CN106226674B - 一种集成电路芯片检测装置 - Google Patents
一种集成电路芯片检测装置 Download PDFInfo
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- CN106226674B CN106226674B CN201610865243.0A CN201610865243A CN106226674B CN 106226674 B CN106226674 B CN 106226674B CN 201610865243 A CN201610865243 A CN 201610865243A CN 106226674 B CN106226674 B CN 106226674B
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- 238000001514 detection method Methods 0.000 title claims abstract description 37
- 230000005540 biological transmission Effects 0.000 claims abstract description 48
- 230000003319 supportive effect Effects 0.000 claims abstract description 10
- 230000000712 assembly Effects 0.000 claims description 18
- 238000000429 assembly Methods 0.000 claims description 18
- 238000006073 displacement reaction Methods 0.000 claims description 6
- 230000003139 buffering effect Effects 0.000 claims description 4
- 238000009434 installation Methods 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 5
- 239000000306 component Substances 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 239000008358 core component Substances 0.000 description 1
- 230000007812 deficiency Effects 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004377 microelectronic Methods 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0491—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets for testing integrated circuits on wafers, e.g. wafer-level test cartridge
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/30—Structural arrangements specially adapted for testing or measuring during manufacture or treatment, or specially adapted for reliability measurements
Abstract
Description
Claims (2)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610865243.0A CN106226674B (zh) | 2016-09-25 | 2016-09-25 | 一种集成电路芯片检测装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610865243.0A CN106226674B (zh) | 2016-09-25 | 2016-09-25 | 一种集成电路芯片检测装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN106226674A CN106226674A (zh) | 2016-12-14 |
CN106226674B true CN106226674B (zh) | 2019-01-11 |
Family
ID=58077150
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201610865243.0A Active CN106226674B (zh) | 2016-09-25 | 2016-09-25 | 一种集成电路芯片检测装置 |
Country Status (1)
Country | Link |
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CN (1) | CN106226674B (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN112363041B (zh) * | 2020-11-21 | 2021-09-28 | 深圳中科精工科技有限公司 | 一种用于半导体的全自动aa设备 |
CN115931039B (zh) * | 2023-03-14 | 2023-06-02 | 广东科视光学技术股份有限公司 | 一种pcb板检测设备及其检测方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN2191517Y (zh) * | 1994-04-28 | 1995-03-08 | 亚智股份有限公司 | 印刷电路板输送装置 |
US5969752A (en) * | 1998-06-15 | 1999-10-19 | Electro Scientific Industries | Multi-function viewer/tester for miniature electric components |
CN202049116U (zh) * | 2011-03-18 | 2011-11-23 | 久元电子股份有限公司 | 封装芯片检测与分类装置 |
ITTO20120126A1 (it) * | 2012-02-13 | 2013-08-14 | Sidel Spa Con Socio Unico | Metodo e unita' per la formazione di spezzoni tubolari di materiale in forma di nastro, in particolare in una etichettatrice |
CN104003171B (zh) * | 2014-06-17 | 2017-01-04 | 上海凯思尔电子有限公司 | H架自动传送放板机 |
CN204011373U (zh) * | 2014-07-25 | 2014-12-10 | 深圳市大族激光科技股份有限公司 | 芯片自动检测装载系统 |
CN105120604A (zh) * | 2015-08-21 | 2015-12-02 | 苏州斯卡柏通讯技术有限公司 | 一种贴片机pcb板传送装置 |
CN105855769B (zh) * | 2016-06-08 | 2019-06-25 | 江门金力五金实业有限公司 | 一种智能焊接机械人 |
-
2016
- 2016-09-25 CN CN201610865243.0A patent/CN106226674B/zh active Active
Also Published As
Publication number | Publication date |
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CN106226674A (zh) | 2016-12-14 |
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Legal Events
Date | Code | Title | Description |
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C06 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20181203 Address after: 221000 Commercial Building No. 3-1408 of Wanda Plaza, Yunlong District, Xuzhou City, Jiangsu Province Applicant after: Jiangsu Qianrui Intelligent System Integration Co., Ltd. Address before: 523000 productivity building 406, high tech Industrial Development Zone, Songshan Lake, Dongguan, Guangdong Applicant before: Dongguan Lianzhou Intellectual Property Operation Management Co.,Ltd. |
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GR01 | Patent grant | ||
GR01 | Patent grant | ||
CP01 | Change in the name or title of a patent holder | ||
CP01 | Change in the name or title of a patent holder |
Address after: 221000 Commercial Building No. 3-1408 of Wanda Plaza, Yunlong District, Xuzhou City, Jiangsu Province Patentee after: Jiangsu Qianrui Intelligent Technology Co., Ltd. Address before: 221000 Commercial Building No. 3-1408 of Wanda Plaza, Yunlong District, Xuzhou City, Jiangsu Province Patentee before: Jiangsu Qianrui Intelligent System Integration Co., Ltd. |
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TR01 | Transfer of patent right |
Effective date of registration: 20200316 Address after: 221114 sunwan village, Zhangji Town, Tongshan District, Xuzhou City, Jiangsu Province Patentee after: JIANGSU JIUTIAN ELECTRICAL EQUIPMENT Co.,Ltd. Address before: 221000 Commercial Building No. 3-1408 of Wanda Plaza, Yunlong District, Xuzhou City, Jiangsu Province Patentee before: Jiangsu Qianrui Intelligent Technology Co., Ltd. |
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Effective date of registration: 20201015 Address after: No. 910, unit 1, building 1, office building 2, Shimao Plaza, Yunlong District, Xuzhou City, Jiangsu Province Patentee after: Xuzhou Zhicheng Accounting Service Co.,Ltd. Address before: 221114 sunwan village, Zhangji Town, Tongshan District, Xuzhou City, Jiangsu Province Patentee before: JIANGSU JIUTIAN ELECTRICAL EQUIPMENT Co.,Ltd. |
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Effective date of registration: 20211213 Address after: 102208 floor 3, building 1, North erpozi village, Huilongguan town, Changping District, Beijing Patentee after: Beijing Yimeisifang Software Technique Co.,Ltd. Address before: Room 910, unit 1, building 2 and office 1, Shimao square, Yunlong District, Xuzhou City, Jiangsu Province, 221000 Patentee before: Xuzhou Zhicheng Accounting Service Co.,Ltd. |