TW201331560A - Light-receiving apparatus capable of increasing light-receiving magnitude and angle - Google Patents

Light-receiving apparatus capable of increasing light-receiving magnitude and angle Download PDF

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TW201331560A
TW201331560A TW102111859A TW102111859A TW201331560A TW 201331560 A TW201331560 A TW 201331560A TW 102111859 A TW102111859 A TW 102111859A TW 102111859 A TW102111859 A TW 102111859A TW 201331560 A TW201331560 A TW 201331560A
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Taiwan
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light
receiving
integrating sphere
hole
glass plate
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TW102111859A
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Chinese (zh)
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TWI479132B (en
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Zheng-Tai Chen
Zhi-Hong Li
Zhi-Wei Chen
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Hauman Technologies Corp
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Priority to CN201410047276.5A priority patent/CN104102008A/en
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Publication of TWI479132B publication Critical patent/TWI479132B/zh

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Abstract

The invention is a light-receiving apparatus capable of increasing light-receiving magnitude and angle. It includes an integrating sphere and a supporting fixture wherein the integrating sphere is a hollow spherical ball in which a reflecting surface is formed on its inner wall surface. A light-receiving pillar and at least a light-emitting pillar are provided on the outer wall of the integrating sphere. A light-receiving hole and a light-emitting hole are set up on the light-receiving pillar and the light-emitting pillar respectively for connecting to space in the integrating sphere. The supporting fixture includes a locating ring and a transparent glass plate. The locating ring can join the light-receiving pillar. The transparent glass plate is set on top side of the locating ring for supporting and placing a light-emitting device to be tested. After light generated by the light-emitting device to be tested entering the integrating sphere, it can be reflected and diffused uniformly by reflecting surface in the integrating sphere before being projected to an optical detection apparatus through the light-emitting hole for carrying out detection. Accordingly, since the light-emitting device to be tested can be located at a position next to the light-receiving hole by the transparent glass plate, light-receiving magnitude and angle of light, generated by the light-emitting device to be tested which is received by the light-receiving hole, can be increased effectively for raising accuracy of detection.

Description

能增加收光量及角度之收光裝置 Light-receiving device capable of increasing light collection amount and angle

本發明係一種能增加收光量及角度之收光裝置,尤指在一積分球之收光柱上裝設一支撐治具,令一待測發光元件能被定位於鄰近該收光柱之位置,以增加該積分球收光量及角度的收光裝置。 The invention relates to a light-receiving device capable of increasing the amount of light received and an angle, in particular to a supporting fixture on a light-collecting column of an integrating sphere, so that a light-emitting element to be tested can be positioned adjacent to the light-receiving column, A light collecting device that increases the amount and angle of light collected by the integrating sphere.

按,發光二極體(Light-Emitting Diode,LED)係一種於通電後能產生光亮的半導體電子元件,相較於傳統的照明用具,發光二極體具有效率高、成本低、反應速度快且使用壽命長的優點,故近年來開始被大量應用在交通號誌、照明器具、顯示面板甚至光通訊等領域上,成為經濟發展及科技研發上極具影響力的關鍵技術之一。 Light-Emitting Diode (LED) is a kind of semiconductor electronic component that can produce bright light after being energized. Compared with traditional lighting appliances, the light-emitting diode has high efficiency, low cost and fast response speed. The advantages of long service life have been widely used in traffic signs, lighting fixtures, display panels and even optical communications in recent years, becoming one of the most influential key technologies in economic development and technology research and development.

發光二極體中主要發光的元件為晶粒(crystal grain),由於晶粒的發光亮度、波長、色溫及操作電壓等特性會因製程條件上的些微差異而有所不同,且即便是由同一片晶圓(wafer)切割而成的晶粒,其發光特性亦並不完全相同,因此,在業者將晶圓切割成複數個晶粒後,切割下來的晶粒尚須經過一檢測程序,以根據晶粒的主波長、發光強度、光通亮、色溫、工作電壓、反向擊穿電壓等特性參數進行分級後,再將不同等級之晶粒應用於適合的領域中。 The main illuminating element in the illuminating diode is crystal grain. The characteristics of the luminescence brightness, wavelength, color temperature and operating voltage of the dies may vary depending on slight differences in process conditions, and even if they are the same A wafer-cut wafer has a different luminescent property. Therefore, after the wafer is diced into a plurality of dies, the diced die must undergo a test procedure to According to the characteristic parameters such as the dominant wavelength of the crystal, the luminous intensity, the luminous flux, the color temperature, the operating voltage, and the reverse breakdown voltage, the different grades of the crystal grains are applied to a suitable field.

一般言,現今業者在進行檢測程序時,多係使用積分球(Integrating Sphere),積分球係一種理想的光學擴散器,其構型為一中空球體,且內部塗佈有高穩定度、高反射率之一反射層(如:硫酸鋇),以在其內部形成一無光害的空間,確保光線投射至該積分球內後,不會受到其他光源的光害影響,進而降低因光線形狀、發散角度及不同檢測位置之響應度所造成的檢測誤差,使得檢測結果更為可靠。請參閱第1圖所示,係一種習知檢測裝置1之結構,該檢測裝置1包括一積分球11及一點測探針 12,該積分球11上設有一收光柱111及二出光柱112,該收光柱111及出光柱112分別開設有開孔,以連通至該積分球11內之空間,該出光柱112分別與一光纖13及一光檢測器14相連接;該點測探針12係經由一點測裝置(圖中未示)定位於對應該收光柱111之位置,且該點測探針12下方呈放有一發光二極體之晶粒10。在進行檢測時,該點測探針12能朝下位移,以分別電氣連接至該晶粒10之接腳,令該晶粒10投射出光線,使該發光二極體之晶粒10發出的光線投射至該積分球11內部後,再藉由該光纖13與光檢測器14,檢測該發光二極體之晶粒10的特性參數。 Generally speaking, in today's industry, the integration process is used to integrate the integrating sphere (Integrating Sphere). The integrating sphere is an ideal optical diffuser. Its configuration is a hollow sphere, and the interior is coated with high stability and high reflection. Rate one of the reflective layers (such as barium sulfate) to form a space without light in the interior, ensuring that the light is not affected by the light damage of other light sources after being projected into the integrating sphere, thereby reducing the shape of the light, The detection error caused by the divergence angle and the responsiveness of different detection positions makes the detection result more reliable. Referring to FIG. 1 , the structure of a conventional detecting device 1 includes an integrating sphere 11 and a probe. 12, the integrating sphere 11 is provided with a light-receiving column 111 and two light-emitting columns 112, and the light-receiving column 111 and the light-emitting column 112 are respectively provided with openings to communicate with the space in the integrating sphere 11, and the light-emitting column 112 and the light-emitting column 112 respectively The optical fiber 13 and a photodetector 14 are connected; the spotting probe 12 is positioned at a position corresponding to the light receiving column 111 via a point measuring device (not shown), and a light is emitted under the spotting probe 12 The die 10 of the diode. When the detection is performed, the spotting probe 12 can be displaced downward to be electrically connected to the pins of the die 10, respectively, so that the die 10 projects light to cause the die 10 of the light emitting diode to emit After the light is projected into the inside of the integrating sphere 11, the characteristic parameters of the crystal 10 of the light-emitting diode are detected by the optical fiber 13 and the photodetector 14.

該晶粒10投射出的光線能在該積分球11中反射、漫射,而形成極為均勻地光束,被該光纖13及該光檢測器14接收,有效地避免了各種可能造成誤差的干擾因素。然而,實際上在進行檢測程序時,藉由該檢測裝置1所檢測出的光線數據,仍無法理想地完全反應出該晶粒10的真正特性,茲分別詳述其理由及該檢測裝置1之缺陷如下: The light projected by the die 10 can be reflected and diffused in the integrating sphere 11 to form a very uniform beam, which is received by the optical fiber 13 and the photodetector 14, effectively avoiding various interference factors that may cause errors. . However, in actuality, when the detection process is performed, the true characteristics of the die 10 are not completely reflected by the light data detected by the detecting device 1, and the reason and the detecting device 1 are respectively described in detail. The defects are as follows:

(1)晶粒10與收光柱111間之距離:由於該晶粒10必須經由該點測探針12來通電驅動,故該晶粒10與該收光柱111間必然存在著一間隔距離D1,因此,該晶粒10投射出之光線並無法在不受外界干擾的情況下,理想地投射至該積分球11中,且該晶粒10在投射出光線時,尚具有一預定之投射角度A,若該投射角度A較大或該間隔距離D1過長,則該光線在經過該間隔距離D1後,必然會有部份的光線無法順利被該收光柱111收集,而影響在測量上的精準度。 (1) The distance between the die 10 and the light-receiving column 111: Since the die 10 must be electrically driven via the spot probe 12, there must be a separation distance D1 between the die 10 and the light-receiving column 111. Therefore, the light projected by the die 10 is not ideally projected into the integrating sphere 11 without being disturbed by the outside, and the die 10 has a predetermined projection angle A when projecting the light. If the projection angle A is large or the interval distance D1 is too long, after the light passes through the separation distance D1, part of the light is inevitably collected by the light collecting column 111, which affects the accuracy of the measurement. degree.

(2)收光柱111上開孔的孔徑大小:如前所述,由於該收光柱111與該晶粒10間具有該間隔距離D1,故在進行檢測時,該收光柱111上之開孔必然需設計成遠較該晶粒10為大,如此,始能儘可能地避免光線經該投射角度A擴散後,無法全部進入該積分球11的問題,然而,在該收光柱111之開孔與該晶粒10並不匹配的情況下,該晶粒10投射出之光線於該積分球11內反射與漫射後,尚可能會由該收光柱111射出,造成該積分球內原應完全密閉的檢測環境被破壞,進而影響到檢測上的精準性。 (2) The aperture size of the aperture in the light-receiving column 111: as described above, since the distance between the light-receiving column 111 and the crystal grain 10 is the distance D1, the opening of the light-receiving column 111 is inevitable when the detection is performed. It needs to be designed to be much larger than the die 10, so that the problem that the light cannot be completely entered into the integrating sphere 11 after the light is diffused through the projection angle A is avoided as much as possible. However, the opening of the light-receiving column 111 is If the crystal grains 10 do not match, after the light projected by the crystal grain 10 is reflected and diffused in the integrating sphere 11, it may be emitted by the light-receiving column 111, so that the integrating sphere should be completely sealed. The detection environment is destroyed, which in turn affects the accuracy of detection.

因此,如何對習知的檢測裝置進行改良,以解決過去在進行 檢測程序時,晶粒10產生之光線無法完全地進入該積分球11,且該積分球11中經反射及漫射後的光線,尚可能由該收光柱111散漏至外界的問題,即成為本發明在此亟欲解決的重要問題。 Therefore, how to improve the conventional detection device to solve the past During the detection process, the light generated by the crystal grain 10 cannot completely enter the integrating sphere 11, and the reflected and diffused light in the integrating sphere 11 may be leaked to the outside by the light-receiving column 111, that is, The present invention is an important problem to be solved here.

有鑑於習知檢測裝置在進行檢測程序時,積分球之收光量受限於晶粒之收光角度影響的問題,發明人憑藉著多年的實務經驗,在不斷地研究、測試及改良後,終於設計出一種能增加收光量及角度之收光裝置,期能解決習知檢測裝置之諸多問題。 In view of the fact that the detection device is performing the detection procedure, the amount of light collected by the integrating sphere is limited by the angle of the light receiving angle of the crystal grain, and the inventor finally studies, tests and improves after years of practical experience. A light-receiving device capable of increasing the amount of light and the angle of the light is designed, and the problems of the conventional detecting device can be solved.

本發明之一目的,係提供一種能增加收光量及角度之收光裝置,該收光裝置包括一積分球及一支撐治具,其中該積分球係一中空之圓形球體,該積分球之內壁表面均勻塗佈或形成有一反射面,該積分球之外壁開設有一收光孔及至少一出光孔,該收光孔及出光孔係分別與該積分球內之空間相連通;該支撐治具包括一定位環及一透光玻板,其中該定位環能固設至該積分球上對應於該收光孔之位置,並與該積分球結合成一體,該透光玻板係固設在該定位環之一頂側,以在該定位環與該積分球結合成一體時,該透光玻板能對應於該收光孔。如此,由於該待測發光元件係直接被置放在該透光玻板上緊鄰該收光孔之位置,故能有效縮減該積分球與待測發光元件之間隔距離,避免該待測發光元件產生之光線經一發光角度擴散後,無法完全進入該積分球的問題,以確保該待測發光元件在發光角度範圍內所產生之所有光線,均能經由均勻反射及漫射,再經由該出光孔射出,有效改善該光檢測裝置對該待測發光元件的量測準確度。 An object of the present invention is to provide a light-receiving device capable of increasing the amount of light received and an angle, the light-receiving device comprising an integrating sphere and a supporting fixture, wherein the integrating sphere is a hollow circular sphere, and the integrating sphere is The inner wall surface is evenly coated or formed with a reflecting surface, the outer wall of the integrating sphere is provided with a light collecting hole and at least one light emitting hole, and the light collecting hole and the light exiting hole are respectively connected with the space in the integrating sphere; The utility model comprises a positioning ring and a light-transmissive glass plate, wherein the positioning ring can be fixed to a position corresponding to the light-receiving hole on the integrating sphere, and integrated with the integrating sphere, the light-transmissive glass plate is fixed On one of the top sides of the positioning ring, the light-transmissive glass plate can correspond to the light-receiving hole when the positioning ring is integrated with the integrating sphere. In this way, since the light-emitting component to be tested is directly placed on the light-transmissive glass plate adjacent to the light-receiving hole, the distance between the integrating sphere and the light-emitting component to be tested can be effectively reduced, and the light-emitting component to be tested is avoided. After the generated light is diffused by a light-emitting angle, the problem that the integrating sphere cannot be completely entered is ensured that all the light generated by the light-emitting element to be tested in the range of the light-emitting angle can be uniformly reflected and diffused, and then the light is emitted. The hole is emitted to effectively improve the measurement accuracy of the light detecting device to the light-emitting element to be tested.

本發明之另一目的,乃該透光玻板面對該收光孔之一側表面上,除中央對應於供支撐及放置該待測發光元件之部位形成有一透光檢測區外,其餘部位均塗佈有一反光層,以形成一不透光反射區,該透光檢測區之構形係對應於該待測發光元件之大小。如此,由於該透光檢測區之構形係對應於該待測發光元件之大小,故在一點測探針對該待測發光元件施加電流,進行點測時,該待測發光元件所產生之光線,除了會在該積分球內被該反射面均勻地反射及漫射外,尚會因該不透光反射區之輔助,被反射回該積分球內,直到形成均勻光強,經由該出光孔,射出該積分球外為 止,以降低反射及漫射光由該收光孔散失之程度。 Another object of the present invention is that the light-transmissive glass plate faces a side surface of the light-receiving hole, except that a light-transmissive detection area is formed at a portion corresponding to a portion for supporting and placing the light-emitting element to be tested. Each of the coatings is coated with a light reflecting layer to form an opaque reflecting area, and the configuration of the light transmitting detecting area corresponds to the size of the light emitting element to be tested. In this way, since the configuration of the light-transmitting detection region corresponds to the size of the light-emitting element to be tested, when a probe is applied to the light-emitting element to be tested, the light generated by the light-emitting element to be tested is measured. In addition to being uniformly reflected and diffused by the reflecting surface in the integrating sphere, it is reflected back into the integrating sphere by the aid of the opaque reflecting area until a uniform light intensity is formed through the light exiting hole. , shooting the score ball outside Stop to reduce the extent to which the reflected and diffused light is lost by the light-receiving aperture.

為便 貴審查委員能對本發明之技術、結構特徵及其目的有更進一步的認識與理解,茲舉實施例配合圖式,詳細說明如下: For the sake of review, the reviewer can have a further understanding and understanding of the technical, structural features and purposes of the present invention. The embodiments are described in conjunction with the drawings, which are described in detail as follows:

〔習知〕 [study]

1‧‧‧檢測裝置 1‧‧‧Detection device

10‧‧‧晶粒 10‧‧‧ grain

11‧‧‧積分球 11‧‧·score ball

111‧‧‧收光柱 111‧‧‧Lighting column

112‧‧‧出光柱 112‧‧‧Light column

12‧‧‧點測探針 12‧‧‧ Spot probe

13‧‧‧光纖 13‧‧‧Fiber

14‧‧‧光檢測器 14‧‧‧Photodetector

A‧‧‧投射角度 A‧‧‧ projection angle

D1‧‧‧間隔距離 D1‧‧‧ separation distance

〔本發明〕 〔this invention〕

2‧‧‧收光裝置 2‧‧‧Lighting device

21‧‧‧積分球 21‧‧·score ball

210‧‧‧反射面 210‧‧‧reflecting surface

211‧‧‧收光柱 211‧‧‧Lighting column

211a‧‧‧收光孔 211a‧‧‧Lighting hole

212‧‧‧出光柱 212‧‧‧Light column

212a‧‧‧出光孔 212a‧‧‧Lighting hole

22‧‧‧支撐治具 22‧‧‧Support fixture

221‧‧‧定位環 221‧‧‧ positioning ring

221a‧‧‧定位空間 221a‧‧‧Location space

221b‧‧‧嵌合元件 221b‧‧‧ fitting components

222‧‧‧透光玻板 222‧‧‧Transparent glass plate

30‧‧‧點測探針 30‧‧‧ Spot probe

L‧‧‧待測發光元件 L‧‧‧Light-emitting components to be tested

F1‧‧‧透光檢測區 F1‧‧‧Light transmission detection area

F2‧‧‧不透光反射區 F2‧‧‧ opaque reflection zone

θ‧‧‧發光角度 θ ‧‧‧Lighting angle

M‧‧‧密封元件 M‧‧‧ sealing element

D2‧‧‧厚度 D2‧‧‧ thickness

第1圖係習知之檢測裝置示意圖;第2圖係本發明之收光裝置之立體示意圖;第3A圖係本發明之收光裝置之作動示意圖;及第3B圖係本發明之收光裝置之作動示意圖。 1 is a schematic view of a conventional detecting device; FIG. 2 is a schematic perspective view of the light collecting device of the present invention; FIG. 3A is a schematic view showing the operation of the light collecting device of the present invention; and FIG. 3B is a light collecting device of the present invention; Actuation diagram.

本發明係一種能增加收光量及角度之收光裝置,請參閱第2及3A圖所示,係本發明之第一較佳實施例,該收光裝置2包括一積分球21及一支撐治具22,該積分球21之構型為一中空之球狀體,其內壁面上均勻塗佈或形成有一反射面210,其外壁上則凸設有一收光柱211及至少一出光柱212(該出光柱212之數量可依業者實際的檢測方式調整),該收光柱211之中央開設有一收光孔211a,各該出光柱212之中央則分別開設有一出光孔212a,且該收光孔211a及出光孔212a係與該積分球21內部之空間相連通。 The present invention is a light-receiving device capable of increasing the amount and angle of light collection. Referring to Figures 2 and 3A, which is a first preferred embodiment of the present invention, the light-receiving device 2 includes an integrating sphere 21 and a supporting treatment. The configuration of the integrating sphere 21 is a hollow spherical body, and a reflecting surface 210 is evenly coated or formed on the inner wall surface, and a light collecting column 211 and at least one light emitting column 212 are protruded from the outer wall thereof. The number of the light-emitting posts 212 can be adjusted according to the actual detection mode of the light-emitting column 211. A light-receiving hole 211a is defined in the center of the light-receiving column 211, and a light-emitting hole 212a is defined in the center of each of the light-emitting columns 212, and the light-receiving hole 211a and the light-receiving hole 211a are respectively The light exit hole 212a is in communication with the space inside the integrating sphere 21.

該支撐治具22包括一定位環221及一透光玻板222,該定位環221面向該積分球21之底側內緣開設有一定位空間221a,該定位空間221a之構型係與該收光柱211之構型相匹配,以能套接於該收光柱211上,且該定位環221上尚活動地設有複數個嵌合元件221b,令使用者能透過轉動各該嵌合元件221b之一端,使該嵌合元件221b之另一端迫緊至該收光柱211之周緣,讓該定位環221與該收光柱211結合成一體;該透光玻板222係固設於該定位環221遠離該收光柱211之頂側,以能透過該定位環221,定位至對應於該收光孔211a之位置,使外界之光線能依序通過該透光玻板222及該收光孔211a,進入該積分球21中。 The support fixture 22 includes a positioning ring 221 and a light-transmissive glass plate 222. The positioning ring 221 defines a positioning space 221a facing the inner edge of the bottom side of the integrating sphere 21. The positioning space 221a is configured with the light-receiving column. The configuration of the 211 is matched to be sleeved on the light-receiving column 211, and the positioning ring 221 is movably provided with a plurality of fitting elements 221b, so that the user can rotate one end of each of the fitting elements 221b. The other end of the fitting member 221b is urged to the periphery of the light-receiving column 211, and the positioning ring 221 is integrated with the light-receiving column 211; the transparent glass plate 222 is fixed to the positioning ring 221 away from the The top side of the light-receiving column 211 is configured to be transparent to the position corresponding to the light-receiving hole 211a through the positioning ring 221, so that the external light can sequentially pass through the light-transmitting glass plate 222 and the light-receiving hole 211a. Integral ball 21.

發明人根據多年來的實務經驗,發現習知的檢測裝置之所以具有過大的檢測誤差,其主要原因在於過去在執行檢測程序時,發光二極體之晶粒必須先置放於一檢測平台上,再透過一點測裝置逐一驅動發光二極體的晶粒發亮,由此可知,該點測裝置所佔據的空間,即為檢測誤差的主要來源,因此,請參閱第3A圖所示,本發明之收光裝置2的一設計重點,即係利用該透光玻板222,作為可直接承載一待測發光元件L(如:發光二極體之晶粒)的支撐面,令該待測發光元件L能透過該透光玻板222,緊貼於該收光柱211上,據此,即可確保該待測發光元件L之光線能完全投射於該積分球21中。在進行檢測程序時,業者能在各該出光柱212上分別連接裝設一光檢測器(圖中未示);或在各該出光柱212上裝設一密封元件M(如:密封蓋或反射板),由於,光檢測器之結構並非本發明之保護重點,故在第3A及3B圖中,僅繪製二密封元件M裝設於該積分球21之態樣,以期能清楚呈現出該積分球21之內部構型,合先陳明。 Based on years of practical experience, the inventors have found that the conventional detection device has an excessive detection error. The main reason is that in the past, when the detection process was performed, the crystal grains of the LED must be placed on a detection platform. Then, through the one-point measuring device, the crystal grains of the light-emitting diode are driven one by one, and thus the space occupied by the measuring device is the main source of the detection error. Therefore, please refer to FIG. 3A, A design focus of the light-receiving device 2 of the invention is to use the light-transmissive glass plate 222 as a support surface for directly carrying a light-emitting element L to be tested (for example, a crystal grain of a light-emitting diode), so that the test piece is to be tested. The light-emitting element L can pass through the light-transmitting glass plate 222 and closely adhere to the light-receiving column 211, thereby ensuring that the light of the light-emitting element L to be tested can be completely projected into the integrating sphere 21. When performing the detection process, the manufacturer can respectively connect a light detector (not shown) on each of the light-emitting columns 212; or install a sealing element M on each of the light-emitting columns 212 (such as a sealing cover or Reflector), since the structure of the photodetector is not the protection focus of the present invention, in the 3A and 3B drawings, only the aspect in which the two sealing elements M are mounted on the integrating sphere 21 is drawn, so as to clearly show the The internal configuration of the integrating sphere 21 is combined with Chen Ming.

請參閱第2~3B圖所示,在本實施例中,該收光裝置2係配合一點測裝置(圖中未示),對該待測發光元件L進行檢測,該點測裝置之一點測探針30係定位於該收光裝置2之上方,且能活動地進行上下位移,由於該點測探針30係設於該支撐治具22遠離該積分球21之方向,故該點測探針30的佔用空間並不會影響該收光裝置2於檢測上的精確度。在該點測探針30分別電氣連接至該待測發光元件L之接腳時,該待測發光元件L將能被通電驅動,並產生出光線,且該光線能經由該收光孔211a,射入該積分球21內,嗣,光線會在該積分球21內被該反射面均勻地反射及漫射,以在該積分球21內形成均勻的光強分佈,再經由該出光孔212a,射出該積分球21外,使該光檢測裝置能由該出光孔212a,檢測到非常均勻的漫射光束,並據以對該待測發光元件L進行檢測。 Referring to FIG. 2 to FIG. 3B, in the embodiment, the light-receiving device 2 is matched with a point-measuring device (not shown) to detect the light-emitting element L to be tested, and one of the spot-measuring devices is spot-measured. The probe 30 is positioned above the light-receiving device 2 and is movable up and down. Since the spotting probe 30 is disposed in a direction away from the integrating sphere 21 of the supporting fixture 22, the point probe is detected. The footprint of the needle 30 does not affect the accuracy of the light-receiving device 2 in detection. When the spotting probes 30 are electrically connected to the pins of the light-emitting element L to be tested, respectively, the light-emitting elements to be tested L can be electrically driven to generate light, and the light can pass through the light-receiving holes 211a. The light is incident on the integrating sphere 21, and the light is uniformly reflected and diffused by the reflecting surface in the integrating sphere 21 to form a uniform light intensity distribution in the integrating sphere 21, and then through the light exit hole 212a. The light detecting device 21 is configured to detect a very uniform diffused light beam from the light exiting hole 212a, and to detect the light emitting element L to be tested.

承上,在本發明之第一較佳實施例中,該透光玻板222面對該收光孔211a之另一側表面上,除中央對應於該待測發光元件L之部位形成有一透光檢測區F1外,其餘部位均塗佈有一反光層,以形成一不透光反射區F2,且該透光檢測區F1之構型係對應於該待測發光元件L之大小。如此,在該點測探針30當對該待測發光元件L施加電流,進行點測時,該 待測發光元件L所產生之光線,在依序通過該透光玻板222及該收光孔211a,射入該積分球21後,除了會在該積分球21內被該反射面均勻地反射及漫射外,尚會因該不透光反射區F2之輔助,被反射回該積分球21內,繼續被該反射面反射及漫射,直到形成均勻光強,經由該出光孔212a,射出該積分球21外為止,故能大幅降低反射及漫射光由該收光孔211a散失之程度。 In the first preferred embodiment of the present invention, the light-transmissive glass plate 222 faces the other side surface of the light-receiving hole 211a, except that a portion corresponding to the light-emitting element L to be tested is formed at the center. The light detecting area F1 is coated with a light reflecting layer to form an opaque reflecting area F2, and the configuration of the light transmitting detecting area F1 corresponds to the size of the light emitting element L to be tested. In this way, when the spot probe 30 applies a current to the light-emitting element L to be tested, and performs a spot test, the The light generated by the light-emitting element L to be tested is sequentially reflected by the reflecting surface in the integrating sphere 21 after being incident on the integrating sphere 21 through the light-transmitting glass plate 222 and the light-receiving hole 211a. And diffusing, which is reflected by the opaque reflection area F2, is reflected back into the integrating sphere 21, and is further reflected and diffused by the reflecting surface until a uniform light intensity is formed, and is emitted through the light exit hole 212a. Since the integrating sphere 21 is out of the range, the degree of reflection and diffusion light scattered by the light receiving hole 211a can be greatly reduced.

請參閱第1、2及3B圖所示,比較習知檢測裝置1與本發明之收光裝置2後可明顯看出,利用該收光裝置2進行檢測時,該待測發光元件L與該積分球21間之距離僅為該透光玻板222之厚度D2,該厚度D2不僅遠較第1圖中的間隔距離D1為短,且由於該透光玻板222係貼設於該收光柱211上,故該待測發光元件L產生之光線並無需先穿過外界空氣,再進入該積分球21,據此,即能確保光線不會受到外界的干擾,並提昇檢測上的精準度,此外,該待測發光元件L產生之光線雖具有一發光角度θ,然而,由於該透光玻板222係緊鄰該收光孔211a及該透光檢測區F1,故該待測發光元件L產生之光線係在進入積分球21後,始會隨著該發光角度θ擴散,意即,本發明之收光裝置2能確保該待測發光元件L產生之光線完全地投射至該積分球21中,令該積分球21的收光量能遠較習知檢測裝置來的理想,同時,亦能完善地解決收光角度的問題。 Referring to Figures 1, 2 and 3B, after comparing the conventional detecting device 1 with the light collecting device 2 of the present invention, it is apparent that the light-emitting element L to be tested and the light-detecting device 2 are detected by the light-receiving device 2 The distance between the integrating spheres 21 is only the thickness D2 of the transparent glass plate 222. The thickness D2 is not only far shorter than the spacing distance D1 in FIG. 1 , and the light-transmitting glass plate 222 is attached to the light-receiving column. 211, the light generated by the light-emitting element L to be tested does not need to first pass through the outside air, and then enters the integrating sphere 21, thereby ensuring that the light is not interfered by the outside world and improving the accuracy of the detection. In addition, the light generated by the light-emitting element L to be tested has a light-emitting angle θ. However, since the light-transmitting glass plate 222 is adjacent to the light-receiving hole 211a and the light-transmitting detection area F1, the light-emitting element L to be tested is generated. The light rays are diffused with the light-emitting angle θ after entering the integrating sphere 21, that is, the light-receiving device 2 of the present invention can ensure that the light generated by the light-emitting element L to be tested is completely projected into the integrating sphere 21. Therefore, the amount of light collected by the integrating sphere 21 can be much better than that of the conventional detecting device. At the same time, it can also solve the problem of the light collection angle.

在此要特別一提者,第2圖中所繪製之積分球21,其收光孔211a係開設於該收光柱211上,惟,在實際施作上,該收光孔211a亦能直接開設於該積分球21之外壁上,而無須透過該收光柱211。業者僅需將該定位環221之底側設計成與該積分球21上對應於該收光孔211a之部位相匹配(如:一弧狀凹面,以貼合至該積分球21上,或使該定位環221能嵌設於該積分球21上之一嵌卡槽中),則亦能密閉地固設於該積分球21上對應於該收光孔211a之位置。此外,在本發明之第一較佳實施例中,該定位環221係透過該等嵌合元件221b,迫緊於該出光柱212之外緣,且該透光玻板222係直接固設(如:以黏膠固定)於該定位環221之頂面,惟,在本發明之其他較佳實施例中,該定位環221及該透光玻板222之定位方式並不以前述之方法為限,該定位環221尚可使用嵌卡、螺合等方式,與 該收光柱211結合成一體,且該透光玻板222亦能以套合或嵌卡的方式,固設於該定位環221上。 In particular, the integrating sphere 21 drawn in FIG. 2 has its light-receiving hole 211a formed on the light-receiving column 211. However, in actual application, the light-receiving hole 211a can also be opened directly. It is on the outer wall of the integrating sphere 21 without passing through the light collecting column 211. The operator only needs to design the bottom side of the positioning ring 221 to match the portion of the integrating sphere 21 corresponding to the light receiving hole 211a (for example, an arc-shaped concave surface to be attached to the integrating sphere 21, or The positioning ring 221 can be embedded in one of the integrating balls 21, and can be fixedly fixed to the position of the integrating sphere 21 corresponding to the light receiving hole 211a. In addition, in the first preferred embodiment of the present invention, the positioning ring 221 is passed through the fitting elements 221b, and is urged to the outer edge of the light-emitting column 212, and the light-transmissive glass plate 222 is directly fixed ( For example, the adhesive film is fixed on the top surface of the positioning ring 221. However, in other preferred embodiments of the present invention, the positioning ring 221 and the transparent glass plate 222 are not positioned in the foregoing manner. Limit, the positioning ring 221 can still use the embedded card, screwing, etc., and The light-receiving column 211 is integrated into the body, and the light-transmissive glass plate 222 can also be fixed on the positioning ring 221 by means of a sleeve or a card.

又,在前述實施例中,該透光玻板222係透過反射層,區分為該透光檢測區F1及不透光反射區F2,惟,業者亦能直接使用不同材料製作該透光玻板222,意即,業者能使用透光材料製成該透光玻板222上透光檢測區F1,並使用整塊的不透光反射材料製作該不透光反射區F2,如此,亦能達成相同之效果。此外,在前述實施例中,該反射層之材質係與該積分球21中反射面210之材質相同,以達成較佳的檢測效果,惟,實際施作上,該反射層之材質仍可依業者之需求進行調整。 Moreover, in the foregoing embodiment, the light-transmissive glass plate 222 is transmitted through the reflective layer and is divided into the light-transmitting detection area F1 and the opaque reflection area F2. However, the manufacturer can also directly use the different materials to fabricate the light-transmissive glass plate. 222, that is, the manufacturer can use the light-transmitting material to make the light-transmitting detection area F1 on the light-transmissive glass plate 222, and use the opaque reflective material of the whole piece to make the opaque reflection area F2, and thus can also be achieved. The same effect. In addition, in the foregoing embodiment, the material of the reflective layer is the same as the material of the reflective surface 210 of the integrating sphere 21, so as to achieve a better detection effect, but in actual application, the material of the reflective layer can still be The needs of the industry are adjusted.

按,以上所述,僅為本發明之若干較佳實施例,惟,本發明之技術特徵並不侷限於此,凡相關技術領域之人士,在參酌本發明之技術內容後所能輕易思及之等效變化,均應不脫離本發明之保護範疇。 The above description is only a few preferred embodiments of the present invention, but the technical features of the present invention are not limited thereto, and those skilled in the relevant art can easily think about it after considering the technical content of the present invention. Equivalent changes should not depart from the scope of protection of the present invention.

2‧‧‧收光裝置 2‧‧‧Lighting device

21‧‧‧積分球 21‧‧·score ball

211‧‧‧收光柱 211‧‧‧Lighting column

211a‧‧‧收光孔 211a‧‧‧Lighting hole

212‧‧‧出光柱 212‧‧‧Light column

212a‧‧‧出光孔 212a‧‧‧Lighting hole

22‧‧‧支撐治具 22‧‧‧Support fixture

221‧‧‧定位環 221‧‧‧ positioning ring

221a‧‧‧定位空間 221a‧‧‧Location space

221b‧‧‧嵌合元件 221b‧‧‧ fitting components

222‧‧‧透光玻板 222‧‧‧Transparent glass plate

F1‧‧‧透光檢測區 F1‧‧‧Light transmission detection area

F2‧‧‧不透光反射區 F2‧‧‧ opaque reflection zone

Claims (4)

一種能增加收光量及角度之收光裝置,包括:一積分球,係一中空之圓形球體,其內壁表面形成有一反射面,該積分球之外壁上開設有一收光孔及至少一出光孔,該收光孔及出光孔係分別與該積分球內之空間相連通;及一支撐治具,包括一定位環及一透光玻板,其中該定位環之底側構型係與該積分球上對應於該收光孔之部位的構型相匹配,以使該定位環能固設於該積分球上對應於該收光孔之位置,並與該積分球結合成一體,該透光玻板係固設於該定位環之一頂側,使該透光玻板能對應於該收光孔,在一待測發光元件定位於該透光玻板之背對該收光孔之一側表面,且一光檢測裝置定位於該出光孔的情況下,該待測發光元件產生之光線能依序通過該透光玻板及收光孔,投射至該積分球內,並在該積分球內被該反射面均勻地反射及漫射後,再由該出光孔,投射至該光檢測裝置。 A light collecting device capable of increasing the amount and angle of light collection, comprising: an integrating sphere, a hollow spherical body having a reflecting surface formed on an inner wall surface thereof, a light collecting hole and at least one light emitting light on the outer wall of the integrating sphere a hole, the light-receiving hole and the light-emitting hole are respectively connected to a space in the integrating sphere; and a supporting fixture, comprising a positioning ring and a light-transmissive glass plate, wherein a bottom side configuration of the positioning ring is The configuration of the portion of the integrating sphere corresponding to the light-receiving hole is matched, so that the positioning ring can be fixed on the integrating sphere corresponding to the position of the light-receiving hole, and integrated with the integrating sphere, The light glass plate is fixed on one of the top sides of the positioning ring, so that the light-transmissive glass plate can correspond to the light-receiving hole, and a light-emitting element to be tested is positioned on the back of the light-transmitting glass plate to the light-receiving hole a light-emitting panel and a light-receiving hole are sequentially projected through the light-transmissive glass plate and the light-receiving hole, and are projected into the integrating sphere, and a light detecting device is positioned in the light-emitting hole. After the integrating sphere is uniformly reflected and diffused by the reflecting surface, the light exiting hole is further The projected light detecting means. 如請求項1所述之收光裝置,其中該透光玻板面對該收光孔之另一側表面上,除中央對應於該待測發光元件之部位形成有一透光檢測區外,其餘部位均塗佈有一反光層,以形成一不透光反射區,且該透光反射區之構型係對應於該待測發光元件之大小。 The light-receiving device of claim 1, wherein the light-transmissive glass plate faces the other side surface of the light-receiving hole, except that a light-transmissive detection area is formed at a portion corresponding to the light-emitting element to be tested at the center; The portions are coated with a light reflecting layer to form an opaque reflecting area, and the configuration of the light transmitting reflecting area corresponds to the size of the light emitting element to be tested. 如請求項2所述之收光裝置,其中該收光孔係開設於該積分球上之一收光柱的中央部位,該收光柱之構型係與該定位環之底側開設之一定位空間相匹配,且該定位環之外緣 尚活動地嵌設有複數個嵌合元件,以在該定位環之底側套接至該收光柱上的情況下,各該嵌合元件之一端能被轉動,使其另一端迫緊至該收光柱之周緣,令該定位環能緊密地與該收光柱結合成一體。 The light-receiving device of claim 2, wherein the light-receiving hole is formed in a central portion of a light-receiving column on the integrating sphere, and the configuration of the light-receiving column and a positioning space of the bottom side of the positioning ring Matching, and the outer edge of the positioning ring a plurality of fitting elements are operatively embedded to allow one end of each of the fitting elements to be rotated when the bottom side of the positioning ring is sleeved onto the light-receiving column, and the other end is urged to the same The periphery of the light-receiving column allows the positioning ring to be closely integrated with the light-receiving column. 如請求項3所述之收光裝置,其中該透光玻板上反光層之材質係與該積分球內壁上之反射面的材質相同。 The light-receiving device of claim 3, wherein the material of the light-reflecting layer on the light-transmissive glass plate is the same as the material of the reflecting surface on the inner wall of the integrating sphere.
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