CN106933299B - Low-power consumption DDS circuit with amplitude and phase error auto-correction function - Google Patents
Low-power consumption DDS circuit with amplitude and phase error auto-correction function Download PDFInfo
- Publication number
- CN106933299B CN106933299B CN201710135908.7A CN201710135908A CN106933299B CN 106933299 B CN106933299 B CN 106933299B CN 201710135908 A CN201710135908 A CN 201710135908A CN 106933299 B CN106933299 B CN 106933299B
- Authority
- CN
- China
- Prior art keywords
- circuit
- codes
- delay
- charge
- output
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/02—Digital function generators
- G06F1/022—Waveform generators, i.e. devices for generating periodical functions of time, e.g. direct digital synthesizers
Landscapes
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Analogue/Digital Conversion (AREA)
- Digital Transmission Methods That Use Modulated Carrier Waves (AREA)
Abstract
The present invention provides a kind of low-power consumption DDS circuit with amplitude and phase error auto-correction function, which includes: charge-domain range error detection amplifying circuit, charge-domain phase error detection amplifying circuit, K charge-domain analog-digital converters, control circuit, ROM module, SRAM module, phase accumulator, the first delay circuit, phase amplitude converter, the second delay circuit, compensation circuit and N current-mode DAC.The low-power consumption DDS circuit with amplitude and phase error auto-correction function can be according to system accuracy and the automatic compromise selection calibration accuracy of hardware spending, and has the characteristics that low-power consumption.
Description
Technical field
The present invention relates to a kind of error calibration circuits, specifically a kind of to have the function of amplitude and phase error auto-correction
Low-power consumption DDS circuit.
Background technique
Direct digital frequency synthesis technology is a kind of signal that required various different frequencies are synthesized by digital means,
The technology of analog signal output is converted thereof into finally by digital analog converter.The technology is with its peculiar feature: can compile
The advantages that journey, frequency hopping be fast, high resolution, high frequency modulation precision and one of become the major technique in current frequency synthesis technique, extensively
It is general to be applied to mobile communication, the communication fields such as military and commercial radar system.
Direct Digital Frequency Synthesizers (DDS) are mainly made of three modules: phase accumulator, phase amplitude converter and
Digital analog converter (DAC).Usually there are two input quantities: reference clock fs and frequency control word X for entire DDS system.It is phase-accumulated
Device under the control of clock, in the input of each clock pulses, it is cumulative constantly to carry out linear phase to frequency control word.Phase
The data of accumulator output are exactly the phase of composite signal, the output frequency i.e. direct digital synthesis technique of phase accumulator
The signal frequency of device output.The phase value input phase amplitude converter of interception accumulator output, through operation conversion output and is somebody's turn to do
The corresponding digitlization range value of phase value.Digital quantity is transformed into analog quantity by digital analog converter, using low-pass filtering
Device is smooth and filters out unwanted sampled signal, output frequency pure sine or cosine signal.
From the working principle of DDS it will be seen that clock non-ideal characteristic, DAC input signal be asynchronous, inside DAC
Module timing is asynchronous, in power supply and circuit design the factors such as signal cross-talk that may be present influence, can make that DAC's is defeated
There are amplitude and phase errors for signal out.In practical applications, due to the fluctuation of processing technology, variation of working environment etc., also
Making DDS amplitude and phase error, there are certain randomnesss, are embodied in the amplitude and phase error of different DDS chips not
It is identical to the greatest extent.It is required in the application accurately controlled DDS amplitude and phase error consistency in phased array radar etc., DDS chip
Between amplitude and phase error inconsistent the problem of causing DDS chip will be made to be unable to satisfy required precision.Therefore design collection
There is very much realistic meaning in the high-precision amplitude and phase error auto-correction circuit in DDS chip.
Summary of the invention
The purpose of the present invention is overcoming the deficiencies in the prior art, provide a kind of with the self-correcting of amplitude and phase error
The low-power consumption DDS circuit of quasi- function has been internally integrated high-precision amplitude and phase error auto-correction circuit.
The purpose of the present invention can be achieved through the following technical solutions, and described has amplitude and phase error auto-correction function
The low-power consumption DDS circuit of energy, structure include: that charge-domain range error detects amplifying circuit, charge-domain phase error detection is put
Big circuit, K charge-domain analog-digital converters, control circuit, ROM module, SRAM module, phase accumulator, the first delay circuit,
Phase amplitude converter, the second delay circuit, compensation circuit and N current-mode DAC;
First, second input terminal of charge-domain phase error detection amplifying circuit is connected respectively to the letter of N current-mode DAC
Number output difference port, the control signal of charge-domain phase error detection amplifying circuit are connected to the first K of control circuit
Option code output port, the differential voltage output end of charge-domain phase error detection amplifying circuit are connected to K charge-domain moduluses
The differential voltage input terminal of converter;First, second input terminal of charge-domain range error detection amplifying circuit is connected respectively to N
The control signal of the signal output difference port of position current-mode DAC, charge-domain range error detection amplifying circuit is connected to control
2nd K option code output ports of circuit processed, charge-domain range error detect the differential voltage output end connection of amplifying circuit
To the differential voltage input terminal of K charge-domain analog-digital converters;The position the K quantization code of K charge-domain analog-digital converters is output to control
The error input port of circuit processed;
The ROM control port of control circuit exports control signal to ROM module, and the SRAM control port of control circuit exports
Signal is controlled to SRAM module, the first K delay code output ends of control circuit are connected to the second input of the first delay circuit
Port, the 2nd K delay code output ends of control circuit are connected to the second input port of the second delay circuit, control circuit
Calibration control signal Ctrl output port is connected to charge-domain phase error detection amplifying circuit simultaneously, K charge-domain moduluses turn
The calibration of parallel operation, compensation circuit, the first delay circuit and the second delay circuit controls signal Ctrl input port;
First N calibration code output ends of the first input port connection ROM module of the first delay circuit, the first deferred telegram
The position the X phase controlling input code of the third input port connection phase accumulator on road, the output port of the first delay circuit is by X
Hand over word is output to phase amplitude converter;2nd N calibrations of the first input port connection ROM module of the second delay circuit
The N position amplitude of code output end, the third input port connection phase amplitude controller output of the second delay circuit controls input code,
N hand over words are output to compensation circuit by the output port of the second delay circuit;The first input port of compensation circuit connects ROM
3rd N calibration code output ends of module, the third input port of compensation circuit connect the position the N conversion of the second delay circuit output
N output codes are output to the data input pin of N current-mode DAC by code, the output port of compensation circuit;Wherein, N is positive whole
Number, K are the positive integer no more than N.
The low-power consumption DDS circuit with amplitude and phase error auto-correction function, operating mode includes calibrating die
Formula and compensation model;And it is introduced into calibration mode in circuit work, enters compensation model afterwards;When entering calibration mode, X
Position phase controlling input code, N amplitude control input codes, N output codes, the first K delay codes, the 2nd K delay codes and K
Compensation codes are invalid, and the first N calibration codes are input to the first delay circuit, and the 2nd N calibration codes are input to the second delay circuit,
3rd N calibration codes are input to compensation circuit;The charge-domain amplitude detection amplifying circuit first carries out width to N current-mode DAC
Degree calibrates for error, then the charge-domain phase-detection amplifying circuit successively to N current-mode DAC and phase amplitude converter into
The calibration of row phase error;When entering compensation model, X phase controlling input codes are input to the first delay circuit, N amplitude controls
Input code processed is input to the second delay circuit, and N output codes are input to compensation circuit;First N calibration codes, the 2nd N calibrations
Code and the 3rd N calibration codes are invalid, and the first K delay codes, the 2nd K delay codes and K compensation codes are effective;The charge-domain width
Degree error calibration circuit starts to carry out N current-mode DAC range error compensation, and the charge-domain phase error calibration circuit is same
When phase compensation is carried out to N current-mode DAC and phase amplitude converter.
The low-power consumption DDS circuit with amplitude and phase error auto-correction function, to the N current-mode DAC
When carrying out range error calibration, the job order of circuit is as follows:
Control circuit controls charge-domain range error by Ctrl signal first and detects amplifying circuit, K charge-domain moduluses
Converter and compensation circuit enter calibration mode, while exporting the 2nd K option codes and detecting amplification electricity to charge-domain range error
Road;
Then control circuit generates first group of the 2nd K option code, while controlling ROM module and generating first group the 3rd N
Calibration code;First group of the 3rd N calibration code enters compensation circuit and obtains N output codes, and N output codes enter N to be calibrated
Position current-mode DAC circuit obtains first group of range error difference output electricity corresponding with the 3rd N calibration codes through digital-to-analogue conversion
Stream;Charge-domain range error detects amplifying circuit by first group of range error differential output current amount of detection, and handles and obtain
First grouping error voltage;K charge-domain analog-digital converters by the first grouping error voltage carry out analog-to-digital conversion, available first group
K quantization codes of range error are simultaneously output to control circuit;Reception is obtained K quantization codes of first group of range error and deposited by control circuit
Storage completes the range error quantization under a kind of input condition in SRAM module;
And then, control circuit, which can generate second group of the 2nd K option code and control ROM module simultaneously, generates second group the
Three N calibration code, second group of the 3rd N calibration code enter compensation circuit and obtain N output codes, and N output codes enter to school
The quasi- position N current-mode DAC circuit, obtains second group of range error corresponding with second group of the 3rd N calibration code through digital-to-analogue conversion
Differential output current;Charge-domain range error detects amplifying circuit by comparing second group of differential output current and second group of benchmark
Its difference is simultaneously amplified available second grouping error voltage by voltage;K charge-domain analog-digital converters are by the second grouping error
Voltage carries out analog-to-digital conversion, and available K quantization codes of second group of range error are simultaneously output to control circuit;Control circuit will connect
Receipts obtain K quantization codes of second group of range error and are stored in SRAM module, complete the range error under second of input condition
Quantization;
It recycles according to this, when control circuit generates the K option codes of L group the 2nd and while controlling ROM module generation L group the
Three N calibration code, and obtain K quantization codes of L group range error, and after being stored in SRAM module, inside control circuit
Computing circuit to the K quantization codes of L group range error being stored in SRAM module will carry out that K compensation codes are calculated;Control
K compensation codes can be output in compensation circuit by circuit processed at this time, and compensation circuit is arranged to compensate for mode, while keeping K
Position compensation codes are constant;So far, the calibration to N current-mode DAC range errors is completed;
Each group of output above-mentioned that N current-mode DAC are carried out in range error calibration process, that control circuit generates simultaneously
The 3rd N calibration codes to compensation circuit must with the 2nd K option codes for being output to charge-domain range error detection amplifying circuit
It must correspond, it may be assumed that the N calibration codes of J group the 3rd must be used cooperatively with the K option codes of J group the 2nd;Wherein, L is little
In 2KPositive integer;J is the positive integer no more than L.
The low-power consumption DDS circuit with amplitude and phase error auto-correction function, to the N current-mode DAC
When carrying out phase error calibration with phase amplitude converter, the job order of circuit is as follows:
1, phase error calibration is carried out to N current-mode DAC first:
1.1 control circuits by Ctrl signal control charge-domain phase error detection amplifying circuit and the second delay circuit into
Enter calibration mode, while exporting the first K option codes and giving charge-domain phase error detection amplifying circuit, starts to N current-modes
DAC carries out phase error calibration;
1.2 then control circuit generate first group of the first K option code, while control ROM module generation first group of the 2nd N
Position calibration code;First group of the 2nd N calibration code enters the second delay circuit and obtains N hand over words, and N hand over words enter to school
It is poor to obtain first group of phase error corresponding with first group of the 2nd N calibration code through digital-to-analogue conversion for quasi- N current-mode DAC circuit
Divide output electric current;Charge-domain phase error detection amplifying circuit passes through first group of phase error differential output current amount of detection, and
It is handled to obtain first group of phase error voltage;First group of phase error voltage is carried out mould by K charge-domain analog-digital converters
Number conversion, available K quantization codes of first group of phase error are simultaneously output to control circuit;Reception is obtained first by control circuit
Phase error K quantization code of group is stored in SRAM module, completes the position the N current-mode DAC circuit phase under a kind of input condition
Error quantization;
1.3 and then, and control circuit generates second group of the first K option code, while controlling ROM module generation second group the
Two N calibration code;Second group of the 2nd N calibration code enters the second delay circuit and obtains N hand over words, and N hand over words enter
The position N current-mode DAC circuit to be calibrated obtains second group of phase corresponding with second group of the 2nd N calibration code through digital-to-analogue conversion
Error differential output current;Charge-domain phase error detection amplifying circuit passes through second group of phase error differential output current of detection
Amount, and handled to obtain second group of phase error voltage;K charge-domain analog-digital converters by second group of phase error voltage into
Row analog-to-digital conversion, available K quantization codes of second group of phase error are simultaneously output to control circuit;Control circuit obtains reception
K quantization codes of second group of phase error are stored in SRAM module, complete N to be calibrated current-modes under two kinds of input conditions
The quantization of DAC circuit phase error;
1.4 recycle according to this, when control circuit generation N calibration codes of L group the 2nd and the K option codes of L group the first, and
To K quantization codes of L group phase error, and after being stored in SRAM module, computing circuit inside control circuit will be to depositing
The K quantization codes of L group phase error stored up in K bit register group carry out that the 2nd K delay codes are calculated;Control circuit is at this time
2nd K delay codes can be output in the second delay circuit, and the 2nd K delay codes of holding are constant, control circuit is by second
Delay circuit is arranged to compensate for mode, completes to calibrate the phase error of N current-mode DAC;
2, later, control circuit enters calibration mode by Ctrl signal the first delay circuit of control, while exporting K choosings
It selects code and gives charge-domain phase error detection amplifying circuit, start to carry out phase error calibration to phase amplitude converter;
Control circuit controls ROM module and generates the first N calibration codes, passes through the first delay circuit, charge-domain phase error
Detect amplifying circuit and K charge-domain analog-digital converters, using and to N current-mode DAC the identical step of phase error calibration
Rapid and method, obtains the first K delay codes and is output in the first delay circuit, while keeping the first K delay codes constant, control
First delay circuit is arranged to compensate for mode by circuit processed, completes to calibrate the phase error of phase amplitude converter;At this point, school
Quasi-mode terminates;
N current-mode DAC and phase amplitude converter are carried out in phase error calibration process above-mentioned, control circuit is same
When each group of the first N calibration codes generating and the 2nd N calibration codes and be output to charge-domain phase error detection amplifying circuit
The first K option codes must correspond, it may be assumed that the N calibration codes of J group the first and the 2nd N calibration codes must and J group
First K option codes are used cooperatively;Wherein, L is no more than 2KPositive integer, J is positive integer no more than L.
Further, in the low-power consumption DDS circuit with amplitude and phase error auto-correction function, the charge
Domain phase error detection amplifying circuit include: current sense resistor, reference clock generation circuit, phase discriminator, loop filter and
First charge-domain voltage amplifier circuit;The both ends of current sense resistor are connected respectively to charge-domain phase error detection amplifying circuit
The first, second input terminal, and be connected respectively to the first and second input terminals of phase discriminator;Reference clock generation circuit is at K
Under the control of option code, generates reference clock and be connected to the third input terminal of phase discriminator;Signal of the phase discriminator to 3 input terminals
It carries out further phase bit comparison and obtains phase error signal;Phase error signal filters to obtain voltage letter by loop filter
Number Vi;ViAmplify to obtain error signal Vop and Von by the first charge-domain voltage amplifier circuit.
Further, in the low-power consumption DDS circuit with amplitude and phase error auto-correction function, the charge-domain
It includes: current sense resistor, reference data generation circuit, the insensitive high-speed switch capacitor of common mode that range error, which detects amplifying circuit,
Differential voltage signal sampling network and the second charge-domain voltage amplifier circuit;The both ends of current sense resistor are connected respectively to charge
Domain range error detects the first and second input terminals of amplifying circuit, and is connected to the insensitive high-speed switch capacitor differential electrical of common mode
Press the first and second input terminals of signal sampling network;Reference data generation circuit generates difference under the control of K option codes
Reference voltage output, and it is connected to the third and fourth defeated of the insensitive high-speed switch capacitor differential voltage signal sampling network of common mode
Enter end;Switching capacity differential voltage signal sampling network further samples the voltage signal of 4 input terminals, obtains difference
Divided voltage signal Vi+ and Vi-;Amplify to obtain error signal Vop and Von by the second charge-domain voltage amplifier circuit.
Further, in the low-power consumption DDS circuit with amplitude and phase error auto-correction function, the position K
Charge-domain analog-digital converter includes: the P grades of assembly line grade circuits based on charge-domain signal processing technology, is used for sampling
The charge packet arrived carries out various processing and completes analog-to-digital conversion and surplus amplification, and the output digital code of each height grade circuit is defeated
Enter to delay SYN register, and the charge packet of each height grade circuit output enters next stage, each height grade circuit repeats
The same course of work;P+1 grades and afterbody A-bitFlash analog-digital converter circuit, P grades are transmitted
Charge packet be re-converted into voltage signal, and carry out the analog-to-digital conversion work of afterbody, and by the output number of the same level circuit
Character code is input to delay SYN register, this grade of circuit only completes analog-to-digital conversion, amplifies without surplus;The synchronous deposit of delay
Device is used to carry out delay alignment to the digital code of each sub- pipelining-stage output, and the digital code of alignment is input to digital school
Positive module;Digital correction circuit module is used to receive the output digital code of SYN register, received digital code is moved
Position is added, to obtain the R bit digital output code of analog-digital converter;Wherein, R is positive integer, and P and A are just whole no more than R
Number.
Further, in the low-power consumption DDS circuit with amplitude and phase error auto-correction function, described first prolongs
Slow circuit and the second delay circuit are all made of identical delay circuit, and structure includes: N number of delay buffer cell and N number of K delay
Register;Wherein, the first K delay time registers~delay time register of n-th K delay code input terminal is all connected to K
Postpone code, control signal input is all connected to Ctrl signal;First delay buffer cell~N delay buffer cell prolongs
Slow code input terminal is connected respectively to the first K delay time registers~delay time register of n-th K delay code output end, and first
Delay buffer cell~N delay buffer cell data output end is connected respectively to the 1st hand over word~N hand over words simultaneously
Output, the first delay buffer cell~N delay buffer cell first control signal input terminal are all connected to Ctrln letter
Number, the first delay buffer cell~N delay buffer cell second control signal input terminal is all connected to Ctrl signal;Its
In, Ctrl and Ctrln are one group of reverse signal.
Further, in the low-power consumption DDS circuit with amplitude and phase error auto-correction function, the compensation electricity
It include: delay buffer circuit and K add circuits inside road, and the delay of be delayed buffer circuit and K add circuits is necessary
It is equal;Compensation circuit can operate under the control of Ctrl signal is calibrated and compensated mode both of which;
When in the calibration mode, Ctrl signal is effective, and the output of K add circuits will be invalid, and the 3rd N calibration codes are through prolonging
When buffer circuit after obtain N output codes and export;
When in the compensation mode, Ctrln signal is effective, and the output of K add circuits will be effective, and N-K hand over words are through prolonging
When buffer circuit after obtain N-K output codes and export, K hand over words are added to obtain with K compensation codes by K add circuits
K output codes simultaneously export.
Further, in the low-power consumption DDS circuit with amplitude and phase error auto-correction function, the control electricity
Road includes: core control circuit, ROM reading circuit, the first delay code generation circuit, the second delay code generation circuit, compensation codes
Generation circuit, option code generation circuit, computing circuit, SRAM read/write circuit and K bit register;
The connection relationship of foregoing circuit are as follows: the first output end of core control circuit is connected to the input of ROM reading circuit
End, the second output terminal of core control circuit are connected to the control signal of the first delay code generation circuit, core control circuit
Third output end be connected to the control signal of the second delay code generation circuit, the 4th output end connection of core control circuit
To the control signal of compensation codes generation circuit, the 5th output end of core control circuit is connected to the control input of computing circuit
End, the 6th output end of core control circuit are connected to the control signal of option code generation circuit, and the of core control circuit
Seven output ends generate calibration control signal Ctrl, the 8th output end of core control circuit be connected to simultaneously K bit register and
The control signal of SRAM read/write circuit, the input terminal of core control circuit are connected to calibration starting control signal;ROM reads electricity
Road generates ROM address code according to the control instruction of core control circuit;The data input pin of computing circuit receives SRAM read-write electricity
The data that road output end is sent, and the first K error codes, the 2nd K errors are generated according to the control instruction of core control circuit
Code and the 3rd K error codes;The data input pin of first delay code generation circuit receives what computing circuit data output end was sent
First K error codes, and the first K delay codes are generated according to the control instruction of core control circuit;Second delay code generates electricity
The data input pin on road receives the 2nd K error codes that computing circuit data output end is sent, and according to core control circuit
Control instruction generates the 2nd K delay codes;The data input pin of compensation codes generation circuit receives computing circuit data output end hair
K error codes of the 3rd sent, and K compensation codes are generated according to the control instruction of core control circuit;Option code generation circuit root
The first K option codes and the 2nd K option codes are generated according to the control instruction of core control circuit;The data of K bit register input
End receives the position the K quantization code that the output end of the K charge-domain analog-digital converter is sent, and according to the control of core control circuit
The data of storage inside it are sent to SRAM read/write circuit by instruction;SRAM read/write circuit is according to the control of core control circuit
Instruction generates SRAM address date code, carries out reading data and write-in to SRAM module.
The invention has the advantages that the designed low-power consumption DDS circuit with amplitude and phase error auto-correction function can
According to system accuracy and the automatic compromise selection calibration accuracy of hardware spending, and has the characteristics that low-power consumption.By using charge-domain
Signal processing technology does not use operational amplifier in terms of error detection process, has the characteristics that low-power consumption;Using charge-domain ADC
Error signal is quantified, error compensating method all uses Digital Signal Processing, further realizes power consumption minimum
And has the characteristics that low-power consumption.
Detailed description of the invention
Fig. 1 is the low-power consumption DDS circuit block diagram that the present invention has amplitude and phase error auto-correction function.
Fig. 2 is charge-domain phase error detection amplification circuit structure block diagram of the present invention.
Fig. 3 is charge-domain voltage amplifier circuit schematic diagram of the present invention.
Fig. 4 is charge-domain voltage amplifier circuit working waveform figure of the present invention.
Fig. 5 is phase detector circuit structural block diagram of the present invention.
Fig. 6 is reference clock generation circuit structural block diagram of the present invention.
Fig. 7 is that charge-domain range error of the present invention detects amplification circuit structure block diagram.
Fig. 8 is reference data generation circuit structural block diagram of the present invention.
Fig. 9 is charge-domain analog-digital converter circuit block diagram of the present invention.
Figure 10 is charge-domain pipelined sub- grade circuit block diagram of the present invention.
Figure 11 is delay circuit structural block diagram of the present invention.
Figure 12 is compensation circuit structural block diagram of the present invention.
Figure 13 is control circuit block diagram of the present invention.
Specific embodiment
The preferred embodiment of the present invention is described in detail below in conjunction with attached drawing.
Fig. 1 show the low-power consumption DDS circuit block diagram that the present invention has amplitude and phase error auto-correction function.The tool
The low-power consumption DDS circuit for having amplitude and phase error auto-correction function includes: charge-domain range error detection amplifying circuit 10, electricity
Lotus domain phase error detection amplifying circuit 11, K charge-domain analog-digital converters 12, control circuit 13, ROM module 15, SRAM mould
Block 14, phase accumulator 16, the first delay circuit 17, phase amplitude converter 18, the second delay circuit 19, compensation circuit 110
With N current-mode DAC111.
The connection relationship of foregoing circuit are as follows: the first and second input terminals of charge-domain phase error detection amplifying circuit 11 point
It is not connected to the signal output difference port (to induction signal Iop and Ion) of N current-mode DAC111, the inspection of charge-domain phase error
The control signal for surveying amplifying circuit 11 is connected to the first K option code output ports of control circuit 13, and charge-domain phase is missed
The differential voltage output end of difference detection amplifying circuit 11 is connected to the differential voltage input terminal of K charge-domain analog-digital converters 12;
First and second input terminals of charge-domain range error detection amplifying circuit 10 are connected respectively to the signal of N current-mode DAC111
The control signal of output difference port, charge-domain range error detection amplifying circuit 10 is connected to the 2nd K of control circuit 13
The differential voltage output end of position option code output port, charge-domain range error detection amplifying circuit 10 is connected to K charge-domains
The differential voltage input terminal of analog-digital converter 12;The position the K quantization code of K charge-domain analog-digital converters 12 is output to control circuit 13
Error input port;
The ROM control port of control circuit 13 exports control signal to ROM module 15, the SRAM control terminal of control circuit 13
Mouth exports control signal to SRAM module 14, and the first K delay code output ends of control circuit 13 are connected to the first delay circuit
2nd K delay code output ends of 17 the second input port, control circuit 13 are connected to the second defeated of the second delay circuit 19
The calibration control signal Ctrl output port of inbound port, control circuit 13 is connected to charge-domain phase error detection amplification electricity simultaneously
The calibration on road 11, K charge-domain analog-digital converters 12, compensation circuit 110, the first delay circuit 17 and the second delay circuit 19
Control signal Ctrl input port;
First N calibration code output ends of the first input port connection ROM module 15 of the first delay circuit 17, first prolongs
The position the X phase controlling input code of the third input port connection phase accumulator 16 of slow circuit 17, the first delay circuit 17 it is defeated
X hand over words are output to phase amplitude converter 18 by exit port;The first input port of second delay circuit 19 connects ROM mould
2nd N calibration code output ends of block 15, the third input port connection phase amplitude controller output of the second delay circuit 19
N position amplitude control input code, N hand over words are output to compensation circuit 110 by the output port of the second delay circuit 19;Compensation
3rd N calibration code output ends of the first input port connection ROM module 15 of circuit 110, the third input of compensation circuit 110
Port connects the position the N hand over word of the second delay circuit 19 output, and N output codes are output to N by the output port of compensation circuit 110
The data input pin of position current-mode DAC111.
Low-power consumption DDS circuit of the present invention with amplitude and phase error auto-correction function, including calibration mode and
Two kinds of operating modes of compensation model.It is introduced into calibration mode in circuit work, enters compensation model afterwards;Entering calibration mode
When, X phase controlling input codes, N amplitudes control input code, N output codes, the first K delay codes, the 2nd K delay codes
Invalid with K compensation codes, the first N calibration codes are input to the first delay circuit 17, and the 2nd N calibration codes are input to second and prolong
Slow circuit 19, the 3rd N calibration codes are input to compensation circuit 110;The charge-domain range error calibration circuit is first to N electric currents
Mould DAC111 carries out range error calibration, and then the charge-domain phase error calibration circuit is successively to N current-mode DAC111
Phase error calibration is carried out with phase amplitude converter 18;When entering compensation model, X phase controlling input codes are input to the
One delay circuit 17, N amplitude control input codes are input to the second delay circuit 19, and N output codes are input to compensation circuit
110;First N calibration codes, the 2nd N calibration codes and the 3rd N calibration codes are invalid, the first K delay codes, the 2nd K delays
Code and K compensation codes are effective;The charge-domain range error calibration circuit starts to carry out range error to N current-mode DAC111
Compensation, the charge-domain phase error calibration circuit carry out phase to N current-mode DAC111 and phase amplitude converter 18 simultaneously
Position compensation.
One, the present invention has the low-power consumption DDS circuit of amplitude and phase error auto-correction function to N current-mode DAC111
Carry out the calibrating principle of range error calibration are as follows:
When calibration mode is opened, control circuit 13 controls the detection amplification of charge-domain range error by Ctrl signal first
Circuit 10, K charge-domain analog-digital converters 12 and compensation circuit 110 enter calibration mode, at the same export the 2nd K option codes to
Charge-domain range error detects amplifying circuit 10;Then control circuit 13 generates first group of the 2nd K option code, control simultaneously
ROM module 15 generates first group of the 3rd N calibration code;First group of the 3rd N calibration code enters compensation circuit 110 and obtains N
Output code, N output codes enter the position N current-mode DAC111 circuit to be calibrated, obtain and the 3rd N calibration codes through digital-to-analogue conversion
Corresponding first group of range error differential output current signal Iop and Ion;Charge-domain range error detection amplifying circuit 10 passes through
Detect Iop-Ion amount, be processed to and with first group of reference voltage Vrefp- caused by internal reference reference generating circuit
Vrefn is compared, and its difference is amplified available error voltage Vop-Von;K charge-domain analog-digital converters 12
Error voltage Vop-Von is subjected to analog-to-digital conversion, available K quantization codes of first group of range error are simultaneously output to control circuit
13;Reception is obtained K quantization codes of first group of range error and is stored in SRAM module 14 by control circuit 13, completes a kind of input
Under the conditions of range error quantization.
And then, control circuit 13, which can generate second group of the 2nd K option code and control ROM module 15 simultaneously, generates second
The 3rd N calibration codes of group, second group of the 3rd N calibration code enter compensation circuit 110 and obtain N output codes, N output codes into
Enter the position N current-mode DAC111 circuit to be calibrated, is obtained through digital-to-analogue conversion second group corresponding with second group of the 3rd N calibration code
Range error differential output current;Charge-domain range error detect amplifying circuit 10 by comparing second group of differential output current and
Its difference is simultaneously amplified available second grouping error voltage Vop-Von by second group of reference voltage;K charge-domain moduluses turn
Second grouping error voltage Vop-Von is carried out analog-to-digital conversion by parallel operation 12, and available K quantization codes of second group of range error are simultaneously defeated
Control circuit 13 is arrived out;Reception is obtained K quantization codes of second group of range error and is stored in SRAM module 14 by control circuit 13,
Complete the range error quantization under second of input condition.
It recycles according to this, generates L when control circuit 13 generates the K option codes of L group the 2nd and controls ROM module 15 simultaneously
The 3rd N calibration codes of group, and obtain K quantization codes of L group range error, and after being stored in SRAM module 14, control circuit
Computing circuit inside 13 will carry out being calculated K to the K quantization codes of L group range error being stored in SRAM module 14
Compensation codes.
K compensation codes can be output in compensation circuit 110 by control circuit 13 at this time, and compensation circuit 110 is arranged to
Compensation model, while keeping K compensation codes constant.The low-power consumption DDS electricity with amplitude and phase error auto-correction function
Complete the calibration to N current-mode DAC111 range errors in road.
In above-mentioned calibration process, each group of the generation simultaneously of control circuit 13 is output to the 3rd N schools of compensation circuit 110
Quasi- code and the 2nd K option codes for being output to charge-domain range error detection amplifying circuit 10 must correspond, it may be assumed that J group
3rd N calibration codes must must be used cooperatively with the K option codes of J group the 2nd, wherein L is no more than 2KPositive integer, J
For the positive integer no more than L.
Two, the low-power consumption DDS circuit of the present invention with amplitude and phase error auto-correction function is to N current-modes
DAC111 and phase amplitude converter 18 carry out the calibrating principle of phase error calibration are as follows:
The low-power consumption DDS circuit with amplitude and phase error auto-correction function is completed to N current-mode DAC111
After the calibration of range error, control circuit 13 controls charge-domain phase error detection amplifying circuit 11 and second by Ctrl signal
Delay circuit 19 enters calibration mode, while exporting the first K option codes to charge-domain phase error detection amplifying circuit 11, opens
Begin to carry out phase error calibration to N current-mode DAC111.
Then control circuit 13 generates first group of the first K option code, while controlling ROM module 15 and generating first group second
N calibration codes;First group of the 2nd N calibration code enters the second delay circuit 19 and obtains N hand over words, and N hand over words enter
N current-mode DAC111 circuit to be calibrated obtains first group of phase corresponding with first group of the 2nd N calibration code through digital-to-analogue conversion
Error differential output current Iop and Ion;Charge-domain phase error detection amplifying circuit 11 is located by detection Iop-Ion amount
It manages and carries out phase-detection with first group of reference clock caused by internal reference clock generation circuit 21, and by its phase difference
Value amplifies available error voltage Vop-Von;K charge-domain analog-digital converters 12 carry out error voltage Vop-Von
Analog-to-digital conversion, available K quantization codes of first group of phase error are simultaneously output to control circuit 13;Control circuit 13 will receive
It is stored in SRAM module 14 to K quantization codes of first group of phase error, completes the position the N current-mode under a kind of input condition
DAC111 current phase error quantization.
And then, control circuit 13 generates second group of the first K option code, while controlling ROM module 15 and generating second group
2nd N calibration codes;Second group of the 2nd N calibration code enters the second delay circuit 19 and obtains N hand over words, N hand over words
Into the position N current-mode DAC111 circuit to be calibrated, obtained and second group of the 2nd N calibration code corresponding second through digital-to-analogue conversion
Group differential output current Iop and Ion;Charge-domain phase error detection amplifying circuit 11 is processed to by detection Iop-Ion amount
And phase-detection is carried out with second group of reference clock caused by internal reference clock generation circuit 21, and by its phase difference value
Amplify available error voltage Vop-Von;Error voltage Vop-Von is carried out mould by K charge-domain analog-digital converters 12
Number conversion, available K quantization codes of second group of phase error are simultaneously output to control circuit 13;Control circuit 13 obtains reception
K quantization codes of second group of phase error are stored in SRAM module 14, complete N to be calibrated current-modes under two kinds of input conditions
DAC111 current phase error quantization.
It recycles according to this, when controller generation N calibration codes of L group the 2nd and the K option codes of L group the first, and obtains L
Phase error K quantization code of group, and after being stored in SRAM module 14, the computing circuit inside control circuit 13 will be to storage
K quantization codes of L group phase error in K bit register group carry out that the 2nd K delay codes are calculated.Control circuit 13 is at this time
2nd K delay codes can be output in the second delay circuit 19, and keep the 2nd K delay codes constant, control circuit 13 will
Second delay circuit 19 is arranged to compensate for mode, completes to calibrate the phase error of N current-mode DAC111.
Later, control circuit 13 controls the first delay circuit 17 into calibration mode by Ctrl signal, while exporting K
Option code starts to carry out phase error calibration to phase amplitude converter 18 to charge-domain phase error detection amplifying circuit 11.
Control circuit 13 controls ROM module 15 and generates the first N calibration codes, is examined by the first delay circuit 17, charge-domain phase error
Survey amplifying circuit 11 and K charge-domain analog-digital converters 12, using and to N current-mode DAC111 phase error calibrate it is identical
The step of and method, obtain the first K delay codes and be output in the first delay circuit 17, at the same keep the first K delay codes
Constant, the first delay circuit 17 is arranged to compensate for mode by control circuit 13, completes to miss the phase of phase amplitude converter 18
Difference calibration.
At this point, the calibration mode of the low-power consumption DDS circuit with amplitude and phase error auto-correction function terminates.
In above-mentioned phase error calibration process, each group of the first N calibration codes and that control circuit 13 generates simultaneously
Two N calibration code and the first K option codes for being output to charge-domain phase error detection amplifying circuit 11 must correspond,
That is: N calibration codes of J group the first and the 2nd N calibration codes must must be used cooperatively with the K option codes of J group the first.
Low-power consumption DDS circuit of the present invention with amplitude and phase error auto-correction function is in actual use process
In, precision, hardware spending size and the prover time length to calibrate for error to DDS amplitude and phase can be different according to selecting
K and L value is configured, to meet the calibration accuracy and rate request of different accuracy and speed DDS chip.
Fig. 2 is a kind of implementation of charge-domain phase error detection amplifying circuit 11 of the present invention.The circuit includes: electric current
Detection resistance Rd, reference clock generation circuit 21, phase discriminator 22, loop filter 23 and the first charge-domain voltage amplifier circuit
24.The both ends of current sense resistor Rd are connected respectively to the first, second input of charge-domain phase error detection amplifying circuit 11
End, and it is connected to the first, second input terminal Voutp and Voutn of phase discriminator 22;Reference clock generation circuit 21 is selected at K
Under the control of code, generates reference clock Clkref and be connected to the third input terminal of phase discriminator 22;Phase discriminator 22 is to 3 input terminals
Signal carry out further phase bit comparison and obtain phase error signal Vp, phase error signal Vp is by the filter of loop filter 23
Wave obtains voltage signal Vi;Error signal Vop and Von are obtained by the amplification of the first charge-domain voltage amplifier circuit 24.
Fig. 3 show 24 schematic diagram of the first charge-domain voltage amplifier circuit of the present invention.First charge-domain voltage amplification
Circuit 24 includes: the first anode charge-storage node Nip, the first negative terminal charge-storage node Nin, the second anode charge storage section
Point Nop and the second negative terminal charge-storage node Non, one be connected to the first and second anode charge-storage node Nip and Nop it
Between anode charge transmit control switch 301, one be connected between the first and second negative terminal charge-storage node Nin and Non
Negative terminal charge transmission control switch 302, be connected to the first anode charge-storage node Nip anode capacitor 303, be connected to the
The anode capacitance programmable capacitor 309 of two anode charge-storage node Nop is connected to the first negative terminal charge-storage node Nin's
Negative terminal capacitor 304, is being connected to first just at the negative terminal capacitance programmable capacitor 310 for being connected to the second negative terminal charge-storage node Non
It holds the first anode voltage transmission switch 305 of charge-storage node Nip, be connected to the of the first anode charge-storage node Nip
Two anode voltage transmission switches 307, the third anode voltage transmission switch 313 for being connected to the second anode charge-storage node Nop
It is deposited with being connected to the 4th anode voltage transmission switch 311 of the second anode charge-storage node Nop, being connected to the first negative terminal charge
The the second negative terminal electricity for storing up the first negative terminal voltage transmitting switch 306 of node Nin, being connected to the first negative terminal charge-storage node Nin
Pressure transmitting switch 308 is connected to the third negative terminal voltage transmitting switch 314 of the second negative terminal charge-storage node Non and is connected to
The 4th negative terminal voltage transmitting switch 312 of second negative terminal charge-storage node Non.For the embodiment of the present invention, the first charge-domain
Any end connects Vi in two analog voltage inputs of voltage amplifier circuit 24, and other end connects reference signal can be real
It is existing.
Fig. 4 is that the working sequence of circuit shown in Fig. 3 controls waveform diagram.Controlling clock Clk and Clkn is opposite in phase
Clock, switch control signal Clkr, Clks and Clkt are that phase does not overlap clock.Heretofore described charge transmission control is opened
Close can embodiment described in the patent of invention using Patent No. 201010291245.6 realize, the voltage biography
Defeated switch can be realized using general metal-oxide-semiconductor or BJT switch.
Fig. 5 show a kind of implementation of 22 circuit of phase discriminator of the present invention.The circuit by signal shaping module and
One subtractor sub-module is constituted.Input differential signal Voutp and Voutn progress shaping are obtained input phase by signal shaping module
Position, for the reference clock of reference clock output as fixed phase, input phase and fixed phase are carried out phase by subtractor sub-module
Subtract, obtains phase error signal Vp.
Fig. 6 show 21 structural block diagram of reference clock generation circuit of the present invention.The reference clock generation circuit 21
It include: a programmable frequency adjustment circuit and a programmable duty cycle adjustment circuit.The programmable frequency adjustment circuit
It is controlled by K option codes with the programmable duty cycle adjustment circuit.Under the control of K option codes, frequency and duty ratio
Fixed input clock successively passes through after the programmable frequency adjustment circuit and the programmable duty cycle adjustment circuit, i.e.,
The reference clock Clkref of different frequency and duty ratio can be obtained.
Fig. 7 is a kind of implementation that charge-domain range error of the present invention detects amplifying circuit 10, and the circuit is using complete poor
Separation structure is realized.The circuit includes: current sense resistor Rd, reference data generation circuit 71, the insensitive high-speed switch electricity of common mode
Tolerance divided voltage signal sampling network 72 and the second charge-domain voltage amplifier circuit 73.
The both ends of current sense resistor Rd are connected respectively to the first and the of charge-domain range error detection amplifying circuit 10
Two input terminals, and it is connected to the first, second input of the insensitive high-speed switch capacitor differential voltage signal sampling network 72 of common mode
Hold Voutp and Voutn;Reference data generation circuit 71 generates differential reference voltage output end under the control of K option codes
Vrefp and Vrefn, and it is connected to the third and fourth of the insensitive high-speed switch capacitor differential voltage signal sampling network 72 of common mode
Input terminal;Switching capacity differential voltage signal sampling network 72 further samples the voltage signal of 4 input terminals, obtains
To differential voltage signal Vi+ and Vi-;Error signal Vop and Von are obtained by the amplification of the second charge-domain voltage amplifier circuit 73.
Fig. 8 show reference data generation circuit structural block diagram of the present invention.The reference data generation circuit includes:
One resistance string, a switch arrays and an output switch selection circuit.Resistance string is by 2K- 1 equal-sized resistance string
Join, both ends are separately connected reference voltage 3 and reference voltage 4, pass through 2K- 1 equal-sized electric resistance partial pressure can obtain
To 2KKind voltage;Switch arrays include 2K- 1 voltage-selected switch exports one group under the control of output switch selection circuit
Differential reference voltage Vrefp and Vrefn;Output switch selection circuit selects to open 2 switch arrays under the control of K option codes
Voltage transmission switch in column.Reference data generation circuit generates one group of differential reference voltage according to any one group of K option code
Vrefp and Vrefn.Reference voltage 3 and reference voltage 4 shown in fig. 8 are respectively Vref3 and Vref4 shown in Fig. 1.
As shown in figure 9, the position the K charge-domain analog-digital converter 12 that the present invention designs includes: P grades based on charge-domain signal processing
Assembly line grade circuit, afterbody (P+1 grades) A-bitFlash analog-digital converter circuit, the delay SYN register of technology
With digital correction circuit module.In addition operating mode control module is also back work mould necessary to analog-digital converter works
Block, the module are not identified in figure.In Fig. 9 in charge-domain analog-digital converter circuit adjacent two-stage grade circuit work by
The digit k of every grade of circuit of sum of series of the control of two groups of multi-phase clocks, working condition complete complementary, and sub- grade circuit can spirit
Adjustment living.Such as 14 analog-digital converters for K=14, totally 13 grades of+1 grade of 2bitFlash of 12 grades of 1.5bit/ grades can be used
Structure, can also be using+1 grade of 3bitFlash of+3 grades of 1.5bit/ grades of 4 grades of 2.5bit/ grades totally 8 grades of structure.
The charge-domain analog-digital converter that the present invention designs includes the following contents: P grades based on charge-domain signal processing technology
Charge-domain pipelined sub- grade circuit is used to carry out various processing completion analog-to-digital conversions to the charge packet that sampling obtains and surplus is put
Greatly, and by the output digital code of each height grade circuit it is input to delay SYN register, and each height grade circuit output
Charge packet enters next stage and repeats the above process;Afterbody (P+1 grades) A-bitFlash analog-digital converter circuit, by
The P grades of charge packets transmitted are re-converted into voltage signal, and carry out the analog-to-digital conversion work of afterbody, and the same level is electric
The output digital code on road is input to delay SYN register, this grade of circuit only completes analog-to-digital conversion, amplifies without surplus;Delay
SYN register is used to carry out delay alignment to the digital code of each sub- pipelining-stage output, and the digital code of alignment is inputted
To figure adjustment module;Digital correction circuit module is used to receive the output digital code of SYN register, by received number
Code carries out shifter-adder, to obtain the R bit digital output code of analog-digital converter.In above description, R is positive integer, and A and P are
Positive integer no more than R.
It is charge-domain pipelined sub- grade circuit diagram shown in Figure 10.Circuit by fully differential signal processing channel structure
At, entire circuit include: 2 the same level charges transmission control switches, 2 charge-storage nodes, 6 be connected to charge-storage node
Charge storage capacitance, C charge comparator, the reference signal selection circuits that C control by comparator output result, 2B+2 is a
Voltage transmission switch, wherein B is positive integer.When circuit works normally, prime differential electrical pocket is transmitted by charge control first
Switch is transmitted and stored at the same level charge-storage node, the voltage between the comparator node caused to the input of differential electrical pocket
Poor variable quantity is compared with reference voltage 3 and reference voltage 4, obtains C quantization output digital code D1~DB of the same level;Number is defeated
Code D1~DB will be output to delay SYN register out, while D1~DB will also control the reference signal selection electricity of the same level respectively
Road makes them generate the reference signal of a pair of of complementation respectively and controls the same level positive and negative terminal charge plus-minus capacitor bottom plate respectively, to by preceding
The differential electrical pocket that grade is transferred to the same level carries out plus-minus processing of corresponding size, obtains the same level differential margin charge packet;Finally, electric
The same level differential margin charge packet is completed by the downward Primary Transmit of the same level in road, reference voltage 2 to the same level differential charge memory node into
Row resets, and completes the work of charge-domain pipelined sub- one whole clock cycle of grade circuit.Wherein, C is positive integer.
Electricity is based on for (P+1 grades) of afterbody of the charge-domain pipelined analog-digital converter that the present invention designs in Fig. 9
The assembly line grade circuit A-bitFlash analog-digital converter circuit of lotus domain signal processing technology, the sub- grade circuit will only need to dock
The charge packet that receives carries out the analog-to-digital conversion work of afterbody, and the same level circuit output digital code is input to delay synchronizes and post
Storage, and without surplus processing.4 for removing the reference signal selection circuit in Figure 10 and being controlled by reference signal selection circuit
A capacitor.
Figure 11 show delay circuit structural block diagram of the present invention.It include: N number of delay inside the delay circuit
Buffer cell and N number of K delay time register, the first delay buffer cell~N delay buffer cell and the first K delay deposits
Device~the delay time register of n-th K.First K delay time registers~delay time register of n-th K delay code input terminal is complete
Portion is connected to K delay codes, and control signal input is all connected to Ctrl signal;First delay buffer cell~N delay
The delay code input terminal of buffer cell is connected respectively to the first K delay time registers~delay time register of n-th K delay code
Output end, the first delay buffer cell~N delay buffer cell data output end are connected respectively to the 1st hand over word~the
N hand over words simultaneously export, and the first delay buffer cell~N delay buffer cell first control signal input terminal all connects
To Ctrln signal, the first delay buffer cell~N delay buffer cell second control signal input terminal is all connected to
Ctrl signal.Wherein, Ctrl and Ctrln is reversed clock.
Delay circuit is operable under the control of Ctrl signal is calibrated and compensated mode both of which.In the calibration mode
When, Ctrl signal is effective, and the 1st hand over word~N input codes are invalid, input code for N hand over words output without any
It influences, the 1st calibration code~N calibration codes obtain the 1st after being delayed buffer circuit 1~delay buffer circuit N respectively and turn
Escape~N hand over words simultaneously export, and K delay codes are input into the first K delay time registers~delay of n-th K deposit
In device and it is latched and remains unchanged.When in the compensation mode, Ctrln signal is effective, and the 1st hand over word~N input codes have
Effect, and obtain the 1st hand over word~N hand over words after being delayed buffer circuit and export, the 1st calibration code~N schools
Quasi- code is invalid, and the position the K delay code stored in the first K delay time registers~delay time register of n-th K is input into delay
Compensation of delay is carried out in buffer circuit 1~delay buffer circuit N.
First delay circuit 17 of the present invention and the second delay circuit 19 are all made of delay circuit shown in Figure 11.
Figure 12 show 110 structural block diagram of compensation circuit of the present invention.It include that delay is slow inside the compensation circuit 110
Circuit and K add circuits are rushed, and the delay of be delayed buffer circuit and K add circuits must be equal.Compensation circuit 110 exists
It is operable under the control of Ctrl signal and is calibrated and compensated mode both of which.When in the calibration mode, Ctrl signal is effective, K
The output of position add circuit will be invalid, and the 3rd N calibration codes obtain N output codes and exported after being delayed buffer circuit.It is mending
When repaying under mode, Ctrln signal is effective, and the output of K add circuits will be effective, and N-K hand over words are after being delayed buffer circuit
It obtains N-K output codes and exports, K hand over words are added to obtain K output codes simultaneously with K compensation codes by K add circuits
Output, wherein Ctrl and Ctrln is reversed clock.
Figure 13 show 13 block diagram of control circuit of the present invention.The control circuit 13 include: core control circuit,
ROM reading circuit, the first delay code generation circuit, the second delay code generation circuit, compensation codes generation circuit, option code generate electricity
Road, computing circuit, SRAM read/write circuit and K bit register.
The connection relationship of the control circuit 13 are as follows: the first output end of core control circuit is connected to ROM reading circuit
Input terminal, the second output terminal of core control circuit is connected to the control signal of the first delay code generation circuit, core control
The third output end of circuit processed is connected to the control signal of the second delay code generation circuit, the 4th output of core control circuit
End is connected to the control signal of compensation codes generation circuit, and the 5th output end of core control circuit is connected to the control of computing circuit
Input terminal processed, the 6th output end of core control circuit are connected to the control signal of option code generation circuit, core control electricity
7th output end on road generates calibration control signal Ctrl, and the 8th output end of core control circuit is connected to K deposits simultaneously
The control signal of device and SRAM read/write circuit, the input terminal of core control circuit are connected to calibration starting control signal;ROM is read
Circuit generates ROM address code according to the control instruction of core control circuit out;The data input pin of computing circuit receives SRAM and reads
The data that write circuit output end is sent, and the first K error codes, the 2nd K are generated according to the control instruction of core control circuit
Error codes and the 3rd K error codes;The data input pin of first delay code generation circuit receives computing circuit data output end hair
K error codes of the first sent, and the first K delay codes are generated according to the control instruction of core control circuit;Second delay code produces
The data input pin of raw circuit receives the 2nd K error codes that computing circuit data output end is sent, and controls electricity according to core
The control instruction on road generates the 2nd K delay codes;The data input pin of compensation codes generation circuit receives the output of computing circuit data
The 3rd K error codes sent are held, and K compensation codes are generated according to the control instruction of core control circuit;Option code generates electricity
Road generates the first K option codes and the 2nd K option codes according to the control instruction of core control circuit;The data of K bit register
Input terminal receives the position the K quantization code that the output end of the K charge-domain analog-digital converter 12 is sent, and according to core control circuit
Control instruction be sent to SRAM read/write circuit for data inside it are stored;SRAM read/write circuit is according to core control circuit
Control instruction generate SRAM address date code, reading data and write-in are carried out to SRAM module 14.
The foregoing is merely presently preferred embodiments of the present invention, is not intended to limit the invention, it is all in spirit of the invention and
Within principle, any modification, equivalent replacement, improvement and so on be should all be included in the protection scope of the present invention.
Claims (10)
1. the low-power consumption DDS circuit with amplitude and phase error auto-correction function, characterized in that include: that charge-domain amplitude is missed
Difference detection amplifying circuit (10), charge-domain phase error detection amplifying circuit (11), K charge-domain analog-digital converters (12), control
Circuit (13) processed, ROM module (15), SRAM module (14), phase accumulator (16), the first delay circuit (17), phase amplitude
Converter (18), the second delay circuit (19), compensation circuit (110) and N current-mode DAC (111);
First, second input terminal of charge-domain phase error detection amplifying circuit (11) is connected respectively to N current-mode DAC
(111) signal output difference port, the control signal of charge-domain phase error detection amplifying circuit (11) are connected to control
First K option code output ports of circuit (13), the differential voltage output of charge-domain phase error detection amplifying circuit (11)
End is connected to the differential voltage input terminal of K charge-domain analog-digital converters (12);Charge-domain range error detects amplifying circuit
(10) the first, second input terminal is connected respectively to the signal output difference port of N current-mode DAC (111), charge-domain amplitude
The control signal of error-detecting amplifying circuit (10) is connected to the 2nd K option code output ports of control circuit (13), electricity
The differential voltage output end of lotus domain range error detection amplifying circuit (10) is connected to the difference of K charge-domain analog-digital converters (12)
Component voltage input terminal;The position the K quantization code of K charge-domain analog-digital converters (12) is output to the error input terminal of control circuit (13)
Mouthful;
The ROM control port of control circuit (13) exports control signal and gives ROM module (15), the SRAM control of control circuit (13)
Port exports control signal and gives SRAM module (14), and the first K delay code output ends of control circuit (13) are connected to first and prolong
Second input port of slow circuit (17), the 2nd K delay code output ends of control circuit (13) are connected to the second delay circuit
(19) the calibration control signal Ctrl output port of the second input port, control circuit (13) is connected to charge-domain phase simultaneously
Error-detecting amplifying circuit (11), K charge-domain analog-digital converters (12), compensation circuit (110), the first delay circuit (17) with
And second delay circuit (19) calibration control signal Ctrl input port;
First N calibration code output ends of first input port connection ROM module (15) of the first delay circuit (17), first prolongs
The position the X phase controlling input code of third input port connection phase accumulator (16) of slow circuit (17), the first delay circuit
(17) X hand over words are output to phase amplitude converter (18) by output port;First input of the second delay circuit (19)
Port connects the 2nd N calibration code output ends of ROM module (15), and the third input port of the second delay circuit (19) connects phase
The N position amplitude of position amplitude controller output controls input code, and the output port of the second delay circuit (19) exports N hand over words
To compensation circuit (110);3rd N calibration code outputs of first input port connection ROM module (15) of compensation circuit (110)
End, the position the N hand over word of third input port connection the second delay circuit (19) output of compensation circuit (110), compensation circuit
(110) N output codes are output to the data input pin of N current-mode DAC (111) by output port;Wherein, N is positive integer,
K is the positive integer no more than N.
2. as described in claim 1 with the low-power consumption DDS circuit of amplitude and phase error auto-correction function, characterized in that its
Operating mode includes calibration mode and compensation model;And it is introduced into calibration mode in circuit work, enters compensation model afterwards;
When entering calibration mode, X phase controlling input codes, N amplitudes control input codes, N output codes, the first K delay codes,
2nd K delay codes and K compensation codes are invalid, and the first N calibration codes are input to the first delay circuit (17), the 2nd N schools
Quasi- code is input to the second delay circuit (19), and the 3rd N calibration codes are input to compensation circuit (110);The charge-domain amplitude is missed
Difference detection amplifying circuit (10) first carries out range error calibration to N current-mode DAC (111), and then the charge-domain phase is missed
Difference detection amplifying circuit (11) successively carries out phase error school to N current-mode DAC (111) and phase amplitude converter (18)
It is quasi-;When entering compensation model, X phase controlling input codes are input to the first delay circuit (17), and N amplitudes control input code
It is input to the second delay circuit (19), N output codes are input to compensation circuit (110);First N calibration codes, the 2nd N calibrations
Code and the 3rd N calibration codes are invalid, and the first K delay codes, the 2nd K delay codes and K compensation codes are effective;The charge-domain width
Degree error calibration circuit starts to carry out N current-mode DAC (111) range error compensation, the charge-domain phase error calibration
Circuit carries out phase compensation to N current-mode DAC (111) and phase amplitude converter (18) simultaneously.
3. as claimed in claim 2 with the low-power consumption DDS circuit of amplitude and phase error auto-correction function, characterized in that its
When carrying out range error calibration to the N current-mode DAC (111), the job order of circuit is as follows:
Control circuit (13) controls charge-domain range error by Ctrl signal first and detects amplifying circuit (10), K charge-domains
Analog-digital converter (12) and compensation circuit (110) enter calibration mode, while exporting the 2nd K option codes and missing to charge-domain amplitude
Difference detection amplifying circuit (10);
Then control circuit (13) generates first group of the 2nd K option code, while controlling ROM module (15) and generating first group of third
N calibration codes;First group of the 3rd N calibration code enters compensation circuit (110) and obtains N output codes, N output codes enter to
The position N current-mode DAC (111) circuit of calibration, obtains first group of range error corresponding with the 3rd N calibration codes through digital-to-analogue conversion
Differential output current;Charge-domain range error detects amplifying circuit (10) and passes through first group of range error differential output current of detection
Amount, and handle and obtain the first grouping error voltage;First grouping error voltage is carried out modulus and turned by K charge-domain analog-digital converters (12)
It changes, available K quantization codes of first group of range error are simultaneously output to control circuit (13);Control circuit (13) obtains reception
K quantization codes of first group of range error are stored in SRAM module (14), complete the range error quantization under a kind of input condition;
And then, control circuit (13), which can generate second group of the 2nd K option code and control ROM module (15) simultaneously, generates second
The 3rd N calibration codes of group, second group of the 3rd N calibration code enter compensation circuit (110) and obtain N output codes, N output codes
Into the position N current-mode DAC (111) circuit to be calibrated, corresponding with second group of the 3rd N calibration code is obtained through digital-to-analogue conversion
Two groups of range error differential output currents;Charge-domain range error detects amplifying circuit (10) by comparing second group of difference output
Its difference is simultaneously amplified available second grouping error voltage by electric current and second group of reference voltage;K charge-domain moduluses turn
Second grouping error voltage is carried out analog-to-digital conversion by parallel operation (12), and available K quantization codes of second group of range error are simultaneously output to
Control circuit (13);Reception is obtained K quantization codes of second group of range error and is stored in SRAM module (14) by control circuit (13)
In, complete the range error quantization under second of input condition;
It recycles according to this, generates L when control circuit (13) generate the K option codes of L group the 2nd and control ROM module (15) simultaneously
The 3rd N calibration codes of group, and obtain K quantization codes of L group range error, and after being stored in SRAM module (14), control electric
The internal computing circuit in road (13) will calculate the K quantization codes of L group range error being stored in SRAM module (14)
Obtain K compensation codes;K compensation codes can be output in compensation circuit (110) by control circuit (13) at this time, and by compensation circuit
(110) it is arranged to compensate for mode, while keeping K compensation codes constant;So far, it completes to miss N current-mode DAC (111) amplitudes
The calibration of difference;
Above-mentioned to carry out in range error calibration process to N current-mode DAC (111), control circuit (13) generates each simultaneously
Group is output to the 3rd N calibration codes of compensation circuit (110) and is output to charge-domain range error detection amplifying circuit (10)
2nd K option codes must correspond, it may be assumed that the N calibration codes of J group the 3rd must make with the K option code cooperations of J group the 2nd
With;Wherein, L is no more than 2KPositive integer;J is the positive integer no more than L.
4. as claimed in claim 2 with the low-power consumption DDS circuit of amplitude and phase error auto-correction function, characterized in that its
When carrying out phase error calibration to the N current-mode DAC (111) and phase amplitude converter (18), the job order of circuit
It is as follows:
1, phase error calibration is carried out to N current-mode DAC (111) first:
1.1 control circuits (13) pass through Ctrl signal control charge-domain phase error detection amplifying circuit (11) and the second deferred telegram
Road (19) enters calibration mode, while exporting the first K option codes to charge-domain phase error detection amplifying circuit (11), starts
Phase error calibration is carried out to N current-mode DAC (111);
1.2 then control circuit (13) generate first group of the first K option code, while control ROM module (15) generation first group
2nd N calibration codes;First group of the 2nd N calibration code enters the second delay circuit (19) and obtains N hand over words, N conversions
Code enters N current-mode DAC (111) circuit to be calibrated, obtains corresponding with first group of the 2nd N calibration code the through digital-to-analogue conversion
One group of phase error differential output current;Charge-domain phase error detection amplifying circuit (11) passes through first group of phase error of detection
Differential output current amount, and handled to obtain first group of phase error voltage;K charge-domain analog-digital converters (12) are by first
Group phase error voltage carries out analog-to-digital conversion, and available K quantization codes of first group of phase error are simultaneously output to control circuit
(13);Reception is obtained K quantization codes of first group of phase error and is stored in SRAM module (14) by control circuit (13), completes one
The position N current-mode DAC (111) current phase error quantization under kind input condition;
1.3 and then, and control circuit (13) generates second group of the first K option code, while controlling ROM module (15) and generating second
The 2nd N calibration codes of group;Second group of the 2nd N calibration code enters the second delay circuit (19) and obtains N hand over words, and N turn
Escape enters the position N current-mode DAC (111) circuit to be calibrated, obtains through digital-to-analogue conversion corresponding with second group of the 2nd N calibration code
Second group of phase error differential output current;Charge-domain phase error detection amplifying circuit (11) passes through second group of phase of detection
Error differential output current amount, and handled to obtain second group of phase error voltage;K charge-domain analog-digital converters (12) will
Second group of phase error voltage carries out analog-to-digital conversion, and available K quantization codes of second group of phase error are simultaneously output to control electricity
Road (13);Reception is obtained K quantization codes of second group of phase error and is stored in SRAM module (14) by control circuit (13), is completed
N to be calibrated current-mode DAC (111) current phase error quantizations under two kinds of input conditions;
1.4 recycle according to this, when control circuit (13) generation N calibration codes of L group the 2nd and the K option codes of L group the first, and
To K quantization codes of L group phase error, and after being stored in SRAM module (14), the internal computing circuit of control circuit (13)
The K quantization codes of L group phase error being stored in K bit register group will be carried out that the 2nd K delay codes are calculated;Control
2nd K delay codes can be output in the second delay circuit (19) by circuit (13) at this time, and keep the 2nd K delay codes not
Become, the second delay circuit (19) is arranged to compensate for mode by control circuit (13), completes the phase to N current-mode DAC (111)
It calibrates for error;
2, later, control circuit (13) enters calibration mode by Ctrl signal control the first delay circuit (17), while exporting K
Position option code starts to carry out phase error to phase amplitude converter (18) to charge-domain phase error detection amplifying circuit (11)
Calibration;
Control circuit (13) controls ROM module (15) and generates the first N calibration codes, passes through the first delay circuit (17), charge-domain
Phase error detection amplifying circuit (11) and K charge-domain analog-digital converters (12), using and to N current-mode DAC (111)
Phase error calibrates identical step and method, obtains the first K delay codes and is output in the first delay circuit (17), simultaneously
Keep the first K delay codes constant, the first delay circuit (17) is arranged to compensate for mode by control circuit (13), is completed to phase
The phase error of amplitude converter (18) is calibrated;At this point, calibration mode terminates;
N current-mode DAC (111) and phase amplitude converter (18) are carried out in phase error calibration process above-mentioned, control
Each group of the first N calibration codes and the 2nd N calibration codes and be output to the inspection of charge-domain phase error that circuit (13) generates simultaneously
The first K option codes for surveying amplifying circuit (11) must correspond, it may be assumed that the N calibration codes of J group the first and the 2nd N calibrations
Code must be used cooperatively with the K option codes of J group the first;Wherein, L is no more than 2KPositive integer, J be just no more than L
Integer.
5. as described in claim 1 with the low-power consumption DDS circuit of amplitude and phase error auto-correction function, characterized in that institute
The charge-domain phase error detection amplifying circuit (11) stated includes: current sense resistor, reference clock generation circuit (21), phase demodulation
Device (22), loop filter (23) and the first charge-domain voltage amplifier circuit (24);The both ends of current sense resistor are separately connected
To the first, second input terminal of charge-domain phase error detection amplifying circuit (11), and it is connected respectively to the of phase discriminator (22)
One and second input terminal;Reference clock generation circuit (21) generates reference clock and is connected to mirror under the control of K option codes
The third input terminal of phase device (22);Phase discriminator (22) carries out further phase bit comparison to the signal of 3 input terminals and obtains phase
Error signal;Phase error signal obtains voltage signal V by loop filter (23) filteringi;ViBy the first charge-domain voltage
Amplifying circuit (24) amplification obtains error signal Vop and Von.
6. as described in claim 1 with the low-power consumption DDS circuit of amplitude and phase error auto-correction function, characterized in that institute
State charge-domain range error detection amplifying circuit (10) include: current sense resistor, reference data generation circuit (71), common mode not
Sensitive high-speed switch capacitor differential voltage signal sampling network (72) and the second charge-domain voltage amplifier circuit (73);Current detecting
The both ends of resistance are connected respectively to the first and second input terminals of charge-domain range error detection amplifying circuit (10), and are connected to
First and second input terminals of the insensitive high-speed switch capacitor differential voltage signal sampling network (72) of common mode;Reference data generates
Circuit (71) generates differential reference voltage output under the control of K option codes, and is connected to the insensitive high-speed switch electricity of common mode
Third and fourth input terminal of tolerance divided voltage signal sampling network (72);Switching capacity differential voltage signal sampling network is to 4
The voltage signal of a input terminal is further sampled, and differential voltage signal V is obtainedi+ and Vi-;By the second charge-domain voltage
Amplifying circuit (73) amplification obtains error signal Vop and Von.
7. as described in claim 1 with the low-power consumption DDS circuit of amplitude and phase error auto-correction function, characterized in that institute
The position the K charge-domain analog-digital converter (12) stated includes: the P grades of assembly line grade circuits based on charge-domain signal processing technology,
Analog-to-digital conversions and surplus amplification are completed for carrying out various processing to the obtained charge packet of sampling, and by each height grade circuit
Output digital code is input to delay SYN register, and the charge packet of each height grade circuit output enters next stage, each
Sub- grade circuit repeats the same course of work;P+1 grades and afterbody A-bit Flash analog-digital converter circuit, will
The P grades of charge packets transmitted are re-converted into voltage signal, and carry out the analog-to-digital conversion work of afterbody, and by the same level
The output digital code of circuit is input to delay SYN register, this grade of circuit only completes analog-to-digital conversion, amplifies without surplus;Prolong
When SYN register, be used to carry out delay alignment to the digital code of each sub- pipelining-stage output, and the digital code of alignment is defeated
Enter to figure adjustment module;Digital correction circuit module is used to receive the output digital code of SYN register, by received number
Character code carries out shifter-adder, to obtain the R bit digital output code of analog-digital converter;Wherein, R is positive integer, and P and A are little
In the positive integer of R.
8. as described in claim 1 with the low-power consumption DDS circuit of amplitude and phase error auto-correction function, characterized in that institute
It states the first delay circuit (17) and the second delay circuit (19) is all made of identical delay circuit, structure includes: N number of delay buffering
Unit and N number of K delay time register;Wherein, the first K delay time registers~delay time register of n-th K delay code inputs
End is all connected to K delay codes, and control signal input is all connected to Ctrl signal;First delay buffer cell~N
The delay code input terminal of delay buffer cell is connected respectively to the first K delay time registers~delay time register of n-th K and prolongs
Slow code output end, the first delay buffer cell~N delay buffer cell data output end are connected respectively to the 1st hand over word
~the N hand over word simultaneously exports, and the first delay buffer cell~N delay buffer cell first control signal input terminal is whole
It is connected to Ctrln signal, the first delay buffer cell~N delay buffer cell second control signal input terminal all connects
To Ctrl signal;Wherein, Ctrl and Ctrln is one group of reverse signal.
9. as claimed in claim 8 with the low-power consumption DDS circuit of amplitude and phase error auto-correction function, characterized in that institute
Stating inside compensation circuit (110) includes: delay buffer circuit and K add circuits, and be delayed buffer circuit and K additions it is electric
The delay on road must be equal;Compensation circuit (110) can operate at two kinds of the mode of being calibrated and compensated under the control of Ctrl signal
Mode;
When in the calibration mode, Ctrl signal is effective, and the output of K add circuits will be invalid, and the 3rd N calibration codes are slow through being delayed
N output codes are obtained after rushing circuit and are exported;
When in the compensation mode, Ctrln signal is effective, and the output of K add circuits will be effective, and N-K hand over words are slow through being delayed
N-K output codes are obtained after rushing circuit and are exported, and K hand over words are added to obtain K with K compensation codes by K add circuits
Output code simultaneously exports.
10. as described in claim 1 with the low-power consumption DDS circuit of amplitude and phase error auto-correction function, characterized in that institute
Stating control circuit (13) includes: core control circuit, ROM reading circuit, the first delay code generation circuit, the second delay code generation
Circuit, compensation codes generation circuit, option code generation circuit, computing circuit, SRAM read/write circuit and K bit register;
The connection relationship of foregoing circuit are as follows: the first output end of core control circuit is connected to the input terminal of ROM reading circuit, core
The second output terminal of heart control circuit is connected to the control signal of the first delay code generation circuit, the third of core control circuit
Output end is connected to the control signal of the second delay code generation circuit, and the 4th output end of core control circuit is connected to compensation
The control signal of code generation circuit, the 5th output end of core control circuit are connected to the control signal of computing circuit, core
6th output end of heart control circuit is connected to the control signal of option code generation circuit, the 7th output of core control circuit
End generates calibration control signal Ctrl, and the 8th output end of core control circuit is connected to K bit register and SRAM read-write simultaneously
The control signal of circuit, the input terminal of core control circuit are connected to calibration starting control signal;ROM reading circuit is according to core
The control instruction of heart control circuit generates ROM address code;The data input pin of computing circuit receives SRAM read/write circuit output end
The data of transmission, and the first K error codes, the 2nd K error codes and the 3rd K are generated according to the control instruction of core control circuit
Position error codes;The data input pin of first delay code generation circuit receives the first K mistakes that computing circuit data output end is sent
Poor code, and the first K delay codes are generated according to the control instruction of core control circuit;The data of second delay code generation circuit are defeated
Enter end and receive the 2nd K error codes that computing circuit data output end is sent, and is produced according to the control instruction of core control circuit
Raw 2nd K delay codes;The data input pin of compensation codes generation circuit receive that computing circuit data output end sends the 3rd K
Error codes, and K compensation codes are generated according to the control instruction of core control circuit;Option code generation circuit controls electricity according to core
The control instruction on road generates the first K option codes and the 2nd K option codes;The data input pin of K bit register receives described K
The position the K quantization code that the output end of charge-domain analog-digital converter (12) is sent, and will be deposited according to the control instruction of core control circuit
The data of storage inside it are sent to SRAM read/write circuit;SRAM read/write circuit is generated according to the control instruction of core control circuit
SRAM address date code carries out reading data and write-in to SRAM module (14).
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710135908.7A CN106933299B (en) | 2017-03-09 | 2017-03-09 | Low-power consumption DDS circuit with amplitude and phase error auto-correction function |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201710135908.7A CN106933299B (en) | 2017-03-09 | 2017-03-09 | Low-power consumption DDS circuit with amplitude and phase error auto-correction function |
Publications (2)
Publication Number | Publication Date |
---|---|
CN106933299A CN106933299A (en) | 2017-07-07 |
CN106933299B true CN106933299B (en) | 2019-07-19 |
Family
ID=59433420
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201710135908.7A Active CN106933299B (en) | 2017-03-09 | 2017-03-09 | Low-power consumption DDS circuit with amplitude and phase error auto-correction function |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN106933299B (en) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109347504B (en) * | 2018-09-26 | 2020-08-25 | 西安烽火电子科技有限责任公司 | Short wave radio frequency digital processing system |
CN110823142B (en) * | 2019-11-11 | 2021-04-30 | 华滋奔腾(苏州)安监仪器有限公司 | Demodulator and demodulation method based on gain phase discriminator coaxial cable strain sensor |
CN112946589B (en) * | 2021-02-01 | 2022-09-06 | 上海交通大学 | Phase self-calibration method for motion measurement of asynchronous FMCW radar system |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1774689A (en) * | 2003-04-16 | 2006-05-17 | 索尼爱立信移动通讯股份有限公司 | Direct digital frequency synthesizer for cellular wireless communication systems based on fast frequency-hopped spread spectrum technology |
WO2009018199A2 (en) * | 2007-07-31 | 2009-02-05 | Motorola, Inc. | Method and system for managing digital to time conversion |
CN101454981A (en) * | 2006-03-08 | 2009-06-10 | 摩托罗拉公司 | Direct digital synthesizer with variable reference for improved spurious performance |
CN101883469A (en) * | 2010-03-15 | 2010-11-10 | 中国原子能科学研究院 | Method and device for eliminating amplitude-phase control crosstalk in self-excitation mode |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7446699B2 (en) * | 2006-03-10 | 2008-11-04 | Mcewan Thomas Edward | Error corrector for radar timing systems |
-
2017
- 2017-03-09 CN CN201710135908.7A patent/CN106933299B/en active Active
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1774689A (en) * | 2003-04-16 | 2006-05-17 | 索尼爱立信移动通讯股份有限公司 | Direct digital frequency synthesizer for cellular wireless communication systems based on fast frequency-hopped spread spectrum technology |
CN101454981A (en) * | 2006-03-08 | 2009-06-10 | 摩托罗拉公司 | Direct digital synthesizer with variable reference for improved spurious performance |
WO2009018199A2 (en) * | 2007-07-31 | 2009-02-05 | Motorola, Inc. | Method and system for managing digital to time conversion |
CN101883469A (en) * | 2010-03-15 | 2010-11-10 | 中国原子能科学研究院 | Method and device for eliminating amplitude-phase control crosstalk in self-excitation mode |
Non-Patent Citations (1)
Title |
---|
"高速任意波形合成关键技术研究";刘科;《中国博士学位论文全文数据库 信息科技辑》;20110815(第8期);第I135-63页 |
Also Published As
Publication number | Publication date |
---|---|
CN106933299A (en) | 2017-07-07 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN106953637A (en) | Charge-domain range error calibrates circuit and the DDS circuit using the calibration circuit | |
CN106933299B (en) | Low-power consumption DDS circuit with amplitude and phase error auto-correction function | |
US7834786B2 (en) | Sample hold circuit for use in time-interleaved A/D converter apparatus including paralleled low-speed pipeline A/D converters | |
CN110048717A (en) | It is a kind of to realize the time-interleaved self-alignment method and device of analog-digital converter | |
US7796077B2 (en) | High speed high resolution ADC using successive approximation technique | |
EP2485400B1 (en) | Sampling | |
JPH03192814A (en) | Pulse generator | |
CN107070450A (en) | Multichannel DAC phase errors calibration circuit based on charge-domain signal transacting | |
CN105933004A (en) | Novel high-precision capacitor self-calibration analog-to-digital converter of successive approximation type | |
CN106788429B (en) | DAC offset error calibration circuit based on charge domain signal processing | |
EP3567720A1 (en) | Mismatch and reference common-mode offset insensitive single-ended switched capacitor gain stage | |
CN110401443A (en) | Circuit is eliminated in the metastable detection of synchronised clock adc circuit | |
CN108768396A (en) | A kind of clock phase mismatch calibration circuit for multichannel ADC | |
CN110768674A (en) | Analog-to-digital conversion device, analog-to-digital conversion equipment and analog-to-digital conversion method | |
CN102545906B (en) | Current digital to analog conversion method and device | |
Li et al. | A review on calibration methods of timing-skew in time-interleaved ADCs | |
CN104702282A (en) | Digital calibration method and circuit for multi-stage multi-bit sub circuit in analog-digital converters | |
CN109462402A (en) | Mixed type pipelined ADC architecture | |
CN106936433A (en) | Charge-domain phase error calibrates circuit and the DDS circuit using the calibration circuit | |
CN110690901A (en) | High-speed low-power-consumption SAR ADC capacitance mismatch self-calibration method and circuit | |
CN109818617A (en) | A kind of high-precision calibration device of SAR type ADC | |
US4527117A (en) | Signal processing system employing charge transfer devices | |
CN106330189B (en) | A kind of charge-domain capacitor digital conversion circuit | |
US6946986B2 (en) | Differential sampling circuit for generating a differential input signal DC offset | |
CN202424690U (en) | Current type digital-to-analogue conversion device |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant |