CN106595851A - Testing device for light-emitting device - Google Patents
Testing device for light-emitting device Download PDFInfo
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- CN106595851A CN106595851A CN201510673800.4A CN201510673800A CN106595851A CN 106595851 A CN106595851 A CN 106595851A CN 201510673800 A CN201510673800 A CN 201510673800A CN 106595851 A CN106595851 A CN 106595851A
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- light
- emitting device
- test equipment
- integrating sphere
- reflecting layer
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Abstract
The invention discloses a testing device for a light-emitting device. The testing device comprises an integrating sphere, a probe for transmitting a current to the light-emitting device during the light-emitting device testing process, and a connecting part connected to the integrating sphere. The connecting part has a hole or a notch; and the probe passes through the hole or the notch. Besides, the connecting part is also provided with a light input port for receiving light emitted by the light-emitting device.
Description
Technical field
The present invention relates to a kind of test equipment of light-emitting device, can more particularly to increase the luminous dress for receiving light
The test equipment put.
Background technology
Fig. 1 show the test equipment of existing light-emitting device.This test equipment includes a supporting body 102,
One current source 104 and an integrating sphere 103.Supporting body 102 is available for determinand 101 placed on it, and
There is provided with the electrode contact of determinand 101 by probe (probe) 105a and 105b by current source 104
One electric current to determinand 101, determinand 101 thus radiate light, wherein probe fixture 106a
With 106b respectively to fixed probe 105a and 105b.Integrating sphere 103 is a hollow sphere, comprising
An one optical input 103i and light output mouth 103e.Determinand 101 is placed in the light input of integrating sphere 103
Near mouth 103i, and the light that determinand 101 is radiated enters integrating sphere 103 by optical input 103i
And collected by it, optical input 103i has an opening interior diameter W.What determinand 101 was launched
Light can be evenly distributed in integrating sphere 103 after the inner surface Multiple Scattering of integrating sphere 103, reflection
On surface, thus characteristic a, detector 108 is connected to the light output mouth 103e of integrating sphere 103 to measure
Survey the optical characteristics of determinand 101.Detector 108 can pass through the light of an optical fiber 107 and integrating sphere 103
Delivery outlet 103e connects.Detector 108 can be a photometer (photometer), a radiometer
(radiometer), a spectroradiometer (spectroradiometer) or a colorimeter colorimeter).
The test equipment of Fig. 1 is illustrated in figure 2 when light is collected, determinand and integrating sphere optical input
Distance and receive angular limit situation, this test equipment collect light when, even if as far as possible adjustment is treated
Survey thing 101 close to the optical input 103i of integrating sphere 103, but because being limited to probe 105a and 105b
Obstruction, determinand 101 has it to limit with the optical input 103i's of integrating sphere 103 apart from H, one
As substantially near when can tune to 6mm～8mm, and have in an opening with an optical input 103i
Diameter W is the situation of 14mm, and it receives optic angle θ about when 90 °～100 °, that is, there is receipts angular less
Shortcoming, easily have light to leak uncollected situation, and affect the precision of test.
Although illustrating the test device of existing light-emitting device in Fig. 1, however, this kind of existing luminous
The test device of device simultaneously is not used to test flip-over type (Flip-Chip type) light-emitting device.Such as Fig. 9 A or
It is the existing test equipment to test flip-over type light-emitting device, wherein shown in Fig. 9 A shown in Fig. 9 B
The situation of the light-emitting device 901 at edge is located at for test；And be then that test is located at non-edge shown in Fig. 9 B
Light-emitting device 901 situation.This test equipment includes a transparent supporting body 902, a current source (figure
Do not show) carried by the probe 905a and 905b for being fixed with probe fixture 906a and 906b respectively
For an electric current to light-emitting device 901 to be measured.As illustrated, multiple light-emitting devices 901 are with array arrangement
It is adhered on a film 912, the blue film (blue tape) of film 912 e.g. is that frame is attached is fixed on a ring
Shape body 911.This multiple light-emitting device 901 is all placed on transparent supporting body 902 together with film 912.
Because light-emitting device 901 is the light-emitting device of flip-over type, with two electrodes the same of its substrate is located relative to
Side, and exiting surface is in the opposite side of substrate.Probe 905a and 905b by light-emitting device 901 top with
The electrode contact of light-emitting device 901, and light-emitting device 901 goes out light by lower section, wherein, supporting body 902
For a transparent supporting body, the lower integral ball 903L for being located at the lower section of supporting body 902 is set to be input into by its light
Mouthful 903i collect above-mentioned light-emitting device 901 it is downward go out light.And in order that testing more precisely, another product
Bulb separation, i.e. upper integral ball 903U are then arranged on light-emitting device 901, to be input into by its light
Mouth 903i ' collects the light upwards of light-emitting device 901, the light that this part is mainly reflected or scattered.
And final metric data is the measurement for adding up lower integral ball 903L and upper integral ball 903U.
As shown in Figure 9 B, when test is located at the light-emitting device 901 of non-edge, light-emitting device 901 to be measured
Surrounding has other light-emitting devices 901, and as shown in Figure 9 A, test is located at the light-emitting device 901 at edge
When, the outside of light-emitting device 901 to be measured is without other light-emitting devices 901, therefore sending out positioned at edge
Electro-optical device 901, in test, when the situation around it is tested with the light-emitting device 901 for being located at non-edge
Situation around it is different.In more detail, positioned at edge light-emitting device 901 test when, partly to
On light easily miss due to a lack of the reflex of other light-emitting devices 901.
The content of the invention
To solve the above problems, the present invention provides a kind of test equipment of light-emitting device, comprising an integrating sphere,
One probe conducts an electric current to above-mentioned light-emitting device and a connection when being used to test above-mentioned light-emitting device
Portion connects with above-mentioned integrating sphere；Wherein, above-mentioned connecting portion has a perforate or breach, and above-mentioned probe is passed through
Above-mentioned perforate or breach, and there is above-mentioned connecting portion an optical input to send out to receive above-mentioned light-emitting device
The light for going out.
The present invention also provides a kind of test equipment of light-emitting device, and comprising an integrating sphere optical input is included
It is located on above-mentioned optical input to receive the light, a transparent supporting body that above-mentioned light-emitting device sent,
To carry above-mentioned light-emitting device and a reflection unit adjacent to above-mentioned light-emitting device to reflect above-mentioned
The light that electro-optical device is sent.
Description of the drawings
Fig. 1 is the schematic diagram of the test equipment of existing light-emitting device；
Fig. 2 for Fig. 1 light-emitting device test equipment collect light when, determinand is defeated with integrating sphere light
The schematic diagram of the situation that the distance and receipts angular of entrance is limited；
Fig. 3 is the schematic diagram of the test equipment of the light-emitting device of first embodiment of the invention；
Fig. 3 A are the local of integrating sphere 303, connecting portion 303c and the relation of light-emitting device 301 in Fig. 3
Enlarged drawing；
Fig. 4 A and Fig. 4 B are respectively two kinds of enforcements of the integrating sphere in the test equipment of Fig. 3 and connecting portion
The side view of aspect；
Fig. 5 is embedded in after aperture adjustment device for the integrating sphere and connecting portion of first embodiment in connecting portion
Lower view；
Fig. 6 is the schematic diagram of the test equipment of the light-emitting device of second embodiment of the invention；
Fig. 7 is the schematic diagram of the removable part of the connecting portion in Fig. 6；
Fig. 8 is the schematic diagram of the test equipment of the light-emitting device of third embodiment of the invention；
Fig. 9 A and Fig. 9 B are the existing test equipment to test flip-over type light-emitting device, wherein Fig. 9 A
The schematic diagram of the light-emitting device positioned at edge, and Fig. 9 B are shown in the light-emitting device for testing multiple arrangements
The schematic diagram of the shown light-emitting device that non-edge is then located at for test；
Figure 10 is the schematic diagram of the test equipment of the light-emitting device of fourth embodiment of the invention；
Figure 11 is the schematic diagram of the test equipment of the light-emitting device of fifth embodiment of the invention；
Figure 12 is the top view of the reflection unit in Figure 11 and transparent supporting body；
Figure 13 is the schematic diagram of the test equipment of the light-emitting device of sixth embodiment of the invention；
Figure 14 is the top view of the relativeness of the ring bodies, film and reflection unit in Figure 13.
Symbol description
103e light output mouths
104 current sources
107 optical fiber
108 detectors
W opening interior diameters
The distance of the optical input of H determinands and integrating sphere
θ receives optic angle
101,301,801,901 light-emitting devices
102,302 supporting bodies
302p push pin device
103,303,603,803,903L ' integrating spheres
303c, 603c, 803c connecting portion
103i, 303i, 803i, 903i, 903i ' optical input
303h perforates
303h ', 609h ' breach
105a, 105b, 305a, 305b, 605a, 605b, 805a, 805b, 905a, 905b probe
106a, 106b, 306a, 306b, 906a, 906b probe fixture
309 aperture adjustment devices
309r, 609r are open
Aisle of the 309s for probe movement
W ' interior diameters
6031,8031 standing parts
6032,8032 removable parts
609 hollow cylinders
609f fixing devices
The interior diameter of 609W upper sheds
609W ' interior diameters
The opening inside diameter of 803W standing parts
The external diameter of 809D removable parts
810 device for image
902 transparent supporting bodies
902R, 909,911R reflection unit
903L lower integral balls
903U upper integral balls
903W optical input interior diameters
The opening interior diameter of 909W reflection units
911 ring bodies
912 films
Specific embodiment
The test equipment of the light-emitting device of Fig. 3 display first embodiment of the invention, and Fig. 4 A and Fig. 4 B
The side-looking of two kinds of enforcement aspects of integrating sphere 303 in this test equipment and connecting portion 303c is shown respectively
Figure.Therefore, please refer to Fig. 3 and Fig. 4 A～Fig. 4 B, as illustrated, the test of the present embodiment sets
It is standby to connect with integrating sphere 303 and with such as Fig. 4 A or Fig. 4 B comprising integrating sphere 303, connecting portion 303c
In perforate 303h or breach 303h ' and probe 305a and 305b can be with light-emitting device 301 to be measured
Electrode contact be used to test light-emitting device 301 when conduct an electric current to light-emitting device 301, light dress
Put 301 thus radiate light.The test equipment of the present embodiment also comprising probe fixture 306a with
306b respectively to fixed probe 305a and 305b, supporting body 302 to carry light-emitting device 301,
Push pin device 302p is in supporting body 302.Probe 305a and 305b is each passed through the perforate of Fig. 4 A
Breach 303h ' in 303h or Fig. 4 B and be connected to the electrode of light-emitting device 301, such as Fig. 4 A show,
The connecting portion 303c of the present embodiment connects with integrating sphere 303 and is formed as one with integrating sphere 303.Even
The inner surface of socket part 303c can be coated with same reflecting material, such as sulphur with the inner surface of integrating sphere 303
Sour barium (BaSiO4).Connecting portion 303c one end has an optical input 303i to receive light-emitting device 301
The light for being sent.Here is implemented in aspect, and connecting portion 303c has a perforate 303h.Shown in Fig. 4 B
For integrating sphere 303 and another enforcement aspect of connecting portion 303c, the integrating sphere 303 in Fig. 4 B substantially with
It is identical shown in Fig. 4 A, but in here enforcement aspect, connecting portion 303c then has a breach 303h '.Phase
Perforate 303h for Fig. 4 A is a closing kenel, and the breach 303h ' in Fig. 4 B is an opening kenel.
In other words, in Figure 4 A, as perforate 303h of the probe through Fig. 4 A, probe is through place's quilt
Connecting portion 303c entirely around, and work as probe through Fig. 4 B breach 303h ' when, probe through place
Not fully connection portion 303c surround.Or say, the perforate 303h and optical input 303i of Fig. 4 A
It is not attached to, and the breach 303h ' of Fig. 4 B is connected with optical input 303i.Because probe passes through perforate 303h
Or breach 303h ', by the design of this connecting portion 303c, as shown in figure 3, light-emitting device 301 will not
As existing test equipment is limited to the obstruction of probe 305a and 305b, and can try one's best to optical input
303i is close.Fig. 3 A show that integrating sphere 303 in Fig. 3, connecting portion 303c and light-emitting device 301 are closed
The partial enlarged drawing of system, in test, the optical input 303i of light-emitting device 301 and connecting portion 303c
Minimum range H be preferably less than or equal to 3mm；Receive optic angle θ and be preferably greater than 130 °, with effective
Improve prior art and receive the not enough shortcoming of optic angle, wherein it is that (light dress under geometrically symmetric to receive optic angle θ
Put 301 be placed in optical input 303i the center of circle lower section when) center of light-emitting device 301 respectively with optical input
The angle of two lines that the two ends of the opening interior diameter W of 303i are constituted, and meet
θ=2*tan-1[(W/2)/H].By the design of the present invention, the opening interior diameter W of optical input 303i is adjusted
Can have with minimum range H of the optical input 303i of connecting portion 303c in test with light-emitting device 301
Effect increases receives optic angle θ.
Push pin device 302p among the present embodiment, to control light-emitting device 301 and optical input 303i
Distance.As shown in figure 3, push pin device 302p is located at the supporting body 302 for carrying light-emitting device 301
In.In test, light-emitting device 301 is placed on supporting body 302, and positioned at push pin device 302p
Surface, and the jack-up upwards of light-emitting device 301 is made by light-emitting device 301 by push pin device 302p
It is more close to optical input 303i again, thus increase and receive angular.Then, traveling probe 305a with
305b simultaneously makes two electrode contacts of itself and light-emitting device 301 and supplies current to light-emitting device 301 to light
Light-emitting device 301.
Fig. 5 show the integrating sphere 303 of the present embodiment and the lower view of connecting portion 303c.Such as Fig. 5 institutes
Show, the test equipment of the present embodiment is optionally also embedded in connecting portion comprising an aperture adjustment device 309
In 303c and substantially with trim at optical input 303i.Seen by lower view, aperture adjustment device 309
Tool one is open 309r less than optical input 303i, that is, the interior diameter W ' of the 309r that is open is less than optical input
The interior diameter W of 103i.Aperture adjustment device 309 is located at aperture adjustment device 309 comprising a reflecting layer
Towards the surface of the centre of sphere of integrating sphere 303, reflecting layer is for the reflectivity of the light that light-emitting device 301 is sent
More than 70%.Reflecting layer includes a metal material, such as golden (Au), silver-colored (Ag), or aluminium (Al).Aperture
Adjusting apparatus 309 have an aisle 309s to house or provide the probe 305a and 305b spaces of movement.
Thus, by this aperture adjustment device 309, for different size of light-emitting device 301, can coordinate
The interior diameter W ' of the bore to opening 309r of adjustment optical input 303i actual receipts light, to adjust receipts light
Angle θ, and then reach and more accurately measure.
Fig. 6 shows the test equipment of the light-emitting device of second embodiment of the invention, and Fig. 7 shows this test
The removable part 6032 of the connecting portion 603c in equipment.Therefore, please refer to Fig. 6 and Fig. 7,
As shown in fig. 6, the test equipment of the light-emitting device of second embodiment of the invention sets with the test shown in Fig. 3
It is standby to compare, except differences described below part, substantially construct with identical.As shown in fig. 6,
The connecting portion 603c of the present embodiment includes a standing part 6031 and a removable part 6032.Fig. 7
Left side is diagrammatically shown, and the removable part 6032 of connecting portion 603c is located away from standing part 6031, and such as
Shown in Fig. 7 right diagrams, when light-emitting device is tested, removable part 6032 and standing part 6031
Engage.Standing part 6031 is integrally formed with integrating sphere 603, and its inner surface can be with integrating sphere 603
Inner surface be coated with same reflecting material, such as barium sulfate (BaSiO4).As shown in fig. 7, separable
Part 6032 connects comprising a hollow cylinder 609 and fixing device 609f with hollow cylinder 609.In
Void column body 609 has a upper shed to connect with standing part 6031, the interior diameter 609W of upper shed
It is substantially identical with the opening interior diameter of standing part 6031.The side wall of hollow cylinder 609 has breach
609h ' for probe 605a and 605b with passing through.The bottom of hollow cylinder 609 has an opening 609r,
Interior diameter 609Ws of its interior diameter 609W ' less than or equal to upper shed.Fixing device 609f and hollow posts
Body 609 connects, to mobile and fixed hollow cylinder 609.The fixing device 609f other end may connect to
Supporting body 102.One reflecting layer can be located at the surface towards integrating sphere 603 of hollow cylinder 609, reflection
For the reflectivity of the light that light-emitting device (not shown) is sent is more than 70%, reflecting material can be gold to layer
Category, such as golden (Au), silver-colored (Ag), or aluminium (Al), it can be direct plating on above-mentioned surface.
Therefore, as shown in Fig. 6 left sides, removable part 6032 is located away from standing part 6031 before test,
It is easy to the adjustment of probe 605a and 605b, prior art can be avoided to be limited to the obstruction of probe, and can makes
Light-emitting device (not shown) is as far as possible close to the opening 609r of removable part 6032, increases and receives optic angle.
And as Fig. 7 right side shown in, it is to be adjusted it is complete after, integrating sphere 603 can be moved down, by standing part 6031
Connect with removable part 6032, now, breach 609h ' equivalent to a perforate, only probe 605a with
605b is passed through and tested.
Fig. 8 shows the profile of the test equipment of the light-emitting device of third embodiment of the invention, as illustrated,
The test equipment of the light-emitting device of the present embodiment is used to comprising integrating sphere 803, probe 805a and 805b
An electric current is conducted during test light-emitting device 801 solid comprising one to light-emitting device 801 and connecting portion 803c
Determine the removable part 8032 of part 8031 and.Standing part 8031 can be and the bodily form of integrating sphere 803 1
Into, and its inner surface can be coated with same reflecting material, such as barium sulfate with the inner surface of integrating sphere 803
(BaSiO4).And removable part 8032 has perforate, it is each passed through for probe 805a and 805b.Together
Sample ground, the removable part 8032 of connecting portion is separable in integrating sphere, and logical when light-emitting device is tested
Cross standing part 8031 to engage with integrating sphere, but relative to above-mentioned second embodiment, the present embodiment
Removable part 8032 formed a sliding sleeve and can be partially submerged in standing part 8031 and with its inwall phase
Connect.Removable part 8032 is located away from standing part 8031, therefore can be easy to probe 805a and 805b
Adjustment contacting the electrode of light-emitting device 801.Therefore can equally avoid prior art from being limited to the resistance of probe
Hinder, and it is close to the opening 809r of removable part 8032 that light-emitting device 801 can be made to try one's best, and increases and receives
Optic angle.Also therefore the opening inside diameter of removable part 8032 also can reduce, and to coordinate test size is used for
Less light-emitting device.And it is to be adjusted it is complete after, integrating sphere 803 can be moved down, by standing part 8031
Connect with removable part 8032.And as described above, the removable part 8032 of the present embodiment forms one and slides
Cover and can be partially submerged in standing part 8031 and with its inwall and connect.Therefore, removable part 8032
External diameter 809D can be substantially equal to or be slightly less than the opening inside diameter 803W of standing part 8031.Additionally,
The present embodiment also passes through removable part 8032 comprising a device for image 810.This device for image 810 can be in
Removable part 8032 is embedded in standing part 8031, by this image output of device for image 810 confirming
Whether probe 805a offsets with 805b contacts with the electrode of light-emitting device 801 and makes the appropriate adjustments immediately.
Figure 10 shows the test equipment of the light-emitting device of fourth embodiment of the invention.The survey of this light-emitting device
Examination equipment is included：One integrating sphere 903L ' is comprising an optical input 903i to receive the institute of light-emitting device 901
The light that sends, a transparent supporting body 902 are located on optical input 903i and a reflection unit 909
The light that neighbouring light-emitting device 901 to be measured is sent to reflex reflexting device 901.The present embodiment send out
The test equipment of electro-optical device also includes that probe 905a and 905b, probe fixture 906a and 906b are used
With fix respectively probe 905a and 905b, a ring bodies 911 on transparent supporting body 902, it is thin
Film 912 is, for example, that a blue film (blue tape) is located in ring bodies 911 so that light-emitting device 901 adheres to it
On.Probe 905a and 905b conducts an electric current to light-emitting device 901 when light-emitting device 901 is tested.
In the present embodiment, reflection unit 909 is placed on supporting body 902, and reflection unit 909 has a bottom
And side wall is to form concave shape, e.g. cup-shaped, bowl-shape or shallow discoid, and comprising a reflecting layer towards
Supporting body 902, described reflecting layer is for the reflectivity of the light that light-emitting device 901 is sent is more than 70%.
The material in reflecting layer includes metal, such as golden (Au), silver-colored (Ag), or aluminium (Al).Reflection unit 909 exists
The area of optical input 903i of the projected area of integrating sphere more than integrating sphere 903L ', or reflection unit 909
Opening interior diameter 909W be about 1.3～1.5 times of optical input 903i interior diameter 903W.It is real one
In applying example, the distance for adjusting reflection unit 909 and determinand causes to test sending out positioned at non-edge and edge
The difference measured during electro-optical device 901 is minimum, and for example adjusting the position of reflection unit 909 makes to be located at non-edge
It is minimum with the light intensity value difference measured by the light-emitting device 901 at edge, and non-edge is sent out with edge
The measurement of electro-optical device 901 does a deviation compensation (offset compensation).
In the test equipment of the light-emitting device of the present embodiment, fixing device 906a also includes including with 906b
One reflecting layer be located at the one of fixing device 906a and 906b towards supporting body 902 surface, described is anti-
Layer is penetrated for the reflectivity of the light that light-emitting device 901 is sent is more than 70%.The material in reflecting layer is included
Metal, such as golden (Au), silver-colored (Ag), or aluminium (Al).
Figure 11 shows the test equipment of the light-emitting device of fifth embodiment of the invention, and wherein Figure 12 shows figure
The top view of the reflection unit 902R in 11 and transparent supporting body 902.This embodiment is the above-mentioned 4th real
Apply the change type of example.The test equipment of this light-emitting device is included：One integrating sphere 903L ' is input into comprising a light
Mouth 903i is located at optical input to receive the transparent supporting body 902 of light, that light-emitting device 901 is sent
On 903i and a reflection unit 902R adjacent luminaires 901 are to reflect luminous dress to be measured
Put 901 light for being sent.The test equipment of the light-emitting device of the present embodiment also include probe 905a with
905b, probe fixture 906a and 906b are to fix respectively probe 905a and 905b, a ring-type
Body 911 is located on transparent supporting body 902 and is, for example, one around transparent supporting body 902, film 912
Blue film (blue tape) is in ring bodies 911 so that light-emitting device 901 is adhered thereto.Probe 905a
With 905b an electric current is conducted to light-emitting device 901 when light-emitting device 901 is tested.In the present embodiment,
Reflection unit 902R is arranged on transparent supporting body 902, substantially with the loading end of transparent supporting body 902
It is parallel, and reflection unit 902R is around light-emitting device 901.Transparent supporting body 902 can first in external zones
Domain etches to form sunk area so that reflection unit 902R is formed in this sunk area, so reflection dress
Put the surface substantially copline of 902R and transparent supporting body 902, therefore, light-emitting device 901 together with
Film 912 can be more entirely attached on supporting body 902 when being placed on transparent supporting body 902, thus
The accuracy of measurement can be lifted.Figure 12 shows the top view of reflection unit 902R and transparent supporting body 902,
As illustrated, reflection unit 902R in an annular shape on transparent supporting body 902, and in annular shape
Between then expose transparent supporting body 902 so that light-emitting device 901 is placed thereon, that is, as shown in figure 11
Reflection unit 902R is around the periphery of light-emitting device 901, and reflection unit 902R includes a reflecting layer
The reflectivity of the light that light-emitting device 901 is sent more than 70%, positioned at the face of reflection unit 902R
To the surface of optical input 903i, the light that light-emitting device 901 is sent is reflected into into optical input
903i.The material in reflecting layer includes metal, such as golden (Au), silver-colored (Ag), or aluminium (Al).
Figure 13 shows the test equipment of the light-emitting device of sixth embodiment of the invention, and Figure 14 shows Figure 13
In ring bodies 911, film 912 and reflection unit 911R relativeness top view.This enforcement
Example is the change type of above-mentioned 5th embodiment.This embodiment is mainly by above-mentioned 5th embodiment (Figure 11)
The practice of reflection unit 902R changes with reflection unit 911R replacements, and reflection unit 911R is located at film
On 912, e.g. one is coated with the circular paster in reflecting layer.In more detail, the present embodiment is luminous
The test equipment of device is included：One integrating sphere 903L ' is comprising an optical input 903i to receive luminous dress
Put 901 light for being sent, a transparent supporting body 902 to be located on optical input 903i and a reflection
Device 902R adjacent luminaires 901 are to reflect the light that light-emitting device 901 to be measured is sent.This
The test equipment of the light-emitting device of embodiment also includes probe 905a and 905b, probe fixture 906a
Transparent supporting body 902 is located at 906b to fix probe 905a and 905b, a ring bodies 911 respectively
On, film 912 be, for example, a blue film (blue tape) in ring bodies 911 for light-emitting device 901
It is installed with.Probe 905a and 905b conducts an electric current to light-emitting device 901 when light-emitting device 901 is tested.
In the present embodiment, reflection unit 911R is located on film 912 or is attached to the inner side of ring bodies 911.
Thus, the material of the visual light-emitting devices 901 of this reflection unit 911R and the array of light-emitting device 901 is big
It is little etc., different reflecting layer or different size of thin slice annulus that selection is coated with different reflecting materials to constitute
Shape paster on film 912 and surround light-emitting device 901 to be attached at, thus more flexible in test.
Above-mentioned reflecting layer is more than 70% for the reflectivity of the light that light-emitting device 901 is sent, the material in reflecting layer
It is e.g. golden (Au), silver-colored (Ag), or the metal such as aluminium (Al).And ring bodies 911 can set for film 912
In ring bodies 911, an e.g. tensioner ring can expand oriented film 912 and adjust sending out for array
The size being spaced between electro-optical device 901.
Each embodiment cited by the present invention is not used to limit the model of the present invention only to illustrate the present invention
Enclose.For example, the test equipment of light-emitting device of the invention it is not specific to the light-emitting device tested
Which kind of stage is defined in manufacturing process, pattern the sending out in the present invention with single or array is also not necessarily limited to
Tested person in the test equipment of electro-optical device, such as light-emitting device to be tested can be on chip (wafer) not
The light emitting diode of cutting, or stick to LED core on blue film (blue tape)
(die) pattern, or after tube core is encapsulated etc..Anyone is made for the present invention any apparent easy to know
Modification is changed without departure from spirit and scope of the invention.
Claims (13)
1. a kind of test equipment of light-emitting device, comprising：
Integrating sphere；
Probe, is used to conduct an electric current to the light-emitting device when testing the light-emitting device；And
Connecting portion, connects with the integrating sphere, and the connecting portion has perforate or breach；Wherein, the probe is worn
The perforate or breach are crossed, and the connecting portion has optical input, to receive what the light-emitting device was sent
Light.
2. test equipment as claimed in claim 1, wherein a receipts of the test equipment to the light-emitting device
Angular is more than 130 °, or the light-emitting device is less than or equal to when testing with the vertical range of the optical input
About 3mm.
3. test equipment as claimed in claim 1, also comprising aperture adjustment device, is input into located at the light
Mouthful, with an opening, less than the optical input, and the aperture adjustment device is included the aperture adjustment device
Reflecting layer, positioned at the aperture adjustment device towards the integrating sphere surface, the reflecting layer is for the luminous dress
The reflectivity for putting sent light is more than 70%.
4. test equipment as claimed in claim 1, also comprising push pin device, to control the luminous dress
Put distance or a device for image with the optical input and pass through the connecting portion.
5. test equipment as claimed in claim 1, wherein connecting portion is integrated with the integrating sphere.
6. test equipment as claimed in claim 1, wherein connecting portion includes a removable part, can
The integrating sphere is located away from, and is engaged with the integrating sphere when light-emitting device is tested.
7. test equipment as claimed in claim 6, the wherein connecting portion include reflecting layer, positioned at the company
The surface towards the integrating sphere of the removable part of socket part, the reflecting layer is sent out for the light-emitting device
The reflectivity of the light for going out is more than 70%.
8. a kind of test equipment of light-emitting device, comprising：
Integrating sphere, comprising an optical input, to receive the light that the light-emitting device is sent；
Transparent supporting body, on the optical input, to carry the light-emitting device；And
Reflection unit, neighbouring light-emitting device, to reflect the light that the light-emitting device is sent.
9. test equipment as claimed in claim 8, the wherein reflection unit be located at the transparent supporting body it
On, comprising reflecting layer, positioned at the surface towards the transparent supporting body of the reflection unit, the reflecting layer pair
The reflectivity of the light sent in the light-emitting device is more than 70%.
10. test equipment as claimed in claim 8, also including probe, to test the light-emitting device
When conduct an electric current to the light-emitting device, and fixing device, to fix the probe, wherein this is fixed
Device comprising a reflecting layer be located at the fixing device towards the transparent supporting body surface, the reflecting layer for
The reflectivity of the light that the light-emitting device is sent is more than 70%.
11. test equipments as claimed in claim 8, the wherein reflection unit are around the light-emitting device and big
Cause is parallel with a loading end of the transparent supporting body, and the reflection unit includes reflecting layer, for the luminous dress
The reflectivity of sent light is put more than 70%, and the reflecting layer is located at the one of the reflection unit towards the light
The surface of input port, by the light that the light-emitting device is sent the optical input is reflected into.
12. test equipments as claimed in claim 8, also comprising ring bodies, positioned at the transparent supporting body it
Above and around the transparent supporting body；And film, so that the light-emitting device is installed with the ring bodies,
Wherein the reflection unit is located on the film or is attached to the ring bodies inner side.
13. test equipments as claimed in claim 8, the wherein reflection unit include reflecting layer, positioned at this
, towards the surface of the optical input, the reflecting layer is for the light that the light-emitting device is sent for the one of reflection unit
Reflectivity be more than 70%, and the light that the light-emitting device is sent is reflected into the optical input.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510673800.4A CN106595851A (en) | 2015-10-16 | 2015-10-16 | Testing device for light-emitting device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201510673800.4A CN106595851A (en) | 2015-10-16 | 2015-10-16 | Testing device for light-emitting device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN106595851A true CN106595851A (en) | 2017-04-26 |
Family
ID=58553939
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201510673800.4A Withdrawn CN106595851A (en) | 2015-10-16 | 2015-10-16 | Testing device for light-emitting device |
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| CN (1) | CN106595851A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111289227A (en) * | 2020-03-20 | 2020-06-16 | 江西照世科技有限公司 | LED lamp string detector based on Internet of things |
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| CN102607696A (en) * | 2012-04-01 | 2012-07-25 | 深圳市矽电半导体设备有限公司 | Integrating sphere used for LED (light emitting diode) tester |
| KR20130079041A (en) * | 2012-01-02 | 2013-07-10 | 주식회사 로보스타 | Apparatus for preventing leakage of light in chip tester |
| CN104102008A (en) * | 2013-04-02 | 2014-10-15 | 豪勉科技股份有限公司 | Light receiving device capable of increasing light receiving quantity and angle |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| KR20130079041A (en) * | 2012-01-02 | 2013-07-10 | 주식회사 로보스타 | Apparatus for preventing leakage of light in chip tester |
| CN102607696A (en) * | 2012-04-01 | 2012-07-25 | 深圳市矽电半导体设备有限公司 | Integrating sphere used for LED (light emitting diode) tester |
| CN104102008A (en) * | 2013-04-02 | 2014-10-15 | 豪勉科技股份有限公司 | Light receiving device capable of increasing light receiving quantity and angle |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN111289227A (en) * | 2020-03-20 | 2020-06-16 | 江西照世科技有限公司 | LED lamp string detector based on Internet of things |
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