CN106443220B - A kind of method and apparatus measuring measured device noise coefficient - Google Patents
A kind of method and apparatus measuring measured device noise coefficient Download PDFInfo
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- CN106443220B CN106443220B CN201510474016.0A CN201510474016A CN106443220B CN 106443220 B CN106443220 B CN 106443220B CN 201510474016 A CN201510474016 A CN 201510474016A CN 106443220 B CN106443220 B CN 106443220B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
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Abstract
The embodiment of the invention discloses a kind of methods for measuring measured device noise coefficient, comprising: obtains the noise coefficient of measured device expanded circuit；The measured device expanded circuit includes measured device and measured device access, and the measured device access includes the first impedance matching network that any one input port of the measured device or any one output port is arranged in；Obtain the insertion loss of the measured device access；The insertion loss of noise coefficient and the measured device access based on the measured device expanded circuit, obtains the noise coefficient of the measured device.The embodiment of the invention also discloses a kind of devices for measuring measured device noise coefficient.
Description
Technical field
The present invention relates to noise-factor measurement technology more particularly to a kind of measurement measured device (Device Under
Test, DUT) noise coefficient (Noise Figure, NF) method and apparatus.
Background technique
With the high speed development of mobile communication technology, the requirement to the measurement accuracy of measured device noise coefficient is increasingly
It is high.For certain measured devices such as RF transceiver (RF Transceiver), in the noise coefficient of measurement measured device
When, it usually needs impedance matching network is set in each output port of measured device, is set in the output end of impedance matching network
Test bench is set, connects noise-factor measurement instrument using test bench, and then complete the measurement of measured device noise coefficient.However,
In the above-mentioned technical solution measured to measured device noise coefficient, since impedance matching network can introduce insertion loss,
The noise coefficient for causing measurement to obtain is not the noise coefficient of measured device itself, causes the accuracy of noise-factor measurement result
It reduces.
It is illustrated so that measured device is RF transceiver as an example below, Fig. 1 is to measure RF transceiver in the prior art
The electrical block diagram of noise coefficient is surveyed as shown in Figure 1, the circuit of measurement RF transceiver noise coefficient is located at a chip
On test plate (panel) 100, which includes: power supply module 101, clock module 102, status control module 103, simulation test seat 104, penetrates
Frequency test bench 105, test motherboard interface 106, test point 107, RF transceiver 108 and impedance matching network 109；Wherein, it penetrates
The output port of frequency transceiver 108 connects radio frequency testing seat 105 by corresponding impedance matching network 109, in radio frequency testing seat
On may be implemented to dock with noise-factor measurement instrument；RF transceiver 108 has multiple output ports, with one in Fig. 1
Output port illustrates.Specifically, clock module 102 is used to provide work clock for RF transceiver；State control
Molding block 103 is used to control the working condition of RF transceiver；Power supply module 101 is used for respectively to RF transceiver, clock mould
Block and status control module provide working power；Simulation test seat 104 is used to provide simulation I/Q signal to RF transceiver, or
Receive the simulation I/Q signal from RF transceiver；Radio frequency testing seat 105 is used to provide radiofrequency signal to RF transceiver, or
The radiofrequency signal from RF transceiver is received, radio frequency testing seat can be used for noise-factor measurement instrument；Test point 107 connects
The pin of RF transceiver, for monitoring the working condition of RF transceiver.Test motherboard interface 106 is for completing chip testing
The docking of plate 100 and FPGA motherboard, FPGA motherboard guarantee chip testing for providing SPI signal and base band data processing function
Each device can work normally on plate.In Fig. 1, the circuit between RF transceiver and noise-factor measurement instrument can receive radio frequency
The measurement result of hair device noise coefficient impacts.Specifically, the input/output end port of RF transceiver 108 is in connection impedance
It needing to connect radio frequency testing seat 105 by cabling after matching network 109, impedance matching network can bring insertion loss, thus
The measurement result of RF transceiver noise coefficient is impacted；In addition, the input/output end port when RF transceiver is more
When, the layout based on circuit design considers, the cabling between impedance matching network and radio frequency testing seat is possible to can be long, this
Sample can bring about biggish insertion loss, in this way can the measurement result further to RF transceiver noise coefficient impact.
Summary of the invention
In order to solve the above technical problems, an embodiment of the present invention is intended to provide a kind of methods for measuring measured device noise coefficient
And device, it can be improved the accuracy of the noise coefficient of measurement measured device.
The technical scheme of the present invention is realized as follows:
The embodiment of the invention provides a kind of methods for measuring measured device noise coefficient, comprising:
Obtain the noise coefficient of measured device expanded circuit；The measured device expanded circuit includes measured device and is tested
Device access, the measured device access include setting in any one input port of the measured device or any one output
First impedance matching network of port；
Obtain the insertion loss of the measured device access；
The insertion loss of noise coefficient and the measured device access based on the measured device expanded circuit, obtains institute
State the noise coefficient of measured device.
In above scheme, first impedance matching network has measured device port, for connecting the measured device；
The insertion loss for obtaining the measured device access includes: to replicate to the measured device access；?
The setting of measured device port and the first impedance matching network of the impedance matching network of measured device access after duplication are formed altogether
The impedance matching network of yoke matching or mirror symmetry；The insertion loss of cascade pathway is obtained, the cascade pathway includes after replicating
Measured device access and the impedance matching network that is connect with the measured device access after the duplication；Based on the cascade
The insertion loss of access obtains the insertion loss of the measured device access.
In above scheme, the insertion loss of the measured device access is the half of the insertion loss of the cascade pathway.
In above scheme, the measured device port of the impedance matching network of measured device access after replication be provided with
When first impedance matching network forms the impedance matching network of mirror symmetry, the insertion loss for obtaining cascade pathway includes:
The insertion loss of cascade pathway is measured, the initial value of the insertion loss of the cascade pathway is obtained；It obtains
The initial value of the insertion loss of the cascade pathway is subtracted the reflection of the cascade pathway by the reflection loss of the cascade pathway
Loss, obtains the insertion loss of the cascade pathway.
In above scheme, the noise coefficient for obtaining measured device expanded circuit, comprising: tested device is obtained by measurement
The gain and noise power spectral density of part expanded circuit based on the gain for measuring the measured device expanded circuit obtained and are made an uproar
Power sound spectrum density obtains the noise coefficient of the measured device expanded circuit.
In above scheme, the noise coefficient based on the measured device expanded circuit and the measured device access
Insertion loss obtains the noise coefficient of the measured device, comprising: subtracts the noise coefficient of the measured device expanded circuit
The insertion loss of the measured device access, obtains the noise coefficient of the measured device.
The embodiment of the invention also provides a kind of devices for measuring measured device noise coefficient, comprising: the first acquisition module,
Second obtains module and computing module；Wherein,
First obtains module, for obtaining the noise coefficient of measured device expanded circuit；The measured device expanded circuit
Including measured device and measured device access, the measured device access includes setting in any one input of the measured device
First impedance matching network of port or any one output port；
Second obtains module, for obtaining the insertion loss of the measured device access；
Computing module, for based on the measured device expanded circuit noise coefficient and the measured device access insert
Enter loss, obtains the noise coefficient of the measured device.
In above scheme, first impedance matching network has measured device port, for connecting the measured device；
Described second obtains module, specifically for replicating to the measured device access；Tested device after replication
The setting of measured device port and the first impedance matching network of the impedance matching network of part access form conjugate impedance match or mirror image pair
The impedance matching network of title；Obtain cascade pathway insertion loss, the cascade pathway include duplication after measured device access,
And the impedance matching network being connect with the measured device access after duplication；Insertion loss based on the cascade pathway obtains institute
State the insertion loss of measured device access.
In above scheme, described second obtains module, the impedance matching network for measured device access after replication
Measured device port be provided with the first impedance matching network formed mirror symmetry impedance matching network when, to cascade pathway
Insertion loss measure, obtain the initial value of the insertion loss of the cascade pathway；The reflection loss of cascade pathway is obtained,
The reflection loss that the initial value of the insertion loss of the cascade pathway is subtracted to the cascade pathway obtains the cascade pathway
Insertion loss.
In above scheme, the computing module, specifically for subtracting the noise coefficient of the measured device expanded circuit
The insertion loss of the measured device access, obtains the noise coefficient of the measured device.
A kind of method and apparatus measuring measured device noise coefficient provided in an embodiment of the present invention, obtain measured device and expand
Open up the noise coefficient of circuit；Obtain the insertion loss of the measured device access；Based on making an uproar for the measured device expanded circuit
The insertion loss of sonic system number and the measured device access, obtains the noise coefficient of the measured device.So, it is possible to obtain by
The insertion loss of device access is surveyed, and then improves the accuracy of the noise coefficient of measurement measured device.
Detailed description of the invention
Fig. 1 is the electrical block diagram for measuring RF transceiver noise coefficient in the prior art；
Fig. 2 is the flow chart of the first embodiment of the method for present invention measurement measured device noise coefficient；
Fig. 3 is measured device expanded circuit in the first embodiment of the method for present invention measurement measured device noise coefficient
Composed structure schematic diagram；
Fig. 4 is in the first embodiment of the method for present invention measurement measured device noise coefficient using first method acquisition
The flow chart of the insertion loss of the measured device access；
Fig. 5 is the composition of the first C-path in the first embodiment of the method for present invention measurement measured device noise coefficient
Structural schematic diagram；
Fig. 6 is in the first embodiment of the method for present invention measurement measured device noise coefficient using second method acquisition
The flow chart of the insertion loss of the measured device access；
Fig. 7 is the composition of the second C-path in the first embodiment of the method for present invention measurement measured device noise coefficient
Structural schematic diagram；
Fig. 8 is the flow chart of the second embodiment of the method for present invention measurement measured device noise coefficient；
Fig. 9 is the composed structure schematic diagram for the device that the embodiment of the present invention measures measured device noise coefficient.
Specific embodiment
Following will be combined with the drawings in the embodiments of the present invention, and technical solution in the embodiment of the present invention carries out clear, complete
Site preparation description.
First embodiment
Fig. 2 is the flow chart of the first embodiment of the method for present invention measurement measured device noise coefficient, as shown in Fig. 2,
This method comprises:
Step 200: obtaining the noise coefficient of measured device expanded circuit.
Fig. 3 is measured device expanded circuit in the first embodiment of the method for present invention measurement measured device noise coefficient
Composed structure schematic diagram, as shown in figure 3, the measured device expanded circuit 300 includes measured device 301 and measured device access
302, the measured device access 302 includes setting in described any one input port of measured device 301 or any one is defeated
First impedance matching network 303 of exit port.
Here, measured device 301 can be the devices such as RF transceiver, radio-frequency transmitter；Measured device 301 has at least
One output port and at least one input port；Measured device access 302 can also include and the first impedance matching network 301
Cabling between the first test bench 304 and the first impedance matching network 303 and the first test bench 304 of connection, the first test
Seat 304 can be used for access noise coefficient measuring instrument device.
Here, measured device expanded circuit 300 can be located at the first printed circuit board (Printed Circuit Board,
PCB on).
In this step, the noise coefficient of measured device expanded circuit is obtained there are many existing implementation, for example, can be with
The noise coefficient of measured device expanded circuit is measured using gain method and Y factor method.
The process for obtaining the noise coefficient of measured device expanded circuit is exemplified below.
The noise coefficient for obtaining measured device expanded circuit, comprising: measured device expanded circuit is obtained by measurement
Gain G ain and measured device expanded circuit noise power spectral density PNOUT, show that RF transceiver expands by following formula
Open up the noise coefficient NF of circuit:
NF=PNOUT-(-174dBm/Hz+Gain)。
Here, measurement obtain measured device expanded circuit gain and noise power spectral density process there are many existing
Implementation, I will not elaborate.
In this step, the first impedance matching network can be the circuit of pure resistance form, and can also be includes reaction component
Circuit；The effect that the first impedance matching network of measured device input port is arranged in is to guarantee that signal can be with the smallest loss
It is input to measured device, the effect that the first impedance matching network of measured device output port is arranged in is to guarantee measured device
Output signal can be sent with the smallest loss；It is corresponding in order to play the role of the first impedance matching network, in this step
Before, corresponding impedance matching network, the first resistance of setting are provided in each input/output end port of measured device by debugging
Anti- matching network has a variety of existing implementations, and I will not elaborate.
Here, the first impedance matching network 303 tool is measured device port there are two port, one of port, is used for
Connect measured device 301；Another port of first impedance matching network 303 is noise coefficient test port, is made an uproar for accessing
Sonic system number measuring instrument；Further, the noise coefficient test port of the first impedance matching network 303 can pass through the first test
304 access noise coefficient measuring instrument devices of seat.
Step 201: obtaining the insertion loss of the measured device access.
The insertion loss for obtaining the measured device access includes: to replicate to the measured device access；?
The setting of measured device port and the first impedance matching network of the impedance matching network of measured device access after duplication are formed altogether
The impedance matching network of yoke matching or mirror symmetry；The insertion loss of cascade pathway is obtained, the cascade pathway includes after replicating
Measured device access and the impedance matching network that is connect with the measured device access after duplication；Based on the cascade pathway
Insertion loss obtain the insertion loss of the measured device access.Here, the insertion loss for surveying device access is described
The half of cascade pathway insertion loss.
Specifically, in this step, the insertion loss of the measured device access can be obtained using following two method.
First method:
Fig. 4 is in the first embodiment of the method for present invention measurement measured device noise coefficient using first method acquisition
The flow chart of the insertion loss of the measured device access, as shown in figure 4, the process includes:
Step 201A: replicating the measured device access, obtains the first duplication measured device access.Namely
It says, the measured device access after duplication is the first duplication measured device access.
Here it is possible to replicate on the 2nd PCB to the measured device access, the 2nd PCB and the first PCB has phase
Same laminated construction.
It should be noted that only being replicated to the measured device access in this step, measured device is not carried out
Duplication.
Step 201B: in the second resistance of measured device port setting of the impedance matching network of the first duplication measured device access
Anti- matching network makes impedance matching network and the second impedance matching network in the measured device of duplication form conjugate impedance match.
Specifically, the impedance matching network in the second impedance matching network and the first duplication measured device access is second
There is symmetrical circuit structure form, cabling and the first duplication measured device access in the second impedance matching network on pcb board
In impedance matching network cabling it is symmetrical.Here it is possible to the parameter of the device by adjusting the second impedance matching network,
So that impedance matching network and the second impedance matching network in the measured device of duplication is realized impedance matching, adjusts the second impedance
The process of the parameter of the device of distribution network has a variety of existing implementations, and I will not elaborate.
In this step, the impedance matching network and the second impedance matching network in the first duplication measured device access are full
The condition of sufficient conjugate impedance match；That is, for the impedance in the second impedance matching network and the first duplication measured device access
The real part of matching network, the impedance of the two is equal, imaginary part opposite number each other.
In practical applications, for the second impedance matching network tool there are two port, one of port is multiple for connecting first
The another port of the measured device port of measured device access processed, the second impedance matching network is Insertion Loss test port, for connecing
Enter insert loss instrument；For first duplication measured device access tool there are two port, one of port is the impedance of itself
The measured device port of matching network, for connecting the second impedance matching network, the other end of the first duplication measured device access
Mouth is Insertion Loss test port, for accessing insert loss instrument.Here, insert loss instrument can use vector net
Network analyzer is realized.
Step 201C: the insertion loss of the first C-path is obtained.
Fig. 5 is the composition of the first C-path in the first embodiment of the method for present invention measurement measured device noise coefficient
Structural schematic diagram, as shown in figure 5, first C-path 500 includes that the second impedance matching network 501 and the first duplication are tested
Device access 502, for the first C-path 500 tool there are two port, one of port is inserting for the second impedance matching network 501
Test port is damaged, for accessing insert loss instrument；Another port of first C-path 500 is that the first duplication is tested
The Insertion Loss test port of device access 502, for accessing insert loss instrument.Here, cascade pathway is that the first combination is logical
Road 500.
In practical applications, it can use the insert loss such as vector network analyzer instrument to the first C-path
Insertion loss measures, to obtain the insertion loss of the first C-path.
In addition, the first C-path of measurement can be passed through when the insertion loss to the first C-path measures
S21 parameter obtains the insertion loss of the first C-path.
Further, the first C-path 500 further includes connecting with the Insertion Loss test port of the second impedance matching network 501
The second test bench 503 and the second impedance matching network 501 and the second test bench 503 between cabling, the second test bench
503 for accessing insert loss instrument.
Here, by the first duplication 502 middle impedance matching network of measured device access and the first duplication measured device access 502
Insertion Loss test port between cabling be denoted as the first Wiring structure, by the second impedance matching network 501 and the second test bench 503
Between cabling be denoted as the second Wiring structure, on the 2nd PCB, the first Wiring structure and the second Wiring structure are symmetrical.
Step 201D: the insertion loss based on the first C-path obtains the insertion loss of measured device access, is tested device
The insertion loss A1 of part access are as follows: A1=S21/2, here, S21 indicate the insertion damage for the first C-path that step 201C is obtained
Consumption.
Second method:
Fig. 6 is in the first embodiment of the method for present invention measurement measured device noise coefficient using second method acquisition
The flow chart of the insertion loss of the measured device access, as shown in fig. 6, the process includes:
Step 201a: replicating the measured device access, obtains the second duplication measured device access.Namely
It says, the measured device access after duplication is the second duplication measured device access.
Here it is possible to replicate on the 3rd PCB to the measured device access, the 3rd PCB and the first PCB has phase
Same laminated construction.
It should be noted that only being replicated to the measured device access in this step, measured device is not carried out
Duplication.
Step 201b: it is hindered in the measured device port setting third of the impedance matching network of the second duplication measured device access
The electricity of the impedance matching network of anti-matching network, the circuit structure of third impedance matching network and the second duplication measured device access
Line structure mirror symmetry.
Here, each device of third impedance matching network uses device identical with the symmetrical device of itself.
In practical applications, for third impedance matching network tool there are two port, one of port is multiple for connecting second
The another port of the measured device port of measured device access processed, third impedance matching network is Insertion Loss test port, for connecing
Enter insert loss instrument；For second duplication measured device access tool there are two port, one of port is the impedance of itself
The measured device port of matching network, for connecting third impedance matching network, the other end of the second duplication measured device access
Mouth is Insertion Loss test port, for accessing insert loss instrument.Here, insert loss instrument can use vector net
Network analyzer is realized.
Step 201c: the insertion loss of the second C-path is obtained；
Fig. 7 is the composition of the second C-path in the first embodiment of the method for present invention measurement measured device noise coefficient
Structural schematic diagram, as shown in fig. 7, second C-path 700 includes that third impedance matching network 701 and the second duplication are tested
Device access 702, for the second C-path 700 tool there are two port, one of port is inserting for third impedance matching network 701
Test port is damaged, for accessing insert loss instrument；Another port of second C-path 700 is that the second duplication is tested
The Insertion Loss test port of device access 702, for accessing insert loss instrument.Here, cascade pathway is that the second combination is logical
Road 700.
In practical applications, it can use the insert loss such as vector network analyzer instrument to the second C-path
Insertion loss measures, to obtain the initial value of the insertion loss of the second C-path.
In addition, the second C-path of measurement can be passed through when the insertion loss to the second C-path measures
S21 parameter obtains the initial value of the insertion loss of the second C-path.
Further, the second C-path 700 further includes connecting with the Insertion Loss test port of third impedance matching network 701
Third test bench 703 and third impedance matching network 701 and third test bench 703 between cabling, third test bench
703 for accessing insert loss instrument.
Here, by the second duplication 702 middle impedance matching network of measured device access and the second duplication measured device access 702
Insertion Loss test port between cabling be denoted as third Wiring structure, by third impedance matching network 701 and third test bench 703
Between cabling be denoted as the 4th Wiring structure, on the 3rd PCB, third Wiring structure and the 4th Wiring structure are symmetrical.
In this step, after obtaining the initial value of insertion loss of the second C-path, or the second C-path is obtained
Insertion loss initial value before, obtain the second C-path reflection loss.Here it is possible to obtain second group by emulation
The reflection loss of access is closed, obtain for example, can emulate by simulation softwares such as ADS (Advanced Design System)
The reflection loss of two C-paths.
After the reflection loss for obtaining the second C-path, the initial value of the insertion loss of the second C-path is subtracted
The reflection loss of second C-path obtains the insertion loss of the second C-path.
Step 201d: the insertion loss based on the second C-path obtains the insertion loss of measured device access, is tested device
The insertion loss of part access is the half of the insertion loss of the second C-path.
It is obtained that is, the insertion loss of measured device access can be calculated by the following formula:
A1=(S21 '-LR)/2
Wherein, S21 ' indicates the initial value of the insertion loss of the second C-path, LRIndicate the reflection of the second C-path
Loss.
It should be noted that in first embodiment of the invention, it can be in the noise coefficient for obtaining measured device expanded circuit
Later, the insertion loss of the measured device access is obtained；Can also obtain measured device expanded circuit noise coefficient it
Before, obtain the insertion loss of the measured device access.
Step 202: the insertion damage of noise coefficient and the measured device access based on the measured device expanded circuit
Consumption, obtains the noise coefficient of the measured device.
This step specifically includes: the noise coefficient of the measured device expanded circuit is subtracted the measured device access
Insertion loss obtains the noise coefficient of the measured device.That is, the noise coefficient NF of the measured deviceportAre as follows:
NFport=NF-A1.
In first embodiment of the invention, if obtaining the insertion loss of the measured device access using first method,
Due in the first duplication measured device access impedance matching network and the second impedance matching network meet the condition of conjugate impedance match,
In this way, signal can be compared with as low as minimum value in the loss of the transmission of the first C-path.In addition, the 2nd PCB and the first PCB has
Identical laminated construction, so insertion loss caused by laminated construction of the 2nd PCB with the first PCB is consistent, in this way, can
The insertion loss of measured device access on the first PCB of calculating is removed with the insertion loss using upper first C-path of the 2nd PCB.
Here, when obtaining the insertion loss of the measured device access using first method, due to not considering reflection damage
The case where consuming, therefore the first impedance matching network be suitble to be pure resistance.
In first embodiment of the invention, if obtaining the insertion loss of the measured device access using second method,
Due to the impedance matching network and third impedance matching network mirror symmetry in the second duplication measured device access, the second combination is logical
The initial value of the insertion loss on road not only includes insertion loss caused by the device loss of the second C-path and cabling loss
Caused insertion loss further includes insertion loss caused by the reflection loss of the second C-path；When measured device access is not deposited
In reflection loss or very low corresponding reflection loss, need to exclude second when calculating the insertion loss of the second C-path
Insertion loss caused by the reflection loss of C-path.In addition, the 3rd PCB and the first PCB laminated construction having the same, so
Insertion loss caused by laminated construction of 3rd PCB with the first PCB is consistent, in this way, can use the 3rd PCB upper second
The insertion loss of C-path goes to calculate the insertion loss of measured device access on the first PCB.
Here, when obtaining the insertion loss of the measured device access using second method, it is contemplated that reflection loss draws
Rise insertion loss, therefore be suitble to the first impedance matching network be pure resistance the case where, or be suitble to the first impedance matching network packet
The case where containing reaction component.
Second embodiment
In order to more embody the purpose of the present invention, on the basis of first embodiment of the invention, further lifted
Example explanation.
In second embodiment of the invention, measured device is RF transceiver, can be completed on the first PCB to radio-frequency receiving-transmitting
Reception, the emitting performance test of device；Wherein, the noise coefficient in the receptivity of RF transceiver is very crucial one and penetrates
Frequency index.The noise coefficient in receptivity in order to obtain RF transceiver, in an input port tune of RF transceiver
The first impedance matching network is tried out, the effect of the first impedance matching network is to guarantee that radiofrequency signal can be transferred to the smallest loss
RF transceiver can subtract as far as possible so usually by the impedance matching of the input port of the first RF transceiver near 50ohm
Reflection loss brought by small first impedance matching network；After debugging out the first impedance matching network, radio frequency can be received
The noise coefficient sent out in the receptivity of device measures, specifically described below.
Fig. 8 is the flow chart of the second embodiment of the method for present invention measurement measured device noise coefficient, as shown in figure 8,
The process includes:
Step 800: obtaining the noise coefficient of RF transceiver expanded circuit.
Here, RF transceiver expanded circuit is located on the first PCB, RF transceiver expanded circuit include radio frequency pack up and
Radio frequency path, radio frequency path include the first impedance matching network that any one input port of RF transceiver is arranged in.Radio frequency
Access further includes the first test bench connecting with the first impedance matching network and the first impedance matching network and the first test bench
Between cabling, the first test bench can be used for access noise coefficient measuring instrument device.
The noise coefficient for obtaining RF transceiver expanded circuit includes: to obtain RF transceiver extension electricity by measurement
The gain G ain on the road and noise power spectral density P of RF transceiver expanded circuitNOUT, show that radio frequency is received by following formula
Send out the noise coefficient NF of device expanded circuit:
NF=PNOUT-(-174dBm/Hz+Gain)。
It should be noted that since radio frequency path can bring insertion loss, the noise coefficient that this step obtains is not
The noise coefficient of RF transceiver itself needs just obtain radio frequency after measurement obtains radio frequency path bring insertion loss
The noise coefficient of transceiver itself.
Step 801: obtaining the insertion loss of the radio frequency path.
In this step, since radio frequency path is approximate without in reflection loss in actual operation, obtained using second method
When taking the insertion loss of radio frequency path, need to exclude insertion loss caused by the reflection loss of the second C-path.
Step 801 is identical as the realization process of step 201, and I will not elaborate.
Step 802: the insertion loss of noise coefficient and the radio frequency path based on the RF transceiver expanded circuit,
Obtain the noise coefficient of the RF transceiver.
Step 802 is identical as the realization process of step 202, and I will not elaborate.
3rd embodiment
The embodiment of the invention also provides a kind of devices for measuring measured device noise coefficient, and Fig. 9 is the embodiment of the present invention
The composed structure schematic diagram for measuring the device of measured device noise coefficient, as shown in figure 9, the device includes: the first acquisition module
900, second module 901 and computing module 902 are obtained；Wherein,
First obtains module 900, for obtaining the noise coefficient of measured device expanded circuit；The measured device extension electricity
Road includes measured device and measured device access, and the measured device access includes that in the measured device, any one is defeated for setting
First impedance matching network of inbound port or any one output port；
Second obtains module 901, for obtaining the insertion loss of the measured device access；
Computing module 902, for noise coefficient and the measured device access based on the measured device expanded circuit
Insertion loss, obtain the noise coefficient of the measured device.
Here, first impedance matching network has measured device port, for connecting the measured device；
Described second obtains module 901, specifically for replicating to the measured device access；After replication tested
The setting of measured device port and the first impedance matching network of the impedance matching network of device access form conjugate impedance match or mirror image
Symmetrical impedance matching network；The insertion loss of cascade pathway is obtained, the cascade pathway includes that the measured device after duplication is logical
Road and the impedance matching network being connect with the measured device access after duplication；Insertion loss based on the cascade pathway obtains
The insertion loss of the measured device access out.
Further, described second module 901, the impedance matching network for measured device access after replication are obtained
Measured device port be provided with the first impedance matching network formed mirror symmetry impedance matching network when, obtain the grade
The reflection loss of the initial value of the insertion loss on connection road and the cascade pathway, by the insertion loss of the cascade pathway
Initial value subtracts the reflection loss of the cascade pathway, obtains the insertion loss of the cascade pathway.
The computing module 902, it is described tested specifically for subtracting the noise coefficient of the measured device expanded circuit
The insertion loss of device access obtains the noise coefficient of the measured device.
It should be understood by those skilled in the art that, the embodiment of the present invention can provide as method, system or computer program
Product.Therefore, the shape of hardware embodiment, software implementation or embodiment combining software and hardware aspects can be used in the present invention
Formula.Moreover, the present invention, which can be used, can use storage in the computer that one or more wherein includes computer usable program code
The form for the computer program product implemented on medium (including but not limited to magnetic disk storage and optical memory etc.).
The present invention be referring to according to the method for the embodiment of the present invention, the process of equipment (system) and computer program product
Figure and/or block diagram describe.It should be understood that every one stream in flowchart and/or the block diagram can be realized by computer program instructions
The combination of process and/or box in journey and/or box and flowchart and/or the block diagram.It can provide these computer programs
Instruct the processor of general purpose computer, special purpose computer, Embedded Processor or other programmable data processing devices to produce
A raw machine, so that being generated by the instruction that computer or the processor of other programmable data processing devices execute for real
The device for the function of being specified in present one or more flows of the flowchart and/or one or more blocks of the block diagram.
These computer program instructions, which may also be stored in, is able to guide computer or other programmable data processing devices with spy
Determine in the computer-readable memory that mode works, so that it includes referring to that instruction stored in the computer readable memory, which generates,
Enable the manufacture of device, the command device realize in one box of one or more flows of the flowchart and/or block diagram or
The function of being specified in multiple boxes.
These computer program instructions also can be loaded onto a computer or other programmable data processing device, so that counting
Series of operation steps are executed on calculation machine or other programmable devices to generate computer implemented processing, thus in computer or
The instruction executed on other programmable devices is provided for realizing in one or more flows of the flowchart and/or block diagram one
The step of function of being specified in a box or multiple boxes.
The foregoing is only a preferred embodiment of the present invention, is not intended to limit the scope of the present invention.
Claims (8)
1. a kind of method for measuring measured device noise coefficient, which is characterized in that the described method includes:
Obtain the noise coefficient of measured device expanded circuit；The measured device expanded circuit includes measured device and measured device
Access, the measured device access include being arranged in any one input port of the measured device or any one output port
The first impedance matching network；Wherein, first impedance matching network has measured device port, described tested for connecting
Device；
Obtain the insertion loss of the measured device access；Wherein, the insertion loss packet for obtaining the measured device access
It includes: the measured device access is replicated；The measured device of the impedance matching network of measured device access after replication
Port setting forms the impedance matching network of conjugate impedance match or mirror symmetry with the first impedance matching network；Obtain cascade pathway
Insertion loss, the cascade pathway include duplication after measured device access and with the measured device access after the duplication
The impedance matching network of connection；Insertion loss based on the cascade pathway obtains the insertion loss of the measured device access；
The insertion loss of noise coefficient and the measured device access based on the measured device expanded circuit, obtains the quilt
Survey the noise coefficient of device.
2. the method according to claim 1, wherein the insertion loss of the measured device access is the cascade
The half of the insertion loss of access.
3. the method according to claim 1, wherein the impedance matching network of measured device access after replication
Measured device port be provided with the first impedance matching network formed mirror symmetry impedance matching network when, the acquisition grade
The insertion loss on connection road includes:
The insertion loss of cascade pathway is measured, the initial value of the insertion loss of the cascade pathway is obtained；Described in acquisition
The reflection loss of cascade pathway damages the reflection that the initial value of the insertion loss of the cascade pathway subtracts the cascade pathway
Consumption, obtains the insertion loss of the cascade pathway.
4. method according to any one of claims 1 to 3, which is characterized in that the acquisition measured device expanded circuit
Noise coefficient, comprising: the gain and noise power spectral density that measured device expanded circuit is obtained by measuring are obtained based on measurement
The measured device expanded circuit gain and noise power spectral density, obtain the noise system of the measured device expanded circuit
Number.
5. method according to any one of claims 1 to 3, which is characterized in that described based on measured device extension electricity
The insertion loss of the noise coefficient on road and the measured device access, obtains the noise coefficient of the measured device, comprising: by institute
The noise coefficient for stating measured device expanded circuit subtracts the insertion loss of the measured device access, obtains the measured device
Noise coefficient.
6. a kind of device for measuring measured device noise coefficient, which is characterized in that described device includes: the first acquisition module, the
Two obtain module and computing module；Wherein,
First obtains module, for obtaining the noise coefficient of measured device expanded circuit；The measured device expanded circuit includes
Measured device and measured device access, the measured device access include being arranged in any one input port of the measured device
Or the first impedance matching network of any one output port；Wherein, first impedance matching network has measured device end
Mouthful, for connecting the measured device；
Second obtains module, for obtaining the insertion loss of the measured device access；Wherein, described to obtain the measured device
The insertion loss of access includes: to replicate to the measured device access；The impedance of measured device access after replication
The measured device port setting of distribution network forms the impedance matching net of conjugate impedance match or mirror symmetry with the first impedance matching network
Network；Obtain cascade pathway insertion loss, the cascade pathway include duplication after measured device access and with the duplication
The impedance matching network of measured device access connection afterwards；Insertion loss based on the cascade pathway obtains the measured device
The insertion loss of access；
Computing module, the insertion for noise coefficient and the measured device access based on the measured device expanded circuit are damaged
Consumption, obtains the noise coefficient of the measured device.
7. device according to claim 6, which is characterized in that described second obtains module, for being tested after replication
The measured device port of the impedance matching network of device access is provided with the resistance that mirror symmetry is formed with the first impedance matching network
When anti-matching network, the insertion loss of cascade pathway is measured, obtains the initial value of the insertion loss of the cascade pathway；
The initial value of the insertion loss of the cascade pathway, is subtracted the reflection of the cascade pathway by the reflection loss for obtaining cascade pathway
Loss, obtains the insertion loss of the cascade pathway.
8. according to the described in any item devices of claim 6 to 7, which is characterized in that the computing module, being specifically used for will be described
The noise coefficient of measured device expanded circuit subtracts the insertion loss of the measured device access, obtains making an uproar for the measured device
Sonic system number.
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| CN201510474016.0A CN106443220B (en) | 2015-08-05 | 2015-08-05 | A kind of method and apparatus measuring measured device noise coefficient |
| PCT/CN2016/089490 WO2017020683A1 (en) | 2015-08-05 | 2016-07-08 | Method and device for measuring noise figure of device under test |
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| CN107247696B (en) * | 2017-06-07 | 2020-09-18 | 中国电子科技集团公司第四十一研究所 | Method for calling S2P file to acquire loss compensation data in noise coefficient analyzer |
| CN108982983A (en) * | 2018-08-27 | 2018-12-11 | 湖南红太阳新能源科技有限公司 | A kind of Resistance Thermal Noise test method and test macro |
| TWI712810B (en) * | 2019-09-11 | 2020-12-11 | 英業達股份有限公司 | Method for detecting a pair of differential signals |
| CN112067914A (en) * | 2020-08-04 | 2020-12-11 | 中电科仪器仪表有限公司 | Method for correcting error introduced by extra network in noise coefficient measurement |
| CN115144805A (en) * | 2022-09-01 | 2022-10-04 | 北京唯捷创芯精测科技有限责任公司 | On-line quick calibration method for radio frequency switch chip test |
| CN116539931B (en) * | 2023-06-16 | 2023-10-20 | 荣耀终端有限公司 | Radio frequency device test connection device and test system |
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