CN112448773B

CN112448773B - Radio frequency compensator, radio frequency test method and system

Info

Publication number: CN112448773B
Application number: CN201910810499.5A
Authority: CN
Inventors: 李欣; 代雪峰
Original assignee: Huizhou BYD Electronic Co Ltd
Current assignee: Huizhou BYD Electronic Co Ltd
Priority date: 2019-08-29
Filing date: 2019-08-29
Publication date: 2023-02-07
Anticipated expiration: 2039-08-29
Also published as: CN112448773A

Abstract

The present disclosure relates to a radio frequency compensator, a radio frequency test method and a system, wherein the radio frequency compensator is applied to a radio frequency test system, the test system comprises a test device and a device to be tested, the radio frequency compensator comprises a plurality of impedance matching networks, and the impedance values of the impedance matching networks are different; the radio frequency compensator is used in the radio frequency test system, and is connected in series with the test equipment and the equipment to be tested to form a test link, wherein in the process of testing the equipment to be tested, the test equipment is selectively electrically communicated with the equipment to be tested through any one of the impedance matching networks, so that the sum of the impedance value of the radio frequency compensator and the impedance value of the equipment to be tested is matched with the impedance value of the test equipment.

Description

Radio frequency compensator, radio frequency test method and system

Technical Field

The present disclosure relates to the field of communications technologies, and in particular, to a radio frequency compensator, a radio frequency test method, and a radio frequency test system.

Background

During the manufacturing process of many electronic products, the products are subjected to relevant electrical property tests. Among them, the rf test is an important test link.

The radio frequency test mode adopted in the related art depends on the related characteristics of the test fixture and the test lead, but the related test tool is easy to generate corresponding characteristic deviation under the influence of some factors, and finally the test precision is reduced.

Disclosure of Invention

The present disclosure is directed to a radio frequency compensator, a radio frequency testing method and a system thereof, for solving the above technical problems.

In order to achieve the above object, in a first aspect, the present disclosure provides a radio frequency compensator, where the radio frequency compensator is applied to a radio frequency test system, the test system includes a test device and a device under test, the radio frequency compensator includes a plurality of impedance matching networks, and an impedance value of each impedance matching network is different;

the radio frequency compensator is used in the radio frequency test system, and is connected in series with the test equipment and the equipment to be tested to form a test link, wherein in the process of testing the equipment to be tested, the test equipment is selectively electrically communicated with the equipment to be tested through any one of the impedance matching networks, so that the sum of the impedance value of the radio frequency compensator and the impedance value of the equipment to be tested is matched with the impedance value of the test equipment.

Optionally, the radio frequency compensator further comprises:

a switching device for series connection in the test chain;

the radio frequency compensator is electrically communicated with any impedance matching network between the test equipment and the equipment to be tested selectively through the switch device.

Optionally, the radio frequency compensator further comprises:

and the control circuit is used for controlling the switch device to be electrically communicated with the impedance matching network corresponding to the frequency range between the test equipment and the equipment to be tested according to the frequency range of the test signal transmitted by the test equipment.

Optionally, each of the impedance matching networks comprises a pi-type impedance matching network and/or a T-type impedance matching network.

In a second aspect, the present disclosure provides a radio frequency testing method applied to a radio frequency testing system including the radio frequency compensator of any one of the above first aspects, the method including:

debugging the sequentially connected test equipment, the radio frequency compensator and the equipment to be tested according to the type information of the equipment to be tested, so that the voltage standing wave ratio of signals in a test link reaches a preset threshold range;

controlling the radio frequency compensator to start a corresponding impedance matching network according to a frequency range to which a target test signal belongs, wherein the target test signal is generated by the test equipment, and the voltage standing wave ratio in the test link is kept within the preset threshold range under the condition that the corresponding impedance matching networks are electrically communicated;

and carrying out radio frequency test on the equipment to be tested according to the target test signal.

Optionally, the debugging the sequentially connected test device, the radio frequency compensator and the device to be tested to enable the voltage standing wave ratio of the signal in the test link to reach a preset threshold range includes:

and adjusting the values of capacitance and/or inductance in each impedance matching network in the radio frequency compensator to ensure that the voltage standing wave ratio VSWR of the signal in the test link is as follows: VSWR is more than or equal to 1 and less than or equal to 1.2.

Optionally, the impedance matching network is set based on a type of the device under test.

Optionally, the controlling the radio frequency compensator to turn on the corresponding impedance matching network according to the frequency range to which the target test signal belongs includes:

controlling the radio frequency compensator to start a corresponding low-frequency impedance matching network;

the radio frequency testing the device to be tested according to the target test signal comprises:

and transmitting the target test signal compensated by the low-frequency impedance matching network as a test signal to a test probe connected with the low-frequency impedance matching network, and performing loopback test on the equipment to be tested.

In a third aspect, the present disclosure provides a radio frequency test system, including a test device, a device under test, and the radio frequency compensator according to any of the first aspect, where the test device, the radio frequency compensator, and the device under test are connected in sequence.

Optionally, the test device is configured to generate a radio frequency test signal, receive a feedback signal fed back by the device under test through the radio frequency compensator, and determine a test result of the device under test according to the feedback signal;

the radio frequency compensator is used for compensating the radio frequency test signal, so that when the test equipment is selectively electrically communicated with the equipment to be tested through any one of a plurality of impedance matching networks of the radio frequency compensator, the sum of the impedance value of the radio frequency compensator and the impedance value of the equipment to be tested is matched with the impedance value of the test equipment.

The technical scheme at least comprises the following technical effects:

by arranging the plurality of impedance matching networks in the radio frequency compensator, when the equipment to be tested is subjected to radio frequency test, the test equipment and the equipment to be tested can be selectively connected through different impedance matching networks according to specific test conditions, so that a corresponding test link is formed. And the sum of the impedance value of the radio frequency compensator and the impedance value of the equipment to be tested is matched with the impedance value of the test equipment, so that the effects of reducing errors in the test process and improving the test accuracy are achieved.

Additional features and advantages of the disclosure will be set forth in the detailed description which follows.

Drawings

The accompanying drawings, which are included to provide a further understanding of the disclosure and are incorporated in and constitute a part of this specification, illustrate embodiments of the disclosure and together with the description serve to explain the disclosure, but do not constitute a limitation of the disclosure. In the drawings:

fig. 1 is a schematic diagram of a radio frequency test system according to an exemplary embodiment of the present disclosure.

Fig. 2 is a circuit diagram of a radio frequency compensator according to an exemplary embodiment of the present disclosure.

Fig. 3 is a circuit diagram of a pi-type impedance matching network according to an exemplary embodiment of the disclosure.

Fig. 4 is a circuit diagram of a T-type impedance matching network according to an exemplary embodiment of the present disclosure.

Fig. 5 is a flow chart illustrating a radio frequency testing method according to an exemplary embodiment of the present disclosure.

Fig. 6 is a schematic diagram of a design of a radio frequency compensator according to an exemplary embodiment of the present disclosure.

Fig. 7 is a block diagram of an electronic device shown in an exemplary embodiment of the present disclosure.

Description of the reference numerals

100-radio frequency compensator, 200-test equipment, 300-equipment to be tested, 21-first switching device, 22-second switching device, 23-low frequency impedance matching network, 24-intermediate frequency impedance matching network and 25-high frequency impedance matching network.

Detailed Description

The following detailed description of specific embodiments of the present disclosure is provided in connection with the accompanying drawings. It should be understood that the detailed description and specific examples, while indicating the present disclosure, are given by way of illustration and explanation only, not limitation.

Before introducing the radio frequency compensator, the radio frequency test method and the radio frequency test system provided by the disclosure, an application scenario of the disclosure is introduced first, and the embodiment provided by the disclosure can be applied to a radio frequency test process of electronic equipment such as a mobile phone and a tablet computer. Currently, radio frequency testing is an important link in the manufacturing process of electronic products such as mobile phones and tablet computers. In the related art, a corresponding test signal may be generated by a test device such as an integrated tester and transmitted to a test probe through a test rf cable. After the test fixture is pressed down, the test probe is inserted into a radio frequency seat of the electronic equipment, and then the corresponding electronic equipment is electrified to run a corresponding test program. It should be noted that such an rf testing method depends on the related impedance characteristics of the testing fixture and the testing conductive line, and the related testing tool is prone to generate a corresponding impedance characteristic shift under the influence of some factors, which eventually results in a reduction in testing accuracy.

In order to solve the above technical problem, the present disclosure provides a radio frequency compensator, which is applied to a radio frequency test system as shown in fig. 1, where the radio frequency test system includes a test device 200 and a device under test 300, the radio frequency compensator 100 includes a plurality of impedance matching networks, and impedance values of the impedance matching networks are different;

the radio frequency compensator 100 is configured to be connected in series with the test device 200 and the device under test 300 in the radio frequency test system to form a test link, wherein during a test of the device under test 300, the test device 200 is selectively electrically connected to the device under test 300 through any one of the impedance matching networks, so that a sum of an impedance value of the radio frequency compensator 100 and an impedance value of the device under test 300 is matched to an impedance value of the test device 200.

In one embodiment, the impedance matching network may be divided according to a frequency range of the test signal. Illustratively, referring to the rf compensator 100 shown in fig. 1, the rf compensator 100 may include three impedance matching networks. The illustrated impedance matching networks 1 to 3 may be a low-frequency impedance matching network, a medium-frequency impedance matching network, and a high-frequency impedance matching network, respectively, and the corresponding frequency ranges may be: 689-960MHz, 1427-2170MHz, and 2300-2570MHz.

In this way, by setting the impedance matching networks corresponding to a plurality of different frequency ranges in the radio frequency compensator 100, when the device to be tested 300 is subjected to radio frequency test, the test device 200 and the device to be tested 300 can be selectively connected through different impedance matching networks according to a specific test signal frequency range, so as to form a corresponding test link. And performing frequency division compensation on the test signal according to the frequency range of the test signal, so that when the corresponding impedance matching network is started, the sum of the impedance value of the radio frequency compensator 100 and the impedance value of the device to be tested 300 is matched with the impedance value of the test device 200, thereby reducing errors in the test process and improving the test accuracy.

It should be noted that the above embodiments are only examples, and the relevant components are not necessary for the present invention. Those skilled in the art will appreciate that, in implementation, the frequency range of the impedance matching network in the rf compensator 100 may also be modified according to actual requirements (e.g., refining the frequency range or expanding the frequency range, etc.). Correspondingly, the number of the impedance matching networks can also be increased or decreased according to the frequency range division manner of the test signal, and the number of the impedance matching networks and the specific frequency range of each impedance matching network are not limited by the disclosure.

In a possible implementation, the rf compensator 100 further includes:

a switching device for series connection in the test link;

the rf compensator 100 is electrically connected to any impedance matching network between the test equipment 200 and the device under test 300 selectively through the switching device.

Wherein the switching device may be selected according to the number of the impedance matching networks. In one embodiment, the impedance matching networks are two, and the switching device can be a single-pole double-throw switch.

In another embodiment, such as the one shown in fig. 2, the number of the impedance matching networks is 3. The switching device may use an SP3T switch (model RF 1613A), which may include a first switching device 21 and a second switching device 22. In this way, the first switch device 21 and the second switch device 22 can selectively electrically communicate with any one of the impedance matching networks between the test equipment 200 and the device under test 300 in response to different logic control signals.

In the above embodiment, optionally, the radio frequency compensator 100 further includes:

and the control circuit is used for controlling the switching device to electrically connect the impedance matching network corresponding to the frequency range between the test equipment 200 and the equipment 300 to be tested according to the frequency range of the test signal transmitted by the test equipment 200.

Still referring to fig. 3, in one embodiment, the rf compensator 100 includes a low frequency impedance matching network 23, a medium frequency impedance matching network 24, and a high frequency impedance matching network 25. The control circuit may output corresponding high and low levels to the CTL1 and CTL2 of the SP3T switch according to a frequency range of the test signal transmitted by the test device 200, so as to control the switching device to electrically connect the impedance matching network corresponding to the frequency range between the test device 200 and the device 300 to be tested. The truth table of the logic control is shown in table 1:

Mode	CTL1	CTL2
			RF1	High	Low
RF2	Low	High
			RF3	High	High

TABLE 1

For example, the frequency range of the test signal is 689-960MHz, the control circuit may input a high level signal and a low level signal to the CTL1 pin and the CTL2 pin of the SP3T switch, respectively, so as to control the switching device to electrically connect the low frequency impedance matching network 23 between the test equipment 200 and the device under test 300.

In another possible implementation, each of the impedance matching networks of the rf compensator 100 includes a pi-type impedance matching network and/or a T-type impedance matching network.

As shown in FIG. 3, in one embodiment, the impedance matching network includes a low frequency impedance matching network 23 composed of L1-L9 and C1, a medium frequency impedance matching network 24 composed of L10-L18 and C2, and a high frequency impedance matching network 25 composed of L19-L27 and C3.

Specifically, the low-frequency impedance matching network 23 includes a first pi-type impedance matching network composed of L1, L5, and L6, a second pi-type impedance matching network composed of L4, L8, and L9, and a first T-type impedance matching network composed of L2, L3, L7, and C1, which are connected in sequence. The inductors L1-L9 can be high-precision inductors of 1nH-10nH, and the capacitance range of the capacitor C1 can be 1pF-5 pF.

The intermediate frequency impedance matching network 24 comprises a third pi-type impedance matching network composed of L10, L14 and L15, a fourth pi-type impedance matching network composed of L13, L17 and L18, and a second T-type impedance matching network composed of L11, L12, L16 and C2, which are connected in sequence. The inductors L10-L18 can be high-precision inductors of 1nH-8nH, and the capacitance range of the capacitor C2 can be 0.3pF-1 pF.

The high-frequency impedance matching network 25 comprises a fifth pi-type impedance matching network composed of L19, L23 and L24, a sixth pi-type impedance matching network composed of L22, L26 and L27, and a third T-type impedance matching network composed of L20, L21, L25 and C3, which are connected in sequence. The inductors L19 to L27 can be high-precision inductors of 0.5nH to 4nH, and the capacitance range of the capacitor C3 can be 0.3pF to 1 pF.

It should be noted that, in addition to the impedance matching networks 23-25 described above, the impedance matching networks may be adjusted according to the specific device 300 under test.

For example, when the device under test 300 is in a high impedance state, the first T-type impedance matching network may be removed on the basis of the low-frequency impedance matching network 23 shown in fig. 2, so as to form a pi-type impedance matching network as shown in fig. 3.

Optionally, when the device 300 to be tested is in a low impedance state, the first pi-type impedance matching network and the second pi-type impedance matching network may be removed on the basis of the low-frequency impedance matching network 23 shown in fig. 2, so as to form a T-type impedance matching network as shown in fig. 4.

It should be noted that the adjustment performed on the impedance matching network may also be applied to the intermediate-frequency impedance matching network 24 and the high-frequency impedance matching network 25, and the adjustment method may refer to the description of the adjustment process performed on the low-frequency impedance matching network 23, which is not described herein again.

That is to say, with the radio frequency compensator 100, the impedance matching network in the radio frequency compensator 100 can be changed according to the actual operating condition, so that switching between the pi-type impedance matching network and the T-type impedance matching network can be performed, and the flexibility of the device is improved.

Fig. 5 is a flowchart of a radio frequency testing method according to an exemplary embodiment of the present disclosure, where the radio frequency testing method may be applied to the radio frequency testing system shown in fig. 1, and referring to fig. 5, the method includes:

s51, debugging the test equipment 200, the radio frequency compensator 100 and the equipment to be tested 300 which are sequentially connected according to the type information of the equipment to be tested 300, so that the voltage standing wave ratio of signals in a test link reaches a preset threshold range.

And S52, controlling the radio frequency compensator 100 to open a corresponding impedance matching network according to the frequency range to which the target test signal belongs.

Wherein the target test signal is generated by the test equipment 200, and the voltage standing wave ratio in the test link is kept within the preset threshold range under the condition that the corresponding impedance matching network is electrically connected.

And S53, performing radio frequency test on the device to be tested 300 according to the target test signal.

Illustratively, the test equipment 200 may generate a 1427-2170MHz test signal while the device under test 300 is tested using an intermediate frequency test signal. The control end may determine the frequency range of the test signal by obtaining the state information of the test device 200 or detecting the radio frequency cable between the test device 200 and the radio frequency compensator 100, so as to generate a corresponding control level, and further enable the radio frequency compensator 100 to turn on the intermediate frequency impedance matching network in response to the corresponding control signal. After passing through the intermediate frequency impedance matching network of the radio frequency compensator 100, the test signal is transmitted to the test probe through the radio frequency test cable, and the loopback test is performed on the device 300 to be tested.

The method can comprise the following technical effects:

and debugging the test equipment 200, the radio frequency compensator 100 and the equipment to be tested 300 which are sequentially connected according to the type information of the equipment to be tested 300, so that the voltage standing wave ratio of signals in a test link reaches a preset threshold range. Thus, when the device 300 to be tested is subjected to the radio frequency test, the radio frequency compensator 100 may be controlled to open the corresponding impedance matching network according to the frequency range to which the target test signal belongs, so that the sum of the impedance value of the radio frequency compensator 100 and the impedance value of the device 300 to be tested is matched with the impedance value of the test device 200. That is to say, under different test signals, the impedance of the input source end and the impedance of the output load end of the system can be always kept in a matching state, so that signal distortion caused by impedance mismatch is reduced, and the false detection rate is further reduced.

In a possible implementation, the step S51 includes:

adjusting values of capacitance and/or inductance in each impedance matching network in the radio frequency compensator 100 so that a voltage standing wave ratio VSWR of a signal in the test link is: VSWR is more than or equal to 1 and less than or equal to 1.2.

For example, a test probe at a test device end and a test connector at a device end to be tested may be respectively connected to two ends of a network analyzer, and referring to a design schematic diagram of the radio frequency compensator 100 shown in fig. 6, each impedance matching network in the radio frequency compensator 100 may be debugged, so that a signal standing wave ratio VSWR in a test link is: VSWR is more than or equal to 1 and less than or equal to 1.2.

Optionally, the impedance matching network may be further configured based on the type of the device under test 300, so as to improve the test flexibility of the radio frequency test system.

In a possible implementation, the step S52 includes:

controlling the radio frequency compensator 100 to start a corresponding low-frequency impedance matching network;

the step S53 includes:

and transmitting the target test signal compensated by the low-frequency impedance matching network as a test signal to a test probe connected with the low-frequency impedance matching network, and performing loopback test on the device 300 to be tested.

Thus, the test signal can be subjected to signal compensation through the low-frequency impedance matching network of the radio frequency compensator 100, and signals of other frequencies are in a high isolation state due to the effect of the switching device in the process, so that signal crosstalk in the test process is reduced, and the test accuracy is improved. And, the existence of a plurality of impedance matching networks also reduces the influence of local damage on the whole test link.

The present disclosure also provides a radio frequency test system, referring to fig. 1, the radio frequency test system includes a test device 200, a device under test 300, and, for example, a radio frequency compensator 100, wherein the test device 200, the radio frequency compensator 100, and the device under test 300 are connected in sequence.

The test device 200 is configured to generate a radio frequency test signal, receive a feedback signal fed back by the device under test 300 through the radio frequency compensator 100, and determine a test result of the device under test 300 according to the feedback signal. For example, the feedback signal of the device under test 300 may be compared with the corresponding index value, so as to determine whether the radio frequency performance of the device under test 300 reaches the standard.

The radio frequency compensator 100 is configured to compensate the radio frequency test signal, so that when the test equipment 200 is selectively electrically connected to the device under test 300 through any one of a plurality of impedance matching networks of the radio frequency compensator 100, a sum of an impedance value of the radio frequency compensator 100 and an impedance value of the device under test 300 matches an impedance value of the test equipment 200.

The radio frequency test system is provided with the plurality of impedance matching networks in the radio frequency compensator, so that when the device 300 to be tested is subjected to radio frequency test, the test device 200 and the device 300 to be tested can be selectively connected through different impedance matching networks according to specific test conditions, and a corresponding test link is formed. Further, the sum of the impedance value of the radio frequency compensator 100 and the impedance value of the device under test 300 is matched with the impedance value of the test equipment 200, so that errors in the test process are reduced finally, and the test accuracy is improved.

Fig. 7 is a block diagram illustrating an electronic device 700 in accordance with an example embodiment. As shown in fig. 7, the electronic device 700 may include: a processor 701 and a memory 702. The electronic device 700 may also include one or more of a multimedia component 703, an input/output (I/O) interface 704, and a communication component 705.

The processor 701 is configured to control the overall operation of the electronic device 700, so as to complete all or part of the steps in the above-mentioned radio frequency testing method. The memory 702 is used to store various types of data to support operation of the electronic device 700, such as instructions for any application or method operating on the electronic device 700 and application-related data, such as related radio frequency test metrics, radio frequency signal processing methods, and so forth. The Memory 702 may be implemented by any type of volatile or non-volatile Memory device or combination thereof, such as Static Random Access Memory (SRAM), electrically Erasable Programmable Read-Only Memory (EEPROM), erasable Programmable Read-Only Memory (EPROM), programmable Read-Only Memory (PROM), read-Only Memory (ROM), magnetic Memory, flash Memory, magnetic disk, or optical disk. The multimedia component 703 may include a screen component. Wherein the screen may be, for example, a touch screen for displaying the relevant test information. The I/O interface 704 provides an interface between the processor 701 and other interface modules, such as a keyboard, buttons, and the like. These buttons may be virtual buttons or physical buttons. The communication component 705 is used for wired or wireless communication between the electronic device 700 and other devices. Wireless communications, such as Wi-Fi, bluetooth, near Field Communication (NFC), 2G, 3G, 4G, or 5G, nb-IOT (Narrow Band Internet of Things), or a combination of one or more of them, and thus the corresponding Communication component 705 may include: wi-Fi module, bluetooth module, NFC module.

In an exemplary embodiment, the electronic Device 700 may be implemented by one or more Application Specific Integrated Circuits (ASICs), digital Signal Processors (DSPs), digital Signal Processing Devices (DSPDs), programmable Logic Devices (PLDs), field Programmable Gate Arrays (FPGAs), controllers, microcontrollers, microprocessors, or other electronic components for performing the above-described rf testing method.

In another exemplary embodiment, a computer readable storage medium comprising program instructions which, when executed by a processor, implement the steps of the radio frequency testing method described above is also provided. For example, the computer readable storage medium may be the memory 702 described above comprising program instructions that are executable by the processor 701 of the electronic device 700 to perform the radio frequency testing method described above.

The preferred embodiments of the present disclosure are described in detail with reference to the accompanying drawings, however, the present disclosure is not limited to the specific details of the above embodiments, and various simple modifications may be made to the technical solution of the present disclosure within the technical idea of the present disclosure, and these simple modifications all belong to the protection scope of the present disclosure.

It should be noted that, in the foregoing embodiments, various features described in the above embodiments may be combined in any suitable manner, and in order to avoid unnecessary repetition, various combinations that are possible in the present disclosure are not described again.

In addition, any combination of various embodiments of the present disclosure may be made, and the same should be considered as the disclosure of the present disclosure, as long as it does not depart from the spirit of the present disclosure.

Claims

1. A radio frequency compensator is characterized in that the radio frequency compensator is applied to a radio frequency test system, the test system comprises test equipment and equipment to be tested, the radio frequency compensator comprises a plurality of impedance matching networks, the impedance values of the impedance matching networks are different, each impedance matching network comprises a pi-type impedance matching network and/or a T-type impedance matching network, the pi-type impedance matching network comprises a first inductor, a second inductor, a third inductor, a fourth inductor, a fifth inductor and a sixth inductor, and the T-type impedance matching network comprises a seventh inductor, an eighth inductor, a ninth inductor and a capacitor; one end of the second inductor is connected with the first end of the first inductor, the other end of the second inductor is grounded, one end of the third inductor is connected with the second end of the first inductor, the other end of the third inductor is grounded, one end of the fifth inductor is connected with the second end of the first inductor and the first end of the fourth inductor, the other end of the fifth inductor is grounded, one end of the sixth inductor is connected with the second end of the fourth inductor, and the other end of the sixth inductor is grounded; the seventh inductor is connected in series with the eighth inductor, one end of the ninth inductor is connected between the seventh inductor and the eighth inductor, and the other end of the ninth inductor is connected in series with the capacitor and then grounded; when the impedance matching network comprises a pi-type impedance matching network and a T-type impedance matching network, the first inductor is connected with a seventh inductor, the third inductor is further connected with the seventh inductor, the fourth inductor is connected with an eighth inductor, and the fifth inductor is further connected with the eighth inductor;

2. The radio frequency compensator of claim 1, further comprising:

a switching device for series connection in the test link;

3. The radio frequency compensator of claim 2, further comprising:

4. A radio frequency test method applied to a radio frequency test system including the radio frequency compensator of any one of claims 1 to 3, the method comprising:

and performing radio frequency test on the equipment to be tested according to the target test signal.

5. The method of claim 4, wherein the debugging the sequentially connected test equipment, the radio frequency compensator and the equipment to be tested so that the voltage standing wave ratio of the signal in the test link reaches a preset threshold range comprises:

6. The method of claim 4 or 5, wherein the impedance matching network is set based on the type of device under test.

7. The method according to claim 4 or 5, wherein the target test signal is in a low frequency range, and the controlling the radio frequency compensator to turn on the corresponding impedance matching network according to the frequency range to which the target test signal belongs comprises:

8. A radio frequency test system comprising a test device, a device under test, and the radio frequency compensator of any one of claims 1 to 3, wherein the test device, the radio frequency compensator, and the device under test are connected in sequence.

9. The radio frequency test system of claim 8,

the test equipment is used for generating a radio frequency test signal, receiving a feedback signal fed back by the equipment to be tested through the radio frequency compensator, and determining a test result of the equipment to be tested according to the feedback signal;