CN106033062B - Automatic dimming method for optical detection and optical detection machine platform thereof - Google Patents
Automatic dimming method for optical detection and optical detection machine platform thereof Download PDFInfo
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- CN106033062B CN106033062B CN201510120954.0A CN201510120954A CN106033062B CN 106033062 B CN106033062 B CN 106033062B CN 201510120954 A CN201510120954 A CN 201510120954A CN 106033062 B CN106033062 B CN 106033062B
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- 238000012544 monitoring process Methods 0.000 claims description 3
- 238000005286 illumination Methods 0.000 claims description 2
- 230000001678 irradiating effect Effects 0.000 claims description 2
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Abstract
The invention discloses an automatic dimming method for optical detection and an optical detection machine thereof, wherein an irradiation light source is automatically adjusted among different types of circuit boards to be detected, the intensity of the irradiation light is adjusted through setting each dimming area and the corresponding type on the circuit board to be detected, based on image data which is captured under each irradiation configuration and corresponds to one of at least one dimming area and based on comparison with pre-stored brightness threshold value standard data of the dimming area of the selected type, and then the corresponding brightness difference degree is obtained according to the brightness value of the image data between any two types of dimming areas captured under the configuration that lateral irradiation light and forward irradiation light are simultaneously irradiated, and a new irradiation light adjustment configuration is selected. Therefore, the invention can automatically optimize the configuration of the irradiation light source, so that the detected circuit board can be detected under the uniform condition.
Description
Technical field
The present invention relates to a kind of automatic light modulating method for optical detection and its optical detection boards, more particularly to one kind
It can be irradiated the automatic light modulating method of the Automatic Optimal of light source configuration to different types of circuit board under test and use this automatic
The optical detection board of light-dimming method.
Background technology
Detection of the automatic optics inspection (AOI) on soft or rigid circuit board plays very important role.Citing
For, in the manufacturing process of various circuit boards, it must all pass through accurate automatic optics inspection to distinguish the quality of circuit board, into
The management and control of row quality.
Automatic optics inspection is carried out by the running of optical detection board, and in detection process, circuit is exposed to light
On plate, then the judgement of flaw, also therefore, optical detector carried out by image of the photographic device acquisition circuitry plate after illuminated
The source mass that lighting device on platform is provided just has considerable influence detection is upper, once source mass it is bad or with
When the configuration difference previously used, testing result will cause result misalignment or product quality because of the offset of detection data not
Stablize.
Traditionally, the irradiation configuration (i.e. each irradiation light strong and weak control) of the light supply apparatus on optical detection board be all by
Manually rule of thumb rule or the irradiation configuration of similar circuit plate is directly applied mechanically to carry out, however, so set not only not
By the process control of homogenization, it is more likely to lead to the generation of defective products because of artificial careless mistake, once the type of circuit board under test
It is numerous and when needing accordingly constantly to change irradiation configuration, adjust not only time-consuming by artificial setting one by one and can not also make each machine
Examination criteria homogenization between platform, such disadvantage, which is often resulted in, is unable to maintain that stable product quality by the product of detection.
Invention content
It is an object of the present invention to maintain stable circuit board inspection quality.
Another object of the present invention is to automatically to various types of circuit boards into the with an automatic light meter of line light source irradiation group state.
For the above-mentioned purpose and other purposes, the present invention proposes a kind of automatic light modulating method for optical detection, for light
The adjust automatically that detection board is irradiated light source between different types of circuit board under test is learned, including：It captures after replacing type
Circuit board under test on image data；Zone enactment steps are dimmed, according to the image data to set at least one light modulation region
And its corresponding type, the type in the light modulation region include metal types, literal type and anti-welding channel type in these three extremely
It is two few；Light modulation step is carried out, the irradiation of lateral irradiation light and lateral irradiation light and two kinds of configurations of positive irradiation light is passed through
Under, it is selected on the basis of a kind of type in selected light modulation region, and based on what each irradiation configuration captured instantly
Type dims the image data in region and the brightness threshold value criterion numeral based on the pre-stored with institute's selection type light modulation region
According to comparison under, adjust the power of irradiation light, institute under the configuration irradiated simultaneously with positive irradiation light further according to lateral irradiation light
The brightness value of the interregional image data of light modulation of wantonly two type captured, obtains corresponding luminance difference degree, selectes irradiation
Light adjusts configuration；And irradiation light adjustment configuration is stored, for the progress of the detection of same type circuit board.
In one embodiment of the invention, include in the light modulation step：Sidelight set-up procedure is carried out, lateral incident this is provided and is waited for
The lateral irradiation light of slowdown monitoring circuit plate, starting exposure intensity adjustment in the light modulation region of institute's selection type, adjust to
Instantly the brightness value of image in institute's pick-up image reaches in first object interval value, to obtain the setting value of lit sideways configuration；
Positive light set-up procedure is carried out, in the case where maintaining the irradiation of setting value of the lit sideways configuration, also provides forward entrance the electricity to be measured
The adjustment of the positive irradiation light of road plate, the starting exposure intensity of the forward direction irradiation light is adjusted in the light modulation region of institute's selection type
The whole brightness value of image in institute's pick-up image instantly reaches in the second target interval value, to obtain positive light irradiation group for the first time
The setting value of state, and in the case where the lit sideways configuration and the first time positive light irradiate the setting value of configuration, capture wantonly two type
The brightness value for dimming interregional image data obtains corresponding luminance difference degree；And carry out second of positive light adjustment step
Suddenly, in the case where maintaining the irradiation of setting value of the lit sideways configuration, the forward direction irradiation light is also adjusted to provide and is higher than the first time
The positive irradiation light of the setting value of positive light irradiation configuration, the further adjustment of the forward direction irradiation light is in the light modulation area of institute's selection type
It in domain, adjusts to the brightness value of image in institute's pick-up image instantly and reaches in third target interval value, to obtain for the second time just
The setting value of light irradiation configuration, and in the lit sideways configuration and under being somebody's turn to do the setting value of second of positive light irradiation configuration, acquisition times
The brightness value of the interregional image data of light modulation of two types, obtains corresponding luminance difference degree, to select the irradiation light tune
Whole group state.
In one embodiment of the invention, in the light modulation step, after second of positive light set-up procedure and in the selected photograph
Before penetrating light adjustment configuration, also include：Close all irradiation configurations；The second wheel sidelight set-up procedure is carried out, providing lateral incidence should
The lateral irradiation light of circuit board under test, starting exposure intensity adjustment in the light modulation region of institute's selection type, adjust to
Brightness value of image in institute's pick-up image instantly reaches in the second wheel first object interval value, to obtain the second wheel lit sideways
The setting value of configuration；The second positive light set-up procedure of wheel is carried out, in the irradiation for the setting value for maintaining the second wheel lit sideways configuration
Under, the positive irradiation light of the forward entrance circuit board under test is also provided, the adjustment of the starting exposure intensity of the forward direction irradiation light in
In the light modulation region of institute's selection type, adjusts to the brightness value of image in institute's pick-up image instantly and reach second the second target of wheel
In interval value, the setting value that first time positive light irradiates configuration is taken turns to obtain second, and in the second wheel lit sideways configuration and be somebody's turn to do
Second wheel under the setting value of positive light irradiation configuration, captures the brightness of the interregional image data of light modulation of wantonly two type for the first time
Value, obtains corresponding luminance difference degree；And second of positive light set-up procedure of the second wheel is carried out, maintaining the second wheel side
Light irradiates under the irradiation of the setting value of configuration, also adjusts the forward direction irradiation light to provide and is higher than second wheel positive light irradiation for the first time
The further adjustment of the positive irradiation light of the setting value of configuration, the forward direction irradiation light is adjusted in the light modulation region of institute's selection type
The whole brightness value of image in institute's pick-up image instantly reaches in the second wheel third target interval value, to obtain the second wheel second
The setting value of secondary positive light irradiation configuration, and irradiate the setting value of configuration in second of positive light of the lit sideways configuration and second wheel
Under, the brightness value of the interregional image data of light modulation of wantonly two type is captured, corresponding luminance difference degree is obtained, is somebody's turn to do with selected
Irradiation light adjusts configuration, wherein the greatest measure of the second wheel first object interval value is more than the first object interval value most
Big numerical value, the second target interval value of the second wheel are equal to the second target interval value, which is equal to
The third target interval value.
In one embodiment of the invention, the type in the light modulation region is metal types, the clear zone class of literal type, soldermask layer
The dark space type of type and soldermask layer this four, and in the step of selected irradiation light adjusts configuration, from the lit sideways configuration
With this for the first time positive light irradiate the setting value of configuration, the lit sideways configuration with should second of positive light irradiate configuration setting value,
Setting value, the second wheel lit sideways configuration of the second wheel lit sideways configuration with the second wheel first time positive light irradiation configuration
Irradiating the setting value of configuration with the second positive light of the second wheel, the conduct of judgement one irradiation light adjusts configuration in this four,
In, the priority of decision rule carries out in the following order, and next rule must be entered by, which beginning when the result of difference degree is identical, carries out
Judgement adjusts configuration with the big configuration setting of difference degree when the result difference of difference degree for the irradiation light；The first, anti-
Luminance difference degree between the clear zone type of layer and the dark space type of soldermask layer；The second, between metal types and literal type
Luminance difference degree；It is bright between the maximum value and literal type of the dark space type of third, the clear zone type of soldermask layer and soldermask layer
Spend difference degree；And between the maximum value of the dark space type of the clear zone type and soldermask layer of the 4th, metal types and soldermask layer
Luminance difference degree.
In one embodiment of the invention, the type in the selected light modulation region is the metal types, based on each
It image data one of in the correspondence that captures instantly of the irradiation configuration at least one light modulation region and is based on and institute
Selection type dims in the step under the comparison of the brightness threshold value normal data of the pre-stored in region, in the image data
The image data of red light wavelength section is compared.
In one embodiment of the invention, in the light modulation zone enactment steps, this is set extremely based on the delimitation of user
A few light modulation region and its corresponding type.
For the above-mentioned purpose and other purposes, the present invention also propose a kind of optical detection board, including radiation source group, taking the photograph
As group and control group, which controls the luminous intensity adjustment of the radiation source group and receives the image number that the camera shooting group is captured
According to, when the optical detection board is irradiated the adjust automatically of light source between different types of circuit board under test, the control group
It operates to execute foregoing automatic light modulating method.
The present invention adds both irradiation configurations of positive light by the type set and sidelight, sidelight in each light modulation region as a result,
Sequentially irradiation carry out corresponding light modulation processing, not only so that optical detection board disclosed in the present application can be to different types of
Circuit board under test is irradiated the Automatic Optimal of light source configuration, more so that can be given under conditions of homogenization by inspection circuit board
With detection, and then can holding circuit plate quality it is uniform.
Description of the drawings
Fig. 1 is the flow chart of the automatic light modulating method in one embodiment of the invention.
Fig. 2 is the schematic diagram of the optical detection board in one embodiment of the invention.
Fig. 3 a are the flow chart of the automatic light modulating method in another embodiment of the present invention.
Fig. 3 b are the flow chart of the automatic light modulating method in yet another embodiment of the invention.
Critical piece reference numeral：
100 control groups
201 lateral irradiation radiants
220 lateral irradiation lights
203 positive irradiation radiants
300 camera shooting groups
500 circuit board under test
S100~S400 steps
Specific implementation mode
To fully understand the purpose of the present invention, feature and technique effect, hereby by following specific embodiments, and in conjunction with attached drawing,
It elaborates, is described as follows to the present invention：
Fig. 1 and Fig. 2 is please referred to first, and Fig. 1 is the flow chart of the automatic light modulating method in one embodiment of the invention, and Fig. 2 is
The schematic diagram of optical detection board in one embodiment of the invention.
Optical detection board include radiation source group (comprising lateral irradiation radiant 201 and positive irradiation radiant 203),
Camera shooting group 300 and control group 100.The control group 100 connects the camera shooting group 300 and the radiation source group (not shown), with control
The luminous intensity of the radiation source group adjusts and receives the image data that the camera shooting group 300 is captured, and exists in the optical detection board
When being irradiated the adjust automatically of light source between different types of circuit board under test 500, which can operate to execute this hair
Bright disclosed automatic light modulating method.Wherein, positive irradiation radiant 203 shown in Fig. 2 can be based on two laterally on operating
The configuration relation in the same plane of radiant 201 is irradiated to avoid covering the image pickup scope of camera shooting group 300.
Automatic light modulating method in one embodiment of the invention is mainly first to capture shadow to the circuit board under test after replacement type
As data, for the setting of light modulation region and its corresponding types, wherein the setting of light modulation region and its corresponding types can be by user
It voluntarily delimit light modulation region and selectes its corresponding type, or by the control group 100 according to the image captured before light modulation
The all types of image features having are (such as in data and circuit board：It is reflective under the image of red light wavelength section on metallic circuit
Can have highest brightness) the light modulation region corresponded on circuit board under various types is picked out automatically, and can select image
The region of better quality come supply subsequently dim flow progress.The subsequent embodiment of the present invention is in such a way that user chooses manually
As example.
As shown in Figure 1, the automatic light modulating method execution in one embodiment of the invention is as follows：
Step S100 first determines whether it has received the replacement instruction for the detection for carrying out variety classes circuit board, in "Yes"
When enter next step S200, next step S101 is entered when "No" and maintains current irradiation configuration.
Then step S200 receives the type set that region is respectively dimmed on the circuit board under test after replacing circuit board type.
So-called type set has according to circuit board surface herein various kenels define, and for example include：As conducting wire
The anti-welding channel type of metal types, the literal type and a variety of colors soldermask layer that are printed by word.It is, in general, that being formed in circuit
Metallic circuit on plate has by coating organic anti-welding dose (OSP), also has directly tin plating or is formed in a manner of chemical nickel gold；Electricity
The word printed on the plate of road has white, black or its allochromatic colour etc.；Soldermask layer is then to have green, blue, white, red etc. color.Operator
After replacement is intended to carry out circuit board with an automatic light meter, the image data captured by the camera shooting group 300 is shown in the control group
In 100 screen (not shown), then (such as by the input interface of the control group 100：Mouse, keyboard etc.) carry out frame choosing towing delimitation
Go out each light modulation region that need to be dimmed, so that these light modulation regions are set in the control group 100, and carries out these
Dim the setting (such as above-mentioned metal types, literal type or anti-welding channel type) of the type in region.
Wherein, it dims region and its setting of type at least selects two groups, that is, metal types, literal type and soldermask layer
Type in these three at least two, for dimming the progress of step.For example, anti-welding channel type can usually be divided into anti-welding again
The clear zone type (having metallic circuit layer below soldermask layer) of layer and the dark space type of soldermask layer (do not have metallic circuit below soldermask layer
Layer), therefore, light modulation step is so that the image data between at least two is clearly recognized, that is, image data exists
Detected system is must be able under desired value of the brightness value based on acquiescence between difference light modulation area type to distinguish, and then is made
The benchmark of light modulation is consistent, can be detected under conditions of homogenization by inspection circuit board.In addition, for example, general
Circuit detection generally has at least set with anti-welding channel type using metal types, because the detection of circuit board is typically to be directed to
Metallic circuit is wanted to configure correctly, and system to be allowed to understand that the metallic circuit picked out on circuit board just depends on by metallic circuit
The image difference degree of the region (being usually anti-welding channel type) with metallic circuit, difference the big more recognizable.So it is above-mentioned only
It is not a kind of limitation for example, the detection of circuit board may also be set for other types, all without departing from the present invention's
Scope.
Then step S300 carries out light modulation step.This step passes through the simple lateral irradiation light of the first and second
Lateral irradiation light arrange in pairs or groups with positive irradiation light, under the irradiation of both configurations, with a kind of type in the light modulation region selected
On the basis of (be usually metal types, illustrated below with metal types) carry out.Configuration institute instantly is irradiated namely based on each
The image data in the light modulation region of the correspondence metal types captured, the brightness door of the pre-stored according to metal types light modulation region
Threshold value normal data is dimmed.In other words, it is under the comparison with brightness threshold value normal data, in default adjustment model
Enclose the power of interior adjustment irradiation light.Then the configuration irradiated simultaneously further according to lateral irradiation light and positive irradiation light is lower to be captured
Wantonly two type (such as metal types with anti-welding channel type) the interregional image data of light modulation brightness value, obtain corresponding bright
Difference degree is spent, an irradiation light is selected and adjusts configuration..
For example, for the light modulation region of metal types, in institute's pick-up image to be made it is clearly recognizable go out metal wire
Road it is necessary to make the minimum intensity of light angle value of the metallic reflection light in the region be higher than it is other kinds of light modulation region maximum reflection
Light intensity value, preferably using red light wavelength section as Rule of judgment.It again for example, can be clear from soldermask layer by white text
Chu identifies, to be inspected with the light intensity value of blue wave band when the green soldermask layer of collocation, be wanted when the blue soldermask layer of collocation
Inspected with the light intensity value of green light band, arrange in pairs or groups red soldermask layer when will with the light intensity value of green light (preferential) or blue wave band
To inspect；Black letters can be identified clearly from soldermask layer then will be with green light (preferential) when the green soldermask layer of collocation
Or the light intensity value of blue wave band is inspected, and to be inspected when the blue soldermask layer of collocation, be taken with the light intensity value of blue wave band
It to be inspected with the light intensity value of green light (preferential) or blue wave band when with red soldermask layer.
Then step S400 stores irradiation light adjustment configuration, for the progress of same type circuit board detecting.
Accordingly, it is of the invention it is with an automatic light meter be the setting for being irradiated in lit sideways configuration and positive light the various collocation of configuration
Under value, the situation (maximum absolute value of the numerical value differed) that different type dims interregional luminance difference degree maximum is chosen
Get off to determine that irradiation light adjusts configuration.
Then Fig. 3 a are please referred to, are the flow chart of the automatic light modulating method in another embodiment of the present invention.Base of the present invention
In the main project that metallic circuit is circuit board detecting, further carrying out following step in dimming step can be to metal to obtain
The irradiation light that the pick-up image of circuit is preferably changed adjusts configuration.
First, sidelight set-up procedure S301 is first carried out under the premise of no irradiation light, and lateral incident circuit under test is provided
The lateral irradiation light 220 of plate, the adjustment of the exposure intensity of starting is in the light modulation region (such as metal types) of institute's selection type
It is interior, it adjusts lateral irradiation light to the brightness value of image in institute's pick-up image instantly and reaches in first object interval value (with metal
For type, this first object interval value for example can be 120~140, this numerical value is 0~255 with range of luminance values
Example), with the setting value that obtains a lit sideways configuration, (i.e. lateral irradiation light is in order to meet the output that front condition is adjusted
Value).
Then positive light set-up procedure S302 is carried out, in the case where maintaining the irradiation of setting value of the lit sideways configuration, is also provided
The positive irradiation light of the forward entrance circuit board under test, the adjustment of the starting exposure intensity of the forward direction irradiation light is in institute's selection type
Light modulation region in, adjust to the brightness value of image in institute's pick-up image instantly and reach in the second target interval value (with metal
For type, this second target interval value for example can be 160~180, this numerical value by range of luminance values for 0~255,
This numerical value refers to numerical value acquired under the superposition under lit sideways and the irradiation of positive light), irradiate configuration to obtain positive light for the first time
Setting value (i.e. positive irradiation light in order to meet the output valve that front condition is adjusted), and the lit sideways configuration and this
Once under the setting value of positive light irradiation configuration, the brightness value of the interregional image data of light modulation of wantonly two type, acquirement pair are captured
The luminance difference degree answered.
The setting value of one group of positive light and sidelight is found after above-mentioned two step to adjust configuration as the irradiation light.But compared with
Good is as shown in Figure 3a, is further included：Second of set-up procedure S303 of positive light, in the setting for maintaining the lit sideways configuration
Under the irradiation of value, then the forward direction irradiation light is adjusted to provide the positive irradiation for being higher than the setting value that the first time positive light irradiates configuration
Light, the further adjustment of the forward direction irradiation light is in the light modulation region of institute's selection type, adjusting in institute's pick-up image instantly
Brightness value of image reach in third target interval value that (for metal types, this second target interval value for example can be
180~200, by range of luminance values for 0~255, this numerical value refers under the superposition under lit sideways and the irradiation of positive light this numerical value
Acquired numerical value), to obtain the setting value that second positive light irradiates configuration, and the lit sideways configuration and this for the second time just
Light irradiates under the setting value of configuration, captures the brightness value of the interregional image data of light modulation of wantonly two type, obtains corresponding bright
Spend difference degree.
It is adjusted in the program of configuration in selecting the irradiation light, for example, the type in the light modulation region is metal types, text
The dark space type of word type, the clear zone type of soldermask layer and soldermask layer this four, in the step of selected irradiation light adjusts configuration
In, from the lit sideways configuration and this for the first time positive light irradiate the setting value of configuration, the lit sideways configuration and this for the second time just
Light irradiates the setting value of configuration, and the conduct of judgement one irradiation light adjusts configuration in the two, wherein the priority of decision rule with
Following order carries out, and begins to be judged into next rule when the result of difference degree is identical, in the knot of difference degree
Configuration is adjusted for the irradiation light with the big configuration setting of difference degree when fruit difference；
The first, the luminance difference degree between the clear zone type of soldermask layer and the dark space type of soldermask layer；
The second, the luminance difference degree between metal types and literal type；
Luminance difference between the maximum value and literal type of the dark space type of third, the clear zone type of soldermask layer and soldermask layer
Degree；And
4th, the luminance difference between the maximum value of the dark space type of the clear zone type and soldermask layer of metal types and soldermask layer
Degree.
For example, when the lit sideways configuration and the first time positive light are irradiated under the setting value of configuration, first is regular
Numerical value under specification is 10；It when the lit sideways configuration and positive light should irradiate under the setting value of configuration for the second time, first is regular
Numerical value under specification is also 10, i.e. the two all identical (or difference is in a certain range), is judged at this time into Second Rule.When
For the lit sideways configuration under this for the first time setting value of positive light irradiation configuration, the numerical value under Second Rule specification is 32；When
The lit sideways configuration is irradiated with second of positive light is somebody's turn to do under the setting value of configuration, and the numerical value under Second Rule specification is also 30,
There is the greater appearance, accordingly, irradiation light adjustment configuration is to be chosen to be " the lit sideways configuration and the first time positive light
Irradiate the setting value of configuration ", that is, configuration is adjusted for the irradiation light with the big configuration setting of difference degree.
Then Fig. 3 b are please referred to, are the flow chart of the automatic light modulating method in yet another embodiment of the invention.Hookup 3a
The step of, then the light modulation step of the second wheel is executed, and adjusted after second of set-up procedure S303 of the positive light and in the irradiation light
Before configuration is recorded (step S400), also include：
Step S310, all irradiation configurations are closed；
Step S311, the second wheel sidelight set-up procedure is carried out, the lateral irradiation light of the lateral incident circuit board under test is provided,
The adjustment of its exposure intensity originated is in the light modulation region of institute's selection type, adjusting to the image in institute's pick-up image instantly
Brightness value reaches in the second wheel first object interval value and greatest measure of the second wheel first object interval value be more than this first
Target interval value greatest measure (for metal types, this second wheel first object interval value for example can be 140~
160, by range of luminance values for 0~255, this numerical value refers to acquired under the superposition under lit sideways and the irradiation of positive light this numerical value
Numerical value), with obtain second wheel lit sideways configuration setting value.
Step S312, the second wheel positive light set-up procedure for the first time is carried out, setting for the second wheel lit sideways configuration is being maintained
Under the irradiation of definite value (i.e. this second wheel second target interval value be equal to the second target interval value), then provide forward entrance this wait for
The positive irradiation light of slowdown monitoring circuit plate, the adjustment of the starting exposure intensity of the forward direction irradiation light is in the light modulation region of institute's selection type
It is interior, it adjusts to the brightness value of image in institute's pick-up image instantly and reaches in second wheel the second target interval value (with metal types
For, this second target interval value of the second wheel for example can be 160~180, this numerical value is 0~255 with range of luminance values
Example, this numerical value refer to numerical value acquired under the superposition under lit sideways and the irradiation of positive light), to obtain the positive illumination for the first time of the second wheel
The setting value of configuration is penetrated, and irradiates the setting value of configuration with the second wheel first time positive light in the second wheel lit sideways configuration
Under, the brightness value of the interregional image data of light modulation of wantonly two type is captured, corresponding luminance difference degree is obtained.
Step S313, second of positive light set-up procedure of the second wheel is carried out, the second wheel lit sideways configuration is being maintained
Under the irradiation of setting value (i.e. the second wheel third target interval value is equal to the third target interval value), then adjust forward direction irradiation
Light with provide be higher than second wheel for the first time positive light irradiate configuration setting value positive irradiation light, the forward direction irradiation light into one
Successive step adjusts to the brightness value of image in institute's pick-up image instantly in the light modulation region of institute's selection type and reaches the second wheel
In third target interval value (for metal types, this second wheel third target interval value for example can be 180~200, this
For numerical value by range of luminance values for 0~255, this numerical value refers to number acquired under the superposition under lit sideways and the irradiation of positive light
Value), to obtain the setting value that second positive light of the second wheel irradiates configuration, and in second of the lit sideways configuration and second wheel
Under the setting value of positive light irradiation configuration, the brightness value of the interregional image data of light modulation of wantonly two type is captured, is obtained corresponding
Luminance difference degree.
Wherein, the greatest measure of the second wheel first object interval value is more than the greatest measure of the first object interval value,
The greatest measure of second wheel, the second target interval value can be equal to or more than the greatest measure of the second target interval value of the second wheel,
The greatest measure of the second wheel third target interval value can be equal to or more than the greatest measure of the second wheel third target interval value.
Preferably, the greatest measure of the second target interval value of the second wheel is equal to the greatest measure of the second target interval value of the second wheel
The greatest measure of (or being same range section), the second wheel third target interval value is equal to the second wheel third target interval value
Greatest measure (or be same range section).
Similarly, the type in the light modulation region for example be metal types, literal type, soldermask layer clear zone type and
The dark space type of soldermask layer this four, and in the step of selected irradiation light adjusts configuration, from the lit sideways configuration and be somebody's turn to do
For the first time the setting value of positive light irradiation configuration, the lit sideways configuration with should second of positive light irradiation configuration setting value, this
Two wheel lit sideways configurations and second wheel for the first time the setting value of positive light irradiation configuration, the second wheel lit sideways configuration with should
Second takes turns the setting value of second of positive light irradiation configuration, a conduct irradiation light adjustment configuration is judged in this four, wherein sentence
The priority of set pattern then carries out in the following order, must be judged into next rule when the result of difference degree is identical, in
Configuration is adjusted for the irradiation light with the big configuration setting of difference degree when the result difference of difference degree：
The first, the luminance difference degree between the clear zone type of soldermask layer and the dark space type of soldermask layer；
The second, the luminance difference degree between metal types and literal type；
Luminance difference between the maximum value and literal type of the dark space type of third, the clear zone type of soldermask layer and soldermask layer
Degree；And
4th, the luminance difference between the maximum value of the dark space type of the clear zone type and soldermask layer of metal types and soldermask layer
Degree.
In addition, for the light modulation region of metal types, in pair captured instantly based on each irradiation configuration
Image data that should be one of at least one light modulation region, and based on the pre-stored for dimming region with institute selection type
Brightness threshold value normal data comparison under step in, with the image data of " red light wavelength section " in the image data come
It is compared.
In summary, the present invention is with an automatic light meter to carry out using the light intensity value represented in institute's pick-up image, and can be directed to
Do optimization processing in different type region so that can be detected under conditions of homogenization by inspection circuit board, and then can holding circuit
The quality of plate is uniform.
The present invention has hereinbefore been disclosed with preferred embodiment, however it will be understood by those skilled in the art that the implementation
Example is only used for describing the present invention, and is not construed as limiting the scope of the invention.It should be noted that all equivalent with the embodiment
Variation and displacement, are regarded as being covered by scope of the invention.Therefore, protection scope of the present invention is when with claims institute
Subject to the content of restriction.
Claims (9)
1. a kind of automatic light modulating method for optical detection, for an optical detection board between different types of circuit board under test
It is irradiated the adjust automatically of light source, which includes the image number on the circuit board under test captured after replacing type
According to；It is characterized in that, the automatic light modulating method also includes：
Zone enactment steps are dimmed, according to the image data to set at least one light modulation region and its corresponding type, the light modulation
The type in region includes at least two of metal types, literal type and anti-welding channel type in these three；
Light modulation step is carried out, under the irradiation by two kinds of configurations of lateral irradiation light and lateral irradiation light and positive irradiation light, with
On the basis of a kind of type in selected light modulation region, and the institute's selection type tune captured instantly based on each irradiation configuration
The ratio of the image data in light region and brightness threshold value normal data based on the pre-stored for dimming region with institute selection type
Under relatively, the power of irradiation light is adjusted, is captured under the configuration irradiated simultaneously with positive irradiation light further according to lateral irradiation light
The brightness value of the interregional image data of light modulation of wantonly two type, obtains corresponding luminance difference degree, selectes an irradiation light tune
Whole group state；And
Irradiation light adjustment configuration is stored, for the progress of the detection of same type circuit board.
2. automatic light modulating method as described in claim 1, which is characterized in that include in the light modulation step：
Sidelight set-up procedure is carried out, the lateral irradiation light of the lateral incident circuit board under test is provided, the exposure intensity of starting
It adjusts in the light modulation region of institute's selection type, adjusts to the brightness value of image in institute's pick-up image instantly and reach first object
In interval value, to obtain the setting value of lit sideways configuration；
Carry out positive light set-up procedure, maintain the lit sideways configuration setting value irradiation under, also provide forward entrance this wait for
The positive irradiation light of slowdown monitoring circuit plate, the adjustment of the starting exposure intensity of the forward direction irradiation light is in the light modulation region of institute's selection type
It is interior, it adjusts to the brightness value of image in institute's pick-up image instantly and reaches in the second target interval value, to obtain positive light for the first time
The setting value of configuration is irradiated, and in the case where the lit sideways configuration and the first time positive light irradiate the setting value of configuration, captures wantonly two
The brightness value of the interregional image data of light modulation of type, obtains corresponding luminance difference degree；And
It carries out second of positive light set-up procedure and also adjusts the forward direction in the case where maintaining the irradiation of setting value of the lit sideways configuration
Irradiation light to provide the positive irradiation light for the setting value for being higher than first time positive light irradiation configuration, the forward direction irradiation light it is further
It adjusts in the light modulation region of institute's selection type, adjusts to the brightness value of image in institute's pick-up image instantly and reach third target
In interval value, the setting value of configuration is irradiated with second of positive light of acquirement, and in the lit sideways configuration and be somebody's turn to do second of positive illumination
It penetrates under the setting value of configuration, captures the brightness value of the interregional image data of light modulation of wantonly two type, obtain corresponding luminance difference
Off course degree adjusts configuration to select the irradiation light.
3. automatic light modulating method as claimed in claim 2, which is characterized in that the type in the light modulation region is metal types, text
The dark space type of word type, the clear zone type of soldermask layer and soldermask layer this four, and in the step for selecting irradiation light adjustment configuration
In rapid, from the lit sideways configuration, positive light irradiates the setting value of configuration, the lit sideways configuration and is somebody's turn to do second for the first time with this
The setting value of positive light irradiation configuration, one conduct irradiation light adjustment configuration of judgement in the two, wherein the priority of decision rule
It carries out in the following order, begins to be judged into next rule when the result of difference degree is identical, in difference degree
As a result configuration is adjusted for the irradiation light with the big configuration setting of difference degree when different；
The first, the luminance difference degree between the clear zone type of soldermask layer and the dark space type of soldermask layer；
The second, the luminance difference degree between metal types and literal type；
Luminance difference off course between the maximum value and literal type of the dark space type of third, the clear zone type of soldermask layer and soldermask layer
Degree；And
4th, the luminance difference off course between the maximum value of the dark space type of the clear zone type and soldermask layer of metal types and soldermask layer
Degree.
4. automatic light modulating method as claimed in claim 2, which is characterized in that in the light modulation step, in second of positive light tune
After synchronizing is rapid and before the selected irradiation light adjusts configuration, also include：
Close all irradiation configurations；
The second wheel sidelight set-up procedure is carried out, the lateral irradiation light of the lateral incident circuit board under test, the irradiation of starting are provided
The adjustment of intensity reaches in the light modulation region of institute's selection type, adjusting to the brightness value of image in institute's pick-up image instantly
In two wheel first object interval values, to obtain the setting value of the second wheel lit sideways configuration；
The second positive light set-up procedure of wheel is carried out, in the case where maintaining the irradiation of setting value of the second wheel lit sideways configuration, is also provided
The positive irradiation light of the forward entrance circuit board under test, the adjustment of the starting exposure intensity of the forward direction irradiation light is in institute's selection type
Light modulation region in, adjust to the brightness value of image in institute's pick-up image instantly and reach in second wheel the second target interval value,
The setting value that positive light for the first time irradiates configuration is taken turns to obtain second, and in the second wheel lit sideways configuration and second wheel first
Under the setting value of secondary positive light irradiation configuration, the brightness value of the interregional image data of light modulation of wantonly two type is captured, correspondence is obtained
Luminance difference degree；And
Second of positive light set-up procedure of the second wheel is carried out, in the irradiation for the setting value for maintaining the second wheel lit sideways configuration
Under, it also adjusts the forward direction irradiation light and is irradiated with the forward direction for providing the setting value for irradiating configuration higher than the second wheel first time positive light
Light, the further adjustment of the forward direction irradiation light is in the light modulation region of institute's selection type, adjusting in institute's pick-up image instantly
Brightness value of image reach in the second wheel third target interval value, to obtain the setting that second positive light of the second wheel irradiates configuration
Value, and in the case where second of positive light of the lit sideways configuration and second wheel irradiates the setting value of configuration, capture the tune of wantonly two type
The brightness value of the interregional image data of light obtains corresponding luminance difference degree, and configuration is adjusted to select the irradiation light,
Wherein, greatest measure of the second wheel first object interval value is more than the greatest measure of the first object interval value, this
Two the second target interval values of wheel are equal to the second target interval value, which is equal to the third target area
Between be worth.
5. automatic light modulating method as claimed in claim 4, which is characterized in that the type in the light modulation region is metal types, text
The dark space type of word type, the clear zone type of soldermask layer and soldermask layer this four, and in the step for selecting irradiation light adjustment configuration
In rapid, from the lit sideways configuration, positive light irradiates the setting value of configuration, the lit sideways configuration and is somebody's turn to do second for the first time with this
Positive light irradiates the setting value of configuration, the second wheel lit sideways configuration and the second wheel just setting of light irradiation configuration for the first time
The setting value of value, the second wheel lit sideways configuration and the second positive light irradiation configuration of the second wheel judges one in this four
Configuration is adjusted as the irradiation light, wherein the priority of decision rule carries out in the following order, identical in the result of difference degree
When begin must be judged into next rule, when the result difference of difference degree with the big configuration setting of difference degree be this
Irradiation light adjusts configuration；
The first, the luminance difference degree between the clear zone type of soldermask layer and the dark space type of soldermask layer；
The second, the luminance difference degree between metal types and literal type；
Luminance difference off course between the maximum value and literal type of the dark space type of third, the clear zone type of soldermask layer and soldermask layer
Degree；And
4th, the luminance difference off course between the maximum value of the dark space type of the clear zone type and soldermask layer of metal types and soldermask layer
Degree.
6. such as automatic light modulating method according to any one of claims 1 to 5, which is characterized in that the selected light modulation region
Type be the metal types.
7. automatic light modulating method as claimed in claim 6, which is characterized in that captured instantly based on each irradiation configuration
To the correspondence at least one light modulation region in one of image data and based on dimming region with institute selection type
In step under the comparison of the brightness threshold value normal data of pre-stored, with the image number of the red light wavelength section in the image data
According to being compared.
8. automatic light modulating method as claimed in claim 6, which is characterized in that in the light modulation zone enactment steps, based on making
The delimitation of user sets at least one light modulation region and its corresponding type.
9. a kind of optical detection board, including radiation source group, camera shooting group and control group, which is characterized in that the control group controls
The luminous intensity of the radiation source group adjusts and receives the image data that the camera shooting group is captured, in the optical detection board in difference
When being irradiated the adjust automatically of light source between the circuit board under test of type, which operates to execute as in claim 1 to 8
Any one of them automatic light modulating method.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW104106592 | 2015-03-03 | ||
| TW104106592A TWI542869B (en) | 2015-03-03 | 2015-03-03 | Automatic dimming method for optical detection and its optical inspection machine |
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| CN106033062A CN106033062A (en) | 2016-10-19 |
| CN106033062B true CN106033062B (en) | 2018-10-23 |
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| JP (1) | JP6038992B2 (en) |
| KR (1) | KR101675339B1 (en) |
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| TWI733062B (en) * | 2018-11-06 | 2021-07-11 | 晶彩科技股份有限公司 | Optical image automatic capture method for compound detection conditions |
| CN112051279A (en) * | 2019-06-06 | 2020-12-08 | 深圳市瑞微智能有限责任公司 | Circuit board welding quality detection method and assembly |
| US11788972B2 (en) | 2021-04-29 | 2023-10-17 | Industrial Technology Research Institute | Method of automatically setting optical parameters and automated optical inspection system using the same |
Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05126748A (en) * | 1990-05-11 | 1993-05-21 | Orbot Syst Ltd | Optical inspecting device |
| JPH07159335A (en) * | 1993-12-03 | 1995-06-23 | Sony Corp | Apparatus and method for inspection of appearance of package |
| JP2003256814A (en) * | 2002-02-27 | 2003-09-12 | Olympus Optical Co Ltd | Substrate checking device |
| CN1618421A (en) * | 2004-11-30 | 2005-05-25 | 上海金纳德制药设备科技发展有限公司 | Adjustable luminous source system used for on-line lamp-examination |
| JP2007139676A (en) * | 2005-11-21 | 2007-06-07 | Nec Tohoku Sangyo System Kk | Device and method for inspecting substrate |
| CN100495000C (en) * | 2004-08-20 | 2009-06-03 | 大日本网目版制造株式会社 | Visual confirmation device and check system |
| CN101556381A (en) * | 2008-04-10 | 2009-10-14 | 东捷科技股份有限公司 | Detection device and image illumination level compensation method |
| WO2009156981A1 (en) * | 2008-06-25 | 2009-12-30 | Applied Materials South East Asia Pte. Ltd. | Dynamic illumination in optical inspection systems |
| JP2013015328A (en) * | 2011-06-30 | 2013-01-24 | Hitachi High-Technologies Corp | Display panel inspection device and display panel inspection method |
| CN103743749A (en) * | 2014-01-03 | 2014-04-23 | 苏州吉视电子科技有限公司 | Device and method for detecting surface quality of flaky parts |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3784603B2 (en) * | 2000-03-02 | 2006-06-14 | 株式会社日立製作所 | Inspection method and apparatus, and inspection condition setting method in inspection apparatus |
| JP2003149169A (en) * | 2001-11-16 | 2003-05-21 | Tokyo Seimitsu Co Ltd | Wafer defect examining device |
-
2015
- 2015-03-03 TW TW104106592A patent/TWI542869B/en active
- 2015-03-19 CN CN201510120954.0A patent/CN106033062B/en active Active
- 2015-04-06 JP JP2015077826A patent/JP6038992B2/en active Active
- 2015-04-14 KR KR1020150052187A patent/KR101675339B1/en active IP Right Grant
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH05126748A (en) * | 1990-05-11 | 1993-05-21 | Orbot Syst Ltd | Optical inspecting device |
| JPH07159335A (en) * | 1993-12-03 | 1995-06-23 | Sony Corp | Apparatus and method for inspection of appearance of package |
| JP2003256814A (en) * | 2002-02-27 | 2003-09-12 | Olympus Optical Co Ltd | Substrate checking device |
| CN100495000C (en) * | 2004-08-20 | 2009-06-03 | 大日本网目版制造株式会社 | Visual confirmation device and check system |
| CN1618421A (en) * | 2004-11-30 | 2005-05-25 | 上海金纳德制药设备科技发展有限公司 | Adjustable luminous source system used for on-line lamp-examination |
| JP2007139676A (en) * | 2005-11-21 | 2007-06-07 | Nec Tohoku Sangyo System Kk | Device and method for inspecting substrate |
| CN101556381A (en) * | 2008-04-10 | 2009-10-14 | 东捷科技股份有限公司 | Detection device and image illumination level compensation method |
| WO2009156981A1 (en) * | 2008-06-25 | 2009-12-30 | Applied Materials South East Asia Pte. Ltd. | Dynamic illumination in optical inspection systems |
| JP2013015328A (en) * | 2011-06-30 | 2013-01-24 | Hitachi High-Technologies Corp | Display panel inspection device and display panel inspection method |
| CN103743749A (en) * | 2014-01-03 | 2014-04-23 | 苏州吉视电子科技有限公司 | Device and method for detecting surface quality of flaky parts |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI542869B (en) | 2016-07-21 |
| CN106033062A (en) | 2016-10-19 |
| JP2016161564A (en) | 2016-09-05 |
| KR20160107080A (en) | 2016-09-13 |
| JP6038992B2 (en) | 2016-12-07 |
| KR101675339B1 (en) | 2016-11-11 |
| TW201632874A (en) | 2016-09-16 |
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