CN106443220A - Method and system for measuring noise coefficient of detected device - Google Patents
Method and system for measuring noise coefficient of detected device Download PDFInfo
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- CN106443220A CN106443220A CN201510474016.0A CN201510474016A CN106443220A CN 106443220 A CN106443220 A CN 106443220A CN 201510474016 A CN201510474016 A CN 201510474016A CN 106443220 A CN106443220 A CN 106443220A
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- measured device
- path
- insertion loss
- impedance matching
- matching network
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
- G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04B—TRANSMISSION
- H04B17/00—Monitoring; Testing
Abstract
The embodiment of the invention discloses a method for measuring the noise coefficient of a detected device, and the method comprises the steps: obtaining the noise coefficient of a detected device expansion circuit, wherein the detected device expansion circuit comprises the detected device and a detected device loop, and the detected device loop comprises a first impedance matching network disposed at any one input port or output port of the detected device; obtaining the insertion loss of the detected device loop; and obtaining the noise coefficient of the detected device based on the noise coefficient of the detected device expansion circuit and the insertion loss of the detected device loop. The embodiment of the invention also discloses a device for measuring the noise coefficient of the detected device.
Description
Technical field
The present invention relates to noise-factor measurement technology, more particularly, to a kind of measurement measured device (Device Under
Test, DUT) noise coefficient (Noise Figure, NF) method and apparatus.
Background technology
With the high speed development of mobile communication technology, the requirement to the measurement accuracy of measured device noise coefficient
More and more higher.For some measured devices such as RF transceiver (RF Transceiver), in measurement quilt
During the noise coefficient of survey device, it usually needs in each output port of measured device, impedance matching network is set,
Test bench is set in the outfan of impedance matching network, connects noise-factor measurement instrument using test bench, enter
And complete the measurement of measured device noise coefficient.However, measuring to measured device noise coefficient above-mentioned
Technical scheme in, because impedance matching network can introduce insertion loss, lead to measure the noise coefficient drawing
It is not the noise coefficient of measured device itself, cause the accuracy of noise-factor measurement result to reduce.
It is to illustrate as a example RF transceiver by measured device below, Fig. 1 is to measure radio frequency in prior art
The electrical block diagram of transceiver noise coefficient, as shown in figure 1, measurement RF transceiver noise coefficient
Circuit is located on a chip testing plate 100, and this circuit includes：Supply module 101, clock module 102,
Status control module 103, simulation test seat 104, radio frequency testing seat 105, test motherboard interface 106, survey
Pilot 107, RF transceiver 108 and impedance matching network 109；Wherein, the output of RF transceiver 108
Port is passed through corresponding impedance matching network 109 and is connected radio frequency testing seat 105, permissible on radio frequency testing seat
Realization is docked with noise-factor measurement instrument；RF transceiver 108 has multiple output ports, in FIG
Illustrative with an output port.Specifically, clock module 102 is used for carrying for RF transceiver
For work clock；Status control module 103 is used for controlling the working condition of RF transceiver；Supply module 101
For providing working power to RF transceiver, clock module and status control module respectively；Simulation test seat
104 are used for providing simulation I/Q signal to RF transceiver, or receive the simulation IQ from RF transceiver
Signal；Radio frequency testing seat 105 is used for providing radiofrequency signal to RF transceiver, or receives from radio frequency receipts
Send out the radiofrequency signal of device, radio frequency testing seat can be used for noise-factor measurement instrument；Test point 107 connects penetrates
The pin of frequency transceiver, for monitoring the working condition of RF transceiver.Test motherboard interface 106 has been used for
Become the docking of chip testing plate 100 and FPGA motherboard, FPGA motherboard is used for providing SPI signal and base band
Data processing function is it is ensured that each device energy normal work on chip testing plate.In Fig. 1, RF transceiver
Circuit and noise-factor measurement instrument between can cause shadow to the measurement result of RF transceiver noise coefficient
Ring.Specifically, the input/output end port of RF transceiver 108 needs after connecting impedance matching network 109
Radio frequency testing seat 105 is connected by cabling, impedance matching network can bring insertion loss, thus to radio frequency
The measurement result of transceiver noise coefficient impacts；In addition, working as the input/output end port of RF transceiver relatively
When many, the layout based on circuit design considers, the cabling between impedance matching network and radio frequency testing seat has can
Can be long, so can bring about larger insertion loss, so can be further to RF transceiver noise
The measurement result of coefficient impacts.
Content of the invention
For solving above-mentioned technical problem, embodiment of the present invention expectation provides a kind of measurement measured device noise coefficient
Method and apparatus, it is possible to increase measurement measured device noise coefficient accuracy.
The technical scheme is that and be achieved in that：
Embodiments provide a kind of method of measurement measured device noise coefficient, including：
Obtain the noise coefficient of measured device expanded circuit；Described measured device expanded circuit includes measured device
With measured device path, described measured device path includes being arranged on any one input of described measured device
Mouth or the first impedance matching network of any one output port；
Obtain the insertion loss of described measured device path；
Noise coefficient based on described measured device expanded circuit and the insertion loss of described measured device path,
Draw the noise coefficient of described measured device.
In such scheme, described first impedance matching network has measured device port, for connecting described quilt
Survey device；
The described insertion loss obtaining described measured device path includes：Described measured device path is carried out multiple
System；The setting of measured device port and first impedance of the impedance matching network of measured device path after replication
Matching network forms the impedance matching network of conjugate impedance match or specular；Obtain the insertion loss of cascade pathway,
Described cascade pathway include replicate after measured device path and with described replicate after measured device path
The impedance matching network connecting；Described measured device path is drawn based on the insertion loss of described cascade pathway
Insertion loss.
In such scheme, the insertion loss of described measured device path is the insertion loss of described cascade pathway
Half.
In such scheme, the measured device port of the impedance matching network of measured device path after replication sets
When being equipped with the impedance matching network with the first impedance matching network formation specular, described acquisition cascade pathway
Insertion loss include：
The insertion loss of cascade pathway is measured, obtains the initial value of the insertion loss of described cascade pathway；
Obtain the reflection loss of described cascade pathway, the initial value of the insertion loss of described cascade pathway is deducted described
The reflection loss of cascade pathway, draws the insertion loss of described cascade pathway.
In such scheme, the described noise coefficient obtaining measured device expanded circuit, including：By measuring
Go out gain and the noise power spectral density of measured device expanded circuit, the described measured device drawing based on measurement
The gain of expanded circuit and noise power spectral density, draw the noise coefficient of described measured device expanded circuit.
In such scheme, the described noise coefficient based on described measured device expanded circuit and described measured device
The insertion loss of path, draws the noise coefficient of described measured device, including：Described measured device is extended
The noise coefficient of circuit deducts the insertion loss of described measured device path, draws the noise of described measured device
Coefficient.
The embodiment of the present invention additionally provides a kind of device of measurement measured device noise coefficient, including：First obtains
Delivery block, the second acquisition module and computing module；Wherein,
First acquisition module, for obtaining the noise coefficient of measured device expanded circuit；Described measured device expands
Exhibition circuit includes measured device and measured device path, and described measured device path includes being arranged on described tested
Any one input port of device or the first impedance matching network of any one output port；
Second acquisition module, for obtaining the insertion loss of described measured device path；
Computing module, leads to for the noise coefficient based on described measured device expanded circuit and described measured device
The insertion loss on road, draws the noise coefficient of described measured device.
In such scheme, described first impedance matching network has measured device port, for connecting described quilt
Survey device；
Described second acquisition module, specifically for replicating to described measured device path；After replication
The setting of measured device port and first impedance matching network of the impedance matching network of measured device path are formed altogether
Yoke coupling or the impedance matching network of specular；Obtain the insertion loss of cascade pathway, described cascade pathway
The impedance matching net be connected including the measured device path after replicating and with the measured device path after replicating
Network；Draw the insertion loss of described measured device path based on the insertion loss of described cascade pathway.
In such scheme, described second acquisition module, for the impedance of measured device path after replication
The measured device port of distribution network is provided with the impedance matching net forming specular with the first impedance matching network
During network, the insertion loss of cascade pathway is measured, obtain described cascade pathway insertion loss initial
Value；Obtain the reflection loss of cascade pathway, the initial value of the insertion loss of described cascade pathway is deducted described
The reflection loss of cascade pathway, draws the insertion loss of described cascade pathway.
In such scheme, described computing module, specifically for by the noise system of described measured device expanded circuit
Number deducts the insertion loss of described measured device path, draws the noise coefficient of described measured device.
A kind of method and apparatus of measurement measured device noise coefficient provided in an embodiment of the present invention, obtains tested
The noise coefficient of device expanded circuit；Obtain the insertion loss of described measured device path；Based on described tested
The noise coefficient of device expanded circuit and the insertion loss of described measured device path, draw described measured device
Noise coefficient.So, it is possible to draw the insertion loss of measured device path, and then improve the tested device of measurement
The accuracy of the noise coefficient of part.
Brief description
Fig. 1 is the electrical block diagram measuring RF transceiver noise coefficient in prior art；
The flow chart that Fig. 2 measures the first embodiment of method of measured device noise coefficient for the present invention；
Measured device extension in the first embodiment of the method for present invention measurement measured device noise coefficient for the Fig. 3
The composition structural representation of circuit；
The first side is adopted in the first embodiment of the method for present invention measurement measured device noise coefficient for the Fig. 4
The flow chart that method obtains the insertion loss of described measured device path；
First C-path in the first embodiment of the method for present invention measurement measured device noise coefficient for the Fig. 5
Composition structural representation；
Second side is adopted in the first embodiment of the method for present invention measurement measured device noise coefficient for the Fig. 6
The flow chart that method obtains the insertion loss of described measured device path；
Second C-path in the first embodiment of the method for present invention measurement measured device noise coefficient for the Fig. 7
Composition structural representation；
The flow chart that Fig. 8 measures the second embodiment of method of measured device noise coefficient for the present invention；
Fig. 9 measures the composition structural representation of the device of measured device noise coefficient for the embodiment of the present invention.
Specific embodiment
Below in conjunction with the accompanying drawing in the embodiment of the present invention, the technical scheme in the embodiment of the present invention is carried out clearly
Chu, it is fully described by.
First embodiment
The flow chart that Fig. 2 measures the first embodiment of method of measured device noise coefficient for the present invention, such as schemes
Shown in 2, the method includes：
Step 200：Obtain the noise coefficient of measured device expanded circuit.
Measured device extension in the first embodiment of the method for present invention measurement measured device noise coefficient for the Fig. 3
The composition structural representation of circuit, as shown in figure 3, described measured device expanded circuit 300 includes tested device
Part 301 and measured device path 302, described measured device path 302 includes being arranged on described measured device
301 any one input port or the first impedance matching network 303 of any one output port.
Here, measured device 301 can be the devices such as RF transceiver, radio-frequency transmitter；Measured device 301
There is at least one output port and at least one input port；Measured device path 302 can also include with
The first test bench 304 that first impedance matching network 301 connects and the first impedance matching network 303 with
Cabling between first test bench 304, the first test bench 304 can be used for access noise coefficient measuring instrument device.
Here, measured device expanded circuit 300 may be located at the first printed circuit board (Printed Circuit
Board, PCB) on.
In this step, the noise coefficient obtaining measured device expanded circuit has multiple existing implementations, example
As, it is possible to use gain method and Y factor method to measure the noise coefficient of measured device expanded circuit.
The process of the noise coefficient that obtain measured device expanded circuit is exemplified below.
The described noise coefficient obtaining measured device expanded circuit, including：Show that measured device expands by measurement
Exhibition gain G ain of circuit and noise power spectral density P of measured device expanded circuitNOUT, by following public affairs
Formula draws the noise coefficient NF of RF transceiver expanded circuit：
NF=PNOUT-(-174dBm/Hz+Gain).
Here, measurement draw the gain of measured device expanded circuit and the process of noise power spectral density have multiple
Existing implementation, I will not elaborate.
In this step, the first impedance matching network can be the circuit of pure resistance form, can also be including electricity
The circuit of anti-part；The effect being arranged on the first impedance matching network of measured device input port is to ensure that letter
Number can be inputted to measured device with minimum loss, be arranged on the first impedance matching of measured device output port
The effect of network is to ensure that the output signal of measured device can be sent with minimum loss；In order that first
Impedance matching network plays corresponding effect, before this step, by debugging measured device each is defeated
Enter/output port arranges out corresponding impedance matching network, setting the first impedance matching network has multiple existing
Implementation, I will not elaborate.
Here, the first impedance matching network 303 has two ports, and one of port is measured device end
Mouthful, for connecting measured device 301；Another port of first impedance matching network 303 is noise coefficient
Test port, for access noise coefficient measuring instrument device；Further, first impedance matching network 303
Noise coefficient test port can pass through the first test bench 304 access noise coefficient measuring instrument device.
Step 201：Obtain the insertion loss of described measured device path.
The described insertion loss obtaining described measured device path includes：Described measured device path is carried out multiple
System；The setting of measured device port and first impedance of the impedance matching network of measured device path after replication
Matching network forms the impedance matching network of conjugate impedance match or specular；Obtain the insertion loss of cascade pathway,
Described cascade pathway is included the measured device path after duplication and is connected with the measured device path after replicating
Impedance matching network；Draw the insertion of described measured device path based on the insertion loss of described cascade pathway
Loss.Here, the insertion loss of described survey device path is the half of described cascade pathway insertion loss.
Specifically, the insertion of described measured device path in this step, can be obtained using following two methods
Loss.
First method：
The first side is adopted in the first embodiment of the method for present invention measurement measured device noise coefficient for the Fig. 4
The flow chart that method obtains the insertion loss of described measured device path, as shown in figure 4, this flow process includes：
Step 201A：Described measured device path is replicated, obtains the first duplication measured device path.
That is, the measured device path after replicating is the first duplication measured device path.
Here it is possible to replicate to described measured device path on the 2nd PCB, the 2nd PCB and
One PCB has identical laminated construction.
It should be noted that in this step, only replicating to described measured device path, not to tested
Device is replicated.
Step 201B：Measured device port setting in the impedance matching network of the first duplication measured device path
Second impedance matching network, makes the impedance matching network in the measured device of duplication and the second impedance matching network
Form conjugate impedance match.
Specifically, the impedance matching network in the second impedance matching network and the first duplication measured device path exists
Symmetrical circuit structure form is had on the second pcb board, the cabling in the second impedance matching network and first is again
The cabling of the impedance matching network in measured device path processed is symmetrical.Here it is possible to pass through adjustment second
The parameter of the device of impedance matching network, makes the impedance matching network in the measured device of duplication and the second impedance
Matching network realizes impedance matching, and the process of the parameter of device of adjustment the second impedance matching network has multiple
Existing implementation, I will not elaborate.
In this step, described first replicates impedance matching network and the second impedance matching in measured device path
Network meets the condition of conjugate impedance match；That is, replicate tested for the second impedance matching network and first
Impedance matching network in device path, the real part of both impedances is equal, imaginary part opposite number each other.
In actual applications, the second impedance matching network has two ports, and one of port is used for connecting
The measured device port of the first duplication measured device path, the another port of the second impedance matching network is Insertion Loss
Test port, for accessing insert loss instrument；First duplication measured device path has two ports,
One of port is the measured device port of the impedance matching network of itself, for connecting the second impedance matching
Network, the another port of the first duplication measured device path is Insertion Loss test port, for accessing insertion loss
Measuring instrument.Here, insert loss instrument can be realized using vector network analyzer.
Step 201C：Obtain the insertion loss of the first C-path.
First C-path in the first embodiment of the method for present invention measurement measured device noise coefficient for the Fig. 5
Composition structural representation, as shown in figure 5, described first C-path 500 includes the second impedance matching net
Network 501 and the first duplication measured device path 502, the first C-path 500 has two ports, wherein
A port is the Insertion Loss test port of the second impedance matching network 501, for accessing insert loss instrument
Device；Another port of first C-path 500 is the Insertion Loss test of the first duplication measured device path 502
Port, for accessing insert loss instrument.Here, cascade pathway is the first C-path 500.
In actual applications, it is possible to use the insert loss instrument such as vector network analyzer combines to first
The insertion loss of path measures, thus drawing the insertion loss of the first C-path.
In addition, when the insertion loss to the first C-path measures, can be by measuring the first combination
The insertion loss to draw the first C-path for the S21 parameter of path.
Further, the first C-path 500 also includes the Insertion Loss test with the second impedance matching network 501
The second test bench 503 that port connects and the second impedance matching network 501 and the second test bench 503 it
Between cabling, the second test bench 503 is used for accessing insert loss instrument.
Here, first is replicated measured device path 502 middle impedance matching network and the first duplication measured device
Cabling between the Insertion Loss test port of path 502 is designated as the first Wiring structure, by the second impedance matching network
501 and second cablings between test bench 503 are designated as the second Wiring structure, and on the 2nd PCB, first walks
Line structure and the second Wiring structure are symmetrical.
Step 201D：Draw the insertion loss of measured device path based on the insertion loss of the first C-path,
The insertion loss A1 of measured device path is：A1=S21/2, here, S21 represents what step 201C drew
The insertion loss of the first C-path.
Second method：
Second side is adopted in the first embodiment of the method for present invention measurement measured device noise coefficient for the Fig. 6
The flow chart that method obtains the insertion loss of described measured device path, as shown in fig. 6, this flow process includes：
Step 201a：Described measured device path is replicated, obtains the second duplication measured device path.
That is, the measured device path after replicating is the second duplication measured device path.
Here it is possible to replicate to described measured device path on the 3rd PCB, the 3rd PCB and
One PCB has identical laminated construction.
It should be noted that in this step, only replicating to described measured device path, not to tested
Device is replicated.
Step 201b：Measured device port setting in the impedance matching network of the second duplication measured device path
3rd impedance matching network, the circuit structure of the 3rd impedance matching network and the second duplication measured device path
The circuit structure specular of impedance matching network.
Here, each device of the 3rd impedance matching network adopts and the symmetrical device identical device of itself.
In actual applications, the 3rd impedance matching network has two ports, and one of port is used for connecting
The measured device port of the second duplication measured device path, the another port of the 3rd impedance matching network is Insertion Loss
Test port, for accessing insert loss instrument；Second duplication measured device path has two ports,
One of port is the measured device port of the impedance matching network of itself, for connecting the 3rd impedance matching
Network, the another port of the second duplication measured device path is Insertion Loss test port, for accessing insertion loss
Measuring instrument.Here, insert loss instrument can be realized using vector network analyzer.
Step 201c：Obtain the insertion loss of the second C-path；
Second C-path in the first embodiment of the method for present invention measurement measured device noise coefficient for the Fig. 7
Composition structural representation, as shown in fig. 7, described second C-path 700 includes the 3rd impedance matching net
Network 701 and the second duplication measured device path 702, the second C-path 700 has two ports, wherein
A port is the Insertion Loss test port of the 3rd impedance matching network 701, for accessing insert loss instrument
Device；Another port of second C-path 700 is the Insertion Loss test of the second duplication measured device path 702
Port, for accessing insert loss instrument.Here, cascade pathway is the second C-path 700.
In actual applications, it is possible to use the insert loss instrument such as vector network analyzer combines to second
The insertion loss of path measures, thus drawing the initial value of the insertion loss of the second C-path.
In addition, when the insertion loss to the second C-path measures, can be by measuring the second combination
The initial value to draw the insertion loss of the second C-path for the S21 parameter of path.
Further, the second C-path 700 also includes the Insertion Loss test with the 3rd impedance matching network 701
The 3rd test bench 703 that port connects and the 3rd impedance matching network 701 and the 3rd test bench 703 it
Between cabling, the 3rd test bench 703 is used for accessing insert loss instrument.
Here, second is replicated measured device path 702 middle impedance matching network and the second duplication measured device
Cabling between the Insertion Loss test port of path 702 is designated as the 3rd Wiring structure, by the 3rd impedance matching network
701 and the 3rd cablings between test bench 703 are designated as the 4th Wiring structure, and on the 3rd PCB, the 3rd walks
Line structure and the 4th Wiring structure are symmetrical.
In this step, after drawing the initial value of insertion loss of the second C-path, or draw second group
Before closing the initial value of insertion loss of path, obtain the reflection loss of the second C-path.Here it is possible to
Obtain the reflection loss of the second C-path by emulation, for example, it is possible to pass through ADS (Advanced Design
) etc. System simulation software emulation draws the reflection loss of the second C-path.
After obtaining the reflection loss of the second C-path, the insertion loss of the second C-path is initial
Value deducts the reflection loss of the second C-path, draws the insertion loss of the second C-path.
Step 201d：Draw the insertion loss of measured device path based on the insertion loss of the second C-path,
The insertion loss of measured device path is the half of the insertion loss of the second C-path.
That is, the insertion loss of measured device path can be calculated by below equation：
A1=(S21 '-LR)/2
Wherein, S21 ' represents the initial value of the insertion loss of the second C-path, LRRepresent the anti-of the second C-path
Penetrate loss.
It should be noted that in first embodiment of the invention, making an uproar of measured device expanded circuit can be being obtained
After sonic system number, obtain the insertion loss of described measured device path；Measured device extension can also obtained
Before the noise coefficient of circuit, obtain the insertion loss of described measured device path.
Step 202：Noise coefficient based on described measured device expanded circuit and described measured device path
Insertion loss, draws the noise coefficient of described measured device.
This step specifically includes：The noise coefficient of described measured device expanded circuit is deducted described measured device
The insertion loss of path, draws the noise coefficient of described measured device.That is, described measured device
Noise coefficient NFportFor：NFport=NF-A1.
In first embodiment of the invention, if obtain the insertion of described measured device path using first method
Loss, replicates impedance matching network and the second impedance matching network satisfaction in measured device path due to first
The condition of conjugate impedance match, so, the loss of the transmission in the first C-path for the signal can relatively low to minima.
In addition, a 2nd PCB and PCB has identical laminated construction, so a 2nd PCB and PCB
The insertion loss caused by laminated construction be consistent, so, it is possible to use the 2nd PCB upper first combination
The insertion loss of path goes to calculate the insertion loss of measured device path on a PCB.
Here, using first method obtain described measured device path insertion loss when, due to not considering
Reflection loss, is therefore suitable for the situation that the first impedance matching network is pure resistance.
In first embodiment of the invention, if obtain the insertion of described measured device path using second method
Loss, replicates impedance matching network and the 3rd impedance matching network mirror image in measured device path due to second
Symmetrically, the initial value of the insertion loss of the second C-path not only includes the device loss of the second C-path and draws
The insertion loss rising and cabling are lost the insertion loss causing, and also include the reflection loss of the second C-path
The insertion loss causing；When measured device path do not exist reflection loss or corresponding reflection loss very low when,
The reflection loss excluding the second C-path when calculating the insertion loss of the second C-path is needed to cause
Insertion loss.In addition, a 3rd PCB and PCB has identical laminated construction, so the 3rd PCB
It is consistent with the insertion loss caused by the laminated construction of a PCB, so, it is possible to use the 3rd PCB
The insertion loss of upper second C-path goes to calculate the insertion loss of measured device path on a PCB.
Here, using second method obtain described measured device path insertion loss when it is contemplated that reflection
The insertion loss that cause is lost, is therefore suitable for the situation that the first impedance matching network is pure resistance, or be suitable for the
One impedance matching network comprises the situation of reaction component.
Second embodiment
In order to be able to more embody the purpose of the present invention, on the basis of first embodiment of the invention, enter traveling one
The illustration of step.
In second embodiment of the invention, measured device is RF transceiver, and it is right to complete on a PCB
The reception of RF transceiver, emitting performance test；Wherein, the noise system in the receptivity of RF transceiver
Number is a RF index of non-the normally off key.In order to draw the noise coefficient in the receptivity of RF transceiver,
Debug out the first impedance matching network in an input port of RF transceiver, the first impedance matching network
Effect is to ensure that radiofrequency signal can be transferred to RF transceiver with minimum loss, generally by the first radio-frequency receiving-transmitting
The impedance matching of the input port of device, near 50ohm, so can reduce the first impedance matching network as far as possible
The reflection loss being brought；After debugging out the first impedance matching network, just RF transceiver can be connect
The noise coefficient received in performance measures, specifically described below.
The flow chart that Fig. 8 measures the second embodiment of method of measured device noise coefficient for the present invention, such as schemes
Shown in 8, this flow process includes：
Step 800：Obtain the noise coefficient of RF transceiver expanded circuit.
Here, RF transceiver expanded circuit is located on a PCB, and RF transceiver expanded circuit includes penetrating
Frequency is packed up and radio frequency path, and radio frequency path includes being arranged on the first of any one input port of RF transceiver
Impedance matching network.Radio frequency path also include the first test bench being connected with the first impedance matching network and
Cabling between first impedance matching network and the first test bench, the first test bench can be used for access noise system
Number measuring instrument.
The described noise coefficient obtaining RF transceiver expanded circuit includes：RF transceiver is drawn by measurement
Gain G ain of expanded circuit and noise power spectral density P of RF transceiver expanded circuitNOUT, pass through
Below equation draws the noise coefficient NF of RF transceiver expanded circuit：
NF=PNOUT-(-174dBm/Hz+Gain).
It should be noted that because radio frequency path can bring insertion loss, therefore, the noise that this step draws
Coefficient is not the noise coefficient of RF transceiver itself, needs to show that the insertion that radio frequency path brings is damaged in measurement
The noise coefficient of RF transceiver itself just can be drawn after consumption.
Step 801：Obtain the insertion loss of described radio frequency path.
In this step, due to radio frequency path, in real work, approximate nothing, in reflection loss, is adopting second
When method obtains the insertion loss of radio frequency path, need what the reflection loss excluding the second C-path caused to insert
Enter loss.
Step 801 and step 201 realize that process is identical, I will not elaborate.
Step 802：The inserting of noise coefficient based on described RF transceiver expanded circuit and described radio frequency path
Enter loss, draw the noise coefficient of described RF transceiver.
Step 802 and step 202 realize that process is identical, I will not elaborate.
3rd embodiment
The embodiment of the present invention additionally provides a kind of device of measurement measured device noise coefficient, and Fig. 9 is the present invention
The composition structural representation of the device of examples measure measured device noise coefficient, as shown in figure 9, this device
Including：First acquisition module 900, the second acquisition module 901 and computing module 902；Wherein,
First acquisition module 900, for obtaining the noise coefficient of measured device expanded circuit；Described tested device
Part expanded circuit includes measured device and measured device path, and described measured device path includes being arranged on described
Any one input port of measured device or the first impedance matching network of any one output port；
Second acquisition module 901, for obtaining the insertion loss of described measured device path；
Computing module 902, for the noise coefficient based on described measured device expanded circuit and described tested device
The insertion loss of part path, draws the noise coefficient of described measured device.
Here, described first impedance matching network has measured device port, for connecting described measured device；
Described second acquisition module 901, specifically for replicating to described measured device path；Replicating
The setting of measured device port and the first impedance matching network shape of the impedance matching network of measured device path afterwards
Become the impedance matching network of conjugate impedance match or specular；Obtain the insertion loss of cascade pathway, described cascade
Path includes the measured device path after duplication and the impedance being connected with the measured device path after replicating
Distribution network；Draw the insertion loss of described measured device path based on the insertion loss of described cascade pathway.
Further, described second acquisition module 901, for the impedance of measured device path after replication
The measured device port of matching network is provided with the impedance matching forming specular with the first impedance matching network
During network, obtain the initial value of insertion loss of described cascade pathway and the reflection loss of described cascade pathway,
The initial value of the insertion loss of described cascade pathway is deducted the reflection loss of described cascade pathway, draw described
The insertion loss of cascade pathway.
Described computing module 902, specifically for deducting institute by the noise coefficient of described measured device expanded circuit
State the insertion loss of measured device path, draw the noise coefficient of described measured device.
Those skilled in the art are it should be appreciated that embodiments of the invention can be provided as method, system or meter
Calculation machine program product.Therefore, the present invention can using hardware embodiment, software implementation or combine software and
The form of the embodiment of hardware aspect.And, the present invention can adopt and wherein include calculating one or more
Computer-usable storage medium (including but not limited to disk memory and the optical storage of machine usable program code
Device etc.) the upper computer program implemented form.
The present invention is with reference to method according to embodiments of the present invention, equipment (system) and computer program
Flow chart and/or block diagram describing.It should be understood that can be by computer program instructions flowchart and/or side
Each flow process in block diagram and/or the knot of the flow process in square frame and flow chart and/or block diagram and/or square frame
Close.Can provide these computer program instructions to general purpose computer, special-purpose computer, Embedded Processor or
The processor of other programmable data processing device with produce a machine so that by computer or other can
The instruction of the computing device of programming data processing equipment produces for realizing in one flow process or multiple of flow chart
The device of the function of specifying in flow process and/or one square frame of block diagram or multiple square frame.
These computer program instructions may be alternatively stored in and can guide computer or other programmable data processing device
So that being stored in this computer-readable memory in the computer-readable memory working in a specific way
Instruction produces the manufacture including command device, and this command device is realized in one flow process of flow chart or multiple stream
The function of specifying in journey and/or one square frame of block diagram or multiple square frame.
These computer program instructions also can be loaded in computer or other programmable data processing device, makes
Obtain and series of operation steps is executed on computer or other programmable devices to produce computer implemented place
Reason, thus the instruction of execution is provided for realizing in flow chart one on computer or other programmable devices
The step of the function of specifying in flow process or multiple flow process and/or one square frame of block diagram or multiple square frame.
The above, only presently preferred embodiments of the present invention, it is not intended to limit the protection model of the present invention
Enclose.
Claims (10)
1. a kind of method of measurement measured device noise coefficient is it is characterised in that methods described includes：
Obtain the noise coefficient of measured device expanded circuit；Described measured device expanded circuit includes measured device
With measured device path, described measured device path includes being arranged on any one input of described measured device
Mouth or the first impedance matching network of any one output port；
Obtain the insertion loss of described measured device path；
Noise coefficient based on described measured device expanded circuit and the insertion loss of described measured device path,
Draw the noise coefficient of described measured device.
2. method according to claim 1 is it is characterised in that described first impedance matching network has
Measured device port, for connecting described measured device；
The described insertion loss obtaining described measured device path includes：Described measured device path is carried out multiple
System；The setting of measured device port and first impedance of the impedance matching network of measured device path after replication
Matching network forms the impedance matching network of conjugate impedance match or specular；Obtain the insertion loss of cascade pathway,
Described cascade pathway include replicate after measured device path and with described replicate after measured device path
The impedance matching network connecting；Described measured device path is drawn based on the insertion loss of described cascade pathway
Insertion loss.
3. method according to claim 2 is it is characterised in that the insertion of described measured device path is damaged
Consume the half of the insertion loss for described cascade pathway.
4. method according to claim 2 is it is characterised in that measured device path after replication
The measured device port of impedance matching network is provided with the impedance forming specular with the first impedance matching network
During matching network, the insertion loss of described acquisition cascade pathway includes：
The insertion loss of cascade pathway is measured, obtains the initial value of the insertion loss of described cascade pathway；
Obtain the reflection loss of described cascade pathway, the initial value of the insertion loss of described cascade pathway is deducted described
The reflection loss of cascade pathway, draws the insertion loss of described cascade pathway.
5. the method according to any one of Claims 1-4 is it is characterised in that the tested device of described acquisition
The noise coefficient of part expanded circuit, including：Draw gain and the noise of measured device expanded circuit by measurement
Power spectral density, the gain of the described measured device expanded circuit being drawn based on measurement and noise power spectral density,
Draw the noise coefficient of described measured device expanded circuit.
6. the method according to any one of Claims 1-4 it is characterised in that described based on described quilt
Survey the noise coefficient of device expanded circuit and the insertion loss of described measured device path, draw described tested device
The noise coefficient of part, including：The noise coefficient of described measured device expanded circuit is deducted described measured device
The insertion loss of path, draws the noise coefficient of described measured device.
7. a kind of device of measurement measured device noise coefficient is it is characterised in that described device includes：First
Acquisition module, the second acquisition module and computing module；Wherein,
First acquisition module, for obtaining the noise coefficient of measured device expanded circuit；Described measured device expands
Exhibition circuit includes measured device and measured device path, and described measured device path includes being arranged on described tested
Any one input port of device or the first impedance matching network of any one output port；
Second acquisition module, for obtaining the insertion loss of described measured device path；
Computing module, leads to for the noise coefficient based on described measured device expanded circuit and described measured device
The insertion loss on road, draws the noise coefficient of described measured device.
8. device according to claim 7 is it is characterised in that described first impedance matching network has
Measured device port, for connecting described measured device；
Described second acquisition module, specifically for replicating to described measured device path；After replication
The setting of measured device port and first impedance matching network of the impedance matching network of measured device path are formed altogether
Yoke coupling or the impedance matching network of specular；Obtain the insertion loss of cascade pathway, described cascade pathway
The impedance matching net be connected including the measured device path after replicating and with the measured device path after replicating
Network；Draw the insertion loss of described measured device path based on the insertion loss of described cascade pathway.
9. device according to claim 8 is it is characterised in that described second acquisition module, for
The measured device port of the impedance matching network of measured device path after duplication is provided with and the first impedance matching
When network forms the impedance matching network of specular, the insertion loss of cascade pathway is measured, obtains
The initial value of the insertion loss of described cascade pathway；Obtain the reflection loss of cascade pathway, by described level UNICOM
The initial value of the insertion loss on road deducts the reflection loss of described cascade pathway, draws inserting of described cascade pathway
Enter loss.
10. the device according to any one of claim 7 to 9 is it is characterised in that described computing module,
Insertion specifically for the noise coefficient of described measured device expanded circuit deducts described measured device path is damaged
Consumption, draws the noise coefficient of described measured device.
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| CN201510474016.0A CN106443220B (en) | 2015-08-05 | 2015-08-05 | A kind of method and apparatus measuring measured device noise coefficient |
| PCT/CN2016/089490 WO2017020683A1 (en) | 2015-08-05 | 2016-07-08 | Method and device for measuring noise figure of device under test |
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Cited By (2)
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| TWI712810B (en) * | 2019-09-11 | 2020-12-11 | 英業達股份有限公司 | Method for detecting a pair of differential signals |
| CN115144805A (en) * | 2022-09-01 | 2022-10-04 | 北京唯捷创芯精测科技有限责任公司 | On-line quick calibration method for radio frequency switch chip test |
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| CN106443220B (en) | 2019-04-30 |
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