CN106407141A - Input data state detection circuit having numerical control of threshold value - Google Patents

Input data state detection circuit having numerical control of threshold value Download PDF

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Publication number
CN106407141A
CN106407141A CN201610814335.6A CN201610814335A CN106407141A CN 106407141 A CN106407141 A CN 106407141A CN 201610814335 A CN201610814335 A CN 201610814335A CN 106407141 A CN106407141 A CN 106407141A
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China
Prior art keywords
threshold values
input
data
comparing unit
circuit
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CN201610814335.6A
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Inventor
伏小强
林振华
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Suzhou Chuangbicheng Electronic Science & Technology Co Ltd
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Suzhou Chuangbicheng Electronic Science & Technology Co Ltd
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Priority to CN201610814335.6A priority Critical patent/CN106407141A/en
Publication of CN106407141A publication Critical patent/CN106407141A/en
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38Information transfer, e.g. on bus

Abstract

The invention discloses an input data state detection circuit having numerical control of a threshold value. The detection circuit comprises a biasing circuit, a first threshold value comparison unit and a second threshold value comparison unit, wherein the biasing circuit comprises two series resistors; a node between the two resistors is connected with a data input interface; the node is connected with first input ends of the first threshold value comparison unit and the second threshold value comparison unit; the second input ends of the first threshold value comparison unit and the second threshold value comparison unit are separately connected with a threshold value voltage generation unit; and the output ends of the first threshold value comparison unit and the second threshold value comparison unit are in one-to-one correspondence connection with the two input ends of a gate circuit. According to the detection circuit disclosed by the invention, input voltage signals of the data input interface are compared; whether the input data of the data input interface is valid or not is judged according to the output data of the gate circuit; and thus, whether the input data of the data input interface is valid or not is detected.

Description

Input data state detection circuit with threshold values numerical control
Technical field
The present invention relates to integrated circuit fields, more particularly, to a kind of input data state-detection electricity with threshold values numerical control Road.
Background technology
Since mankind's nineteen forty-seven invention transistor, between more than 50 year, semiconductor technology experienced silicon transistor, integrated electricity The several generations such as road, super large-scale integration, very large scale integration, development speed is that other industries are unexistent soon;In Central processor refers to the part that computer-internal is processed to data and processing procedure is controlled, and collects along with extensive Become the developing rapidly of circuit engineering, integrated chip density more and more higher, CPU can integrated on a semiconductor chip in a, this There are the LSI devices of central processing unit function, be collectively referred to as " microprocessor ";Either video recorder, intelligence are washed The household appliances such as clothing machine, mobile phone, or car engine controls, and Digit Control Machine Tool, guided missile precise guidance etc. will embed All kinds of different microprocessors;Microprocessor is not only the core component of microcomputer, is also various digital intelligent equipment Critical component.
And interface chip, it is for connecting a kind of electronic devices and components between microprocessor and memory, it includes number According to the data buffer of temporary buffering or bus buffer, provide bus driver of larger driving force etc. for address signal Deng in brief, interface chip is for ensuring that safety and the stability of data transmission procedure.
However, during data transfer, the input interface of interface chip can cannot determine interface because of loose contact Effectively whether, now, the output interface of interface chip but still can export the determination signal of " 0 " or " 1 " to the input data of chip, And by the middle of its signal transmission to microprocessor;However, due to the loose contact of input interface, making the input data of interface chip Real data can not be reflected, thus leading to the output data of interface chip to be nonsensical.How to obtain interface chip The validity of upper input data, thus deciding whether to accept and believe the output data on interface chip, becomes for people's research Individual problem.
In digital circuit, digital circuit typically has three kinds of output states, is high level, low level and high-impedance state, wherein High level is logical one, and low level is logical zero, and high-impedance state is equivalent to cut-off state;Wherein by logical one and logical zero group The binary signal becoming, is the major way of current electronic chip data transfer inside, and if the input interface of interface chip Vacantly or in the case of loose contact, high-impedance state will be formed, be based on this, if can be carried out by the input of docking port chip The test of high-impedance state, to obtain the validity of input data on interface chip, thus avoiding judging whether output data has The technical problem of effect.
Therefore, it is necessary to provide a kind of input energy to detect the circuit of input data validity.
Content of the invention
The present invention provides a kind of input data state detection circuit with threshold values numerical control for solving the above problems, by right The input voltage signal of Data Input Interface is compared, and the output data according to gate circuit is judging the defeated of Data Input Interface Whether effectively enter data, thus detect Data Input Interface input data whether effective.
For achieving the above object, reach the effect above, the present invention is achieved through the following technical solutions:
A kind of input data state detection circuit with threshold values numerical control, this testing circuit includes biasing circuit, the first threshold values ratio Compared with unit, the second threshold values comparing unit;Wherein biasing circuit includes the resistance of two series connection, node between the resistances with Data Input Interface is connected, and this node is connected with the first input end of the first threshold values comparing unit, the second threshold values comparing unit;The One threshold values comparing unit, the second input of the second threshold values comparing unit are connected with a threshold voltage signal generating unit respectively, the Two inputs of one threshold values comparing unit, the output end of the second threshold values comparing unit and gate circuit connect one to one, according to Whether the output data of gate circuit is effective come the input data to judge Data Input Interface.
As preferred, gate circuit is same OR gate or XOR gate.
As preferred, in order to detect that circuit output state is high level, low level or high-impedance state, threshold voltage generation Unit includes high threshold value signal generating unit, low threshold voltage signal generating unit, high threshold value signal generating unit, low threshold voltage Signal generating unit is connected with digital interface control unit, and the second input of the first threshold values comparing unit is connected high threshold value life Become unit, the second input of the second threshold values comparing unit connects low threshold voltage signal generating unit, generates single from high threshold value Unit, low threshold voltage signal generating unit upload the benchmark being input into the high and low level voltage threshold values coming as comparator.
As preferred, the output end of the first threshold values comparing unit or the second threshold values comparing unit is selected one and is connect with data output Mouth connects, and will input data be transferred in next stage circuit.
As preferred, when input data is effective, the next stage circuit being connected with this circuit will continue to gather this data Signal;When input data is invalid, the next stage circuit being connected with this circuit will stop gathering this data-signal.
As preferred, because the span of high and low level is extreme for two, so the biasing circuit producing takes centre During value scheme preferably, so make two resistance resistance equal, and so that one of resistance is connected with power supply, another resistance and Ground connects, so that the bias voltage that intermediate node produces is the median of circuit voltage.
As preferred, the first threshold values comparing unit, the first input end of the second threshold values comparing unit are in-phase end, first Threshold values comparing unit, the second input of the second threshold values comparing unit are end of oppisite phase, i.e. the first threshold values comparing unit, the second threshold values Comparing unit is all using positive logic.
As preferred, control signal is received by digital interface control unit, so that high threshold value signal generating unit is generated high Level voltage threshold values, low threshold voltage signal generating unit generates low level voltage threshold values, and the node voltage between two resistance is less than High level voltage threshold values, and it is more than low level voltage threshold values, that is, high and low level voltage threshold values forms three voltage ranges, respectively Three kinds of states of corresponding circuits output.
As preferred, in order to adapt to different working environments and demand, two resistance can equivalence replacement be two electric currents Source, one of current source is connected with power supply, and another current source is connected to ground, and the current direction of current source is for power supply direction extremely Ground, its objective is to produce bias voltage.
The invention has the beneficial effects as follows:
A kind of input data state detection circuit with threshold values numerical control, by entering to the input voltage signal of Data Input Interface Row compares, and whether the output data according to gate circuit is effective come the input data judging Data Input Interface, thus ensureing data The validity of transmitting procedure, and can find in time when input interface occurs hanging or loose contact, it is to avoid because collection is no The fault that the signal of meaning is led to as data.
Described above is only the general introduction of technical solution of the present invention, in order to better understand the technological means of the present invention, And can be practiced according to the content of specification, below with presently preferred embodiments of the present invention and coordinate accompanying drawing describe in detail as after, The specific embodiment of the present invention is shown in detail in by following examples and its accompanying drawing.
Brief description
Accompanying drawing described herein is used for providing a further understanding of the present invention, constitutes the part of the application, this Bright schematic description and description is used for explaining the present invention, does not constitute inappropriate limitation of the present invention.In the accompanying drawings:
The physical circuit of the input data state detection circuit with threshold values numerical control that Fig. 1 is related to for first embodiment of the invention shows It is intended to;
Fig. 2 is the chip interface schematic diagram of the input data state detection circuit carrying threshold values numerical control containing the present invention;
Each position voltage in the input data state detection circuit with threshold values numerical control that Fig. 3 is related to for first embodiment of the invention Schematic diagram;
The physical circuit that Fig. 4 applies, for the present invention second, the input data state detection circuit with threshold values numerical control that example is related to is illustrated Figure;
The physical circuit of the input data state detection circuit with threshold values numerical control that Fig. 5 is related to for third embodiment of the invention shows It is intended to;
The physical circuit of the input data state detection circuit with threshold values numerical control that Fig. 6 is related to for fourth embodiment of the invention shows It is intended to.
Wherein, 1 is high threshold value signal generating unit, and 2 is low threshold voltage signal generating unit, and 3 is digital interface control unit, IN is Data Input Interface, DoutFor data output interface, DINSFor data input State- output interface, VSControl for threshold values and connect Mouthful, VCCFor the power supply of circuit, GND is earth terminal, R1-R2For resistance, IS1、IS2For current source, A1Compare for the first threshold values Unit, A2For the second threshold values comparing unit.
Wherein, in Fig. 3, the voltage of each position is described as follows:VINFor input voltage, VbiasFor bias voltage, VA1+For first Threshold values comparing unit A1The input voltage of in-phase end, VA1-For the first threshold values comparing unit A1The input voltage of end of oppisite phase, VA2+For Two threshold values comparing unit A2The input voltage of in-phase end, VA2-For the second threshold values comparing unit A2The input voltage of end of oppisite phase, Vouta For the first threshold values comparing unit A1Output voltage, VoutbFor the second threshold values comparing unit A2Output voltage, VrefhFor high threshold values Input voltage, VreflFor low valve valve input voltage, VoutFor output voltage, VINSFor data input state-detection voltage.
Specific embodiment
Below with reference to the accompanying drawings and in conjunction with the embodiments, to describe the present invention in detail:
As shown in Figure 1 to Figure 3 for the first embodiment of the present invention, wherein Fig. 1 is the physical circuit schematic diagram of first embodiment; This testing circuit includes biasing circuit, the first threshold values comparing unit A1, the second threshold values comparing unit A2;Wherein biasing circuit includes The resistance R of two series connection1、R2, resistance R1Power supply V with circuitCCConnect, resistance R2It is connected with earth terminal GND, in resistance R1、R2Between node be connected with Data Input Interface IN.
As shown in figure 1, the first threshold values comparing unit A1, the second threshold values comparing unit A2All using positive logic so that and data The node of input interface IN and the first threshold values comparing unit A1, the second threshold values comparing unit A2First input end connect, and two The first input end of comparing unit is in-phase end;Second input of two comparing units is end of oppisite phase, the wherein first threshold values Comparing unit A1Second input connect high threshold value signal generating unit 1, the second threshold values comparing unit A2The second input even Connect low threshold voltage signal generating unit 2, meanwhile, high threshold value signal generating unit 1, low threshold voltage signal generating unit 2 and digital interface Control unit 3 connects, and digital interface control unit 3 is to being externally connected with threshold values control interface VS;First threshold values comparing unit A1, Two threshold values comparing unit A2Output end connect one to one with two inputs of same OR gate, with output end and the data of OR gate Input state output interface DINSConnect, the first threshold values comparing unit A1Output end simultaneously with data output interface DoutConnect.
Wherein, by threshold values control interface VSThreshold values control signal is transferred in digital interface control unit 3, thus controlling High threshold value signal generating unit 1 processed, low threshold voltage signal generating unit 2 generate high level voltage threshold values V respectivelyrefh, low level electricity Pressure valve value Vrefl, wherein high level voltage threshold values VrefhIt is disposed proximate to but the lower limit less than high level voltage, low level voltage Threshold values VreflIt is disposed proximate to but the lower limit more than low level voltage, resistance R1、R2Between node voltage be less than high level electricity Pressure valve value Vrefh, and it is more than low level voltage threshold values Vrefl, that is, form three voltage ranges, be respectively more than high level voltage valve Value VrefhInterval, be in high level voltage threshold values VrefhWith low level voltage threshold values VreflBetween interval and be less than low electricity Flat threshold voltage VreflInterval, and three kinds of states of respectively corresponding circuits output.
Meanwhile, in order to ensure more preferably Detection results, make resistance R1、R2Resistance equal, and resistance R1、R2Resistance is very Greatly, thus in the ideal case, the bias voltage V of generationbiasPower supply V for circuitCC1/2nd, and this biased electrical Electric current very little on road is so as to ignore to the impact caused by the high and low level of input data.
In order to better illustrate the course of work of whole circuit, each position voltage schematic diagram such as in cooperation Fig. 3, data is defeated Circuit analysis under the upper three kinds of forms of incoming interface IN is as follows:
(1), when Data Input Interface IN state in which be high level when, VA1+=VA2+=VIN=VIH(Input high level), VA1- =Vrefh, VA2-=Vrefl, due to VIH> VrefhAnd VIH> Vrefl, so that the first threshold values comparing unit A1Output voltage Vouta、 Second threshold values comparing unit A2Output voltage VoutbIt is high level, after same OR gate computing, the data input state that obtains Detection voltage VINSFor high level, that is, the logical value exporting is 1.
(2), when Data Input Interface IN state in which be low level when, VA1+=VA2+=VIN=VIL(Input low level), VA1-=Vrefh, VA2-=Vrefl, due to VIL<VrefhAnd VIL<Vrefl, so that the first threshold values comparing unit A1Output voltage Vouta, the second threshold values comparing unit A2Output voltage VoutbIt is low level, after same OR gate computing, the data obtaining is defeated Enter state-detection voltage VINSFor high level, that is, the logical value exporting is 1.
(3), when Data Input Interface IN state in which is high-impedance state, be equal on Data Input Interface IN not outer Connect, now, VA1+=VA2+=Vbias, due to Vrefl< Vbias< Vrefh, so that the first threshold values comparing unit A1Output voltage VoutaFor low level, the second threshold values comparing unit A2Output voltage VoutbFor high level, i.e. the first threshold values comparing unit A1Output Logical value be 0, the second threshold values comparing unit A2The logical value of output is 1, after same OR gate computing, the data input that obtains State-detection voltage VINSFor low level, that is, the logical value exporting is 0.
In sum, as data input state-detection voltage VINSOutput logical value be 1 when, Data Input Interface IN institute The state at place is high level or low level, i.e. the input data logical validity of Data Input Interface IN, and logically, output Voltage VoutWith input voltage VINEqual, the output interface D therefore the next stage circuit being connected with this testing circuit is fetched dataoutOutput Data is as the input data of this next stage circuit;As data input state-detection voltage VINSOutput logical value be 0 When, Data Input Interface IN state in which be high-impedance state, that is, the input data logic of Data Input Interface IN is invalid, thus with this The next stage circuit that testing circuit connects stops accepting and believing this output data.
Fig. 4 applies the physical circuit schematic diagram of example for the present invention second, and the difference compared with first embodiment is:First valve Value comparing unit A1, the second threshold values comparing unit A2First input end be end of oppisite phase;First threshold values comparing unit A1, second Threshold values comparing unit A2The second input be in-phase end, when Data Input Interface IN state in which be high level when, first Threshold values comparing unit A1, the second threshold values comparing unit A2The logical value of output is 0, when Data Input Interface IN state in which During for low level, the first threshold values comparing unit A1, the second threshold values comparing unit A2The logical value of output is 1, that is, export logical value Contrary with input logic value, the next stage circuit that is now connected with this testing circuit is fetched data output interface DoutOutput data As the input data of this next stage circuit, remaining is with reference to above-mentioned with regard to first embodiment for result after NAND gate computing Description.
Fig. 5 is the physical circuit schematic diagram of third embodiment of the invention, and this testing circuit includes biasing circuit, the first threshold values Comparing unit A1, the second threshold values comparing unit A2;Wherein biasing circuit includes the current source IS of two series connection1、IS2, current source IS1 Power supply V with circuitCCConnect, current source IS2It is connected with earth terminal GND, in current source IS1、IS2Between node and number It is connected according to input interface IN, that is, third embodiment of the invention is on the basis of first embodiment, by the resistance on biasing circuit R1、R2Replace with current source IS1、IS2, remaining is with reference to the above-mentioned description with regard to first embodiment.
Fig. 6 is the physical circuit schematic diagram of fourth embodiment of the invention, the first threshold values comparing unit A1, the second threshold values compares Unit A2Output end connect one to one with two inputs of XOR gate, the output end of XOR gate is defeated with data input state Outgoing interface DINSConnect, now, as data input state-detection voltage VINSOutput logical value be 0 when, Data Input Interface IN Input data logical validity;As data input state-detection voltage VINSOutput logical value be 1 when, Data Input Interface IN Input data logic invalid, that is, the fourth embodiment of the present invention is on the basis of first embodiment, will replace with OR gate , so that the correspondence of output logical value and validity is contrary with first embodiment, remaining is with reference to above-mentioned with regard to the first enforcement for XOR gate The description of example.
Meanwhile, by the exchange of in-phase end and end of oppisite phase in second embodiment, by resistance R in 3rd embodiment1、R2Replace with Current source IS1、IS2, in fourth embodiment, same OR gate is replaced with the form of XOR gate, is all on the basis of first embodiment The replacement carrying out, this three kinds of substitute modes can freely form new embodiment, the such as the 5th embodiment:In first embodiment On the basis of, by resistance R1、R2Replace with current source IS1、IS2, XOR gate will be replaced with OR gate, the 5th enforcement so being formed Example be implement to the 3rd, the simple combination of fourth embodiment, such combine the equivalent reality that new embodiment is the present invention Apply example.
The above, only presently preferred embodiments of the present invention, not the present invention is made with any pro forma restriction;All The those of ordinary skill of the industry all can shown in by specification accompanying drawing and the above and swimmingly implement the present invention;But, all Those skilled in the art, in the range of without departing from technical solution of the present invention, are done using disclosed above technology contents The a little change going out, the equivalent variations modified and develop, are the Equivalent embodiments of the present invention;Meanwhile, all according to the present invention The change of any equivalent variations, modification and differentiation that substantial technological is made to above example etc., all still fall within the skill of the present invention Within the protection domain of art scheme.

Claims (9)

1. a kind of input data state detection circuit with threshold values numerical control it is characterised in that:This testing circuit includes biased electrical Road, the first threshold values comparing unit, the second threshold values comparing unit;Described biasing circuit includes the resistance of two series connection, described in two Node between resistance is connected with Data Input Interface, and the node connecting described Data Input Interface is compared with described first threshold values Unit, the first input end of the second threshold values comparing unit connect;Described first threshold values comparing unit, the second threshold values comparing unit Second input is connected with a threshold voltage signal generating unit respectively, and described first threshold values comparing unit, the second threshold values are more single The output end of unit is connected one to one with two inputs of gate circuit, and the output data according to described gate circuit is judging data Whether the input data of input interface is effective.
2. the input data state detection circuit with threshold values numerical control according to claim 1 it is characterised in that:Described door Circuit is same OR gate or XOR gate, and the output end of described gate circuit is connected with data input State- output interface.
3. the input data state detection circuit with threshold values numerical control according to claim 1 it is characterised in that:Described valve Threshold voltage signal generating unit includes high threshold value signal generating unit(1), low threshold voltage signal generating unit(2), described high threshold values electricity Pressure signal generating unit(1), low threshold voltage signal generating unit(2)With digital interface control unit(3)Connect, described first threshold values compares Second input of unit connects high threshold value signal generating unit(1), the second input of described second threshold values comparing unit is even Connect low threshold voltage signal generating unit(2).
4. the input data state detection circuit with threshold values numerical control according to claim 1 it is characterised in that:Described The output end of one threshold values comparing unit or described second threshold values comparing unit is selected one and is connected with data output interface.
5. the input data state detection circuit with threshold values numerical control according to claim 1 it is characterised in that:Work as input When data is effective, the next stage circuit being connected with this circuit will continue to gather this data-signal;When input data is invalid, with this The next stage circuit that circuit connects will stop gathering this data-signal.
6. the input data state detection circuit with threshold values numerical control according to claim 1 it is characterised in that:Two institutes The resistance stating resistance is equal, and so that one of described resistance is connected with power supply, and another described resistance is connected to ground.
7. the input data state detection circuit with threshold values numerical control according to claim 1 it is characterised in that:Described One threshold values comparing unit, the first input end of the second threshold values comparing unit are in-phase end, described first threshold values comparing unit, second Second input of threshold values comparing unit is end of oppisite phase.
8. the input data state detection circuit with threshold values numerical control according to claim 3 it is characterised in that:By described Digital interface control unit receives control signal, makes described high threshold value signal generating unit(1)Generate high level voltage threshold values, institute State low threshold voltage signal generating unit(2)Generate low level voltage threshold values, the node voltage between two described resistance is less than high electricity Flat threshold voltage, and it is more than low level voltage threshold values.
9. the input data state detection circuit with threshold values numerical control according to one of claim 1 to 8, its feature It is:Two described resistance can equivalence replacement be two current sources, and one of described current source is connected with power supply, another institute State current source to be connected to ground, the current direction of described current source is power supply direction to ground.
CN201610814335.6A 2016-09-10 2016-09-10 Input data state detection circuit having numerical control of threshold value Pending CN106407141A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111023395A (en) * 2019-12-11 2020-04-17 广州视源电子科技股份有限公司 Monitoring circuit and air conditioner

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110178968A1 (en) * 2008-10-15 2011-07-21 Koninklijke Philips Electronics N.V. System and method for detecting respiratory insufficiency in the breathing of a subject
US20130342261A1 (en) * 2012-06-25 2013-12-26 Novatek Microelectronics Corp. Bias and load circuit, fast bias circuit and method
CN104502683A (en) * 2014-12-31 2015-04-08 武汉华中数控股份有限公司 Switch quantity signal detection method and detection circuit

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20110178968A1 (en) * 2008-10-15 2011-07-21 Koninklijke Philips Electronics N.V. System and method for detecting respiratory insufficiency in the breathing of a subject
US20130342261A1 (en) * 2012-06-25 2013-12-26 Novatek Microelectronics Corp. Bias and load circuit, fast bias circuit and method
CN104502683A (en) * 2014-12-31 2015-04-08 武汉华中数控股份有限公司 Switch quantity signal detection method and detection circuit

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111023395A (en) * 2019-12-11 2020-04-17 广州视源电子科技股份有限公司 Monitoring circuit and air conditioner

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