TWI460405B - Light amount measuring device and light amount measuring method - Google Patents

Light amount measuring device and light amount measuring method Download PDF

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TWI460405B
TWI460405B TW102127493A TW102127493A TWI460405B TW I460405 B TWI460405 B TW I460405B TW 102127493 A TW102127493 A TW 102127493A TW 102127493 A TW102127493 A TW 102127493A TW I460405 B TWI460405 B TW I460405B
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light
light receiving
emitting diode
range
measuring device
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TW102127493A
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Chinese (zh)
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TW201405106A (en
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Manabu Mochizuki
Shoichi Fujimori
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Pioneer Corp
Pioneer Fa Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L25/00Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
    • H01L25/03Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes
    • H01L25/04Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers
    • H01L25/075Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00
    • H01L25/0753Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof all the devices being of a type provided for in the same subgroup of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. assemblies of rectifier diodes the devices not having separate containers the devices being of a type provided for in group H01L33/00 the devices being arranged next to each other
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/0242Control or determination of height or angle information of sensors or receivers; Goniophotometry
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/0266Field-of-view determination; Aiming or pointing of a photometer; Adjusting alignment; Encoding angular position; Size of the measurement area; Position tracking; Photodetection involving different fields of view for a single detector
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/0407Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings
    • G01J1/0411Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings using focussing or collimating elements, i.e. lenses or mirrors; Aberration correction
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/06Restricting the angle of incident light
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/10Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void
    • G01J1/20Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle
    • G01J1/28Photometry, e.g. photographic exposure meter by comparison with reference light or electric value provisionally void intensity of the measured or reference value being varied to equalise their effects at the detectors, e.g. by varying incidence angle using variation of intensity or distance of source
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/06Restricting the angle of incident light
    • G01J2001/061Baffles
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/02Details
    • G01J1/04Optical or mechanical part supplementary adjustable parts
    • G01J1/06Restricting the angle of incident light
    • G01J2001/067Restricting the angle of incident light for angle scan
    • G01J2001/068Restricting the angle of incident light for angle scan by diaphragm or the like
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00Photometry, e.g. photographic exposure meter
    • G01J1/42Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J2001/4247Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources
    • G01J2001/4252Photometry, e.g. photographic exposure meter using electric radiation detectors for testing lamps or other light sources for testing LED's
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Description

光量測定裝置及光量測定方法Light quantity measuring device and light quantity measuring method

本發明係有關於用於發光二極體之光量測定裝置及光量測定方法。The present invention relates to a light amount measuring device and a light amount measuring method for a light emitting diode.

在發光二極體的製程中具有一檢查步驟,用於檢查是否能從所製造的發光二極體得到預期的光量,以管理不良品的篩選及生產線之製程能力。而在此檢查步驟中用以測定發光二極體之光量的裝置,則須達到構造簡單、能實現高精度測定的要求。In the process of the light-emitting diode, there is an inspection step for checking whether the expected amount of light can be obtained from the manufactured light-emitting diode to manage the screening of the defective product and the process capability of the production line. In the inspection step, the means for measuring the amount of light of the light-emitting diode must have a simple structure and a high-precision measurement.

專利文獻1揭示一半導體檢查裝置,將受光裝置之受光面固定於與晶圓的基板面的光發射方向5°到35°的角度範圍內的光束入射的位置上,該受光裝置用於對晶圓上的光半導體元件進行光量測定。Patent Document 1 discloses a semiconductor inspection apparatus for fixing a light-receiving surface of a light-receiving device at a position where a light beam is incident in an angular range of 5° to 35° with respect to a light emission direction of a substrate surface of the wafer, and the light-receiving device is used for crystal alignment. The optical semiconductor element on the circle is subjected to light quantity measurement.

[先前技術文獻][Previous Technical Literature] [專利文獻][Patent Literature]

[專利文獻1]日本特開平11-340512號公報[Patent Document 1] Japanese Patent Laid-Open No. Hei 11-340512

[發明所欲解決之問題][The problem that the invention wants to solve]

然而,專利文獻1中的受光面被固定為傾斜於光半導體元件,因此,雖然可測定到特定角度成分之光束,但是在高精度地測定全角度成分的光束方面還有改善的空間。而且,在專利文獻1中,並沒有考慮光半導體元件在晶圓上的排列關係對光束測定所造成之影響,因此,在高精度測定上尚需改進。再者,在專利文獻1中,為了進行高精度的測定,必須在晶圓本身特別設置反射裝置,構造過於複雜。因此,難以將專利文獻1的半導體檢查裝置使用於檢查步驟中。However, since the light-receiving surface in Patent Document 1 is fixed to be inclined to the optical semiconductor element, it is possible to measure a light beam having a specific angular component, but there is still room for improvement in measuring a light beam of a full-angle component with high precision. Further, in Patent Document 1, since the influence of the arrangement relationship of the optical semiconductor elements on the wafer on the measurement of the light beam is not considered, improvement in high-precision measurement is required. Further, in Patent Document 1, in order to perform high-accuracy measurement, it is necessary to provide a reflection device in the wafer itself, and the structure is too complicated. Therefore, it is difficult to use the semiconductor inspection apparatus of Patent Document 1 in the inspection step.

本發明鑒於上述情況,將解決上述問題作為一課題。即,本發明的目的是提供一種構造簡單、能實現高精度測定發光二極體之光量測定裝置。The present invention has been made in view of the above circumstances as a problem. That is, an object of the present invention is to provide a light amount measuring device which is simple in structure and capable of measuring a light-emitting diode with high precision.

本發明請求項1之光量測定裝置為發光二極體之光量測定裝置,其具備:一受光部,其係與該發光二極體相向配置,接收由該發光二極體所發出之放射狀的光,並測定其光量;一探針,其係供給電力至該發光二極體,以使該發光二極體發光;以及一受光範圍設定機構,其係根據相對於該發光二極體的發光中心軸之角度,對該發光二極體發出的光之中使該受光部受光之光的範圍即受光範圍進行設定,其中,在一切割片上排列有多個該發光二極體,該受光範圍設定機構在該受光部接收從該多個排列之該發光二極體發出的光時,將該受光範圍設定為不論該多個排列之該發光二極體的排列形態為何,使該接收到的光之光量的測定誤差在規定比率以下。The light quantity measuring device according to claim 1 is a light quantity measuring device for a light emitting diode, comprising: a light receiving unit disposed to face the light emitting diode and receiving the radial light emitted by the light emitting diode Light, and measuring the amount of light; a probe for supplying power to the light emitting diode to cause the light emitting diode to emit light; and a light receiving range setting mechanism for emitting light according to the light emitting diode The angle of the central axis is set to a range of light that is received by the light-receiving portion, that is, a light-receiving range, and a plurality of the light-emitting diodes are arranged on a dicing sheet. When the light receiving unit receives the light emitted from the plurality of arranged light emitting diodes, the setting unit sets the light receiving range to be different regardless of the arrangement form of the plurality of light emitting diodes. The measurement error of the amount of light is below a predetermined ratio.

本發明請求項8之光量測定方法為發光二極體的光量測定方法,其使用與排列於切割片上之多個該發光二極體相向配置之一受光機構,接收由該發光二極體所發出之放射狀的光,其具有以下步驟:一發光步驟,其係供給電力至該發光二極體,使該發光二極體發光;一受光範圍設定步驟,其係根據相對於該發光二極體的發光中心軸之角度,對該發光二極體發出的光之中使該受光機構受光之光的範圍即受光範圍進行設定;以及一測定步驟,測定藉由該受光機構接收到的光之光量,其中,該受光範圍設定步驟在該受光機構接收從該多個排列之該發光二極體發出的光時,將該受光範圍設定為不論該多個排列之該發光二極體的排列形態為何,使該接收到的光之光量的測定誤差在規定比率以下。The method for measuring the amount of light in the eighth aspect of the present invention is a method for measuring the amount of light of a light-emitting diode, wherein a light-receiving mechanism is disposed opposite to a plurality of the light-emitting diodes arranged on the dicing sheet, and is received by the light-emitting diode. Radial light having the following steps: a light emitting step of supplying power to the light emitting diode to cause the light emitting diode to emit light; and a light receiving range setting step based on the light emitting diode The angle of the central axis of the light is set in the range of the light emitted by the light receiving means, that is, the light receiving range, and the measuring step, and the amount of light received by the light receiving means is measured. The light receiving range setting step sets the light receiving range to the arrangement form of the light emitting diodes regardless of the plurality of arrays when the light receiving unit receives the light emitted from the plurality of arranged light emitting diodes. The measurement error of the amount of received light is equal to or less than a predetermined ratio.

本發明請求項9之光量測定裝置為發光二極體之光量測定裝置, 其具備:一受光部,其係接收從該發光二極體所發出之放射狀的光,並測定其光量;一探針,其係供給電力至該發光二極體,以使該發光二極體發光;以及一測定範圍設定機構,其係根據相對於該發光二極體的發光中心軸之角度,對該發光二極體發出的光之中使在該受光部測定的光範圍即測定範圍進行設定,其中,在一切割片上排列有多個該發光二極體,該測定範圍設定機構將該發出的光之中該角度的最大值為75°±10°的光範圍設定為該測定範圍。The light quantity measuring device according to claim 9 of the present invention is a light quantity measuring device for a light emitting diode, The method includes a light receiving unit that receives the radial light emitted from the light emitting diode and measures the amount of light, and a probe that supplies power to the light emitting diode to make the light emitting diode And a measurement range setting mechanism for determining a range of light measured by the light-receiving portion, that is, a range of light emitted from the light-emitting diode, based on an angle with respect to an emission central axis of the light-emitting diode The setting is performed, wherein a plurality of the light-emitting diodes are arranged on a dicing sheet, and the measuring range setting means sets the light range of the maximum value of the angle of the emitted light to 75°±10° as the measuring range. .

本發明請求項10之光量測定方法,為發光二極體的光量測定方法,其使用一受光機構接收從排列於切割片上的多個該發光二極體所發出之放射狀的光,其具有以下步驟:一發光步驟,其係供給電力至該發光二極體,使該發光二極體發光;一測定範圍設定步驟,其係根據相對於該發光二極體的發光中心軸之角度,對該發光二極體發出的光之中使在該受光機構測定的光範圍即測定範圍進行設定;以及一測定步驟,測定藉由該受光機構接收到的光之光量,該測定範圍設定步驟將該發出的光之中該角度的最大值為75°±10°的光範圍設定為該測定範圍。The method for measuring the amount of light according to claim 10 of the present invention is a method for measuring the amount of light of a light-emitting diode, which receives a radial light emitted from a plurality of the light-emitting diodes arranged on a dicing sheet by using a light-receiving mechanism, and has the following Step: a light-emitting step of supplying power to the light-emitting diode to cause the light-emitting diode to emit light; and a measuring range setting step according to an angle with respect to a central axis of the light-emitting diode The light emitted from the light-emitting diode sets a measurement range which is a light range measured by the light-receiving means, and a measurement step of measuring the amount of light received by the light-receiving means, and the measurement range setting step is issued. The range of light in which the maximum value of the angle is 75° ± 10° is set as the measurement range.

1‧‧‧受光模組1‧‧‧ light receiving module

3‧‧‧光量測定裝置3‧‧‧Light measuring device

10‧‧‧半導體晶圓10‧‧‧Semiconductor wafer

11‧‧‧切割片11‧‧‧Cut slices

12‧‧‧晶片環12‧‧‧ wafer ring

101‧‧‧發光二極體101‧‧‧Lighting diode

101a‧‧‧發光面101a‧‧‧Lighting surface

101b‧‧‧發光二極體101b‧‧‧Lighting diode

101c‧‧‧發光二極體101c‧‧‧Lighting diode

103‧‧‧載置桌103‧‧‧Loading table

103a‧‧‧玻璃桌103a‧‧‧glass table

103b‧‧‧切割片103b‧‧‧cutting piece

105‧‧‧光檢測器105‧‧‧Photodetector

107‧‧‧保持部107‧‧‧ Keeping Department

107a‧‧‧遮蔽部107a‧‧‧Shading Department

107b‧‧‧側面部107b‧‧‧ Side section

107c‧‧‧圓形開口部107c‧‧‧Circular opening

107d‧‧‧圓形開口部107d‧‧‧Circular opening

108‧‧‧積分球108‧‧·score ball

108a‧‧‧內壁108a‧‧‧ inner wall

108b‧‧‧開口部108b‧‧‧ openings

109‧‧‧探針109‧‧‧Probe

111‧‧‧訊號線111‧‧‧Signal line

113‧‧‧放大器113‧‧‧Amplifier

115‧‧‧通訊線115‧‧‧Communication line

117‧‧‧導光部117‧‧‧Light Guide

119‧‧‧光纖119‧‧‧ fiber

120‧‧‧波長測定部120‧‧‧ Wavelength Measurement Department

121‧‧‧分光器121‧‧‧Spectroscope

123‧‧‧反射體123‧‧‧ reflector

123a‧‧‧反射面123a‧‧·reflecting surface

124‧‧‧光圈124‧‧‧ aperture

125‧‧‧電氣特性計測部125‧‧‧Electrical Characteristics Measurement Department

126‧‧‧菲涅耳透鏡126‧‧ ‧ Fresnel lens

127‧‧‧反射體127‧‧‧ reflector

127a‧‧‧反射面127a‧‧‧reflecting surface

151‧‧‧演算部151‧‧‧ Calculation Department

153‧‧‧HV單元153‧‧‧HV unit

155‧‧‧ESD單元155‧‧‧ESD unit

157‧‧‧切換單元157‧‧‧Switch unit

159‧‧‧定位單元159‧‧‧ Positioning unit

d1‧‧‧界道寬度D1‧‧‧ boundary width

d2‧‧‧界道寬度D2‧‧‧ boundary width

LCA‧‧‧發光中心軸LCA‧‧‧Lighting Center Shaft

圖1(a)至圖1(c)係為使用本發明一實施形態之光量測定裝置所測定的發光二極體的發光狀況之說明圖。1(a) to 1(c) are explanatory views of the light-emitting state of the light-emitting diode measured by the light amount measuring device according to the embodiment of the present invention.

圖2(a)至圖2(c)係為使用本發明一實施形態之光量測定裝置所測定的發光二極體的發光強度分布之說明圖。2(a) to 2(c) are explanatory views of the luminous intensity distribution of the light-emitting diode measured by the light amount measuring device according to the embodiment of the present invention.

圖3係為本發明一實施形態之光量測定裝置的受光模組之說明圖。Fig. 3 is an explanatory view of a light receiving module of the light quantity measuring device according to the embodiment of the present invention.

圖4係為本發明一實施形態之光量測定裝置之說明圖。Fig. 4 is an explanatory view showing a light quantity measuring device according to an embodiment of the present invention.

圖5(a)、圖5(b)係為本發明一實施形態之光量測定裝置測定之發光二極體的排列形態之說明圖。5(a) and 5(b) are explanatory views showing an arrangement pattern of light-emitting diodes measured by a light amount measuring device according to an embodiment of the present invention.

圖6(a)、圖6(b)係顯示使用本發明一實施形態之光量測定裝置所 測定之發光二極體的各種排列形態之光量測定結果圖。6(a) and 6(b) show the use of a light amount measuring device according to an embodiment of the present invention. A photometric measurement result chart of various arrangements of the measured light-emitting diodes.

圖7(a)、圖7(b)係為使用本發明一實施形態之光量測定裝置所測定之發光二極體的排列形態對光量的影響之說明圖。7(a) and 7(b) are explanatory views of the influence of the arrangement form of the light-emitting diodes measured by the light amount measuring device according to the embodiment of the present invention on the amount of light.

圖8(a)、圖8(b)係顯示使用本發明一實施形態之光量測定裝置所測定的各種種類的發光二極體之光量測定結果圖。8(a) and 8(b) are diagrams showing the results of measurement of the light amount of various types of light-emitting diodes measured by the light amount measuring apparatus according to the embodiment of the present invention.

圖9係顯示本發明一實施形態之光量測定裝置的光量推算誤差圖。Fig. 9 is a view showing a light amount estimation error of the light amount measuring device according to the embodiment of the present invention.

圖10係為本發明一實施形態之光量測定裝置的受光範圍設定機構的實施例1之說明圖。FIG. 10 is an explanatory diagram of the first embodiment of the light receiving range setting means of the light amount measuring device according to the embodiment of the present invention.

圖11係為本發明一實施形態之光量測定裝置的受光範圍設定機構的實施例2之說明圖。Fig. 11 is an explanatory view showing a second embodiment of the light receiving range setting means of the light amount measuring device according to the embodiment of the present invention.

圖12係為本發明一實施形態之光量測定裝置的受光範圍設定機構的實施例3之說明圖。Fig. 12 is an explanatory view showing a third embodiment of a light receiving range setting mechanism of the light amount measuring device according to the embodiment of the present invention.

圖13係為本發明一實施形態之光量測定裝置的受光範圍設定機構的實施例4之說明圖。Fig. 13 is an explanatory view showing a fourth embodiment of the light receiving range setting means of the light amount measuring device according to the embodiment of the present invention.

圖14係為本發明一實施形態之光量測定裝置的受光範圍設定機構的實施例5之說明圖。Fig. 14 is an explanatory view showing a fifth embodiment of the light receiving range setting means of the light amount measuring device according to the embodiment of the present invention.

圖15係為本發明一實施形態之光量測定裝置的受光模組的變形例1之說明圖。Fig. 15 is an explanatory view showing a first modification of the light receiving module of the light amount measuring device according to the embodiment of the present invention.

圖16係為本發明一實施形態之光量測定裝置的受光模組的變形例2之說明圖。Fig. 16 is an explanatory view showing a second modification of the light receiving module of the light quantity measuring device according to the embodiment of the present invention.

圖17係為本發明一實施形態之光量測定裝置的受光模組的變形例3之說明圖。Fig. 17 is an explanatory view showing a third modification of the light receiving module of the light quantity measuring device according to the embodiment of the present invention.

圖18係為本發明一實施形態之光量測定裝置的載置桌的應用例之說明圖。Fig. 18 is an explanatory diagram showing an application example of a mounting table of the light quantity measuring device according to the embodiment of the present invention.

<發光二極體的發光狀況><Lighting status of light-emitting diode>

以下,針對本發明的實施形態,參照圖面進行說明。Hereinafter, embodiments of the present invention will be described with reference to the drawings.

圖1係為使用本發明一實施形態之光量測定裝置3所測定的發光二極體101的發光狀況之說明圖。Fig. 1 is an explanatory view showing a state of light emission of the light-emitting diode 101 measured by the light amount measuring device 3 according to the embodiment of the present invention.

如圖1(a)所示,從發光二極體(以下稱之為LED(Light Emitting Diode))101的發光面101a發射的光呈放射狀。As shown in FIG. 1(a), light emitted from the light-emitting surface 101a of the light-emitting diode (hereinafter referred to as LED (Light Emitting Diode)) 101 is radially formed.

圖1(a)的發光面101a位於LED101的上面。將LED101的發光面101a的法線稱為發光中心軸LCA。The light emitting surface 101a of Fig. 1(a) is located above the LED 101. The normal line of the light-emitting surface 101a of the LED 101 is referred to as an emission center axis LCA.

將包含發光面101a之平面上的一方向當作基準軸(X軸)時,而從該平面上的X軸逆時針旋轉的角度定義為φ。此外,將φ固定時,將與發光中心軸LCA所夾之角度定義為θ。When one direction on the plane including the light-emitting surface 101a is taken as the reference axis (X-axis), the angle rotated counterclockwise from the X-axis on the plane is defined as φ. Further, when φ is fixed, the angle with the central axis of illumination LCA is defined as θ.

LED101發光時,其從發光面101a發射的光強度會依與發光中心軸LCA所夾之角度θ等而不同。When the LED 101 emits light, the intensity of light emitted from the light-emitting surface 101a differs depending on the angle θ or the like sandwiched by the central axis of illumination LCA.

光量為將φ的值為0°到360°、θ的值為由0°到90°為止的範圍內之光強度全部累計,並且針對LED101的相反側也進行計算,並將其兩者合計的值。The amount of light is such that the value of φ is 0° to 360°, and the value of θ is all accumulated from 0° to 90°, and the opposite side of the LED 101 is also calculated, and the two are combined. value.

可藉由得知此光量而檢查出其LED101是否適用於各種使用方式。By knowing the amount of light, it is possible to check whether or not the LED 101 is suitable for various modes of use.

從LED101發射的光強度的值,依據不同的θ及φ而不同。為了以視覺方式表現光強度,使用如圖1(b)的圖進行說明。The value of the light intensity emitted from the LED 101 differs depending on the different θ and φ. In order to visually express the light intensity, it is explained using the figure of FIG. 1(b).

在圖1(b)中,X軸與Y軸的交點部份以θ=0°表示。圓上的各點分別表示θ=90°的每個φ的位置。In Fig. 1(b), the intersection of the X-axis and the Y-axis is represented by θ = 0°. Each point on the circle represents the position of each φ of θ = 90°.

圖1的(c)為φ值在固定位置的剖面圖。(c) of Fig. 1 is a cross-sectional view showing a value of φ at a fixed position.

在此,在距離LED101相同距離、且位於與發光中心軸LCA所夾的角度θ的位置上,將光強度定義為發光強度E(θ)。此發光強度E(θ)對應每個θ之發光強度分布如圖所示。Here, the light intensity is defined as the light emission intensity E(θ) at the same distance from the LED 101 and at an angle θ with respect to the light emission center axis LCA. This luminous intensity E(θ) corresponds to the luminous intensity distribution of each θ as shown.

此外,在圖1的說明中,假設在距離LED101夠遠的位置進行測 定,則LED101可被視為是一個點。LED101與一般的光檢測器105等(參照圖3)相比極為渺小,因此這樣的假設是可以成立的。於圖2之後的說明中若無特別記載,皆為相同。Further, in the description of FIG. 1, it is assumed that the measurement is performed far enough from the LED 101. The LED 101 can be regarded as a point. The LED 101 is extremely small compared to the general photodetector 105 (see FIG. 3), and thus such an assumption can be established. Unless otherwise stated in the description of FIG. 2 and subsequent steps, the same is true.

圖2係為使用本發明一實施形態之光量測定裝置3所測定的發光二極體101的發光強度分布之說明圖。FIG. 2 is an explanatory diagram of the luminous intensity distribution of the light-emitting diode 101 measured by the light amount measuring device 3 according to the embodiment of the present invention.

圖2(a)與圖1(c)為相同的圖。Fig. 2(a) is the same as Fig. 1(c).

如圖2(a)所示,發光強度E為從LED101的距離r在固定位置、固定的φ角度之每個θ中的光強度。As shown in Fig. 2(a), the luminous intensity E is the light intensity in each of θ of the fixed angle φ angle from the distance r of the LED 101 at a fixed position.

通常,LED101因其種類及製造誤差等造成每個LED101具有不同的發光強度。其不同的LED101可能存在如圖2(b)的cos型LED101,以及如圖2(c)的環型LED101。Generally, each of the LEDs 101 has a different luminous intensity due to its kind and manufacturing error. The different LEDs 101 may have a cos type LED 101 as shown in Fig. 2(b), and a ring type LED 101 as shown in Fig. 2(c).

cos型及環型的LED101僅為一例,並非限定具有此兩種特性的LED101為測定對象。當然,一般LED101大多具有在θ=0°具有波峰強度的cos型以及在θ=30°具有波峰強度的環型之間的特性。即,作為檢查對象的一般LED101,大部分是在θ為0°到30°的範圍內具有波峰強度。The cos-type and ring-shaped LED 101 is only an example, and the LED 101 having these two characteristics is not limited to the measurement target. Of course, in general, the LEDs 101 generally have a characteristic of a cos type having a peak intensity at θ = 0° and a ring type having a peak intensity at θ = 30°. That is, most of the general LEDs 101 to be inspected have peak intensities in a range of θ of 0° to 30°.

一旦知道發光強度分布,即可進行接下來的步驟以求出LED101的光量。Once the luminous intensity distribution is known, the next step can be performed to find the amount of light of the LED 101.

即,以發光中心軸LCA周圍的圓周對發光強度E(θ)作積分(φ=0°至=360°為止作積分),求出周發光強度L(θ)。周發光強度L(θ)以L(θ)=E(θ).2πγ.sinθ表示。將該此周發光強度L(θ)的θ=0°至θ°為止作積分,可求出發光面101a側的光量S(θ)。In other words, the luminous intensity E(θ) is integrated by the circumference around the central axis of the light emission LCA (integrated from φ=0° to =360°), and the circumferential luminous intensity L(θ) is obtained. The luminous intensity L(θ) is L(θ)=E(θ). 2πγ. Sin θ is expressed. By integrating θ=0° to θ° of the circumferential light emission intensity L(θ), the amount of light S(θ) on the light-emitting surface 101a side can be obtained.

此外,將S(θ)乘上固定係數α,可算出LED101背面側(發光面101a的相反側)的光量。Further, by multiplying S(θ) by the fixed coefficient α, the amount of light on the back side of the LED 101 (opposite side of the light-emitting surface 101a) can be calculated.

接著,將發光面101a側的光量S(θ)加上背面側的光量(S(θ).α),可算出LED101的光量。Next, the amount of light of the LED 101 can be calculated by adding the amount of light S(θ) on the light-emitting surface 101a side to the amount of light on the back side (S(θ).α).

另外,可知以同一製程製造的LED101,其發光面101a側的光量與背面側的光量之差為大致固定。因此,只要實際測量一個LED101求出係數α之後,其他的LED101也可適用此相同值。In addition, it is understood that the difference between the amount of light on the light-emitting surface 101a side and the amount of light on the back surface side of the LED 101 manufactured by the same process is substantially constant. Therefore, as long as one LED 101 is actually measured to obtain the coefficient α, the same value can be applied to the other LEDs 101.

<光量測定裝置><Light quantity measuring device>

以下利用圖3及圖4,說明光量測定裝置3之構造。The structure of the light amount measuring device 3 will be described below with reference to Figs. 3 and 4 .

圖3係為本發明一實施形態之光量測定裝置3的受光模組1之說明圖。3 is an explanatory view of the light receiving module 1 of the light amount measuring device 3 according to the embodiment of the present invention.

圖4係為本發明一實施形態之光量測定裝置3之說明圖。Fig. 4 is an explanatory view showing a light amount measuring device 3 according to an embodiment of the present invention.

光量測定裝置3為可同時測定LED101的發光光量及波長之裝置。The light amount measuring device 3 is a device that can simultaneously measure the amount of light emitted by the LED 101 and the wavelength.

光量測定裝置3至少具備載置桌103、探針109、受光模組1、電氣特性計測部125、演算部151及輸出部163。The light amount measuring device 3 includes at least a mounting table 103, a probe 109, a light receiving module 1, an electrical property measuring unit 125, an arithmetic unit 151, and an output unit 163.

載置桌103為載置檢查對象LED101的測定樣品台。The mounting table 103 is a measurement sample stage on which the inspection target LED 101 is placed.

載置桌103具有大致均勻的平板狀,設置為大致水平。The placing table 103 has a substantially uniform flat shape and is provided to be substantially horizontal.

載置桌103與其所載置的LED101為彼此大致平行。The mounting table 103 and the LEDs 101 mounted thereon are substantially parallel to each other.

載置桌103至少具有玻璃桌103a與切割片103b。The mounting table 103 has at least a glass table 103a and a dicing sheet 103b.

玻璃桌103a使用藍寶石及玻璃等的光穿透材料,形成大致均勻的平板狀。The glass table 103a uses a light-transmitting material such as sapphire or glass to form a substantially uniform flat plate shape.

切割片103b的表面具有黏著性,層積在玻璃桌103a上。LED101載置於此該切割片103b上。The surface of the dicing sheet 103b has adhesiveness and is laminated on the glass table 103a. The LED 101 is placed on the dicing sheet 103b.

具有切割片103b的載置桌103可在測定時將LED101輕易地移載至載置桌103,且抑制其移位。The mounting table 103 having the dicing sheet 103b can easily transfer the LED 101 to the mounting table 103 at the time of measurement, and suppress the displacement thereof.

此外,如同利用圖5後述之在切割片11上排列有多個LED101時,可代替切割片103b,將切割片11整個一起移載至玻璃桌103a上。Further, as in the case where a plurality of LEDs 101 are arranged on the dicing sheet 11 as will be described later with reference to Fig. 5, the dicing sheets 11b can be entirely transferred to the glass table 103a instead of the dicing sheet 103b.

探針109供給電力至LED101,以使LED101發光。探針109與LED101的發光面101a大致平行,沿與LED101的法線呈直角的方向放射狀延伸。The probe 109 supplies power to the LED 101 to cause the LED 101 to emit light. The probe 109 is substantially parallel to the light-emitting surface 101a of the LED 101, and radially extends in a direction perpendicular to the normal line of the LED 101.

圖3的探針109在測定LED101的光學特性(光量、波長)時,接觸LED101的電極並施加電壓。此外,探針109與利用圖4後述之光量測定裝置3的電氣特性計測部125連接,可同時測定LED101的電氣特性。The probe 109 of FIG. 3 contacts the electrode of the LED 101 and applies a voltage when measuring the optical characteristics (light amount, wavelength) of the LED 101. Further, the probe 109 is connected to the electrical characteristic measuring unit 125 of the light amount measuring device 3 which will be described later with reference to Fig. 4, and the electrical characteristics of the LED 101 can be simultaneously measured.

使探針109接觸LED101時,可在載置桌103及LED101為固定狀態下移動探針109。相反的,也可以在探針109為固定的狀態下,移動載置桌103及LED101。When the probe 109 is brought into contact with the LED 101, the probe 109 can be moved while the mounting table 103 and the LED 101 are in a fixed state. Conversely, the table 103 and the LED 101 may be moved while the probe 109 is stationary.

受光模組1接收由LED101所發射的光,具有將接收到的光轉換為電子訊號的功能。The light receiving module 1 receives the light emitted by the LED 101 and has a function of converting the received light into an electronic signal.

受光模組1與LED101相向配置,與發光面101a大致平行。The light receiving module 1 is disposed to face the LED 101 and is substantially parallel to the light emitting surface 101a.

如圖3所示,受光模組1至少具備光檢測器105、保持部107、訊號線111、放大器113以及通訊線115。As shown in FIG. 3, the light receiving module 1 includes at least a photodetector 105, a holding portion 107, a signal line 111, an amplifier 113, and a communication line 115.

保持部107為其內部保持有光檢測器105等的殼體。保持部107隔空配置在與載置桌103相對的位置上。The holding portion 107 holds a housing such as the photodetector 105 therein. The holding portion 107 is disposed at a position facing the mounting table 103 in a space.

保持部107與載置桌103、載置於載置桌103上之LED101以及光檢測器105大致平行地配置。The holding portion 107 is disposed substantially in parallel with the mounting table 103, the LEDs 101 placed on the mounting table 103, and the photodetector 105.

保持部107在維持此大致平行的配置關係的狀態下,可朝上下方向移動。藉由此保持部107的移動,光檢測器105與LED101之間可接近或遠離,以變更θ的大小。不一定是保持部107移動,也可以是載置桌103移動。The holding portion 107 is movable in the vertical direction while maintaining the substantially parallel arrangement relationship. By the movement of the holding portion 107, the photodetector 105 and the LED 101 can be moved closer to or away from each other to change the magnitude of θ. It is not always necessary that the holding portion 107 moves, or the placing table 103 may move.

此外,如圖3所示,在本實施形態中,從LED101發射之放射狀的光之中,將使受光模組1接收的光範圍(以下稱之為「受光範圍」),以相對於從LED101發射的光之發光中心軸LCA的角度θ表示。與受光範圍相關的φ是以0°≦φ≦360°為前提。Further, as shown in FIG. 3, in the present embodiment, among the radial light emitted from the LED 101, the range of light received by the light receiving module 1 (hereinafter referred to as "light receiving range") is relatively The angle θ of the central axis of illumination LCA of the light emitted by the LED 101 is indicated. The φ associated with the light receiving range is based on 0° ≦ φ ≦ 360 °.

例如,當圖3的θ為θ=50°時,表示光量測定裝置3使受光模組1接收從LED101發射的光之中θ=50°為止的光。也就是說,受光模組1的 受光範圍為0°≦θ≦50°的範圍。此外,θ的值為規定受光範圍的邊界角度的最大值,在本實施形態中亦稱為「受光角度」。For example, when θ of FIG. 3 is θ=50°, the light amount measuring device 3 causes the light receiving module 1 to receive light of θ=50° among the light emitted from the LED 101. That is, the light receiving module 1 The light receiving range is in the range of 0° ≦ θ ≦ 50°. Further, the value of θ is the maximum value of the boundary angle of the predetermined light receiving range, and is also referred to as "light receiving angle" in the present embodiment.

保持部107至少具備遮蔽部107a、側面部107b及圓形開口部107c。The holding portion 107 includes at least a shielding portion 107a, a side surface portion 107b, and a circular opening portion 107c.

側面部107b具有在θ=0°的方向延伸之略圓筒狀。The side surface portion 107b has a substantially cylindrical shape extending in the direction of θ = 0°.

遮蔽部107a及側面部107b的中心在θ=0°的方向,與LED101的發光面101a的發光中心軸LCA大致相同。The center of the shielding portion 107a and the side surface portion 107b is substantially the same as the emission central axis LCA of the light-emitting surface 101a of the LED 101 in the direction of θ = 0°.

在側面部107b的內周面所形成之中空空間中,配置有光檢測器105。A photodetector 105 is disposed in a hollow space formed by the inner peripheral surface of the side surface portion 107b.

於遮蔽部107a的中心部形成有形成圓柱狀中空部之圓形開口部107c。A circular opening portion 107c that forms a cylindrical hollow portion is formed in a central portion of the shielding portion 107a.

藉此圓形開口部107c,光檢測器105可接收從LED101發射的光。Thereby, the light detector 105 can receive the light emitted from the LED 101 by the circular opening portion 107c.

光檢測器105接收從LED101發射的光。光檢測器105根據將接收到的所有光之強度累計後的量,產生類比訊號。光檢測器105經由訊號線111將產生的類比訊號輸出至放大器113。此類比訊號相當於接收到的光之光量訊息。光檢測器105也可由接收到的光之每個θ的強度,測定出發光強度分布。The photodetector 105 receives the light emitted from the LED 101. The photodetector 105 generates an analog signal based on the amount of the received light intensity. The photodetector 105 outputs the generated analog signal to the amplifier 113 via the signal line 111. This type of ratio signal is equivalent to the amount of light received. The photodetector 105 can also measure the luminous intensity distribution from the intensity of each θ of the received light.

放大器113對從光檢測器105輸出的類比訊號進行放大及AD轉換,轉換為演算部151能檢測出的電壓值。放大器113經由通訊線115將轉換之後以電壓值表示的數位訊號輸出至演算部151。The amplifier 113 amplifies and AD converts the analog signal output from the photodetector 105, and converts it into a voltage value detectable by the calculation unit 151. The amplifier 113 outputs a digital signal represented by a voltage value after the conversion to the calculation unit 151 via the communication line 115.

此外,如圖4所示,受光模組1具有波長測定部120。Further, as shown in FIG. 4, the light receiving module 1 has a wavelength measuring unit 120.

此波長測定部120至少具有導光部117、光纖119及分光器121。The wavelength measuring unit 120 includes at least a light guiding unit 117, an optical fiber 119, and a spectroscope 121.

導光部117具有一入射面117a,其接收從LED101發射的光,光入射至導光部117的內部。從入射面117a入射的光被導光為與導光部117的長度方向大致平行。The light guiding portion 117 has an incident surface 117a that receives light emitted from the LED 101, and the light is incident on the inside of the light guiding portion 117. The light incident from the incident surface 117a is guided to be substantially parallel to the longitudinal direction of the light guiding portion 117.

導光部117配置在光檢測器105所接收的光的最外圍線K上。導光 部117與測定對象之LED101保持等距離。此外,導光部117保持為可向θ及φ的角度方向轉動。總之,導光部117保持在不影響光檢測器105受光的位置上。The light guiding portion 117 is disposed on the outermost peripheral line K of the light received by the photodetector 105. Light guide The portion 117 is equidistant from the LED 101 to be measured. Further, the light guiding portion 117 is held to be rotatable in the angular direction of θ and φ. In summary, the light guiding portion 117 is maintained at a position that does not affect the light receiving by the photodetector 105.

導光部117經由光纖119將入射至入射面117a的光導光至分光器121。The light guiding portion 117 guides the light incident on the incident surface 117a to the spectroscope 121 via the optical fiber 119.

分光器121測定由導光部117導光的光之波長及強度(包含發光強度),輸出至演算部151。The spectroscope 121 measures the wavelength and intensity (including the luminescence intensity) of the light guided by the light guiding unit 117, and outputs it to the calculation unit 151.

受光模組1除了光檢測器105之外,還具有波長測定部120。具有受光模組1的光量測定裝置3,能夠同時測定到預定角度為止的光量以及在預定角度上的波長。因此,光量測定裝置3可連續且高速地進行對LED101的各項測定。The light receiving module 1 has a wavelength measuring unit 120 in addition to the photodetector 105. The light amount measuring device 3 including the light receiving module 1 can simultaneously measure the amount of light up to a predetermined angle and the wavelength at a predetermined angle. Therefore, the light amount measuring device 3 can perform measurement of each of the LEDs 101 continuously and at high speed.

電氣特性計測部125至少具備定位單元159、HV單元153、ESD單元155及切換單元157。The electrical characteristic measurement unit 125 includes at least a positioning unit 159, an HV unit 153, an ESD unit 155, and a switching unit 157.

定位單元159定位且固定探針109。具體而言,在載置桌103移動的形式下,定位單元159具有將探針109的頂端位置保持在固定位置的功能。相反的,在探針109移動的形式下,定位單元159具有將探針109的頂端位置移動至載置有LED101的載置桌103上之預定位置,並且保持在該位置的功能。The positioning unit 159 positions and fixes the probe 109. Specifically, in the form in which the placement table 103 moves, the positioning unit 159 has a function of holding the tip end position of the probe 109 at a fixed position. Conversely, in the form in which the probe 109 is moved, the positioning unit 159 has a function of moving the tip end position of the probe 109 to a predetermined position on the mounting table 103 on which the LED 101 is placed, and holding the position.

HV單元153具有施加額定電壓、並且檢測出對該額定電壓之LED101的各種電氣特性的作用。The HV unit 153 has a function of applying a rated voltage and detecting various electrical characteristics of the LED 101 of the rated voltage.

通常,在由該HV單元153的電壓施加狀態下,LED101發出的光是由光檢測器105進行測定。Generally, in the voltage application state by the HV unit 153, the light emitted from the LED 101 is measured by the photodetector 105.

HV單元153檢測出的各種特性訊息將輸出至演算部151。The various characteristic messages detected by the HV unit 153 are output to the calculation unit 151.

ESD單元155為進行對LED101施加瞬間大電壓造成靜電放電並檢查其是否遭受靜電破壞等的單元。The ESD unit 155 is a unit that performs electrostatic discharge by applying an instantaneous large voltage to the LED 101 and checks whether it is subjected to electrostatic breakdown or the like.

ESD單元155檢測出的靜電破壞訊息將輸出至演算部151。The electrostatic destruction message detected by the ESD unit 155 is output to the calculation unit 151.

切換單元157進行HV單元153與ESD單元155的切換。The switching unit 157 performs switching of the HV unit 153 and the ESD unit 155.

藉由切替單元157變更通過探針109印加至LED101的電壓。接著,藉由此變更,LED101的檢查項目可分別變更為檢測在額定電壓下的各種特性,或是檢測其是否遭到靜電破壞。The voltage applied to the LED 101 by the probe 109 is changed by the switching unit 157. Then, by this change, the inspection items of the LED 101 can be changed to detect various characteristics at the rated voltage or to detect whether they are damaged by static electricity.

演算部151接收由放大器113輸出的受光光量及發光強度的訊息、從分光器121的光波長及發光強度的訊息、HV單元153所檢測出的各種電氣特性訊息、ESD單元155所檢測出的靜電破壞訊息等的輸入。The calculation unit 151 receives the information of the amount of received light and the intensity of the light emitted from the amplifier 113, the information of the wavelength of the light and the intensity of the light emitted from the spectroscope 121, various electrical characteristic information detected by the HV unit 153, and the static electricity detected by the ESD unit 155. Destroy the input of messages, etc.

演算部151根據該些輸入進行LED101的各種特性的分級及分析。分析出各種特性後,演算部151根據需要,將其分析結果由輸出部163進行影像輸出、訊息輸出等。The calculation unit 151 performs classification and analysis of various characteristics of the LED 101 based on the inputs. After analyzing various characteristics, the calculation unit 151 performs image output, message output, and the like from the analysis unit 163 as needed.

<發光二極體的排列形態><Arrangement pattern of light-emitting diodes>

以下,利用圖5說明光量測定裝置3所測定的LED101的排列形態。Hereinafter, an arrangement form of the LEDs 101 measured by the light amount measuring device 3 will be described with reference to Fig. 5 .

圖5係為本發明一實施形態之光量測定裝置3測定之LED101的排列形態之說明圖。Fig. 5 is an explanatory view showing an arrangement of LEDs 101 measured by the light amount measuring device 3 according to the embodiment of the present invention.

在LED的製程中,具有將如圖5(a)所示的半導體晶圓10切割成個片之LED晶片的切割步驟。In the process of the LED, there is a cutting step of the LED wafer in which the semiconductor wafer 10 shown in FIG. 5(a) is cut into pieces.

半導體晶圓10貼附在具有黏著性的切割片11上。切割片11藉由晶片環12保持其形狀。The semiconductor wafer 10 is attached to the adhesive sheet 11 having adhesiveness. The dicing sheet 11 retains its shape by the wafer ring 12.

LED101經過此切割工程而成為晶片。切割後的晶圓狀的多個LED101被排列於切割片11上。The LED 101 becomes a wafer through this cutting process. The diced plurality of wafer-shaped LEDs 101 are arranged on the dicing sheet 11.

切割步驟之後,使用晶圓擴展裝置擴展用以區劃晶圓狀LED101之界道的寬度,進行伴隨光量測定之檢查步驟。此外,伴隨光量測定的檢查步驟,也可以在切割步驟之後,將LED101由切割片11移載至玻璃桌103a上的切割片103b時,使界道的寬度擴展的狀況下進行。After the dicing step, the width of the boundary of the wafer-shaped LED 101 is expanded by using a wafer expanding device, and an inspection step accompanying the measurement of the amount of light is performed. Further, the inspection step of the light amount measurement may be performed while the LED 101 is transferred from the dicing sheet 11 to the dicing sheet 103b on the glass table 103a after the dicing step, and the width of the boundary is expanded.

圖5(b)為界道的寬度已擴展之晶圓狀的LED101的一部分之示意 圖。Figure 5(b) is a schematic illustration of a portion of a wafer-like LED 101 whose width has been expanded Figure.

將圖5(b)的列方向(左右方向)的界道寬度當作d1,行方向(上下方向)的界道寬度當作d2。LED101彼此之間的間隔依界道寬度d1與d2的大小而改變。The boundary width in the column direction (left-right direction) of FIG. 5(b) is taken as d1, and the boundary width in the row direction (up-and-down direction) is taken as d2. The interval between the LEDs 101 varies depending on the widths of the boundary widths d1 and d2.

如圖5(b)所示,晶圓狀的LED101之中,將其四周全都由相鄰的LED所包圍的LED101當作LED101b。此外,晶圓狀的LED101之中,將其四周並未全由相鄰的LED所包圍,而是位於角落位置的LED101當作LED101c。As shown in FIG. 5(b), among the wafer-shaped LEDs 101, the LEDs 101 surrounded by the adjacent LEDs are regarded as the LEDs 101b. Further, among the wafer-shaped LEDs 101, the LEDs 101 located at the corner positions are not surrounded by the adjacent LEDs, and the LEDs 101 are regarded as the LEDs 101c.

如晶圓狀的LED101一般,在排列有多個LED101的狀態下進行光量測定時,在θ為90°附近,會被與測定對象之LED101相鄰的LED遮住從LED101發射的光。被相鄰LED遮住光的LED101,隨著θ接近90°,其發光強度將會降低。In the case of the wafer-shaped LED 101, when the amount of light is measured in a state in which a plurality of LEDs 101 are arranged, the LEDs adjacent to the LEDs 101 to be measured are shielded from the light emitted from the LEDs 101 when θ is around 90°. The LED 101 that is blocked by the adjacent LEDs will have a lower luminous intensity as θ approaches 90°.

另一方面,在LED101為個片的狀態下進行光量測定,對來自相鄰的LED的發光強度分布不產生影響,最為理想。但是,在LED的檢查步驟中,將所有的LED101作為個片抽出以進行測定,則伴隨此繁雜作業會導致工時增加,因此並不現實。On the other hand, it is most preferable to measure the amount of light in a state in which the LEDs 101 are in a single piece, and to have no influence on the emission intensity distribution from the adjacent LEDs. However, in the LED inspection step, all of the LEDs 101 are taken out as a single piece for measurement, and this complicated operation causes an increase in man-hours, which is not realistic.

因此,光量測定裝置3必須能夠在排列有多個LED101的狀態下,盡可能排除因存在有相鄰的LED而對發光強度分布的影響,以進行光量的測定。Therefore, in the state in which the plurality of LEDs 101 are arranged, the light amount measuring device 3 must be able to eliminate the influence of the adjacent LEDs on the emission intensity distribution as much as possible to measure the amount of light.

<光量測定結果><Light measurement result>

接著利用圖6至圖9,說明上述構成之光量測定裝置3之光量測定結果。Next, the light amount measurement result of the light amount measuring device 3 having the above configuration will be described with reference to Figs. 6 to 9 .

首先,利用圖6及圖7進行說明在排列有多個LED101的狀態下測定之影響。First, the influence of measurement in a state in which a plurality of LEDs 101 are arranged will be described with reference to FIGS. 6 and 7.

圖6係顯示使用本發明一實施形態之光量測定裝置3所測定之LED101的各種排列形態之光量測定結果圖。Fig. 6 is a view showing the results of measurement of the light amount in various arrangements of the LEDs 101 measured by the light amount measuring device 3 according to the embodiment of the present invention.

圖7係為使用本發明一實施形態之光量測定裝置3所測定之LED101的排列形態對光量的影響之說明圖。Fig. 7 is an explanatory view showing the influence of the arrangement pattern of the LEDs 101 measured by the light amount measuring device 3 according to the embodiment of the present invention on the amount of light.

圖6(a)為表示受光模組1的受光範圍與光量之間的關係之圖形。Fig. 6(a) is a graph showing the relationship between the light receiving range and the amount of light of the light receiving module 1.

圖6(a)的橫軸將受光模組1的受光範圍以受光角度θ表示。圖6(a)的縱軸表示受光模組1的受光光量占LED101的全光量之百分比。The horizontal axis of Fig. 6(a) indicates that the light receiving range of the light receiving module 1 is represented by the light receiving angle θ. The vertical axis of Fig. 6(a) indicates the percentage of the amount of light received by the light receiving module 1 as the total amount of light of the LED 101.

測定條件1~5依LED101的排列形態而不同。測定條件1~5的詳細內容如表1所示。除此之外的測定條件全都相同。The measurement conditions 1 to 5 differ depending on the arrangement of the LEDs 101. The details of the measurement conditions 1 to 5 are shown in Table 1. The measurement conditions other than this are all the same.

條件1為比較例,為沒有相鄰LED之個片LED101。條件1沒有來自相鄰LED對發光強度分布的影響,為理想的測定條件。Condition 1 is a comparative example and is a sheet LED 101 having no adjacent LEDs. Condition 1 does not have an influence on the distribution of luminous intensity from adjacent LEDs, and is an ideal measurement condition.

條件2如圖5(b)所示,是在晶圓狀的LED101之中位於角落位置的LED101c。界道的寬度為d1=30μm、d2=30μm。As shown in FIG. 5(b), the condition 2 is an LED 101c located at a corner position among the wafer-shaped LEDs 101. The width of the boundary is d1 = 30 μm and d2 = 30 μm.

條件3如圖5(b)所示,是在晶圓狀的LED101之中位於中央位置的LED101b。界道的寬度為d1=150μm、d2=150μm。As shown in FIG. 5(b), the condition 3 is an LED 101b located at a central position among the wafer-shaped LEDs 101. The width of the boundary is d1 = 150 μm and d2 = 150 μm.

條件4如圖5(b)所示,是在晶圓狀的LED101之中位於中央位置的LED101b。界道的寬度為d1=100μm、d2=50μm。As shown in FIG. 5(b), the condition 4 is an LED 101b located at a central position among the wafer-shaped LEDs 101. The width of the boundary is d1 = 100 μm and d2 = 50 μm.

條件5如圖5(b)所示,是在晶圓狀的LED101之中位於中央位置的LED101b。界道的寬度為d1=30μm、d2=30μm。As shown in FIG. 5(b), the condition 5 is an LED 101b located at a central position among the wafer-shaped LEDs 101. The width of the boundary is d1 = 30 μm and d2 = 30 μm.

此測定條件1~5中,隨著條件1至條件5,其相鄰LED之間的間隔越來越窄。In the measurement conditions 1 to 5, with the conditions 1 to 5, the interval between adjacent LEDs becomes narrower and narrower.

圖6(a)的圖形表示LED101的各種排列形態之不同的變化曲線。The graph of Fig. 6(a) shows a different curve of the various arrangements of the LEDs 101.

受光角度θ在θ=75°為止的區域中,條件1的光量之變化曲線為最低。接著,條件2、條件3、條件4的變化曲線由低到高。而條件5的光量之變化曲線為最高。In the region where the light receiving angle θ is in the range of θ=75°, the curve of the light amount of the condition 1 is the lowest. Next, the curves of Condition 2, Condition 3, and Condition 4 are from low to high. The curve of the amount of light of Condition 5 is the highest.

即,可知受光角度θ在θ=75°為止的區域中,隨著與相鄰LED之間的間隔越窄,光量之變化曲線越高。In other words, it can be seen that in the region where the light receiving angle θ is in the range of θ=75°, the curve of the amount of light increases as the interval between the adjacent LEDs becomes narrower.

這是因為如圖7(a)所示,與相鄰LED的間隔越窄,則在未直接到達光檢測器105的角度成分的光之中,被相鄰LED反射而到達光檢測器105的角度成分θa的光越多。This is because, as shown in FIG. 7(a), the narrower the interval from the adjacent LEDs, the light that is not directly reaching the angular component of the photodetector 105 is reflected by the adjacent LEDs and reaches the photodetector 105. The more light of the angle component θa.

受光角度θ在大於θ=75°的區域中,相反的,條件1的光量之變化曲線為最高。接著,條件2、條件3、條件4的變化曲線由高到低。而條件5的光量之變化曲線為最低。The light receiving angle θ is in a region larger than θ=75°, and conversely, the curve of the light amount of the condition 1 is the highest. Next, the curves of Condition 2, Condition 3, and Condition 4 are high to low. The curve of the amount of light of Condition 5 is the lowest.

即,可知受光角度θ在大於θ=75°的區域中,隨著與相鄰LED之間的間隔越窄,光量之變化曲線越低。That is, it can be seen that in the region where the light receiving angle θ is larger than θ=75°, as the interval from the adjacent LED is narrower, the curve of the amount of light is lower.

這是因為如圖7(b)所示,與相鄰LED的間隔越窄,則在到達光檢測器105的角度成分的光之中,被相鄰LED遮蔽的角度成分θb的光越多。This is because, as shown in FIG. 7(b), the narrower the interval from the adjacent LEDs, the more the light of the angular component θb blocked by the adjacent LEDs among the light reaching the angular component of the photodetector 105.

接著,可知在受光角度θ在θ=75°附近,條件1~條件5的變化曲線全都在一點附近交會(圖6(a)的點P)。Next, it is understood that the change curves of the conditions 1 to 5 are all in the vicinity of the light receiving angle θ in the vicinity of θ=75° (point P in Fig. 6(a)).

意即,可知在受光角度θ在θ=75°附近,排列成晶圓狀的多個LED101,不論是處於哪個位置的LED101,全都具有大致相同的光量。此外,可知在受光角度θ在θ=75°附近,排列成晶圓狀的多個LED101,不管與相鄰LED之間的間隔多大,全都具有大致相同的光量。In other words, it can be seen that the plurality of LEDs 101 arranged in a wafer shape at a light receiving angle θ in the vicinity of θ=75° have substantially the same amount of light regardless of the position of the LEDs 101. Further, it is understood that the plurality of LEDs 101 arranged in a wafer shape in the vicinity of the light receiving angle θ at θ=75° have substantially the same amount of light regardless of the interval between the adjacent LEDs.

這是因為在受光角度θ在θ=75°附近,被相鄰LED反射且到達光檢 測器105的角度成分θa的光與被相鄰LED遮蔽的角度成分θb的光到達平衡的緣故。此角度成分θa的光與角度成分θb的光到達平衡,因此在受光角度θ在θ=75°附近,與沒有相鄰LED的個片狀態之下的光量大致相同。This is because the light receiving angle θ is in the vicinity of θ=75°, is reflected by the adjacent LED and reaches the optical inspection. The light of the angle component θa of the detector 105 and the light of the angle component θb blocked by the adjacent LEDs reach equilibrium. Since the light of the angle component θa and the light of the angle component θb reach equilibrium, the light receiving angle θ is approximately the same as the amount of light in the state of the slice without adjacent LEDs in the vicinity of θ=75°.

圖6(b)係顯示以圖6(a)的光量測定結果為基準,受光模組1的受光範圍與光量偏差之間關係之圖形。圖6(b)的測定條件與圖6(a)相同。Fig. 6(b) is a graph showing the relationship between the light receiving range of the light receiving module 1 and the light amount deviation based on the light amount measurement result of Fig. 6(a). The measurement conditions of Fig. 6(b) are the same as those of Fig. 6(a).

圖6(b)的橫軸將受光模組1的受光範圍以受光角度θ表示。圖6(b)的縱軸表示在個片狀態下測定之條件1與在多個排列狀態下測定之條件2~5之間的光量偏差δ。The horizontal axis of Fig. 6(b) indicates the light receiving range of the light receiving module 1 as the light receiving angle θ. The vertical axis of Fig. 6(b) shows the light amount deviation δ between the condition 1 measured in the individual sheet state and the conditions 2 to 5 measured in the plurality of array states.

在受光角度θ在θ=20°~30°附近顯示光量偏差δ之波峰。The peak of the light amount deviation δ is displayed in the vicinity of θ=20° to 30° at the light receiving angle θ.

可知在受光角度θ在θ=20°~30°附近,在多個排列狀態下之測定與個片狀態下之測定最為背離。It can be seen that the measurement in the plurality of array states is most deviated from the measurement in the individual sheet state when the light receiving angle θ is in the vicinity of θ=20° to 30°.

尤其,與相鄰LED的間隔越窄,光量偏差δ越大,與個片狀態下之測定背離也越大。這與在圖6(a)的說明相同,是因為接收到的光中的角度成分θa較多的緣故。In particular, the narrower the interval from the adjacent LEDs, the larger the light amount deviation δ, and the larger the deviation from the measurement in the patch state. This is the same as the description of FIG. 6(a) because the angle component θa in the received light is large.

受光角度θ在θ=20°~30°之後到θ=75°為止,隨著受光角度θ的增加,光量偏差δ減少。The light receiving angle θ decreases from θ=20° to 30° to θ=75° as the light receiving angle θ increases.

意即,可知受光角度θ在θ=20°~30°之後到θ=75°為止,藉由增加受光角度θ,可使多個排列狀態下之測定接近個片狀態下之測定。In other words, it can be seen that the measurement of the plurality of alignment states is close to the measurement of the sheet state by increasing the light receiving angle θ from θ=20° to 30° to θ=75°.

尤其,與相鄰LED之間的間隔越窄,隨著受光角度θ的增加,光量偏差δ急遽減少。因此,可知與相鄰LED之間的間隔越窄,增加受光角度θ的優點就越多。In particular, the narrower the interval between adjacent LEDs, the light amount deviation δ decreases sharply as the light receiving angle θ increases. Therefore, it can be seen that the narrower the interval between adjacent LEDs, the more the advantage of increasing the light receiving angle θ.

當受光角度θ在θ=65°~85°,條件2~5的光量偏差量δ皆在±6%以下。尤其,當受光角度θ在θ=75°附近,條件2~5的光量偏差量δ幾乎為0。When the light receiving angle θ is θ=65° to 85°, the light amount deviation amount δ of the conditions 2 to 5 is ±6% or less. In particular, when the light receiving angle θ is in the vicinity of θ=75°, the light amount deviation amount δ of the conditions 2 to 5 is almost zero.

意即,受光角度θ在θ=75°±10°時,排列成晶圓狀的多個 LED101,不論與相鄰LED之間的間隔或排列位置為何,與在個片狀態下之測定的背離都會變小。也就是說,可知將受光角度θ設定為在θ=75°±10°進行測定時,即使是多個排列狀態下之測定,也能夠重現與個片狀態下相同的測定。That is, when the light receiving angle θ is θ=75°±10°, a plurality of wafers are arranged. The LED 101, regardless of the spacing or arrangement position between adjacent LEDs, becomes smaller as measured in the slice state. In other words, it is understood that when the light receiving angle θ is measured at θ=75°±10°, even in the measurement in a plurality of array states, the same measurement as in the individual sheet state can be reproduced.

受光角度θ一旦超過θ=85°,相反的,條件5的光量偏差δ就會大於±6%。When the light receiving angle θ exceeds θ=85°, on the contrary, the light amount deviation δ of the condition 5 is greater than ±6%.

意即,一旦將受光角度θ設定為超過θ=85°,則與相鄰LED之間的間隔狹窄的LED101,其光量偏差會大於±6%。That is, once the light receiving angle θ is set to exceed θ=85°, the light amount deviation of the LED 101 having a narrow interval from the adjacent LEDs is greater than ±6%.

接下來,利用圖8說明LED101的不同種類對光量測定結果的影響。Next, the influence of different types of the LEDs 101 on the light quantity measurement results will be described using FIG.

圖8係顯示使用本發明一實施形態之光量測定裝置3所測定的各種種類的LED101之光量測定結果圖。Fig. 8 is a graph showing measurement results of light amounts of various types of LEDs 101 measured by the light amount measuring device 3 according to the embodiment of the present invention.

圖8(a)為顯示受光模組1的受光範圍與光量之間的關係之圖形。Fig. 8(a) is a graph showing the relationship between the light receiving range and the amount of light of the light receiving module 1.

圖8(b)是以圖8(a)的光量測定結果為基準,顯示受光模組1的受光範圍與光量偏差之間的關係之圖形。Fig. 8(b) is a graph showing the relationship between the light receiving range of the light receiving module 1 and the light amount deviation based on the light amount measurement result of Fig. 8(a).

在圖8中,以彼此相異之10種實際產品為對象,使用光量測定裝置3測定個片狀態的LED101。In FIG. 8, the LEDs 101 in the state of each piece are measured using the light quantity measuring apparatus 3 for 10 kinds of actual products which are different from each other.

表2顯示使用於圖8的測定中之彼此相異之10種實際產品的詳細內容。Table 2 shows the details of the 10 actual products which are different from each other used in the measurement of Fig. 8.

使用於圖8的測定中之LED101具有大致為長方體或立方體的形狀。表2中的W、D以及H分別表示LED101的寬度方向、深度方向以及高度方向之外形尺寸。The LED 101 used in the measurement of Fig. 8 has a substantially cuboid or cubic shape. W, D, and H in Table 2 indicate the outer dimensions of the LED 101 in the width direction, the depth direction, and the height direction, respectively.

將彼此相異之10種實際產品的受光角度θ=90°時的光量當作100%,篩選出在受光範圍的光量偏差最大的兩種類作為Max種類及Min種類,繪製在圖8(a)中。Max種類為表2中的種類9,而Min種類為表2中的種類2。The amount of light when the light receiving angle θ=90° of the 10 actual products that are different from each other is taken as 100%, and the two types with the largest deviation of the light amount in the light receiving range are selected as the Max type and the Min type, which are plotted in Fig. 8(a). in. The Max type is the category 9 in Table 2, and the Min type is the category 2 in Table 2.

而將Max種類與Min種類之間的光量偏差δ繪製於圖8(b)中。The light amount deviation δ between the Max type and the Min type is plotted in Fig. 8(b).

如圖8(b)所示,彼此相異之10種實際產品的光量偏差δ會隨著受光角度θ的增加而減少。As shown in Fig. 8(b), the light amount deviation δ of the ten actual products different from each other decreases as the light receiving angle θ increases.

顯示受光角度θ在θ=65°~85°的光量偏差δ小於5%。The light amount deviation δ indicating that the light receiving angle θ is θ=65° to 85° is less than 5%.

因此,可知由圖6的圖形導出θ=65°~85°之受光角度θ為可容許因LED101的種類不同所產生的光量偏差之受光角度θ。Therefore, it is understood that the light receiving angle θ of θ=65° to 85° is derived from the pattern of FIG. 6 as the light receiving angle θ at which the amount of light generated by the type of the LED 101 is different.

此外,雖未圖示,但是與圖6相同,在多個排列狀態下測定種類1~10,將其結果以受光角度θ表示時,在θ=75°附近,種類1~10各別的變化曲線也全會都在一點附近(參照圖6(a)的點P)交會。Further, although not shown, in the same manner as in FIG. 6, when the types 1 to 10 are measured in a plurality of array states, and the results are expressed by the light receiving angle θ, the types 1 to 10 are changed in the vicinity of θ=75°. The curve is also all around the point (refer to point P in Fig. 6(a)).

接下來,以LED101的排列形態之光量偏差以及種類之光量偏差為基準,針對以光量測定裝置3的光量測定之誤差推算的結果,利用圖9進行說明。Next, the result of estimating the error of the light amount measurement by the light amount measuring device 3 based on the light amount deviation of the arrangement pattern of the LEDs 101 and the variation of the light amount of the type will be described with reference to FIG. 9.

圖9係顯示本發明一實施形態之光量測定裝置3的光量推算誤差 圖。Fig. 9 is a view showing the light amount estimation error of the light amount measuring device 3 according to the embodiment of the present invention. Figure.

圖9的橫軸將受光模組1的受光範圍以受光角度θ表示。圖9的縱軸顯示光量推算誤差。The horizontal axis of FIG. 9 indicates that the light receiving range of the light receiving module 1 is represented by the light receiving angle θ. The vertical axis of Fig. 9 shows the light amount estimation error.

圖9的排列誤差顯示的是由圖6所示的排列形態之光量偏差δ推算的誤差。具體而言,圖9的排列誤差是將排列形態之光量偏差δ各分一半的值(|δ|/2)在±上來推算的。The arrangement error of Fig. 9 shows an error estimated from the light amount deviation δ of the arrangement form shown in Fig. 6. Specifically, the arrangement error of FIG. 9 is obtained by estimating the value (|δ|/2) which is half of the light amount deviation δ of the arrangement form by ±.

圖9的種類誤差顯示的是由如圖8所示的排列形態之光量偏差δ所推算的誤差。具體而言,圖9的種類誤差是將種類之光量偏差δ各分一半的值(|δ|/2)在±上來推算的。The type error of Fig. 9 shows an error estimated from the light amount deviation δ of the arrangement form as shown in Fig. 8. Specifically, the type error of FIG. 9 is obtained by estimating the value (|δ|/2) which is half of the light amount deviation δ of the type on ±.

圖9的排列+種類誤差是以排列誤差及種類誤差為基準所推算的光量測定裝置3的光量測定之誤差。具體而言,圖9的排列+種類誤差,是將排列誤差乘以2與將種類誤差乘以2之後相加,並算出其相加後的值的平方根來推算的。The arrangement + type error of FIG. 9 is an error of the light amount measurement by the light amount measuring device 3 estimated based on the arrangement error and the type error. Specifically, the arrangement + type error of FIG. 9 is obtained by multiplying the arrangement error by 2 and adding the type error by 2, and calculating the square root of the added value.

在受光角度θ在θ=20°~30°附近顯示排列+種類誤差之波峰。The peak of the arrangement + type error is displayed in the vicinity of θ=20° to 30° at the light receiving angle θ.

這顯示在θ=20°~30°附近的排列誤差具有波峰對於誤差有很大的影響。This shows that the alignment error around θ = 20° ~ 30° has a peak which has a large influence on the error.

受光角度θ在θ=20°~30°之後到θ=70°為止,排列+種類誤差隨著受光角度θ的增加而減少。The light receiving angle θ decreases from θ=20° to 30° to θ=70° as the light receiving angle θ increases.

意即,可知受光角度θ在θ=20°~30°之後到θ=70°為止,藉由增加受光角度θ,可使誤差減少。That is, it can be seen that the received light angle θ is reduced by θ=20° to 30° to θ=70° by increasing the light receiving angle θ.

當受光角度θ在θ=65°~85°附近,排列+種類誤差顯示小於±4%的值。When the light receiving angle θ is in the vicinity of θ=65° to 85°, the arrangement + type error shows a value smaller than ±4%.

意即,可知藉由將受光角度θ設定為θ=75°±10°,能將光量測定裝置3中光量測定之誤差抑制在小於±4%,可實現高精度的測定。In other words, it is understood that the error of the light amount measurement in the light amount measuring device 3 can be suppressed to less than ±4% by setting the light receiving angle θ to θ=75°±10°, and high-precision measurement can be realized.

一般而言,市場對於光量測定裝置的測定精度是要求抑制在誤差為±5%以下。本實施形態的光量測定裝置3,可藉由將受光角度θ設定為θ=75°±10°,得到滿足市場要求、小於±4%的測定精度。因此, 將受光角度θ設定為θ=75°±10°具備臨界性的意義。In general, the measurement accuracy of the light quantity measuring device is required to be suppressed to ±5% or less. The light amount measuring device 3 of the present embodiment can obtain a measurement accuracy that satisfies the market requirement and is less than ±4% by setting the light receiving angle θ to θ=75°±10°. therefore, Setting the light receiving angle θ to θ=75°±10° has a criticality.

尤其,當受光角度θ在θ=70°~80°附近,顯示排列+種類誤差的值小於±2%。此外,當受光角度θ在θ=70°~80°附近,顯示排列+種類誤差呈平坦的變化曲線。In particular, when the light receiving angle θ is in the vicinity of θ=70° to 80°, the value of the display arrangement + type error is less than ±2%. Further, when the light receiving angle θ is in the vicinity of θ=70° to 80°, the display + type error is flat.

因此,藉由將受光角度θ設定為θ=75°±5°,能將光量測定裝置3中光量測定之誤差抑制在小於±2%,並且,能使誤差保持固定。Therefore, by setting the light receiving angle θ to θ=75°±5°, the error in the light amount measurement in the light amount measuring device 3 can be suppressed to less than ±2%, and the error can be kept constant.

在實際的測定上,於調整受光角度θ時,受光模組1、載置桌103的位置或LED101的排列等可能會產生移位,很難每次都使受光角度θ與θ=75°完全一致。然而,本實施形態的光量測定裝置3可藉由將受光角度θ設定為θ=75°±5°,即使發生上述移位等使受光角度θ變動±5°,也可以將誤差保持在小於±2%的固定值。這是因為在受光角度θ為θ=75°±5°的範圍內,顯示誤差為小於±2%之平坦的變化曲線所致。換言之,光量測定裝置3可藉由將受光角度θ設定為θ=75°±5°,得到遠高於市場所要求的測定精度,並且可穩定地進行測定。因此,將受光角度θ設定為θ=75°±5°更加具備臨界性的意義。In the actual measurement, when the light receiving angle θ is adjusted, the position of the light receiving module 1 or the mounting table 103 or the arrangement of the LEDs 101 may be displaced, and it is difficult to completely complete the light receiving angle θ and θ=75° each time. Consistent. However, the light amount measuring device 3 of the present embodiment can set the light receiving angle θ to θ=75°±5°, and the error can be kept less than ± even if the light receiving angle θ is changed by ±5° by the above-described shift or the like. 2% fixed value. This is because the display error is a flat variation curve of less than ±2% in the range where the light receiving angle θ is θ=75°±5°. In other words, the light amount measuring device 3 can obtain measurement accuracy far higher than the market by setting the light receiving angle θ to θ=75°±5°, and can perform measurement stably. Therefore, setting the light receiving angle θ to θ=75°±5° is more critical.

受光角度θ一旦超過θ=80°,則排列+種類誤差會隨著受光角度θ的增加而增加。When the light receiving angle θ exceeds θ=80°, the arrangement + type error increases as the light receiving angle θ increases.

意即,可知受光角度θ一旦超過θ=80°,則不增加受光角度θ較能抑制誤差。That is, it can be seen that once the light receiving angle θ exceeds θ=80°, the error can be suppressed without increasing the light receiving angle θ.

尤其,當受光角度θ一旦超過θ=85°,則排列+種類誤差會大於±4%,因此,將受光角度θ設定在θ=85°以下較佳。In particular, when the light receiving angle θ exceeds θ=85°, the arrangement + type error is greater than ±4%. Therefore, it is preferable to set the light receiving angle θ to θ=85° or less.

如此一來,光量測定裝置3可藉由將受光角度θ設定在θ=75°±10°,不論LED101的排列形態為何,皆可將測定誤差抑制為小於±4%(在市場要求的±5%以下),實現以簡單的構造進行高精度的測定。In this way, the light quantity measuring device 3 can set the light receiving angle θ to θ=75°±10°, and suppress the measurement error to less than ±4% regardless of the arrangement pattern of the LED 101 (±5 required in the market) % or less), high-precision measurement with a simple structure is realized.

習知的光量測定裝置之誤差為±10%以上。因此,為了提高測定 精度,受光角度θ越接近θ=90°越佳。The error of the conventional light quantity measuring device is ±10% or more. Therefore, in order to improve the determination Accuracy, the closer the light receiving angle θ is to θ=90°.

然而,只是藉著將受光模組與LED之間的距離縮小,很難將受光角度設定為θ=90°附近。However, it is difficult to set the light receiving angle to be around θ=90° by narrowing the distance between the light receiving module and the LED.

因此,習知的光量測定裝置為了測定在受光角度θ接近θ=90°附近的光,會使用積分球或是使用至少在θ=90°以上的範圍環繞LED之反射器,以測定LED的光量。Therefore, in order to measure light having a light receiving angle θ close to θ=90°, a conventional light quantity measuring device uses an integrating sphere or a reflector that surrounds the LED at least in a range of θ=90° or more to measure the amount of light of the LED. .

使用積分球或上述的反射器進行測定時,必須在每次測定時將LED搬入積分球內,或是必須進行反射器的對位等,導致檢查步驟的工時增加等問題。何況在多個排列成晶圓狀的狀態下直接進行測定,更是難上加難。此外,如上述的反射器與LED接觸,會造成LED損傷或是打亂排列等問題。而且,誤差為±10%以上之測定精度也太低。When the measurement is performed using the integrating sphere or the above-described reflector, it is necessary to carry the LED into the integrating sphere at each measurement, or it is necessary to perform the alignment of the reflector, etc., resulting in an increase in the number of man-hours in the inspection step. Moreover, it is even more difficult to directly measure in a state in which a plurality of wafers are arranged in a row. In addition, if the reflector is in contact with the LED as described above, it may cause problems such as LED damage or disordered alignment. Moreover, the measurement accuracy with an error of ±10% or more is also too low.

相對於此,本實施形態之光量測定裝置3可藉由將受光角度θ設定為θ=75°±10°(更佳為設定成θ=75°±5°),無需使用積分球或反射器等,能夠直接測定多個排列之LED101,重現個片狀態下的測定。而且,光量測定裝置3不論排列成晶圓狀的多個LED101的排列位置及與相鄰LED之間的間隔,能夠將光量測定之誤差抑制到市場所要求的±5%以下。具體而言,即使加上種類誤差,仍可達到θ=75°±10°時誤差小於±4%、θ=75°±5°時誤差小於±2%。On the other hand, the light amount measuring device 3 of the present embodiment can set the light receiving angle θ to θ=75°±10° (more preferably, it is set to θ=75°±5°) without using an integrating sphere or reflector. Alternatively, a plurality of arrays of LEDs 101 can be directly measured to reproduce the measurement in a single chip state. Further, the light amount measuring device 3 can suppress the error in the measurement of the light amount to ±5% or less required by the market regardless of the arrangement position of the plurality of LEDs 101 arranged in a wafer shape and the interval between the adjacent LEDs. Specifically, even if a type error is added, the error can be less than ±4% when θ=75°±10° and less than ±2% when θ=75°±5°.

因此,光量測定裝置3藉由將受光角度θ設定為θ=75°±10°(更佳為設定成θ=75°±5°),能夠以簡單的構造穩定地對排列成晶圓狀的多個LED101的光量進行高精度的測定。再者,光量測定裝置3無需從晶圓狀的LED101中抽出個片以進行測定,能夠顯著地加速檢查步驟。Therefore, the light amount measuring device 3 can stably arrange the wafers in a simple configuration by setting the light receiving angle θ to θ=75°±10° (more preferably, θ=75°±5°). The light amount of the plurality of LEDs 101 is measured with high precision. Further, the light amount measuring device 3 does not need to extract a single piece from the wafer-shaped LED 101 for measurement, and can significantly accelerate the inspection step.

如圖3所示,探針109插入LED101與受光模組1之間。因此,從LED101發射的光之中直接照射到探針109的光,可能會被探針109反射而無法被受光模組1接收。由探針109的影響所造成的光量衰減量雖與探針109的構造有關,但基本上固定為15%以下。As shown in FIG. 3, the probe 109 is inserted between the LED 101 and the light receiving module 1. Therefore, light directly incident on the probe 109 from among the light emitted from the LED 101 may be reflected by the probe 109 and cannot be received by the light receiving module 1. The amount of attenuation of the amount of light caused by the influence of the probe 109 is substantially fixed to 15% or less depending on the configuration of the probe 109.

在上述圖6至圖9中說明的光量測定結果為加上由探針109的影響所造成的光量衰減量之結果,圖9的光量推算誤差顯示包括該影響之光量推算誤差。換言之,受光模組1的光檢測器105即使具有約15%無法受光的區域,只要此區域不隨著時間變化,就能夠實現光量推算誤差較小的測量。The result of the light amount measurement described above with reference to Figs. 6 to 9 is the result of adding the amount of light amount attenuation caused by the influence of the probe 109, and the light amount estimation error of Fig. 9 shows the light amount estimation error including the influence. In other words, even if the photodetector 105 of the light receiving module 1 has an area of about 15% that cannot be received by light, as long as the area does not change with time, measurement with a small amount of light estimation error can be realized.

本實施形態之受光模組1由一個光檢測器105構成,其受光面為圓形。然而,受光模組1也可由多個光檢測器105構成,而其該受光面也可為方形。The light receiving module 1 of the present embodiment is composed of one photodetector 105, and its light receiving surface is circular. However, the light receiving module 1 may also be composed of a plurality of photodetectors 105, and the light receiving surface may be square.

<受光範圍設定機構><light receiving range setting mechanism>

接下來,利用圖10至圖14,說明構成光量測定裝置3之受光範圍設定機構。Next, the light receiving range setting means constituting the light amount measuring device 3 will be described with reference to Figs. 10 to 14 .

圖10係為本發明一實施形態之光量測定裝置3的受光範圍設定機構的實施例1之說明圖。FIG. 10 is an explanatory diagram of the first embodiment of the light receiving range setting mechanism of the light amount measuring device 3 according to the embodiment of the present invention.

圖11係為本發明一實施形態之光量測定裝置3的受光範圍設定機構的實施例2之說明圖。Fig. 11 is an explanatory view showing a second embodiment of the light receiving range setting means of the light amount measuring device 3 according to the embodiment of the present invention.

圖12係為本發明一實施形態之光量測定裝置3的受光範圍設定機構的實施例3之說明圖。Fig. 12 is an explanatory view showing a third embodiment of the light receiving range setting means of the light amount measuring device 3 according to the embodiment of the present invention.

圖13係為本發明一實施形態之光量測定裝置3的受光範圍設定機構的實施例4之說明圖。Fig. 13 is an explanatory view showing a fourth embodiment of the light receiving range setting means of the light amount measuring device 3 according to the embodiment of the present invention.

圖14係為本發明一實施形態之光量測定裝置3的受光範圍設定機構的實施例5之說明圖。Fig. 14 is an explanatory view showing a fifth embodiment of the light receiving range setting means of the light amount measuring device 3 according to the embodiment of the present invention.

此外,於圖10至圖14中省略了探針109的圖示。另外,在圖10至圖14中,保持部107、載置桌103、LED101及光檢測器105彼此大致平行地配置。而在圖10至圖13中,示意地將受光範圍設定前的受光模組1的受光角度表示為θ1,將受光範圍設定後的受光模組1的受光角度表示為θ2。Further, the illustration of the probe 109 is omitted in FIGS. 10 to 14. In addition, in FIGS. 10 to 14, the holding portion 107, the mounting table 103, the LED 101, and the photodetector 105 are arranged substantially in parallel with each other. In FIGS. 10 to 13, the light receiving angle of the light receiving module 1 before the light receiving range is set is schematically indicated as θ1, and the light receiving angle of the light receiving module 1 after the light receiving range is set is represented as θ2.

光量測定裝置3根據受光角度θ設定受光模組1的受光範圍。受光範圍如上所述,為從LED101發射的光之中被受光模組1接收的光範圍。受光角度θ如上所述,為規定受光範圍的邊界之最大值。The light amount measuring device 3 sets the light receiving range of the light receiving module 1 based on the light receiving angle θ. The light receiving range is the range of light received by the light receiving module 1 among the light emitted from the LED 101 as described above. As described above, the light receiving angle θ is the maximum value of the boundary of the predetermined light receiving range.

如圖10所示,實施例1的光量測定裝置3之受光模組1直接接收從LED101發射的光。As shown in FIG. 10, the light receiving module 1 of the light amount measuring device 3 of the first embodiment directly receives the light emitted from the LED 101.

實施例1的光量測定裝置3具有使受光模組1往上下方向移動的移動機構。The light amount measuring device 3 of the first embodiment has a moving mechanism that moves the light receiving module 1 in the vertical direction.

移動機構可由安裝在保持部107上、未圖示之致動器所構成。移動機構使受光模組1沿著發光中心軸LCA移動。因此,受光模組1即使藉由移動機構移動,保持部107、載置桌103、LED101及光檢測器105也維持彼此大致平行的配置關係。The moving mechanism can be constituted by an actuator (not shown) attached to the holding portion 107. The moving mechanism moves the light receiving module 1 along the light emission center axis LCA. Therefore, even if the light receiving module 1 is moved by the moving mechanism, the holding portion 107, the mounting table 103, the LED 101, and the photodetector 105 maintain an arrangement relationship substantially parallel to each other.

一旦藉由移動機構使受光模組1移動,則光檢測器105與LED101之間的接近或遠離,將改變受光角度θ的大小。Once the light receiving module 1 is moved by the moving mechanism, the proximity or distance between the photodetector 105 and the LED 101 changes the magnitude of the received light angle θ.

實施例1的光量測定裝置3利用移動機構改變光檢測器105與LED101之間的距離,將受光角度θ調整為θ=75°±10°。意即,在實施例1的光量測定裝置3中,藉由利用移動機構將受光角度θ調整為θ=75°±10°,以設定受光模組1的受光範圍。The light amount measuring device 3 of the first embodiment changes the distance between the photodetector 105 and the LED 101 by the moving mechanism, and adjusts the light receiving angle θ to θ=75°±10°. In the light amount measuring device 3 of the first embodiment, the light receiving range of the light receiving module 1 is set by adjusting the light receiving angle θ to θ=75°±10° by the moving mechanism.

換言之,實施例1的光量測定裝置3利用移動機構,將受光範圍設定為0°≦θ≦75°±10°(0°≦θ≦65°至0°≦θ≦85°)。藉由此設定,受光模組1能夠接收到從LED101發射的光之中θ=75°±10°為止範圍(0°≦θ≦65°至0°≦θ≦85°的範圍)的光。In other words, the light amount measuring device 3 of the first embodiment sets the light receiving range to 0°≦θ≦75°±10° (0°≦θ≦65° to 0°≦θ≦85°) by the moving mechanism. By this setting, the light receiving module 1 can receive light having a range of θ=75°±10° (0°≦θ≦65° to 0°≦θ≦85°) from the light emitted from the LED 101.

在實施例1的光量測定裝置3中,上述移動機構作為受光範圍設定機構發揮作用。另外,移動機構可不移動受光模組1,而是移動載置有LED101的載置桌103,或是可移動該載置桌103及受光模組1雙方。In the light amount measuring device 3 of the first embodiment, the moving mechanism functions as a light receiving range setting means. Further, the moving mechanism can move the mounting table 103 on which the LED 101 is placed without moving the light receiving module 1, or can move both the mounting table 103 and the light receiving module 1.

如圖11所示,實施例2的光量測定裝置3之受光模組1直接接收從 LED101發射的光。As shown in FIG. 11, the light receiving module 1 of the light amount measuring device 3 of the second embodiment directly receives the light receiving module 1 Light emitted by LED 101.

實施例2的光量測定裝置3具有遮蔽從LED101發射的光之一部分的光圈124。The light amount measuring device 3 of Embodiment 2 has a diaphragm 124 that shields a portion of the light emitted from the LED 101.

光圈124改變保持部107的圓形開口部107c的開口大小。光圈124形成為以發光中心軸LCA為中心軸之略圓盤狀。The diaphragm 124 changes the opening size of the circular opening portion 107c of the holding portion 107. The aperture 124 is formed in a substantially disk shape with the central axis of illumination LCA as a central axis.

光圈124配置於受光模組1與LED101之間。光圈124與保持部107、載置桌103、LED101及光檢測器105大致平行地配置。另外,光圈124可與遮蔽部107a形成為一體。The aperture 124 is disposed between the light receiving module 1 and the LED 101. The diaphragm 124 is disposed substantially in parallel with the holding portion 107, the mounting table 103, the LED 101, and the photodetector 105. In addition, the diaphragm 124 may be formed integrally with the shielding portion 107a.

光圈124為了改變圓形開口部107c的開口大小,改變其在開口邊緣之徑向方向的位置。一旦改變光圈124的開口邊緣之徑向方向的位置,則連結該開口邊緣與LED101所成的直線相對於發光中心軸LCA的傾斜角度也會改變。光圈124的該傾斜角度規定可到達光檢測器105的光範圍。光圈124藉由改變開口邊緣的徑向方向的位置,可改變受光角度θ。The aperture 124 changes its position in the radial direction of the opening edge in order to change the opening size of the circular opening portion 107c. Once the position in the radial direction of the opening edge of the aperture 124 is changed, the inclination angle of the straight line connecting the opening edge with the LED 101 with respect to the illumination central axis LCA also changes. This angle of inclination of the aperture 124 defines the range of light that can reach the photodetector 105. The aperture 124 can change the light receiving angle θ by changing the position of the radial direction of the opening edge.

實施例2的光量測定裝置3使用光圈124,調整受光角度θ,使θ=75°±10°。意即在實施例2的光量測定裝置3中,利用光圈124將受光角度θ調整為θ=75°±10°,以設定受光模組1的受光範圍。The light amount measuring device 3 of the second embodiment adjusts the light receiving angle θ using the diaphragm 124 so that θ = 75 ° ± 10 °. In the light amount measuring device 3 of the second embodiment, the light receiving angle θ is adjusted to θ=75°±10° by the diaphragm 124 to set the light receiving range of the light receiving module 1.

換言之,實施例2的光量測定裝置3使用光圈124,將受光範圍設定為0°≦θ≦75°±10°(0°≦θ≦65°至0°≦θ≦85°)。藉由此設定,受光模組1能夠接收到從LED101發射的光之中θ=75°±10°為止範圍(0°≦θ≦65°至0°≦θ≦85°的範圍)的光。In other words, the light amount measuring device 3 of the second embodiment sets the light receiving range to 0 ° ≦ θ ≦ 75 ° ± 10 ° (0 ° ≦ θ ≦ 65 ° to 0 ° ≦ θ ≦ 85 °) using the diaphragm 124. By this setting, the light receiving module 1 can receive light having a range of θ=75°±10° (0°≦θ≦65° to 0°≦θ≦85°) from the light emitted from the LED 101.

在實施例2的光量測定裝置3中,此光圈124作為受光範圍設定機構發揮作用。In the light amount measuring device 3 of the second embodiment, the diaphragm 124 functions as a light receiving range setting means.

如圖12所示,在實施例3的光量測定裝置3中,受光模組1並未直接接收一部分從LED101發射的光。As shown in FIG. 12, in the light amount measuring device 3 of the third embodiment, the light receiving module 1 does not directly receive a part of the light emitted from the LED 101.

實施例3的光量測定裝置3具有反射體123,用於將從LED101發射 的光反射至受光模組1。The light quantity measuring device 3 of Embodiment 3 has a reflector 123 for emitting from the LED 101 The light is reflected to the light receiving module 1.

反射體123外接傾斜面107d,其為構成保持部107之遮蔽部107a的內周面。The reflector 123 is externally connected to the inclined surface 107d which is an inner peripheral surface of the shielding portion 107a constituting the holding portion 107.

反射體123以傾斜面107d為基端,其頂端沿著發光中心軸LCA朝向LED101側(下方側)延伸。朝向LED101側延伸的反射體123的內周面形成反射面123a。The reflector 123 has a sloped surface 107d as a base end, and its tip end extends toward the LED 101 side (lower side) along the light emission center axis LCA. The inner peripheral surface of the reflector 123 extending toward the LED 101 side forms a reflecting surface 123a.

反射體123的反射面123a是由銀、鋁等具有高反射率特性之反射材料所形成。反射面123a形成以發光中心軸LCA為中心軸之上下顛倒的略圓錐台形的中空空間。形成上下顛倒的略圓錐台形的中空空間之反射面123a,隨著朝向LED101,其軸向方向斷面的直徑越小。因此,反射面123a可將從LED101發射的光反射至光檢測器105。The reflecting surface 123a of the reflector 123 is formed of a reflective material having high reflectance characteristics such as silver or aluminum. The reflecting surface 123a forms a substantially truncated cone-shaped hollow space whose upper end is reversed with the central axis of the light emission LCA as the central axis. The reflecting surface 123a of the hollow space having a slightly truncated cone shape which is upside down is formed, and the diameter of the cross section in the axial direction is smaller as it goes toward the LED 101. Therefore, the reflecting surface 123a can reflect the light emitted from the LED 101 to the photodetector 105.

反射體123藉由改變從傾斜面107d向LED101側延伸的延伸長度,改變延伸出的頂端部之反射面123a的位置。一旦改變頂端面的反射面123a的位置,則連結該反射面123a與LED101所成的直線相對於發光中心軸LCA的傾斜角度也會改變。反射體123之該傾斜角度規定可到達光檢測器105的光範圍。反射體123能夠藉由改變從傾斜面107d向LED101側延伸的延伸長度,改變受光角度θ。The reflector 123 changes the position of the reflecting surface 123a of the extended distal end portion by changing the extending length from the inclined surface 107d toward the LED 101 side. When the position of the reflecting surface 123a of the distal end surface is changed, the inclination angle of the straight line connecting the reflecting surface 123a and the LED 101 with respect to the central axis of the light emission LCA also changes. This angle of inclination of the reflector 123 defines the range of light that can reach the photodetector 105. The reflector 123 can change the light receiving angle θ by changing the length of the extension from the inclined surface 107d toward the LED 101 side.

實施例3的光量測定裝置3使用反射體123,調整受光角度θ,使θ=75°±10°。意即,在實施例3的光量測定裝置3中,利用反射體123將受光角度θ調整為θ=75°±10°,以設定受光模組1的受光範圍。The light amount measuring device 3 of the third embodiment adjusts the light receiving angle θ using the reflector 123 so that θ = 75 ° ± 10 °. In the light amount measuring device 3 of the third embodiment, the light receiving angle θ is adjusted to θ=75°±10° by the reflector 123 to set the light receiving range of the light receiving module 1.

換言之,實施例3的光量測定裝置3使用反射體123,將受光範圍設定為0°≦θ≦75°±10°(0°≦θ≦65°至0°≦θ≦85°)。藉由此設定,受光模組1能夠接收到從LED101發射的光之中θ=75°±10°為止範圍(0°≦θ≦65°至0°≦θ≦85°的範圍)的光。In other words, the light amount measuring device 3 of the third embodiment uses the reflector 123 to set the light receiving range to 0 ° ≦ θ ≦ 75 ° ± 10 ° (0 ° ≦ θ ≦ 65 ° to 0 ° ≦ θ ≦ 85 °). By this setting, the light receiving module 1 can receive light having a range of θ=75°±10° (0°≦θ≦65° to 0°≦θ≦85°) from the light emitted from the LED 101.

在實施例3的光量測定裝置3中,此反射體123作為受光範圍設定機構發揮作用。In the light amount measuring device 3 of the third embodiment, the reflector 123 functions as a light receiving range setting means.

如圖13所示,在實施例4的光量測定裝置3中,受光模組1並未直接接收一部分從LED101發射的光。As shown in FIG. 13, in the light amount measuring device 3 of the fourth embodiment, the light receiving module 1 does not directly receive a part of the light emitted from the LED 101.

實施例4的光量測定裝置3具有菲涅耳透鏡126,用於將從LED101發射的光折射至受光模組1。The light amount measuring device 3 of the fourth embodiment has a Fresnel lens 126 for refracting light emitted from the LED 101 to the light receiving module 1.

菲涅耳透鏡126形成為以發光中心軸LCA為中心軸之略圓盤狀。The Fresnel lens 126 is formed in a substantially disk shape with the central axis of the light emission LCA as a central axis.

菲涅耳透鏡126配置於受光模組1與LED101之間。菲涅耳透鏡126與保持部107、載置桌103、LED101及光檢測器105大致平行地配置。此外,可設有多片菲涅耳透鏡126。The Fresnel lens 126 is disposed between the light receiving module 1 and the LED 101. The Fresnel lens 126 is disposed substantially in parallel with the holding portion 107, the mounting table 103, the LED 101, and the photodetector 105. In addition, a plurality of Fresnel lenses 126 may be provided.

菲涅耳透鏡126可沿著發光中心軸LCA往上下方向移動。一旦改變菲涅耳透鏡126於上下方向中的位置,則連結菲涅耳透鏡126的外周緣與LED101所成的直線相對於發光中心軸LCA的傾斜角度也會改變。菲涅耳透鏡126的該傾斜角度規定可到達光檢測器105的光範圍。菲涅耳透鏡126藉由改變外周緣於上下方向的位置,可改變受光角度θ。The Fresnel lens 126 is movable in the up and down direction along the light emission center axis LCA. Once the position of the Fresnel lens 126 in the up-and-down direction is changed, the inclination angle of the straight line connecting the outer circumference of the Fresnel lens 126 and the LED 101 with respect to the light-emitting central axis LCA also changes. This angle of inclination of the Fresnel lens 126 defines the range of light that can reach the photodetector 105. The Fresnel lens 126 can change the light receiving angle θ by changing the position of the outer circumference in the up and down direction.

實施例4的光量測定裝置3使用菲涅耳透鏡126,調整受光角度θ,使θ=75°±10°。意即,在實施例4的光量測定裝置3中,利用菲涅耳透鏡126將受光角度θ調整為θ=75°±10°,以設定受光模組1的受光範圍。The light amount measuring device 3 of the fourth embodiment adjusts the light receiving angle θ using the Fresnel lens 126 so that θ = 75 ° ± 10 °. In the light amount measuring device 3 of the fourth embodiment, the light receiving angle θ is adjusted by the Fresnel lens 126 to θ=75°±10° to set the light receiving range of the light receiving module 1.

換言之,實施例4的光量測定裝置3使用菲涅耳透鏡126,將受光範圍設定為0°≦θ≦75°±10°(0°≦θ≦65°至0°≦θ≦85°)。藉由此設定,受光模組1能夠接收到從LED101發射的光之中θ=75°±10°為止範圍(0°≦θ≦65°至0°≦θ≦85°的範圍)的光。In other words, the light amount measuring device 3 of the fourth embodiment uses the Fresnel lens 126 to set the light receiving range to 0 ° ≦ θ ≦ 75 ° ± 10 ° (0 ° ≦ θ ≦ 65 ° to 0 ° ≦ θ ≦ 85 °). By this setting, the light receiving module 1 can receive light having a range of θ=75°±10° (0°≦θ≦65° to 0°≦θ≦85°) from the light emitted from the LED 101.

在實施例4的光量測定裝置3中,此菲涅耳透鏡126作為受光範圍設定機構發揮作用。In the light amount measuring device 3 of the fourth embodiment, the Fresnel lens 126 functions as a light receiving range setting means.

如圖14所示,在實施例5的光量測定裝置3中,受光模組1並未直接接收一部分從LED101發射的光。As shown in FIG. 14, in the light amount measuring device 3 of the fifth embodiment, the light receiving module 1 does not directly receive a part of the light emitted from the LED 101.

實施例5的光量測定裝置3具有用於將從LED101發射的光反射至 受光模組1之反射體127,以及使受光模組1往上下方向移動之移動機構。The light quantity measuring device 3 of Embodiment 5 has a function for reflecting light emitted from the LED 101 to The reflector 127 of the light receiving module 1 and a moving mechanism for moving the light receiving module 1 in the vertical direction.

實施例5的光量測定裝置3所具有的反射體127,具有與實施例3的反射體123相同的構造。The reflector 127 included in the light amount measuring device 3 of the fifth embodiment has the same structure as the reflector 123 of the third embodiment.

意即,反射體127沿著發光中心軸LCA朝向LED101側延伸,此內周面形成反射面127a。而且,反射體127可藉由改變由傾斜面107d向LED101側的上述延伸長度,改變連結先端部的反射面127a與LED101所成的直線之上述傾斜角度,以改變受光角度θ。That is, the reflector 127 extends toward the LED 101 side along the light emission center axis LCA, and this inner peripheral surface forms the reflection surface 127a. Further, the reflector 127 can change the above-described inclination angle of the straight line connecting the reflection surface 127a of the tip end portion and the LED 101 by changing the extension length of the inclined surface 107d toward the LED 101 side to change the light receiving angle θ.

然而,反射體127與實施例3的反射體123不同,將被反射面127a反射的光限定為從LED101發射的光之中在70°<θ≦85°範圍內的光。However, the reflector 127 is different from the reflector 123 of the embodiment 3 in that the light reflected by the reflecting surface 127a is defined as light in the range of 70° < θ ≦ 85° among the light emitted from the LED 101.

此外,實施例5的光量測定裝置3所具有的移動機構與實施例1的移動機構具有相同的構造。Further, the moving mechanism of the light amount measuring device 3 of the fifth embodiment has the same configuration as the moving mechanism of the first embodiment.

意即,實施例5的光量測定裝置3的移動機構使受光模組1沿著發光中心軸LCA移動。而且,實施例5的光量測定裝置3所具有的移動機構可藉由改變光檢測器105與LED101之間的距離,改變受光角度θ。In other words, the moving mechanism of the light amount measuring device 3 of the fifth embodiment moves the light receiving module 1 along the light emission center axis LCA. Further, the moving mechanism of the light amount measuring device 3 of the fifth embodiment can change the light receiving angle θ by changing the distance between the photodetector 105 and the LED 101.

然而,實施例5的光量測定裝置3所具有的移動機構,與實施例1的移動機構不同,將光檢測器105從LED101直接接收的光限定為從LED101發射的光之中在θ≦70°範圍內的光。However, the moving mechanism of the light amount measuring device 3 of the fifth embodiment differs from the moving mechanism of the first embodiment in that the light directly received by the photodetector 105 from the LED 101 is limited to θ ≦ 70° among the light emitted from the LED 101. Light within the range.

一般而言,在光檢測器的受光面上大多設有用於保護受光面之保護材料。受此保護材料的折射率的影響,在入射至光檢測器的光之中入射角比70°大的光增加保護材料表面的反射成分。因此,比θ=70°大的光與其由光檢測器直接受光,不如經過反射體等的一次反射,並且將朝向光檢測器的入射角抑制在70°以下,更能測定出正確的光量,以及提高測定精度。In general, a protective material for protecting the light-receiving surface is often provided on the light-receiving surface of the photodetector. Affected by the refractive index of the protective material, light having an incident angle greater than 70° among the light incident on the photodetector increases the reflection component of the surface of the protective material. Therefore, light larger than θ=70° is directly received by the photodetector, and is less likely to be reflected by the reflector or the like, and the incident angle toward the photodetector is suppressed to 70° or less, and the correct amount of light can be measured. And improve the measurement accuracy.

實施例5的光量測定裝置3利用移動機構及反射體127,將受光角度θ調整為θ=75°±10°。意即,在實施例5的光量測定裝置3中,藉由利 用移動機構及反射體127將受光角度θ調整為θ=75°±10°,以設定受光模組1的受光範圍。The light amount measuring device 3 of the fifth embodiment adjusts the light receiving angle θ to θ=75°±10° by the moving mechanism and the reflector 127. That is, in the light quantity measuring device 3 of the fifth embodiment, The light receiving angle θ is adjusted to θ=75°±10° by the moving mechanism and the reflector 127 to set the light receiving range of the light receiving module 1.

換言之,實施例5的光量測定裝置3利用移動機構及反射體127,將受光範圍設定為0°≦θ≦75°±10°(0°≦θ≦65°至0°≦θ≦85°)。In other words, the light amount measuring device 3 of the fifth embodiment sets the light receiving range to 0° ≦ θ ≦ 75 ° ± 10 ° (0° ≦ θ ≦ 65 ° to 0 ° ≦ θ ≦ 85 °) by using the moving mechanism and the reflector 127. .

但是,光量測定裝置3調整成在0°≦θ≦70°範圍中的光由光檢測器105直接接收,而在70°<θ≦85°範圍中的光經由反射面127a使光檢測器105接收。However, the light quantity measuring device 3 is adjusted such that light in the range of 0° ≦ θ ≦ 70° is directly received by the photodetector 105, and light in the range of 70° < θ ≦ 85° causes the photodetector 105 to pass through the reflecting surface 127a. receive.

一旦如上設定受光範圍,則受光模組1直接接收從LED101發射的光之中θ=70°為止範圍(在0°≦θ≦65°至0°≦θ≦70°範圍內的光)內的光。並且,受光模組1經由反射面127a接收從LED101發射的光之中比θ=70°大且θ=85°為止範圍(70°<θ≦85°的範圍)內的光。Once the light receiving range is set as above, the light receiving module 1 directly receives the light within the range of θ=70° (light in the range of 0°≦θ≦65° to 0°≦θ≦70°) among the light emitted from the LED 101. Light. Further, the light receiving module 1 receives light in a range (70° < θ ≦ 85°) that is larger than θ=70° and θ=85° among the light emitted from the LED 101 via the reflecting surface 127a.

在實施例5的光量測定裝置3中,此移動機構及反射體127作為受光範圍設定機構發揮作用。In the light amount measuring device 3 of the fifth embodiment, the moving mechanism and the reflector 127 function as a light receiving range setting means.

另外,在上述的說明中敘述將受光模組1直接接收光的實施例1及實施例2的光量測定裝置3的受光範圍設定為0°≦θ≦75°±10°(0°≦θ≦65°至0°≦θ≦85°)。然而,實施例1及實施例2的光量測定裝置3的受光範圍也可設定為限定於0°≦θ≦65°至0°≦θ≦70°。Further, in the above description, the light receiving range of the light quantity measuring device 3 of the first embodiment and the second embodiment in which the light receiving module 1 directly receives light is set to 0° ≦ θ ≦ 75 ° ± 10 ° (0 ° ≦ θ ≦ 65° to 0°≦θ≦85°). However, the light receiving ranges of the light amount measuring devices 3 of the first embodiment and the second embodiment may be set to be limited to 0°≦θ≦65° to 0°≦θ≦70°.

此外,在上述的說明中,敘述將受光模組1不直接接收光的實施例3及實施例4的光量測定裝置3的受光範圍設定為0°≦θ≦75°±10°(0°≦θ≦65°至0°≦θ≦85°)。然而,實施例3及實施例4的光量測定裝置3的受光範圍也可設定為0°≦θ≦70°至0°≦θ≦85°。Further, in the above description, the light receiving range of the light amount measuring device 3 of the third embodiment and the fourth embodiment in which the light receiving module 1 does not directly receive light is set to 0° ≦ θ ≦ 75 ° ± 10 ° (0 ° ≦). θ ≦ 65 ° to 0 ° ≦ θ ≦ 85 °). However, the light receiving ranges of the light amount measuring devices 3 of the third embodiment and the fourth embodiment can be set to 0° ≦ θ ≦ 70° to 0° ≦ θ ≦ 85°.

意即,將受光範圍設定在0°≦θ≦65°至0°≦θ≦70°時,使用實施例1或2的光量測定裝置3,而將受光範圍設定在0°≦θ≦70°至0°≦θ≦85°時,可使用實施例3或4的光量測定裝置3。That is, when the light receiving range is set from 0°≦θ≦65° to 0°≦θ≦70°, the light amount measuring device 3 of Embodiment 1 or 2 is used, and the light receiving range is set to 0°≦θ≦70°. The light quantity measuring device 3 of Embodiment 3 or 4 can be used up to 0° ≦ θ ≦ 85°.

藉由這種選擇方式,實施例1至4的光量測定裝置3與實施例5相 同,可抑止因光檢測器105的保護材料表面而增加的反射成分的影響,能夠測定出更正確的光量,提高測定精度。With this selection, the light quantity measuring device 3 of the first to fourth embodiments is in phase with the fifth embodiment. In the same manner, it is possible to suppress the influence of the reflection component which is increased by the surface of the protective material of the photodetector 105, and it is possible to measure a more accurate amount of light and improve the measurement accuracy.

<受光模組相關之變形例><Modification of Light-Receiving Module>

以下,利用圖15至圖17,說明構成光量測定裝置3的受光模組1之變形例。Hereinafter, a modification of the light receiving module 1 constituting the light amount measuring device 3 will be described with reference to Figs. 15 to 17 .

圖15係為本發明一實施形態之光量測定裝置的受光模組1的變形例1之說明圖。Fig. 15 is an explanatory view showing a first modification of the light receiving module 1 of the light amount measuring device according to the embodiment of the present invention.

如上所述,為了不論LED101的排列位置、與相鄰LED的間隔以及種類而抑制光量測定誤差,因此光量測定裝置3將受光角度θ=75°±10°為止的光設定為受光模組1的受光範圍至關重要。As described above, in order to suppress the light amount measurement error regardless of the arrangement position of the LEDs 101 and the interval and type of the adjacent LEDs, the light amount measuring device 3 sets the light of the light receiving angle θ=75°±10° as the light receiving module 1 . The range of light received is critical.

但是,受光模組1有時無法完全接收在受光範圍內的光。例如,受光模組1是由多個光檢測器105所構成時,到達兩個光檢測器105之間的間隙的光,或是造成探針109的影子的光等。如此一來,在LED101的光量測定中,在受光範圍內有時會產生測定系統構成上無法避免的「光無法被接收的區域」。因此,即使是光量測定裝置3,受光模組1有時也無法完全接收到受光角度θ=75°±10°為止的光。However, the light receiving module 1 may not completely receive the light in the light receiving range. For example, when the light receiving module 1 is composed of a plurality of photodetectors 105, light that reaches a gap between the two photodetectors 105, or light that causes a shadow of the probe 109, or the like. As a result, in the measurement of the amount of light of the LED 101, "the area where light cannot be received" which is unavoidable in the measurement system configuration may occur in the light receiving range. Therefore, even in the light amount measuring device 3, the light receiving module 1 may not completely receive the light having the light receiving angle θ=75°±10°.

然而,在光量測定裝置3中,使用受光模組1完全接收從LED101發射的光之中被規定在與發光中心軸LCA所形成的角度θ為θ=75°±10°為止的角度範圍內的光,並不是最重要的。例如,如圖13所示之實施例4,在LED101與受光模組1之間一旦配置菲涅耳透鏡126等,就必然會產生光損失,而光量的絕對值也會隨之減少。但是,在光量測定裝置3中,隨著受光角度θ變化的光量的變化曲線本身相對不變,不會影響其測定性能。這是因為更為重要的是,光量測定裝置3使受光模組1接收從LED101發射的光之中被規定在相對於發光中心軸LCA的角度θ為θ=75°±10°為止的角度範圍內的光的光量成比例的光。因此,光量測定裝置3可在LED101與受光模組1之間插入ND濾光片等的光衰減 器,使受光模組1接收衰減後的光。However, in the light amount measuring device 3, the light receiving module 1 completely receives the light emitted from the LED 101 within an angle range defined by the angle θ formed by the light emission center axis LCA to be θ=75°±10°. Light is not the most important. For example, in the fourth embodiment shown in FIG. 13, when the Fresnel lens 126 or the like is disposed between the LED 101 and the light receiving module 1, light loss is inevitably generated, and the absolute value of the amount of light is also reduced. However, in the light amount measuring device 3, the change curve of the amount of light that changes with the light receiving angle θ is relatively constant, and the measurement performance is not affected. This is because it is more important that the light-quantity measuring device 3 causes the light-receiving module 1 to receive an angular range defined by the angle θ with respect to the central axis of the light-emitting center LCA from the light emitted from the LED 101 to be θ=75°±10°. The amount of light within the light is proportional to the amount of light. Therefore, the light amount measuring device 3 can insert light attenuation such as an ND filter between the LED 101 and the light receiving module 1 The light receiving module 1 receives the attenuated light.

而且,本實施形態的光量測定裝置3也沒有從LED101發射的光之後會循著什麼路徑到達光檢測器105,以使受光模組1接收的問題。Further, the light amount measuring device 3 of the present embodiment does not have a path following the light emitted from the LED 101 to the photodetector 105, so that the light receiving module 1 receives the problem.

也就是說,本實施形態的光量測定裝置3為測定被規定於受光角度θ=75°±10°為止的角度範圍內的光的光量成比例的光,對受光模組1本身的構成沒有任何限定。In other words, the light amount measuring device 3 of the present embodiment measures light in proportion to the amount of light in the angular range defined by the light receiving angle θ=75°±10°, and does not have any configuration for the light receiving module 1 itself. limited.

上述光量測定裝置3之中,受光模組1的構造為圖3及圖4所示之構造,已進行過說明。In the light amount measuring device 3 described above, the structure of the light receiving module 1 is as shown in Figs. 3 and 4 and has been described.

圖3及圖4所示的受光模組1中,光檢測器105與LED101相向配置,大致平行於LED101的發光面101a。另外,圖3及圖4的光檢測器105保持在保持部107的內部。In the light receiving module 1 shown in FIGS. 3 and 4, the photodetector 105 is disposed to face the LED 101 and is substantially parallel to the light emitting surface 101a of the LED 101. Further, the photodetector 105 of FIGS. 3 and 4 is held inside the holding portion 107.

光量測定裝置3的受光模組1的構造並不限定於圖3及圖4所例示的構造,也可以是下述構造。The structure of the light receiving module 1 of the light amount measuring device 3 is not limited to the structure illustrated in FIGS. 3 and 4, and may be the following structure.

如圖15所示,變形例1的受光模組1至少具有積分球108。積分球108形成為中空的略球狀。As shown in FIG. 15, the light receiving module 1 of the first modification has at least an integrating sphere 108. The integrating sphere 108 is formed into a hollow slightly spherical shape.

變形例1的受光模組1中,光檢測器105保持在形成積分球108的內部空間的內壁108a中,並不保持在圖3所示之保持部107的內部。In the light receiving module 1 of the first modification, the photodetector 105 is held in the inner wall 108a forming the internal space of the integrating sphere 108, and is not held inside the holding portion 107 shown in FIG.

內壁108a由具有良好高反射率的擴散性的材料形成。在內壁108a中未保持有光檢測器105的位置上設有開口部108b。The inner wall 108a is formed of a diffusible material having a good high reflectance. An opening 108b is provided at a position where the photodetector 105 is not held in the inner wall 108a.

開口部108b將從LED101發射的光引導至積分球108的內部。The opening 108b guides the light emitted from the LED 101 to the inside of the integrating sphere 108.

開口部108b形成為略圓形。開口部108b的開口中心軸與從LED101發出的光之發光中心軸LCA大致一致。The opening portion 108b is formed to be slightly circular. The central axis of the opening of the opening 108b substantially coincides with the central axis of illumination LCA of the light emitted from the LED 101.

針對變形例1的受光模組1中的其他構造,與圖3及圖4所示之受光模組1相同。意即,雖然圖15中省略了圖示,圖15的光檢測器105也經由訊號線111連接至放大器113。The other structure of the light receiving module 1 according to the first modification is the same as that of the light receiving module 1 shown in FIGS. 3 and 4. That is, although the illustration is omitted in FIG. 15, the photodetector 105 of FIG. 15 is also connected to the amplifier 113 via the signal line 111.

變形例1的光量測定裝置3並不將檢查對象的LED101搬入積分球 108內,而是在放置於外部的狀態下進行光量測定。The light amount measuring device 3 of the first modification does not carry the LED 101 to be inspected into the integrating sphere. In 108, the amount of light is measured while being placed outside.

變形例1的光量測定裝置3中,從LED101發射的光由開口部108b被引導至積分球108的內部。被引導至積分球108內部的光被積分球108的內壁108a重覆反射。被內壁108a重覆反射的光被光檢測器105引導,由光檢測器105接收。光檢測器105接收的光與從LED101發射的光成正比。In the light amount measuring device 3 of the first modification, the light emitted from the LED 101 is guided to the inside of the integrating sphere 108 by the opening portion 108b. The light guided to the inside of the integrating sphere 108 is repeatedly reflected by the inner wall 108a of the integrating sphere 108. The light repeatedly reflected by the inner wall 108a is guided by the photodetector 105 and received by the photodetector 105. The light received by photodetector 105 is proportional to the light emitted from LED 101.

藉此,變形例1的受光模組1能接收從LED101發射的光,並且測定其光量。Thereby, the light receiving module 1 of the first modification can receive the light emitted from the LED 101 and measure the amount of light thereof.

此外,變形例1的光量測定裝置3中,可代替保持在內壁108a中的光檢測器105而設置光纖,也可以在積分球108的外部設置光檢測器105。而且,也可使用該光纖導光至積分球108的外部,利用積分球108外部的光檢測器105接收光。此時,在積分球108的外部,可使用光檢測器105以外的光量測定機(例如分光器)。Further, in the light amount measuring device 3 of the first modification, an optical fiber may be provided instead of the photodetector 105 held in the inner wall 108a, or the photodetector 105 may be provided outside the integrating sphere 108. Moreover, the optical fiber can also be used to guide light to the outside of the integrating sphere 108, and the light is received by the photodetector 105 outside the integrating sphere 108. At this time, a light amount measuring device (for example, a spectroscope) other than the photodetector 105 can be used outside the integrating sphere 108.

順帶一提,圖3及圖4所示之受光模組1中,LED101的發光面101a與光檢測器105的受光面大致平行地相對。意即,圖3及圖4所示之受光模組1中,從LED101發射的光的發光中心軸LCA與光檢測器105的受光面之法線大致平行。藉此,圖3及圖4所示之受光模組1中,從LED101發射的光相對於發光中心軸LCA的角度θ,與從LED101發射的光相對於光檢測器105的入射角一致。Incidentally, in the light receiving module 1 shown in FIGS. 3 and 4, the light emitting surface 101a of the LED 101 faces the light receiving surface of the photodetector 105 substantially in parallel. In other words, in the light receiving module 1 shown in FIGS. 3 and 4, the light emission center axis LCA of the light emitted from the LED 101 is substantially parallel to the normal line of the light receiving surface of the photodetector 105. Thereby, in the light receiving module 1 shown in FIGS. 3 and 4, the angle θ of the light emitted from the LED 101 with respect to the central axis of the light emission LCA coincides with the angle of incidence of the light emitted from the LED 101 with respect to the photodetector 105.

因此,具備圖3及圖4的受光模組1的光量測定裝置3中,測定從LED101發射的光之中使受光模組1受光的光量之光的角度範圍,與入射至光檢測器105之光的角度範圍一致。Therefore, in the light amount measuring device 3 including the light receiving module 1 of FIGS. 3 and 4, the angular range of the light of the light amount received by the light receiving module 1 among the light emitted from the LED 101 is measured, and is incident on the photodetector 105. The angular range of light is the same.

由此,到此為止的說明中,將從LED101發射的光之中使受光模組1接收並測定光量之光的角度範圍稱為「受光範圍」。並且,將規定受光範圍的邊界角度的最大值稱為「受光角度θ」。更進一步,將根據受光角度θ設定受光範圍的光量測定裝置3的機構稱為「受光範圍設定 機構」。Therefore, in the above description, the angle range in which the light received by the light receiving module 1 and the light amount is measured among the light emitted from the LED 101 is referred to as a "light receiving range". Further, the maximum value of the boundary angle of the predetermined light receiving range is referred to as "light receiving angle θ". Further, the mechanism of the light amount measuring device 3 that sets the light receiving range based on the light receiving angle θ is referred to as "light receiving range setting". mechanism".

另一方面,圖15所示之變形例1之受光模組1中,LED101的發光面101a與光檢測器105的受光面並不是大致平行地相對。意即,變形例1的受光模組1中,從LED101發射的光的發光中心軸LCA與光檢測器105的受光面的法線並不為大致平行。由此,變形例1的受光模組1中,相對於發光中心軸LCA的角度θ,與從LED101發射的光相對於光檢測器105的入射角並不一致。On the other hand, in the light receiving module 1 of the first modification shown in FIG. 15, the light emitting surface 101a of the LED 101 and the light receiving surface of the photodetector 105 are not substantially parallel to each other. In the light-receiving module 1 of the first modification, the light-emission central axis LCA of the light emitted from the LED 101 and the normal to the light-receiving surface of the photodetector 105 are not substantially parallel. As a result, in the light receiving module 1 of the first modification, the angle θ with respect to the light emission center axis LCA does not coincide with the incident angle of the light emitted from the LED 101 with respect to the photodetector 105.

因此,具備變形例1的受光模組1的光量測定裝置3中,測定從LED101發射的光之中使受光模組1接收的光量之光的角度範圍,與入射至光檢測器105的光的角度範圍並不一致。Therefore, in the light amount measuring device 3 including the light receiving module 1 of the first modification, the angular range of the light of the amount of light received by the light receiving module 1 among the light emitted from the LED 101 is measured, and the light incident on the photodetector 105 The range of angles is not consistent.

測定使受光模組1接收的光量之光的角度範圍,與入射至光檢測器105之光的角度範圍並不一致時,「受光範圍」的意義有可能會被誤解為是入射至光檢測器105之光的角度範圍。When the angular range of the light that has received the amount of light received by the light receiving module 1 does not coincide with the angular range of the light incident on the photodetector 105, the meaning of the "light receiving range" may be misinterpreted as being incident on the photodetector 105. The angular extent of the light.

因此,接下來的說明,將從LED101發射的光之中使受光模組1接收並測定光量之光的角度範圍稱為「測定範圍」。並且,將規定受光範圍的邊界角度的最大值稱為「測定角度θ」。更進一步,將根據測定角度θ設定測定範圍之光量測定裝置3的機構稱為「測定範圍設定機構」,並進行說明。Therefore, in the following description, the angle range in which the light received by the light receiving module 1 and the light amount is measured among the lights emitted from the LED 101 is referred to as a "measurement range". Further, the maximum value of the boundary angle of the predetermined light receiving range is referred to as "measurement angle θ". Furthermore, the mechanism of the light amount measuring device 3 that sets the measurement range based on the measurement angle θ is referred to as a "measurement range setting means" and will be described.

意即,在本發明中的概念是「測定範圍」包含「受光範圍」的意義內容。相同的,「測定角度θ」包含「受光角度θ」的意義內容。「測定範圍設定機構」包含「受光範圍設定機構」的意義內容。That is, the concept in the present invention is that the "measurement range" includes the meaning of the "light-receiving range". Similarly, the "measurement angle θ" includes the meaning of the "light-receiving angle θ". The "measurement range setting means" includes the meaning of the "light-receiving range setting means".

變形例1的光量測定裝置3中的測定範圍設定機構與圖10至圖14中之一所示的受光範圍設定機構相同。在圖15中,舉例說明的變形例1的測定範圍設定機構,與圖10所示的實施例1的受光範圍設定機構相同。此外,在圖15中,示意地將測定範圍設定前的受光模組1的測定角度表示為θ1,將測定範圍設定後的受光模組1的測定角度表示為 θ2。The measurement range setting means in the light amount measuring device 3 of the first modification is the same as the light receiving range setting means shown in one of FIGS. 10 to 14. In Fig. 15, the measurement range setting means of the modified example 1 is the same as the light receiving range setting means of the first embodiment shown in Fig. 10. In addition, in FIG. 15, the measurement angle of the light receiving module 1 before the measurement range setting is shown as θ1, and the measurement angle of the light receiving module 1 after setting the measurement range is represented as Θ2.

變形例1的光量測定裝置3利用測定範圍設定機構,將測定範圍設定為0°≦θ≦75°±10°(0°≦θ≦65°至0°≦θ≦85°)。藉由此設定,受光模組1能夠接收到從LED101發射的光之中θ=75°±10°為止的範圍(0°≦θ≦65°至0°≦θ≦85°的範圍)的光,並測定其光量。The light amount measuring device 3 according to the first modification uses the measurement range setting means to set the measurement range to 0 ° ≦ θ ≦ 75 ° ± 10 ° (0 ° ≦ θ ≦ 65 ° to 0 ° ≦ θ ≦ 85 °). By this setting, the light receiving module 1 can receive light in a range (0° ≦ θ ≦ 65 ° to 0 ° ≦ θ ≦ 85 °) from θ = 75 ° ± 10 ° among the light emitted from the LED 101. And measure the amount of light.

變形例1的光量測定裝置3中的其他構造,與圖3及圖4所示之光量測定裝置3的構造相同。The other structure of the light amount measuring device 3 of the first modification is the same as that of the light amount measuring device 3 shown in Figs. 3 and 4 .

圖16係為本發明一實施形態之光量測定裝置的受光模組1的變形例2之說明圖。Fig. 16 is an explanatory view showing a second modification of the light receiving module 1 of the light amount measuring device according to the embodiment of the present invention.

根據其表面電極與發光面101a的位置關係,LED101可分為「上面發光型」、「下面發光型」及「雙面發光型」三種類型。According to the positional relationship between the surface electrode and the light-emitting surface 101a, the LED 101 can be classified into three types: "upper light-emitting type", "lower-side light-emitting type", and "double-sided light-emitting type".

「上面發光型」為在與LED101的電極同一側的面,即上面具有發光面101a。The "upper illumination type" is a surface on the same side as the electrode of the LED 101, that is, the upper surface has a light-emitting surface 101a.

「下面發光型」為在與LED101的電極相反側的面,即下面具有發光面101a。The "lower light-emitting type" has a light-emitting surface 101a on the surface opposite to the electrode of the LED 101, that is, on the lower surface.

「雙面發光型」為在與LED101的電極同一側的面即上面,以及與電極相反側的面即下面之雙面具有發光面101a。The "double-sided light-emitting type" has a light-emitting surface 101a on the upper surface of the surface on the same side as the electrode of the LED 101, and on the lower surface of the surface opposite to the electrode.

如圖3及圖4所示之光量測定裝置3中,將受光模組1配置在載置有LED101的載置桌103的上面側。具備該配置的受光模組1的光量測定裝置3,適用於測定「上面發光型」的LED101的光量。In the light amount measuring device 3 shown in FIGS. 3 and 4, the light receiving module 1 is placed on the upper surface side of the mounting table 103 on which the LEDs 101 are placed. The light amount measuring device 3 of the light receiving module 1 having the above configuration is suitable for measuring the amount of light of the "upper light emitting type" LED 101.

如圖16所示,變形例2的光量測定裝置3中,將受光模組1配置在載置有LED101的載置桌103的下面側。具備變形例2的受光模組1之光量測定裝置3,適用於測定「下面發光型」的LED101的光量。As shown in FIG. 16, in the light amount measuring device 3 of the second modification, the light receiving module 1 is placed on the lower surface side of the mounting table 103 on which the LEDs 101 are placed. The light amount measuring device 3 including the light receiving module 1 of the second modification is suitable for measuring the amount of light of the "lower light emitting type" LED 101.

如圖16所示,變形例2的受光模組1與圖3及圖4所示之受光模組1的構造相同。As shown in FIG. 16, the light receiving module 1 of the second modification has the same configuration as the light receiving module 1 shown in FIGS. 3 and 4.

變形例2的受光模組1中,光檢測器105經由載置桌103,與 LED101大致平行地配置。此時,變形例2的受光模組1可配置為與載置桌103的玻璃桌103a無空隙地接觸。載置桌103的下面側上並沒有與LED101的電極連接的探針109,因此,配置於載置桌103的下面側的受光模組1可配置為與玻璃桌103a接觸。In the light receiving module 1 of the second modification, the photodetector 105 is placed on the table 103 via The LEDs 101 are arranged substantially in parallel. At this time, the light receiving module 1 of the second modification can be disposed in contact with the glass table 103a of the mounting table 103 without a gap. Since the probe 109 connected to the electrode of the LED 101 is not provided on the lower surface side of the mounting table 103, the light receiving module 1 disposed on the lower surface side of the mounting table 103 can be placed in contact with the glass table 103a.

另外,也可將具有積分球108的受光模組1(參照圖15)適用於變形例2的受光模組1。Further, the light receiving module 1 (see FIG. 15) having the integrating sphere 108 may be applied to the light receiving module 1 of the second modification.

變形例2的玻璃桌103a與圖3及圖4所示之光量測定裝置3的玻璃桌103a相同。意即,玻璃桌103a是由對從LED101發射的光的波長帶寬具有高穿透率的材料所形成。例如,玻璃桌103a較佳是由穿透率90%以上的藍寶石或玻璃等所形成。The glass table 103a of the second modification is the same as the glass table 103a of the light amount measuring device 3 shown in Figs. 3 and 4 . That is, the glass table 103a is formed of a material having a high transmittance of a wavelength bandwidth of light emitted from the LED 101. For example, the glass table 103a is preferably formed of sapphire or glass having a transmittance of 90% or more.

變形例2的切割片103b可為一般的有色切割片,較佳為透明切割片。例如,切割片103b由對從LED101發射的光的波長帶寬具有80%以上的穿透率的切割片所形成較佳。The dicing sheet 103b of the second modification may be a general colored dicing sheet, preferably a transparent dicing sheet. For example, the dicing sheet 103b is preferably formed of a dicing sheet having a transmittance of 80% or more with respect to the wavelength bandwidth of light emitted from the LED 101.

變形例2的載置桌103中的其他構造與圖3及圖4所示之載置桌103相同。The other structure in the mounting table 103 of the second modification is the same as the mounting table 103 shown in FIGS. 3 and 4 .

如圖16所示,變形例2的光量測定裝置3中的測定範圍設定機構可使用與如圖10所示之實施例1的受光範圍測定機構相同的機構。此外,在圖16中,示意地將測定範圍設定前的受光模組1的測定角度表示為θ1,將測定範圍設定後的受光模組1的測定角度表示為θ2。As shown in FIG. 16, the measurement range setting means in the light amount measuring device 3 of the second modification can use the same mechanism as the light receiving range measuring means of the first embodiment shown in FIG. In addition, in FIG. 16, the measurement angle of the light receiving module 1 before the measurement range setting is shown as θ1, and the measurement angle of the light receiving module 1 after the measurement range setting is shown as θ2.

變形例2的光量測定裝置3利使用測定範圍設定機構,將測定範圍設定為0°≦θ≦75°±10°(0°≦θ≦65°至0°≦θ≦85°)。藉由此設定,受光模組1能夠接收到從LED101發射的光之中θ=75°±10°為止範圍(0°≦θ≦65°至0°≦θ≦85°的範圍)的光,並測定其光量。The light amount measuring device 3 according to the second modification uses the measurement range setting means to set the measurement range to 0 ° ≦ θ ≦ 75 ° ± 10 ° (0 ° ≦ θ ≦ 65 ° to 0 ° ≦ θ ≦ 85 °). With this setting, the light receiving module 1 can receive light of a range of θ=75°±10° (0°≦θ≦65° to 0°≦θ≦85°) among the light emitted from the LED 101, And measure the amount of light.

另外,「下面發光型」的LED101也會得到如圖6至圖9說明的光量測定結果相同的結果,因此,將測定角度θ設定為θ=75°±10°具備臨界性的意義。Further, the "lower-emitting type" LED 101 also has the same result as the light amount measurement results described with reference to FIGS. 6 to 9. Therefore, setting the measurement angle θ to θ=75°±10° has a criticality.

變形例2的光量測定裝置3中的其他構造與圖3及圖4所示之光量測定裝置3的構造相同。The other structure of the light amount measuring device 3 of the second modification is the same as that of the light amount measuring device 3 shown in FIGS. 3 and 4 .

圖17係為本發明一實施形態之光量測定裝置的受光模組1的變形例3之說明圖。Fig. 17 is an explanatory view showing a third modification of the light receiving module 1 of the light amount measuring device according to the embodiment of the present invention.

如圖17所示,變形例3的光量測定裝置3中,將受光模組1配置在載置有LED101的載置桌103的上面側及下面側。具備變形例3的受光模組1之光量測定裝置3,適用於測定「雙面發光型」的LED101的光量。As shown in FIG. 17, in the light amount measuring device 3 of the third modification, the light receiving module 1 is placed on the upper surface side and the lower surface side of the mounting table 103 on which the LEDs 101 are placed. The light amount measuring device 3 including the light receiving module 1 of the third modification is suitable for measuring the amount of light of the "double-sided light emitting type" LED 101.

如圖17所示,變形例3的每個受光模組1與圖3及圖4所示之受光模組1的構造相同。As shown in FIG. 17, each light receiving module 1 of the third modification has the same configuration as that of the light receiving module 1 shown in FIGS. 3 and 4.

變形例3的每個受光模組1中,各個光檢測器105配置為與LED101大致平行。此時,位於變形例3下面側的受光模組1與變形例2的受光模組1相同,可配置為為與載置桌103的玻璃桌103a無空隙地接觸。In each of the light receiving modules 1 of Modification 3, each of the photodetectors 105 is disposed substantially parallel to the LEDs 101. At this time, the light receiving module 1 located on the lower side of the modification 3 is the same as the light receiving module 1 of the second modification, and can be disposed so as to be in contact with the glass table 103a of the mounting table 103 without a gap.

另外,也可將具有積分球108的受光模組1(參照圖15)分別適用於變形例3的每個受光模組1。Further, the light receiving module 1 (see FIG. 15) having the integrating sphere 108 may be applied to each of the light receiving modules 1 of the third modification.

變形例3的玻璃桌103a與變形例2相同,也與圖3及圖4所示之光量測定裝置3的玻璃桌103a相同。The glass table 103a of the third modification is the same as the modification 2, and is also the same as the glass table 103a of the light amount measuring device 3 shown in Figs. 3 and 4 .

變形例3的切割片103b也與變形例2相同,可為一般的有色切割片,較佳為透明切割片。The dicing sheet 103b of the third modification is also the same as the modification 2, and may be a general colored dicing sheet, preferably a transparent dicing sheet.

變形例3的載置桌103中的其他構造與圖3及圖4所示之載置桌103相同。The other structure in the mounting table 103 of the modification 3 is the same as that of the mounting table 103 shown in FIGS. 3 and 4 .

變形例3的光量測定裝置3中的測定範圍設定機構可對每個受光模組1個別地調整測定角度θ。The measurement range setting means in the light amount measuring device 3 of the third modification can individually adjust the measurement angle θ for each of the light receiving modules 1.

變形例3的光量測定裝置3中的測定範圍設定機構與如圖10至圖14其中之一所示的受光範圍測定機構相同。在圖17中省略測定範圍設定機構的圖示。The measurement range setting means in the light amount measuring device 3 of the third modification is the same as the light receiving range measuring means shown in one of FIGS. 10 to 14. The illustration of the measurement range setting mechanism is omitted in FIG.

變形例3的光量測定裝置3利使用測定範圍設定機構,對於每個受光模組1,將測定範圍設定為0°≦θ≦75°±10°(0°≦θ≦65°至0°≦θ≦85°)。藉由此設定,受光模組1能夠接收從LED101發射的光之中θ=75°±10°為止範圍(0°≦θ≦65°至0°≦θ≦85°的範圍)的光,並測定其光量。In the light amount measuring device 3 of the third modification, the measurement range setting means is used, and for each light receiving module 1, the measurement range is set to 0 ° ≦ θ ≦ 75 ° ± 10 ° (0 ° ≦ θ ≦ 65 ° to 0 ° ≦ θ≦85°). With this setting, the light receiving module 1 can receive light from the range of θ=75°±10° (0°≦θ≦65° to 0°≦θ≦85°) among the light emitted from the LED 101, and The amount of light was measured.

另外,「雙面發光型」的LED101也會得到如圖6至圖9說明的光量測定結果相同的結果,因此,將測定角度θ設定為θ=75°±10°具備臨界性的意義。Further, the "double-sided light-emitting type" LED 101 also has the same result as the light amount measurement results described with reference to FIGS. 6 to 9. Therefore, setting the measurement angle θ to θ=75°±10° has a criticality.

變形例3的光量測定裝置3中的其他構造與圖3及圖4所示之光量測定裝置3的構造相同。The other structure of the light amount measuring device 3 of the third modification is the same as that of the light amount measuring device 3 shown in FIGS. 3 and 4 .

<關於載置桌之應用例><Application example of placing table>

以下,利用圖18說明構成光量測定裝置3的載置桌103的應用例。Hereinafter, an application example of the mounting table 103 constituting the light amount measuring device 3 will be described with reference to Fig. 18 .

圖18係為本發明一實施形態之光量測定裝置的載置桌103的應用例之說明圖。FIG. 18 is an explanatory diagram showing an application example of the mounting table 103 of the light amount measuring device according to the embodiment of the present invention.

在上述的光量測定裝置3中,已說明載置桌103的構造為圖3及圖4所示之構造。In the above-described light amount measuring device 3, the structure of the placing table 103 has been described as the structure shown in Figs. 3 and 4 .

圖3及圖4所示之載置桌103具有玻璃桌103a及切割片103b。The mounting table 103 shown in Figs. 3 and 4 has a glass table 103a and a dicing sheet 103b.

光量測定裝置3的載置桌103的構造並不限定於圖3及圖4所例示的構造,也可以是下述構造。The structure of the mounting table 103 of the light amount measuring device 3 is not limited to the structure illustrated in FIGS. 3 and 4, and may be the following structure.

如圖18所示,應用例的載置桌103具有位於玻璃桌103a下面的反射板103c。As shown in Fig. 18, the mounting table 103 of the application example has a reflecting plate 103c located under the glass table 103a.

反射板103c使用正反射材料形成為大致均勻的平板狀。例如,反射板103c較佳是由反射率90%以上的正反射材料所形成。The reflecting plate 103c is formed into a substantially uniform flat plate shape using a regular reflection material. For example, the reflecting plate 103c is preferably formed of a specular reflection material having a reflectance of 90% or more.

另外,具有反射板103c時,應用例的載置桌103可不具有玻璃桌103a。Further, when the reflector 103c is provided, the mounting table 103 of the application example does not have the glass table 103a.

圖18所示之應用例的玻璃桌103a也與變形例2及變形例3相同,與圖3及圖4所示之光量測定裝置3的玻璃桌103a相同。The glass table 103a of the application example shown in Fig. 18 is the same as the modification 2 and the modification 3, and is the same as the glass table 103a of the light amount measuring device 3 shown in Figs. 3 and 4 .

此應用例的切割片103b也與變形例2及變形例3相同,可為一般的有色切割片,較佳為透明切割片。The dicing sheet 103b of this application example is also the same as the modification 2 and the modification 3, and may be a general colored dicing sheet, preferably a transparent dicing sheet.

應用例的載置桌103中的其他構造與圖3及圖4所示之載置桌103相同。The other structure in the mounting table 103 of the application example is the same as that of the mounting table 103 shown in FIGS. 3 and 4.

應用例的受光模組1為與圖3及圖4所示之受光模組1相同的構造,配置於LED101的上面側。The light receiving module 1 of the application example has the same structure as the light receiving module 1 shown in FIGS. 3 and 4, and is disposed on the upper surface side of the LED 101.

應用例的光量測定裝置3中的載置桌103適用於測定從「上面發光型」的LED101發射的光之光量。The mounting table 103 in the light amount measuring device 3 of the application example is suitable for measuring the amount of light emitted from the "upper light emitting type" LED 101.

另外,也可將具有積分球108的受光模組1(參照圖15)適用於應用例的受光模組1。Further, the light receiving module 1 (see FIG. 15) having the integrating sphere 108 may be applied to the light receiving module 1 of the application example.

應用例的光量測定裝置3中的測定範圍設定機構與圖10至圖14其中之一所示之受光範圍設定機構相同。圖18中省略了測定範圍設定機構的圖示。The measurement range setting mechanism in the light amount measuring device 3 of the application example is the same as the light receiving range setting mechanism shown in one of FIGS. 10 to 14. The illustration of the measurement range setting mechanism is omitted in Fig. 18 .

應用例之光量測定裝置3利用測定範圍設定機構,將測定範圍設定為0°≦θ≦75°±10°(0°≦θ≦65°至0°≦θ≦85°)。藉由此設定,受光模組1能夠接收到從LED101發射的光之中θ=75°±10°為止範圍(0°≦θ≦65°至0°≦θ≦85°的範圍)的光,並測定其光量。The light amount measuring device 3 of the application example sets the measurement range to 0 ° ≦ θ ≦ 75 ° ± 10 ° (0 ° ≦ θ ≦ 65 ° to 0 ° ≦ θ ≦ 85 °) by the measurement range setting means. With this setting, the light receiving module 1 can receive light of a range of θ=75°±10° (0°≦θ≦65° to 0°≦θ≦85°) among the light emitted from the LED 101, And measure the amount of light.

另外,應用例的光量測定裝置3也會得到如圖6至圖9說明的光量測定結果相同的結果,因此,將測定角度θ設定為θ=75°±10°具備臨界性的意義。Further, the light amount measuring device 3 of the application example also obtains the same result as the light amount measurement results described with reference to FIGS. 6 to 9. Therefore, setting the measurement angle θ to θ=75°±10° has a criticality.

應用例之光量測定裝置3中的其他構造與圖3及圖4所示之光量測定裝置3的構造相同。The other structure of the light amount measuring device 3 of the application example is the same as that of the light amount measuring device 3 shown in Figs. 3 and 4 .

上述之本實施形態僅為本發明之較佳實施形態,本發明並不受上揭實施形態之限制,並可做各種未脫離本發明要旨範圍內的變化或 變更,而實施例及變形例等之技術可互相組合。The above-described embodiments are merely preferred embodiments of the present invention, and the present invention is not limited to the above-described embodiments, and various changes or modifications may be made without departing from the scope of the present invention. Modifications, and techniques such as the embodiments and the modifications can be combined with each other.

當LED101為「上面發光型」且於下面具有反射膜時的LED101的光量測定,適合使用其上面側具備受光模組1的光量測定裝置3。例如,圖3及圖4所示之光量測定裝置3、圖15所示之變形例1的光量測定裝置3等。When the LED 101 is the "upper light-emitting type" and the light amount of the LED 101 is measured when the reflective film is formed on the lower surface, the light amount measuring device 3 including the light-receiving module 1 on the upper surface side thereof is preferably used. For example, the light amount measuring device 3 shown in Figs. 3 and 4, the light amount measuring device 3 of the first modification shown in Fig. 15, and the like.

當LED101為「上面發光型」且下面不具有反射膜時的光量測定,適合使用其上面側具備受光模組1、且具備反射板103c的光量測定裝置3,或是其上面側及下面側雙方具有受光模組1的光量測定裝置3。例如,圖18所示之應用例的光量測定裝置3,及圖17所示之變形例3的光量測定裝置3等。When the amount of light is measured when the LED 101 is the "upper light-emitting type" and the reflective film is not provided on the lower surface, it is preferable to use the light-amount measuring device 3 including the light-receiving module 1 on the upper surface side and the reflecting plate 103c, or both the upper side and the lower side. The light amount measuring device 3 having the light receiving module 1 is provided. For example, the light amount measuring device 3 of the application example shown in Fig. 18, and the light amount measuring device 3 of the modified example 3 shown in Fig. 17 and the like.

當LED101為「下面發光型」時的光量測定,適合使用其下面側具備受光模組1的光量測定裝置3,或是其上面側及下面側雙方具有受光模組1的光量測定裝置3。例如,圖16所示之變形例2的光量測定裝置3,及圖17所示之變形例3的光量測定裝置3等。In the measurement of the amount of light when the LED 101 is in the "lower illumination type", it is preferable to use the light amount measuring device 3 including the light receiving module 1 on the lower side thereof or the light amount measuring device 3 having the light receiving module 1 on both the upper side and the lower side. For example, the light amount measuring device 3 of the second modification shown in FIG. 16 and the light amount measuring device 3 of the third modification shown in FIG.

當LED101為「雙面發光型」時的光量測定,適合使用其上面側及下面側雙方具有受光模組1的光量測定裝置3,或是其上面側具備受光模組1、且具備反射板103c的光量測定裝置3。例如,圖17所示之變形例3的光量測定裝置3,及圖18所示之應用例的光量測定裝置3等。When the amount of light of the LED 101 is "double-sided illumination type", it is preferable to use the light amount measuring device 3 having the light receiving module 1 on both the upper side and the lower side, or the light receiving module 1 on the upper side thereof and the reflecting plate 103c. Light quantity measuring device 3. For example, the light amount measuring device 3 of the third modification shown in Fig. 17 and the light amount measuring device 3 of the application example shown in Fig. 18 are used.

然而,以上組合僅為例示,並不排除其他組合。可配合實施裝置進行適當組合。However, the above combinations are merely illustrative and do not exclude other combinations. The combination can be appropriately combined with the implementation device.

<實施形態的構造及效果><Structure and Effect of Embodiment>

本實施形態之發光二極體的光量測定裝置3的特徵在於,具備:一受光模組1,其係與LED101相向配置,接收從LED101所發出之放射狀的光,並測定其光量;一探針109,其係供給電力至LED101,以使LED101發光;以及一受光範圍設定機構,其係根據相對於LED101的發光中心軸LCA之角度,對從LED101發出的光之中使受光模組1受 光之光的範圍即受光範圍進行設定,其中,在一切割片103b上排列有多個LED101,受光範圍設定機構在受光模組1接收從多個排列之LED101發出的光時,將受光範圍設定為不論多個排列之LED101的排列形態為何,使接收到的光之光量的測定誤差在規定比率以下。The light quantity measuring device 3 of the light-emitting diode according to the present embodiment includes a light receiving module 1 that is disposed to face the LED 101, receives the radial light emitted from the LED 101, and measures the amount of light; a needle 109 for supplying electric power to the LED 101 to cause the LED 101 to emit light, and a light receiving range setting mechanism for subjecting the light receiving module 1 to light emitted from the LED 101 according to an angle with respect to the central axis LCA of the LED 101 The range of the light light, that is, the light receiving range, is set in which a plurality of LEDs 101 are arranged on one of the dicing sheets 103b, and the light receiving range setting means sets the light receiving range when the light receiving module 1 receives the light emitted from the plurality of arranged LEDs 101. The measurement error of the amount of received light is equal to or less than a predetermined ratio regardless of the arrangement pattern of the LEDs 101 arranged in a plurality of rows.

藉由此構造,光量測定裝置3可利用簡單的構造實現高精度的測定。With this configuration, the light amount measuring device 3 can realize high-accuracy measurement with a simple configuration.

更進一步,受光模組1與LED101大致平行地配置,受光範圍設定機構將從LED101發出的光之中該角度為0°以上75°±10°以下的光的範圍設定為受光範圍。Further, the light receiving module 1 and the LEDs 101 are arranged substantially in parallel, and the light receiving range setting means sets the range of light having an angle of 0° or more and 75°±10° or less among the lights emitted from the LEDs 101 as the light receiving range.

藉由此構造,光量測定裝置3可利用簡單的構造實現高精度的測定,並且穩定、迅速地測定排列成晶圓狀的多個LED101的光量。With this configuration, the light amount measuring device 3 can realize high-accuracy measurement with a simple structure, and can stably and quickly measure the amount of light of the plurality of LEDs 101 arranged in a wafer shape.

更進一步,受光範圍設定機構具有一移動機構,其係使載置有切割片103b的載置桌103或是受光模組1的其中之一或兩者移動,利用移動機構調整該角度,設定受光範圍。Further, the light receiving range setting mechanism has a moving mechanism that moves one or both of the mounting table 103 or the light receiving module 1 on which the dicing sheet 103b is placed, and adjusts the angle by the moving mechanism to set the light receiving range.

藉由此構造,光量測定裝置3可利用更簡單的構造實現高速、高精度及穩定的測定。With this configuration, the light amount measuring device 3 can realize high-speed, high-accuracy, and stable measurement using a simpler structure.

更進一步,受光範圍設定機構具有一光圈124,其係配置於LED101與受光模組1之間,用以遮蔽從LED101發出的光之一部分,利用該光圈124調整該角度,設定受光範圍。Further, the light receiving range setting means has an aperture 124 disposed between the LED 101 and the light receiving module 1 for shielding a portion of the light emitted from the LED 101, and the aperture 124 is used to adjust the angle to set the light receiving range.

藉由此構造,光量測定裝置3可利用更簡單的構造實現高速、高精度及穩定的測定。With this configuration, the light amount measuring device 3 can realize high-speed, high-accuracy, and stable measurement using a simpler structure.

更進一步,受光範圍設定機構具有一反射體123,其係配置於LED101與受光模組1之間,用以將從LED101發出的光反射至受光模組1,利用反射體123調整該角度,設定受光範圍。Further, the light receiving range setting mechanism has a reflector 123 disposed between the LED 101 and the light receiving module 1 for reflecting the light emitted from the LED 101 to the light receiving module 1 and adjusting the angle by the reflector 123 to set Light receiving range.

藉由此構造,光量測定裝置3可利用更簡單的構造實現高速、高精度及穩定的測定。With this configuration, the light amount measuring device 3 can realize high-speed, high-accuracy, and stable measurement using a simpler structure.

更進一步,受光範圍設定機構具有一菲涅耳透鏡126,其係配置於LED101與受光模組1之間,用以將從LED101發出的光折射至受光模組1,利用菲涅耳透鏡126調整該角度,設定受光範圍。Further, the light receiving range setting mechanism has a Fresnel lens 126 disposed between the LED 101 and the light receiving module 1 for refracting light emitted from the LED 101 to the light receiving module 1 and adjusting by the Fresnel lens 126. This angle sets the light receiving range.

藉由此構造,光量測定裝置3可利用更簡單的構造實現高速、高精度及穩定的測定。With this configuration, the light amount measuring device 3 can realize high-speed, high-accuracy, and stable measurement using a simpler structure.

本實施形態之發光二極體的光量測定裝置3的特徵在於,具備:一受光模組1,其係與LED101大致平行地相向配置,接收從LED101所發出之放射狀的光,並測定其光量;一探針109,其係供給電力至LED101,以使LED101發光;以及一受光範圍設定機構,其係根據相對於LED101的發光中心軸LCA之角度,對從LED101發出的光之中使受光模組1受光之光的範圍即受光範圍進行設定,在一切割片103b上排列有多個LED101,受光範圍設定機構將從LED101發出的光之中角度為0°以上75°±10°以下的光的範圍設定為受光範圍。The light-quantity measuring device 3 of the light-emitting diode according to the present embodiment includes a light-receiving module 1 that is disposed to face the LEDs 101 substantially in parallel, and receives the radial light emitted from the LEDs 101, and measures the amount of light. a probe 109 for supplying electric power to the LED 101 to cause the LED 101 to emit light, and a light receiving range setting mechanism for causing the light receiving mode to be emitted from the light emitted from the LED 101 according to an angle with respect to the central axis of the light emission LCA of the LED 101 The range of the light received by the group 1 is the light receiving range, and a plurality of LEDs 101 are arranged on one of the dicing sheets 103b. The light receiving range setting means selects light from the LED 101 at an angle of 0° or more and 75°±10° or less. The range is set to the light receiving range.

藉由此構造,光量測定裝置3可利用更簡單的構造實現高精度、穩定且快速地測定多個排列成晶圓狀的LED101之光量。With this configuration, the light amount measuring device 3 can realize the high-precision, stable, and rapid measurement of the amount of light of the plurality of LEDs 101 arranged in a wafer shape with a simpler configuration.

本實施形態之發光二極體的光量測定方法的特徵在於,使用一受光模組1測定一LED101,受光模組1與排列於切割片103b上之多個LED101相向配置,接收從LED101所發出之放射狀的光,其具有以下步驟:一發光步驟,其係供給電力至LED101,使LED101發光;一測定範圍設定步驟,其係根據相對於LED101的發光中心軸LCA之角度,對從LED101發出的光之中使受光模組1接收的光範圍即測定範圍進行設定;以及一測定步驟,測定藉由受光模組1接收到的光之光量,其中,受光範圍設定步驟在受光模組1接收由多個排列之LED101發出的光時,將受光範圍設定為不論多個排列之LED101的排列形態為何,使接收到的光之光量的測定誤差在規定比率以下。In the method for measuring the amount of light of the light-emitting diode according to the present embodiment, one LED 101 is measured by a light receiving module 1, and the light receiving module 1 is disposed opposite to the plurality of LEDs 101 arranged on the dicing sheet 103b, and is received by the LED 101. Radial light having the following steps: a light-emitting step of supplying power to the LED 101 to cause the LED 101 to emit light; and a measurement range setting step of emitting the light from the LED 101 according to an angle with respect to the light-emitting central axis LCA of the LED 101 The light range received by the light receiving module 1 is set in the light; and a measuring step is performed to measure the amount of light received by the light receiving module 1 , wherein the light receiving range setting step is received by the light receiving module 1 When the light emitted from the plurality of LEDs 101 is arranged, the light receiving range is set to be equal to or smaller than a predetermined ratio of the amount of light of the received light regardless of the arrangement pattern of the plurality of arranged LEDs 101.

藉由此構造,本實施形態之光量測定方法可利用簡單的構造實 現高精度的測定。With this configuration, the light amount measuring method of the present embodiment can utilize a simple structure. High precision measurement is now available.

本實施形態之發光二極體的光量測定裝置3的特徵在於,具備:一受光模組1,其係接收從LED101所發出之放射狀的光,並測定其光量;一探針109,其係供給電力至LED101,以使LED101發光;以及一測定範圍設定機構,其係根據相對於LED101的發光中心軸LCA之角度,對從LED101發出的光之中使在受光模組1測定的光範圍即測定範圍進行設定,在一切割片103b上排列有多個LED101,測定範圍設定機構將從LED101發出的光之中角度的最大值為75°±10°的光範圍設定為測定範圍。The light quantity measuring device 3 of the light-emitting diode according to the present embodiment includes a light receiving module 1 that receives the radial light emitted from the LED 101 and measures the amount of light thereof. A probe 109 is used. Supplying power to the LED 101 to cause the LED 101 to emit light; and a measurement range setting mechanism for making the range of light measured by the light receiving module 1 among the light emitted from the LED 101 based on the angle of the light emission center axis LCA with respect to the LED 101 The measurement range is set, and a plurality of LEDs 101 are arranged on one dicing sheet 103b, and the measurement range setting means sets the light range from the maximum value of the angle of light emitted from the LED 101 to 75 ° ± 10 ° as the measurement range.

藉由此構造,光量測定裝置3可利用更簡單的構造實現高精度、穩定且快速地測定多個排列成晶圓狀的LED101之光量。With this configuration, the light amount measuring device 3 can realize the high-precision, stable, and rapid measurement of the amount of light of the plurality of LEDs 101 arranged in a wafer shape with a simpler configuration.

本實施形態之發光二極體的光量測定方法的特徵在於,使用一受光模組1測定一LED101,受光模組1與排列於切割片103b上之多個LED101相對,接收從LED101所發出之放射狀的光,其具有以下步驟:一發光步驟,其係供給電力至LED101,使LED101發光;一測定範圍設定步驟,其係根據相對於LED101的發光中心軸LCA之角度,對從LED101發出的光之中使在受光模組1測定的光範圍即測定範圍進行設定;以及一測定步驟,測定藉由受光模組1接收到的光之光量,測定範圍設定步驟將發出的光之中角度的最大值為75°±10°的光範圍設定為測定範圍。The light amount measuring method of the light-emitting diode according to the present embodiment is characterized in that one LED 101 is measured using a light receiving module 1, and the light receiving module 1 is opposed to the plurality of LEDs 101 arranged on the cutting piece 103b, and receives radiation emitted from the LED 101. The light having the following steps: a light-emitting step of supplying power to the LED 101 to cause the LED 101 to emit light; and a measuring range setting step of light emitted from the LED 101 according to an angle with respect to the central axis of the light-emitting axis LCA of the LED 101 The measurement range is set in the light range measured by the light receiving module 1, and the measurement step measures the amount of light received by the light receiving module 1, and the angle in the measurement range setting step is the largest among the emitted light. A light range of 75 ° ± 10 ° is set as the measurement range.

藉由此構造,本實施形態之光量測定方法可利用更簡單的構造實現高精度、穩定且快速地測定多個排列成晶圓狀的LED101之光量。With this configuration, the light amount measuring method of the present embodiment can realize the high-precision, stable, and rapid measurement of the amount of light of the plurality of LEDs 101 arranged in a wafer shape with a simpler structure.

1‧‧‧受光模組1‧‧‧ light receiving module

101‧‧‧發光二極體101‧‧‧Lighting diode

103‧‧‧載置桌103‧‧‧Loading table

103a‧‧‧玻璃桌103a‧‧‧glass table

103b‧‧‧切割片103b‧‧‧cutting piece

105‧‧‧光檢測器105‧‧‧Photodetector

107‧‧‧保持部107‧‧‧ Keeping Department

107a‧‧‧遮蔽部107a‧‧‧Shading Department

107b‧‧‧側面部107b‧‧‧ Side section

107c‧‧‧圓形開口部107c‧‧‧Circular opening

109‧‧‧探針109‧‧‧Probe

111‧‧‧訊號線111‧‧‧Signal line

113‧‧‧放大器113‧‧‧Amplifier

115‧‧‧通訊線115‧‧‧Communication line

LCA‧‧‧發光中心軸LCA‧‧‧Lighting Center Shaft

Claims (9)

一種光量測定裝置,用於測定發光二極體,其具備:一受光部,其係與該發光二極體相向配置,接收由該發光二極體所發出之放射狀的光,並測定其光量;一探針,其係供給電力至該發光二極體,以使該發光二極體發光;以及一受光範圍設定機構,其係根據相對於該發光二極體的發光中心軸之角度,對該發光二極體發出的光之中使該受光部受光之光的範圍即受光範圍進行設定;其中該受光部與該發光二極體大致平行地配置;排列有多個該發光二極體;該受光範圍設定機構在該受光部接收從該多個排列之該發光二極體發出的光時,將該發出的光之中之該角度為0°以上75°±10°以下的光的範圍設定為該受光範圍,使得不論該多個排列之該發光二極體的排列形態為何,該接收到的光之光量的測定誤差在規定比率以下。 A light amount measuring device for measuring a light emitting diode, comprising: a light receiving portion disposed to face the light emitting diode, receiving the radial light emitted by the light emitting diode, and measuring the amount of light a probe for supplying power to the light emitting diode to cause the light emitting diode to emit light, and a light receiving range setting mechanism according to an angle with respect to a central axis of the light emitting diode The light emitted by the light-emitting diode sets a range of light that is received by the light-receiving portion, that is, a light-receiving range; wherein the light-receiving portion is disposed substantially in parallel with the light-emitting diode; and a plurality of the light-emitting diodes are arranged; When the light receiving unit receives the light emitted from the plurality of arranged light emitting diodes, the light receiving range setting means sets the angle of the emitted light to be 0° or more and 75°±10° or less. The light receiving range is set such that the measurement error of the received light amount is equal to or less than a predetermined ratio regardless of the arrangement pattern of the plurality of arrays of the light emitting diodes. 如請求項1之光量測定裝置,其中該受光範圍設定機構具有一移動機構,其係使載置有該發光二極體的載置桌或是該受光部的其中之一或兩者移動,利用該移動機構調整該角度,設定該受光範圍。 The light amount measuring device according to claim 1, wherein the light receiving range setting means has a moving mechanism for moving one or both of the mounting table on which the light emitting diode is placed or the light receiving portion, and utilizing The moving mechanism adjusts the angle to set the light receiving range. 如請求項1之光量測定裝置,其中該受光範圍設定機構具有一光圈,其係配置於該發光二極體與該受光部之間,用以遮蔽該發出的光之一部分,利用該光圈調整該角度,設定該受光範圍。 The light quantity measuring device of claim 1, wherein the light receiving range setting mechanism has an aperture disposed between the light emitting diode and the light receiving portion to shield a portion of the emitted light, and the aperture is adjusted by the aperture Angle, set the light receiving range. 如請求項1之光量測定裝置,其中該受光範圍設定機構具有一反射體,其係配置於該發光二極體與該受光部之間,用以將該發 出的光反射至該受光部,利用該反射體調整該角度,設定該受光範圍。 The light quantity measuring device of claim 1, wherein the light receiving range setting mechanism has a reflector disposed between the light emitting diode and the light receiving portion for use in the transmitting The emitted light is reflected to the light receiving portion, and the angle is adjusted by the reflector to set the light receiving range. 如請求項1之光量測定裝置,其中該受光範圍設定機構具有一菲涅耳透鏡,其係配置於該發光二極體與該受光部之間,用以將該發出的光折射至該受光部,利用該菲涅耳透鏡調整該角度,設定該受光範圍。 The light quantity measuring device of claim 1, wherein the light receiving range setting mechanism has a Fresnel lens disposed between the light emitting diode and the light receiving portion for refracting the emitted light to the light receiving portion The angle is adjusted by the Fresnel lens to set the light receiving range. 一種光量測定裝置,用於測定發光二極體,其具備:一受光部,其係與該發光二極體大致平行地相向配置,接收由該發光二極體所發出之放射狀的光,並測定其光量;一探針,其係供給電力至該發光二極體,以使該發光二極體發光;以及一受光範圍設定機構,其係根據相對於該發光二極體的發光中心軸之角度,對該發光二極體發出的光之中使該受光部受光之光的範圍即受光範圍進行設定;其中排列有多個該發光二極體;該受光範圍設定機構將該發出的光之中該角度為0°以上75°±10°以下的光的範圍設定為該受光範圍。 A light amount measuring device for measuring a light emitting diode, comprising: a light receiving portion that is disposed to face substantially parallel to the light emitting diode, and receives the radial light emitted by the light emitting diode, and Measuring a light amount; a probe for supplying electric power to the light emitting diode to cause the light emitting diode to emit light; and a light receiving range setting mechanism according to a central axis of the light emitting relative to the light emitting diode The angle is set in a range of light emitted by the light-emitting diode, that is, a light-receiving range, wherein a plurality of the light-emitting diodes are arranged; and the light-receiving range setting means emits the light The range of light in which the angle is 0° or more and 75°±10° or less is set as the light receiving range. 一種光量測定方法,為發光二極體的光量測定方法,其使用與多個被排列之該發光二極體相向配置之一受光機構,接收從該發光二極體所發出之放射狀的光,其具有以下步驟:一發光步驟,其係供給電力至該發光二極體,使該發光二極體發光;一受光範圍設定步驟,其係根據相對於該發光二極體的發光中心軸之角度,對該發光二極體發出的光之中使該受光機構受光之光的範圍即受光範圍進行設定;以及一測定步驟,其測定藉由該受光機構接收到的光之光量;其 中該受光範圍設定步驟在該受光機構接收從該多個排列之該發光二極體發出的光時,將該發出的光之中之該角度為0°以上75°±10°以下的光的範圍設定為該受光範圍,使得不論該多個排列之該發光二極體的排列形態為何,該接收到的光之光量的測定誤差在規定比率以下。 A method for measuring the amount of light is a method for measuring the amount of light of a light-emitting diode, and a light-receiving mechanism is disposed to face a plurality of aligned light-emitting diodes, and receives radial light emitted from the light-emitting diode. The method has the following steps: a light-emitting step of supplying power to the light-emitting diode to cause the light-emitting diode to emit light; and a light-receiving range setting step according to an angle with respect to a central axis of the light-emitting diode And setting a light receiving range which is a range of light emitted by the light receiving means among the light emitted from the light emitting diode; and a measuring step of measuring a light amount of light received by the light receiving means; In the light receiving range setting step, when the light receiving means receives light emitted from the plurality of arranged light emitting diodes, the angle of the emitted light is 0° or more and 75°±10° or less. The range is set to the light receiving range such that the measurement error of the received light amount is equal to or less than a predetermined ratio regardless of the arrangement pattern of the plurality of arrays of the light emitting diodes. 一種光量測定裝置,用於測定發光二極體,其具備:一受光部,其係接收從該發光二極體所發出之放射狀的光,並測定其光量;一探針,其係供給電力至該發光二極體,以使該發光二極體發光;及一測定範圍設定機構,其係根據相對於該發光二極體的發光中心軸之角度,對該發光二極體發出的光之中使在該受光部測定的光範圍即測定範圍進行設定;其中排列有多個該發光二極體;該測定範圍設定機構將該發出的光之中該角度的最大值為75°±10°的光範圍設定為該測定範圍。 A light quantity measuring device for measuring a light emitting diode, comprising: a light receiving unit that receives the radial light emitted from the light emitting diode and measures the amount of light; and a probe that supplies power a light emitting diode to cause the light emitting diode to emit light; and a measuring range setting mechanism for emitting light to the light emitting diode according to an angle with respect to a central axis of the light emitting diode The measurement range is set in the light range measured by the light receiving unit; wherein the plurality of light emitting diodes are arranged; the measurement range setting mechanism has a maximum value of the angle of the emitted light of 75°±10° The light range is set to the measurement range. 一種光量測定方法,為發光二極體的光量測定方法,其使用一受光機構接收從多個被排列之該發光二極體所發出之放射狀的光,且具有以下步驟:一發光步驟,其係供給電力至該發光二極體,使該發光二極體發光;一測定範圍設定步驟,其係根據相對於該發光二極體的發光中心軸之角度,對該發光二極體發出的光之中使在該受光機構測定的光範圍即測定範圍進行設定;以及一測定步驟,其測定藉由該受光機構接收到的光之光量;其 中該測定範圍設定步驟將該發出的光之中該角度的最大值為75°±10°的光範圍設定為該測定範圍。 A method for measuring the amount of light, which is a method for measuring the amount of light of a light-emitting diode, which receives a radial light emitted from a plurality of arranged light-emitting diodes using a light-receiving mechanism, and has the following steps: a light-emitting step Supplying electric power to the light emitting diode to cause the light emitting diode to emit light; a measuring range setting step of emitting light to the light emitting diode according to an angle with respect to an emission central axis of the light emitting diode The light range measured by the light receiving means, that is, the measurement range is set; and a measuring step of measuring the amount of light received by the light receiving means; The measurement range setting step sets the light range of the maximum value of the angle of the emitted light to 75°±10° as the measurement range.
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