CN204287257U - A kind of Multi-point contact type shell fragment type probe assembly - Google Patents

A kind of Multi-point contact type shell fragment type probe assembly Download PDF

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Publication number
CN204287257U
CN204287257U CN201420777188.6U CN201420777188U CN204287257U CN 204287257 U CN204287257 U CN 204287257U CN 201420777188 U CN201420777188 U CN 201420777188U CN 204287257 U CN204287257 U CN 204287257U
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CN
China
Prior art keywords
probe
current
shank
stacker
shell fragment
Prior art date
Application number
CN201420777188.6U
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Chinese (zh)
Inventor
李洪波
毛长峰
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深圳市精实机电科技有限公司
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Publication date
Application filed by 深圳市精实机电科技有限公司 filed Critical 深圳市精实机电科技有限公司
Priority to CN201420777188.6U priority Critical patent/CN204287257U/en
Application granted granted Critical
Publication of CN204287257U publication Critical patent/CN204287257U/en

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Abstract

The utility model discloses a kind of Multi-point contact type shell fragment type probe assembly, comprise shank, lower end is connected to the voltage probe in shank, be fixedly connected on the stacker of shank upper end, be arranged at stacker top and nestable multiple current probes together, described each current probe includes a ring body, the multiple braces separately of annular array on body upper surface centered by the body center of circle, from each brace top toward the contact chip of interior extension, the oblique setting of every a connecting piece, voltage probe and current probe are coaxially arranged, and voltage probe is positioned at middle, the contact chip of all current probes is in the same plane, and the top end face of voltage probe and all current probe contact chips is set to flank of thread, during test, the surface of contact of multiple current probe can realize Multi-contact test to single battery electrode, thus the high-current test of multiple different model can be applicable to, flank of thread can improve the stability of contact, measuring accuracy can also be improved.

Description

A kind of Multi-point contact type shell fragment type probe assembly
Technical field
The utility model relates to the probe detecting battery, particularly relates to a kind of Multi-point contact type shell fragment type probe assembly.
Background technology
In the prior art, in cell production process, need to detect the half-finished charging of battery, electric discharge and voltage, electric current, resistance, and the key operation realizing detecting is exactly by the both positive and negative polarity of the probes touch battery of testing tool, carries out related data reading by instrument.In practical operation, probe assembly is under the promotion of complete machine cylinder, and the two poles of the earth of probe contact with institute test battery both positive and negative polarity, thus realizes the detection to battery charging, electric discharge and voltage, electric current, resistance.In actual production, because battery variety is various, and the contact area of the both positive and negative polarity of most of battery is relatively little, and need the pickup current of test increasing, thus need to carry out installation testing with the probe of inhomogeneity shape and a lot of current probe, so, bring much inconvenience to user, and add cost.
Utility model content
The purpose of this utility model is to provide a kind of Multi-point contact type shell fragment type probe assembly, and it can be adapted to the great current cell test of multiple different model, and contact is good, and measuring accuracy is high.
For achieving the above object, the technical scheme that the utility model adopts is:
A kind of Multi-point contact type shell fragment type probe assembly, comprise hollow shank, lower end is connected to the voltage probe in shank, be fixedly connected on the stacker of shank upper end, the guide pin bushing being socketed on shank can be slided up and down to, be sheathed on shank and be arranged at the spring between stacker and fixing guide pin bushing, be arranged at stacker top and nestable multiple current probes together, to be connected to above stacker and described multiple current probe to be fixed on the holder of stacker, described each current probe includes a ring body, the multiple braces separately of annular array on body upper surface centered by the body center of circle, from each brace top toward the contact chip of interior extension, the bottom of all braces of each current probe described surrounds circle at the bottom of, top surrounds a tip circle, top diameter of a circle is less than end circle, up and down in nestable multiple current probes together, the tip circle of a current probe and end circular diameter are greater than tip circle and the end circular diameter of a current probe below respectively above, described voltage probe and current probe are coaxially arranged, and voltage probe is positioned at middle, the top of voltage probe and the contact chip of all current probes reveal all for outside holder upper end, the contact chip of all current probes is in the same plane, and the top end face of the top end face of described voltage probe and all current probe contact chips is set to flank of thread.
Described stacker comprises connecting portion and the lower connecting portion for being connected with shank, and the external diameter of upper connecting portion is less than lower connecting portion, and described multiple nestable current probe is together placed on the top end face of connecting portion.
Described lower connecting portion is provided with internal thread, and described shank upper end is provided with corresponding external thread, thus described stacker and shank are threaded connection.
Described holder lower end is provided with internal thread, the lower connecting portion of stacker is provided with corresponding external thread, thus holder and stacker are threaded connection, the part between brace bottom and body outer rim of described current probe body upper surface is set to press face, and the inner roof wall of holder is pressed in the press face of the current probe in the top of the multiple current probes be nested in together.
The madial wall of described holder is provided with an intermediate step between inner roof wall and lower surface, thus the lower surface of holder, intermediate step and inner roof wall formed three grades step-like, and the height between intermediate step and inner roof wall equals the thickness of all current probe ring bodies, the diameter of inner roof wall equals the external diameter of current probe body.
This body diameter of described multiple current probe is identical and equal the external diameter of connecting portion on stacker.
Described shank is provided with flange, and described guide pin bushing lower end abutment is in flange upper surface.
Described shank lower end is provided with screw thread and connects for a nut.
Described voltage probe lower end is connected in shank by probe casing and insulating sheath.
The beneficial effects of the utility model are: because the utility model is provided with multiple current probe, and each current probe is provided with multiple surface of contact, thus during test, Multi-contact test can be realized to single battery electrode, so, the high-current test of multiple different model can be applicable to, reduce costs greatly, shorten test period, facilitate user simultaneously; And current probe is due to the structure of itself, when making contact chip pressurized, brace has certain elastic deformation amount with this physical efficiency of combination opposed annular contacting skin, namely current probe itself has elasticity, thus can make when testing, the electrode contact of current probe and mesuring battary is more reliable and stable; In addition, and because the top end face of voltage probe and current probe contact chip is and flank of thread that flank of thread can increase contact friction force, thus can ensure further and the contact of battery electrode reliability and stability more, and relative to shiny surface, flank of thread can reduce resistivity, thus improve measuring accuracy.
Accompanying drawing explanation
Fig. 1 is the utility model Multi-point contact type shell fragment type probe assembly overall schematic;
Fig. 2 is the utility model Multi-point contact type shell fragment type probe assembly exploded perspective view;
Fig. 3 is the utility model Multi-point contact type shell fragment type probe assembly diagrammatic cross-section.
Embodiment
In order to make the purpose of this utility model, technical scheme and advantage clearly understand, below in conjunction with drawings and Examples, the utility model is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the utility model, and be not used in restriction the utility model.
As Fig. 1, 2, shown in 3, the utility model Multi-point contact type shell fragment type probe assembly comprises hollow shank 1, lower end is connected to the voltage probe 2 in shank 1, be fixedly connected on the stacker 3 of shank 1 upper end, the guide pin bushing 4 being socketed on shank 1 can be slided up and down to, be sheathed on shank 1 and be arranged at the spring 5 between stacker 3 and fixing guide pin bushing 4, be arranged at stacker 3 top and nestable multiple current probes 6 together, to be connected to above stacker 3 and described multiple current probe 6 to be fixed on the holder 7 of stacker 3, described each current probe 6 includes a ring body 61, the multiple braces 62 separately of annular array on body 61 upper surface centered by body 61 center of circle, from each brace 62 top toward the contact chip 63 of interior extension, the bottom of all braces 62 of each current probe 6 described surrounds circle at the bottom of, top surrounds a tip circle, top diameter of a circle is less than end circle, the i.e. oblique setting of described every a connecting piece 62, up and down in nestable multiple current probes 6 together, above the tip circle of a current probe 6 and end circular diameter be greater than tip circle and the end circular diameter of a current probe 6 below respectively, so, multiple current probe 6 could be together nestable up and down, described voltage probe 2 and current probe 6 are coaxially arranged, and voltage probe 2 is positioned at middle, and that is to say the central shaft of the central shaft of current probe 6 and voltage probe 2 on the same line, the contact chip 63 of all current probes 6 is round the most central voltage probe 2, the top of voltage probe 2 and the contact chip 63 of all current probes 6 are exposed to outside holder 7 upper end, the contact chip 63 of all current probes 6 is in the same plane, and the top end face of the top end face of described voltage probe 2 and all current probes 6 contact chip 63 is set to flank of thread.
Described stacker 3 comprises connecting portion 31 and the lower connecting portion 32 for being connected with shank 1, the external diameter of upper connecting portion 31 is less than lower connecting portion 32, described multiple nestable current probe 6 is together placed on the top end face of connecting portion 31, that is to say, in multiple nestable current probe 6 together, ring body 61 lower surface of nethermost current probe 6 is placed on the top end face of connecting portion 31.In the present embodiment, preferably, described lower connecting portion 32 is provided with internal thread, and described shank 1 upper end is provided with corresponding external thread, thus described stacker 3 and shank 1 are threaded connection.
Described holder 7 lower end is provided with internal thread, and the lower connecting portion 32 of stacker 3 is provided with corresponding external thread, thus holder 7 and stacker 3 are threaded connection; Because the bottom of described current probe brace 62 and body 61 outer rim have a segment distance, that is to say, the part between brace 62 bottom and body 61 outer rim of current probe body 61 upper surface is set to press face 64, thus after holder 7 is connected with stacker 3, the inner roof wall 70 of holder 7 is pressed in the press face 64 of the current probe 6 in the top of the multiple current probes 6 be nested in together, that is, when holder 7 is tightened against stacker 3, current probe 6 is pressed on the upper surface of connecting portion 31 on stacker by holder 7 simultaneously.
In the present embodiment, preferably, the madial wall of described holder 7 is provided with an intermediate step 71 between inner roof wall 70 and lower surface 72, thus the lower surface 72 of holder 7, intermediate step 71 and inner roof wall 70 formed three grades step-like, and the height between intermediate step 71 and inner roof wall 70 equals the thickness of all current probe 6 ring bodies 61, the diameter of inner roof wall 70 equals the external diameter of current probe body 61.
In the present embodiment, preferably, body 61 external diameter of described multiple current probe is identical and equal the external diameter of connecting portion 31 on stacker 3.
Described shank 1 is provided with flange 11, and described guide pin bushing 4 lower end abutment is in flange 11 upper surface; Described shank 1 lower end is provided with screw thread and connects for a nut 8.
Described voltage probe 2 lower end is connected in shank 1 by probe casing 9 and insulating sheath 10, and concrete connected mode is the feasible arbitrarily known technology in this area, thus does not repeat at this.And voltage probe 2 end is connected with electric wire 20.
Because the utility model is provided with multiple current probe 6, and each current probe 6 is provided with multiple surface of contact, thus during test, Multi-contact test can be realized to single battery electrode, so, the high-current test of multiple different model can be applicable to, reduce costs greatly, facilitate user simultaneously; And current probe 6 is due to the structure of itself, when making contact chip 63 pressurized, brace 62 has certain elastic deformation amount with the combination opposing body 61 of contact chip 63, namely current probe 6 itself has elasticity, thus can make when testing, current probe 6 is more reliable and stable with the electrode contact of mesuring battary; In addition, and because voltage probe 2 with the top end face of current probe 6 contact chip 63 is and flank of thread, flank of thread can increase contact friction force, thus can ensure further and the contact of battery electrode reliability and stability more, and relative to shiny surface, flank of thread can reduce resistivity, thus improves measuring accuracy.
Described guide pin bushing 4 is for being connected to battery testing frame (not shown) by the utility model probe assembly, guide pin bushing 4 can be connected by relative sliding with shank 1, and between stacker 3 and guide pin bushing 4, spring 5 is set, thus when testing, current probe 6 battery testing frame relative to voltage probe 2 can have certain up and down space, thus the utility model can be applicable to the battery testing of differing heights especially further, and the elastic force of spring 5 can make current probe 6 more be adjacent to the contact of voltage probe 2 with mesuring battary electrode, contact is better.

Claims (9)

1. a Multi-point contact type shell fragment type probe assembly, is characterized in that: comprise hollow shank, lower end connects
Voltage probe in shank, be fixedly connected on the stacker of shank upper end, the guide pin bushing being socketed on shank can be slided up and down to, be sheathed on shank and be arranged at the spring between stacker and fixing guide pin bushing, be arranged at stacker top and nestable multiple current probes together, to be connected to above stacker and described multiple current probe to be fixed on the holder of stacker, described each current probe includes a ring body, the multiple braces separately of annular array on body upper surface centered by the body center of circle, from each brace top toward the contact chip of interior extension, the bottom of all braces of each current probe described surrounds circle at the bottom of, top surrounds a tip circle, top diameter of a circle is less than end circle, up and down in nestable multiple current probes together, the tip circle of a current probe and end circular diameter are greater than tip circle and the end circular diameter of a current probe below respectively above, described voltage probe and current probe are coaxially arranged, and voltage probe is positioned at middle, the top of voltage probe and the contact chip of all current probes reveal all for outside holder upper end, the contact chip of all current probes is in the same plane, and the top end face of the top end face of described voltage probe and all current probe contact chips is set to flank of thread.
2. Multi-point contact type shell fragment type probe assembly according to claim 1, is characterized in that: described in hold
Joint chair comprises connecting portion and the lower connecting portion for being connected with shank, and the external diameter of upper connecting portion is less than lower connecting portion, and described multiple nestable current probe is together placed on the top end face of connecting portion.
3. Multi-point contact type shell fragment type probe assembly according to claim 2, is characterized in that: under described
Connecting portion is provided with internal thread, and described shank upper end is provided with corresponding external thread, thus described stacker and shank are threaded connection.
4. the Multi-point contact type shell fragment type probe assembly according to Claims 2 or 3, is characterized in that: institute
State holder lower end and be provided with internal thread, the lower connecting portion of stacker is provided with corresponding external thread, thus holder and stacker are threaded connection, the part between brace bottom and body outer rim of described current probe body upper surface is set to press face, and the inner roof wall of holder is pressed in the press face of the current probe in the top of the multiple current probes be nested in together.
5. Multi-point contact type shell fragment type probe assembly according to claim 4, is characterized in that: described solid
The madial wall of reservation is provided with an intermediate step between inner roof wall and lower surface, thus the lower surface of holder, intermediate step and inner roof wall formed three grades step-like, and the height between intermediate step and inner roof wall equals the thickness of all current probe ring bodies, the diameter of inner roof wall equals the external diameter of current probe body.
6. Multi-point contact type shell fragment type probe assembly according to claim 5, is characterized in that: described many
This body diameter of individual current probe is identical and equal the external diameter of connecting portion on stacker.
7. the Multi-point contact type shell fragment type probe assembly according to claim 1 or 2 or 3 or 5 or 6, its
Be characterised in that: described shank is provided with flange, described guide pin bushing lower end abutment is in flange upper surface.
8. Multi-point contact type shell fragment type probe assembly according to claim 7, is characterized in that: described pin
Bar lower end is provided with screw thread and connects for a nut.
9. the Multi-point contact type shell fragment type probe assembly according to claim 1 or 2 or 3 or 5 or 6 or 8, is characterized in that: described voltage probe lower end is connected in shank by probe casing and insulating sheath.
CN201420777188.6U 2014-12-11 2014-12-11 A kind of Multi-point contact type shell fragment type probe assembly CN204287257U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201420777188.6U CN204287257U (en) 2014-12-11 2014-12-11 A kind of Multi-point contact type shell fragment type probe assembly

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201420777188.6U CN204287257U (en) 2014-12-11 2014-12-11 A kind of Multi-point contact type shell fragment type probe assembly

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CN204287257U true CN204287257U (en) 2015-04-22

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Cited By (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN105044406A (en) * 2015-08-28 2015-11-11 东莞市天元通金属科技有限公司 Current probe
CN105044405A (en) * 2015-08-26 2015-11-11 深圳市精实机电科技有限公司 Automatic positive-finding probe assembly
CN106207061A (en) * 2015-05-08 2016-12-07 毛广甫 Battery Quick Connect Kit
CN106468725A (en) * 2015-08-14 2017-03-01 致茂电子股份有限公司 Probe structure
CN108906669A (en) * 2018-07-17 2018-11-30 游诚琦 A kind of automatic sorting method of lithium cell
CN108940934A (en) * 2018-07-17 2018-12-07 游诚琦 A kind of lithium battery consistency sorting unit
CN108993934A (en) * 2018-07-17 2018-12-14 游诚琦 A kind of automatic fraction collector of lithium cell
CN109254180A (en) * 2017-07-13 2019-01-22 致茂电子(苏州)有限公司 Current probe and jig suitable for this current probe
CN109683000A (en) * 2017-10-18 2019-04-26 深圳市瑞能实业股份有限公司 High-current test probe
CN109713389A (en) * 2018-12-28 2019-05-03 蜂巢能源科技有限公司 Charging probe

Cited By (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN106207061A (en) * 2015-05-08 2016-12-07 毛广甫 Battery Quick Connect Kit
CN106468725A (en) * 2015-08-14 2017-03-01 致茂电子股份有限公司 Probe structure
CN105044405A (en) * 2015-08-26 2015-11-11 深圳市精实机电科技有限公司 Automatic positive-finding probe assembly
CN105044405B (en) * 2015-08-26 2017-11-17 深圳市精实机电科技有限公司 A kind of automatic capturing probe assembly
CN105044406A (en) * 2015-08-28 2015-11-11 东莞市天元通金属科技有限公司 Current probe
CN109254180A (en) * 2017-07-13 2019-01-22 致茂电子(苏州)有限公司 Current probe and jig suitable for this current probe
CN109683000A (en) * 2017-10-18 2019-04-26 深圳市瑞能实业股份有限公司 High-current test probe
CN108906669A (en) * 2018-07-17 2018-11-30 游诚琦 A kind of automatic sorting method of lithium cell
CN108940934A (en) * 2018-07-17 2018-12-07 游诚琦 A kind of lithium battery consistency sorting unit
CN108993934A (en) * 2018-07-17 2018-12-14 游诚琦 A kind of automatic fraction collector of lithium cell
CN108993934B (en) * 2018-07-17 2020-12-01 国网江苏省电力有限公司无锡供电分公司 Automatic sorting machine for lithium battery cores
CN109713389A (en) * 2018-12-28 2019-05-03 蜂巢能源科技有限公司 Charging probe

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