CN106500843A - A kind of imaging spectrometer optimum image plane calibration method and device - Google Patents
A kind of imaging spectrometer optimum image plane calibration method and device Download PDFInfo
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Abstract
The invention discloses a kind of imaging spectrometer optimum image plane calibration method and device, which adopts step-scan collimator tube reticle position, the angle that parallel light tube and imaging spectrometer optical axis are adjusted by three-dimensional rotation platform, measured by out of focus and software analysis process to detect the optimum image plane position of imaging spectrometer, without the need for being frequently moved into the position as spectrometer detectors, substantially reduce detection working strength；Also, the optimal imaging image planes of imaging spectrometer are fitted using the method for the different visual field different wave length MTF maximums for calculating imaging spectrometer also, accuracy of detection is significantly increased；Meanwhile, using special graticle, can be used for the comprehensive evaluating of imaging spectrometer synthesis aberration, Spectral line bend and chromatic variation of distortion；Additionally, the monochromatic light of different wave length is coupled using optical fiber image transmission beam, can be used for the Fast Calibration of the spectral position of imaging spectrometer, can be used for the demarcation of imaging spectrometer field spectrum.
Description
Technical field
The present invention relates to spectral technique field, more particularly to a kind of imaging spectrometer optimum image plane calibration method and device.
Background technology
Imaging spectrometer is a new generation that the progress of the demand and photoelectric technology recently as earth observation is got up
Remote sensing instrument, traditional two-dimensional imaging remote sensing technology is effectively combined with spectrometer technology together with, obtaining object of observation
The spectral information of target is obtained while two-dimensional space information.The spectral image data for being obtained includes the spectrum letter of target
Breath, can reveal that spectral characteristic and the material composition of atural object, be widely used in the detection such as air, ocean and land.
One important indicator of airborne wide visual field imaging spectrometer is exactly big visual field, and visual field is the important finger of remote sensing instrument
Mark, it determine remote sensing instrument Global coverage and local coverage cycle.Total visual field is bigger, and the cycle is less, and operating efficiency is got over
High.
Airborne big view field imaging spectrometer completes large-scale push-scanning image, the clutter reflections sun by the motion of flying platform
After the imaged spectrometer of light, the light of different wave length converges at the diverse location of focus planardetector, due to preset lens aberration and
The curvature of field is present, and the light of different wave length its position of focal plane after system is not fully consistent, and this affects part to a great extent
The resolution capability of spectrum segment partial field of view.General aberration characteristics curve is that value is drawn in Gauss image planes, but Gaussian image
Face is not necessarily the optimum image plane of actual imaging system, therefore, it can choose optimum image plane by the method for out of focus.In imaging
In the development process of spectrometer, particularly the school stage is filled in system, the placement location of planar array detector is accorded with to the full extent simultaneously
The requirement for closing each wave band position of focal plane becomes the key issue for being currently needed for solving.Conventional method is typically simulated using parallel light tube
Infinity atural object, the position of focal plane for measuring system using reading microscope, fine setting face battle array detection based on this position of focal plane
The position of device a to relative ideal, the shortcoming of this method are to measure using visual system and judge, by personal main
The impact of sight factor is larger, while the adjusting process can not be solved under the resolution ratio of partial spectrum band part visual field to the full extent
The problem of drop.
Airborne big view field imaging spectrometer is due to the vibration of flying platform, after many subtasks, the spectrum of imaging spectrometer
Line position is susceptible to offset, and affects the spectrum accuracy of imaging spectrometer atural object, therefore, the light to imaging spectrometer in the wild
It is also very necessary with correction that spectral position carries out calibration.
Content of the invention
It is an object of the invention to provide a kind of imaging spectrometer optimum image plane calibration method and device, without the need for being constantly adjusted to
As the detector of spectrometer, by image procossing after one-shot measurement, the position of optimum image plane is fitted, detector reconditioning is calculated
The trim amount of pad, realizes that imaging spectrometer is docked with the fast accurate of detector, is conducive to wide visual field hyperspectral imager to detect
The fast and accurately adjustment of device.
The purpose of the present invention is achieved through the following technical solutions：
A kind of imaging spectrometer optimum image plane calibration device, including：The adjustable parallel light tube of target position, three-dimensional rotation
Platform, imaging spectrometer and computer control system；Wherein, the adjustable parallel light tube of target position is placed on three-dimensional rotation platform
On, and the adjustable parallel light tube of target position and imaging spectrometer common optical axis or at an angle；
The adjustable parallel light tube of the target position includes：Multispectral light source, frosted glass, graticle, motorized precision translation stage with
Collimating mirror；The multispectral light source, frosted glass, graticle and collimating mirror set gradually, and multispectral light source, frosted glass and graduation
Plate is placed on motorized precision translation stage；
The imaging spectrometer includes：Preset lens, spectrometer, detector reconditioning pad and the detector for setting gradually；
The motorized precision translation stage, three-dimensional rotation platform and detector are connected with computer control system.
According to the technical indicator of imaging spectrometer on the graticle, specific pattern is provided with, so as to realize imaging spectral
The comprehensive evaluating of instrument synthesis aberration, Spectral line bend and chromatic variation of distortion.
The multispectral light source is the multispectral light source coupled using optical fiber image transmission beam, for imaging spectrometer spectral position
Fast Calibration.
A kind of imaging spectrometer optimum image plane calibration method, the method are optimal using the aforesaid imaging spectrometer of claim
Image planes calibration device realizes that its step is as follows：
Step a, adjustment graticle are located at the focal plane of collimating mirror, and now the position coordinates of graticle is Z0；
Step b, the adjustable parallel light pipe of adjustment target surface and imaging spectrometer common optical axis；
Step c, translation stage scanning initial, final position and step information are set using computer control system；
Step d, opening multispectral light source, light source are radiated on graticle after the even light of frosted glass, and collimated mirror simulation is defeated
Go out the scenery of different object distances, be imaged on the detector after imaged spectrometer preset lens and spectrometer light splitting；Computer controls system
System control translation stage is scanned according to the relevant information for setting, also by the image letter of detector collection and storage graticle
Breath, and record corresponding positional information Z of graticle1,Z2,......,Zn；
Step e, computer control system calculate Z according to the image information for obtaining1,Z2,......,ZnDifferent wave length is corresponding
Modulation transfer function, when calculating Same Wavelength MTF highests, the position coordinates of corresponding graticle, is designated as Zband, by with
Lower formula calculates the trim amount of same visual field Same Wavelength reconditioning pad, so as to obtain same visual field different wave length optimum image plane position
And the trim amount of detector reconditioning pad：
In above formula, fImaging spectrometerFor the focal length of imaging spectrometer, fParallel light tubeFocal length for the adjustable parallel light pipe of target surface；
Step f, using computer control system control three-dimensional rotation platform rotation so that the adjustable parallel light pipe of target surface and imaging
Spectrometer optical axis is at a certain angle, repeat the above steps c～step e, obtains the optimum image plane position of different visual fields；
Step g, the optimum image plane position according to different visual fields, the optimal picture that imaging spectrometer is obtained by data fitting
Face, the trim amount of calculating detector reconditioning pad and inclination angle.
The method also includes：Pattern on predetermined graticle；Its process is as follows：
Determine the focal length f of spectrometerImaging spectrometer, detector Pixel size p and the adjustable parallel light pipe of target surface focal length be
fParallel light tube；
Calculate striped live width d of the imaging spectrometer static state transmission function adjustable parallel light pipe focal length of corresponding target surface1For：
Calculate striped live width d of the imaging spectrometer dynamic transfer function adjustable parallel light pipe focal length of corresponding target surface2For：
According to striped live width d1With striped live width d2Determine the pattern on graticle.
As seen from the above technical solution provided by the invention, step-scan collimator tube reticle position is adopted 1),
The angle that parallel light tube and imaging spectrometer optical axis are adjusted by three-dimensional rotation platform, is measured by out of focus and software analysis are processed
To detect the optimum image plane position of imaging spectrometer, without the need for being frequently moved into the position as spectrometer detectors, detection work is made
Intensity is substantially reduced；2) using the method fitting imaging of the different visual field different wave length MTF maximums for calculating imaging spectrometer
The optimal imaging image planes of spectrometer, accuracy of detection are significantly increased；3) using special graticle, can be used for imaging spectrometer comprehensive
Close the comprehensive evaluating of aberration, Spectral line bend and chromatic variation of distortion；4) monochromatic light of different wave length is coupled using optical fiber image transmission beam, can be with
For the Fast Calibration of the spectral position of imaging spectrometer, can be used for the demarcation of imaging spectrometer field spectrum.
Description of the drawings
In order to be illustrated more clearly that the technical scheme of the embodiment of the present invention, below will be to using needed for embodiment description
Accompanying drawing be briefly described, it should be apparent that, drawings in the following description are only some embodiments of the present invention, for this
For the those of ordinary skill in field, on the premise of not paying creative work, can be obtaining other according to these accompanying drawings
Accompanying drawing.
Fig. 1 is a kind of schematic diagram of imaging spectrometer optimum image plane calibration device provided in an embodiment of the present invention；
Fig. 2 is the multispectral light source schematic diagram of utilization optical fiber image transmission beam coupling provided in an embodiment of the present invention；
Fig. 3 is imaging spectrometer optimum image plane calibration flow chart provided in an embodiment of the present invention；
Fig. 4 is graticle pattern schematic diagram provided in an embodiment of the present invention；
Fig. 5 is the mtf value curve map of the corresponding graticle diverse locations of fitting wavelength 650nm provided in an embodiment of the present invention
Fig. 6 is that imaging spectrometer image quality provided in an embodiment of the present invention evaluates measuring method flow chart.
Specific embodiment
Accompanying drawing in reference to the embodiment of the present invention, to the embodiment of the present invention in technical scheme carry out clear, complete
Ground description, it is clear that described embodiment is only a part of embodiment of the invention, rather than whole embodiment.Based on this
Inventive embodiment, the every other enforcement obtained under the premise of creative work is not made by those of ordinary skill in the art
Example, belongs to protection scope of the present invention.
The embodiment of the present invention provides a kind of imaging spectrometer optimum image plane calibration device；As shown in figure 1, which mainly includes：
The adjustable parallel light tube 10 of target position, three-dimensional rotation platform 11, imaging spectrometer 13 and computer control system 12；Wherein,
The adjustable parallel light tube 10 of target position is placed on three-dimensional rotation platform 11, and the adjustable parallel light tube 10 of target position and imaging
13 common optical axis of spectrometer or at an angle；
The adjustable parallel light tube 10 of the target position includes：Multispectral light source 1, frosted glass 2, graticle 3, electric translation
Platform 4 and collimating mirror 5；The multispectral light source 1, frosted glass 2, graticle 3 are set gradually with collimating mirror 5, and multispectral light source 1,
Frosted glass 2 is placed on motorized precision translation stage 4 with graticle 3；
The imaging spectrometer 13 includes：Preset lens 8, spectrometer 9, detector reconditioning pad 7 and the detector for setting gradually
6；
The motorized precision translation stage 4, three-dimensional rotation platform 11 and detector 6 are connected with computer control system 12.
In the embodiment of the present invention, according to the technical indicator of imaging spectrometer 13 on the graticle 3, specific figure is provided with
Sample, so that realize the comprehensive evaluating of imaging spectrometer synthesis aberration, Spectral line bend and chromatic variation of distortion.
Additionally, the multispectral light source is the multispectral light source coupled using optical fiber image transmission beam, can be used for imaging spectrometer
The Fast Calibration of spectral position.As shown in Fig. 2 being the multispectral light source schematic diagram coupled using optical fiber image transmission beam, wherein 17 are
The controller of different wave length monochromatic source；18 is the monochromatic source LD lamp of different wave length；19 is optical fiber image transmission beam.
Another embodiment of the present invention also provides a kind of imaging spectrometer optimum image plane calibration method, the aforesaid imaging spectral
Instrument optimum image plane calibration device realizes that its step is as follows：
Step a, adjustment graticle 3 are located at the focal plane of collimating mirror 5, and now the position coordinates of graticle 3 is Z0.
The adjustable parallel light pipe 10 of step b, adjustment target surface and 13 common optical axis of imaging spectrometer.
Step c, the scanning that translation stage 4 is set using computer control system 12 initial, final position and step information.
Step d, opening multispectral light source 1, light source are radiated on graticle 3 after 2 even light of frosted glass, 5 mould of collimated mirror
Intend the scenery of output different object distances, be imaged on the detector after imaged spectrometer preset lens 8 and 9 light splitting of spectrometer；Computer
Control system 12 controls translation stage 4 and is scanned according to the relevant information for setting, also by the collection of detector 6 and storage graticle
3 image information, and record 3 corresponding positional information Z of graticle1,Z2,......,Zn；
Step e, computer control system 12 calculate Z according to the image information for obtaining1,Z2,......,ZnDifferent wave length pair
The MTF (modulation transfer function) for answering, when calculating Same Wavelength MTF highests, the position coordinates of corresponding graticle, is designated as Zband,
The trim amount that same visual field Same Wavelength reconditioning pad is calculated by below equation, so that obtain same visual field different wave length optimum image plane
Position and the trim amount of detector reconditioning pad：
In above formula, fImaging spectrometerFor the focal length of imaging spectrometer, fParallel light tubeFocal length for the adjustable parallel light pipe of target surface；
Exemplary, it is possible to use the method for curve matching asks for the corresponding graticle position coordinates Z of MTF maximumsband.
Step f, using computer control system control three-dimensional rotation platform rotation so that the adjustable parallel light pipe of target surface and imaging
Spectrometer optical axis is at a certain angle, repeat the above steps c～step e, obtains the optimum image plane position of different visual fields；
Step g, the optimum image plane position according to different visual fields, the optimal picture that imaging spectrometer is obtained by data fitting
Face, the trim amount of calculating detector reconditioning pad and inclination angle.
Exemplary, it is possible to use the method for surface fitting asks for the best curved surface of imaging spectrometer image quality, according to
Surface fitting goes out a best fit plane and causes relative deviation between curved surface and plane minimum, and the plane is used as imaging spectrometer
Optimum image plane, and calculate trim amount and the inclination angle of reconditioning pad.
The such scheme of the embodiment of the present invention, using out of focus measuring method, without the need for constantly adjusting the detection of imaging spectrometer
Device, by image procossing after one-shot measurement, fits the position of optimum image plane, calculates the trim amount of detector reconditioning pad, real
Existing imaging spectrometer is docked with the fast accurate of detector, is conducive to wide visual field hyperspectral imager detector fast and accurately
Adjustment.
Additionally, the step of said method is carried out before a, also predefining the pattern on graticle；Its process is as follows：
Determine the focal length f of spectrometerImaging spectrometer, detector Pixel size p and the adjustable parallel light pipe of target surface focal length be
fParallel light tube；
Calculate striped live width d of the imaging spectrometer static state transmission function adjustable parallel light pipe focal length of corresponding target surface1For：
Calculate striped live width d of the imaging spectrometer dynamic transfer function adjustable parallel light pipe focal length of corresponding target surface2For：
According to striped live width d1With striped live width d2Determine the pattern on graticle.
The graticle pattern for determining by the way, can also measure the point spread function of different visual field different wave lengths simultaneously
Number PSF, for the comprehensive evaluating of the comprehensive aberration, Spectral line bend and chromatic variation of distortion of imaging spectrometer.
In order to make it easy to understand, illustrating with reference to specific example.
Example one
As shown in figure 3, being imaging spectrometer optimum image plane calibration flow chart, which mainly includes：
A () determines the systematic parameter of tested imaging spectrometer, the focal length f of imaging spectrometerImaging spectrometer=224mm, imaging
Angle of half field-of view ω=4 ° of spectrometer, detector Pixel size p=16um, the focal length of the adjustable parallel light pipe of target surface are
fParallel light tube=1000mm.Then the streak line of the corresponding 1000mm parallel light tubes of imaging spectrometer static state transmission function is a width ofThe streak line of the corresponding 1000mm parallel light tubes of imaging spectrometer dynamic transfer function is a width ofGraticle pattern is designed as shown in figure 4, wherein according to result of calculation, 14 is cross
Silk target；15 is Point Target；16 is stripe target.
The adjustable parallel light pipe 10 of (b) adjustment target surface and 13 common optical axis of imaging spectrometer.
C () starts the analysis measurement software in main control computer, be input into relevant parameter, the adjustable parallel light pipe 10 of adjustment target surface
Graticle 3 be located at parallel light tube collimating mirror focal plane at, now the position coordinates of graticle 3 be Z0=46.4mm.Arrange flat
Moving stage 4 scans initial position co-ordinates Z1=30mm, step information are 0.5mm, final position coordinate Zn=60mm, opens multispectral
Light source, light source are radiated on graticle after the even light of frosted glass, the scenery of collimated mirror simulation output different object distances, imaged light
It is imaged on the detector after spectrometer preset lens spectrometer light splitting, translation stage 4 is arranged according to program and is scanned, computer controls system
Image information of the system 12 by the collection storage graticle 3 of detector 6 of imaging spectrometer 13, and record the position letter of graticle 3
Breath Z1,Z2,......,Zn；Computer control system 12 calculates Z according to the image information that detector 6 is obtained1,Z2,......,Zn
The corresponding MTF of different wave length, calculates the position coordinates of corresponding graticle 3 during 650nm transmission function highests, as shown in figure 5, note
For Z650=47mm, can by below equation can obtain central vision wavelength for 650nm when in theory 7 trim amount of reconditioning pad should beCentral vision 450nm, 500nm, 550nm, 600nm can be calculated in the same manner,
The position coordinates of corresponding graticle and theory during 700nm, 750nm, 800nm, 850nm, 900nm, 950nm transmission function highest
Upper 7 trim amount of reconditioning pad.
D () arranges 11 information of three-dimensional rotation platform, the adjustable parallel light pipe 10 of adjustment target surface and 13 optical axis included angle of imaging spectrometer
For 2 °, repeat step (c) arranges optical axis included angle in the same manner for 4 °, -2 °, -4 °, and repeat step (c) obtains whole image planes ideal picture
The position coordinates in face；
E () obtains the optimum image plane of imaging spectrometer by data fitting, the trim amount of calculating detector reconditioning pad 7 and
Inclination angle, such that it is able to realize that imaging spectrometer is docked with the fast accurate of detector.
Example two
Have been previously mentioned, the graticle in the embodiment of the present invention carries specific pattern, thus can realize imaging
The comprehensive evaluating of the comprehensive aberration, Spectral line bend and chromatic variation of distortion of spectrometer.Imaging spectrometer imaging matter is mainly introduced in this example
Amount evaluation measuring method, as shown in fig. 6, which mainly includes：
A () determines the systematic parameter of tested imaging spectrometer, the focal length f of imaging spectrometerImaging spectrometer=224mm,
Angle of half field-of view ω=4 ° of imaging spectrometer, detector Pixel size p=16um, Jiao of the adjustable parallel light pipe of target surface
Away from for fParallel light tube=1000mm.Then the streak line of the corresponding 1000mm parallel light tubes of imaging spectrometer static state transmission function is a width ofThe streak line of the corresponding 1000mm parallel light tubes of imaging spectrometer dynamic transfer function is a width ofGraticle pattern is designed according to result of calculation as shown in Figure 4.
B () starts the analysis measurement software in computer control system 12, be input into relevant parameter, and adjustment target surface is adjustable parallel
The graticle 3 of light pipe 10 is located at the focal plane of parallel light tube collimating mirror 5, and now the position coordinates of graticle 3 is Z0=46.4mm,
Adjustment graticle 3, it is φ to make Point Target 151Circular hole pattern be imaged on the detector.11 information of three-dimensional turntable, adjustment are set
The adjustable parallel light pipe 10 of target surface is 0 ° with 13 optical axis included angle of imaging spectrometer, opens multispectral light source 1, the spy of multispectral light source 1
Standing wave a length of 442nm, 532nm, 660nm, 808nm, 904nm, 1064nm, computer control system 12 pass through imaging spectrometer 13
The collection storage graticle 3 of detector 6 image information, and calculate the point spread function of each point source target picture in image information,
And the centroid position coordinate of each point hot spot.
C () arranges 11 information of three-dimensional turntable, the adjustable parallel light pipe 10 of adjustment target surface with 13 optical axis included angle of imaging spectrometer is
2 °, 4 °, -2 °, -4 °, repeat step (b).
D () calculates the point spread function of imaging spectrometer difference visual field different wave length is used for the comprehensive of 13 aberration of imaging spectrometer
Evaluation and test is closed, the point facula mass center position coordinates according to different visual field different wave lengths calculates the spectral position of imaging spectrometer 13, spectrum
Line bending and the size of chromatic variation of distortion.
The such scheme of the embodiment of the present invention, mainly has the advantage that：
1) step-scan collimator tube reticle position is adopted, parallel light tube and imaging spectral is adjusted by three-dimensional rotation platform
The angle of instrument optical axis, is measured by out of focus and software analysis process to detect the optimum image plane position of imaging spectrometer, need not
The position as spectrometer detectors is frequently moved into, substantially reduces detection working strength.
2) imaging spectrometer is fitted using the method for the different visual field different wave length MTF maximums for calculating imaging spectrometer
Optimal imaging image planes, accuracy of detection are significantly increased.
3) using special graticle, can be used for the comprehensive of imaging spectrometer synthesis aberration, Spectral line bend and chromatic variation of distortion
Close evaluation and test.
4) using optical fiber image transmission beam couple different wave length monochromatic light, can be used for imaging spectrometer spectral position fast
Speed is demarcated, and can be used for the demarcation of imaging spectrometer field spectrum.
The above, the only present invention preferably specific embodiment, but protection scope of the present invention is not limited thereto,
Any those familiar with the art in the technical scope of present disclosure, the change or replacement that can readily occur in,
Should all be included within the scope of the present invention.Therefore, protection scope of the present invention should be with the protection model of claims
Enclose and be defined.
Claims (5)
1. a kind of imaging spectrometer optimum image plane calibration device, it is characterised in that include：The adjustable parallel light tube of target position,
Three-dimensional rotation platform, imaging spectrometer and computer control system；Wherein, the adjustable parallel light tube of target position is placed on three-dimensional
On turntable, and the adjustable parallel light tube of target position and imaging spectrometer common optical axis or at an angle；
The adjustable parallel light tube of the target position includes：Multispectral light source, frosted glass, graticle, motorized precision translation stage and collimation
Mirror；The multispectral light source, frosted glass, graticle and collimating mirror set gradually, and multispectral light source, frosted glass and graticle are put
Put on motorized precision translation stage；
The imaging spectrometer includes：Preset lens, spectrometer, detector reconditioning pad and the detector for setting gradually；
The motorized precision translation stage, three-dimensional rotation platform and detector are connected with computer control system.
2. a kind of imaging spectrometer optimum image plane calibration device according to claim 1, it is characterised in that the graticle
On according to the technical indicator of imaging spectrometer, be provided with specific pattern, so as to realize imaging spectrometer synthesis aberration, Spectral line bend
And the comprehensive evaluating of chromatic variation of distortion.
3. a kind of imaging spectrometer optimum image plane calibration device according to claim 1, it is characterised in that described multispectral
Light source is the multispectral light source coupled using optical fiber image transmission beam, for the Fast Calibration of imaging spectrometer spectral position.
4. a kind of imaging spectrometer optimum image plane calibration method, it is characterised in that the method utilizes any one of claim 1-2 institute
The imaging spectrometer optimum image plane calibration device that states realizes that its step is as follows：
Step a, adjustment graticle are located at the focal plane of collimating mirror, and now the position coordinates of graticle is Z0；
Step b, the adjustable parallel light pipe of adjustment target surface and imaging spectrometer common optical axis；
Step c, translation stage scanning initial, final position and step information are set using computer control system；
Step d, opening multispectral light source, light source are radiated on graticle after the even light of frosted glass, and collimated mirror simulation output is not
With the scenery of object distance, it is imaged on the detector after imaged spectrometer preset lens and spectrometer light splitting；Computer control system control
Translation stage processed is scanned according to the relevant information for setting, also by detector collection and the image information for storing graticle, and
Corresponding positional information Z of record graticle1,Z2,......,Zn；
Step e, computer control system calculate Z according to the image information for obtaining1,Z2,......,ZnThe corresponding tune of different wave length
Modulation trnasfer function MTF, when calculating Same Wavelength MTF highests, the position coordinates of corresponding graticle, is designated as Zband, by following public affairs
Formula calculates the trim amount of same visual field Same Wavelength reconditioning pad, so as to obtain same visual field different wave length optimum image plane position and
The trim amount of detector reconditioning pad：
In above formula, fImaging spectrometerFor the focal length of imaging spectrometer, fParallel light tubeFocal length for the adjustable parallel light pipe of target surface；
Step f, using computer control system control three-dimensional rotation platform rotation so that the adjustable parallel light pipe of target surface and imaging spectral
Instrument optical axis is at a certain angle, repeat the above steps c～step e, obtains the optimum image plane position of different visual fields；
Step g, the optimum image plane position according to different visual fields, the optimum image plane that imaging spectrometer is obtained by data fitting, meter
Calculate trim amount and the inclination angle of detector reconditioning pad.
5. a kind of imaging spectrometer optimum image plane calibration method according to claim 4, it is characterised in that the method is also wrapped
Include：Pattern on predetermined graticle；Its process is as follows：
Determine the focal length f of spectrometerImaging spectrometer, detector Pixel size p and the adjustable parallel light pipe of target surface focal length be fParallel light tube；
Calculate striped live width d of the imaging spectrometer static state transmission function adjustable parallel light pipe focal length of corresponding target surface1For：
Calculate striped live width d of the imaging spectrometer dynamic transfer function adjustable parallel light pipe focal length of corresponding target surface2For：
According to striped live width d1With striped live width d2Determine the pattern on graticle.
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| CN201611037478.7A CN106500843B (en) | 2016-11-23 | 2016-11-23 | A kind of imaging spectrometer optimum image plane calibration method and device |
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| CN201611037478.7A CN106500843B (en) | 2016-11-23 | 2016-11-23 | A kind of imaging spectrometer optimum image plane calibration method and device |
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| CN109431458A (en) * | 2018-12-21 | 2019-03-08 | 合肥奥比斯科技有限公司 | Multispectral light source and eyeground imaging system |
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| CN111896108A (en) * | 2020-07-13 | 2020-11-06 | 中国科学院空天信息创新研究院 | Method and device for assembling and adjusting imaging spectrometer |
| CN111982472A (en) * | 2020-08-17 | 2020-11-24 | 福州锐景达光电科技有限公司 | Cross-hair pattern unit, reticle and method for measuring magnification of inverse projection light path |
| CN116519136A (en) * | 2023-07-03 | 2023-08-01 | 中国科学院合肥物质科学研究院 | Same-optical-axis adjustment system and method for moon direct spectrum irradiance instrument |
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| CN111896108B (en) * | 2020-07-13 | 2023-06-30 | 中国科学院空天信息创新研究院 | Method and device for adjusting imaging spectrometer |
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| CN116519136A (en) * | 2023-07-03 | 2023-08-01 | 中国科学院合肥物质科学研究院 | Same-optical-axis adjustment system and method for moon direct spectrum irradiance instrument |
| CN116519136B (en) * | 2023-07-03 | 2023-09-08 | 中国科学院合肥物质科学研究院 | Same-optical-axis adjustment system and method for moon direct spectrum irradiance instrument |
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