CN104034927A - High-precision double-head test probe - Google Patents
High-precision double-head test probe Download PDFInfo
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- CN104034927A CN104034927A CN201410205288.6A CN201410205288A CN104034927A CN 104034927 A CN104034927 A CN 104034927A CN 201410205288 A CN201410205288 A CN 201410205288A CN 104034927 A CN104034927 A CN 104034927A
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- probe
- test
- head
- backshank
- syringe needle
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Abstract
The invention discloses a high-precision double-head test probe and aims at providing a high-precision double-head test probe which is simple in structure and capable of well solving a problem of test of small-test-point, small-test-distance, large-number and large-area electronic product main boards and capable of meeting automation demands of a test device. The high-precision double-head test probe includes a probe body (1) which is in the shaped of an annulated column, and a probe head (2) and a probe tail (3), which are arranged in the two ends of the probe body (1) in a sleeved manner. A resetting element is arranged between the probe head (2) and the probe tail (3) and in the probe body (1). The size of the outer diameter A of the probe body (1) is 16 mil to 31 mil. During test, the probe head (1) and the probe tail (3) are capable of sliding in the probe body (1). The high-precision double-head test probe is applied to the technical field of an automation test device.
Description
Technical field
The present invention relates to a kind of high precision double-ended test probe for Electronic Testing.
Background technology
Test probe, also claims in the industry probe, is divided into again spring needle (special needle) and general pin while testing for pcb board.Spring needle in use, need to make testing mould according to the wiring situation of tested pcb board, and generally, a mould can only be tested a kind of pcb board; General pin in use, only need have enough counting, therefore now a lot of producer is all being used general pin.Spring needle is divided into again pcb board probe, ICT probe, BGA probe according to service condition.Pcb board probe is mainly used in pcb board test, and ICT probe is mainly used in the on-line testing after plug-in unit, and BGA probe is mainly used in BGA packaging and testing and chip testing.
For little test point (test point diameter is less than 0.5mm), little spacing (test point spacing is less than 1.27mm), large area (test products area surpasses 15mm*15mm), majority, measure the test products of (number of probes surpasses 200Pcs) at present, mainly in industry to adopt the Double ended socket testing needle of U.S. QA company or the testing needle of X-probe, it can accomplish the test point that minimum test spacing is 31mil, demand that simultaneously can compatible the Automation Design.
Along with the increase of consumption electronic product function, in the situation that product size reduces, need the function of test also to increase thereupon, just need to, on less area, arrange more test point.The diameter (0.4mm is main, also has about 20% 0.3mm test point) that this just requires to dwindle test point reduces spacing (narrowing down to 0.6mm, 22mil) simultaneously.Like this, the testing needle of the interior conventional Double ended socket testing needle of industry or X-probe just cannot meet testing requirement (the minimum 39mil of Double ended socket testing needle, the minimum 31mil of testing needle of X-probe).Meanwhile, the testing needle of these two kinds of structures, in technique, cannot accomplish less size.
And the POGO PIN probe of smaller szie, length own is too little, routine 5.7mm left and right, and it is very thin that needle plate processing needs, and approximately 0.5mm, cannot accomplish the product that test is larger.The fixture that uses POGO PIN, is all generally manually operated, cannot meet the demand of client's robotization.
Summary of the invention
Technical matters to be solved by this invention is to overcome the deficiencies in the prior art, and a kind of high precision double-ended test probe simple in structure that can solve well the test of little test point, little test spacing, large quantity, large-area electronic product mainboard and can meet the robotization demand of testing apparatus is provided.
The technical solution adopted in the present invention is: the present invention includes be the probe body of annulated column shape and the described probe body two ends that are slidably located in respectively in syringe needle and backshank, in described probe body and between described syringe needle and described backshank, be provided with reposition element, the size of the outer diameter A of described probe body is 16mil to 31mil, during test, described syringe needle and described backshank can slide in described probe body.
Preferably, the afterbody of described syringe needle and the afterbody of described backshank that are positioned at described probe body are provided with retaining step.
Preferably, the one end that is provided with the described probe body of described backshank is provided with closing in.
Preferably, described probe body is provided with the limited step suitable with the described retaining step of described syringe needle.
Preferably, the head of described syringe needle and the head of described backshank are all symmetrically arranged with inclined-plane, and described inclined-plane comes to a point the head of described syringe needle and the head of described backshank.
Preferably, the angle of the described inclined-plane of the head of described syringe needle and the axis of described syringe needle is 15 °, and the angle of the described inclined-plane of the head of described backshank and the axis of described backshank is 28 °.
Preferably, the length of described probe body is 20mm or 30mm.
Preferably, the length of described high precision double-ended test probe is 41mm or 28mm, and the length after compression is 34.75mm or 23.5mm.
Preferably, described reposition element is spring.
Preferably, described reposition element is the magnetic post that a pair of homopolarity is oppositely arranged, and a pair of described magnetic post is separately positioned on the afterbody of described syringe needle and described backshank.
The invention has the beneficial effects as follows: due to the present invention includes be the probe body of annulated column shape and the described probe body two ends that are slidably located in respectively in syringe needle and backshank, in described probe body and between described syringe needle and described backshank, be provided with reposition element, the size of the outer diameter A of described probe body is 16mil to 31mil, during test, described syringe needle and described backshank can slide in described probe body, so, the present invention can solve little test point (minimum test point diameter 0.3mm) well, little test spacing (minimum 0.6mm), large quantity (a needle plate number of probes surpasses 200Pcs), the test of the electronic product mainboard of large area (area of test products surpasses 15mm*15mm).
In addition, conventional double-ended needle need to adopt interference to join frictionally to fix, very high to the requirement of strength of probe itself.So, cannot accomplish less diameter.And the present invention adopts clearance fit, by special structure, realize the fixing of probe, avoided well the dependence of probe to the intensity of material own.Make retaining under the prerequisite of result of use, it is less that probe can be done.The specification of current 16mil to 31mil of the present invention unconventional specification, considerably beyond the minimum gauge 31mil of conventional probe.
Accompanying drawing explanation
Fig. 1 is one-piece construction schematic diagram of the present invention;
Fig. 2 is the structural representation of described test board 2 and described clamping unit 3;
Fig. 3 is another structural representation of the present invention.
Embodiment
As depicted in figs. 1 and 2, in the present embodiment, the present invention includes be the probe body 1 of annulated column shape and described probe body 1 two ends that are slidably located in respectively in syringe needle 2 and backshank 3, in described probe body 1 and between described syringe needle 2 and described backshank 3, be provided with reposition element 4, the size of the outer diameter A of described probe body 1 is 16mil to 31mil, during test, described syringe needle 2 and described backshank 3 can be in the interior slips of described probe body 1.
The afterbody of described syringe needle 2 and the afterbody of described backshank 3 that are positioned at described probe body 1 are provided with retaining step 5.
The one end that is provided with the described probe body 1 of described backshank 3 is provided with closes up 6.
Described probe body 1 is provided with the limited step 7 suitable with the described retaining step 5 of described syringe needle 2.
The head of the head of described syringe needle 2 and described backshank 3 is all symmetrically arranged with inclined-plane, and described inclined-plane comes to a point the head of described syringe needle 2 and the head of described backshank 3.
The angle of the described inclined-plane of the head of described syringe needle 2 and the axis of described syringe needle 2 is 15 °, and the angle of the described inclined-plane of the head of described backshank 3 and the axis of described backshank 3 is 28 °.
The length of described probe body 1 is 20mm or 30mm.
The test point of test 0.6mm spacing, the diameter of probe can not surpass 0.4mm.Need to meet the test of robotization and large product, the length of probe needs large.Test point quantity is large, considers actual use, need to adopt all resilient modes of two ends, comes the signal converting on test products in test circuit.Be directed to this, we have developed the different probe of modal length, and in the present embodiment, the length of described high precision double-ended test probe is 41mm or 28mm, and the length after compression is 34.75mm or 23.5mm, and described reposition element 4 is spring 8.
The magnetic post 9 that certain described reposition element 4 also can be oppositely arranged for a pair of homopolarity, a pair of described magnetic post 9 is separately positioned on the afterbody of described syringe needle 2 and described backshank 3.
In the present embodiment, the diameter 0.4mm of described probe body 1, meets the demand of testing 0.6mm spacing test point completely.The length of described probe body 1 is 20mm or 30mm, and the parts of stationary probe have enough intensity, and it is larger that size can be done.Described syringe needle 2 exposed portions serve length are 8mm or 6mm, and the support plate of placing product has certain thickness, and it is larger that support plate size can be done, and carries larger sized product.Ensure technically the design requirement of robotization, the present invention can solve the test of the electronic product mainboard of little test point (minimum test point diameter 0.3mm), little test spacing (minimum 0.6mm), large quantity (a needle plate number of probes surpasses 200Pcs), large area (area of test products surpasses 15mm*15mm) well.Meanwhile, can also meet the robotization demand of testing apparatus.
The present invention is applied to the technical field of automated test device.
Although embodiments of the invention are described with practical solution, do not form the restriction to implication of the present invention, for those skilled in the art, according to this instructions to the modification of its embodiment and with the combination of other schemes be all apparent.
Claims (10)
1. a high precision double-ended test probe, comprise be the probe body (1) of annulated column shape and described probe body (1) two ends that are slidably located in respectively in syringe needle (2) and backshank (3), in described probe body (1) and between described syringe needle (2) and described backshank (3), be provided with reposition element, it is characterized in that: the size of the outer diameter A of described probe body (1) is 16mil to 31mil, during test, described syringe needle (2) and described backshank (3) can slide in described probe body (1).
2. high precision double-ended test probe according to claim 1, is characterized in that: the afterbody of described syringe needle (2) and the afterbody of described backshank (3) that are positioned at described probe body (1) are provided with retaining step (5).
3. high precision double-ended test probe according to claim 2, is characterized in that: the one end that is provided with the described probe body (1) of described backshank (3) is provided with closing in (6).
4. high precision double-ended test probe according to claim 2, is characterized in that: described probe body (1) is provided with the limited step (7) suitable with the described retaining step (5) of described syringe needle (2).
5. high precision double-ended test probe according to claim 1, it is characterized in that: the head of the head of described syringe needle (2) and described backshank (3) is all symmetrically arranged with inclined-plane, described inclined-plane comes to a point the head of described syringe needle (2) and the head of described backshank (3).
6. high precision double-ended test probe according to claim 5, it is characterized in that: the angle of the axis of the described inclined-plane of the head of described syringe needle (2) and described syringe needle (2) is 15 °, the angle of the axis of the described inclined-plane of the head of described backshank (3) and described backshank (3) is 28 °.
7. high precision double-ended test probe according to claim 1, is characterized in that: the length of described probe body (1) is 20mm or 30mm.
8. according to the high precision double-ended test probe described in claim 1 or 7, it is characterized in that: the length of described high precision double-ended test probe is 41mm or 28mm, the length after compression is 34.75mm or 23.5mm.
9. high precision double-ended test probe according to claim 1, is characterized in that: described reposition element is spring (8).
10. high precision double-ended test probe according to claim 1, is characterized in that: described reposition element is the magnetic post (9) that a pair of homopolarity is oppositely arranged, and a pair of described magnetic post (9) is separately positioned on the afterbody of described syringe needle (2) and described backshank (3).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410205288.6A CN104034927A (en) | 2014-05-15 | 2014-05-15 | High-precision double-head test probe |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410205288.6A CN104034927A (en) | 2014-05-15 | 2014-05-15 | High-precision double-head test probe |
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| CN104034927A true CN104034927A (en) | 2014-09-10 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201410205288.6A Pending CN104034927A (en) | 2014-05-15 | 2014-05-15 | High-precision double-head test probe |
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Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105929208A (en) * | 2016-06-20 | 2016-09-07 | 东莞市联洲知识产权运营管理有限公司 | Test probe card used for detecting integrated circuit |
| CN106093752A (en) * | 2016-06-20 | 2016-11-09 | 东莞市联洲知识产权运营管理有限公司 | A kind of test probe card being applied to integrated circuit |
| CN106841999A (en) * | 2017-03-24 | 2017-06-13 | 深圳市斯纳达科技有限公司 | Arrangement for testing integrated circuit and its test probe |
Citations (6)
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| EP0989409A1 (en) * | 1998-09-23 | 2000-03-29 | Delaware Capital Formation, Inc. | Scan test machine for densely spaced test sites |
| US6900649B1 (en) * | 2003-09-23 | 2005-05-31 | Keithley Instruments, Inc. | High frequency RF interconnect for semiconductor automatic test equipment |
| CN201035046Y (en) * | 2007-04-19 | 2008-03-12 | 沈芳珍 | Double-ended test probe |
| CN203365489U (en) * | 2013-07-09 | 2013-12-25 | 大西电子仪器（昆山）有限公司 | Eccentric probe for detecting circuit board |
| CN203535080U (en) * | 2013-09-22 | 2014-04-09 | 上海电器科学研究所（集团）有限公司 | SMA type RF testing probe |
| CN204116397U (en) * | 2014-05-15 | 2015-01-21 | 珠海市运泰利自动化设备有限公司 | High precision double-ended test probe |
-
2014
- 2014-05-15 CN CN201410205288.6A patent/CN104034927A/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0989409A1 (en) * | 1998-09-23 | 2000-03-29 | Delaware Capital Formation, Inc. | Scan test machine for densely spaced test sites |
| US6900649B1 (en) * | 2003-09-23 | 2005-05-31 | Keithley Instruments, Inc. | High frequency RF interconnect for semiconductor automatic test equipment |
| CN201035046Y (en) * | 2007-04-19 | 2008-03-12 | 沈芳珍 | Double-ended test probe |
| CN203365489U (en) * | 2013-07-09 | 2013-12-25 | 大西电子仪器（昆山）有限公司 | Eccentric probe for detecting circuit board |
| CN203535080U (en) * | 2013-09-22 | 2014-04-09 | 上海电器科学研究所（集团）有限公司 | SMA type RF testing probe |
| CN204116397U (en) * | 2014-05-15 | 2015-01-21 | 珠海市运泰利自动化设备有限公司 | High precision double-ended test probe |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN105929208A (en) * | 2016-06-20 | 2016-09-07 | 东莞市联洲知识产权运营管理有限公司 | Test probe card used for detecting integrated circuit |
| CN106093752A (en) * | 2016-06-20 | 2016-11-09 | 东莞市联洲知识产权运营管理有限公司 | A kind of test probe card being applied to integrated circuit |
| CN106093752B (en) * | 2016-06-20 | 2019-03-12 | 定颖电子(黄石)有限公司 | A kind of test probe card applied to integrated circuit |
| CN106841999A (en) * | 2017-03-24 | 2017-06-13 | 深圳市斯纳达科技有限公司 | Arrangement for testing integrated circuit and its test probe |
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| RJ01 | Rejection of invention patent application after publication | ||
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Application publication date: 20140910 |