TWM578381U - Measuring device for array type lighting unit - Google Patents

Measuring device for array type lighting unit Download PDF

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Publication number
TWM578381U
TWM578381U TW107217111U TW107217111U TWM578381U TW M578381 U TWM578381 U TW M578381U TW 107217111 U TW107217111 U TW 107217111U TW 107217111 U TW107217111 U TW 107217111U TW M578381 U TWM578381 U TW M578381U
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light
type light
image
receiver
image type
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TW107217111U
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Chinese (zh)
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徐秋田
林奕良
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惠特科技股份有限公司
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Abstract

本創作關於一種陣列式發光單元之量測裝置,用於測量呈陣列式排列之複數發光單元,其包括:一承載平台,其包括一承載該複數發光單元之透光部;複數探針組,分別可供選擇地電性接觸該複數發光單元之複數待測發光單元;一量測組件,其包括一第一影像式光接收器及一第二影像式光接收器,該第一影像式光接收器及該第二影像式光接收器分別位於該承載平台的一側,該第一影像式光接收器可與該透光部可相對移動,該第二影像式光接收器可與該透光部可相對移動,以選擇地使該第一影像式光接收器或該第二影像式光接收器對應該透光部以接收該複數待側發光單元所產生的光。The present invention relates to a measuring device for an array type light emitting unit, which is used for measuring a plurality of light emitting units arranged in an array, comprising: a carrying platform comprising a light transmitting portion carrying the plurality of light emitting units; and a plurality of probe sets; a plurality of light-emitting units to be selectively electrically connected to the plurality of light-emitting units; a measuring component comprising a first image-type light receiver and a second image-type light receiver, the first image-type light The receiver and the second image-type optical receiver are respectively located on one side of the carrying platform, and the first image-type light receiver is movable relative to the light-transmitting portion, and the second image-type light receiver can be transparent to the light-receiving portion The light portion is relatively movable to selectively cause the first image type light receiver or the second image type light receiver to correspond to the light transmitting portion to receive the light generated by the plurality of to-be-side light emitting units.

Description

陣列式發光單元之量測裝置Array type illumination unit measuring device

本創作係有關於一種陣列式發光單元之量測裝置。This creation is directed to a measuring device for an array of light-emitting units.

為了保持發光二極體的良率及品質,往往會對發光二極體進行光性的檢測。習知技術之發光二極體量測裝置,係在發光二極體下方設有積分球,透過積分球接收發光二極體的光以進行光性量測。In order to maintain the yield and quality of the light-emitting diode, the light-emitting diode is often detected for light. A conventional light-emitting diode measuring device is provided with an integrating sphere below the light-emitting diode, and receives the light of the light-emitting diode through the integrating sphere for photometric measurement.

然而,習知技術由於透過積分球一次只能量測單一顆發光二極體,造成量測時間長,有量測效率不佳的問題。再者使用積分球用於收集光及量測光會有反射光線而造成光量逸散的問題,導致量測不精確。However, the conventional technique can only measure a single light-emitting diode at a time through the integrating sphere, resulting in a long measurement time and a problem of poor measurement efficiency. Furthermore, the use of an integrating sphere for collecting light and measuring light has a problem of reflecting light and causing the amount of light to escape, resulting in inaccurate measurement.

因此,有必要提供一種新穎且具有進步性之陣列式發光單元之量測裝置,以解決上述之問題。Therefore, it is necessary to provide a novel and progressive array type light-emitting unit measuring device to solve the above problems.

本創作之主要目的在於提供一種陣列式發光單元之量測裝置,可以二個影像式光接收器量測複數發光單元的光性,以提升量測效率。The main purpose of the present invention is to provide a measuring device for an array type light emitting unit, which can measure the optical properties of a plurality of light emitting units by two image type light receivers to improve measurement efficiency.

為達成上述目的,本創作提供一種陣列式發光單元之量測裝置,用於測量呈陣列式排列之複數發光單元,該陣列式發光單元之量測裝置包括:一承載平台,其包括一透光部,該透光部承載該複數發光單元;複數探針組,分別可供選擇地電性接觸該複數發光單元之複數待測發光單元;一量測組件,其包括一第一影像式光接收器及一第二影像式光接收器,該第一影像式光接收器及該第二影像式光接收器分別位於該承載平台的一側,該第一影像式光接收器可與該透光部可相對移動,該第二影像式光接收器可與該透光部可相對移動,以選擇地使該第一影像式光接收器或該第二影像式光接收器對應該透光部以接收該複數待側發光單元所產生的光。In order to achieve the above object, the present invention provides a measuring device for an array type light emitting unit, which is used for measuring a plurality of light emitting units arranged in an array, wherein the measuring device of the array type light emitting unit comprises: a carrying platform comprising a light transmitting The light transmitting portion carries the plurality of light emitting units; the plurality of probe groups respectively selectively electrically contacting the plurality of light emitting units of the plurality of light emitting units; and a measuring component comprising a first image light receiving And a second image type light receiver, wherein the first image type light receiver and the second image type light receiver are respectively located at one side of the carrying platform, and the first image type light receiver is compatible with the light transmission The second image type light receiver can be relatively moved with the light transmitting portion to selectively make the first image type light receiver or the second image type light receiver correspond to the light transmitting portion. Receiving light generated by the plurality of to-be-side light emitting units.

為達成上述目的,本創作另提供一種陣列式發光單元之量測裝置,用於測量呈陣列式排列之複數發光單元,該陣列式發光單元之量測裝置包括:一承載平台,其包括一透光部,該透光部承載該複數發光單元;複數探針組,分別可供選擇地電性接觸該複數發光單元之複數待測發光單元;一量測組件,其包括一第一影像式光接收器、一第二影像式光接收器及一分光元件,該分光元件對準該透光部,用以將該複數待測發光單元之光線分光投射至該第一影像式光接收器及該第二影像式光接收器。In order to achieve the above object, the present invention further provides a measuring device for an array type light emitting unit, which is used for measuring a plurality of light emitting units arranged in an array, wherein the measuring device of the array type light emitting unit comprises: a carrying platform, which comprises a transparent a light-emitting portion carrying the plurality of light-emitting units; a plurality of probe sets respectively for selectively electrically contacting the plurality of light-emitting units to be tested; and a measuring component comprising a first image light a receiver, a second image light receiver, and a beam splitting component, wherein the light splitting component is aligned with the light transmitting portion, and the light of the plurality of light emitting units to be tested is split and projected onto the first image light receiver and the light source The second image type light receiver.

以下將藉由實施例說明本創作之結構特徵及其預期達成之功效,惟非用以限制本創作所欲保護之範疇,合先敘明。The structural features of the present invention and the intended effects thereof will be described by way of example only, but are not intended to limit the scope of the present invention.

請參考圖1至圖4,其顯示本創作之一第一較佳實施例,本創作之陣列式發光單元之量測裝置1,用於測量呈陣列式排列之複數發光單元2,其包括一承載平台10、複數探針組20及一量測組件30。進一步說明,本實施例為可動式量測裝置,該複數發光單元2為發光二極體晶片或一晶圓上的複數晶粒。Referring to FIG. 1 to FIG. 4, a first preferred embodiment of the present invention is shown. The measuring device 1 of the array type illuminating unit of the present invention is configured to measure a plurality of illuminating units 2 arranged in an array, which includes a The carrying platform 10, the plurality of probe sets 20 and a measuring component 30. Further, the embodiment is a movable measuring device, and the plurality of light emitting units 2 are light emitting diode chips or a plurality of crystal grains on a wafer.

該承載平台10包括一透光部11,該透光部11承載該複數發光單元2,該透光部11可為一供該複數發光單元2安裝之階孔、透孔或為透明、透光材質。該複數探針組20分別可供選擇地電性接觸該複數發光單元2之複數待測發光單元3;該量測組件30包括一第一影像式光接收器31及一第二影像式光接收器32,該第一影像式光接收器31及該第二影像式光接收器32分別位於該承載平台10的一側,該第一影像式光接收器31可與該透光部11可相對移動,該第二影像式光接收器32可與該透光部11可相對移動,以選擇地使該第一影像式光接收器31或該第二影像式光接收器32對應該透光部11以接收該複數待側發光單元2所產生的光,藉此,可同時測量該複數發光單元2的光性,以提升量測效率,節省量測時間。再者,可分別以第一影像式光接收器31及一第二影像式光接收器32之多組影像式光接收器量測該複數發光單元2的光性,以提升檢測的精確度。The carrying platform 10 includes a light transmitting portion 11 that carries the plurality of light emitting units 2, and the light transmitting portion 11 can be a stepped hole, a through hole, or a transparent, transparent light for mounting the plurality of light emitting units 2. Material. The plurality of probe sets 20 respectively selectively electrically contact the plurality of light-emitting units 3 to be tested of the plurality of light-emitting units 2; the measuring component 30 includes a first image-type light receiver 31 and a second image-type light-receiving unit The first image type light receiver 31 and the second image type light receiver 32 are respectively located on one side of the carrying platform 10, and the first image type light receiver 31 is opposite to the light transmitting part 11 Moving, the second image type light receiver 32 is movable relative to the light transmitting portion 11 to selectively make the first image type light receiver 31 or the second image type light receiver 32 correspond to the light transmitting portion. 11 to receive the light generated by the plurality of to-be-side light-emitting units 2, whereby the optical properties of the plurality of light-emitting units 2 can be simultaneously measured to improve the measurement efficiency and save the measurement time. Furthermore, the optical properties of the plurality of light-emitting units 2 can be measured by a plurality of sets of image light receivers of the first image type light receiver 31 and the second image type light receiver 32, respectively, to improve the accuracy of the detection.

進一步說明,該第一影像式光接收器31及該第二影像式光接收器32可固定不動,而由該承載平台10相對該第一影像式光接收器31及該第二影像式光接收器32移動;或反之,例如承載平台10為一移動平台。於本實施例中,該第一影像式光接收器31及該第二影像式光接收器32可同時相對該承載平台10移動,使該第一影像式光接收器31或該第二影像式光接收器32對應該透光部11,以利於計算該第一影像式光接收器31及該第二影像式光接收器32的移動距離。Further, the first image type light receiver 31 and the second image type light receiver 32 can be fixed, and the carrier platform 10 is opposite to the first image type light receiver 31 and the second image type light receiving unit. The device 32 moves; or vice versa, for example, the carrier platform 10 is a mobile platform. In this embodiment, the first image type light receiver 31 and the second image type light receiver 32 can simultaneously move relative to the carrying platform 10 to make the first image type light receiver 31 or the second image type. The light receiver 32 corresponds to the light transmitting portion 11 to facilitate calculation of the moving distance of the first image type light receiver 31 and the second image type light receiver 32.

於本實施例中,該承載平台10為一石英玻璃平台,具有高的光譜透射性。In this embodiment, the carrying platform 10 is a quartz glass platform with high spectral transmittance.

該複數探針組20可相對該透光部11平移,以快速位移至欲檢測的該複數發光單元2。此外,該複數探針組20呈矩陣排列,可同時激發呈矩陣排列之該複數待測發光單元3,具有較佳地量測效果。詳細地說,該複數探針組20係成組設置例如探針卡、探針排、機械手臂上的複數探針。The plurality of probe sets 20 are translatable relative to the light transmitting portion 11 for rapid displacement to the plurality of light emitting units 2 to be detected. In addition, the plurality of probe sets 20 are arranged in a matrix, and the plurality of light-emitting units 3 to be tested arranged in a matrix can be excited at the same time, which has a better measurement effect. In detail, the plurality of probe sets 20 are arranged in groups such as a probe card, a probe row, and a plurality of probes on a robot arm.

該第一影像式光接收器31與該第二影像式光接收器32為二測量不同的光性之量測器;該第一影像式光接收器31與該第二影像式光接收器32分別為一亮度、色度或光譜偵測器,於本實施例中,該第一影像式光接收器31為一亮度量測器,該第二影像式光接收器32為一色度量測器;於其他實施例亦不限制,藉由該第一影像式光接收器31與該第二影像式光接收器32複數個影像式光接收器量測各種光性,以提升量測的精準度。The first image type light receiver 31 and the second image type light receiver 32 are two different measuring optical indicators; the first image type light receiver 31 and the second image type light receiver 32 In the embodiment, the first image type light receiver 31 is a brightness measuring device, and the second image type light receiving unit 32 is a color measuring device. In other embodiments, the first image type optical receiver 31 and the second image type optical receiver 32 are used to measure various optical properties to improve the accuracy of the measurement. .

於本實施例中,該第一影像式光接收器31與該第二影像式光接收器32位於該承載平台10的同一側,具小體積節省空間且可精準量測各種光性。In the embodiment, the first image type light receiver 31 and the second image type light receiver 32 are located on the same side of the carrying platform 10, and have a small volume saving space and can accurately measure various light properties.

該第一影像式光接收器31與該第二影像式光接收器32各設有複數光接收單元331, 332,該複數光接收單元331, 332形成陣列排列,各該光接收單元331, 332接收其中一該複數待測發光單元3所產生的光,其中該複數光接收單元331, 332可分別凸出該第一影像式光接收器31及該第二影像式光接收器32之表面或設於內部;於本實施例中,該複數光接收單元331, 332的數量對應該複數發光單元2的數量,該複數光接收單元331, 332的位置與該複數發光單元2的位置係一對一相互對應,在檢測過程中,該複數光接收單元331, 332與該複數發光單元2對準定位後,僅需移動該複數探針組20接觸該複數待測發光單元3以SMU(Source measurement unit)供電發光,以精簡量測步驟。於其他實施例中,該複數光接收單元的數量可小於該複數光接收單元的數量,該第一影像式光接收器及該第二影像式光接收器與該複數探針組同步或不同步移動對位後以對準該複數待測發光單元。於本實施例中,各該發光單元2為覆晶式(Flip Chip)發光二極體。詳細地說,各該發光單元2包括一發光面4及一電極面5,該電極面5設有二電極6, 7,各該探針組20包括二探針21,該二探針21分別電性接觸該二電極6, 7(如正、負電極),該複數探針組20與該量測組件30分別位於該承載平台10的相對側,該發光面4朝向該量測組件30,該電極面5朝向該複數探針組20,具有較佳地量測效率,且可直接量測各該發光單元2的正面光。於其他實施例,亦可反之,以量測各該發光單元的背面光(如圖5,為本創作之一第二較佳實施例),值得一提的是,可應用於陣列式垂直腔面電射發射器的量測。The first image type light receiver 31 and the second image type light receiver 32 are each provided with a plurality of light receiving units 331 and 332. The plurality of light receiving units 331, 332 are arranged in an array, and the light receiving units 331 and 332 are respectively arranged. Receiving light generated by one of the plurality of light-emitting units 3 to be tested, wherein the plurality of light-receiving units 331, 332 may respectively protrude from the surface of the first image-type light receiver 31 and the second image-type light receiver 32 or In the present embodiment, the number of the plurality of light receiving units 331, 332 corresponds to the number of the plurality of light emitting units 2, and the positions of the plurality of light receiving units 331, 332 and the position of the plurality of light emitting units 2 are Correspondingly, after the plurality of light receiving units 331, 332 are aligned with the plurality of light emitting units 2, the multiplicity probe set 20 only needs to be moved to contact the plurality of light emitting units 3 to be tested (SMU). Unit) Power supply illumination to streamline the measurement steps. In other embodiments, the number of the plurality of light receiving units may be smaller than the number of the plurality of light receiving units, and the first image type light receiver and the second image type light receiver are synchronized or not synchronized with the plurality of types of the light probe unit. After the alignment is moved, the plurality of light-emitting units to be tested are aligned. In this embodiment, each of the light emitting units 2 is a flip chip light emitting diode. In detail, each of the light-emitting units 2 includes a light-emitting surface 4 and an electrode surface 5, and the electrode surface 5 is provided with two electrodes 6, 7. Each of the probe sets 20 includes two probes 21, and the two probes 21 respectively Electrically contacting the two electrodes 6, 7 (such as positive and negative electrodes), the plurality of probe sets 20 and the measuring component 30 are respectively located on opposite sides of the carrying platform 10, and the light emitting surface 4 faces the measuring component 30, The electrode surface 5 faces the plurality of probe sets 20, has better measurement efficiency, and can directly measure the front light of each of the light-emitting units 2. In other embodiments, the back side light of each of the light emitting units may be measured (as shown in FIG. 5 , which is a second preferred embodiment of the present invention). It is worth mentioning that it can be applied to an array vertical cavity. Measurement of the surface emitter.

該陣列式發光單元之量測裝置1另包括一光分析裝置40,該光分析裝置40分別通聯該第一影像式光接收器31及該第二影像式光接收器32,該第一影像式光接收器31及該第二影像式光接收器32分別接收該複數待測發光單元3的光而產生光性資訊,該光分析裝置40接收並整合該第一影像式光接收器31之光性資訊及該第二影像式光接收器32之光性資訊以進行分析及計算以進行分析及計算,具有較佳地分析及計算效率,光性資訊例如光亮度、光譜、光色度、主波長、峰波長、中心波長、半波寬、色純度、色座標及演色性等,該光亮度資料包括光強度(cd或mcd)、光通量(流明)、光功率(W或mW)等。詳細地說,該光分析裝置40係透過軟體計算分析該第一影像式光接收器31及該第二影像式光接收器32之光性資訊。其中該光分析裝置40可以有線或無線的方式分別與該第一影像式光接收器31及該第二影像式光接收器32通聯。The measuring device 1 of the array type light emitting unit further includes an optical analyzing device 40, and the optical analyzing device 40 respectively connects the first image type light receiver 31 and the second image type light receiver 32, the first image type The light receiver 31 and the second image light receiver 32 respectively receive the light of the plurality of light-emitting units 3 to be tested to generate optical information, and the light analyzing device 40 receives and integrates the light of the first image light receiver 31. The information and the optical information of the second image light receiver 32 are analyzed and calculated for analysis and calculation, and have better analysis and calculation efficiency, such as lightness, spectrum, light color, and main information. The wavelength, peak wavelength, center wavelength, half-wave width, color purity, color coordinates, color rendering, etc., and the brightness data include light intensity (cd or mcd), luminous flux (lumens), optical power (W or mW), and the like. In detail, the optical analysis device 40 analyzes and analyzes the optical information of the first image type light receiver 31 and the second image type light receiver 32 through software. The optical analysis device 40 can be connected to the first image type light receiver 31 and the second image type light receiver 32 in a wired or wireless manner.

該光分析裝置40另包括至少一顯示器50,該至少一顯示器50例如螢幕,該顯示器50顯示該光性資訊。The optical analysis device 40 further includes at least one display 50, such as a screen, which displays the optical information.

較佳地,該陣列式發光單元之量測裝置1另包括一光衰減元件60,該光衰減元件60設於該透光部11與該量測組件30之間,以提升量測的精準度,避免光過度飽和造成量測不精確。於本實施例中,該光衰減元件60位於該第一影像式光接收器31及該承載平台10之間。Preferably, the measuring device 1 of the array type light emitting unit further includes a light attenuating element 60 disposed between the light transmitting portion 11 and the measuring component 30 to improve the accuracy of the measurement. To avoid excessive measurement of light, resulting in inaccurate measurement. In the embodiment, the light attenuating element 60 is located between the first image type light receiver 31 and the carrying platform 10 .

請參考圖6,其顯示本創作之一第三較佳實施例,本實施例為固定式之量測裝置1’,其與該第一實施例的差異在於,該量測組件30另包括一分光元件70,於本實施例中該分光元件為一分光鏡,該分光元件70對準該透光部11,用以將該複數待測發光單元3之光線分光投射至該第一影像式光接收器31及該第二影像式光接收器32。於本實施例中,該分光元件70係設於該第一影像式光接收器31、該第二影像式光接收器32及該承載平台10之間,使該第一影像式光接收器31及該第二影像式光接收器32可同時接收該複數待測發光單元3的光,以縮短量測時間。該至少一顯示器50的數量為複數,該複數顯示器50分別顯示該第一影像式光接收器31之光性資訊或該第二影像式光接收器32之光性資訊。Please refer to FIG. 6, which shows a third preferred embodiment of the present invention. The present embodiment is a fixed measuring device 1', which differs from the first embodiment in that the measuring component 30 further includes a In the present embodiment, the light splitting element is a beam splitter, and the light splitting element 70 is aligned with the light transmitting portion 11 for splitting the light of the plurality of light emitting units 3 to be detected into the first image light. The receiver 31 and the second image light receiver 32. In the embodiment, the light splitting component 70 is disposed between the first image type light receiver 31, the second image type light receiver 32, and the carrying platform 10, so that the first image type light receiver 31 is provided. And the second image type light receiver 32 can simultaneously receive the light of the plurality of light-emitting units 3 to be tested to shorten the measurement time. The number of the at least one display 50 is plural, and the plurality of displays 50 respectively display the optical information of the first image type light receiver 31 or the light information of the second image type light receiver 32.

綜上,本創作之陣列式發光單元之量測裝置可同時測量該複數發光單元的光性,以提升量測效率,節省量測時間。再者,可分別以二個影像式光接收器量測該複數發光單元的光性,以提升檢測的精確度。In summary, the measuring device of the array type illuminating unit of the present invention can simultaneously measure the optical properties of the plurality of illuminating units to improve measurement efficiency and save measurement time. Furthermore, the optical properties of the complex light-emitting unit can be measured by two image light receivers respectively to improve the accuracy of the detection.

1, 1’‧‧‧量測裝置1, 1'‧‧‧Measurement device

2‧‧‧發光單元2‧‧‧Lighting unit

3‧‧‧待測發光單元3‧‧‧Lighting unit to be tested

4‧‧‧發光面4‧‧‧Lighting surface

5‧‧‧電極面5‧‧‧electrode surface

6, 7‧‧‧電極6, 7‧‧‧ electrodes

10‧‧‧承載平台10‧‧‧Loading platform

11‧‧‧透光部11‧‧‧Transmission Department

20‧‧‧探針組20‧‧‧ probe set

21‧‧‧探針21‧‧‧ probe

30‧‧‧量測組件30‧‧‧Measurement components

31‧‧‧第一影像式光接收器31‧‧‧First Image Light Receiver

32‧‧‧第二影像式光接收器32‧‧‧Second image light receiver

331, 332‧‧‧光接收單元331, 332‧‧‧Light receiving unit

40‧‧‧光分析裝置40‧‧‧Light analysis device

50‧‧‧顯示器50‧‧‧ display

60‧‧‧光衰減元件60‧‧‧Light attenuation components

70‧‧‧分光元件70‧‧‧Spectral components

圖1為本創作一第一較佳實施例之立體圖。 圖2為本創作一第一較佳實施例之局部放大剖面圖。 圖3為本創作一第一較佳實施例之使用狀態圖。 圖4為本創作一第一較佳實施例之另一使用狀態圖。 圖5為本創作一第二較佳實施例之一使用狀態圖。 圖6為本創作一第三較佳實施例之一使用狀態圖。1 is a perspective view of a first preferred embodiment of the present invention. Figure 2 is a partially enlarged cross-sectional view showing a first preferred embodiment of the present invention. Figure 3 is a diagram showing the state of use of a first preferred embodiment of the present invention. 4 is another use state diagram of a first preferred embodiment of the present invention. FIG. 5 is a view showing a state of use of a second preferred embodiment of the present invention. Figure 6 is a diagram showing the state of use of a third preferred embodiment of the present invention.

Claims (13)

一種陣列式發光單元之量測裝置,用於測量呈陣列式排列之複數發光單元,該陣列式發光單元之量測裝置包括:一承載平台,包括一透光部,該透光部承載該複數發光單元;複數探針組,分別可供選擇地電性接觸該複數發光單元之複數待測發光單元;一量測組件,包括一第一影像式光接收器及一第二影像式光接收器,該第一影像式光接收器及該第二影像式光接收器分別位於該承載平台的一側,該第一影像式光接收器可與該透光部可相對移動,該第二影像式光接收器可與該透光部可相對移動,以選擇地使該第一影像式光接收器或該第二影像式光接收器對應該透光部以接收該複數待側發光單元所產生的光。 The measuring device of the array type illuminating unit is configured to measure a plurality of illuminating units arranged in an array, wherein the measuring device of the illuminating unit comprises: a carrying platform, comprising a light transmitting portion, the light transmitting portion carrying the plurality a plurality of probe units respectively for selectively electrically contacting the plurality of light-emitting units of the plurality of light-emitting units; a measuring component comprising a first image-type light receiver and a second image-type light receiver The first image type light receiver and the second image type light receiver are respectively located at one side of the carrying platform, and the first image type light receiver is movable relative to the light transmitting portion, the second image type The light receiver can be relatively movable with the light transmitting portion to selectively make the first image type light receiver or the second image type light receiver correspond to the light transmitting portion to receive the plurality of to-side side light emitting units. Light. 如請求項1所述的陣列式發光單元之量測裝置,其中該第一影像式光接收器及該第二影像式光接收器可同時相對該承載平台移動,使該第一影像式光接收器或該第二影像式光接收器對應該透光部。 The measuring device of the array type light emitting unit of claim 1, wherein the first image type light receiver and the second image type light receiver are simultaneously movable relative to the carrying platform to enable the first image type light receiving The second image type light receiver or the second image type light receiver corresponds to the light transmitting portion. 一種陣列式發光單元之量測裝置,用於測量呈陣列式排列之複數發光單元,該陣列式發光單元之量測裝置包括:一承載平台,包括一透光部,該透光部承載該複數發光單元;複數探針組,分別可供選擇地電性接觸該複數發光單元之複數待測發光單元;一量測組件,包括一第一影像式光接收器、一第二影像式光接收器及一分光元件,該分光元件對準該透光部,用以將該複數待測發光單元之光線分光投射至該第一影像式光接收器及該第二影像式光接收器。 The measuring device of the array type illuminating unit is configured to measure a plurality of illuminating units arranged in an array, wherein the measuring device of the illuminating unit comprises: a carrying platform, comprising a light transmitting portion, the light transmitting portion carrying the plurality a plurality of probe units respectively for selectively electrically contacting the plurality of light-emitting units of the plurality of light-emitting units; a measuring component comprising a first image-type light receiver and a second image-type light receiver And a light splitting component, wherein the light splitting component is aligned with the light transmitting portion for splitting the light of the plurality of light emitting units to be tested into the first image light receiver and the second image light receiver. 如請求項3所述的陣列式發光單元之量測裝置,其中該分光元件係設於該第一影像式光接收器、該第二影像式光接收器及該承載平台之間。 The measuring device of the array type light emitting unit according to claim 3, wherein the beam splitting element is disposed between the first image type light receiver, the second image type light receiver and the carrying platform. 如請求項1至4其中任一項所述的陣列式發光單元之量測裝置,其中該第一影像式光接收器與該第二影像式光接收器為二測量不同的光性之量測器。 The measuring device of the array type light emitting unit according to any one of claims 1 to 4, wherein the first image type light receiver and the second image type light receiver measure different optical properties Device. 如請求項5所述的陣列式發光單元之量測裝置,其中該第一影像式光接收器與該第二影像式光接收器分別為一亮度、色度或光譜偵測器。 The measuring device of the array type light emitting unit of claim 5, wherein the first image type light receiver and the second image type light receiver are respectively a brightness, chromaticity or spectrum detector. 如請求項1至4其中任一項所述的陣列式發光單元之量測裝置,其中該第一影像式光接收器與該第二影像式光接收器位於該承載平台的同一側。 The measuring device of the array type light emitting unit according to any one of claims 1 to 4, wherein the first image type light receiver and the second image type light receiver are located on the same side of the carrying platform. 如請求項1至4其中任一項所述的陣列式發光單元之量測裝置,其中該第一影像式光接收器與該第二影像式光接收器各設有複數光接收單元,該複數光接收單元形成陣列排列,各該光接收單元的位置對應其中一該發光單元的位置。 The measuring device of the array type light emitting unit according to any one of claims 1 to 4, wherein the first image type light receiver and the second image type light receiver are each provided with a plurality of light receiving units, the plural The light receiving units form an array arrangement, and the positions of the light receiving units correspond to the positions of one of the light emitting units. 如請求項8所述的陣列式發光單元之量測裝置,其中該複數光接收單元的數量對應該複數發光單元的數量,該複數光接收單元的位置與該複數發光單元的位置係一對一相互對應。 The measuring device of the array type light emitting unit according to claim 8, wherein the number of the plurality of light receiving units corresponds to the number of the plurality of light emitting units, and the position of the plurality of light receiving units and the position of the plurality of light emitting units are one to one Correspond to each other. 如請求項1至4其中任一項所述的陣列式發光單元之量測裝置,另包括一光分析裝置,該光分析裝置分別通聯該第一影像式光接收器及該第二影像式光接收器,該第一影像式光接收器及該第二影像式光接收器分別接收該複數待測發光單元的光而產生光性資訊,該光分析裝置接收並整合該第一影像式光接收器之光性資訊及該第二影像式光接收器之光性資訊以進行分析及計算。 The measuring device of the array type light emitting unit according to any one of claims 1 to 4, further comprising an optical analyzing device, wherein the optical analyzing device respectively connects the first image type light receiver and the second image type light The first image type light receiver and the second image type light receiver respectively receive light of the plurality of light emitting units to be tested to generate optical information, and the light analyzing device receives and integrates the first image type light receiving The optical information of the device and the optical information of the second image light receiver are analyzed and calculated. 如請求項1至4其中任一項所述的陣列式發光單元之量測裝置,另包括一光衰減元件,該光衰減元件設於該透光部與該量測組件之間。 The measuring device of the array type light emitting unit according to any one of claims 1 to 4, further comprising a light attenuating element disposed between the light transmitting portion and the measuring component. 如請求項1至4其中任一項所述的陣列式發光單元之量測裝置,其中各該發光單元包括一發光面及一電極面,該電極面設有二電極,各該探針組包括二探針,該二探針分別電性接觸該二電極,該複數探針組與該量測組件分別位於該承載平台的相對側,該發光面朝向該量測組件,該電極面朝向該複數探針組。 The measuring device of the array type light emitting unit according to any one of claims 1 to 4, wherein each of the light emitting units comprises a light emitting surface and an electrode surface, the electrode surface is provided with two electrodes, and each of the probe groups comprises a second probe, the two probes are electrically connected to the two electrodes respectively, the plurality of probe sets and the measuring component are respectively located on opposite sides of the carrying platform, and the light emitting surface faces the measuring component, and the electrode surface faces the plural Probe set. 如請求項2或4所述的陣列式發光單元之量測裝置,其中該第一影像式光接收器與該第二影像式光接收器為二測量不同的光性之量測器;該第一影像式光接收器與該第二影像式光接收器分別為一亮度、色度或光譜偵測器;該第一影像式光接收器與該第二影像式光接收器位於該承載平台的同一側;該第一影像式光接收器與該第二影像式光接收器各設有複數光接收單元,該複數光接收單元形成陣列排列,各該光接收單元的位置對應其中一該發光單元的位置;該複數光接收單元的數量對應該複數發光單元的數量,該複數光接收單元的位置與該複數發光單元的位置係一對一相互對應;該陣列式發光單元之量測裝置另包括一光分析裝置,該光分析裝置分別通聯該第一影像式光接收器及該第二影像式光接收器,該第一影像式光接收器及該第二影像式光接收器分別接收該複數待測發光單元的光而產生光性資訊,該光分析裝置接收並整合該第一影像式光接收器之光性資訊及該第二影像式光接收器之光性資訊以進行分析及計算;該陣列式發光單元之量測裝置另包括一光衰減元件,該光衰減元件設於該透光部與該量測組件之間;各該發光單元包括一發光面及一電極面,該電極面設有二電極,各該探針組包括二探針,該二探針分別電性接觸該二電極,該複數探針組與該量測組件分別位於該承載平台的相對側,該發光面朝向該量測組件,該電極面朝向該複數探針組;該承載平台為一石英玻璃平台;各該發光 單元為覆晶式發光二極體;該複數探針組可相對該透光部平移;該光分析裝置另包括至少一顯示器,該至少一顯示器顯示該光性資訊;該複數探針組呈矩陣排列。The measuring device of the array type light emitting unit of claim 2 or 4, wherein the first image type light receiver and the second image type light receiver are two different measuring instruments for measuring optical properties; An image light receiver and the second image light receiver are respectively a brightness, chromaticity or spectrum detector; the first image type light receiver and the second image type light receiver are located on the carrying platform The first image type light receiver and the second image type light receiver are each provided with a plurality of light receiving units, and the plurality of light receiving units are arranged in an array, and the positions of the light receiving units correspond to one of the light emitting units. a position of the plurality of light receiving units corresponding to the number of the plurality of light emitting units, the position of the plurality of light receiving units and the position of the plurality of light emitting units are corresponding to each other; the measuring device of the array type light emitting unit further comprises An optical analysis device, wherein the optical analysis device is respectively connected to the first image type light receiver and the second image type light receiver, wherein the first image type light receiver and the second image type light receiver respectively Receiving light of the plurality of light-emitting units to be tested to generate optical information, the light analyzing device receiving and integrating the optical information of the first image-type optical receiver and the optical information of the second image-type optical receiver for analysis And the calculation device of the array type light-emitting unit further includes a light-attenuating element disposed between the light-transmitting portion and the measuring component; each of the light-emitting units includes a light emitting surface and an electrode surface. The electrode surface is provided with two electrodes, each of the probe sets includes two probes, and the two probes are electrically connected to the two electrodes respectively, and the plurality of probe sets and the measuring component are respectively located on opposite sides of the carrying platform, The light emitting surface faces the measuring component, the electrode surface faces the plurality of probe sets; the carrying platform is a quartz glass platform; each of the light emitting The unit is a flip-chip light-emitting diode; the plurality of probe sets are translatable relative to the light-transmitting portion; the light analyzing device further includes at least one display, the at least one display displays the optical information; the plurality of probe sets are in a matrix arrangement.
TW107217111U 2018-12-17 2018-12-17 Measuring device for array type lighting unit TWM578381U (en)

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Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI734366B (en) * 2020-02-04 2021-07-21 均豪精密工業股份有限公司 Optical detection system
CN113218623A (en) * 2020-02-04 2021-08-06 均豪精密工业股份有限公司 Optical detection system
TWI765834B (en) * 2020-12-31 2022-05-21 台灣愛司帝科技股份有限公司 Light-emitting diode wafer inspection method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI734366B (en) * 2020-02-04 2021-07-21 均豪精密工業股份有限公司 Optical detection system
CN113218623A (en) * 2020-02-04 2021-08-06 均豪精密工业股份有限公司 Optical detection system
TWI765834B (en) * 2020-12-31 2022-05-21 台灣愛司帝科技股份有限公司 Light-emitting diode wafer inspection method

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