CN106093752A - A kind of test probe card being applied to integrated circuit - Google Patents
A kind of test probe card being applied to integrated circuit Download PDFInfo
- Publication number
- CN106093752A CN106093752A CN201610455264.5A CN201610455264A CN106093752A CN 106093752 A CN106093752 A CN 106093752A CN 201610455264 A CN201610455264 A CN 201610455264A CN 106093752 A CN106093752 A CN 106093752A
- Authority
- CN
- China
- Prior art keywords
- probe
- permanent magnetism
- external thread
- thread sleeve
- shaped guide
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
Abstract
nullThe invention discloses a kind of test probe card being applied to integrated circuit，Including probe base and testing circuit plate，Probe aperture is formed on probe base，Probe it is plugged with in probe aperture，Probe includes the stopper section at middle part，The upper surface detection bar of stopper section，The upper surface of probe base is exposed in the upper end of detection bar，It is characterized in that: the lower surface of stopper section forms vertical external thread sleeve，Inverted T-shaped guide post it is plugged with in the endoporus of external thread sleeve，T-shaped guide post upper sleeve has lower permanent magnetism set，External thread sleeve upper sleeve has upper permanent magnetism set,The magnetic pole of upper permanent magnetism set lower surface is identical with the magnetic pole that lower permanent magnetism puts end face，In T-shaped guide post, grafting is fixed with electric conductor，Electric conductor is made up of cylindrical carbon brush head and carbon brush post，Carbon brush head is resisted against on the inner hole wall of external thread sleeve，The lower end of carbon brush post is exposed the lower surface of T-shaped guide post and is resisted against on testing circuit plate.Its simple in construction, easy to assembly, it is avoided that the loose contact caused because of spring mechanical fatigue failure.
Description
Technical field:
The present invention relates to the technical field of integrated circuit detector, be applied to integrated circuit more specifically to one
Test probe card.
Background technology:
Probe card is to be commonly used for the element of testing circuit in semiconductor technology, is disposed with multiple probe in it, visits
The arrangement position of pin configures corresponding with the circuit on the circuit board under test that this probe card to be detected.Probe card is normally placed in one
On detection board, circuit board under test is with an instrument clamping and suppresses on probe.Hence in so that each probe turns on electricity to be measured
Circuit on the plate of road, by the whether normal operation of the circuit on probe in detecting circuit board under test.Existing probe structure typically wraps
Containing being provided with two electrodes and the spring being connected between two electrodes in a sleeve sleeve.One of them electrode is fixed on
Detection board and be electrically connected with detection board, another electrode is positioned at sleeve the most movably in order to connect treating of being detected
Solder joint on slowdown monitoring circuit plate.When circuit board under test presses probe, spring is compressed and is forced in the electrode of activity, thereby makes this
Electrode is pressed into contact with circuit board under test and really turns on.Or a movable electrode is only set, and direct by spring
Connect electrode and detection board.
Probe is small element, and its structure is complicated, and part makes and assembles and is all difficult to.Existing probe using spring as
Connect element, its therefore the error in technique probe loose contact often can be caused cannot to turn on circuit board under test and testing machine
Platform.
Summary of the invention:
The purpose of the present invention is aiming at the deficiency of prior art, and provides a kind of test being applied to integrated circuit and visit
Pin card, its simple in construction, easy to assembly, it is avoided that traditional test probe endogenous cause of ill spring mechanical fatigue failure etc. simultaneously and causes
Loose contact.
For achieving the above object, technical scheme is as follows:
A kind of test probe card being applied to integrated circuit, including probe base and testing circuit plate, probe base forms
Probe aperture, is plugged with probe in probe aperture, probe includes the stopper section at middle part, the upper surface detection bar of stopper section, detection bar
The upper surface of probe base is exposed in upper end, it is characterised in that: the lower surface of stopper section forms vertical external thread sleeve, external thread sleeve
Endoporus in be plugged with inverted T-shaped guide post, T-shaped guide post upper sleeve has lower permanent magnetism set, lower permanent magnetism set to be resisted against T-shaped guiding
The lower end of bar, described external thread sleeve upper sleeve has upper permanent magnetism set, and magnetic pole and the lower permanent magnetism of upper permanent magnetism set lower surface put end face
Magnetic pole identical, in described T-shaped guide post, grafting is fixed with electric conductor, and electric conductor is by cylindrical carbon brush head and carbon brush post group
Becoming, carbon brush head is resisted against on the inner hole wall of external thread sleeve, and the lower end of carbon brush post is exposed the lower surface of T-shaped guide post and is resisted against detection
On circuit board.
Described permanent magnetism set is spirally connected on the external thread sleeve being fixed on probe, outside the outer wall of T-shaped guide post lower end forms
Screw thread, lower permanent magnetism set is spirally connected and is fixed on T-shaped guide post.
The bottom counterbore that external thread sleeve endoporus is connected, the hole of bottom counterbore is formed on the bottom surface of described probe stopper section
Footpath is identical with the aperture of external thread sleeve, and the central axis of bottom counterbore and the central axis of external thread sleeve are on the same line.
The diameter of described upper permanent magnetism set outer wall and the equal diameters of lower permanent magnetism set outer wall.
The upper end of described probe in detecting bar forms the syringe needle of some tapers, and syringe needle is ring around the center of detection bar upper surface
Shape is evenly distributed on detection bar.
The beneficial effects of the present invention is:
It is a kind of simple in construction, test probe easy to assembly, and in testing probe, elastic construction is by same pole simultaneously
Permanent magnet replace traditional spring, then be avoided that traditional test probe endogenous cause of ill spring mechanical fatigue failure etc. and the contact that causes
Bad.
Accompanying drawing illustrates:
Fig. 1 is the structural representation of invention；
Fig. 2 is the structural representation of invention probe base inner body.
In figure: 1, probe base；11, probe aperture；2, probe；21, stopper section；211, bottom counterbore；22, detection bar；221、
Syringe needle；23, external thread sleeve；3, upper permanent magnetism set；4, T-shaped guide post；5, lower permanent magnetism set；6, electric conductor；61, carbon brush head；62, carbon brush
Post；7, testing circuit plate.
Detailed description of the invention:
Embodiment: such as Fig. 1, shown in 2, a kind of test probe card being applied to integrated circuit, including probe base 1 and detection electricity
Road plate 7, probe base 1 forms probe aperture 11, is plugged with probe 2 in probe aperture 11, and probe 2 includes the stopper section 21 at middle part,
The upper surface detection bar 22 of stopper section 21, the upper surface of probe base 1 is exposed in the upper end of detection bar 22, it is characterised in that: stopper section
The lower surface of 21 forms vertical external thread sleeve 23, is plugged with inverted T-shaped guide post 4 in the endoporus of external thread sleeve 23, T-shaped
Guide post 4 upper sleeve has lower permanent magnetism set 5, lower permanent magnetism set 5 to be resisted against the lower end of T-shaped guide post 4, described external thread sleeve 23 is inserted
Being cased with permanent magnetism set 3, upper permanent magnetism overlaps the T-shaped guiding that the magnetic pole of 3 lower surfaces is identical with the magnetic pole that lower permanent magnetism overlaps 5 upper surfaces, described
In bar 4, grafting is fixed with electric conductor 6, and electric conductor 6 is made up of cylindrical carbon brush head 61 and carbon brush post 62, and carbon brush head 61 is resisted against
On the inner hole wall of external thread sleeve 23, the lower end of carbon brush post 62 is exposed the lower surface of T-shaped guide post 4 and is resisted against on testing circuit plate 7.
Described permanent magnetism set 3 is spirally connected on the external thread sleeve 23 being fixed on probe 2, molding on the outer wall of T-shaped guide post 4 lower end
External screw thread, lower permanent magnetism set 5 is had to be spirally connected and be fixed on T-shaped guide post 4.
The bottom counterbore 211 that external thread sleeve 23 endoporus is connected, bottom is formed on the bottom surface of described probe 2 stopper section 21
The aperture of counterbore 211 is identical with the aperture of external thread sleeve 23, the central axis of bottom counterbore 211 and the central shaft of external thread sleeve 23
Line is on the same line.
Described upper permanent magnetism overlaps the diameter of 3 outer walls and lower permanent magnetism overlaps the equal diameters of 5 outer walls.
The upper end that described probe 2 detects bar 22 forms the syringe needle 221 of some tapers, and syringe needle 221 is around detection bar 22 upper end
The center in face is evenly distributed on detection bar 22 ringwise.
Operation principle: the present invention is the test probe of detection integrated circuit, belongs to the one of probe card, is mainly characterized by
Rectify and improve the structure within probe card, overlapped, by upper permanent magnetism set 3 and lower permanent magnetism, the repulsion offer elastic force that 5 same pole produce, and
Use and overlap 5 coaxial electric conductors 6 with upper permanent magnetism set 3 and lower permanent magnetism and realize probe 2 and electrically connect with slowdown monitoring circuit plate 7, while lead T-shaped
Under the effect of bar 4, permanent magnetism set 3 and lower permanent magnetism set 5 suffer restraints, and repulsion reaches maximum, then can reduce lower permanent magnetism set accordingly
3 and the size of lower permanent magnetism set 5, it is simple to the assembling of probe card, and electric conductor 6 is made up of carbon brush head 61 and carbon brush post 62, carbon brush head
61 is wear-resistant, then can keep good contact.
Claims (5)
1. it is applied to a test probe card for integrated circuit, including probe base (1) and testing circuit plate (7), on probe base (1)
Forming probe aperture (11), be plugged with probe (2) in probe aperture (11), probe (2) includes the stopper section (21) at middle part, stopper section
(21) upper surface detection bar (22), the upper surface of probe base (1) is exposed in the upper end of detection bar (22), it is characterised in that: backstop
The lower surface in portion (21) forms vertical external thread sleeve (23), is plugged with inverted T-shaped lead in the endoporus of external thread sleeve (23)
To bar (4), T-shaped guide post (4) upper sleeve has lower permanent magnetism set (5), and lower permanent magnetism set (5) is resisted against the lower end of T-shaped guide post (4),
Described external thread sleeve (23) upper sleeve has upper permanent magnetism set (3), on the magnetic pole of upper permanent magnetism set (3) lower surface and lower permanent magnetism set (5)
The magnetic pole of end face is identical, and described T-shaped guide post (4) interior grafting is fixed with electric conductor (6), and electric conductor (6) is by cylindrical carbon
Brush (61) and carbon brush post (62) composition, carbon brush head (61) is resisted against on the inner hole wall of external thread sleeve (23), carbon brush post (62)
Lower end is exposed the lower surface of T-shaped guide post (4) and is resisted against on testing circuit plate (7).
A kind of test probe card being applied to integrated circuit the most according to claim 1, it is characterised in that: described permanent magnetism
Set (3) is spirally connected on the external thread sleeve (23) being fixed on probe (2), and the outer wall of T-shaped guide post (4) lower end forms external screw thread,
Lower permanent magnetism set (5) is spirally connected and is fixed on T-shaped guide post (4).
A kind of test probe card being applied to integrated circuit the most according to claim 1, it is characterised in that: described probe
(2) the bottom counterbore (211) that external thread sleeve (23) endoporus is connected, bottom counterbore are formed on the bottom surface of stopper section (21)
(211) aperture is identical with the aperture of external thread sleeve (23), in the central axis of bottom counterbore (211) and external thread sleeve (23)
Mandrel line is on the same line.
A kind of test probe card being applied to integrated circuit the most according to claim 1, it is characterised in that: described upper permanent magnetism
The diameter of set (3) outer wall and the equal diameters of lower permanent magnetism set (5) outer wall.
A kind of test probe card being applied to integrated circuit the most according to claim 1, it is characterised in that: described probe
(2) upper end of detection bar (22) forms the syringe needle (221) of some tapers, and syringe needle (221) is in detection bar (22) upper surface
The heart is evenly distributed in detection bar (22) ringwise.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610455264.5A CN106093752B (en) | 2016-06-20 | 2016-06-20 | A kind of test probe card applied to integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610455264.5A CN106093752B (en) | 2016-06-20 | 2016-06-20 | A kind of test probe card applied to integrated circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106093752A true CN106093752A (en) | 2016-11-09 |
| CN106093752B CN106093752B (en) | 2019-03-12 |
Family
ID=57238758
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610455264.5A Active CN106093752B (en) | 2016-06-20 | 2016-06-20 | A kind of test probe card applied to integrated circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106093752B (en) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102056739B1 (en) | 2018-12-03 | 2019-12-17 | 초이미디어 주식회사 | Magnetic pogo pin |
Citations (9)
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| CN201673179U (en) * | 2010-03-10 | 2010-12-15 | 上海凯恒电子科技有限公司 | Special testing probe for AV port |
| CN201765257U (en) * | 2010-06-12 | 2011-03-16 | 秦皇岛视听机械研究所 | Diode bare chip electromagnet elastic probe |
| CN102004173A (en) * | 2009-09-01 | 2011-04-06 | 鸿富锦精密工业（深圳）有限公司 | Probe |
| CN203178322U (en) * | 2013-02-21 | 2013-09-04 | 政云科技有限公司 | Semiconductor test probe |
| CN104034927A (en) * | 2014-05-15 | 2014-09-10 | 珠海市运泰利自动化设备有限公司 | High-precision double-head test probe |
| CN204211931U (en) * | 2014-09-26 | 2015-03-18 | 泉州市永祺塑胶电子有限公司 | Self-return probe |
| CN104969080A (en) * | 2012-11-21 | 2015-10-07 | 康拉德有限责任公司 | Method and device for testing a workpiece |
| CN105044406A (en) * | 2015-08-28 | 2015-11-11 | 东莞市天元通金属科技有限公司 | Current probe |
| CN105444695A (en) * | 2015-12-22 | 2016-03-30 | 四川大学 | Probe contact type measuring head enabling elastic element position limiting method-based dynamic characteristic adjustment |
-
2016
- 2016-06-20 CN CN201610455264.5A patent/CN106093752B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102004173A (en) * | 2009-09-01 | 2011-04-06 | 鸿富锦精密工业（深圳）有限公司 | Probe |
| CN201673179U (en) * | 2010-03-10 | 2010-12-15 | 上海凯恒电子科技有限公司 | Special testing probe for AV port |
| CN201765257U (en) * | 2010-06-12 | 2011-03-16 | 秦皇岛视听机械研究所 | Diode bare chip electromagnet elastic probe |
| CN104969080A (en) * | 2012-11-21 | 2015-10-07 | 康拉德有限责任公司 | Method and device for testing a workpiece |
| CN203178322U (en) * | 2013-02-21 | 2013-09-04 | 政云科技有限公司 | Semiconductor test probe |
| CN104034927A (en) * | 2014-05-15 | 2014-09-10 | 珠海市运泰利自动化设备有限公司 | High-precision double-head test probe |
| CN204211931U (en) * | 2014-09-26 | 2015-03-18 | 泉州市永祺塑胶电子有限公司 | Self-return probe |
| CN105044406A (en) * | 2015-08-28 | 2015-11-11 | 东莞市天元通金属科技有限公司 | Current probe |
| CN105444695A (en) * | 2015-12-22 | 2016-03-30 | 四川大学 | Probe contact type measuring head enabling elastic element position limiting method-based dynamic characteristic adjustment |
Also Published As
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|---|---|
| CN106093752B (en) | 2019-03-12 |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20190128 Address after: 435109 No. 88 Daqi Avenue, Wangren Town, Huangshi Economic Development Zone, Hubei Province Applicant after: DYNAMIC ELECTRONICS (HUANGSHI) Co.,Ltd. Address before: 523000 productivity building 406, high tech Industrial Development Zone, Songshan Lake, Dongguan, Guangdong Applicant before: Dongguan Lianzhou Intellectual Property Operation Management Co.,Ltd. |
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| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address | ||
| CP03 | Change of name, title or address |
Address after: 435000 No.88 Daqi Avenue, Wangren Town, Huangshi economic and Technological Development Zone, Hubei Province Patentee after: Chaoying Electronic Circuit Co.,Ltd. Address before: 435109 No. 88 Daqi Avenue, Wangren Town, Huangshi Economic Development Zone, Hubei Province Patentee before: DYNAMIC ELECTRONICS (HUANGSHI) Co.,Ltd. |