CN106482829A - The dynamic and static combined test system of single-photon detector and its method of testing - Google Patents
The dynamic and static combined test system of single-photon detector and its method of testing Download PDFInfo
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
- G01J2001/444—Compensating; Calibrating, e.g. dark current, temperature drift, noise reduction or baseline correction; Adjusting
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/44—Electric circuits
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Abstract
The invention discloses a kind of dynamic and static combined test system of single-photon detector, including digital sourcemeter, changing device, test circuit and oscillograph, avalanche diode is positioned in the incubation chamber in changing device, the negative electrode of avalanche diode is connected with the outfan of digital sourcemeter, the anode of avalanche diode is connected with the input of test circuit, the output waveform of avalanche diode connects to oscillographic input, and the outfan of test circuit connects to computer.Due to different temperatures, different overbias and under the different dead time, the composition of dark current can change, and the present invention joins together to be separated by dynamic test and static test it is achieved that dynamically debugging in real time in combination with static state；And determine the composition of dark current, and this determines that the method that dark current is constituted easily is realized, therefore, dark current is constituted not only goes up Theoretical Calculation, experimentally also easily proves.
Description
Technical field
The present invention relates to a kind of dynamic and static combined test system of single-photon detector and its method of testing, belong to micro-
Optical detector technology field.
Background technology
Single-photon detecting survey technology, is the powerful measure of detection faint optical signal, has extensively in quantum communications, laser ranging etc.
General application.The principal element limiting single-photon detector quantum efficiency at present is dark counting and afterpulse, is to lead to quantum to lead to
The key factor of the bit error rate in letter.Photoelectric detector (as avalanche photodide) is an important set of single-photon detector
Become part, be dark current respectively and be captured releasing again of carrier with detector dark counting, the corresponding parameter of afterpulse probability
Put the electric current of generation, therefore, in order to reduce the dark counting of single-photon detector and afterpulse probability it is necessary to analyze avalanche diode
The source of dark current, research reduces dark current, the method for afterpulse effect, could improve the performance of single-photon detector.Work
The noise of the single-photon detector under Geiger mode angular position digitizer is mainly derived from three classes：Random noise that thermal noise causes, high-V alloy
It is afterpulse effect that lower carrier occurs tunneling effect to cause snowslide, trapping centre to discharge carrier again.Afterpulse effect is in reality
Test be relatively easy to distinguish, although and thermal noise and tunnelling current have the strict derivation of equation in theory, experimentally divide
Do not obtain still more difficult.The composition determining dark current is also one study hotspot of monochromatic light subdomains instantly.
Avalanche diode is a kind of high diode of sensitivity, and slightly larger electric current can be to be allowed to damage, therefore right
When it is tested certain it is noted that restriction to electric current.In existing static test, its I-V, C-V curve need by means of half
Conductor parameter analyzer, but do not enable real-time control；Can also be by digital sourcemeter, it is possible to achieve real-time control, but
C-V curve can not be obtained.And the control for temperature needs by means of becoming circuit temperature, mainly adopt semiconductor refrigerating, system at present
Speed of cooling is fast and low cost.Single-photon detector photoelectric detector (as avalanche photodide) generally to be comprised, device drive
Galvanic electricity road and output signal extract circuit, and the test to the dark counting of its whole system etc. is referred to as dynamic test.And for same
For the avalanche diode of sample, static and dynamically to test the result obtaining be different, static test can obtain total
Dark current, and dynamic test can obtain dark counting feature.And static test system and dynamic test system are for a lot of parameters
Definition mode have bigger difference, such as avalanche breakdown voltage.In static test, avalanche breakdown voltage is that snow dark current reaches certain
Bias voltage value during one value；And in dynamic circuit, occur more than bias voltage value during a certain output pulse for first time.
Fact proved, both is widely different.Therefore, it is necessary to joint test, to realize the purpose of efficient accurate measurement.
Content of the invention
The present invention is in order to overcome the shortcomings of above technology, there is provided a kind of dynamic and static state of single-photon detector combines survey
Test system and its method of testing, dynamic test and static test are succinctly efficiently combined by this method of testing is tested,
Achieve dynamic and static unified debugging, to reach the purpose determining that dark current is constituted.
The present invention overcomes its technical problem be employed technical scheme comprise that：
A kind of dynamic and static combined test system of single-photon detector, including digital sourcemeter, changing device, test electricity
Road and oscillograph, avalanche diode is positioned in the incubation chamber in changing device, the negative electrode of avalanche diode and digital sourcemeter
Outfan connects, the anode of avalanche diode is connected with the input of test circuit, the output waveform of avalanche diode connect to
Oscillographic input, the outfan of test circuit connects to computer.
According to currently preferred, digital sourcemeter adopts Keithley 2400 digital sourcemeter.
Present invention also offers a kind of test of the dynamic and static combined test system using above-mentioned single-photon detector
Method, step is as follows：
S1, fix a temperature value, this temperature span is -50 DEG C～20 DEG C, digital sourcemeter to avalanche diode plus
Bias, observes the dark counting of the electric current registration, oscilloscope display waveform and computer acquisition on digital sourcemeter；
S2, it is gradually increased and is biased into avalanche breakdown voltage, at this moment on digital sourcemeter, the electric current of display becomes larger, and shows simultaneously
On ripple device, the waveform of display starts snowslide pulse, and non-zero numeral also in dark counting；Under avalanche breakdown voltage state, number
On the table of word source, the electric current of display is total dark current Idark, on oscillograph, the avalanche voltage waveform of appearance is calculated by Ohm's law
Obtain corresponding current value, current curve be integrated, obtain single snowslide quantity of electric charge Q,
Wherein, T1Represent the moment shown by oscillograph, T when avalanche signal starts to occur2Represent avalanche signal will disappear
When shown moment；
S3, obtain the numerical value n of dark counting from test circuit, then obtain total snowslide quantity of electric charge QaFor the single snowslide quantity of electric charge
The product of Q and dark count numerical value n, and then obtain snowslide dark current Ia,
That is, IaIt is the dark current sum being caused with afterpulse due to the dark current that thermal noise and tunneling effect cause, wherein,
τ is the dead time；
S4, determine the composition of dark current and the test of dark current：Have neither part nor lot in the dark current I of snowslidebMainly leaked by surface
Electric current causes, snowslide dark current IaThe main dark current I being caused by thermal noiseth, the dark current I that causes of tunneling effectTATAnd after
The dark current I that pulse causescConstitute；
S4.1, have neither part nor lot in the dark current I of snowslideb：
Total dark current IdarkDeduct snowslide dark current IaAs have neither part nor lot in the dark current I of snowslideb；
The dark current I that S4.2, thermal noise causeth：
In the case that barrier width is constant, penetration coefficient is relevant with depletion region electric field, the dark electricity that is, tunneling effect causes
Stream ITATOnly relevant with overbias, and afterpulse can be adjusted by dead time τ, as τ >=20 μ s, afterpulse can be ignored, because
This, can be by the dead time τ, the dark current I that tunneling effect causes of fixing overbias and setting >=20 μ sTATIn snowslide dark current
IaIn numerical value be fixing, the dark current I that afterpulse causescNegligible, and then can be from IaIn isolate Ith：Fixing
Overbias and the dead time τ of setting >=20 μ s, constantly reduce temperature, obtain the dark counting under different temperatures, obtain dark after matching
Count the relation curve with temperature T, I be can get by dark countingaValue, and then I can be obtainedaWith the relation curve of temperature T,
Represent the I under different temperaturesaDifference be the change of the lower thermal noise of relevant temperature change, then with thermal noise curve in theoryIt is compared；
The dark current I that S4.3, tunneling effect causeTAT：
When temperature≤- 40 DEG C, the dark current I that thermal noise leads tothCan ignore, at this moment can obtain tunneling effect and cause
Dark current ITATAnd the dark current I that afterpulse causesc；In temperature≤- 20 DEG C, overbias >=3V, increase dead time τ extremely
>=20 μ s, can ignore the electric current that afterpulse causes, you can separate and obtain the dark current I that tunneling effect causesTAT；
The dark current I that S4.4, afterpulse causec：
According to the measurement result of step S4.2 and S4.3, by snowslide dark current IaDeduct the dark current I that thermal noise leads toth
The dark current I causing with tunneling effectTAT, obtain the dark current I that afterpulse causesc.
According to currently preferred, in described step S4.2, if the actual measurement thermal noise curve obtaining is bent with theoretical thermal noise
The trend of line is identical and numerical value difference is in allowed band, then illustrate that this experimental result is correct；If numerical value difference exceedes permission model
Enclose, then continue to increase the dead time, reduce temperature, then be compared, until obtaining the result in allowed band.
The invention has the beneficial effects as follows：
Due to different temperatures, different overbias and under the different dead time, the composition of dark current can change, and the present invention passes through
A kind of simple method (i.e. dynamic test and static test are joined together) is separated it is achieved that dynamic and static state reality in combination
When debugging；And determine the composition of dark current, and this determines that the method that dark current is constituted easily is realized, therefore, dark current is constituted
Not only go up Theoretical Calculation, experimentally also easily prove.
Brief description
Fig. 1 is the structural representation of the test system of the present invention.In figure, 1, digital sourcemeter；2nd, changing device；3rd, test electricity
Road；4th, oscillograph；5th, computer.
Fig. 2 is 0.2V for overbias, through 100 times of avalanche signal curve charts obtaining from oscillograph after amplifying.In figure, indulges
Coordinate is voltage, and every lattice represent 20mV；Abscissa is the time, and every lattice represent 50ns.
The graph of relation that Fig. 3 is dark counting and temperature T in the case of 1.5V, 2.0V, 2.5V, 3.0V for overbias.In figure,
Vertical coordinate is dark counting；Abscissa is temperature.
Specific embodiment
It is better understood from the present invention for the ease of those skilled in the art, with specific embodiment, the present invention is done below in conjunction with the accompanying drawings
Further describe, following is only exemplary not limit protection scope of the present invention.
Embodiment 1,
The dynamic and static combined test system of single-photon detector of the present invention, as shown in figure 1, include digital source
Table 1, changing device 2, test circuit 3 and oscillograph 4, digital sourcemeter 1 adopts Keithley 2400 digital sourcemeter, and oscillograph 4 is not
Need, using more expensive current probe, directly voltage to be tested, oscillograph has the impedance matching of 50 Ω it is easy to by ohm
Law obtains curent change, and digital sourcemeter 1 can also can obtain the device of electric current by arranging voltage with other；Snowslide two pole
Pipe is positioned in the incubation chamber in changing device 2, and the negative electrode of avalanche diode is connected with the outfan of digital sourcemeter 1, snowslide two
The anode of pole pipe is connected with the input of test circuit 3, and the output waveform of avalanche diode connects to the input of oscillograph 4,
The outfan of test circuit 3 is connected to computer 5 by USB.
Embodiment 2,
A kind of method of testing of the dynamic and static combined test system of the single-photon detector described in utilization embodiment 1,
Step is as follows：
S1, fix a temperature value, this temperature span is -50 DEG C～20 DEG C, digital sourcemeter to avalanche diode plus
Bias, observes the dark counting of the electric current registration, oscilloscope display waveform and computer acquisition on digital sourcemeter.
S2, it is gradually increased and is biased into avalanche breakdown voltage, at this moment on digital sourcemeter, the electric current of display becomes larger (pA-nA-
μ A), on oscillograph, the waveform of display starts snowslide pulse, as shown in Fig. 2 non-zero numeral also in dark counting simultaneously；Snow
Collapse under breakdown voltage state, on digital sourcemeter, the electric current of display is total dark current Idark, the avalanche voltage of appearance on oscillograph
Waveform is calculated corresponding current value by Ohm's law, and current curve is integrated, and obtains the single snowslide quantity of electric charge
Q,
Wherein, T1Represent the moment shown by oscillograph, T when avalanche signal starts to occur2Represent avalanche signal will disappear
When shown moment.
S3, obtain the numerical value n of dark counting from test circuit, then obtain total snowslide quantity of electric charge QaFor the single snowslide quantity of electric charge
The product of Q and dark count numerical value n, and then obtain snowslide dark current Ia,
That is, IaIt is the dark current sum being caused with afterpulse due to the dark current that thermal noise and tunneling effect cause, wherein,
τ is the dead time.
S4, after above-mentioned steps S1, S2 and S3, it is then determined that the test of the composition of dark current and dark current：Do not join
Dark current I with snowslidebMainly caused by tracking current, snowslide dark current IaThe main dark current I being caused by thermal noiseth、
The dark current I that tunneling effect causesTATAnd the dark current I that afterpulse causescConstitute.
S4.1, have neither part nor lot in the dark current I of snowslideb：
Total dark current IdarkDeduct snowslide dark current IaAs have neither part nor lot in the dark current I of snowslideb.
The dark current I that S4.2, thermal noise causeth：
In the case that barrier width is constant, penetration coefficient is relevant with depletion region electric field, the dark electricity that is, tunneling effect causes
Stream ITATOnly relevant with overbias, and afterpulse can be adjusted by dead time τ, in the case that the dead time is larger, the present embodiment selects
When taking τ >=20 μ s, afterpulse can be ignored, and therefore, can be imitated by the dead time τ of fixing overbias and setting >=20 μ s, tunnelling
The dark current I that should causeTATIn snowslide dark current IaIn numerical value be fixing, the dark current I that afterpulse causescNegligible not
Meter, and then can be from IaIn isolate Ith：Fixing overbias and the dead time τ of setting >=20 μ s, constantly reduce temperature, obtain not
Dark counting under synthermal, obtains the relation curve of dark counting and temperature T after matching, as shown in figure 3, as can be seen from Figure 3, no
Under same overbias, the rising dark counting with temperature all increases, and the increase with overbias, and dark counting also increases；Then
I be can get by dark countingaValue, the therefore relation curve of dark counting and temperature T passes through vertical coordinate and converts to obtain IaWith temperature
The relation curve of degree T, represents the I under different temperaturesaDifference be the change of the lower thermal noise of relevant temperature change, then with reason
By upper thermal noise curveIt is compared；If the actual measurement thermal noise curve obtaining is become with theoretical thermal noise curve
Gesture is identical and numerical value difference is in allowed band, then illustrate that this experimental result is correct；If numerical value difference exceedes allowed band, continue
Continuous increase dead time, reduction temperature, reduce temperature and can be selected for sterlin refrigerator, then be compared, until obtaining allowing model
Result in enclosing.
The dark current I that S4.3, tunneling effect causeTAT：
When temperature is especially low, the present embodiment chooses temperature≤- 40 DEG C, the dark current I that thermal noise leads tothCan ignore,
At this moment the dark current I that tunneling effect causes can be obtainedTATAnd the dark current I that afterpulse causesc；In temperature≤- 20 DEG C, mistake
During bias >=3V, increase dead time τ to >=20 μ s, the electric current that afterpulse causes can be ignored, you can separate and obtain tunneling effect
The dark current I causingTAT.
The dark current I that S4.4, afterpulse causec：
According to the measurement result of step S4.2 and S4.3, by snowslide dark current IaDeduct the dark current I that thermal noise leads toth
The dark current I causing with tunneling effectTAT, obtain the dark current I that afterpulse causesc.So far, obtained tracking current to cause
Dark current Ib, the dark current I that causes of thermal noiseth, the dark current I that causes of tunneling effectTATAnd the dark current that afterpulse causes
Ic, so that it is determined that the composition of dark current.
Above only describes ultimate principle and the preferred implementation of the present invention, those skilled in the art can be according to foregoing description
Make many changes and improvements, these changes and improvements should belong to protection scope of the present invention.
Claims (4)
1. a kind of single-photon detector dynamic and static combined test system it is characterised in that：Including digital sourcemeter (1), become
Warm device (2), test circuit (3) and oscillograph (4), avalanche diode is positioned in the incubation chamber in changing device (2), snowslide
The negative electrode of diode is connected with the outfan of digital sourcemeter (1), the input of the anode of avalanche diode and test circuit (3) even
Connect, the output waveform of avalanche diode connects to the input of oscillograph (4), and the outfan of test circuit (3) connects to calculating
Machine (5).
2. test system according to claim 1 it is characterised in that：Digital sourcemeter (1) adopts Keithley2400 numeral
Source table.
3. the method for testing of the dynamic and static combined test system of single-photon detector according to claim 1 and 2, its
It is characterised by, as follows including step：
S1, fix a temperature value, this temperature span is -50 DEG C～20 DEG C, digital sourcemeter to avalanche diode biasing,
Observe the dark counting of the electric current registration, oscilloscope display waveform and computer acquisition on digital sourcemeter；
S2, it is gradually increased and is biased into avalanche breakdown voltage, at this moment on digital sourcemeter, the electric current of display becomes larger, oscillograph simultaneously
The waveform of upper display starts snowslide pulse, and non-zero numeral also in dark counting；Under avalanche breakdown voltage state, digital source
On table, the electric current of display is total dark current Idark, on oscillograph, the avalanche voltage waveform of appearance is calculated by Ohm's law
Corresponding current value, is integrated to current curve, obtains single snowslide quantity of electric charge Q,
Wherein, T1Represent the moment shown by oscillograph, T when avalanche signal starts to occur2Represent avalanche signal will disappear when institute
The moment of display；
S3, obtain the numerical value n of dark counting from test circuit, then obtain total snowslide quantity of electric charge QaFor single snowslide quantity of electric charge Q and secretly
The product of count value n, and then obtain snowslide dark current Ia,
That is, IaIt is the dark current sum being caused with afterpulse due to the dark current that thermal noise and tunneling effect cause, wherein, τ is dead
Time；
S4, determine the composition of dark current and the test of dark current：Have neither part nor lot in the dark current I of snowslidebMainly drawn by tracking current
Rise, snowslide dark current IaThe main dark current I being caused by thermal noiseth, the dark current I that causes of tunneling effectTATAnd afterpulse draws
The dark current I risingcConstitute；
S4.1, have neither part nor lot in the dark current I of snowslideb：
Total dark current IdarkDeduct snowslide dark current IaAs have neither part nor lot in the dark current I of snowslideb；
The dark current I that S4.2, thermal noise causeth：
In the case that barrier width is constant, penetration coefficient is relevant with depletion region electric field, the dark current I that is, tunneling effect causesTAT
Only relevant with overbias, and afterpulse can be adjusted by dead time τ, as τ >=20 μ s, afterpulse can be ignored, and therefore, can lead to
Cross fixing overbias and the dead time τ, the dark current I that tunneling effect causes of setting >=20 μ sTATIn snowslide dark current IaIn number
Value is fixing, the dark current I that afterpulse causescNegligible, and then can be from IaIn isolate Ith：Fixing overbias and
The dead time τ of setting >=20 μ s, constantly reduces temperature, obtains the dark counting under different temperatures, obtains dark counting and temperature after matching
The relation curve of degree T, can get I by dark countingaValue, and then I can be obtainedaWith the relation curve of temperature T, represent difference
At a temperature of IaDifference be the change of the lower thermal noise of relevant temperature change, then with thermal noise curve in theoryIt is compared；
The dark current I that S4.3, tunneling effect causeTAT：
When temperature≤- 40 DEG C, the dark current I that thermal noise leads tothCan ignore, at this moment can obtain that tunneling effect causes is dark
Electric current ITATAnd the dark current I that afterpulse causesc；In temperature≤- 20 DEG C, overbias >=3V, increase dead time τ to >=20 μ
S, can ignore the electric current that afterpulse causes, you can separate and obtain the dark current I that tunneling effect causesTAT；
The dark current I that S4.4, afterpulse causec：
According to the measurement result of step S4.2 and S4.3, by snowslide dark current IaDeduct the dark current I that thermal noise leads tothAnd tunnel
Wear the dark current I that effect causesTAT, obtain the dark current I that afterpulse causesc.
4. method of testing according to claim 3 is it is characterised in that in described step S4.2, if the actual measurement heat obtaining is made an uproar
Acoustic curve is identical with the trend of theoretical thermal noise curve and numerical value difference is in allowed band, then illustrate that this experimental result is correct；
If numerical value difference exceedes allowed band, continue to increase the dead time, reduce temperature, then be compared, until obtaining allowing model
Result in enclosing.
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| CN113791755B (en) * | 2021-08-24 | 2023-10-20 | 中国航天科工集团第二研究院 | Quantum random number sequence generation method, system and device |
| CN114112030A (en) * | 2021-12-06 | 2022-03-01 | 江西省纳米技术研究院 | Photoelectric detector performance testing device based on artificial intelligence |
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