CN102565654A - Measurement system and measuring method for derating curve of LED (light-emitting diode) - Google Patents
Measurement system and measuring method for derating curve of LED (light-emitting diode) Download PDFInfo
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- CN102565654A CN102565654A CN2010106221885A CN201010622188A CN102565654A CN 102565654 A CN102565654 A CN 102565654A CN 2010106221885 A CN2010106221885 A CN 2010106221885A CN 201010622188 A CN201010622188 A CN 201010622188A CN 102565654 A CN102565654 A CN 102565654A
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Abstract
The invention relates to a measurement system and a measurement method for a derating curve of an LED (light-emitting diode), belonging to the technical field of detection on thermal properties of semiconductor optoelectronic devices. According to the measurement system disclosed by the invention, the LED to be tested, a thermocouple and a clamp are arranged in a constant-temperature oven, and the LED to be tested and the thermocouple are arranged in the same position on the clamp. A digital source meter is connected with the LED to be tested, and a digital universal meter is connected with the thermocouple. The digital source meter, the digital universal meter, the clamp and the constant-temperature oven are respectively connected with a computer. The digital source meter is used for providing forward current for driving the LED to be tested; the constant-temperature oven is used for providing a stable environmental temperature; the thermocouple is used for detecting the actual environmental temperature in the vicinity of the LED to the tested; the digital universal meter is used for patrol inspection on the resistance of the thermocouple; and the computer is responsible for collecting and processing related data and outputting the graphical derating curve to a user. Compared with the prior art, the measurement system and method disclosed by the invention have the advantages of high efficiency, accuracy and a wide range of applications.
Description
Technical field
The invention belongs to the thermal property detection technique field, particularly LED junction temperature of semiconductor photoelectric device and the measuring system and the measuring method of electric current derate curve.
Background technology
LED is the abbreviation of English Light Emitting Diode, is translated into light emitting diode.By the end of being that the luminescence efficiency of global commerce white light LEDs product has reached about 150lm/W, is about 2 times of fluorescent light light efficiency at present; And the white light LEDs light efficiency under the laboratory condition is more up to about 200lm/W.Life-span can reach more than 5～100,000 hours.Remarkable quality and the extensively approvals of acquisition in worldwide of great market value such as the energy-saving and environmental protection of LED, long-life.
Although the electro-optical efficiency of LED is very high, still have the fraction electric energy to convert heat energy into, add the heat energy that the photon that do not extract is produced in the continuous loss of device inside, all will increase the junction temperature of LED device.Too high junction temperature can be to the parameter generating damaging influences such as spectrum, luminous power, life-span and reliability of device.Therefore, implement effective thermal management and just become the important topic in LED device or the lamp system design, particularly be accompanied by the continuous lifting of LED working current and power.Electric current derate curve is a kind of effective workaround in the thermal management just.
Electric current derate curve is meant, when environment temperature raises, realizes the control to junction temperature for the junction temperature that guarantees LED is no more than the way that the maximum functional junction temperature takes to reduce forward current.Forward current along with the environment temperature increase is expressed with graphical curve from the process that maximum operating currenbt begins to reduce gradually, has just been formed electric current derate curve.Electric current derate curve is one of evaluation index of LED designs, Design of Luminaires, also is the important evidence of practical applications simultaneously, such as, use intelligent chip accurate, safe drive current to be provided under the varying environment temperature as LED.In addition, electric current derate curve has become indispensable performance parameter collection of illustrative plates in LED device or the light fixture product description.So choosing accurately and efficiently measuring system and algorithm, to obtain electric current derate curve significant.At present, domestic and international none routine patent still relates to the measuring system and the measuring method of LED electric current derate curve.
In addition, need to prove that the measurement of electric current derate curve is the prerequisite that is measured as with the LED junction temperature.Furthermore, electric current derate curve is to come through derivation, calculating to junction temperature and forward current change curve.
Report that with Chinese patent common method has about the existing many documents of the measurement of LED junction temperature: the 1. k-factor method of forward voltage; 2. the pulse scale method of forward voltage (document: Y.Xi, E.F.Schubert, Applied Physics Letters, Vol.85, No.12, Page:2163～2165; Chinese patent: CN 10170101854A); 3. pin method; 4. electroluminescence peakdeviation method; 5. blue Bai Bifa; 6. infrared photography method or the like.Wherein, method 1., measuring accuracy 3.～5. is lower; The device form that 6. method only exposes led chip is effective, then can't implement to measure for general packaging or light fixture; Method measuring accuracy 2. is higher, and the scope of application is wider, but calculates for the junction temperature under a plurality of strength of current, and it is comparatively loaded down with trivial details that this method seems.
Summary of the invention
The deficiency that exists to LED junction temperature measurement in the above-mentioned prior art, and the blank of LED derate curved measurement, the present invention aims to provide a kind of measuring system and measuring method of LED derate curve, makes that it has efficiently, accurate, advantage that the scope of application is extensive.
In order to reach the foregoing invention purpose, technical scheme of the present invention realizes as follows:
A kind of measuring system of LED derate curve, its design feature are that it comprises digital source table, constant temperature roaster, thermopair, anchor clamps, digital multimeter, computing machine and LED to be measured.Said LED to be measured, thermopair and anchor clamps place in the constant temperature roaster, and LED to be measured and thermopair place the same position on the anchor clamps.Use four-wire method to connect digital source table and LED to be measured, use four-wire method to connect digital multimeter and thermopair, four-wire method is a kind of connection mode of digital source table, is convenient to accurately measure the voltage at measured device two ends.Respectively digital source table, digital multimeter, anchor clamps and constant temperature roaster are connected with computing machine.The digital source table provides the forward current that drives LED to be measured and measures forward voltage simultaneously; Constant temperature roaster is that LED to be measured provides stable environment temperature; Near the actual environment temperature of position it when thermopair is used to survey LED work to be measured; Digital multimeter is used to patrol and examine the resistance size of thermopair and obtain instant environment temperature; The computing machine that Survey Software is housed is the control center of total system, be responsible for to collect, handles related data, and to the derate curve of user's output patternization.
In above-mentioned measuring system, said LED to be measured is led chip or passes through encapsulated LED device, light fixture.
In above-mentioned measuring system, said digital source table possesses the function in pulse dc power and constant direct current source, and the single pulse width that it produced answers≤10
-2S, dutycycle answers≤0.1%, and the current source error answers≤10
-3A, voltage measurement error answers≤10
-1V; The resistance measurement error of said digital multimeter is answered≤1 Ω; The measuring error of thermopair is answered≤1 ℃
In above-mentioned measuring system, the inner mounting temperature detector of said constant temperature roaster carries out circulatory monitoring to baking temperature, and monitor temperature is outputed to computing machine.
In above-mentioned measuring system, said anchor clamps are to be that 20～150 ℃ pcb board forms by the heat resisting temperature scope, a plurality of device slots are set on the anchor clamps and the auxiliary circuit that possesses addressing conducting function is housed, and be responsible for controlling the addressing conducting of measured device by computing machine.
A kind of measuring method of LED derate curve, it uses and comprises digital source table, constant temperature roaster, thermopair, anchor clamps, digital multimeter, computing machine and LED to be measured, the steps include:
1. be placed in the same position on the anchor clamps to LED to be measured and thermopair, and put into constant temperature roaster together; Use four-wire method to connect digital source table and LED to be measured, use four-wire method to connect digital multimeter and thermopair; And respectively digital source table, digital multimeter, anchor clamps and constant temperature roaster are connected with computing machine;
2. open the digital source table, adopt the direct supply If of low duty ratio, short pulse to drive LED to be measured, pulse width≤10
-2S, dutycycle≤0.1%; Under the certain situation of If, rising constant temperature roaster temperature is to preset numerical point, treat that thermopair is surveyed the actual environment temperature stabilization after, the numerical value that records through the computer acquisition digital multimeter; Simultaneously, gather the forward voltage that the digital source table records LED to be measured, obtain the data point of a forward voltage and environment temperature; After this, continue the rising constant temperature roaster, gather corresponding forward voltage and environment temperature in the same way to next target temperature; At last, the plurality of data point that collects is carried out the linear fit of least square method, obtain straight-line equation V
f=K
1T
a+ b; Wherein, V
fThe forward voltage of representing LED to be measured, K
1Being the slope of system of straight lines equation, is a constant, T
aBe environment temperature;
3. constant temperature roaster is heated to a certain temperature value; After treating that the detected actual environment temperature of thermopair is also stable; Still the direct supply with low duty ratio, short pulse drives LED to be measured, but strength of current If is changed into one group of default value, gathers the corresponding forward voltage numerical value of next group; Then, with these forward voltage values substitution straight-line equations V
f=K
1T
a+ b obtains the values of intercept b (If) of one group of straight-line equation, and then obtains system of straight lines equation V
f=K
1T
a+ b (I
f); Because the direct supply of low duty ratio, short pulse almost can be ignored the self-heating effect that LED to be measured produces, so above-mentioned system of straight lines equation also can be expressed as V
f=K
1T
j+ b (I
f); Wherein, T
jThe junction temperature of representing LED to be measured;
4. the constant temperature roaster temperature is set at certain fixed value, treat that the detected environment temperature Ta of thermopair is also stable after, use the constant direct current source of strength of current If to drive LED to be measured; After LED to be measured reaches stable thermal equilibrium state, gather the forward voltage Vf numerical value of LED to be measured, and with this numerical value substitution system of straight lines equation V
f=K
1T
j+ b (I
f) definite junction temperature T of LED to be measured in such cases
jAfter this, change I
fSize obtains LED junction temperature T to be measured
jWith I
fThe data point that changes is carried out the linear fit of least square method to data point, obtains straight-line equation T
j=K
2I
f+ T
aWherein, K
2Being the slope of system of straight lines equation, is a constant;
5. change environment temperature T
aBe one group of fixed value, straight-line equation T
j=K
2I
f+ T
aBecome system of straight lines equation T
j=K
2I
f+ T
a
6. according to the maximum forward current value I that allows under the LED normal operating conditions to be measured
F-maxWith maximum junction temperature T
J-max, through system of straight lines equation T
j=K
2I
f+ T
aFind the solution the environment temperature T that electric current derate knee point occurs
A-turn, i.e. T
A-turn=T
J-max-K
2I
F-max
7. last, reduce the starting point and the final position coordinate (I in stage at electric current according to the derate curve
F-max, T
A-turn) and (0, T
J-max) to calculate the straight-line equation that electric current reduces be I
f=(1/K
2) (T
a-T
J-max); Through the just exportable patterned LED derate curve of computer technology.
Especially, the invention provides corresponding test method, and combine method of testing to provide algorithm flow, with this programming foundation as testing system software.
Measuring system that the present invention adopted and embodiment have been simplified measuring process, have taken into account the precision of measurement module simultaneously.And the present invention adopts each ingredient of computer integrated, and the enforcement of automatic control survey process utilizes related algorithm that image data is handled, and at last measurement result is exported with the mode at software through pictures interface.Therefore, the present invention has the characteristics easy, efficient, accurate, that applicability is wide.
Below in conjunction with accompanying drawing and embodiment the present invention is described further.
Description of drawings
Fig. 1 is the structural representation of measuring system of the present invention;
Fig. 2 is the process flow diagram of measuring method of the present invention;
Fig. 3 is the system of straight lines equation V of measuring method of the present invention
f=K
1T
j+ b (I
f) graph of a relation;
Fig. 4 is the system of straight lines equation T of measuring method of the present invention
j=K
2I
f+ T
aGraph of a relation;
Fig. 5 is the straight-line equation I of measuring method of the present invention
f=(1/K
2) (T
a-T
J-max) graph of a relation.
Embodiment
Referring to Fig. 1, measuring system of the present invention comprises digital source table 1, constant temperature roaster 2, thermopair 5, anchor clamps 4, digital multimeter 6, computing machine 7 and employing led chip or passes through the LED3 to be measured of encapsulated LED device, light fixture.LED3 to be measured, thermopair 5 and anchor clamps 4 place in the constant temperature roaster 2, and LED3 to be measured and thermopair 5 place the same position on the anchor clamps 4.Use four-wire method to connect digital source table 1 and LED3 to be measured, use four-wire method to connect digital multimeter 6 and thermopair 5, respectively digital source table 1, digital multimeter 6, anchor clamps 4 and constant temperature roaster 2 are connected with computing machine 7.Digital source table 1 provides the forward current that drives LED3 to be measured and measures forward voltage simultaneously, and digital source table 1 possesses the function in pulse dc power and constant direct current source, and the single pulse width that it produced answers≤10
-2S, dutycycle answers≤0.1%, and the current source error answers≤10
-3A, voltage measurement error answers≤10
-1V.Constant temperature roaster 2 provides stable environment temperature for LED3 to be measured, and its inner mounting temperature detector carries out circulatory monitoring to baking temperature, and monitor temperature is outputed to computing machine 7.Near the actual environment temperature of position it when thermopair 5 is used to survey LED3 work to be measured.Digital multimeter 6 is used to patrol and examine the resistance size of thermopair 5 and obtain instant environment temperature, and its resistance measurement error should≤1 Ω.The measuring error of thermopair 5 is answered≤1 ℃.The computing machine 7 that Survey Software is housed is control centers of total system, be responsible for to collect, handles related data, and to the derate curve of user's output patternization.Anchor clamps 4 are to be that 20～150 ℃ pcb board forms by the heat resisting temperature scope, a plurality of device slots are set on the anchor clamps 4, and the auxiliary circuit that possesses addressing conducting function is housed.
A preferred embodiment of the present invention is explained as follows:
Digital source table 1 is selected Keithley Sourcemeter 2601A for use, and constant temperature roaster 2 is selected ESPEC PC200 for use, and platinum alloy thermopair 5 is selected model Pt100, and digital multimeter 6 is selected Keithley Multimeter 2000 for use, and LED3 to be measured is a GaN base blue light diode.
Referring to Fig. 2, the measuring system under above-mentioned type selecting will be implemented according to following measuring method:
1. be placed in the same position on the anchor clamps 4 to LED3 to be measured and thermopair 5, and put into constant temperature roaster 2 together; Use four-wire method to connect digital source table 1 and LED3 to be measured, use four-wire method to connect digital multimeter 6 and thermopair 5; And respectively digital source table 1, digital multimeter 6, anchor clamps 4 and constant temperature roaster 2 are connected computing machine 7 addressing conductings LED3 to be measured with computing machine 7.
2. open digital source table 1, adopt the direct supply of low duty ratio, short pulse to drive LED3 to be measured, strength of current is set at 50mA, and pulse width is 10
-4S, dutycycle is 0.05%.Constant temperature roaster 2 temperature are elevated to 120 ℃ from 23 ℃ of room temperatures, and the intensification step-length is 20 ℃.The actual environment temperature of LED3 to be measured is gathered digital multimeter 6 through computing machine 7 and is obtained, and before the image data, should guarantee that actual environment temperature keeps stable.So just, obtain the data point of one group of forward voltage and environment temperature, discrete point as shown in Figure 3.At last, the plurality of data point that collects is carried out the linear fit of least square method, obtain straight-line equation V
f=2.39*T
a+ b, V
fUnit be mV.
3. let constant temperature roaster 2 be heated to 60 ℃, treat thermopair 5 detected actual environment temperature after stablizing near 60 ℃, still using pulse width is 10
-4S, dutycycle is that 0.05% direct supply drives LED3 to be measured, and gathers down I
fChange into 20,40,60,80, one group of forward voltage behind the 100mA.With these forward voltage values substitution straight-line equations V
f=2.39*T
a+ b obtains the values of intercept b (I of one group of straight-line equation
f), and then obtain system of straight lines equation V
f=2.39*T
a+ b (I
f), in Fig. 3, shown the represented straight line of these equations.Because the direct supply of low duty ratio, short pulse almost can be ignored " self-heating effect " that LED3 to be measured produces, therefore, above-mentioned system of straight lines equation also can be expressed as V
f=2.39*T
j+ b (I
f).
4. constant temperature roaster 2 is cooled to room temperature, treat that thermopair 5 detected environment temperatures are stabilized in room temperature after, using strength of current respectively is 10,20,40,50,60,80, the constant direct current source of 100mA drives LED3 to be measured.After LED3 work to be measured reaches the steady heat equilibrium state, gather its a series of forward voltage V down respectively
fNumerical value, and with these numerical value substitution system of straight lines equations V
f=2.39*T
a+ b (I
f), confirm one group of junction temperature T of LED3 to be measured in such cases
jAt last data point is carried out the linear fit of least square method, obtain straight-line equation T
j=0.94*I
f+ T
a
5. change environment temperature T
aBe 30,40,50,60,70 ℃, straight-line equation T
j=0.94*I
f+ T
aBecome system of straight lines equation T
j=0.94*I
f+ T
a, specifically as shown in Figure 4.
6. set the maximum forward current value I that allows under the LED3 normal operating conditions to be measured
F-max=50mA and maximum junction temperature T
J-max=90 ℃, through system of straight lines equation T
j=0.94*I
f+ T
a, find the solution the environment temperature T that electric current derate knee point occurs
A-turn=43.6 ℃, as shown in Figure 4.
7. last, it is I that the starting point that reduces the stage according to the derate curve at electric current and final position coordinate (50mA, 43.6 ℃) and (0mA, 90 ℃) calculate the straight-line equation in electric current reduction stage
f=-1.06* (T
a-90), the form of derate curve is as shown in Figure 5.
Example embodiment of the present invention is below just disclosed.For the person skilled of this area thought according to instance of the present invention, the change part of on embodiment and range of application, being made also all belongs to protection scope of the present invention.
Claims (6)
1. the measuring system of a LED derate curve; It is characterized in that; It comprises digital source table (1), constant temperature roaster (2), thermopair (5), anchor clamps (4), digital multimeter (6), computing machine (7) and LED to be measured (3); Said LED to be measured (3), thermopair (5) and anchor clamps (4) place in the constant temperature roaster (2); LED to be measured (3) and thermopair (5) place the same position on the anchor clamps (4), use four-wire method to connect digital source table (1) and LED to be measured (3), use four-wire method to connect digital multimeter (6) and thermopair (5); Respectively digital source table (1), digital multimeter (6), anchor clamps (4) and constant temperature roaster (2) are connected with computing machine (7), digital source table (1) provides the forward current that drives LED to be measured (3) and measures forward voltage simultaneously; Constant temperature roaster (2) provides stable environment temperature for LED to be measured (3); Near the actual environment temperature of its position when thermopair (5) is used to survey LED to be measured (3) work; Digital multimeter (6) is used to patrol and examine the resistance size of thermopair (5) and obtain instant environment temperature; The computing machine (7) that Survey Software is housed is the control center of total system, be responsible for to collect, handles related data, and to the derate curve of user's output patternization.
2. according to the described measuring system of claim 1, it is characterized in that said LED to be measured (3) is led chip or passes through encapsulated LED device, light fixture.
3. according to claim 1 or 2 described measuring systems, it is characterized in that said digital source table (1) possesses the function in pulse dc power and constant direct current source, the single pulse width that it produced answers≤10
-2S, dutycycle answers≤0.1%, and the current source error answers≤10
-3A, voltage measurement error answers≤10
-1V; The resistance measurement error of said digital multimeter (6) is answered≤1 Ω; The measuring error of thermopair (5) is answered≤1 ℃.
4. according to the described measuring system of claim 3, it is characterized in that the inner mounting temperature detector of said constant temperature roaster (2) carries out circulatory monitoring to baking temperature, and monitor temperature is outputed to computing machine (7).
5. according to the described measuring system of claim 4; It is characterized in that; Said anchor clamps (4) are to be that 20～150 ℃ pcb board forms by the heat resisting temperature scope; A plurality of device slots are set on the anchor clamps (4) and the auxiliary circuit that possesses addressing conducting function is housed, and be responsible for the addressing conducting of control measured device by computing machine (7).
6. the measuring method of a LED derate curve, its uses and comprises digital source table (1), constant temperature roaster (2), thermopair (5), anchor clamps (4), digital multimeter (6), computing machine (7) and LED to be measured (3), the steps include:
1. be placed in the same position on the anchor clamps (4) to LED to be measured (3) and thermopair (5), and put into constant temperature roaster (2) together; Use four-wire method to connect digital source table (1) and LED to be measured (3), use four-wire method to connect digital multimeter (6) and thermopair (5); And respectively digital source table (1), digital multimeter (6), anchor clamps (4) and constant temperature roaster (2) are connected with computing machine (7); Computing machine (7) addressing conducting LED to be measured (3);
2. open digital source table (1), adopt the direct supply If of low duty ratio, short pulse to drive LED to be measured (3), pulse width≤10
-2S, dutycycle≤0.1%; Under the certain situation of If, rising constant temperature roaster (2) temperature is to preset numerical point, treat that thermopair (5) institute surveys the actual environment temperature stabilization after, the numerical value that records through computing machine (7) collection digital multimeter (6); Simultaneously, gather digital source table (1) and record the forward voltage of LED to be measured (3), obtain the data point of a forward voltage and environment temperature; After this, continue rising constant temperature roaster (2), gather corresponding forward voltage and environment temperature in the same way to next target temperature; At last, the plurality of data point that collects is carried out the linear fit of least square method, obtain straight-line equation V
f=K
1T
a+ b; Wherein, V
fThe forward voltage of representing LED to be measured (3), K
1Being the slope of system of straight lines equation, is a constant, T
aBe environment temperature;
3. constant temperature roaster (2) is heated to a certain temperature value; After treating that the detected actual environment temperature of thermopair (5) is also stable; Still the direct supply with low duty ratio, short pulse drives LED to be measured (3); But strength of current If is changed into one group of default value, and gather the corresponding forward voltage numerical value of next group; Then, with these forward voltage values substitution straight-line equations V
f=K
1T
a+ b obtains the values of intercept b (If) of one group of straight-line equation, and then obtains system of straight lines equation V
f=K
1T
a+ b (I
f); Because the direct supply of low duty ratio, short pulse almost can be ignored the self-heating effect that LED to be measured (3) produces, therefore, above-mentioned system of straight lines equation also can be expressed as V
f=K
1T
j+ b (I
f); Wherein, T
jThe junction temperature of representing LED to be measured (3);
4. constant temperature roaster (2) temperature is set at certain fixed value, treats the detected environment temperature T of thermopair (5)
aAfter also stable, use strength of current to be I
fThe constant direct current source drive LED to be measured (3); After LED to be measured (3) reaches the steady heat equilibrium state, gather the forward voltage V of LED to be measured (3)
fNumerical value, and with this numerical value substitution system of straight lines equation V
f=K
1T
j+ b (I
f) confirm the junction temperature T of LED to be measured in such cases (3)
jAfter this, change I
fSize obtains LED to be measured (3) junction temperature T
jWith I
fThe data point that changes is carried out the linear fit of least square method to data point, obtains straight-line equation T
j=K
2I
f+ T
aWherein, K
2Being the slope of system of straight lines equation, is a constant;
5. change environment temperature T
aBe one group of fixed value, straight-line equation T
j=K
2I
f+ T
aBecome system of straight lines equation T
j=K
2I
f+ T
a
6. according to the maximum forward current value I that allows under LED to be measured (3) normal operating conditions
F-maxWith maximum junction temperature T
J-max, through system of straight lines equation T
j=K
2I
f+ T
aFind the solution the environment temperature T that electric current derate knee point occurs
A-turn, i.e. T
A-turn=T
J-max-K
2I
F-max
7. last, reduce the starting point and the final position coordinate (I in stage at electric current according to the derate curve
F-max, T
A-turn) and (0, T
J-max) to calculate the straight-line equation that electric current reduces be I
f=(1/K
2) (T
a-T
J-max); Through the just exportable patterned LED derate curve of computer technology.
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Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103868613A (en) * | 2012-12-13 | 2014-06-18 | 青海天普太阳能科技有限公司 | LabVIEW-based LED junction temperature measurement method |
| CN104020405A (en) * | 2014-06-26 | 2014-09-03 | 厦门大学 | Pulse type power mode LED voltage-current-junction temperature characteristic testing device |
| CN105044583A (en) * | 2015-06-05 | 2015-11-11 | 江苏理工学院 | Test apparatus for LED junction temperature K coefficient |
| CN105840997A (en) * | 2016-04-21 | 2016-08-10 | 予众信息科技（上海）有限公司 | Design method for LED lamp |
| CN107505555A (en) * | 2017-09-06 | 2017-12-22 | 珠海格力电器股份有限公司 | Diode electrical characteristic curve drawing method and testing equipment |
| CN112649752A (en) * | 2020-11-25 | 2021-04-13 | 深圳市大能创智半导体有限公司 | Derating curve measuring method and system |
| CN113049947A (en) * | 2021-04-02 | 2021-06-29 | 西安电子科技大学 | Method for measuring I/V curve in IBIS model |
| US20220074795A1 (en) * | 2018-12-25 | 2022-03-10 | Ozyegin Universitesi | System for measuring junction temperature of photonics devices |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101701854A (en) * | 2009-11-18 | 2010-05-05 | 中国科学院上海技术物理研究所 | Method for detecting junction temperature of chip of LED lamp |
| CN201548657U (en) * | 2009-12-07 | 2010-08-11 | 国家电光源质量监督检验中心(上海) | Measuring unit for LED forward voltage drop and junction temperature curve |
| CN102193053A (en) * | 2010-03-08 | 2011-09-21 | 上海时代之光照明电器检测有限公司 | Method for measuring relation curve of forward voltage and junction temperature of LED (Light Emitting Diode) in lamp |
-
2010
- 2010-12-27 CN CN2010106221885A patent/CN102565654A/en active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101701854A (en) * | 2009-11-18 | 2010-05-05 | 中国科学院上海技术物理研究所 | Method for detecting junction temperature of chip of LED lamp |
| CN201548657U (en) * | 2009-12-07 | 2010-08-11 | 国家电光源质量监督检验中心(上海) | Measuring unit for LED forward voltage drop and junction temperature curve |
| CN102193053A (en) * | 2010-03-08 | 2011-09-21 | 上海时代之光照明电器检测有限公司 | Method for measuring relation curve of forward voltage and junction temperature of LED (Light Emitting Diode) in lamp |
Non-Patent Citations (1)
| Title |
|---|
| 刘畅: "二极管正相平均电流降额曲线的测试方法及分析", 《第十九界中国（天津）2005IT、网络、信息技术、电子、仪器仪表创新学术会议》 * |
Cited By (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103868613A (en) * | 2012-12-13 | 2014-06-18 | 青海天普太阳能科技有限公司 | LabVIEW-based LED junction temperature measurement method |
| CN104020405A (en) * | 2014-06-26 | 2014-09-03 | 厦门大学 | Pulse type power mode LED voltage-current-junction temperature characteristic testing device |
| CN105044583A (en) * | 2015-06-05 | 2015-11-11 | 江苏理工学院 | Test apparatus for LED junction temperature K coefficient |
| CN105840997A (en) * | 2016-04-21 | 2016-08-10 | 予众信息科技（上海）有限公司 | Design method for LED lamp |
| CN107505555A (en) * | 2017-09-06 | 2017-12-22 | 珠海格力电器股份有限公司 | Diode electrical characteristic curve drawing method and testing equipment |
| US20220074795A1 (en) * | 2018-12-25 | 2022-03-10 | Ozyegin Universitesi | System for measuring junction temperature of photonics devices |
| CN112649752A (en) * | 2020-11-25 | 2021-04-13 | 深圳市大能创智半导体有限公司 | Derating curve measuring method and system |
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