CN107339955B - High-precision lens center deviation detection instrument and measurement method thereof - Google Patents
High-precision lens center deviation detection instrument and measurement method thereof Download PDFInfo
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- CN107339955B CN107339955B CN201710011065.XA CN201710011065A CN107339955B CN 107339955 B CN107339955 B CN 107339955B CN 201710011065 A CN201710011065 A CN 201710011065A CN 107339955 B CN107339955 B CN 107339955B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/26—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes
- G01B11/27—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes
- G01B11/272—Measuring arrangements characterised by the use of optical techniques for measuring angles or tapers; for testing the alignment of axes for testing the alignment of axes using photoelectric detection means
Abstract
The invention discloses a high-precision lens center deviation detection instrument which comprises an LED irradiation source emission system, a microscope system and a detected glass bearing seat, wherein the LED irradiation source emission system, the microscope system and the detected glass bearing seat are arranged on a base, the LED irradiation source emission system and the detected glass bearing seat are positioned on the same plane, the microscope system is positioned above the detected glass bearing seat, light rays emitted by a light source in a signal emission system are focused by a condenser lens through cross wires, are turned to the detected glass by a reflecting prism, are amplified and imaged on a cross reticle through the microscope system, and are finally imaged on a CCD through an electronic eyepiece and displayed on a monitor. The lens center detection system has the beneficial effects that: the lens center deviation measuring device can realize the measurement of the measured lens with a particularly small or large focal length and avoid the phenomenon that the cross hair is too thick to influence the reading without changing the sensitivity. And further measuring the central deviation according to the displacement of the cross hair image when the cross hair rotates for a circle.
Description
Technical Field
The invention relates to the technical field of optical inspection and measurement, in particular to a high-precision lens center deviation detection instrument and a measurement method thereof.
Background
A key problem often exists in the production process of optical technology: in the processing and production links of the lens and the assembling process of the lens, central deviation can be generated, namely, the optical center (optical axis) and the geometric center (geometric axis) of the lens are not coincident but have deviation. In other words, the optical axis of the light beam and the reference axis of the lens do not coincide, and the center deviation occurs when the optical axis and the reference axis of the lens are in different directions and positions.
In order to reduce the center deviation in the lens production and assembly process and ensure the coaxiality of all optical surfaces of the optical lens, a high-precision optical positioning instrument needs to be designed and manufactured.
The closest prior art to the present invention is a decentration detecting device and a detecting method, application number is CN20131041023.7, when the present invention detects a lens with a particularly small focal length or a particularly large focal length, the cross hair imaging is too thick, which affects the reading, increases the error, and affects the precision.
Disclosure of Invention
The invention aims to solve the technical problem of providing a high-precision lens center deviation detection instrument and a measurement method thereof, which are used for detecting the deviation between the optical center and the geometric center of a lens to be detected with different focal lengths (including a lens with a particularly small or large focal length), so that the precision is improved. When the cross hair is imaged on the CCD, the situation that the cross hair is very thick and the reading is influenced can occur, the technology provides an optical system for detecting the deviation between the optical center and the geometric center of the detected lens at high precision, so that the cross hair is imaged clearly and an image signal is easily interpreted, the precision is not influenced, an operator can more favorably interpret the image signal, and the defects in the prior art are caused.
In order to achieve the above purpose, the present invention provides the following technical solutions: a high-precision lens center deviation detection instrument comprises an LED irradiation source emission system, a microscope system and a detected glass bearing seat, wherein the LED irradiation source emission system, the microscope system and the detected glass bearing seat are arranged on a base, the LED irradiation source emission system and the detected glass bearing seat are located on the same plane, and the microscope system is located above the detected glass bearing seat;
the LED irradiation source emission system comprises an LED irradiation source and a condenser lens, and a light outlet of the LED irradiation source is provided with a cross wire;
the microscope system comprises a microscope lens barrel body, a scale reticle is arranged in the microscope lens barrel, an electron eyepiece is arranged at the microscope eyepiece of the microscope lens barrel, and the electron eyepiece is connected with an external black-and-white monitor through a CCD (charge coupled device);
the interior of the tested glass bearing seat is provided with a reflecting prism, and the tested glass rotates relative to the tested glass bearing seat.
Preferably, a beam splitter is arranged between the scale reticle and the microscope objective lens in the microscope lens barrel, and an LED light source facing the beam splitter is arranged on the microscope lens barrel.
Preferably, the base is provided with a stand column, the stand column is provided with a support which slides relative to the stand column, the microscope lens cone is fixed on the support, and the support is provided with a first micro-motion hand wheel which controls the support to slide.
Preferably, the collecting lens is arranged in the guide rail, and a second micro hand wheel for controlling the collecting lens to move is arranged on the outer side of the guide rail.
Preferably, the glass bearing to be measured moves relative to the base, and the outside of the glass bearing to be measured is provided with a third fine motion hand wheel for controlling the movement of the glass bearing to be measured.
A measuring method of a high-precision lens decentration detecting instrument comprises the following steps: installing a measured lens on the rotary table, roughly adjusting an instrument to enable the measured lens and a microscope system to be basically located on the same optical axis, then opening an LED irradiation source switch, adjusting the microscope system, enabling light beams emitted by the LED irradiation source to sequentially pass through the cross wire and a condenser lens to become parallel light beams, enabling the parallel light beams to be reflected by a reflecting prism to enter the measured lens and to be imaged at the position where the focus of the measured lens and the focus of the microscope objective coincide, enabling the image to sequentially pass through the beam splitter, the scale reticle and the electronic eyepiece to be imaged on the CCD, adjusting the lens centering instrument until the reticle is clearly imaged in the CCD, observing the position relation between the reticle and the cross wire image in a black-and-white monitor, then rotating the measured lens, and reading out an offset grid value;
the measured glass bearing seat can rotate, the measured glass bearing seat is rotated at least twice in different directions, the grid value of the imaging offset of the cross wire during each rotation is observed, the eccentricity is obtained, and therefore the eccentricity is obtained;
the eccentricity is obtained by the following formula:
；
where C is the eccentricity, P is the offset grid value, the scale of the reticle is 0.1 (mm/grid), and L is the distance (mm) from the lens under test to the reticle.
The beneficial effect of adopting above technical scheme is: according to the detection instrument with the structure, when the focal length of the detected lens is extremely small or large, the condenser lens is added, so that the lens center detector can perform eccentric detection on the lens with the extremely small or large focal length, the focal length range of the detected lens is greatly increased, and the precision of the lens center detector is improved.
The situation that the reading is influenced by too coarse imaging of the cross hair possibly exists, and after the additional lens is added to the lens center detector, the lens center detector in the technology enables the cross hair to image clear image signals which are easy to interpret, does not influence the precision, and is more beneficial to an operator to interpret.
If the optical axis of the lens is not coincident with the axis of the rotating shaft, when the lens is placed on the bearing and rotates for one circle, the optical axis rotates for one circle around the axis of the rotating shaft, so that the cross image formed by the microscope system rotates for one circle. The radius of the locus of the circumferential movement of the cross image (the jumping range of the cross image) reflects the degree of deviation of the optical axis of the lens from the axis of the rotating shaft. The larger the distance of the optical axis of the lens deviating from the axis of the rotating shaft is, the larger the radius of the circumferential moving track of the cross image is; the lens center detector is simple in structure and convenient to use.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic view of a glass to be tested as a positive lens with a focal length of 35mm to 2000 mm;
FIG. 3 is a schematic view of a glass to be tested as a positive lens with a focal length of less than 35 mm;
FIG. 4 is a schematic view of a glass to be tested as a negative lens with a focal length of minus 100mm to minus 2000 mm;
FIG. 5 is a schematic view of the glass to be tested as a negative lens with a focal length of minus 5mm to minus 100 mm.
The system comprises a CCD (charge coupled device), an electronic eyepiece, a reticle), an LED light source, a beam splitter, a microscope objective, a glass to be measured, a reflecting prism, a condenser, an LED illumination source, a base, a column, a stand, a bracket, a guide rail, a first micro-motion hand wheel, a second micro-motion hand wheel, a third micro-motion hand wheel, a glass bearing, an additional objective and an additional objective, wherein the CCD, the electronic eyepiece, the reticle, the LED light source, the beam splitter, the microscope objective, the glass to be measured, the reflecting prism, the condenser, the LED illumination source, the base, the column, the upright, the bracket, the guide rail.
Detailed Description
Preferred embodiments of the present invention will be described in detail below with reference to the accompanying drawings.
Fig. 1 shows a specific embodiment of the invention: a high-precision lens center deviation detection instrument comprises an LED irradiation source 10 emission system, a microscope system and a detected glass bearing 18 which are arranged on a base 11, wherein the LED irradiation source 10 emission system and the detected glass bearing 18 are positioned on the same plane, and the microscope system is positioned above the detected glass bearing 18;
the emitting system of the LED irradiation source 10 comprises an LED irradiation source 10 and a condenser lens 9, and a cross-shaped wire is arranged at a light outlet of the LED irradiation source 10;
the microscope system comprises a microscope lens barrel body, a scale reticle 3 is arranged in the microscope lens barrel, an electron eyepiece 2 is arranged at the microscope eyepiece of the microscope lens barrel, and the electron eyepiece 2 is connected with an external black-and-white monitor through a CCD 11;
the measured glass bearing 18 is internally provided with a reflecting prism 8, and the measured glass 7 rotates relative to the measured glass bearing 18.
A light splitting plate 5 is arranged between the scale dividing plate 3 and the microscope objective 6 in the microscope lens barrel, and an LED light source 4 which is right opposite to the light splitting plate 5 is arranged on the microscope lens barrel.
The base 11 is provided with a vertical column 12, the vertical column 12 is provided with a support 13 which slides relative to the vertical column 12, the microscope lens barrel is fixed on the support 13, and the support 13 is provided with a first micro-motion hand wheel 15 which controls the support 13 to slide.
The collecting lens 9 is arranged in a guide rail 14, and a second micro-motion hand wheel 16 for controlling the collecting lens 9 to move is arranged on the outer side of the guide rail 14.
The tested glass bearing 18 moves relative to the base 11, and a third fine-motion hand wheel 17 for controlling the movement of the tested glass bearing 18 is arranged on the outer side of the tested glass bearing 18.
A measuring method of a high-precision lens decentration detecting instrument comprises the following steps: installing a measured lens on the rotary table, roughly adjusting an instrument to enable the measured lens and a microscope system to be basically located on the same optical axis, then opening an LED irradiation source switch, adjusting the microscope system, enabling light beams emitted by the LED irradiation source to sequentially pass through the cross wire and a condenser lens to become parallel light beams, enabling the parallel light beams to be reflected by a reflecting prism to enter the measured lens and to be imaged at the position where the focus of the measured lens and the focus of the microscope objective coincide, enabling the image to sequentially pass through the beam splitter, the scale reticle and the electronic eyepiece to be imaged on the CCD, adjusting the lens centering instrument until the reticle is clearly imaged in the CCD, observing the position relation between the reticle and the cross wire image in a black-and-white monitor, then rotating the measured lens, and reading out an offset grid value;
the measured glass bearing seat can rotate, the measured glass bearing seat is rotated at least twice in different directions, the grid value of the imaging offset of the cross wire during each rotation is observed, the eccentricity is obtained, and therefore the eccentricity is obtained;
the eccentricity is obtained by the following formula:
；
where C is the eccentricity, P is the offset grid value, the scale of the reticle is 0.1 (mm/grid), and L is the distance (mm) from the lens under test to the reticle.
According to the detection instrument with the structure, when the focal length of the detected lens is extremely small or large, the condenser lens is added, so that the lens center detector can perform eccentric detection on the lens with the extremely small or large focal length, the focal length range of the detected lens is greatly increased, and the precision of the lens center detector is improved.
The situation that the reading is influenced by too coarse imaging of the cross hair possibly exists, and after the additional lens is added to the lens center detector, the lens center detector in the technology enables the cross hair to image clear image signals which are easy to interpret, does not influence the precision, and is more beneficial to an operator to interpret.
If the optical axis of the lens is not coincident with the axis of the rotating shaft, when the lens is placed on the bearing and rotates for one circle, the optical axis rotates for one circle around the axis of the rotating shaft, so that the cross image formed by the microscope system rotates for one circle. The radius of the locus of the circumferential movement of the cross image (the jumping range of the cross image) reflects the degree of deviation of the optical axis of the lens from the axis of the rotating shaft. The larger the distance of the optical axis of the lens deviating from the axis of the rotating shaft is, the larger the radius of the circumferential moving track of the cross image is; the lens center detector is simple in structure and convenient to use.
Referring to fig. 2 (schematic diagram of dotted line), when the LED illumination source 10 is out of 1 time of the focal length of the condenser 9, the light emitted from the LED illumination source is changed into convergent light by the condenser, passes through the reflecting prism 8, and converges into a cross-hair image after passing through the glass 7 (dotted line) to be measured, and the image is imaged on the cross reticle by the microscope objective 6 and focused by the electronic eyepiece 2 to be imaged on the CCD1 again. At this time, the handwheel needs to be adjusted to see a clear image.
Referring to fig. 2 (schematic diagram of black solid line), when the LED illumination source 10 is at the focus of the condenser 9, the light emitted from the LED illumination source is changed into parallel light by the condenser, passes through the reflecting prism 8, and converges into a cross-hair image after passing through the glass 7 (solid line) to be measured, and this image is imaged on the cross reticle by the microscope objective 6, and is converged by the electron eyepiece 2 to be imaged on the CCD1 again.
Referring to fig. 2 (schematic diagram of dotted lines), when the LED illumination source 10 is within 1 time of the focal length of the condenser 9, the light emitted from the LED illumination source is changed into divergent light by the condenser, passes through the reflecting prism 8, converges into a cross-hair image after passing through the glass 7 (dotted points) to be measured, and the image is imaged on the cross reticle by the microscope objective 6 and focused by the electronic eyepiece 2 to be imaged on the CCD1 again. At this time, the handwheel needs to be adjusted to see a clear image.
Referring to fig. 3 (schematic diagram of dotted line), when the LED illumination source 10 is at the focus of the condenser 9, the light emitted from the LED illumination source is changed into parallel light by the condenser, passes through the reflecting prism 8, and is converged into a cross-hair image after passing through the additional objective lens 11a and the glass 7 to be measured (dotted line) in sequence, and the image is imaged on the cross reticle through the microscope objective lens 6, and the cross-hair and the reticle are imaged on the CCD1 together after passing through the electron eyepiece 2.
Referring to fig. 3 (schematic diagram of black solid line), when the LED illumination source 10 is at the focus of the condenser 9, the light emitted from the LED illumination source is changed into parallel light by the condenser, passes through the reflecting prism 8, and converges into a cross-hair image after passing through the additional objective lens 11b and the glass 7 to be measured (solid line) in sequence, and the image is imaged on the cross reticle through the microscope objective lens 6, and the cross-hair and the reticle are imaged on the CCD1 together after passing through the electronic eyepiece 2.
Referring to fig. 3 (schematic dotted line), when the LED radiation source 10 is at the focus of the condenser 9, the light emitted from the LED radiation source is changed into parallel light by the condenser, passes through the reflecting prism 8, and then converges into a cross-hair image after passing through the additional objective lens 11c and the glass 7 to be measured (dotted line) in sequence, and this image is imaged on the cross reticle through the microscope objective 6, and the cross-hair and the reticle are imaged on the CCD1 together after passing through the electron eyepiece 2.
Referring to fig. 4 (schematic diagram of black solid line), when the LED illumination source 10 is out of 1 focal length of the condenser 9, the light emitted from the LED illumination source is changed into convergent light by the condenser, passes through the reflecting prism 8, and converges into a cross-hair image after passing through the glass 7 (solid line) to be measured, and the image is imaged on the cross reticle by the microscope objective 6 and focused by the electronic eyepiece 2 to be imaged on the CCD1 again. At this time, the handwheel needs to be adjusted to see a clear image.
Referring to fig. 4 (schematic dashed line), when the LED illumination source 10 is at the focus of the condenser 9, the light emitted from the LED illumination source is changed into parallel light by the condenser, passes through the reflecting prism 8, and converges into a cross-hair image after passing through the glass 7 (dashed line) to be measured, and this image is imaged on the cross reticle by the microscope objective 6, and is focused by the electronic eyepiece 2 to be imaged on the CCD1 again.
Referring to fig. 5 (schematic diagram of dotted line), when the LED illumination source 10 is at the focus of the condenser 9, the light emitted from the LED illumination source is changed into parallel light by the condenser, passes through the reflecting prism 8, and is converged into a cross-hair image after passing through the additional objective lens 11a and the glass 7 to be measured (dotted line) in sequence, and the image is imaged on the cross reticle through the microscope objective lens 6, and the cross-hair and the reticle are imaged on the CCD1 together after passing through the electron eyepiece 2.
Referring to fig. 5 (schematic diagram of black solid line), when the LED illumination source 10 is at the focus of the condenser 9, the light emitted from the LED illumination source is changed into parallel light by the condenser, passes through the reflecting prism 8, and converges into a cross-hair image after passing through the additional objective lens 11b and the glass 7 to be measured (solid line) in sequence, and the image is imaged on the cross reticle through the microscope objective lens 6, and the cross-hair and the reticle are imaged on the CCD1 together after passing through the electronic eyepiece 2.
Referring to fig. 5 (schematic dotted line), when the LED radiation source 10 is at the focus of the condenser 9, the light emitted from the LED radiation source is changed into parallel light by the condenser, passes through the reflecting prism 8, and then converges into a cross-hair image after passing through the additional objective lens 11c and the glass 7 to be measured (dotted line) in sequence, and this image is imaged on the cross reticle through the microscope objective 6, and the cross-hair and the reticle are imaged on the CCD1 together after passing through the electron eyepiece 2.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various changes and modifications can be made without departing from the inventive concept of the present invention, and these changes and modifications are all within the scope of the present invention.
Claims (5)
1. A high-precision lens center deviation detection instrument is characterized by comprising an LED irradiation source emission system, a microscope system and a detected glass bearing seat, wherein the LED irradiation source emission system, the microscope system and the detected glass bearing seat are arranged on a base, the LED irradiation source emission system and the detected glass bearing seat are positioned on the same plane, and the microscope system is positioned above the detected glass bearing seat; the LED irradiation source emission system comprises an LED irradiation source and a condenser lens, and a light outlet of the LED irradiation source is provided with a cross wire; the microscope system comprises a microscope lens barrel body, a scale reticle is arranged in the microscope lens barrel, an electron eyepiece is arranged at the microscope eyepiece of the microscope lens barrel, and the electron eyepiece is connected with an external black-and-white monitor through a CCD (charge coupled device); the interior of the tested glass bearing seat is provided with a reflecting prism, the tested glass rotates relative to the tested glass bearing seat,
the measuring method of the high-precision lens decentration detecting instrument comprises the following steps: installing a measured lens on a rotary table, roughly adjusting an instrument to enable the measured lens and a microscope system to be basically located on the same optical axis, then opening an LED irradiation source switch, adjusting the microscope system, enabling light beams emitted by the LED irradiation source to sequentially pass through a cross wire and a condenser lens to become parallel light beams, enabling the parallel light beams to be reflected by a reflecting prism to enter the measured lens and to be imaged at the position where the focus of the measured lens and the focus of the microscope objective coincide, enabling the image to sequentially pass through a beam splitter, a scale reticle and an electronic eyepiece to be imaged on a CCD, adjusting a lens centering instrument until the reticle is clearly imaged in the CCD, observing the position relation between the reticle and the cross wire image in a black-and-white monitor, then rotating the measured lens, and reading an offset grid value; the measured glass bearing seat can rotate, the measured glass bearing seat is rotated at least twice in different directions, the grid value of the imaging offset of the cross wire during each rotation is observed, the eccentricity is obtained, and therefore the eccentricity is obtained;
the eccentricity is obtained by the following formula:
wherein C is eccentricity, P is offset grid value, the scale of the reticle is 0.1 mm/grid, and L is the distance from the measured lens to the reticle.
2. A high accuracy lens decentration detecting apparatus according to claim 1, wherein a beam splitter is provided inside the microscope tube between the graduation mark and the microscope objective, and the microscope tube is provided with an LED light source facing the beam splitter.
3. The apparatus according to claim 1, wherein the base has a vertical column, the vertical column has a support sliding with respect to the vertical column, the microscope tube is fixed on the support, and the support has a first fine-motion handwheel for controlling the support to slide.
4. A high accuracy lens decentration detection instrument according to claim 1, wherein the condenser lens is arranged in a guide rail, and a second fine-motion handwheel for controlling the movement of the condenser lens is arranged outside the guide rail.
5. The apparatus according to claim 1, wherein the glass holder to be measured moves relative to the base, and a third handwheel for controlling the movement of the glass holder to be measured is provided outside the glass holder to be measured.
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| CN109963142A (en) * | 2017-12-25 | 2019-07-02 | 广东虚拟现实科技有限公司 | Vision display system and method and head-wearing display device |
| CN109029928B (en) * | 2018-07-10 | 2023-12-12 | 张家港市光学仪器有限公司 | Microscope objective center inspection device |
| WO2020073346A1 (en) * | 2018-10-11 | 2020-04-16 | 广州博冠光电科技股份有限公司 | Digital laser holography-based fast lens center misalignment testing device, and method |
| CN109283650B (en) * | 2018-11-16 | 2023-08-15 | 苏州巨目光学科技有限公司 | Back reflecting device |
| CN109883361A (en) * | 2019-02-23 | 2019-06-14 | 西安昂科光电有限公司 | A method of realizing that optical module centre deviation is tested using high-precision guide rail |
| CN110428463B (en) * | 2019-06-04 | 2021-09-14 | 浙江大学 | Method for automatically extracting center of image in out-of-focus fuzzy centering of aspheric optical element |
| CN110440929B (en) * | 2019-09-17 | 2021-03-16 | 昆明北方红外技术股份有限公司 | Thermal imager installation reference surface deviation elimination installation and adjustment method |
| CN111197967A (en) * | 2020-01-13 | 2020-05-26 | 苏州大学 | Center deviation measuring device and method based on liquid lens |
| CN112697054A (en) * | 2020-12-10 | 2021-04-23 | 无锡鑫巨宏智能科技有限公司 | Microlens rise measuring device and method |
| CN115289973B (en) * | 2022-09-29 | 2022-12-09 | 南通环球光学仪器有限公司 | Detector for detecting center alignment degree of reticle assembly |
| CN117213406B (en) * | 2023-11-09 | 2024-01-30 | 南京施密特光学仪器有限公司 | Device and method for detecting parallelism of emergent light of collimator |
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| JP4774332B2 (en) * | 2006-06-06 | 2011-09-14 | 富士フイルム株式会社 | Eccentricity measurement method |
| CN201096611Y (en) * | 2007-11-08 | 2008-08-06 | 西安工业大学 | Aspheric lens eccentric measuring apparatus |
| CN204301970U (en) * | 2014-12-09 | 2015-04-29 | 南京东利来光电实业有限责任公司 | Lens centre detector |
| CN104833319A (en) * | 2015-04-15 | 2015-08-12 | 中国科学院苏州生物医学工程技术研究所 | System and method for measuring central deviation of lens |
| CN204831226U (en) * | 2015-08-14 | 2015-12-02 | 西安工业大学 | A optics light path for detection lens center is inclined to one side and optical detection device thereof |
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