CN106199371B - Utilize the method and device of alternating-current pulse measurement AC-LED thermal resistance and junction temperature - Google Patents
Utilize the method and device of alternating-current pulse measurement AC-LED thermal resistance and junction temperature Download PDFInfo
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- CN106199371B CN106199371B CN201610884239.9A CN201610884239A CN106199371B CN 106199371 B CN106199371 B CN 106199371B CN 201610884239 A CN201610884239 A CN 201610884239A CN 106199371 B CN106199371 B CN 106199371B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2607—Circuits therefor
- G01R31/2632—Circuits therefor for testing diodes
- G01R31/2635—Testing light-emitting diodes, laser diodes or photodiodes
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
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- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
Abstract
Using the method and device of alternating-current pulse measurement AC-LED thermal resistance and junction temperature, it is related to alternating-current light emitting diode thermal resistance and junction temperature test.Signal generator, voltage/current amplifier, oscillograph, thermal station, current/voltage probe, integrating sphere, spectrometer are equipped with using the device that alternating-current pulse measures AC-LED thermal resistance and junction temperature；The input terminal of the output termination voltage/current amplifier of signal generator, AC-LED is surveyed in the output end reception of voltage/current amplifier, AC-LED to be measured is fixed on thermal station, current/voltage probe connects thermal station, the signal output end of current/voltage probe connects oscillograph, integrating sphere is connect with AC-LED to be measured, the optical power output termination spectrometer of integrating sphere.Junction temperature is had little influence on using positive and negative burst pulse, compares the square-wave signal of identical amplitude, adjustment heat sink temperature keeps the two amplitude equal, determines heat sink and the PN junction temperature difference and thermal resistance.
Description
Technical field
The present invention relates to alternating-current light emitting diode (AC-LED) thermal resistance and method for testing junction temperature, exchange more particularly, to utilizing
The method and device of impulsive measurement AC-LED thermal resistance and junction temperature.
Background technique
LED has many advantages, such as forth generation green light source, such as high reliablity, service life length, environmental protection and energy saving, small in size
Deng.Nowadays LED such as shows in numerous areas, decorates, illuminate and be widely used.Alternating-current light emitting diode (AC-LED) without
AC/DC conversion can be used directly in 220V (or 110V) alternating current.Application of the AC-LED on illuminating product, than traditional LED
It is all more energy saving with general light bulb and also more convenient in use.However the heat dissipation of AC-LED is a distinct issues,
How to keep AC-LED junction temperature in the range of a permission, is kept for the good light efficiency of AC-LED and stable service life, be always
Urgent problem.
The ununified standard of test to junction temperature at present, existing literature proposes a variety of junction temperature measurement methods, such as positive
Voltage method, pin method, infrared thermal imagery method, pulse current method etc. [Han-Youl Ryu, Kyoung-Ho Ha,
et.al.Measurement of junction temperature in GaN-based laser diodes using
voltage-temperature characteristics[J].Appl.Phys.Lett.,2005,87:093506.],
[H.Ishikawa,T.Fujiwara,K.Fukiwara,et.al.Accelerated aging test of Gal-xAlxAs
DH lasers [J] .APP.Phys.Lett., 1999,50:2518.] [Wen Huaijiang, Mu Tongsheng, impulse method measure LED junction temperature, heat
The research of appearance, photoelectric project, 2010,7,53-59.].Wherein infrared thermal imagery method measurement junction temperature is an eaily method,
But compared with the influence vulnerable to encapsulating structure, the application condition of measurement is big, and response speed is slower with respect to electric method, and device must be located
In the state not broken a seal.Forward voltage method is the method for using a kind of commonplace measurement junction temperature at present, forward voltage method tool
There is non-destructive.But since junction temperature is measured under low current state, when measurement, need to be from the heating shape of high current
State is rapidly switched to the test mode of low current, more demanding to equipment response speed, affects measuring accuracy.
Above method is not suitable for substantially mainly for direct-current LED, to AC-LED, is also compared the junction temperature research of AC-LED at present
Compared with shortcoming, has and peak wavelength alternating-current light emitting diode junction temperature detection method [is based on, Chinese invention is special based on peak wavelength survey junction temperature
Benefit, the patent No.: ZL201310091219.2], but to the AC-LED of different materials, peak wavelength displacement is not necessarily linear
, this method does not have versatility.Have and surveys a kind of junction temperature [test system for measuring AC-LED junction temperature using pulse current method
System and test method, patent of invention, publication No.: CN103424678A], but pulse letter is added in the method in AC wave shape
Number, normal working condition is not only disturbed, but also the heat that when single pulse signal is vulnerable to alternate current operation generates influences, and affects
The accuracy of test.
Summary of the invention
The purpose of the present invention is to provide a kind of devices using alternating-current pulse measurement AC-LED thermal resistance and junction temperature.
Another object of the present invention is to provide a kind of methods using alternating-current pulse measurement AC-LED thermal resistance and junction temperature.
The device for measuring AC-LED thermal resistance and junction temperature using alternating-current pulse is put equipped with signal generator, voltage/current
Big device, oscillograph, thermal station, current/voltage probe, integrating sphere, spectrometer；
The input terminal of the output termination voltage/current amplifier of the signal generator, the output of voltage/current amplifier
AC-LED to be measured is terminated, AC-LED to be measured is fixed on thermal station, and current/voltage probe connects thermal station, current/voltage probe
Signal output end connects oscillograph, and integrating sphere is connect with AC-LED to be measured, the optical power output termination spectrometer of integrating sphere.
The method using alternating-current pulse measurement AC-LED thermal resistance and junction temperature, comprising the following steps:
1) positive and negative burst pulse is applied to AC-LED to be measured, adjusts heat sink temperature, heat sink temperature is AC-LED junction temperature, is measured
The current or voltage amplitude of AC-LED, obtains the relationship of junction temperature and current or voltage, and fit linear formula under corresponding junction temperature；
2) it changes the square-wave signal with pulsion phase with amplitude and identical frequency into, measures heat sink temperature T at this timeHAnd electric current
I or voltage V amplitude, electrical power Pe=IV obtains corresponding same current or voltage pulse by the linear formula that step 1) obtains
Junction temperature T when drivingJ, and knot and the heat sink temperature difference are calculated, with the optical power P under integrating sphere and the spectrometer measurement square waveo, generation
Enter thermal resistance formula and calculates thermal resistance
3) the optical power P of AC-LED when measurement works in alternating currento, electrical power Pe(Pe=IVcos Φ), calculate the work
Make the junction temperature T under stateJ=TH+Rth(Pe-Po)。
In step 1), the positive and negative burst pulse can be voltage or current impulse, and amplitude is corresponding normally in exchange electrician
Virtual value under making；The current or voltage amplitude for measuring AC-LED under corresponding junction temperature surveys current amplitude under voltage pulse, electricity
Voltage magnitude is surveyed under stream pulse.
It is to be had little influence on using positive and negative burst pulse to junction temperature that the present invention, which surveys AC-LED junction temperature using alternating-current pulse, compares phase
With the square-wave signal of amplitude, adjusting heat sink temperature keeps the two amplitude equal, so that it is determined that heat sink and the PN junction temperature difference and thermal resistance.In reality
The AC-LED junction temperature to work under the AC signal of border is convenient to obtain by thermal resistance formula.
Main advantages of the present invention are as follows:
1) heating effect is small under burst pulse, and junction temperature and current/voltage amplitude have good linear relationship, can quickly determine narrow
Junction temperature size under pulse and square wave when same current/voltage magnitude.
2) by positive negative cycle respectively add a pulse make the AC-LED complete period shine, under equal conditions with square-wave signal
Current/voltage amplitude com parison when effect.Thermal resistance calculation is more reliable.
3) thermal resistance and junction temperature test separate, and the thermal resistance tested in the state of relatively stable avoids the influence of signal fluctuation,
Precision is higher, more reliable.According to the junction temperature fast response time under thermal resistance calculation actual working state.
Detailed description of the invention
Fig. 1 is the method flow diagram that the present invention measures AC-LED thermal resistance and junction temperature using alternating-current pulse.
Fig. 2 is the structure composition of the Installation practice of the present invention that AC-LED thermal resistance and junction temperature are measured using alternating-current pulse
Block diagram.
Fig. 3 is AC-LED of embodiment of the present invention junction temperature-current amplitude relation curve.
Specific embodiment
Following embodiment will the present invention is further illustrated in conjunction with attached drawing.
The present invention provides a kind of method of alternating-current pulse measurement AC-LED thermal resistance and junction temperature, pulse signal such as Fig. 1
Shown (by taking voltage pulse as an example), positive negative cycle all add a pulse to be to allow the AC-LED complete period to shine respectively.
The device for measuring AC-LED thermal resistance and junction temperature using alternating-current pulse is put equipped with signal generator 1, voltage/current
Big device 2, oscillograph 4, thermal station 5, current/voltage probe 6, integrating sphere 7, spectrometer 8；
The input terminal of the output termination voltage/current amplifier 2 of the signal generator 1, voltage/current amplifier 2
AC-LED 3 is surveyed in output end reception, and AC-LED 3 to be measured is fixed on thermal station 5, and current/voltage probe 6 connects thermal station 5, electricity
The signal output end of stream/voltage probe 6 connects oscillograph 4, and integrating sphere 7 is connect with AC-LED 3 to be measured, and the optical power of integrating sphere 7 is defeated
Spectrometer 8 is terminated out.
The present invention best experimental result in order to obtain, the selection lesser pulse of pulsewidth as far as possible, this sentences an operating voltage
For the AC-LED bare die sample of 100V, applying the pulse that pulsewidth is 12 μ s, (experiment discovery, pulsewidth are available within 200 μ s
More consistent experimental result).In order to verify feasibility of the invention, comparison is directly tested with thermocouple.
Below with reference to embodiment and attached drawing, the present invention will be described in detail (referring to fig. 2):
1) AC-LED sample 3 is fixed on thermal station 5, the 50Hz alternating-current pulse electricity that with amplitude be 100V, pulsewidth is 12 μ s
The bright sample of pressure point, adjusts heat sink temperature within the scope of 30~95 DEG C, records the electric current width of corresponding A C-LED under different temperatures respectively
Value.Heat sink temperature AC- at 29.6,34.4,43.5,53.3,61.1,71,76.5,92.7 DEG C is had recorded in the present embodiment
The current amplitude (being shown in Table 1) of LED.
Table 1
2) fitting pulse current amplitude and junction temperature linear relation (see Fig. 3): TJ=4.2881I-15.028.
3) in corresponding heat sink temperature THUnder (29.6 DEG C), with identical amplitude (100V), the square wave of identical frequency (50Hz) is driven
Dynamic AC-LED, records current amplitude size I at this times, electrical power P e=IsV.The square wave is measured with integrating sphere 7 and spectrometer 8
Under optical power Po.
4) relational expression obtained according to step 2), by current amplitude IsCalculate junction temperature T under this conditionJ.Then knot and heat sink temperature
Poor Δ T=TJ-TH。
5) according to thermal resistance formulaCalculate thermal resistance Rth=24.9 DEG C/W.
6) sample (heat sink temperature is set as 29.6 DEG C) is driven with 50Hz sinusoidal ac signal, friendship can be extrapolated by thermal resistance
The junction temperature under signal driving is flowed, and (the results are shown in Table 2) compared with the result that thermocouple is directly tested.
Table 2
The result shows that the two test result relative error, within 1.2%, the junction temperature result that the present invention obtains is reliable.
Claims (2)
1. utilizing the method for alternating-current pulse measurement AC-LED thermal resistance and junction temperature, it is characterised in that measured using using alternating-current pulse
The device of AC-LED thermal resistance and junction temperature, the device for measuring AC-LED thermal resistance and junction temperature using alternating-current pulse are equipped with signal
Device, voltage/current amplifier, oscillograph, thermal station, current/voltage probe, integrating sphere, spectrometer；
The input terminal of the output termination voltage/current amplifier of the signal generator, the output termination of voltage/current amplifier
AC-LED to be measured, AC-LED to be measured are fixed on thermal station, and current/voltage probe connects thermal station, the signal of current/voltage probe
Output termination oscillograph, integrating sphere are connect with AC-LED to be measured, the optical power output termination spectrometer of integrating sphere；
It the described method comprises the following steps:
1) positive negative cycle burst pulse is applied to AC-LED to be measured, heat sink temperature is AC-LED junction temperature, adjusts heat sink temperature, measures
The current or voltage amplitude of AC-LED, obtains the relationship of junction temperature and current or voltage, and fit linear formula under corresponding junction temperature；
2) changing into has forward and reverse periodic signal of square wave, measurement with amplitude and identical frequency with voltage or current, narrow pulsion phase
The heat sink temperature T of AC-LED at this time outHWith electric current I or voltage V amplitude, electrical power Pe=IV, the linear public affairs obtained by step 1)
Formula obtains junction temperature T when corresponding same current or voltage burst pulse driveJ, and AC-LED knot and the heat sink temperature difference are calculated, finally
With the optical power P under integrating sphere and the spectrometer measurement square wave0, substitute into thermal resistance formula and calculate thermal resistance
3) the optical power P of AC-LED when measurement works in alternating current0, electrical power Pe, Pe=IVcos Φ, calculates the working condition
Under junction temperature TJ=TH+Rth(Pe-Po), cos Φ is power factor,When for work the voltage of alternating message source used and electric current it
Between phase difference, RthThe thermal resistance being calculated by step 2).
2. utilizing the method for alternating-current pulse measurement AC-LED thermal resistance and junction temperature as described in claim 1, it is characterised in that in step
1) in, the positive and negative burst pulse is voltage or current impulse, and voltage or current pulse amplitude are corresponding normally in alternating current work
Under voltage or current effective value；The current or voltage amplitude for measuring AC-LED under corresponding junction temperature refers to drives in voltage pulse
Dynamic lower survey passes through AC-LED current amplitude, or surveys under current impulse driving and pass through AC-LED voltage magnitude.
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| Application Number | Priority Date | Filing Date | Title |
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| CN201610884239.9A CN106199371B (en) | 2016-10-11 | 2016-10-11 | Utilize the method and device of alternating-current pulse measurement AC-LED thermal resistance and junction temperature |
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| CN201610884239.9A CN106199371B (en) | 2016-10-11 | 2016-10-11 | Utilize the method and device of alternating-current pulse measurement AC-LED thermal resistance and junction temperature |
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| CN106199371B true CN106199371B (en) | 2019-07-26 |
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Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
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| CN107015134B (en) * | 2017-05-23 | 2019-08-09 | 山东大学 | A kind of test macro and its application of LED light Electrothermal Properties |
| CN108303628B (en) * | 2018-01-09 | 2020-06-23 | 厦门大学 | Method for driving semiconductor device to carry out junction temperature test by utilizing rectangular wave signal |
| CN109212399B (en) * | 2018-08-10 | 2021-01-01 | 全球能源互联网研究院有限公司 | Device and method for testing high-temperature electrical characteristics of semiconductor device |
| CN109297687A (en) * | 2018-11-27 | 2019-02-01 | 上海应用技术大学 | LED light system for detecting electrical property and detection method |
| CN111781480B (en) * | 2020-05-28 | 2022-05-20 | 南方电网科学研究院有限责任公司 | IGBT junction temperature monitoring method, device and system |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103196576A (en) * | 2013-03-20 | 2013-07-10 | 上海理工大学 | Junction temperature detection method for alternate current light-emitting diode (AC LED) based on peak current |
| CN103424678A (en) * | 2012-06-06 | 2013-12-04 | 上海理工大学 | Test system and test method for measuring AC-LED junction temperature |
| CN104020405A (en) * | 2014-06-26 | 2014-09-03 | 厦门大学 | Pulse type power mode LED voltage-current-junction temperature characteristic testing device |
| CN104848961A (en) * | 2015-05-14 | 2015-08-19 | 哈尔滨工业大学 | Saturation-conduction-voltage-drop-based temperature calibration platform for measuring IGBT junction temperature and method for realizing IGBT junction temperature measurement |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI404923B (en) * | 2008-07-07 | 2013-08-11 | Ind Tech Res Inst | Standard Test Method for PN Joint Temperature of Light Emitting Diodes |
-
2016
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Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103424678A (en) * | 2012-06-06 | 2013-12-04 | 上海理工大学 | Test system and test method for measuring AC-LED junction temperature |
| CN103196576A (en) * | 2013-03-20 | 2013-07-10 | 上海理工大学 | Junction temperature detection method for alternate current light-emitting diode (AC LED) based on peak current |
| CN104020405A (en) * | 2014-06-26 | 2014-09-03 | 厦门大学 | Pulse type power mode LED voltage-current-junction temperature characteristic testing device |
| CN104848961A (en) * | 2015-05-14 | 2015-08-19 | 哈尔滨工业大学 | Saturation-conduction-voltage-drop-based temperature calibration platform for measuring IGBT junction temperature and method for realizing IGBT junction temperature measurement |
Non-Patent Citations (1)
| Title |
|---|
| "交流发光二极管特性研究及热学仿真";陈莹亮;《中国学位论文全文数据库》;20130918;第32、48页 |
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