CN106093752B - A kind of test probe card applied to integrated circuit - Google Patents
A kind of test probe card applied to integrated circuit Download PDFInfo
- Publication number
- CN106093752B CN106093752B CN201610455264.5A CN201610455264A CN106093752B CN 106093752 B CN106093752 B CN 106093752B CN 201610455264 A CN201610455264 A CN 201610455264A CN 106093752 B CN106093752 B CN 106093752B
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- CN
- China
- Prior art keywords
- probe
- permanent magnetism
- guide rod
- external thread
- type guide
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2886—Features relating to contacting the IC under test, e.g. probe heads; chucks
- G01R31/2887—Features relating to contacting the IC under test, e.g. probe heads; chucks involving moving the probe head or the IC under test; docking stations
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- General Engineering & Computer Science (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Abstract
The invention discloses a kind of test probe cards applied to integrated circuit, including probe base and detection circuit board, probe aperture is formed on probe base, probe is plugged in probe aperture, probe includes the stopper section at middle part, the upper surface detection bar of stopper section, expose the upper surface of probe base in the upper end of detection bar, it is characterized by: the lower end surface of stopper section forms vertical external thread sleeve, inverted T-type guide rod is plugged in the inner hole of external thread sleeve, T-type guide rod upper sleeve has lower permanent magnetism set, external thread sleeve upper sleeve has upper permanent magnetism set, the magnetic pole that the magnetic pole of upper permanent magnetism set lower end surface and lower permanent magnetism put on end face is identical, grafting is fixed with electric conductor in T-type guide rod, electric conductor is made of cylindrical carbon brush head and carbon brush column, carbon brush head is resisted against on the inner hole wall of external thread sleeve, the lower end of carbon brush column expose the lower end surface of T-type guide rod against In detection circuit board.Its structure is simple, easy to assembly, is avoided that poor contact caused by due to spring mechanical fatigue failure.
Description
Technical field:
The present invention relates to the technical fields of integrated circuit detector, are applied to integrated circuit more specifically to one kind
Test probe card.
Background technique:
Probe card is the element that detection circuit is commonly used in semiconductor technology, is inside disposed with multiple probes, is visited
The arrangement position of needle is corresponding with the circuit configuration on the circuit board under test that this probe card to be detected.Probe card is normally placed in one
It detects on board, circuit board under test is clamped with a tool and suppressed on probe.So that electricity to be measured is connected in each probe
Circuit on the plate of road, by the circuit on probe in detecting circuit board under test whether normal operation.Existing probe structure generally wraps
Contain the spring for being equipped with two electrodes in a sleeve sleeve and being connected between two electrodes.One of electrode is fixed on
Detection board and be electrically connected detection board, another electrode be then movably located in sleeve to connect to be detected to
Solder joint on slowdown monitoring circuit plate.When circuit board under test presses probe, spring is compressed and forces in movable electrode, makes this whereby
Electrode is pressed into contact with circuit board under test and is connected really.One movable electrode is either only set, and it is direct by spring
Connect electrode and detection board.
Probe is small element, and its structure is complicated, and part production and assembling are all not easy.Existing probe using spring as
Element is connected, therefore the error in technique often will lead to probe poor contact and circuit board under test and detection machine can not be connected
Platform.
Summary of the invention:
The purpose of the present invention is to the deficiencies of the prior art, and provide a kind of test spy applied to integrated circuit
Needle card, structure is simple, easy to assembly, while caused by being avoided that in traditional test probe due tos spring mechanical fatigue failure etc.
Poor contact.
To achieve the above object, technical scheme is as follows:
A kind of test probe card applied to integrated circuit, including probe base and detection circuit board form on probe base
Probe aperture is plugged with probe in probe aperture, and probe includes the stopper section at middle part, and the upper surface of stopper section forms detection bar, examines
Expose the upper surface of probe base in the upper end of measuring staff, it is characterised in that: the lower end surface of stopper section forms vertical external thread sleeve, outside
Inverted T-type guide rod is plugged in the inner hole of thread bush, T-type guide rod upper sleeve has lower permanent magnetism set, and lower permanent magnetism set is resisted against T
The lower end of type guide rod, the external thread sleeve upper sleeve have upper permanent magnetism set, the magnetic pole and lower permanent magnetism set of upper permanent magnetism set lower end surface
The magnetic pole of upper surface is identical, and grafting is fixed with electric conductor in the T-type guide rod, and electric conductor is by cylindrical carbon brush head and carbon
Brush spine composition, carbon brush head is resisted against on the inner hole wall of external thread sleeve, the lower end of carbon brush column expose the lower end surface of T-type guide rod against
In detection circuit board；
The upper permanent magnetism set, which is spirally connected, to be fixed on the external thread sleeve of probe, is formed on the outer wall of T-type guide rod lower end outer
Screw thread, lower permanent magnetism set, which is spirally connected, to be fixed on T-type guide rod；
The bottom counterbore being connected with external thread sleeve inner hole is formed on the bottom surface of the probe stopper section, bottom counterbore
Aperture is identical with the aperture of external thread sleeve, and the central axis of the central axis of bottom counterbore and external thread sleeve is on the same line.
The diameter of the upper permanent magnetism set outer wall and the diameter of lower permanent magnetism set outer wall are equal.
The upper end of the probe in detecting bar forms the syringe needle of several tapers, and syringe needle is in ring around the center of detection bar upper surface
Shape is evenly distributed in detection bar.
The beneficial effects of the present invention are:
It is a kind of simple, the easy to assembly test probe of structure, while testing in probe elastic construction by same pole
Permanent magnet replace traditional spring, then be avoided that in traditional test probe contact caused by due tos spring mechanical fatigue failure etc.
It is bad.
Detailed description of the invention:
Fig. 1 is the structural schematic diagram of invention；
Fig. 2 is the structural schematic diagram of invention probe base inner body.
In figure: 1, probe base；11, probe aperture；2, probe；21, stopper section；211, bottom counterbore；22, detection bar；221,
Syringe needle；23, external thread sleeve；3, upper permanent magnetism set；4, T-type guide rod；5, lower permanent magnetism set；6, electric conductor；61, carbon brush head；62, carbon brush
Column；7, detection circuit board.
Specific embodiment:
Embodiment: as shown in FIGS. 1 and 2, a kind of test probe card applied to integrated circuit, including probe base 1 and detection electricity
Road plate 7 forms probe aperture 11 on probe base 1, and probe 2 is plugged in probe aperture 11, and probe 2 includes the stopper section 21 at middle part,
The upper surface of stopper section 21 forms detection bar 22, and the upper surface of probe base 1 is exposed in the upper end of detection bar 22, it is characterised in that:
The lower end surface of stopper section 21 forms vertical external thread sleeve 23, and inverted T-type guiding is plugged in the inner hole of external thread sleeve 23
Bar 4,4 upper sleeve of T-type guide rod have lower permanent magnetism set 5, and lower permanent magnetism set 5 is resisted against the lower end of T-type guide rod 4, the external screw thread
Covering 23 upper sleeves has upper permanent magnetism set 3, and the magnetic pole that upper permanent magnetism covers the magnetic pole of 3 lower end surfaces and lower permanent magnetism covers 5 upper surfaces is identical, described
Grafting is fixed with electric conductor 6 in T-type guide rod 4, and electric conductor 6 is made of cylindrical carbon brush head 61 and carbon brush column 62, carbon brush head
61 are resisted against on the inner hole wall of external thread sleeve 23, and the lower end surface that T-type guide rod 4 is exposed in the lower end of carbon brush column 62 is resisted against detection electricity
On road plate 7.
The permanent magnetism set 3, which is spirally connected, to be fixed on the external thread sleeve 23 of probe 2, is formed on the outer wall of 4 lower end of T-type guide rod
There is external screw thread, lower permanent magnetism set 5, which is spirally connected, to be fixed on T-type guide rod 4.
The bottom counterbore 211 being connected with 23 inner hole of external thread sleeve, bottom are formed on the bottom surface of 2 stopper section 21 of probe
The aperture of portion's counterbore 211 is identical with the aperture of external thread sleeve 23, the central axis of bottom counterbore 211 and the center of external thread sleeve 23
Axis is on the same line.
The diameter that the upper permanent magnetism covers the diameter of 3 outer walls and lower permanent magnetism covers 5 outer walls is equal.
The upper end of 2 detection bar 22 of probe forms the syringe needle 221 of several tapers, and syringe needle 221 is around 22 upper end of detection bar
The center in face is evenly distributed in a ring in detection bar 22.
Working principle: the present invention is to detect the test probe of integrated circuit, belongs to one kind of probe card, is mainly characterized by
The structure inside probe card has been rectified and improved, the repulsion that 5 same poles generate has been covered by upper permanent magnetism set 3 and lower permanent magnetism, elastic force is provided, and
It realizes that probe 2 is electrically connected with slowdown monitoring circuit plate 7 using the electric conductor 6 coaxial with upper permanent magnetism set 3 and lower permanent magnetism set 5, while being led in T-type
Permanent magnetism set 3 and lower permanent magnetism set 5 suffer restraints under the action of to bar 4, and repulsion reaches maximum, then can reduce lower permanent magnetism set accordingly
3 and lower permanent magnetism set 5 size, convenient for the assembling of probe card, and electric conductor 6 is made of carbon brush head 61 and carbon brush column 62, carbon brush head
61 is wear-resistant, then is able to maintain good contact.
Claims (3)
1. a kind of test probe card applied to integrated circuit, including probe base (1) and detection circuit board (7), on probe base (1)
It forms probe aperture (11), is plugged with probe (2) in probe aperture (11), probe (2) includes the stopper section (21) at middle part, stopper section
(21) upper surface forms detection bar (22), and the upper surface of probe base (1) is exposed in the upper end of detection bar (22), and feature exists
In: the lower end surface of stopper section (21) forms vertical external thread sleeve (23), is plugged with inversion in the inner hole of external thread sleeve (23)
T-type guide rod (4), T-type guide rod (4) upper sleeve has lower permanent magnetism set (5), and lower permanent magnetism set (5) is resisted against T-type guide rod (4)
Lower end, the external thread sleeve (23) upper sleeve has upper permanent magnetism set (3), the magnetic pole and lower permanent magnetism of upper permanent magnetism set (3) lower end surface
The magnetic pole for covering (5) upper surface is identical, and described T-type guide rod (4) the interior grafting is fixed with electric conductor (6), and electric conductor (6) is by cylinder
The carbon brush head (61) and carbon brush column (62) of shape form, and carbon brush head (61) is resisted against on the inner hole wall of external thread sleeve (23), carbon brush column
(62) expose the lower end surface of T-type guide rod (4) and be resisted against on detection circuit board (7) in lower end；
The upper permanent magnetism set (3), which is spirally connected, to be fixed on the external thread sleeve (23) of probe (2), on the outer wall of T-type guide rod (4) lower end
External screw thread is formed, lower permanent magnetism set (5), which is spirally connected, to be fixed on T-type guide rod (4)；
The bottom counterbore being connected with external thread sleeve (23) inner hole is formed on the bottom surface of probe (2) stopper section (21)
(211), the aperture of bottom counterbore (211) is identical with the aperture of external thread sleeve (23), the central axis of bottom counterbore (211) and outer
The central axis of thread bush (23) is on the same line.
2. a kind of test probe card applied to integrated circuit according to claim 1, it is characterised in that: the upper permanent magnetism
The diameter of the diameter and lower permanent magnetism set (5) outer wall that cover (3) outer wall is equal.
3. a kind of test probe card applied to integrated circuit according to claim 1, it is characterised in that: the probe
(2) upper end of detection bar (22) forms the syringe needle (221) of several tapers, and syringe needle (221) is in detection bar (22) upper surface
The heart is evenly distributed in a ring on detection bar (22).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610455264.5A CN106093752B (en) | 2016-06-20 | 2016-06-20 | A kind of test probe card applied to integrated circuit |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610455264.5A CN106093752B (en) | 2016-06-20 | 2016-06-20 | A kind of test probe card applied to integrated circuit |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106093752A CN106093752A (en) | 2016-11-09 |
| CN106093752B true CN106093752B (en) | 2019-03-12 |
Family
ID=57238758
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610455264.5A Active CN106093752B (en) | 2016-06-20 | 2016-06-20 | A kind of test probe card applied to integrated circuit |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106093752B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102056739B1 (en) | 2018-12-03 | 2019-12-17 | 초이미디어 주식회사 | Magnetic pogo pin |
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| CN201673179U (en) * | 2010-03-10 | 2010-12-15 | 上海凯恒电子科技有限公司 | Special testing probe for AV port |
| CN201765257U (en) * | 2010-06-12 | 2011-03-16 | 秦皇岛视听机械研究所 | Diode bare chip electromagnet elastic probe |
| CN102004173A (en) * | 2009-09-01 | 2011-04-06 | 鸿富锦精密工业（深圳）有限公司 | Probe |
| CN203178322U (en) * | 2013-02-21 | 2013-09-04 | 政云科技有限公司 | Semiconductor test probe |
| CN104034927A (en) * | 2014-05-15 | 2014-09-10 | 珠海市运泰利自动化设备有限公司 | High-precision double-head test probe |
| CN204211931U (en) * | 2014-09-26 | 2015-03-18 | 泉州市永祺塑胶电子有限公司 | Self-return probe |
| CN104969080A (en) * | 2012-11-21 | 2015-10-07 | 康拉德有限责任公司 | Method and device for testing a workpiece |
| CN105044406A (en) * | 2015-08-28 | 2015-11-11 | 东莞市天元通金属科技有限公司 | Current probe |
| CN105444695A (en) * | 2015-12-22 | 2016-03-30 | 四川大学 | Probe contact type measuring head enabling elastic element position limiting method-based dynamic characteristic adjustment |
-
2016
- 2016-06-20 CN CN201610455264.5A patent/CN106093752B/en active Active
Patent Citations (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102004173A (en) * | 2009-09-01 | 2011-04-06 | 鸿富锦精密工业（深圳）有限公司 | Probe |
| CN201673179U (en) * | 2010-03-10 | 2010-12-15 | 上海凯恒电子科技有限公司 | Special testing probe for AV port |
| CN201765257U (en) * | 2010-06-12 | 2011-03-16 | 秦皇岛视听机械研究所 | Diode bare chip electromagnet elastic probe |
| CN104969080A (en) * | 2012-11-21 | 2015-10-07 | 康拉德有限责任公司 | Method and device for testing a workpiece |
| CN203178322U (en) * | 2013-02-21 | 2013-09-04 | 政云科技有限公司 | Semiconductor test probe |
| CN104034927A (en) * | 2014-05-15 | 2014-09-10 | 珠海市运泰利自动化设备有限公司 | High-precision double-head test probe |
| CN204211931U (en) * | 2014-09-26 | 2015-03-18 | 泉州市永祺塑胶电子有限公司 | Self-return probe |
| CN105044406A (en) * | 2015-08-28 | 2015-11-11 | 东莞市天元通金属科技有限公司 | Current probe |
| CN105444695A (en) * | 2015-12-22 | 2016-03-30 | 四川大学 | Probe contact type measuring head enabling elastic element position limiting method-based dynamic characteristic adjustment |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR102056739B1 (en) | 2018-12-03 | 2019-12-17 | 초이미디어 주식회사 | Magnetic pogo pin |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106093752A (en) | 2016-11-09 |
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| Date | Code | Title | Description |
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| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20190128 Address after: 435109 No. 88 Daqi Avenue, Wangren Town, Huangshi Economic Development Zone, Hubei Province Applicant after: DYNAMIC ELECTRONICS (HUANGSHI) Co.,Ltd. Address before: 523000 productivity building 406, high tech Industrial Development Zone, Songshan Lake, Dongguan, Guangdong Applicant before: Dongguan Lianzhou Intellectual Property Operation Management Co.,Ltd. |
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| TA01 | Transfer of patent application right | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP03 | Change of name, title or address |
Address after: 435000 No.88 Daqi Avenue, Wangren Town, Huangshi economic and Technological Development Zone, Hubei Province Patentee after: Chaoying Electronic Circuit Co.,Ltd. Address before: 435109 No. 88 Daqi Avenue, Wangren Town, Huangshi Economic Development Zone, Hubei Province Patentee before: DYNAMIC ELECTRONICS (HUANGSHI) Co.,Ltd. |
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| CP03 | Change of name, title or address |