CN107228710B - A kind of quantum efficiency of LED measuring device and its measurement method - Google Patents
A kind of quantum efficiency of LED measuring device and its measurement method Download PDFInfo
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- CN107228710B CN107228710B CN201710383842.3A CN201710383842A CN107228710B CN 107228710 B CN107228710 B CN 107228710B CN 201710383842 A CN201710383842 A CN 201710383842A CN 107228710 B CN107228710 B CN 107228710B
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- 238000000691 measurement method Methods 0.000 title claims abstract description 10
- 238000005259 measurement Methods 0.000 claims abstract description 7
- 238000010438 heat treatment Methods 0.000 claims description 3
- 230000013011 mating Effects 0.000 claims description 3
- 230000003287 optical effect Effects 0.000 claims description 2
- 238000000034 method Methods 0.000 description 4
- 239000000446 fuel Substances 0.000 description 3
- 239000004065 semiconductor Substances 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 235000013399 edible fruits Nutrition 0.000 description 1
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- 238000005286 illumination Methods 0.000 description 1
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- 238000001228 spectrum Methods 0.000 description 1
- 238000001931 thermography Methods 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/2803—Investigating the spectrum using photoelectric array detector
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/20—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using resistors, thermistors or semiconductors sensitive to radiation, e.g. photoconductive devices
- G01J5/22—Electrical features thereof
Abstract
A kind of quantum efficiency of LED measuring device and its measurement method, are related to light emitting diode.Device is equipped with computer, digital power table, temperature voltage input table, temperature control fixture, spectrometer and thermal infrared imager.Measurement method：Using quantum efficiency of LED measuring device；One group of temperature value T is set by temperature voltage input table, one group of temperature value of setting includes at least 5 different temperature value T；Different temperature control fixture temperature value T are obtained by temperature value and current value measurementSUnder light emitting diode one group of quantum efficiency η；By one group of measured quantum efficiency η, the relational graph of quantum efficiency η and temperature T under the conditions of different current value I are first drawn；The quantum efficiency (η ') in the case of eliminating heat affecting is obtained by formula.
Description
Technical field
The present invention relates to light emitting diodes, more particularly, to a kind of quantum efficiency of LED measuring device and its measurement
Method.
Background technology
In the past few years, light emitting diode (LED) technology is developed rapidly, and is widely used in backlight, is handed over
The fields such as ventilating signal lamp and general illumination ([1] Z.Q.Liu, T.B.Wei, E.Q.Guo, X.Y.Yi, L.C.Wang, J.X.Wang,
G.H.Wang,Y.Shi,I.Ferguson and J.M.Li,Appl.Phys.Lett.99,091104(2011)；[2]
M.E.Raypah,B.K.Sodipo,M.Devarajan,and F.Sulaiman,IEEE Trans.Electron Devices,
63,2790-2795,(2016)).When being worked due to semiconductor devices, especially power semiconductor, it will produce a large amount of
Heat causes the temperature at LED P N knots to increase, and PN junction temperature rise can cause light-emitting diode luminous efficiency to decline.It is accurate
The quantum efficiency when work of LED device constant temperature is really measured, it on the one hand can be with the quality of materials and device of analysis device
Internal structure, on the other hand be also practical application design in an important parameter.Constant temperature lower semiconductor quantum is measured at present
The method of efficiency mainly uses impulse method.The square-wave pulse that the method must use pulsewidth short, but still cannot prevent to shine completely
Temperature rise when diode operation, and due to the use of the pulse power, what light emitting diode was sent out is passage of scintillation light, and passage of scintillation light is adopted
It is big to collect difficulty.
Invention content
The purpose of the present invention is to provide that can eliminate, light emitting diode fuel factor influences, measuring device is simple and convenient to operate
A kind of quantum efficiency of LED measuring device and its measurement method.
The quantum efficiency of LED measuring device is equipped with computer, digital power table, temperature voltage input table, temperature control
Fixture, spectrometer and thermal infrared imager；Light emitting diode to be measured, the connection of digital power apparent source the two poles of the earth is clamped in the temperature control fixture
Light emitting diode to be measured, digital power table are electrically connected with mechatronics, computer is calculated with temperature voltage input table, temperature voltage input
The mating temperature sensor of table and heating plate are mounted on temperature control fixture, spectrometer and calculating mechatronics, infrared thermal imagery
Instrument and calculating mechatronics.
The quantum efficiency of LED measurement method includes the following steps：
1) quantum efficiency of LED measuring device is used；
2) one group of temperature value T is set by temperature voltage input table, one group of temperature value of setting includes at least 5 different temperature
Value T, the temperature value are less than the invalid temperature of light emitting diode to be measured, while by digital power table setting electric current value I, the electricity
Flow valuve I is less than the failure electric current of light emitting diode to be measured；
3) one group of set temperature value and set current value are pressed, measures obtain different temperature control fixture temperature values respectively
TSUnder light emitting diode one group of quantum efficiency η；
4) by one group of quantum efficiency η measured by step 3), first draw under the conditions of different current value I quantum efficiency η with
Then the relational graph of temperature T carries out fitting a straight line by following formula (1)：
η=λ1(I)-λ2(I)*T (1)
Obtain one group of λ corresponding with current value I1(I) and λ2(I) coefficient；
5) control temperature control fixture is temperature-resistant, and the output current of digital power table is made to start from scratch gradual increase, infrared
Thermal imaging system measures and records the temperature T (I) of light emitting diode, and the electric current of measurement is no more than the failure electric current of light emitting diode, then
It is fitted by following formula (2)：
T (I)=A+B*I (2)
6) the temperature-resistant of temperature control fixture is kept, so that the output current of digital power table is started from scratch gradual increase, spectrum
Instrument measures and records the quantum efficiency η of light emitting diode being influenced by heat, and the electric current of measurement is no more than the failure of light emitting diode
Electric current；
7) quantum efficiency (η ') in the case of eliminating heat affecting is obtained by formula (3)：
η '=η+B* ∫ λ2(I)dI. (3)。
Compared with the prior art, beneficial effects of the present invention are as follows：
Computer changes luminous two by the output signal for the commanded temperatures voltage input table prearranged by temperature control fixture
The junction temperature of pole pipe；Computer controls digital power table and applies electric current to light emitting diode；Thermal infrared imager and spectrometer test knot
Fruit feeds back to computer and preserves so as to post-processing.By indirect method, can measure light emitting diode eliminate heat affecting it
Quantum efficiency afterwards, included fuel factor influences when avoiding LED test under pulse current working condition；Luminous two
There are good linear relationships between the quantum efficiency and junction temperature of pole pipe.
Description of the drawings
Fig. 1 is the quantum efficiency of LED measuring device built of the embodiment of the present invention and uses schematic diagram.
Fig. 2 is that quantum efficiency of LED of the embodiment of the present invention measures quantum efficiency and temperature change relational graph.In Fig. 2
In exposition electric current as a result, abscissa be kelvin degree, ordinate is quantum efficiency.
Fig. 3 is the temperature-current graph of relation of light emitting diode of the embodiment of the present invention.In figure 3, temperature control fixture temperature
Value is arranged in 300K；Abscissa is electric current, and ordinate is kelvin degree.
Fig. 4 is the quantum efficiency and current relationship curve that light emitting diode of the embodiment of the present invention is influenced by heat at room temperature,
With the quantum efficiency and current relationship curve of removal heat affecting.In Fig. 4, abscissa is electric current, and ordinate is quantum efficiency.
Specific implementation mode
The invention will be further described with reference to the accompanying drawings and examples.
Measurement method described in the present embodiment, includes the following steps：
1) quantum efficiency measuring device is built
As shown in Figure 1, quantum efficiency measuring device is equipped with computer 1, digital power table 2, temperature voltage input table 3, temperature control
Fixture 4, spectrometer 6 and thermal infrared imager 7；
Light emitting diode 5 to be measured is clamped in temperature control fixture 4, and light emitting diode 5, number are surveyed in the reception of 2 two poles of digital power table
Word power meter 2 is electrically connected with computer 1, and computer 1 is electrically connected with temperature voltage input table 3, the mating temperature of temperature voltage input table 3
Degree sensor 31 and heating plate 32 be mounted on temperature control fixture 4, spectrometer 6 is electrically connected with computer 1, thermal infrared imager 7 and
Computer 1 is electrically connected；
2) one group of temperature value T is set by temperature voltage input table 3, one group of temperature value 300K, 305K of setting, 310K, 315K,
320K, 325K and 330K, these temperature values are less than the invalid temperature of light emitting diode 5 to be measured, while being set by digital power table 2
Current value 1mA is measured and is obtained one group of corresponding quantum efficiency value of the light emitting diode under different temperatures value；
3) by one group of quantum efficiency value measured by step 2), the relational graph of quantum efficiency and temperature is first drawn, then
Fitting a straight line is carried out by following formula (1)：
η=λ1(I)-λ2(I)*T (1)
Obtain one group of λ corresponding with current value (I)1(I) and λ2(I) coefficient；
4) gradually increase current value, repeat step 2) with 3), obtain the quantum corresponding to different temperatures value under different electric currents
Efficiency value and a series of λs corresponding with current value (I)1(I) and λ2(I) coefficient, as shown in Figure 2；
5) control temperature control fixture 4 is temperature-resistant, so that the output current of digital power table 2 is started from scratch and gradually increases to
300mA, thermal infrared imager 7 measure and record the temperature T (I) of light emitting diode 5, as shown in Figure 3.The electric current of measurement is no more than hair
The failure electric current of optical diode 5, then be fitted by following formula (2)：
T (I)=A+B*I (2)
Obtain A, B coefficient value.
6) the temperature-resistant of temperature control fixture 4 is kept, so that the output current of digital power table 2 is started from scratch gradual increase, light
Spectrometer 6 measures and records the quantum efficiency η of light emitting diode 5 being influenced by heat, and the electric current of measurement is no more than light emitting diode 5
Fail electric current.
7) quantum efficiency (η ') in the case of eliminating heat affecting can be obtained by formula (3)：
η '=η+B* ∫ λ2(I)dI. (3)。
Fig. 4 is the quantum efficiency and current relationship curve that light emitting diode was influenced by heat and excluded heat affecting.It can be seen by Fig. 4
Go out, by light emitting diode heat affecting, quantum efficiency is relatively low.Quantum efficiency can increase after eliminating heat affecting.
Measurement method described in the present embodiment can eliminate the influence of light emitting diode fuel factor, obtain light emitting diode without thermal effect
The quantum efficiency answered.
Claims (1)
1. quantum efficiency of LED measurement method, it is characterised in that include the following steps：
1) quantum efficiency of LED measuring device is used, the quantum efficiency of LED measuring device, which is equipped with, to be calculated
Machine, digital power table, temperature voltage input table, temperature control fixture, spectrometer and thermal infrared imager；Hair to be measured is clamped in the temperature control fixture
Optical diode, digital power apparent source the two poles of the earth connect light emitting diode to be measured, digital power table and calculating mechatronics, computer
It is electrically connected with temperature voltage input table, the mating temperature sensor of temperature voltage input table and heating plate are mounted on temperature control fixture
On, spectrometer and calculating mechatronics, thermal infrared imager and calculating mechatronics；
2) one group of temperature value T being set by temperature voltage input table, one group of temperature value of setting includes at least 5 different temperature value T,
The temperature value is less than the invalid temperature of light emitting diode to be measured, while by digital power table setting electric current value I, the current value
I is less than the failure electric current of light emitting diode to be measured；
3) one group of set temperature value and set current value are pressed, measures obtain different temperature control fixture temperature value T respectivelySUnder
Light emitting diode one group of quantum efficiency η；
4) by one group of quantum efficiency η measured by step 3), quantum efficiency η and temperature T under the conditions of different current value I is first drawn
Relational graph, then pass through following formula (1) carry out fitting a straight line：
η=λ1(I)-λ2(I)*T (1)
Obtain one group of λ corresponding with current value I1(I) and λ2(I) coefficient；
5) control temperature control fixture is temperature-resistant, so that the output current of digital power table is started from scratch gradual increase, infrared thermal imagery
Instrument measures and records the temperature T (I) of light emitting diode, and the electric current of measurement is no more than the failure electric current of light emitting diode, then passes through
Following formula (2) are fitted：
T (I)=A+B*I (2)
6) the temperature-resistant of temperature control fixture is kept, the output current of digital power table is made to start from scratch gradual increase, spectrometer is surveyed
The quantum efficiency η of light emitting diode being influenced by heat is measured and records, the electric current of measurement is no more than the failure electric current of light emitting diode；
7) quantum efficiency (η ') in the case of eliminating heat affecting is obtained by formula (3)：
η '=η+B* ∫ λ2(I)dI. (3)。
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