CN105093105B - A kind of encapsulation microwave switch test device - Google Patents

A kind of encapsulation microwave switch test device Download PDF

Info

Publication number
CN105093105B
CN105093105B CN201510524441.6A CN201510524441A CN105093105B CN 105093105 B CN105093105 B CN 105093105B CN 201510524441 A CN201510524441 A CN 201510524441A CN 105093105 B CN105093105 B CN 105093105B
Authority
CN
China
Prior art keywords
test
microwave switch
probe
circuit plate
fixture
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN201510524441.6A
Other languages
Chinese (zh)
Other versions
CN105093105A (en
Inventor
袁文
张世艳
杜勇
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Guizhou Aerospace Institute of Measuring and Testing Technology
Original Assignee
Guizhou Aerospace Institute of Measuring and Testing Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Guizhou Aerospace Institute of Measuring and Testing Technology filed Critical Guizhou Aerospace Institute of Measuring and Testing Technology
Priority to CN201510524441.6A priority Critical patent/CN105093105B/en
Publication of CN105093105A publication Critical patent/CN105093105A/en
Application granted granted Critical
Publication of CN105093105B publication Critical patent/CN105093105B/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The invention discloses a kind of encapsulation microwave switch test devices, test pushbutton module and test circuit plate including test fixture, placement microwave switch, test fixture is placed on test circuit plate, it is fixedly attached on metal base plate, test pushbutton module is fixed in the middle part of test fixture, built-in one end contacted with test circuit plate can elastic telescopic test probe, the signal input tube foot for testing probe pin upper ends and microwave switch connects, test circuit plate is mounted on metal base plate, is wired to monitoring device.The present invention is put into microwave switch is encapsulated in test fixture, the pin of microwave switch is connect with test circuit plate by test probe, it can avoid the contact of chip pin and test circuit plate, the elasticity of test probe plays the role of buffering, it can keep being in close contact with test circuit plate, reduce parasitic parameter, ensure the normal transmission of microwave signal, it avoids pressing chip firmly, improves testing reliability and testing efficiency.

Description

A kind of encapsulation microwave switch test device
Technical field
The invention belongs to electronic component testing apparatus technical fields, are related to a kind of encapsulation microwave switch test device.
Background technology
It is eight pin devices to encapsulate microwave switch, and maximum operating frequency is in microwave section(4GHz or more), pin is respectively Signal output, two output of channel, working power, logic control, exports enabled and two ground pins and device at the output of channel one There is a bulk of ground plane among bottom, to ensure proper device operation.The test of encapsulation microwave switch is mostly to utilize fixture handle at present Device is directly born against on the corresponding position of test circuit plate, is then tested using test equipment, this test mode due to Device pin is the mode contacted firmly with circuit board, it is easy to the solderability of damage influence device is caused to device pin coating, Simultaneously because the difference of the pin height of device itself, it is not very good to cause to contact between pin and circuit board, influences to test Effect even burns device;Another test mode is then to be directly welded on circuit board to test, and thus destroys microwave and opens It has been easily destroyed microwave switch structural behaviour index itself when closing the performance of the welding surface of pin, and welding, has not been suitable for micro- The parameter testing of wave switch.And the testing efficiency of both test modes is not high, is not suitable for large batch of test.
Invention content
The technical problem to be solved by the present invention is to:Using hard pressure or welding side when being tested for existing encapsulation microwave switch Mechanical damage, poor contact caused by formula, easily short circuit are easy maloperation and be easy to cause larger test data error etc. Problem provides a kind of encapsulation microwave switch test device, can realize that not damaged, contact is good, not short-circuit, operation is reliable and surveys It is accurate to try data, to overcome problems of the prior art.
The technical solution that the present invention takes is:A kind of encapsulation microwave switch test device, including test fixture, placement microwave The test pushbutton module and test circuit plate of switch, the test fixture are placed on test circuit plate, are fixedly attached to metal bottom On plate, the test pushbutton module is movably connected in the middle part of test fixture, and what built-in one end was contacted with test circuit plate can The signal input tube foot of the test probe of elastic telescopic, the test probe pin upper ends and microwave switch connects, the test circuit Plate is mounted on metal base plate, is wired to monitoring device.
Preferably, above-mentioned test fixture includes briquetting and fixture lower frame, is provided on the briquetting and is opened for fastening microwave The boss of pass is movably connected on the cover board, and the cover board is connected to by cap hinge axle on fixture lower frame, and engaging is passed through Mode is fastened, which operates and easy to loading and unloading convenient for microwave switch to be accurately positioned and be fastened.
Preferably, above-mentioned test pushbutton module includes interior cavity main body and test probe, is provided with and puts in the interior cavity main body It sets the cavity of microwave switch and places the mounting hole of test probe, the test probe includes syringe needle, inserting tube and probe springs, institute It states syringe needle to be placed in inserting tube, lower end is connected to probe springs, and the probe springs other end is fixedly attached to inserting tube upper end, described Cavity upper end is communicated to test fixture upper surface, by can elastic telescopic test probe, probe lower end connects with test circuit plate It touches, upper end and pins contact, can be conducive to microwave switch device pin and test circuit plate keeping certain distance, to realize The good connection of microwave switch pin and test circuit plate, this is simple in structure, loads and unloads and easy to maintain.
Preferably, above-mentioned test circuit plate is connected to monitoring by the way that sub-miniature A connector one, sub-miniature A connector two and sub-miniature A connector three is arranged In equipment, the sub-miniature A connector one is for signal input connection, and the sub-miniature A connector two is for the output connection of channel one, the SMA For connector three for the output connection of channel three, the sub-miniature A connector one, sub-miniature A connector two and sub-miniature A connector three are fixedly connected on fixture lower frame On the side end face of left and right, inner core is kept in contact with microwave switch pin respectively, is set with monitoring by fixed three standard sub-miniature A connectors The standby connector provided can be matched smoothly very much, not had to when ensure that the quality of microwave signal in test process, while testing Repeatedly transformation test cable keeps the data of test more stable reliable, and consistency is good.
Preferably, above-mentioned metal base plate material uses copper product, and one layer of surface coating is gold-plated, is conducive to heat dissipation, convenient for manufacture And installation, ensure measured device good earth.
Preferably, above-mentioned test fixture is fixedly attached to by screw on metal base plate, and it is reliable convenient to connect.
Preferably, the bottom setting power supply of above-mentioned test circuit plate and control logic circuit input terminal, the power supply and control Logic circuit input terminal processed passes through metal base plate, compact-sized, easy to operate.
Preferably, front end is provided with block tongue on above-mentioned cover board, and front end is provided with card slot, the block tongue on the fixture lower frame It is connected on cover board by shaft, the back side and the extension spring for being provided with contact, the extension spring connection on the cover board, is located at Shaft position on the lower side realizes that engaging is fastenedly connected by card slot and block tongue, shaft is provided in the middle part of the block tongue, simple in structure, Easy to operate, engaging tightness is good.
Preferably, above-mentioned cover board upper surface is provided with squeeze grip, and the squeeze grip includes rotation button and fixed company It is connected on the screw rod of rotation button bottom, the rotation button includes the boss that turns being arranged in rotating disk and rotating disk, described Screw rod is placed in the threaded hole of cover board, and lower end is movably connected with briquetting, can push down on briquetting movement, with this configuration The pressing that different height pin can be achieved, to ensure to test device pin connection close contact.
Preferably, above-mentioned rotation side surface is the disc cam type structure of egg shape, and the off-axis heart distal end of rotating disk can Block tongue rear contact is rotated about the axis, block tongue back is contacted by distal end, block tongue fixation can be prevented to be fastened in card slot, ensured Cover board is fixedly connected.
Preferably, the U-shaped positioning groove positioned for microwave switch, U-shaped positioning groove are provided on above-mentioned raised head face Two side can contact in the device side wall in device pin direction, prevent pressing device time shift dynamic, avoid face contact bad or Deviate person position.
Beneficial effects of the present invention:Compared with prior art, the present invention is put into microwave switch is encapsulated in test fixture In test pushbutton module, the pin of microwave switch by can the test probe of elastic telescopic be attached with test circuit plate, can The contact of chip pin and test circuit plate is avoided, reduces parasitic parameter, ensures the normal transmission of microwave signal, on the other hand, The elasticity of test probe plays the role of buffering, can keep being in close contact with test circuit plate, to avoid pressing chip belt firmly The device failure come, therefore, the present invention improve the testing efficiency of encapsulation microwave switch testing reliability and microwave switch, solve When the test of encapsulation microwave switch using mechanical damage, poor contact caused by conventional hard pressure or welding manner, easily short circuit, hold Easy maloperation and the problem of be easy to cause larger test data error.
Description of the drawings
Fig. 1 is dimensional structure diagram when the cover board of the present invention is opened;
Dimensional structure diagram when Fig. 2 is the cover plate closing of the present invention;
Fig. 3 is the schematic top plan view of Fig. 1;
The partial perspective enlarged diagram placed at microwave switch that Fig. 4 is Fig. 3;
Fig. 5 is the elevational schematic view of Fig. 1;
Fig. 6 is the probe structure schematic diagram of the present invention;
Fig. 7 is the connection diagram of block tongue of the present invention and cover board;
Fig. 8 is microwave switch structural schematic diagram.
In figure, 1- test fixtures, 2- microwave switches, 3- test pushbutton modules, 4- test circuit plates, 5- metal base plates, 6- Sub-miniature A connector one, 7-SMA connectors two, 8-SMA connectors three, 9- power supplys and logic circuit input terminal, 10- test probes, 11- briquettings, 12- boss, 13- cavitys, 14- positioning grooves, 15- fixture lower frames, 16- mounting holes, cavity main body in 17-, 18- syringe needles, 19- are visited Pipe, 20- probe springs, 21- cover boards, 22- block tongues, 23- card slots, 24- squeeze grips, 25- shafts, 26- rotating disks, 27- are turned Boss, 28- flanges, 29- cap hinge axles, 30- torsional springs, 31- extension springs, 33- directional holes, 34- symmetric windows, 35- connection spiral shells Nail.
Specific implementation mode
Below in conjunction with the accompanying drawings and invention is described further in specific embodiment.
As shown in Fig. 1 ~ Fig. 8, a kind of encapsulation microwave switch test device, including test fixture 1, placement microwave switch 2 Test pushbutton module 3 and test circuit plate 4, the test fixture 1 are placed on test circuit plate 4, are fixedly attached to metal base plate 5 On, the test pushbutton module 3 is movably connected by attachment screw 35 in 1 middle part of test fixture, 35 lower end of attachment screw It is fixedly connected on metal base plate 5, upper end is that head of screw limits test pushbutton module 3, built-in one end and test circuit Plate 4 contact can elastic telescopic test probe 10, by testing probe 10 by the pin contacted with test circuit plate 4 and middle part Ground wire connection, test 10 upper end of probe connect with the signal input tube foot of microwave switch 2, the peace of test circuit plate 4 On metal base plate 5, it is wired to monitoring device, the present invention is put into the survey in test fixture by microwave switch is encapsulated Sound out in pin module, the pin of microwave switch by can the test probe of elastic telescopic be attached with test circuit plate, can keep away Exempt from the contact of chip pin and test circuit plate, reduce parasitic parameter, ensure the normal transmission of microwave signal, on the other hand, surveys The elasticity for souning out needle plays the role of buffering, can keep being in close contact with test circuit plate, to avoid pressing chip belt firmly Device failure, therefore, the present invention improve encapsulation microwave switch testing reliability and microwave switch testing efficiency, solve Using mechanical damage, poor contact caused by conventional hard pressure or welding manner, easily short circuit, easy when encapsulating microwave switch test Maloperation and the problem of be easy to cause larger test data error.
Preferably, above-mentioned test fixture 1 includes briquetting 11 and fixture lower frame 15, is provided on the briquetting 11 for fastening The boss 12 of microwave switch 2, is movably connected on cover board 21, and the cover board 21 is connected to by cap hinge axle 29 under fixture It on frame 15, is fastened to by way of engaging on fixture lower frame 15, torsional spring 30 is provided on cap hinge axle 29, pass through 30 energy of torsional spring Enough allow cover board there are one the power opened, be at the more firm state of fastening, the overall structure be convenient for by microwave switch into Row is accurately positioned and fastens, and operates and easy to loading and unloading;Above-mentioned test pushbutton module 3 includes interior cavity main body 17 and test probe 10, It is provided with the cavity 13 for placing microwave switch in the interior cavity main body 17 and places the mounting hole 16 of probe, the front and back side of cavity 13 It is provided with symmetric windows 34 on wall, measured device is taken out by 34 tweezers easy to use of symmetric windows, survey can be greatly improved Efficiency is tried, the test probe 10 includes that syringe needle 18, the inserting tube 19 of lower ending opening and probe springs 20, the syringe needle 18 are placed in spy It is three-level Step Shaft in pipe 19, lower part big end is connected to probe springs 20, the extended inserting tube 19 of big end, the probe springs 20 The other end is fixedly attached to 19 upper end of inserting tube, and the elastic reaction by testing probe 10 can allow interior cavity main body 17 to be in yielding movable Dynamic state, when compression, can move down interior cavity main body 17, to allow syringe needle 18 to expose, be connect with device pin, the chamber 13 upper end of body is communicated to 1 upper surface of test fixture, by can elastic telescopic test probe, probe lower end connects with test circuit plate It touches, test pushbutton module can be in a compressed state by upper end and pins contact, and the syringe needle of probe is tested after compression and can be revealed Go out into cavity the pins contact with tested microwave Katyuan, realize the connection of circuit, by microwave switch device pin and test electricity Road plate keeps certain distance, and the good connection of microwave switch pin and test circuit plate, structure letter are realized by testing probe It is single, it loads and unloads and easy to maintain.
Preferably, above-mentioned test circuit plate 4 is connected to by the way that sub-miniature A connector 1, sub-miniature A connector 27 and sub-miniature A connector 38 is arranged In monitoring device, the sub-miniature A connector 1 is for signal input connection, and the sub-miniature A connector 27 is for the output connection of channel one, institute It states sub-miniature A connector 38 and exports connection for channel three, the sub-miniature A connector 1, sub-miniature A connector 27 are fixedly connected with sub-miniature A connector 38 On 15 or so side end face of fixture lower frame, inner core is kept in contact with 2 pin of microwave switch respectively, passes through fixed three standards The connector that sub-miniature A connector is provided with monitoring device can be matched smoothly very much, ensure that the quality of microwave signal in test process, Do not have to repeatedly transformation when testing simultaneously and test cable, keeps the data of test more stable reliable, consistency is good.
Preferably, 5 material of above-mentioned metal base plate uses copper product, and one layer of surface coating is gold-plated, is conducive to heat dissipation, convenient for manufacture And installation, ensure measured device good earth;Above-mentioned test fixture 1 is fixedly attached to by screw on metal base plate 5, and connection can By convenient;The bottom setting power supply and control logic circuit input terminal 9, the power supply and control logic of above-mentioned test circuit plate 4 Circuit input end 9 passes through metal base plate 5, compact-sized, easy to operate.
Preferably, front end is provided with block tongue 22 on above-mentioned cover board 21, and front end is provided with card slot 23 on the fixture lower frame 15, The block tongue 22 is connected to by shaft on cover board 21, and lower end is provided with V-type flange, which can be embedded into card slot 23, The back side and the extension spring for being provided with contact, the extension spring connection on the cover board, are located at shaft position on the lower side, pass through card slot 23 and block tongue 22 realize engaging be fastenedly connected, 22 upper end of block tongue be arranged flange 28, easily block tongue can be rotated by flange 28, Overall structure is simple, easy to operate, and engaging tightness is good.
Preferably, 21 upper surface of above-mentioned cover board is provided with squeeze grip 24, the squeeze grip 24 include rotation button and It is fixedly connected on the screw rod 29 of rotation button bottom, the rotation button includes turning of being arranged in rotating disk 26 and rotating disk Boss 27, the screw rod 19 are placed in the threaded hole of cover board 21, and lower end is movably connected with briquetting 11, can push down on dynamic pressure Block 11 moves, and can realize the pressing of different height pin with this configuration, to ensure that it is close that the pin for testing device connects Contact.
Preferably, 26 end face of above-mentioned rotating disk is the disc cam type structure of egg shape, and the 26 off-axis heart of the rotating disk is remote End can rotate about the axis 22 rear contact of block tongue, can fix block tongue 22 by distal end and be fastened in card slot 23, ensure cover board Be fixedly connected.
Preferably, the U-shaped positioning groove 14 positioned for microwave switch, positioning groove are provided on 12 end face of above-mentioned boss 14 two sides can contact in the device side wall in 2 pin direction of microwave switch, prevents pressing device time shift dynamic, avoids face contact Deviate bad or position.
Preferably, because mask placement device is symmetrical structure, in order to quick and easy for installation, installation direction mistake is prevented, in fixture Lower frame 15 and 13 left upper of cavity are both provided with directional hole 33.
Microwave switch 2 is put into test pushbutton module 3 when test, covers the cover board 21 of lower test fixture 1, turn rotation by Button presses briquetting 11 in the upper surface of microwave switch 2, so that the pin of microwave switch 2 closely connects, applies corresponding Supply voltage and logic control level can just make device be in normal operating conditions, and input signal is defeated by input adapter 1 Enter to measured device 2, output signal is transmitted in monitoring device and is measured by sub-miniature A connector 27 and sub-miniature A connector 28.
When being tested encapsulation microwave switch using this test device, measured device is put into test device with tweezers In cavity, lid gets togather cover board, turns rotation button, and briquetting is pushed to move down, to push measured device pin to be visited with test Needle keeps good contact, starts test device, so as to simulate measured device real use state, test data completely Accurately and reliably, consistency is good.
The present invention is by changing test circuit plate and probe module, it may also be used for the test of other model microwave devices is answered It is wide and expansibility is good with range.
The above description is merely a specific embodiment, but scope of protection of the present invention is not limited thereto, any Those familiar with the art in the technical scope disclosed by the present invention, can easily think of the change or the replacement, and should all contain Within protection scope of the present invention, therefore, protection scope of the present invention should be based on the protection scope of the described claims lid.

Claims (7)

1. a kind of encapsulation microwave switch test device, it is characterised in that:Including test fixture(1), place microwave switch(2)Survey Sound out pin module(3)With test circuit plate(4), the test fixture(1)It is placed in test circuit plate(4)On, it is fixedly attached to gold Belong to bottom plate(5)On, the test pushbutton module(3)It is movably connected in test fixture(1)Middle part, built-in one end and test electricity Road plate(4)Contact can elastic telescopic test probe(10), the test probe(10)Upper end and microwave switch(2)Signal Input pin connects, the test circuit plate(4)Mounted on metal base plate(5)On, it is wired to monitoring device;It is described Test fixture(1)Including briquetting(11)With fixture lower frame(15), the briquetting(11)On be provided with for fastening microwave switch(2) Boss(12), may be movably coupled to cover board(21)On, the cover board(21)Pass through cap hinge axle(29)It is connected under fixture Frame(15)On, it is fastened by way of engaging;The boss(12)Be provided on end face positioned for microwave switch it is U-shaped Groove(14), U-shaped positioning groove two side(14)It can contact microwave switch(2)In the device side wall in pin direction;The gold Belong to bottom plate(5)Material uses copper product, one layer of surface coating gold-plated.
2. a kind of encapsulation microwave switch test device according to claim 1, it is characterised in that:The test pushbutton module (3)Including interior cavity main body(17)With test probe(10), the interior cavity main body(17)Inside it is provided with placement microwave switch(2)Chamber Body(13)Probe is tested with placing(10)Mounting hole(16), the test probe(10)Including syringe needle(18), lower ending opening Inserting tube(19)And probe springs(20), the syringe needle(18)It is placed in inserting tube(19)Interior, lower end is connected to probe springs(20), described Probe springs(20)The other end is fixedly attached to inserting tube(19)Upper end, the cavity(13)Upper end is communicated to test fixture(1)On End face.
3. a kind of encapsulation microwave switch test device according to claim 1, it is characterised in that:The test circuit plate (4)By the way that sub-miniature A connector one is arranged(6), sub-miniature A connector two(7)With sub-miniature A connector three(8)It is connected in monitoring device, the SMA connects It is first(6)It exports and connects for signal, the sub-miniature A connector two(7)It exports and connects for channel one, the sub-miniature A connector three(8)With It exports and connects in channel three, the sub-miniature A connector one(6), sub-miniature A connector two(7)With sub-miniature A connector three(8)It is fixedly connected under fixture Frame(15)On the side end face of left and right, inner core respectively with microwave switch(2)Pin is kept in contact.
4. a kind of encapsulation microwave switch test device according to claim 1, it is characterised in that:The test circuit plate (4)Bottom setting power supply and control logic circuit input terminal(9), the power supply and control logic circuit input terminal(9)It passes through Metal base plate(5).
5. a kind of encapsulation microwave switch test device according to claim 1, it is characterised in that:The cover board(21)It goes forward End is provided with block tongue(22), the fixture lower frame(15)Upper front end is provided with card slot(23), the block tongue(17)Pass through shaft (24)It is connected to cover board(16)On, the back side and the extension spring for being provided with contact(28), the extension spring(28)It is connected to lid Plate(16)On, it is located at shaft(24)Position on the lower side, passes through card slot(18)And block tongue(17)Realize that engaging is fastenedly connected.
6. a kind of encapsulation microwave switch test device according to claim 1, it is characterised in that:The cover board(21)Upper end Face is provided with squeeze grip(24), the squeeze grip(24)Including rotation button and the spiral shell for being fixedly connected on rotation button bottom Swing arm(29), the rotation button includes rotating disk(26)And rotating disk(26)Upper setting turns boss(27), the spiral Bar(29)It is placed in cover board(21)Threaded hole in, lower end and briquetting(11)It is movably connected, briquetting can be pushed down on(11)It moves It is dynamic.
7. a kind of encapsulation microwave switch test device according to claim 6, it is characterised in that:The rotating disk(26)End Face is the disc cam type structure of egg shape, the rotating disk(26)Off-axis heart distal end can rotate about the axis block tongue(22)Rear side Contact.
CN201510524441.6A 2015-08-25 2015-08-25 A kind of encapsulation microwave switch test device Active CN105093105B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201510524441.6A CN105093105B (en) 2015-08-25 2015-08-25 A kind of encapsulation microwave switch test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201510524441.6A CN105093105B (en) 2015-08-25 2015-08-25 A kind of encapsulation microwave switch test device

Publications (2)

Publication Number Publication Date
CN105093105A CN105093105A (en) 2015-11-25
CN105093105B true CN105093105B (en) 2018-09-21

Family

ID=54573984

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201510524441.6A Active CN105093105B (en) 2015-08-25 2015-08-25 A kind of encapsulation microwave switch test device

Country Status (1)

Country Link
CN (1) CN105093105B (en)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105699824B (en) * 2016-03-31 2018-10-26 中国电子科技集团公司第十三研究所 A kind of microwave device test device of top bottom lead case package
CN106841693A (en) * 2016-12-21 2017-06-13 北京中科飞鸿科技有限公司 A kind of test fixture for testing surface-mount type wave filter
CN106442573A (en) * 2016-12-27 2017-02-22 成都信息工程大学 Rapid non-destructive testing device for microwave surface-mounted component
CN107367648B (en) * 2017-06-23 2023-07-04 中国电子科技集团公司第十三研究所 Microwave monolithic circuit immunity test fixture
CN109975678A (en) * 2017-12-14 2019-07-05 惠州海格光学技术有限公司 A kind of PLCC encapsulation chip functions automatic test module
CN108254437B (en) * 2018-03-01 2023-12-19 中国人民解放军陆军军医大学第三附属医院(野战外科研究所) Acoustic surface wave biosensor fixture and test system
CN109257121A (en) * 2018-11-26 2019-01-22 伟创力电子技术(苏州)有限公司 A kind of 5G frequency Wifi signal test system
CN109406126B (en) * 2018-11-28 2023-12-29 广东电网有限责任公司 Mechanical characteristic test device for high-voltage circuit breaker
CN111596105A (en) * 2020-06-30 2020-08-28 瑞声精密制造科技(常州)有限公司 Test fixture of dielectric waveguide filter
CN113189375A (en) * 2021-05-06 2021-07-30 杭州中安电子有限公司 Microwave device test fixture
CN113933547A (en) * 2021-10-15 2022-01-14 武汉海泰中测电子有限责任公司 Detection clamp convenient for rapid replacement of tested module
CN114814720B (en) * 2022-06-20 2022-09-30 成都市克莱微波科技有限公司 Microwave direction finding device, system, method and storage medium
CN116908658B (en) * 2023-08-01 2024-01-05 中国人民解放军国防科技大学 Small-size small-signal circuit board testing device

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5969535A (en) * 1996-09-30 1999-10-19 Hewlett-Packard Company Probe card with connector
CN2847460Y (en) * 2005-09-14 2006-12-13 翔宏兴业有限公司 Storage chip detector
CN201194023Y (en) * 2008-04-07 2009-02-11 比亚迪股份有限公司 Integrated circuit testing apparatus
CN204116390U (en) * 2014-09-26 2015-01-21 贵州航天计量测试技术研究所 A kind of direct insertion microwave voltage controlled oscillator test bench
CN104535800A (en) * 2015-01-07 2015-04-22 安拓锐高新测试技术(苏州)有限公司 Novel adjustable test socket cover
CN205176216U (en) * 2015-08-25 2016-04-20 贵州航天计量测试技术研究所 Encapsulation microwave switch testing arrangement

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5969535A (en) * 1996-09-30 1999-10-19 Hewlett-Packard Company Probe card with connector
CN2847460Y (en) * 2005-09-14 2006-12-13 翔宏兴业有限公司 Storage chip detector
CN201194023Y (en) * 2008-04-07 2009-02-11 比亚迪股份有限公司 Integrated circuit testing apparatus
CN204116390U (en) * 2014-09-26 2015-01-21 贵州航天计量测试技术研究所 A kind of direct insertion microwave voltage controlled oscillator test bench
CN104535800A (en) * 2015-01-07 2015-04-22 安拓锐高新测试技术(苏州)有限公司 Novel adjustable test socket cover
CN205176216U (en) * 2015-08-25 2016-04-20 贵州航天计量测试技术研究所 Encapsulation microwave switch testing arrangement

Also Published As

Publication number Publication date
CN105093105A (en) 2015-11-25

Similar Documents

Publication Publication Date Title
CN105093105B (en) A kind of encapsulation microwave switch test device
TWI388844B (en) Testing system and testing method
KR100654262B1 (en) Electrical socket apparatus
CN203191515U (en) Testing tool
CN105044402A (en) Encapsulated micro-wave voltage-controlled oscillator test device
TWI382193B (en) Testing system and testing method
CN112327139A (en) Chip testing device
KR20050087300A (en) Test socket for semiconductor package
CN213689776U (en) Test fixture and WiFi module antenna coupling test fixture
CN101893681B (en) Test system and method
CN217385580U (en) QFN packaging radio frequency chip test fixture
US6489791B1 (en) Build off self-test (Bost) testing method
CN209231471U (en) A kind of encapsulation chip testing structure
CN205176216U (en) Encapsulation microwave switch testing arrangement
CN206557303U (en) A kind of device tested for microwave device
CN212905382U (en) Cable fault tester convenient to operation
CN106797090A (en) Electric component socket
CN204925172U (en) Encapsulation microwave voltage controlled oscillator testing arrangement
US9837747B2 (en) Burn-in socket for packaged integrated circuits
JP2001155835A (en) Socket and electronic part mounting device
CN106680543B (en) The application method of conducting heavy current device
CN210604887U (en) BGA chip rapid test fixture
CN207717928U (en) Arrangement for testing integrated circuit
CN217112612U (en) Intelligence wrist-watch mainboard testing arrangement
JP2013083506A (en) Electric component socket

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
GR01 Patent grant
GR01 Patent grant