CN106033062A - Automatic dimming method for optical detection and optical detection machine platform thereof - Google Patents
Automatic dimming method for optical detection and optical detection machine platform thereof Download PDFInfo
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Abstract
The invention discloses an automatic dimming method for optical detection and an optical detection machine thereof, wherein an irradiation light source is automatically adjusted among different types of circuit boards to be detected, the intensity of the irradiation light is adjusted through setting each dimming area and the corresponding type on the circuit board to be detected, based on image data which is captured under each irradiation configuration and corresponds to one of at least one dimming area and based on comparison with pre-stored brightness threshold value standard data of the dimming area of the selected type, and then the corresponding brightness difference degree is obtained according to the brightness value of the image data between any two types of dimming areas captured under the configuration that lateral irradiation light and forward irradiation light are simultaneously irradiated, and a new irradiation light adjustment configuration is selected. Therefore, the invention can automatically optimize the configuration of the irradiation light source, so that the detected circuit board can be detected under the uniform condition.
Description
Technical field
The present invention relates to a kind of automatic light modulating method for optical detection and optical detection board thereof, especially
Relate to the automatic tune of a kind of Automatic Optimal that different types of circuit board under test can be irradiated light source configuration
Light method and use the optical detection board of this automatic light modulating method.
Background technology
The automatic optics inspection (AOI) detection on soft or rigid circuit board plays very important angle
Color.For example, in the manufacture process of various circuit boards, all must be through accurate automatic optics inspection
To distinguish the quality of circuit board, carry out the management and control of quality.
Automatic optics inspection is carried out by the running of optical detection board, during detection, shines with light
It is incident upon on circuit board, then carries out sentencing of flaw by camera head acquisition circuitry plate image after illuminated
Disconnected, the most therefore, the source mass that the illuminator on optical detection board is provided just has in detection
Considerable influence, the best once source mass or different from the configuration previously used, testing result is just
The instability of result misalignment or product quality can be caused because of the skew of detection data.
Traditionally, irradiation configuration (the strong and weak control of the most each irradiation light of the light supply apparatus on optical detection board
System) it is all by artificial the most rule of thumb rule or directly to apply mechanically the irradiation configuration of similar circuit plate and carry out,
But, so set the process control not only without homogenization, more likely cause because of artificial careless mistake
The generation of defective products, needs once the numerous types of circuit board under test constantly to change accordingly to irradiate configuration,
Adjust the most time-consuming by artificial setting one by one and the examination criteria between each board also cannot be made to uniform,
Such shortcoming often results in and is unable to maintain that stable product quality by the product of detection.
Summary of the invention
It is an object of the present invention to maintain stable circuit board inspection quality.
Another object of the present invention is to automatically various types of circuit boards to be carried out light source irradiate configuration from
Dynamic light modulation.
For reaching above-mentioned purpose and other purposes, the present invention proposes a kind of side with an automatic light meter for optical detection
Method, is irradiated the automatic adjustment of light source between different types of circuit board under test for optical detection board,
Comprise: capture the image data on the circuit board under test after changing kind；Light modulation zone enactment steps, root
According to this image data to set at least one light modulation region and the type of correspondence, the type bag in this light modulation region
Containing at least two in metal types, literal type and welding resisting layer type these three；Carry out dimming step,
Irradiate under light and the lateral irradiation irradiating two kinds of configurations that light irradiates light with forward, with selected by lateral
A kind of type dimming region on the basis of, and irradiate selected by configuration captured instantly based on each
Determine the image data in type light modulation region and based on the brightness with the pre-stored in institute's selection type light modulation region
Under the comparison of threshold value normal data, adjust the power irradiating light, shine with forward further according to the lateral light that irradiates
Penetrate the brightness dimming interregional image data of wantonly two types captured under this configuration that light irradiates simultaneously
Value, obtains corresponding luminance difference degree, and the selected light that irradiates adjusts configuration；And store this irradiation light tune
Whole configuration, for the carrying out of the detection of same kind circuit board.
In one embodiment of the invention, comprise in this light modulation step: carry out sidelight set-up procedure, it is provided that side
Laterally irradiating light to this circuit board under test incident, the adjustment of its initial exposure rate is in institute's selection type
Light modulation region in, adjust that to reach first object to the brightness value of image in institute's pick-up image instantly interval
In value, to obtain the setting value of lit sideways configuration；Carry out positive light set-up procedure, shine maintaining this sidelight
Under the irradiation of the setting value penetrating configuration, the forward also providing for this circuit board under test of forward entrance irradiates light, should
Adjusting in the light modulation region of institute's selection type of the initial exposure rate of forward irradiation light, adjusts to working as
Brightness value of image in lower institute pick-up image reaches in the second target interval value, to obtain the most positive illumination
Penetrate the setting value of configuration, and under the setting value that this lit sideways configuration and this most positive light irradiate configuration,
Capture the brightness value dimming interregional image data of wantonly two types, obtain corresponding luminance difference degree；
And carry out the positive light set-up procedure of second time, under maintaining the irradiation of setting value of this lit sideways configuration,
Also adjust this forward and irradiate light to provide the forward of the setting value higher than this first time positive light irradiation configuration to irradiate
Light, adjusting further in the light modulation region of institute's selection type of this forward irradiation light, adjust to instantly
Brightness value of image in institute's pick-up image reaches in the 3rd target interval value, to obtain second time positive light irradiation
The setting value of configuration, and under the setting value that this lit sideways configuration light positive with this second time irradiates configuration,
Capture the brightness value dimming interregional image data of wantonly two types, obtain corresponding luminance difference degree,
Configuration is adjusted with this irradiation light selected.
In one embodiment of the invention, in this light modulation step, after the positive light set-up procedure of second time and in
Before this irradiation light selected adjusts configuration, also comprise: close all irradiation configurations；Carry out second and take turns sidelight tune
Synchronizing is rapid, it is provided that this circuit board under test lateral incident laterally irradiate light, the tune of its initial exposure rate
Whole in the light modulation region of institute's selection type, adjust to the brightness value of image in institute's pick-up image instantly and reach
Take turns in first object interval value to second, to obtain the second setting value taking turns lit sideways configuration；Carry out
Two take turns positive light set-up procedure, under the irradiation maintaining this second setting value taking turns lit sideways configuration, also carry
Forward for this circuit board under test of forward entrance irradiates light, and this forward irradiates the tune of the initial exposure rate of light
Whole in the light modulation region of institute's selection type, adjust to the brightness value of image in institute's pick-up image instantly and reach
Take turns in the second target interval value to second, to obtain the second setting value taking turns the most positive light irradiation configuration,
And second take turns lit sideways configuration at this and second take turns under setting value that for the first time positive light irradiates configuration with this, pick
Take the brightness value dimming interregional image data of wantonly two types, obtain corresponding luminance difference degree；
And carry out second and take turns the positive light set-up procedure of second time, second take turns setting of lit sideways configuration maintaining this
Under the irradiation of definite value, also adjust this forward and irradiate light and second take turns for the first time positive light irradiation group to provide higher than this
The forward of the setting value of state irradiates light, adjusting further in the light modulation of institute's selection type of this forward irradiation light
In region, adjust and reach second to the brightness value of image in institute's pick-up image instantly and take turns the 3rd target interval
In value, take turns the positive light of second time and irradiate the setting value of configuration obtaining second, and this lit sideways configuration with
This second is taken turns under the setting value that the positive light of second time irradiates configuration, and captures wantonly two types dims interregional shadow
As the brightness value of data, obtain corresponding luminance difference degree, adjust configuration with this irradiation light selected, its
In, this second greatest measure taking turns first object interval value is more than the greatest measure of this first object interval value,
This second takes turns the second target interval value equal to this second target interval value, and this second takes turns the 3rd target interval value
Equal to the 3rd target interval value.
In one embodiment of the invention, the type in this light modulation region is metal types, literal type, anti-welding
The clear zone type of layer and the dark space type these four of welding resisting layer, and the step of configuration is adjusted in this irradiation light selected
In Zhou, irradiate the setting value of configuration, this lit sideways group from this lit sideways configuration with this most positive light
The positive light of state and this second time irradiate configuration setting value, this second take turns lit sideways configuration and this second takes turns the
Once positive light irradiates the setting value of configuration, this second takes turns lit sideways configuration and second take turns the positive light of second time with this
Irradiate the setting value of configuration, these four judging, one adjusts configuration as this irradiation light, wherein, it is determined that
The priority of rule is carried out in the following order, begins to enter next rule when the result of difference degree is identical
Judge, be this irradiation light with the configuration setting that difference degree is big when the result difference of difference degree
Adjust configuration；The first, the luminance difference degree between the clear zone type of welding resisting layer and the dark space type of welding resisting layer；
The second, the luminance difference degree between metal types and literal type；3rd, welding resisting layer clear zone type and
Luminance difference degree between the maximum of the dark space type of welding resisting layer and literal type；And the 4th, metal
Luminance difference degree between the maximum of the clear zone type of type and welding resisting layer and the dark space type of welding resisting layer.
In one embodiment of the invention, the type in this light modulation region selected is this metal types, at base
In each irradiate that configuration captured instantly at least one dimming the shadow of one of them in region
As data and based on the ratio with the brightness threshold value normal data of the pre-stored in institute's selection type light modulation region
In step under relatively, compare with the image data of the red light wavelength section in this image data.
In one embodiment of the invention, in this light modulation zone enactment steps, delimitation based on user comes
Set this at least one light modulation region and type of correspondence thereof.
For reaching above-mentioned purpose and other purposes, the present invention also proposes a kind of optical detection board, comprises irradiation
Light sources, shooting group and control group, this control group controls the light intensity of this radiation source group and adjusts and receive
The image data that this shooting group is captured, in this optical detection board between different types of circuit board under test
Being irradiated when automatically adjusting of light source, this control group running performs foregoing automatic light modulating method.
Thus, the present invention adds positive light both by the type set in each light modulation region and sidelight, sidelight
Irradiate configuration sequentially irradiates the light modulation process carrying out correspondence, not only makes optics disclosed in the present application examine
Survey board and different types of circuit board under test can be irradiated the Automatic Optimal of light source configuration, more make to be subject to
Inspection circuit board all can be detected under conditions of homogenization, so can the quality of holding circuit plate homogeneous.
Accompanying drawing explanation
Fig. 1 is the flow chart of the automatic light modulating method in one embodiment of the invention.
Fig. 2 is the schematic diagram of the optical detection board in one embodiment of the invention.
Fig. 3 a is the flow chart of the automatic light modulating method in another embodiment of the present invention.
Fig. 3 b is the flow chart of the automatic light modulating method in yet another embodiment of the invention.
Critical piece reference:
100 control groups
201 laterally irradiate radiant
220 laterally irradiate light
203 forwards irradiate radiant
300 shooting groups
500 circuit board under test
S100～S400 step
Detailed description of the invention
For being fully understood by the purpose of the present invention, feature and technique effect, hereby by following specific embodiment, and
In conjunction with accompanying drawing, the present invention is elaborated, is described as follows:
First refer to the flow process that Fig. 1 and Fig. 2, Fig. 1 are the automatic light modulating method in one embodiment of the invention
Figure, Fig. 2 is the schematic diagram of the optical detection board in one embodiment of the invention.
Optical detection board comprises radiation source group and (comprises lateral irradiation radiant 201 and forward irradiates light
Light source 203), shooting group 300 and control group 100.This control group 100 connects this shooting group 300 and is somebody's turn to do
Radiation source group (not shown), to control the light intensity adjustment of this radiation source group and to receive this shooting group
300 image datas captured, enter between different types of circuit board under test 500 in this optical detection board
When automatically adjusting of row radiation source, this control group 100 can operate perform disclosed in this invention automatically
Light-dimming method.Wherein, the forward irradiation radiant 203 shown in Fig. 2 can be based on lateral with two in operation
The configuration relation irradiating radiant 201 in the same plane avoids covering the shooting model of shooting group 300
Enclose.
Automatic light modulating method in one embodiment of the invention is the most first to the circuit board under test after replacing kind
Pick-up image data, for light modulation region and the setting of corresponding types thereof, wherein light modulation region and correspondence thereof
The setting of type can be delimited light modulation region and the type of its correspondence selected voluntarily by user, or by this control
Processed group 100 according to all types of image features having on the image data captured before light modulation and circuit board
(such as: reflective on metallic circuit can have the highest brightness under the image of red light wavelength section) comes automatically
Pick out the light modulation region under corresponding all kinds on circuit board, and can select the quality of image preferably district
Territory is for the carrying out of follow-up light modulation flow process.The follow-up embodiment of the present invention is in the way of user is manually chosen
As example.
As it is shown in figure 1, the automatic light modulating method in one embodiment of the invention performs as follows:
First step S100, it is determined whether receive the replacing instruction of the detection carrying out variety classes circuit board,
When "Yes", enter next step S200, when "No", enter next step S101 and remain current
Irradiation configuration.
Then step S200, receives each class dimming region on the circuit board under test after changing circuit board type
Type sets.The various kenels that the most so-called type set has according to circuit board surface define, citing
For comprise: as the metal types of wire, the literal type printed by word and shades of colour welding resisting layer
Welding resisting layer type.It is, in general, that the metallic circuit being formed on circuit board has by organic anti-welding dose of coating
, (OSP) also have the most tin plating or formed in chemical nickel and gold mode；The word printed on circuit board
There are white, black or its allochromatic colour etc.；Welding resisting layer is then to have green, blue, white, red etc. color.Operator
After replacing is intended to carry out circuit board with an automatic light meter, the image data captured by this shooting group 300,
It is shown in the screen (not shown) of this control group 100, then by the input interface of this control group 100
(such as: mouse, keyboard etc.) carrys out frame choosing towing and delimit out each light modulation region that need to carry out dimming, so that
These light modulation regions are set in this control group 100, and carry out setting of these types dimming regions
Fixed (metal types described above, literal type or welding resisting layer type).
Wherein, the setting of light modulation region and type thereof at least selects two groups, i.e. metal types, word class
At least two in type and welding resisting layer type these three, for the carrying out of light modulation step.For example, anti-
Layer type can be divided into the most again the clear zone type (having metallic circuit layer below welding resisting layer) of welding resisting layer and prevent
The dark space type (not having metallic circuit layer below welding resisting layer) of layer, therefore, light modulation step is i.e. intended to make
Image data between at least two can be understood identification, that is image data is in difference light modulation region class
Must be able to detected system area under brightness value between type desired value based on acquiescence branch away, and then make tune
The benchmark of light is consistent, all can be detected under conditions of homogenization by inspection circuit board.Additionally, citing
For, general electric circuit inspection generally has at least use metal types to set with welding resisting layer type,
Because the detection of circuit board is typically to want configure correctly for metallic circuit, and system to be allowed understands and picks out
Metallic circuit on circuit board just depends on region (usually welding resisting layer type) and the metal on metallic circuit side
The image difference degree of circuit, difference is the biggest to be more easily discernible.So above are only example, be not one
Planting and limit, the detection of circuit board also may set for other types, all without departing from the model of the present invention
Farmland.
Then step S300, carries out dimming step.This step laterally irradiates light by the simple of the first,
And the lateral light that irradiates of the second irradiates light collocation with forward, under the irradiation of both configurations, to select
On the basis of fixed a kind of type dimming region (usually metal types, illustrate with metal types below)
Carry out.Namely be based on each light modulation region irradiating the corresponding metal types that configuration is captured instantly
Image data, carry out according to the brightness threshold value normal data of pre-stored in metal types light modulation region
Light modulation.In other words, be i.e. with under the comparison of brightness threshold value normal data, in default adjusting range
Adjust the power irradiating light.Then irradiate, with forward, this configuration that light irradiates simultaneously further according to the lateral light that irradiates
The image data that the light modulation of lower captured wantonly two types (such as metal types and welding resisting layer type) is interregional
Brightness value, obtain corresponding luminance difference degree, a selected irradiation light adjusts configuration..
For example, for the light modulation region of metal types, clearly recognizable in institute to be made pick-up image
Go out metallic circuit it is necessary to the minimum intensity of light angle value of metallic reflection light in making this region is higher than other types
Light modulation region maximum reflection light intensity value, preferably using red light wavelength section as Rule of judgment.Illustrate again
For, white text can clearly be identified from welding resisting layer then will be with when the green welding resisting layer of collocation
The light intensity value of blue wave band is inspected, will be with the light intensity value of green light band when the blue welding resisting layer of collocation
Inspect, to inspect with the light intensity value of green glow (preferentially) or blue wave band during the red welding resisting layer of collocation；
Can clearly be identified from welding resisting layer by black letters then will be with green glow when the green welding resisting layer of collocation
The light intensity value of (preferentially) or blue wave band is inspected, will be with blue wave band when the blue welding resisting layer of collocation
Light intensity value inspect, will be with green glow (preferentially) or the light intensity of blue wave band during the red welding resisting layer of collocation
Angle value is inspected.
Then step S400, stores this irradiation light and adjusts configuration, for the carrying out of same kind circuit board detecting.
Accordingly, the with an automatic light meter of the present invention is i.e. to irradiate the various of configuration at lit sideways configuration and positive light to take
Under the setting value joined, choose situation (the i.e. phase that the interregional luminance difference degree of dissimilar light modulation is maximum
The maximum absolute value of the numerical value of difference) decision irradiation light adjustment configuration of getting off.
Then refer to Fig. 3 a, it is the flow chart of the automatic light modulating method in another embodiment of the present invention.
The present invention is the main project of circuit board detecting based on metallic circuit, under carrying out in light modulation step further
State step and obtain the irradiation light adjustment configuration pick-up image of metallic circuit preferably can changed.
First, without first carrying out sidelight set-up procedure S301 on the premise of irradiating light, it is provided that lateral incidence should
The lateral of circuit board under test irradiates light 220, adjusting in the tune of institute's selection type of its initial exposure rate
In light region (such as metal types), adjust the lateral light that irradiates to the image in institute's pick-up image instantly
In brightness value reaches first object interval value, (for metal types, the citing of this first object interval value comes
Say can be 120～140, this numerical value by range of luminance values as a example by 0～255), to obtain a lit sideways
The setting value (the most laterally irradiating light to meet the above controlled output valve of condition) of configuration.
Then positive light set-up procedure S302 is carried out, under maintaining the irradiation of setting value of this lit sideways configuration,
The forward also providing for this circuit board under test of forward entrance irradiates light, and this forward irradiates the initial exposure rate of light
Adjust in the light modulation region of institute's selection type, adjust to the image brilliance in institute's pick-up image instantly
Value reaches in the second target interval value that (for metal types, this second target interval value for example may be used
Being 160～180, this numerical value is by range of luminance values as a example by 0～255, and this numerical value refers to lit sideways and positive light
Numerical value acquired under superposition under Zhao Sheing), to obtain the setting value of the most positive light irradiation configuration (i.e.
Forward irradiates light to meet the above controlled output valve of condition), and in this lit sideways configuration and
This most positive light irradiates under the setting value of configuration, captures the image data that the light modulation of wantonly two types is interregional
Brightness value, obtain corresponding luminance difference degree.
I.e. find the one group of positive light setting value with sidelight using as this irradiation light adjustment group after above-mentioned two steps
State.But the most as shown in Figure 3 a, comprise further: positive light second time set-up procedure S303, in dimension
Under the irradiation of the setting value holding this lit sideways configuration, then adjust this forward irradiate light with provide higher than this
Once the forward of the setting value that positive light irradiates configuration irradiates light, adjusting further in institute of this forward irradiation light
In the light modulation region of selection type, adjust to the brightness value of image in institute's pick-up image instantly and reach the 3rd
In target interval value (for metal types, this second target interval value for example can be 180～200,
This numerical value is by range of luminance values as a example by 0～255, and this numerical value refers to the superposition under lit sideways and positive light irradiation
Lower acquired numerical value), the setting value of configuration is irradiated with the positive light of acquirement second time, and at this lit sideways
Configuration light positive with this second time irradiates under the setting value of configuration, captures the shadow that the light modulation of wantonly two types is interregional
As the brightness value of data, obtain corresponding luminance difference degree.
In this irradiation light selected adjusts the program of configuration, for example, the type in this light modulation region is gold
Belong to type, literal type, the clear zone type of welding resisting layer and the dark space type these four of welding resisting layer, in selected
This irradiation light adjusts in the step of configuration, irradiates configuration from this lit sideways configuration with this most positive light
Setting value, this lit sideways configuration light positive with this second time irradiates the setting value of configuration, judges in the two
One adjusts configuration as this irradiation light, wherein, it is determined that the priority of rule is carried out in the following order, in
Begin to enter next rule when the result of difference degree is identical to judge, different in the result of difference degree
Time with the configuration setting that difference degree is big be this irradiation light adjust configuration；
The first, the luminance difference degree between the clear zone type of welding resisting layer and the dark space type of welding resisting layer；
The second, the luminance difference degree between metal types and literal type；
3rd, between the maximum of the dark space type of the clear zone type of welding resisting layer and welding resisting layer and literal type
Luminance difference degree；And
Between the maximum of the clear zone type of the 4th, metal types and welding resisting layer and the dark space type of welding resisting layer
Luminance difference degree.
For example, when this lit sideways configuration is irradiated under the setting value of configuration with this most positive light,
Numerical value under first rule specification is 10；When this lit sideways configuration light positive with this second time irradiates configuration
Under setting value, the numerical value under the first rule specification is also 10, i.e. the two is the most identical (or difference is in necessarily
In the range of), now enter Second Rule and judge.When this lit sideways configuration and this most positive illumination
Penetrating under the setting value of configuration, the numerical value under Second Rule specification is 32；When this lit sideways configuration with should
The positive light of second time irradiates under the setting value of configuration, and the numerical value under Second Rule specification is also 30, i.e. has one
The greater occurs, accordingly, this irradiation light adjust configuration be i.e. be chosen to be " this lit sideways configuration with this
Once positive light irradiates the setting value of configuration ", i.e. it is this irradiation light with the configuration setting that difference degree is big
Adjust configuration.
Then refer to Fig. 3 b, it is the flow chart of the automatic light modulating method in yet another embodiment of the invention.
The step of hookup 3a, then perform the second light modulation step taken turns, and in this positive light second time set-up procedure
Adjust (step S400) before configuration is recorded after S303 and in this irradiation light, also comprise:
Step S310, close all irradiation configurations；
Step S311, carry out second and take turns sidelight set-up procedure, it is provided that the side of lateral this circuit board under test incident
To irradiating light, adjusting in the light modulation region of institute's selection type of its initial exposure rate, adjust to
Instantly the brightness value of image in institute's pick-up image reaches second and takes turns in first object interval value and this second takes turns the
The greatest measure of one target interval value (is come with metal types more than the greatest measure of this first object interval value
Saying, second to take turns first object interval value can be for example 140～160 for this, and this numerical value is with range of luminance values
As a example by 0～255, this numerical value refers to numerical value acquired under the superposition under lit sideways and positive light irradiation),
To obtain the second setting value taking turns lit sideways configuration.
Step S312, carry out second and take turns for the first time positive light set-up procedure, second take turns lit sideways maintaining this
Under the irradiation of the setting value of configuration, (i.e. this second takes turns the second target interval value equal to this second target interval
Value), the forward reoffering this circuit board under test of forward entrance irradiates light, and this forward irradiates the initial photograph of light
Penetrate the adjusting in the light modulation region of institute's selection type of intensity, adjust to the shadow in institute's pick-up image instantly
Image brightness value reach second take turns the second target interval value in (for metal types, this second takes turns the second mesh
Mark interval value for example can be 160～180, and this numerical value is by range of luminance values as a example by 0～255, and this counts
Value refers to that lit sideways and positive light irradiate numerical value acquired under lower superposition), take turns first time obtaining second
Positive light irradiates the setting value of configuration, and second takes turns lit sideways configuration at this and second take turns the most positive light with this
Irradiate under the setting value of configuration, capture the brightness value dimming interregional image data of wantonly two types, take
Obtain corresponding luminance difference degree.
Step S313, carry out second and take turns the positive light set-up procedure of second time, second take turns sidelight maintaining this and shine
Under the irradiation of the setting value penetrating configuration, (i.e. this second takes turns the 3rd target interval value equal to the 3rd target interval
Value), then adjust this forward and irradiate light and higher than this to provide second take turns for the first time positive light and irradiate the setting of configuration
Value forward irradiate light, this forward irradiate light adjust further in the light modulation region of institute's selection type,
Adjust to the brightness value of image in institute's pick-up image instantly reach second to take turns in the 3rd target interval value (with
For metal types, second to take turns the 3rd target interval value for example can be 180～200 for this, this numerical value with
Range of luminance values is as a example by 0～255, and this numerical value refers under the superposition under lit sideways and positive light irradiation acquired
Numerical value), take turns the positive light of second time and irradiate the setting value of configuration obtaining second, and in this lit sideways group
State second is taken turns under the setting value that the positive light of second time irradiates configuration with this, and the light modulation capturing wantonly two types is interregional
The brightness value of image data, obtain corresponding luminance difference degree.
Wherein, this second takes turns greatest measure of first object interval value more than this first object interval value
Big numerical value, this second greatest measure taking turns the second target interval value second can take turns the second mesh equal to or more than this
The greatest measure of mark interval value, this second greatest measure taking turns the 3rd target interval value can be equal to or more than being somebody's turn to do
Second greatest measure taking turns the 3rd target interval value.It is preferred that this second takes turns the second target interval value
Big numerical value, should equal to this second greatest measure (or interval for same range) taking turns the second target interval value
Second takes turns the greatest measure of the 3rd target interval value equal to this second greatest measure taking turns the 3rd target interval value
(or being that same range is interval).
Similarly, the type in this light modulation region is for example metal types, literal type, welding resisting layer
The dark space type of clear zone type and welding resisting layer these four, and in this irradiation light selected adjusts the step of configuration,
Irradiate setting value of configuration, this lit sideways configuration from this lit sideways configuration and this most positive light and be somebody's turn to do
The positive light of second time irradiates the setting value of configuration, this second takes turns lit sideways configuration and second the most just taking turns with this
Light irradiates the setting value of configuration, this second takes turns lit sideways configuration and second take turns the positive light irradiation group of second time with this
The setting value of state, judges in these four that one adjusts configuration as this irradiation light, wherein, it is determined that rule
Successively carry out in the following order, next rule must be entered when the result of difference degree is identical and judge,
When the result difference of difference degree with the configuration setting that difference degree is big be this irradiation light adjust configuration:
The first, the luminance difference degree between the clear zone type of welding resisting layer and the dark space type of welding resisting layer；
The second, the luminance difference degree between metal types and literal type；
3rd, between the maximum of the dark space type of the clear zone type of welding resisting layer and welding resisting layer and literal type
Luminance difference degree；And
Between the maximum of the clear zone type of the 4th, metal types and welding resisting layer and the dark space type of welding resisting layer
Luminance difference degree.
Additionally, for the light modulation region of metal types, instantly picked in irradiating configuration based on each
Get to should at least one light modulation region in the image data of one of them, and based on selected
In step under the comparison of the brightness threshold value normal data of the pre-stored in type light modulation region, with this image
The image data of " red light wavelength section " in data compares.
Summary, the present invention utilizes the light intensity value represented in institute's pick-up image with an automatic light meter to carry out,
And can for dissimilar region do optimization process so that by inspection circuit board can homogenization under conditions of quilt
Detection, so can the quality of holding circuit plate homogeneous.
The present invention discloses with preferred embodiment the most, but it will be understood by those skilled in the art that
This embodiment is only used for describing the present invention, and is not construed as limiting the scope of the present invention.It should be noted that
All changes equivalent with this embodiment and displacement, be regarded as being covered by scope of the invention.Therefore,
Protection scope of the present invention is as the criterion when the content limited with claims.
Claims (9)
1. for an automatic light modulating method for optical detection, for an optical detection board different types of
The automatic adjustment of light source it is irradiated, it is characterised in that comprise between circuit board under test:
Capture the image data on the circuit board under test after changing kind；
Light modulation zone enactment steps, according to this image data to set at least one light modulation region and correspondence thereof
Type, the type in this light modulation region comprises in metal types, literal type and welding resisting layer type these three
At least two；
Carry out dimming step, irradiate two kinds of configurations of light by lateral irradiation light and the lateral light that irradiates with forward
Irradiation under, on the basis of selected a kind of type dimming region, and based on each irradiate configuration work as
The image data in the lower institute selection type light modulation region captured and based on selection type light modulation district of institute
Under the comparison of the brightness threshold value normal data of the pre-stored in territory, adjust the power irradiating light, further according to side
Interregional with the light modulation that forward irradiates wantonly two types captured under this configuration that light irradiates simultaneously to irradiating light
The brightness value of image data, obtain corresponding luminance difference degree, a selected irradiation light adjusts configuration；
And
Store this irradiation light and adjust configuration, for the carrying out of the detection of same kind circuit board.
2. automatic light modulating method as claimed in claim 1, it is characterised in that comprise in this light modulation step:
Carry out sidelight set-up procedure, it is provided that this circuit board under test lateral incident laterally irradiate light, it initiates
The adjusting in the light modulation region of institute's selection type of exposure rate, adjust in institute's pick-up image instantly
Brightness value of image reach in first object interval value, to obtain the setting value of lit sideways configuration；
Carry out positive light set-up procedure, under maintaining the irradiation of setting value of this lit sideways configuration, also provide for
The forward of this circuit board under test of forward entrance irradiates light, and this forward irradiates the adjustment of the initial exposure rate of light
In the light modulation region of institute's selection type, adjust to the brightness value of image in institute's pick-up image instantly and reach
In second target interval value, to obtain the setting value of the most positive light irradiation configuration, and at this lit sideways
Configuration is irradiated under the setting value of configuration with this most positive light, captures the shadow that the light modulation of wantonly two types is interregional
As the brightness value of data, obtain corresponding luminance difference degree；And
Carry out the positive light set-up procedure of second time, under maintaining the irradiation of setting value of this lit sideways configuration,
Also adjust this forward and irradiate light to provide the forward of the setting value higher than this first time positive light irradiation configuration to irradiate
Light, adjusting further in the light modulation region of institute's selection type of this forward irradiation light, adjust to instantly
Brightness value of image in institute's pick-up image reaches in the 3rd target interval value, to obtain second time positive light irradiation
The setting value of configuration, and under the setting value that this lit sideways configuration light positive with this second time irradiates configuration,
Capture the brightness value dimming interregional image data of wantonly two types, obtain corresponding luminance difference degree,
Configuration is adjusted with this irradiation light selected.
3. automatic light modulating method as claimed in claim 2, it is characterised in that the type in this light modulation region
For the dark space type these four of metal types, literal type, the clear zone type of welding resisting layer and welding resisting layer, and
In this irradiation light selected adjusts the step of configuration, irradiate with this most positive light from this lit sideways configuration
The setting value of configuration, this lit sideways configuration light positive with this second time irradiates the setting value of configuration, the two
Middle judgement one adjusts configuration as this irradiation light, wherein, it is determined that the priority of rule is entered in the following order
OK, when the result of difference degree is identical, begin to enter next rule judge, in the knot of difference degree
It is that this irradiation light adjusts configuration with the configuration setting that difference degree is big when fruit is different；
The first, the luminance difference degree between the clear zone type of welding resisting layer and the dark space type of welding resisting layer；
The second, the luminance difference degree between metal types and literal type；
3rd, between the maximum of the dark space type of the clear zone type of welding resisting layer and welding resisting layer and literal type
Luminance difference degree；And
Between the maximum of the clear zone type of the 4th, metal types and welding resisting layer and the dark space type of welding resisting layer
Luminance difference degree.
4. automatic light modulating method as claimed in claim 2, it is characterised in that in this light modulation step,
After the positive light set-up procedure of second time and before this irradiation light selected adjusts configuration, also comprise:
Close all irradiation configurations；
Carry out second and take turns sidelight set-up procedure, it is provided that this circuit board under test lateral incident laterally irradiate light,
Adjusting in the light modulation region of institute's selection type of its initial exposure rate, adjusts and is captured to instantly
Brightness value of image in image reaches second and takes turns in first object interval value, takes turns lit sideways obtaining second
The setting value of configuration；
Carry out second and take turns positive light set-up procedure, maintaining this second photograph of setting value taking turns lit sideways configuration
Penetrating down, the forward also providing for this circuit board under test of forward entrance irradiates light, and this forward irradiates the initial photograph of light
Penetrate the adjusting in the light modulation region of institute's selection type of intensity, adjust to the shadow in institute's pick-up image instantly
Image brightness value reaches second and takes turns in the second target interval value, takes turns for the first time positive light and irradiates configuration obtaining second
Setting value, and second take turns lit sideways configuration at this and second take turns for the first time positive light with this and irradiate setting of configuration
Under definite value, capture the brightness value dimming interregional image data of wantonly two types, obtain corresponding brightness
Difference degree；And
Carry out second and take turns the positive light set-up procedure of second time, second take turns setting of lit sideways configuration maintaining this
Under the irradiation of definite value, also adjust this forward and irradiate light and second take turns for the first time positive light irradiation group to provide higher than this
The forward of the setting value of state irradiates light, adjusting further in the light modulation of institute's selection type of this forward irradiation light
In region, adjust and reach second to the brightness value of image in institute's pick-up image instantly and take turns the 3rd target interval
In value, take turns the positive light of second time and irradiate the setting value of configuration obtaining second, and this lit sideways configuration with
This second is taken turns under the setting value that the positive light of second time irradiates configuration, and captures wantonly two types dims interregional shadow
As the brightness value of data, obtain corresponding luminance difference degree, adjust configuration with this irradiation light selected,
Wherein, this second takes turns greatest measure of first object interval value more than this first object interval value
Big numerical value, this second takes turns the second target interval value equal to this second target interval value, and this second takes turns the 3rd mesh
Mark interval value is equal to the 3rd target interval value.
5. automatic light modulating method as claimed in claim 4, it is characterised in that the type in this light modulation region
For the dark space type these four of metal types, literal type, the clear zone type of welding resisting layer and welding resisting layer, and
In this irradiation light selected adjusts the step of configuration, irradiate with this most positive light from this lit sideways configuration
The setting value of configuration, this lit sideways configuration and this positive light of second time irradiate the setting value of configuration, this second
Wheel lit sideways configuration second takes turns that for the first time positive light irradiates the setting value of configuration, this second takes turns sidelight and shine with this
Penetrate configuration second to take turns the positive light of second time with this and irradiate the setting value of configuration, these four judging, a conduct should
Irradiate light and adjust configuration, wherein, it is determined that the priority of rule is carried out, in the following order in difference degree
Begin to enter next rule when result is identical to judge, with difference journey when the result difference of difference degree
Spending big configuration setting is that this irradiation light adjusts configuration；
The first, the luminance difference degree between the clear zone type of welding resisting layer and the dark space type of welding resisting layer；
The second, the luminance difference degree between metal types and literal type；
3rd, between the maximum of the dark space type of the clear zone type of welding resisting layer and welding resisting layer and literal type
Luminance difference degree；And
Between the maximum of the clear zone type of the 4th, metal types and welding resisting layer and the dark space type of welding resisting layer
Luminance difference degree.
6. the automatic light modulating method as according to any one of Claims 1 to 5, it is characterised in that selected
The type in this light modulation region be this metal types.
7. automatic light modulating method as claimed in claim 6, it is characterised in that irradiating based on each
Configuration instantly captured to should at least one light modulation region in the image data of one of them and base
In with the step under the comparison of the brightness threshold value normal data of the pre-stored in institute selection type light modulation region
In, compare with the image data of the red light wavelength section in this image data.
8. automatic light modulating method as claimed in claim 6, it is characterised in that set in this light modulation region
In step, delimitation based on user sets this at least one light modulation region and type of correspondence thereof.
9. an optical detection board, it is characterised in that comprise radiation source group, shooting group and control group,
This control group controls the light intensity of this radiation source group and adjusts and receive the image number that this shooting group is captured
According to, between different types of circuit board under test, the automatic adjustment of light source it is irradiated in this optical detection board
Time, the running of this control group performs the automatic light modulating method as according to any one of claim 1 to 8.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW104106592 | 2015-03-03 | ||
| TW104106592A TWI542869B (en) | 2015-03-03 | 2015-03-03 | Automatic dimming method for optical detection and its optical inspection machine |
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| CN106033062A true CN106033062A (en) | 2016-10-19 |
| CN106033062B CN106033062B (en) | 2018-10-23 |
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| JP (1) | JP6038992B2 (en) |
| KR (1) | KR101675339B1 (en) |
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| TWI733062B (en) * | 2018-11-06 | 2021-07-11 | 晶彩科技股份有限公司 | Optical image automatic capture method for compound detection conditions |
| CN112051279A (en) * | 2019-06-06 | 2020-12-08 | 深圳市瑞微智能有限责任公司 | Circuit board welding quality detection method and assembly |
| US11788972B2 (en) | 2021-04-29 | 2023-10-17 | Industrial Technology Research Institute | Method of automatically setting optical parameters and automated optical inspection system using the same |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05126748A (en) * | 1990-05-11 | 1993-05-21 | Orbot Syst Ltd | Optical inspecting device |
| JPH07159335A (en) * | 1993-12-03 | 1995-06-23 | Sony Corp | Apparatus and method for inspection of appearance of package |
| US20010048761A1 (en) * | 2000-03-02 | 2001-12-06 | Akira Hamamatsu | Method of inspecting a semiconductor device and an apparatus thereof |
| US20030094586A1 (en) * | 2001-11-16 | 2003-05-22 | Toshirou Kurosawa | Wafer defect inspection machine |
| JP2003256814A (en) * | 2002-02-27 | 2003-09-12 | Olympus Optical Co Ltd | Substrate checking device |
| CN1618421A (en) * | 2004-11-30 | 2005-05-25 | 上海金纳德制药设备科技发展有限公司 | Adjustable luminous source system used for on-line lamp-examination |
| JP2007139676A (en) * | 2005-11-21 | 2007-06-07 | Nec Tohoku Sangyo System Kk | Device and method for inspecting substrate |
| CN100495000C (en) * | 2004-08-20 | 2009-06-03 | 大日本网目版制造株式会社 | Visual confirmation device and check system |
| CN101556381A (en) * | 2008-04-10 | 2009-10-14 | 东捷科技股份有限公司 | Detection device and image illumination level compensation method |
| WO2009156981A1 (en) * | 2008-06-25 | 2009-12-30 | Applied Materials South East Asia Pte. Ltd. | Dynamic illumination in optical inspection systems |
| JP2013015328A (en) * | 2011-06-30 | 2013-01-24 | Hitachi High-Technologies Corp | Display panel inspection device and display panel inspection method |
| CN103743749A (en) * | 2014-01-03 | 2014-04-23 | 苏州吉视电子科技有限公司 | Device and method for detecting surface quality of flaky parts |
-
2015
- 2015-03-03 TW TW104106592A patent/TWI542869B/en active
- 2015-03-19 CN CN201510120954.0A patent/CN106033062B/en active Active
- 2015-04-06 JP JP2015077826A patent/JP6038992B2/en active Active
- 2015-04-14 KR KR1020150052187A patent/KR101675339B1/en active IP Right Grant
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05126748A (en) * | 1990-05-11 | 1993-05-21 | Orbot Syst Ltd | Optical inspecting device |
| JPH07159335A (en) * | 1993-12-03 | 1995-06-23 | Sony Corp | Apparatus and method for inspection of appearance of package |
| US20010048761A1 (en) * | 2000-03-02 | 2001-12-06 | Akira Hamamatsu | Method of inspecting a semiconductor device and an apparatus thereof |
| US20030094586A1 (en) * | 2001-11-16 | 2003-05-22 | Toshirou Kurosawa | Wafer defect inspection machine |
| JP2003256814A (en) * | 2002-02-27 | 2003-09-12 | Olympus Optical Co Ltd | Substrate checking device |
| CN100495000C (en) * | 2004-08-20 | 2009-06-03 | 大日本网目版制造株式会社 | Visual confirmation device and check system |
| CN1618421A (en) * | 2004-11-30 | 2005-05-25 | 上海金纳德制药设备科技发展有限公司 | Adjustable luminous source system used for on-line lamp-examination |
| JP2007139676A (en) * | 2005-11-21 | 2007-06-07 | Nec Tohoku Sangyo System Kk | Device and method for inspecting substrate |
| CN101556381A (en) * | 2008-04-10 | 2009-10-14 | 东捷科技股份有限公司 | Detection device and image illumination level compensation method |
| WO2009156981A1 (en) * | 2008-06-25 | 2009-12-30 | Applied Materials South East Asia Pte. Ltd. | Dynamic illumination in optical inspection systems |
| JP2013015328A (en) * | 2011-06-30 | 2013-01-24 | Hitachi High-Technologies Corp | Display panel inspection device and display panel inspection method |
| CN103743749A (en) * | 2014-01-03 | 2014-04-23 | 苏州吉视电子科技有限公司 | Device and method for detecting surface quality of flaky parts |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI542869B (en) | 2016-07-21 |
| KR101675339B1 (en) | 2016-11-11 |
| JP2016161564A (en) | 2016-09-05 |
| JP6038992B2 (en) | 2016-12-07 |
| KR20160107080A (en) | 2016-09-13 |
| CN106033062B (en) | 2018-10-23 |
| TW201632874A (en) | 2016-09-16 |
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