CN106895780B - 用于测量对象的位置的光学装置 - Google Patents
用于测量对象的位置的光学装置 Download PDFInfo
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- CN106895780B CN106895780B CN201611179066.7A CN201611179066A CN106895780B CN 106895780 B CN106895780 B CN 106895780B CN 201611179066 A CN201611179066 A CN 201611179066A CN 106895780 B CN106895780 B CN 106895780B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/365—Control or image processing arrangements for digital or video microscopes
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- C—CHEMISTRY; METALLURGY
- C12—BIOCHEMISTRY; BEER; SPIRITS; WINE; VINEGAR; MICROBIOLOGY; ENZYMOLOGY; MUTATION OR GENETIC ENGINEERING
- C12Q—MEASURING OR TESTING PROCESSES INVOLVING ENZYMES, NUCLEIC ACIDS OR MICROORGANISMS; COMPOSITIONS OR TEST PAPERS THEREFOR; PROCESSES OF PREPARING SUCH COMPOSITIONS; CONDITION-RESPONSIVE CONTROL IN MICROBIOLOGICAL OR ENZYMOLOGICAL PROCESSES
- C12Q1/00—Measuring or testing processes involving enzymes, nucleic acids or microorganisms; Compositions therefor; Processes of preparing such compositions
- C12Q1/68—Measuring or testing processes involving enzymes, nucleic acids or microorganisms; Compositions therefor; Processes of preparing such compositions involving nucleic acids
- C12Q1/6813—Hybridisation assays
- C12Q1/6816—Hybridisation assays characterised by the detection means
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/002—Measuring arrangements characterised by the use of optical techniques for measuring two or more coordinates
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0032—Optical details of illumination, e.g. light-sources, pinholes, beam splitters, slits, fibers
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/0004—Microscopes specially adapted for specific applications
- G02B21/002—Scanning microscopes
- G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
- G02B21/0052—Optical details of the image generation
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/02—Objectives
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/086—Condensers for transillumination only
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/06—Means for illuminating specimens
- G02B21/08—Condensers
- G02B21/10—Condensers affording dark-field illumination
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/18—Arrangements with more than one light path, e.g. for comparing two specimens
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/24—Base structure
- G02B21/241—Devices for focusing
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B21/00—Microscopes
- G02B21/36—Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
- G02B21/361—Optical details, e.g. image relay to the camera or image sensor
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/005—Diaphragms
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/04—Prisms
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Optics & Photonics (AREA)
- Analytical Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Multimedia (AREA)
- Organic Chemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Wood Science & Technology (AREA)
- Proteomics, Peptides & Aminoacids (AREA)
- Health & Medical Sciences (AREA)
- Zoology (AREA)
- Theoretical Computer Science (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Microbiology (AREA)
- Molecular Biology (AREA)
- Immunology (AREA)
- Biotechnology (AREA)
- Biochemistry (AREA)
- Biophysics (AREA)
- General Engineering & Computer Science (AREA)
- General Health & Medical Sciences (AREA)
- Genetics & Genomics (AREA)
- Signal Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
Claims (21)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
EP15307065 | 2015-12-18 | ||
EP15307065.1 | 2015-12-18 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN106895780A CN106895780A (zh) | 2017-06-27 |
CN106895780B true CN106895780B (zh) | 2019-08-20 |
Family
ID=55077376
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201611179066.7A Active CN106895780B (zh) | 2015-12-18 | 2016-12-19 | 用于测量对象的位置的光学装置 |
Country Status (3)
Country | Link |
---|---|
US (2) | US9933609B2 (zh) |
EP (2) | EP3181703B1 (zh) |
CN (1) | CN106895780B (zh) |
Families Citing this family (11)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20180023943A1 (en) * | 2016-07-21 | 2018-01-25 | Sony Corporation | Optical apparatuses and method of collecting three dimensional information of an object |
DE102017214189A1 (de) * | 2017-08-15 | 2019-02-21 | Carl Zeiss Microscopy Gmbh | Verfahren zum Betrieb einer Mikroskopieranordnung und Mikroskopieranordnung mit einem ersten Mikroskop und mindestens einem weiteren Mikroskop |
US10855973B1 (en) * | 2017-12-21 | 2020-12-01 | Facebook Technologies, Llc | Depth mapping using fringe interferometry |
WO2019041756A1 (zh) | 2018-02-06 | 2019-03-07 | 深圳市汇顶科技股份有限公司 | 屏下生物特征识别装置、生物特征识别组件和终端设备 |
CN111338332B (zh) * | 2018-11-30 | 2022-03-18 | 宝时得科技(中国)有限公司 | 自动行走设备、其避障方法及装置 |
US11686935B2 (en) * | 2019-01-29 | 2023-06-27 | Meta Platforms Technologies, Llc | Interferometric structured illumination for depth determination |
EP3757644A1 (en) | 2019-06-26 | 2020-12-30 | Paris Sciences et Lettres - Quartier Latin | Deformable device for positioning a holder |
EP3825752A1 (de) * | 2019-11-20 | 2021-05-26 | Siemens Aktiengesellschaft | Kompaktes common path interferometer |
CN113358060B (zh) * | 2021-08-09 | 2022-04-01 | 武汉精测电子集团股份有限公司 | 基于共焦光路的三维测量系统和方法 |
WO2023187759A1 (en) | 2022-04-01 | 2023-10-05 | Depixus SAS | Methods of screening compounds |
CN114964181B (zh) * | 2022-05-27 | 2023-04-25 | 哈尔滨工业大学 | 基于波前零差干涉的高精度双轴激光水平仪及测量方法 |
Citations (3)
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CN102589428A (zh) * | 2012-01-17 | 2012-07-18 | 浙江大学 | 基于非对称入射的样品轴向位置跟踪校正的方法和装置 |
CN103069342A (zh) * | 2010-06-18 | 2013-04-24 | 卡尔蔡司Smt有限责任公司 | 利用光刻掩模所产生的辐射分布的局部解析测量的装置与方法 |
CN104655024A (zh) * | 2015-02-11 | 2015-05-27 | 苏州天准科技股份有限公司 | 一种影像测量设备及其快速准确测高装置与方法 |
Family Cites Families (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7052650B2 (en) | 1997-03-28 | 2006-05-30 | Center National De La Recherche Scientifique (Cnrs) | Apparatus and method for the manipulation and testing of molecules, and in particular of DNA |
US20020102595A1 (en) * | 2001-01-29 | 2002-08-01 | Davis Lloyd Mervyn | Methods for detection of incorporation of a nucleotide onto a nucleic acid primer |
JP4789177B2 (ja) | 2005-07-06 | 2011-10-12 | 独立行政法人科学技術振興機構 | 3次元位置観測方法及び装置 |
WO2007016502A2 (en) * | 2005-08-02 | 2007-02-08 | Wisconsin Alumni Research Foundation | Synthesis of arrays of oligonucleotides and other chain molecules |
US20070115452A1 (en) * | 2005-11-23 | 2007-05-24 | Asml Netherlands B.V. | Method of measuring the magnification of a projection system, device manufacturing method and computer program product |
EP2106531A2 (en) * | 2007-01-22 | 2009-10-07 | California Institute Of Technology | Method for quantitative 3-d imaging |
WO2010090849A1 (en) * | 2009-01-21 | 2010-08-12 | California Institute Of Technology | Quantitative differential interference contrast (dic) devices for computed depth sectioning |
EP2378310B1 (en) * | 2010-04-15 | 2016-08-10 | Rockwell Automation Safety AG | Time of flight camera unit and optical surveillance system |
US20120281113A1 (en) * | 2011-05-06 | 2012-11-08 | Raytheon Company | USING A MULTI-CHIP SYSTEM IN A PACKAGE (MCSiP) IN IMAGING APPLICATIONS TO YIELD A LOW COST, SMALL SIZE CAMERA ON A CHIP |
DE102013005563A1 (de) * | 2013-03-28 | 2014-10-02 | Carl Zeiss Microscopy Gmbh | Lichtmikroskop und verfahren zum untersuchen einer mikroskopischen probe |
JP6327931B2 (ja) * | 2014-05-02 | 2018-05-23 | キヤノン株式会社 | 画像処理装置、情報処理方法及びプログラム |
JP2015219209A (ja) * | 2014-05-21 | 2015-12-07 | 株式会社安川電機 | 計測システム、照射装置、演算装置及び計測方法 |
JP2016033620A (ja) * | 2014-07-31 | 2016-03-10 | キヤノン株式会社 | 画像取得装置 |
JP6408893B2 (ja) * | 2014-12-16 | 2018-10-17 | オリンパス株式会社 | 3次元位置情報取得方法及び3次元位置情報取得装置 |
-
2016
- 2016-12-16 EP EP16204727.8A patent/EP3181703B1/en active Active
- 2016-12-16 US US15/381,320 patent/US9933609B2/en active Active
- 2016-12-16 EP EP18210281.4A patent/EP3505641A1/en active Pending
- 2016-12-19 CN CN201611179066.7A patent/CN106895780B/zh active Active
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2018
- 2018-02-15 US US15/897,335 patent/US10209505B2/en active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN103069342A (zh) * | 2010-06-18 | 2013-04-24 | 卡尔蔡司Smt有限责任公司 | 利用光刻掩模所产生的辐射分布的局部解析测量的装置与方法 |
CN102589428A (zh) * | 2012-01-17 | 2012-07-18 | 浙江大学 | 基于非对称入射的样品轴向位置跟踪校正的方法和装置 |
CN104655024A (zh) * | 2015-02-11 | 2015-05-27 | 苏州天准科技股份有限公司 | 一种影像测量设备及其快速准确测高装置与方法 |
Also Published As
Publication number | Publication date |
---|---|
US20170176735A1 (en) | 2017-06-22 |
EP3181703A1 (en) | 2017-06-21 |
EP3505641A1 (en) | 2019-07-03 |
US20180172974A1 (en) | 2018-06-21 |
CN106895780A (zh) | 2017-06-27 |
US10209505B2 (en) | 2019-02-19 |
US9933609B2 (en) | 2018-04-03 |
EP3181703B1 (en) | 2018-12-05 |
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Effective date of registration: 20200820 Address after: Paris France Co-patentee after: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE Patentee after: PARIS SCIENCES ET LETTRES - QUARTIER LATIN Co-patentee after: SORBONNE UNIVERSITE Co-patentee after: UNIVERSITE PARIS DIDEROT - PARIS 7 Address before: Paris France Co-patentee before: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE Patentee before: PARIS SCIENCES ET LETTRES - QUARTIER LATIN Co-patentee before: Pierre and Marie Curie University (University of Paris VI) Co-patentee before: UNIVERSITE PARIS DIDEROT - PARIS 7 |
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Address after: Paris France Patentee after: Paris foundation for science and Literature Patentee after: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE Patentee after: SORBONNE UNIVERSITE Patentee after: UNIVERSITE PARIS DIDEROT - PARIS 7 Address before: Paris France Patentee before: PARIS SCIENCES ET LETTRES - QUARTIER LATIN Patentee before: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE Patentee before: SORBONNE UNIVERSITE Patentee before: UNIVERSITE PARIS DIDEROT - PARIS 7 |
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