CN106841693A - A kind of test fixture for testing surface-mount type wave filter - Google Patents

A kind of test fixture for testing surface-mount type wave filter Download PDF

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Publication number
CN106841693A
CN106841693A CN201611192789.0A CN201611192789A CN106841693A CN 106841693 A CN106841693 A CN 106841693A CN 201611192789 A CN201611192789 A CN 201611192789A CN 106841693 A CN106841693 A CN 106841693A
Authority
CN
China
Prior art keywords
test
mount type
filter device
type filter
raised line
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201611192789.0A
Other languages
Chinese (zh)
Inventor
左慧杰
靳超松
万飞
杨丽伟
李丹
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
ZHONGKE FEIHONG SCIENCE AND TECHNOLOGY Co Ltd BEIJING
Original Assignee
ZHONGKE FEIHONG SCIENCE AND TECHNOLOGY Co Ltd BEIJING
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by ZHONGKE FEIHONG SCIENCE AND TECHNOLOGY Co Ltd BEIJING filed Critical ZHONGKE FEIHONG SCIENCE AND TECHNOLOGY Co Ltd BEIJING
Priority to CN201611192789.0A priority Critical patent/CN106841693A/en
Publication of CN106841693A publication Critical patent/CN106841693A/en
Pending legal-status Critical Current

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Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02General constructional details
    • G01R1/04Housings; Supporting members; Arrangements of terminals
    • G01R1/0408Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0425Test clips, e.g. for IC's

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention discloses a kind of test fixture for testing surface-mount type wave filter, the testing base and top briquetting being hinged including side, hollow test trough is provided with testing base, test trough is consistent with tested surface-mount type filter device bottom shape, test trench bottom sets the multiple ground connection of quantity and plays pin and be provided with input and output shell fragment at two ends, top briquetting inner face is provided with raised line, and raised line closely agrees with when the top briquetting is fallen within shown testing base with the test trough.The surface-mount type filter device that ground connection plays pin and is used to be tested with input and output shell fragment is realized being flexible coupling with test fixture.Raised line compresses tested surface-mount type filter device, makes tested surface-mount type filter device uniform force.Can be applied in screening debugging, test in surface-mount type filter device production process, can effectively improve the precision of test and the efficiency of debugging, improve the reliability of production speed and product, and simple structure, it is with low cost, it is easy to accomplish.

Description

A kind of test fixture for testing surface-mount type wave filter
Technical field
The present invention relates to a kind of microwave filter, more particularly to a kind of test fixture for testing surface-mount type wave filter.
Background technology
With the development of radio-frequency technique, the transceiver channel of some conventional communication equipments needs surface-mount type wave filter increasingly It is many, therefore, the requirement to surface-mount type filter frequencies index is increasingly harsh.
For surface-mount type filter device, if to realize that intact payment user uses, wave filter is just must assure that The characterisitic parameter of setting can be met, therefore, need that filter device first is arranged on into bottom in surface-mount type wave filter production process Primary screening debugging is first carried out on seat, the device debugged then could be screened and be done experiment checking, finally tested.And this Plant way and there is Railway Project:First, whether the installment state for screening debugging is consistent, if installment state is inconsistent, is grounded shape State is not good, and surveying parameter must change, and increased debugging difficulty.Second, after the completion of device experiment, state during test It is different with screening adjustment and installation state, the disqualification rate of product can be increased.
It is well known that if surface-mount type filter device earthing effect is bad, installment state is inconsistent, and screening can be caused to debug Inefficiency and test accuracy it is low be also unfavorable for batch production, on the one hand can increase the cost of product, the qualification rate of product It is greatly reduced, therefore, it is possible to ensure that installment state is consistent, earthing effect good screening debugging, the fixture of test, for carrying The scheduling and planning of surface-mount type filter device is risen, testing efficiency is significant, and does not meet the requirement also in the prior art Fixture.
The content of the invention
It is it is an object of the invention to provide a kind of efficiency and reliability high, and simple structure, it is with low cost, be easily achieved Test the test fixture of surface-mount type wave filter.
The purpose of the present invention is achieved through the following technical solutions:
The test fixture of test surface-mount type wave filter of the invention, including the testing base and top pressure that side is hinged Block, is provided with hollow test trough, the test trough and tested surface-mount type filter device bottom shape in the testing base Shape is consistent, and the test trench bottom sets the multiple ground connection of quantity and plays pin and be provided with input and output shell fragment, the top pressure at two ends Block inner face is provided with raised line, the raised line when the top briquetting is fallen within shown testing base with the tight contract of the test trough Close.
As seen from the above technical solution provided by the invention, test surface-mount type wave filter provided in an embodiment of the present invention Test fixture, can screen in the surface-mount type filter device production process apply in debugging, test, can effectively improve survey The precision of examination and the efficiency of debugging, improve the reliability of production speed and product, and simple structure, low cost It is honest and clean, it is easy to accomplish.
Brief description of the drawings
Fig. 1 is the structural representation of the test fixture of test surface-mount type wave filter provided in an embodiment of the present invention.
In figure:
1- testing bases, 2- test troughs, 3- ground connection plays pin, 4-SMA adapters, 5 input and output shell fragments, 6 top briquettings, 7 Raised line.
Specific embodiment
With reference to the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clear, complete Ground description, it is clear that described embodiment is only a part of embodiment of the invention, rather than whole embodiments.Based on this Inventive embodiment, the every other implementation that those of ordinary skill in the art are obtained under the premise of creative work is not made Example, belongs to protection scope of the present invention.
The test fixture of test surface-mount type wave filter of the invention, its preferably specific embodiment is:
The testing base and top briquetting being hinged including side, hollow testing in being provided with the testing base Groove, the test trough is consistent with tested surface-mount type filter device bottom shape, and it is multiple that the test trench bottom sets quantity Ground connection plays pin and is provided with input and output shell fragment at two ends, and the top briquetting inner face is provided with raised line, and the raised line is on the top Closely agree with the test trough when portion's briquetting is fallen within shown testing base.
The ground connection bullet pin is realized soft for tested surface-mount type filter device with input and output shell fragment with test fixture Connection.
The raised line compresses tested surface-mount type filter device, makes tested surface-mount type filter device uniform force.
The test fixture of test surface-mount type wave filter of the invention, can screen in surface-mount type filter device production process Applied in debugging, test, can effectively improve the precision of test and the efficiency of debugging, improve production speed and product The reliability of product, and simple structure, it is with low cost, it is easy to accomplish.
Specific embodiment:
As shown in figure 1, including testing base, test trough, the test trough and table are provided with the middle part of the testing base The bottom size shape of mounted filter device is consistent, and the test trough is used for device performance and tests and circuit debugging;The survey Experimental tank bottom is in contact equipped with pin, the bullet pin is played with the bottom surface of the surface-mount type wave filter device;There is output in the test trough Input contact flat spring, the output input contact flat spring and SMA adapters are one-to-one connected relation.The SMA switchings Head is for the connection with vector network analyzer test port.
Preferably, the test fixture includes base and top briquetting;The testing base is rectangular base, in the survey There is test trough on examination base, the size of the test trough is more slightly larger than the bottom size of institute's tester device.
Preferably, the test trough includes Bottom ground bullet pin and input and output shell fragment, changes test device test clip The connected mode of tool.
Preferably, having raised line closely to agree with the test trough on the top briquetting makes test device surrounding stress equal It is even.
Implement the present invention, have the advantages that:
Test fixture can realize online debugging, and make the result of test more accurate, substantially increase test Precision.The effect of briquetting is that tester part is more uniformly stressed, and has abandoned pattern of the old-fashioned hand by discontinuity, from And improve the precision of test;Grounding elastic part realizes the real-time earthing of device, and old-fashioned test fixture ground connection can be avoided bad The measurement error brought can effectively improve the efficiency of test, and can effectively improve debugging efficiency and the survey of product Examination precision;The shell fragment of input and output effectively realizes being flexible coupling for device input and output, so as to avoid input/output terminal from adjusting The damage that Hard link brings when examination and test.
The above, the only present invention preferably specific embodiment, but protection scope of the present invention is not limited thereto, Any one skilled in the art in the technical scope of present disclosure, the change or replacement that can be readily occurred in, Should all be included within the scope of the present invention.Therefore, protection scope of the present invention should be with the protection model of claims Enclose and be defined.

Claims (3)

1. it is a kind of test surface-mount type wave filter test fixture, it is characterised in that the testing base (1) being hinged including side With top briquetting (6), hollow test trough (2), the test trough (2) and tested table are provided with the testing base (1) Mounted filter device bottom shape is consistent, and test trough (2) bottom sets the multiple ground connection of quantity and plays pin (3) and set at two ends There is input and output shell fragment (5), top briquetting (6) inner face is provided with raised line (7), and the raised line (7) is in the top briquetting (6) closely agree with the test trough (2) when falling within shown testing base (1).
2. it is according to claim 1 test surface-mount type wave filter test fixture, it is characterised in that the ground connection bullet pin (3) realize being flexible coupling with test fixture for the surface-mount type filter device being tested with input and output shell fragment (5).
3. the test fixture of test surface-mount type wave filter according to claim 2, it is characterised in that the raised line (7) pressure Tight tested surface-mount type filter device, makes tested surface-mount type filter device uniform force.
CN201611192789.0A 2016-12-21 2016-12-21 A kind of test fixture for testing surface-mount type wave filter Pending CN106841693A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201611192789.0A CN106841693A (en) 2016-12-21 2016-12-21 A kind of test fixture for testing surface-mount type wave filter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201611192789.0A CN106841693A (en) 2016-12-21 2016-12-21 A kind of test fixture for testing surface-mount type wave filter

Publications (1)

Publication Number Publication Date
CN106841693A true CN106841693A (en) 2017-06-13

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CN201611192789.0A Pending CN106841693A (en) 2016-12-21 2016-12-21 A kind of test fixture for testing surface-mount type wave filter

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Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107870251A (en) * 2017-11-22 2018-04-03 深圳振华富电子有限公司 A kind of control circuit of voltage ageing screening fixture and fixture
CN111596105A (en) * 2020-06-30 2020-08-28 瑞声精密制造科技(常州)有限公司 Test fixture of dielectric waveguide filter
CN111722045A (en) * 2020-06-30 2020-09-29 瑞声精密制造科技(常州)有限公司 Test tool for dielectric waveguide filter
CN112730909A (en) * 2020-12-25 2021-04-30 无锡国芯微电子系统有限公司 Microwave module test fixture

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US5879172A (en) * 1997-04-03 1999-03-09 Emulation Technology, Inc. Surface mounted adapter using elastomeric conductors
US5942905A (en) * 1992-06-03 1999-08-24 Itt Corporation Contact arrangement
CN105044402A (en) * 2015-08-25 2015-11-11 贵州航天计量测试技术研究所 Encapsulated micro-wave voltage-controlled oscillator test device
CN105093105A (en) * 2015-08-25 2015-11-25 贵州航天计量测试技术研究所 Encapsulation microwave switch test device
CN204925172U (en) * 2015-08-25 2015-12-30 贵州航天计量测试技术研究所 Encapsulation microwave voltage controlled oscillator testing arrangement
CN204989229U (en) * 2015-02-15 2016-01-20 上海唯捷创芯电子技术有限公司 Chip test fixture and test system
CN205176216U (en) * 2015-08-25 2016-04-20 贵州航天计量测试技术研究所 Encapsulation microwave switch testing arrangement

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5942905A (en) * 1992-06-03 1999-08-24 Itt Corporation Contact arrangement
US5879172A (en) * 1997-04-03 1999-03-09 Emulation Technology, Inc. Surface mounted adapter using elastomeric conductors
US6077091A (en) * 1997-04-03 2000-06-20 Emulation Technology, Inc. Surface mounted package adapter using elastomeric conductors
CN204989229U (en) * 2015-02-15 2016-01-20 上海唯捷创芯电子技术有限公司 Chip test fixture and test system
CN105044402A (en) * 2015-08-25 2015-11-11 贵州航天计量测试技术研究所 Encapsulated micro-wave voltage-controlled oscillator test device
CN105093105A (en) * 2015-08-25 2015-11-25 贵州航天计量测试技术研究所 Encapsulation microwave switch test device
CN204925172U (en) * 2015-08-25 2015-12-30 贵州航天计量测试技术研究所 Encapsulation microwave voltage controlled oscillator testing arrangement
CN205176216U (en) * 2015-08-25 2016-04-20 贵州航天计量测试技术研究所 Encapsulation microwave switch testing arrangement

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN107870251A (en) * 2017-11-22 2018-04-03 深圳振华富电子有限公司 A kind of control circuit of voltage ageing screening fixture and fixture
CN111596105A (en) * 2020-06-30 2020-08-28 瑞声精密制造科技(常州)有限公司 Test fixture of dielectric waveguide filter
CN111722045A (en) * 2020-06-30 2020-09-29 瑞声精密制造科技(常州)有限公司 Test tool for dielectric waveguide filter
WO2022000591A1 (en) * 2020-06-30 2022-01-06 瑞声声学科技(深圳)有限公司 Test tool for dielectric waveguide filter
WO2022000701A1 (en) * 2020-06-30 2022-01-06 瑞声声学科技(深圳)有限公司 Testing fixture of dielectric waveguide filter
CN112730909A (en) * 2020-12-25 2021-04-30 无锡国芯微电子系统有限公司 Microwave module test fixture

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Application publication date: 20170613

RJ01 Rejection of invention patent application after publication