CN106092974A - Extraordinary edge filter transmittance graph high precision testing device and method - Google Patents

Extraordinary edge filter transmittance graph high precision testing device and method Download PDF

Info

Publication number
CN106092974A
CN106092974A CN201610375987.4A CN201610375987A CN106092974A CN 106092974 A CN106092974 A CN 106092974A CN 201610375987 A CN201610375987 A CN 201610375987A CN 106092974 A CN106092974 A CN 106092974A
Authority
CN
China
Prior art keywords
edge filter
laser
extraordinary
spectrum
high precision
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201610375987.4A
Other languages
Chinese (zh)
Inventor
马骏
陈帆
朱日宏
袁群
潘少华
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nanjing University of Science and Technology
Original Assignee
Nanjing University of Science and Technology
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nanjing University of Science and Technology filed Critical Nanjing University of Science and Technology
Priority to CN201610375987.4A priority Critical patent/CN106092974A/en
Publication of CN106092974A publication Critical patent/CN106092974A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/59Transmissivity

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)

Abstract

The invention discloses a kind of extraordinary edge filter transmittance graph high precision testing device and method, wide spectral laser device, collimating lens, extraordinary edge filter, condenser lens and the spectrogrph set gradually including common optical axis, all devices are the most contour relative to substrate, i.e. the most contour relative to optical table or instrument base.The laser beam that wide spectral laser device sends, first collimated collimated, then focused on focal point by condenser lens, the spectrum R of spectrometer measurement laser instrument1(λ), then special type edge filter is placed on turntable, inserts in light path, between collimating lens and condenser lens, rotate extraordinary edge filter, change laser light incident angle, measure the laser spectrum curve R under different incidence angles degree2(λ).Precision of the present invention is higher, can reach 0.02nm, and experimental provision is simple, and cost is relatively low.

Description

Extraordinary edge filter transmittance graph high precision testing device and method
Technical field
The present invention relates to spectral measurement and sharp combiner field, be specifically related to a kind of extraordinary edge filter transmittance graph High precision testing device and method.
Background technology
Along with the raising of the Performance And Reliability of optical fiber laser in recent years, the application of optical fiber laser has penetrated into respectively Individual ambit, defines a huge application network and covers.It is steady that optical fiber laser has efficiency height, good reliability, performance The advantages such as fixed, life-span length, are widely applied to Materialbearbeitung mit Laserlicht, laser intelligence process, laser biology and medical science, laser Printing, communication, laser chemistry, laser detection are led with metering, laser isotope separation, laser remanufacturing and national defense safety etc. Territory, is greatly promoted technology and the industry development in these fields.High-power semiconductor laser processing is as a kind of advanced manufacture Technology, has become as the national economy such as automobile, metallurgy, electronics, aviation, electrical equipment, machine-building and supports the irreplaceable skill of industry One of art, it is improving production rate, process automation, environmental nonpollution and the aspect such as reduce cost consumption has huge Advantage.Although it is 10kW that American I PG company the most successfully have developed First power in 2009, beam quality factor M2 < single mode fiber laser of 1.5, but due to accumulated heat and the existence of nonlinear effect, power to be developed is higher, M2The factor is still High-energy laser close to 1 also exists huge technical problem.Therefore to it is industrial and military to make laser preferably to meet Demand, swash combiner technology be directed initially into and conduct in-depth research.
Conventional conjunction bundle technology includes that the methods such as bundle, polarization coupling and spectrum beam combination are closed in coherently combined, space.Wherein light Spectrum closes bundle due to device simply, and the reasons such as conjunction bundle efficiency is high, low cost become present study hotspot.And extraordinary the cut-off filters Mating plate greatly, needs for this to carry out it as the key element of spectrum beam combination, its transmittance graph involutory bundle efficiency impact Accurately measure.Conventional measuring method uses spectrophotometer to measure filter transmission curve, but its wavelength resolution Rate is only capable of reaching 0.2nm, far from meeting actual demand.
Chinese patent CN201510941431.2 propose one " optical filter high accuracy transmitance test system and Method of testing ", use photomodulator and the mode of operation of lock-in amplifier, the high-acruracy survey absorbance of optical filter, but its Device is more complicated, and external condition disturbance is bigger.
Summary of the invention
It is an object of the invention to provide a kind of extraordinary edge filter transmittance graph high precision testing device and method, Certainty of measurement is high, and experimental provision is simple, low cost.
The technical solution realizing the object of the invention is: a kind of extraordinary edge filter transmittance graph high precision measurement Device, wide spectral laser device, collimating lens, extraordinary edge filter, condenser lens and the spectrum set gradually including common optical axis Instrument, all devices are the most contour relative to substrate, i.e. the most contour relative to optical table or instrument base.
The laser beam that wide spectral laser device sends, first collimated collimated, then focused on focal point, light by condenser lens The spectrum R of spectrometer Laser Measurement device1(λ), then special type edge filter is placed on turntable, inserts in light path, between collimation thoroughly Between mirror and condenser lens, rotate extraordinary edge filter, change laser light incident angle, measure the laser light under different incidence angles degree Spectral curve R2(λ)。
Described spectrogrph is placed in the focal point of condenser lens;Wide spectral laser device is positioned at the front focus of collimating lens.
The diameter D=25mm of described extraordinary edge filter, thickness is 6mm, and the plane of incidence is plane, plates cut film, with 2.5 ° of incident angles, absorbance is less than 2nm from the steepness of 0.1% to 99.9%;The plane of incidence and the rough surface of exit facet Degree: Ra=0.5nm;Transmission wavefront PV < λ/10 (λ=632.8nm;The depth of parallelism: 10 ";Damage threshold: continuous light 20MW/cm2, even Continuous action time > 10s, for 10ns width pulse: 0.1J/cm2;Edge is provided with protectiveness chamfering.
Described extraordinary edge filter is with 2.5 ° of angle of incidence, from air incidence, to wavelength between 1010nm's~1082nm Laser reflectivity is more than 99.99%, is 50% to visible reflectance;With 2.5 ° of angle incidences, from the plane of incidence to exit facet, to ripple The long laser absorbance between 1084~1100nm is more than 99.9%, is 50% to transmission of visible light.
Above-mentioned collimating lens and condenser lens all use double glued achromatic lens.
Described spectrometer wavelength resolution is 0.02nm, and wavelength repeatability is 0.005nm, measurement scope be 600~ 1700nm。
A kind of method of testing using extraordinary edge filter transmittance graph high precision testing device, method step is such as Under:
The wide spectral laser Shu Jinhang that wide spectral laser device sends is collimated and focuses on by step 1, use collimating lens;
Step 2, spectrogrph is placed in the focal point of condenser lens, measures the spectrum R of wide spectrum light source1(λ);
Step 3, special type edge filter is arranged between collimating lens and condenser lens, rotates extraordinary light cutoff filter Sheet, changes laser light incident angle, measures the laser spectrum curve R under different incidence angles degree2(λ);
Step 4, the curve of spectrum according to gained, the transmittance graph of extraordinary edge filter
In above-mentioned steps 2 and step 3, spectrogrph, during measuring, needs position before and after continuous mobility spectrum instrument probe, Guarantee that laser coupling efficiency reaches the highest, i.e. curve of spectrum peak value is the highest.
Compared with prior art, its remarkable advantage is the present invention: wide spectral laser device spectrum halfwidth used by the present invention For 45nm so that the measurement scope of experimental provision is relatively big, and used by device, spectrometer wavelength resolution is 0.02nm, and commonly uses simultaneously It is only 0.2nm in the spectrophotometric wavelength resolution measuring filter transmission curve, so experimental provision certainty of measurement Higher, and simple in construction, cost is relatively low.
Accompanying drawing explanation
Fig. 1 is the structural representation of special type edge filter transmittance graph high precision testing device of the present invention.
Fig. 2 is the flow chart of special type edge filter transmittance graph high precision measurement method of the present invention.
Fig. 3 is experimental result picture in the embodiment of the present invention 1.
Detailed description of the invention
Below in conjunction with the accompanying drawings the present invention is described in further detail.
In conjunction with Fig. 1, a kind of extraordinary edge filter transmittance graph high precision testing device, set gradually including common optical axis Wide spectral laser device 1, collimating lens 2, extraordinary edge filter 3, condenser lens 4 and spectrogrph 5, all devices are relative to base The end, is the most contour, i.e. the most contour relative to optical table or instrument base.
The laser beam that wide spectral laser device 1 sends, first collimated lens 2 collimate, then are focused on focus by condenser lens 4 Place, is then placed at the back focus of condenser lens 4 by spectrogrph probe, the spectrum R of Laser Measurement device 11(λ);Again special type is cut Only optical filter 3 is placed on turntable, inserts in light path, between collimating lens 2 and condenser lens 4, rotates extraordinary light cutoff filter Sheet 3, changes laser light incident angle, measures the laser spectrum curve R under different incidence angles degree2(λ)。
Described spectrogrph 5 is placed in the focal point of condenser lens 4;Wide spectral laser device 1 is positioned at the front focus of collimating lens 2 Place.
The diameter D=25mm of described extraordinary edge filter 3, thickness is 6mm, and the plane of incidence is plane, plates cut film, with 2.5 ° of incident angles, absorbance is less than 2nm from the steepness of 0.1% to 99.9%;The plane of incidence and the rough surface of exit facet Degree: Ra=0.5nm;Transmission wavefront PV < λ/10 (λ=632.8nm;The depth of parallelism: 10 ";Damage threshold: continuous light 20MW/cm2, even Continuous action time > 10s, for 10ns width pulse: 0.1J/cm2;Edge is provided with protectiveness chamfering.
Described extraordinary edge filter 3 is with 2.5 ° of angle of incidence, from air incidence, to wavelength between 1010nm's~1082nm Laser reflectivity is more than 99.99%, is 50% to visible reflectance;With 2.5 ° of angle incidences, from the plane of incidence to exit facet, to ripple The long laser absorbance between 1084~1100nm is more than 99.9%, is 50% to transmission of visible light.
Above-mentioned collimating lens 2 and condenser lens 4 all use double glued achromatic lens.
Described spectrogrph 5 wavelength resolution is 0.02nm, and wavelength repeatability is 0.005nm, measurement scope be 600~ 1700nm。
In conjunction with Fig. 2, a kind of method of testing using extraordinary edge filter transmittance graph high precision testing device, method Step is as follows:
Step 1, the wide spectral laser Shu Jinhang using collimating lens 2 to send wide spectral laser device 1 collimate and focus on.
Step 2, spectrogrph 5 is placed in the focal point of condenser lens 4, measures the spectrum R of wide spectrum light source1(λ)。
Step 3, special type edge filter 3 is arranged between collimating lens 2 and condenser lens 4, rotates special type cut-off filter Mating plate 3, changes laser light incident angle, measures the laser spectrum curve R under different incidence angles degree2(λ)。
Step 4, the curve of spectrum according to gained, the transmittance graph of extraordinary edge filter 3
In above-mentioned steps 2 and step 3, spectrogrph 5, during measuring, needs position before and after continuous mobility spectrum instrument 5 probe Put, it is ensured that laser coupling efficiency reaches the highest, i.e. curve of spectrum peak value is the highest.
Embodiment 1
A kind of extraordinary edge filter transmittance graph high precision testing device, the wide spectrum set gradually including common optical axis Laser instrument 1, collimating lens 2, extraordinary edge filter 3, condenser lens 4 and spectrogrph 5, all devices are coaxial etc. relative to substrate Height, i.e. the most contour relative to optical table or instrument base.
The laser beam that wide spectral laser device 1 sends, first collimated lens 2 collimate, then are focused on focus by condenser lens 4 Place, is then placed at the back focus of condenser lens 4 by spectrogrph probe, the spectrum R of Laser Measurement device 11(λ);Again special type is cut Only optical filter 3 is placed on turntable, inserts in light path, between collimating lens 2 and condenser lens 4, rotates extraordinary light cutoff filter Sheet 3, changes laser light incident angle, measures the laser spectrum curve R under different incidence angles degree2(λ)。
Described spectrogrph 5 is placed in the focal point of condenser lens 4;Wide spectral laser device 1 is positioned at the front focus of collimating lens 2 Place.
A kind of method of testing using extraordinary edge filter transmittance graph high precision testing device, method step is such as Under:
Step 1, the wide spectral laser Shu Jinhang using collimating lens 2 to send wide spectral laser device 1 collimate and focus on.
Step 2, spectrogrph 5 is placed in the focal point of condenser lens 4, measures the spectrum R of wide spectrum light source1(λ)。
Step 3, special type edge filter 3 is arranged between collimating lens 2 and condenser lens 4, rotates special type cut-off filter Mating plate 3, changes laser light incident angle, measures the laser spectrum curve R under different incidence angles degree2(λ)。
Step 4, the curve of spectrum according to gained, the transmittance graph of extraordinary edge filter 3
Experimental result is as it is shown on figure 3, it is that the optical filter under 1.5 °, 2.5 ° and 5.5 ° is saturating that the present invention measures angle of incidence respectively Penetrate rate curve, as seen from the figure filter transmission from 0.1% to 99.9% steepness be 1.4nm, this refers to filter designs Mark is consistent, and along with the increase of incident angle, filter transmission curve can move to shortwave direction.Can by this experimental result Knowing, this measurement device precision is high, and result is accurate.

Claims (8)

1. an extraordinary edge filter transmittance graph high precision testing device, it is characterised in that: include that common optical axis sets successively Wide spectral laser device (1), collimating lens (2), extraordinary edge filter (3), condenser lens (4) and the spectrogrph (5) put, all Device is the most contour relative to substrate, i.e. the most contour relative to optical table or instrument base;
The laser beam that wide spectral laser device (1) sends, first collimated lens (2) collimation, then focused on focus by condenser lens (4) Place, the spectrum R of spectrogrph (5) Laser Measurement device (1)1(λ), then special type edge filter (3) is placed on turntable, inserts light path In, between collimating lens (2) and condenser lens (4), rotate extraordinary edge filter (3), change laser light incident angle, measure Laser spectrum curve R under different incidence angles degree2(λ)。
Extraordinary edge filter transmittance graph high precision testing device the most according to claim 1, it is characterised in that: institute State spectrogrph (5) and be placed in the focal point of condenser lens (4);Wide spectral laser device (1) is positioned at the front focus of collimating lens (2).
Extraordinary edge filter transmittance graph high precision testing device the most according to claim 1, it is characterised in that: institute Stating the diameter D=25mm of extraordinary edge filter (3), thickness is 6mm, and the plane of incidence is plane, plates cut film, with 2.5 ° of angle of incidence Incidence, absorbance is less than 2nm from the steepness of 0.1% to 99.9%;The plane of incidence and the surface roughness of exit facet: Ra= 0.5nm;Transmission wavefront PV < λ/10 (λ=632.8nm;The depth of parallelism: 10 ";Damage threshold: continuous light 20MW/cm2, continuous action Time > 10s, for 10ns width pulse: 0.1J/cm2;Edge is provided with protectiveness chamfering.
Extraordinary edge filter transmittance graph high precision testing device the most according to claim 3, it is characterised in that: institute State extraordinary edge filter (3) with 2.5 ° of angle of incidence, from air incidence, to wavelength between the laser-bounce of 1010nm~1082nm Rate is more than 99.99%, is 50% to visible reflectance;With 2.5 ° of angle incidences, from the plane of incidence to exit facet, to wavelength between The laser absorbance of 1084~1100nm is more than 99.9%, is 50% to transmission of visible light.
Extraordinary edge filter transmittance graph high precision testing device the most according to claim 1, it is characterised in that on: State collimating lens (2) and condenser lens (4) all uses double glued achromatic lens.
Extraordinary edge filter transmittance graph high precision testing device the most according to claim 1, it is characterised in that: institute Stating spectrogrph (5) wavelength resolution is 0.02nm, and wavelength repeatability is 0.005nm, and measurement scope is 600~1700nm.
7. the test side using extraordinary edge filter transmittance graph high precision testing device as claimed in claim 1 Method, it is characterised in that method step is as follows:
Step 1, the wide spectral laser Shu Jinhang using collimating lens (2) to send width spectral laser device (1) collimate and focus on;
Step 2, spectrogrph (5) is placed in the focal point of condenser lens (4), measures the spectrum R of wide spectrum light source1(λ);
Step 3, special type edge filter (3) is arranged between collimating lens (2) and condenser lens (4), rotates special type cut-off Optical filter (3), changes laser light incident angle, measures the laser spectrum curve R under different incidence angles degree2(λ);
Step 4, the curve of spectrum according to gained, the transmittance graph of extraordinary edge filter (3)
The test side using extraordinary edge filter transmittance graph high precision testing device the most according to claim 7 Method, it is characterised in that: in above-mentioned steps 2 and step 3, spectrogrph (5), during measuring, needs continuous mobility spectrum instrument (5) to visit Position before and after Tou, it is ensured that laser coupling efficiency reaches the highest, i.e. curve of spectrum peak value is the highest.
CN201610375987.4A 2016-05-31 2016-05-31 Extraordinary edge filter transmittance graph high precision testing device and method Pending CN106092974A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN201610375987.4A CN106092974A (en) 2016-05-31 2016-05-31 Extraordinary edge filter transmittance graph high precision testing device and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN201610375987.4A CN106092974A (en) 2016-05-31 2016-05-31 Extraordinary edge filter transmittance graph high precision testing device and method

Publications (1)

Publication Number Publication Date
CN106092974A true CN106092974A (en) 2016-11-09

Family

ID=57230440

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201610375987.4A Pending CN106092974A (en) 2016-05-31 2016-05-31 Extraordinary edge filter transmittance graph high precision testing device and method

Country Status (1)

Country Link
CN (1) CN106092974A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110108449A (en) * 2019-06-26 2019-08-09 深圳市楠轩光电科技有限公司 A kind of optics module test macro and method
CN111076901A (en) * 2019-12-12 2020-04-28 河北汉光重工有限责任公司 Device for measuring influence of light incidence angle on performance of optical filter

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1259159A1 (en) * 1985-05-05 1986-09-23 Предприятие П/Я Р-6681 Method of determining interference filter transmissivity
US5572500A (en) * 1993-11-17 1996-11-05 Pioneer Electronic Corporation Optical filter with light transmittance dependency on incident angle
CN1570586A (en) * 2004-04-30 2005-01-26 宁波大学 Automatic detecting device for spike filter
CN104180901A (en) * 2014-08-15 2014-12-03 中国科学院上海技术物理研究所 Transmittance spectrum measurement device and method for ultra-narrow band filter
CN105115907A (en) * 2015-08-17 2015-12-02 中国科学院等离子体物理研究所 Measuring device for optical filter spectrum transmittance
CN105372042A (en) * 2015-12-16 2016-03-02 北方夜视技术股份有限公司 Optical filter high precision transmittance testing device

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU1259159A1 (en) * 1985-05-05 1986-09-23 Предприятие П/Я Р-6681 Method of determining interference filter transmissivity
US5572500A (en) * 1993-11-17 1996-11-05 Pioneer Electronic Corporation Optical filter with light transmittance dependency on incident angle
CN1570586A (en) * 2004-04-30 2005-01-26 宁波大学 Automatic detecting device for spike filter
CN104180901A (en) * 2014-08-15 2014-12-03 中国科学院上海技术物理研究所 Transmittance spectrum measurement device and method for ultra-narrow band filter
CN105115907A (en) * 2015-08-17 2015-12-02 中国科学院等离子体物理研究所 Measuring device for optical filter spectrum transmittance
CN105372042A (en) * 2015-12-16 2016-03-02 北方夜视技术股份有限公司 Optical filter high precision transmittance testing device

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
李永强等: "超窄带滤光片光谱特性测试与修正", 《航天返回与遥感》 *

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110108449A (en) * 2019-06-26 2019-08-09 深圳市楠轩光电科技有限公司 A kind of optics module test macro and method
CN110108449B (en) * 2019-06-26 2022-05-10 深圳市楠轩光电科技有限公司 Optical module testing system and method
CN111076901A (en) * 2019-12-12 2020-04-28 河北汉光重工有限责任公司 Device for measuring influence of light incidence angle on performance of optical filter

Similar Documents

Publication Publication Date Title
CN106546533B (en) Equipment for collecting surface enhanced Raman scattering spectrum by using full-aperture angle parabolic mirror
CN108981579B (en) Spectrum confocal measurement system and method for large-range measurement
CN107356407B (en) Device for synchronously measuring power, spectrum and beam quality of high-power fiber laser
Kumar et al. Stand-off detection of solid targets with diffuse reflection spectroscopy using a high-power mid-infrared supercontinuum source
EP2472251B1 (en) Apparatus for measuring transmissivity of patterned glass
CN103219638A (en) Super-continuum spectrum light source and coherent anti Stokes Raman scattering imaging system
CN108287059B (en) High-precision near-infrared laser beam quality measurement and analysis device
Sytcevich et al. Characterizing ultrashort laser pulses with second harmonic dispersion scans
He et al. High-spectral-resolution characterization of broadband high-efficiency reflection gratings
CN104568765A (en) Miniature spectroscopic ellipsometer device and measuring method
Lilienfein et al. Enhancement cavities for few-cycle pulses
CN103913235A (en) Spatial modulation Fourier transform infrared spectrometer based on MOEMS technology
CN106092974A (en) Extraordinary edge filter transmittance graph high precision testing device and method
CN103884659B (en) Angular resolution micro-nano spectral analysis device
US10458917B2 (en) Method of measuring Raman scattering and related spectrometers and laser sources
CN108287058A (en) Correct superpower laser M2The device and method of measuring system thermal deformation
CN103018214A (en) Reflection type optical path transient state absorption spectrometer
US7929131B2 (en) Highly compact design for raman spectrometry
CN104034435A (en) Gauss beam parameter measuring method
Aubourg et al. 1617 nm emission control of an Er: YAG laser by a corrugated single-layer resonant grating mirror
CN103779784B (en) A kind of semiconductor laser for raman spectroscopy measurement
CN216771491U (en) Polarization resolution second harmonic testing device
CN203824653U (en) Femtosecond laser pulse width measuring instrument based on molecular ionization detection
CN106969835B (en) A kind of removing method of two level and Advanced Diffraction spectrum applied to spectral instrument
Ahmido et al. Femtosecond laser-induced breakdown spectroscopy of surface nitrate chemicals

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication
RJ01 Rejection of invention patent application after publication

Application publication date: 20161109