TWI733062B - Optical image automatic capture method for compound detection conditions - Google Patents

Optical image automatic capture method for compound detection conditions Download PDF

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TWI733062B
TWI733062B TW107139393A TW107139393A TWI733062B TW I733062 B TWI733062 B TW I733062B TW 107139393 A TW107139393 A TW 107139393A TW 107139393 A TW107139393 A TW 107139393A TW I733062 B TWI733062 B TW I733062B
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color separation
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TW202018582A (en
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林傳宗
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晶彩科技股份有限公司
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本發明旨在揭露一種複合檢測條件之光學影像自動擷取方法,其運用取像裝置及光源之互相搭配而進行待測物之光學影像擷取作業,以在不同波段之光線照射下,有效取得良/劣品之檢測結果,進而提升檢測效率。The present invention aims to disclose a method for automatically capturing optical images under multiple detection conditions, which uses the mutual matching of image capturing devices and light sources to perform optical image capturing operations of the object under test, so as to effectively obtain the optical image under different wavelengths of light. The inspection results of good/bad products, thereby improving the inspection efficiency.

Description

複合檢測條件之光學影像自動擷取方法Optical image automatic capture method for compound detection conditions

本發明係有關於一種檢測方法,其尤指一種透過複合檢測條件進行光學影像自動擷取之方法。The present invention relates to a detection method, and particularly refers to a method for automatically capturing optical images through multiple detection conditions.

生產線上完成之產品,早期係採用人工檢測之方式進行品質控管。由於人眼的視覺感受有其侷限性,以致會有主觀認知差異,例如無法詳細判斷快速移動、微米至奈米級精細尺寸之產品中的缺陷,或者是外部檢測環境、產品本身之特殊條件對於光譜之可見區域的限制,造成無法確切於人眼內呈現產品中之缺陷。後來發展出以人工搭配儀器之方式進行品管作業,然而,因檢測人員之生理狀態抑或是操作儀器不當等疏失,亦常發生漏檢問題。For products completed on the production line, quality control was carried out by manual inspection in the early stage. Due to the limitations of human visual perception, there will be subjective cognitive differences. For example, it is impossible to judge in detail the defects in fast-moving, micron to nanometer-level fine size products, or the external testing environment or the special conditions of the product itself. The limitation of the visible region of the spectrum makes it impossible to accurately display the defects in the product in the human eye. Later, it was developed to use manual equipment to perform quality control operations. However, due to negligence such as the physiological state of the inspector or improper operation of the instrument, the problem of missed inspection often occurs.

現今,拜科技進步所賜,機器視覺檢測方法取代人眼視覺檢測的時代已來臨,各領域之業界開始啟用自動檢測方式取代人工檢測。自動檢測方式一方面除了可以減少大量人力之外,同時亦得以克服大部分之檢測條件,將檢測精度、檢測速度一併提升,進而改善習知採用人力檢測所產生之缺失,在檢測效果上具有相當之客觀性及泛用性。Nowadays, thanks to the advancement of science and technology, the era of machine vision inspection methods replacing human visual inspection has arrived, and industries in various fields have begun to use automatic inspection methods to replace manual inspections. On the one hand, the automatic detection method can not only reduce a lot of manpower, but also overcome most of the detection conditions, improve detection accuracy and detection speed, and improve the lack of conventional manual detection. It has a good detection effect. Quite objective and versatile.

而對於平面產品之檢測,如印刷電路板(Printed circuit board, PCB)、顯示面板(Display Panel)或玻璃(Glass)等,產業上即有運用機器視覺中,非接觸方式之光學技術予以檢測者。以印刷電路板為例,在該領域中,自動光學檢測為製程上常見之代表性手法,習知做法為利用不同方向或光線強度不同之光源對印刷電路板進行照射,以使影像產生色階之差異,再進行影像擷取,之後透過數據資料庫中符合合格產品之圖式、參數,與擷取到之該印刷電路板之影像進行分析、比對。As for the inspection of flat products, such as printed circuit board (PCB), display panel (Display Panel) or glass (Glass), there are those who use machine vision, non-contact optical technology for inspection in the industry. . Take the printed circuit board as an example. In this field, automatic optical inspection is a common representative method in the manufacturing process. The conventional method is to illuminate the printed circuit board with light sources with different directions or different light intensities to generate color gradations in the image. The difference is then captured by the image, and then analyzed and compared with the captured image of the printed circuit board through the schema and parameters of the qualified product in the data database.

承接前段,印刷電路板之檢測過程中,採用不同強度或不同方向發射之光線予以照射後,僅能取得該印刷電路板在該光線下之色階差異表現,而無法確實獲取在其他光學條件下所能顯示之瑕疵辨識信息。例如,施以反射光,可檢測該印刷電路板之刮痕,卻無法檢測其有無破洞;施以穿透光,則可檢測該印刷電路板之破洞,而無法檢測其是否有刮痕。In the previous stage, in the inspection process of the printed circuit board, after the light emitted from different intensities or different directions is irradiated, only the color gradation difference performance of the printed circuit board under the light can be obtained, and it cannot be obtained under other optical conditions. Defect identification information that can be displayed. For example, applying reflected light can detect the scratches of the printed circuit board, but cannot detect whether there are holes; applying penetrating light, it can detect the holes of the printed circuit board, but cannot detect whether it has scratches .

同理,以不同方向之光源先後分別照射印刷電路板,再先後進行影像擷取,其所取得之圖像分析雖足以有效辨識缺陷存在之資訊,但卻須耗費較多時間。例如,先施以反射光,隨之掃描檢測該印刷電路板之刮痕,其後施以穿透光,接著掃描檢測該印刷電路板之破洞,此使得掃描檢測所需時間耗費至少兩倍之時間。In the same way, light sources in different directions are used to illuminate the printed circuit board respectively, and then image capture is performed one after another. Although the image analysis obtained is sufficient to effectively identify the information of the defect, it takes a lot of time. For example, first apply reflected light, then scan the printed circuit board to detect scratches, then apply penetrating light, and then scan to detect the hole in the printed circuit board, which makes the time required for scanning and inspection to be at least twice Of time.

職是之故,本發明人鑑於上述所衍生之問題,本於發明改良之意念,著手研發解決方案,經多時之構思而有本發明之複合檢測條件之光學影像自動擷取方法產生,以服務社會大眾及促進產業之發展。For this reason, in view of the above-derived problems, the inventor started to develop solutions based on the idea of improving the invention. After many years of thinking, the optical image automatic capture method with the compound detection conditions of the present invention was produced. Serve the public and promote the development of the industry.

本發明之一目的提供一種複合檢測條件之光學影像自動擷取方法,其以取像裝置及光源適配進行待測物影像之擷取,而可由影像資料中各色圖層所呈現之資訊,有效辨識待測物之瑕疵,進而提升檢測結果之精準度及檢測效率。An object of the present invention is to provide a method for automatically capturing optical images with multiple detection conditions, which uses image capturing device and light source adaptation to capture the image of the object under test, and the information presented by each color layer in the image data can be effectively identified The flaws of the object to be tested further improve the accuracy and efficiency of the test results.

本發明之一目的提供一種複合檢測條件之光學影像自動擷取方法,其藉由待測物經不同波段之光線照射,與取像裝置之感光元件本身功能之相互作用下而取得之各色圖層之影像資訊,可供明顯判斷待測物是否存有瑕疵。An object of the present invention is to provide a method for automatically capturing optical images under multiple detection conditions, which uses the interaction of the function of the photosensitive element of the imaging device to obtain the various color layers of the object to be tested by irradiating light of different wavelengths. Image information can be used to clearly determine whether the object to be tested is flawed.

為了達成上述所指稱之各目的與功效,本發明揭露一種複合檢測條件之光學影像自動擷取方法,其包含:提供一檢測平台;提供一取像裝置,相對該檢測平台而鎖定一影像區域;提供至少一光源,包含至少二波段之光線照射該影像區域之至少一側;一待測物進入該影像區域受該些光線所照射,由該取像裝置進行取像,取得包含該些波段之光線與該待測物之一影像資料,並且將該影像資料與該待測物其無瑕疵部分之分色影像資訊,或相同於該待測物之無瑕疵待測物其分色影像資訊進行比對,而取得一檢測結果。In order to achieve the aforementioned objectives and effects, the present invention discloses an automatic optical image capturing method with multiple detection conditions, which includes: providing a detection platform; providing an image capturing device to lock an image area relative to the detection platform; Provide at least one light source, including at least two wavebands of light irradiating at least one side of the image area; an object to be tested enters the image area and is irradiated by the light rays, and the image capturing device is used to capture the image to obtain the light including the wavebands Light and one of the image data of the object under test, and the image data and the color separation image information of the flawless part of the object under test, or the same as the color separation image information of the flawless part of the object under test Compare, and obtain a test result.

於本發明之一實施例中,其亦揭露該光源與該取像裝置設置於該檢測平台之同一側。In an embodiment of the present invention, it is also disclosed that the light source and the image capturing device are arranged on the same side of the detection platform.

於本發明之一實施例中,其亦揭露該影像資料分別包含一紅色圖層與一綠色圖層之影像資訊,且個別將該紅色圖層與該綠色圖層之影像資訊與該待測物其無瑕疵部分之分色影像資訊,或相同於該待測物之無瑕疵待測物其分色影像資訊進行比對,而取得該檢測結果。In an embodiment of the present invention, it also discloses that the image data includes image information of a red layer and a green layer, respectively, and that the image information of the red layer and the green layer and the flawless part of the object under test are separately The color separation image information, or the color separation image information of the flawless object that is the same as the object under test, is compared to obtain the detection result.

於本發明之一實施例中,其亦揭露該些波段之光線為一紅色波段以及一綠色波段。In an embodiment of the present invention, it also discloses that the light of these wavebands is a red waveband and a green waveband.

於本發明之一實施例中,其亦揭露該影像資料分別包含一紅色圖層與一藍色圖層之影像資訊,且個別將該紅色圖層與該藍色圖層之影像資訊與該待測物其無瑕疵部分之分色影像資訊,或相同於該待測物之無瑕疵待測物其分色影像資訊進行比對,而取得該檢測結果。In an embodiment of the present invention, it is also disclosed that the image data includes image information of a red layer and a blue layer, respectively, and that the image information of the red layer and the blue layer and the object to be measured are different. The color separation image information of the defective part or the color separation image information of the non-defective object to be tested is compared to obtain the detection result.

於本發明之一實施例中,其亦揭露該些波段之光線為一紅色波段以及一藍色波段。In an embodiment of the present invention, it is also disclosed that the light of these wavebands is a red waveband and a blue waveband.

於本發明之一實施例中,其亦揭露該影像資料分別包含一綠色圖層與一藍色圖層之影像資訊,且個別將該綠色圖層與該藍色圖層之影像資訊與該待測物其無瑕疵部分之分色影像資訊,或相同於該待測物之無瑕疵待測物其分色影像資訊進行比對,而取得該檢測結果。In an embodiment of the present invention, it is also disclosed that the image data includes image information of a green layer and a blue layer, respectively, and the image information of the green layer and the blue layer and the object to be measured are different. The color separation image information of the defective part or the color separation image information of the non-defective object to be tested is compared to obtain the detection result.

於本發明之一實施例中,其亦揭露該些波段之光線為一綠色波段以及一藍色波段。In an embodiment of the present invention, it is also disclosed that the light of these wavebands is a green waveband and a blue waveband.

於本發明之一實施例中,其亦揭露該影像資料分別包含一紅色圖層、一綠色圖層以及一藍色圖層之影像資訊,且個別將該紅色圖層、該綠色圖層以及該藍色圖層之影像資訊與該待測物其無瑕疵部分之分色影像資訊,或相同於該待測物之無瑕疵待測物其分色影像資訊進行比對,而取得該檢測結果。In an embodiment of the present invention, it is also disclosed that the image data includes image information of a red layer, a green layer, and a blue layer, and the images of the red layer, the green layer, and the blue layer are separately The information is compared with the color separation image information of the flawless part of the test object, or the color separation image information of the flawless test object that is the same as the test object, to obtain the detection result.

於本發明之一實施例中,其亦揭露該些波段之光線為一紅色波段、一綠色波段以及一藍色波段。In an embodiment of the present invention, it is also disclosed that the light of these wavebands is a red waveband, a green waveband, and a blue waveband.

於本發明之一實施例中,其亦揭露該取像裝置為一照相機構或攝影機構。In an embodiment of the present invention, it is also disclosed that the image capturing device is a photographing mechanism or a photographing mechanism.

於本發明之一實施例中,其亦揭露該光源設置於該檢測平台之一側,該取像裝置設置於該檢測平台之另一側。In an embodiment of the present invention, it is also disclosed that the light source is arranged on one side of the inspection platform, and the image capturing device is arranged on the other side of the inspection platform.

為使    貴審查委員對本發明之特徵及所達成之功效有更進一步之瞭解與認識,僅佐以實施例及配合詳細之說明如後:In order to enable your reviewer to have a further understanding and understanding of the features of the present invention and the effects achieved, only the examples and detailed descriptions are provided as follows:

先前技術所載,習知針對待測物進行自動光學檢測之方法,存在著無法同時擷取不同光學條件下之影像其圖像進行比對。因此,本發明遂提出一種複合檢測條件之光學影像自動擷取方法,解決傳統待改進之問題,以提升檢測結果之精準度及檢測效率,並且於下述詳盡說明。In the prior art, the conventional automatic optical inspection method for the object under test cannot simultaneously capture images under different optical conditions and compare the images. Therefore, the present invention proposes an optical image automatic capture method with multiple detection conditions to solve the traditional problems to be improved to improve the accuracy of the detection results and the detection efficiency, and is described in detail below.

在此說明本發明之一種複合檢測條件之光學影像自動擷取方法,請參閱第一圖,其為本發明之複合檢測條件之光學影像自動擷取方法之流程圖。如圖所示,本發明之步驟包含:Here is a description of a method for automatically capturing optical images with multiple inspection conditions of the present invention. Please refer to the first figure, which is a flowchart of the method for automatically capturing optical images with multiple inspection conditions of the present invention. As shown in the figure, the steps of the present invention include:

步驟S10:提供一檢測平台;Step S10: Provide a detection platform;

步驟S12:提供一取像裝置,相對該檢測平台而鎖定一影像區域;Step S12: Provide an image capturing device to lock an image area relative to the detection platform;

步驟S14:提供至少一光源,包含至少二波段之光線照射該影像區域之至少一側;Step S14: Provide at least one light source, including at least two wavelengths of light illuminating at least one side of the image area;

步驟S16:一待測物進入該影像區域受該些光線所照射,由該取像裝置進行取像,取得包含該些波段之光線與該待測物之一影像資料;以及Step S16: an object to be measured enters the image area and is irradiated by the light rays, and the image capturing device is used to capture the image to obtain one of the light rays of the wavelength bands and the object to be measured; and

步驟S18:將該影像資料與該待測物其無瑕疵部分之分色影像資訊,或相同於該待測物之無瑕疵待測物其分色影像資訊進行比對,而取得一檢測結果。Step S18: Compare the image data with the color separation image information of the flawless part of the test object, or the color separation image information of the flawless test object that is the same as the test object, to obtain a detection result.

接續說明為達成本發明方法之系統的構件組成,請參閱第二A圖以及第二B圖,其係本發明之複合檢測條件之光學影像自動擷取系統之示意圖一、二。如圖所示,本發明之複合檢測條件之光學影像自動擷取系統1包含:一取像裝置10及至少一光源12,取像裝置10設置於一檢測平台9之一側,並且相對檢測平台9而鎖定一影像區域100。光源12可與取像裝置10設置於檢測平台9之同一側(如第二A圖),亦可光源12設置於檢測平台9之一側,取像裝置10設置於檢測平台9之另一側(如第二B圖),其包含至少二波長之光線L1、L2照射影像區域100之至少一側。取像裝置10於影像區域100擷取影像而獲得影像資料102。The following description is to achieve the component composition of the system of the method of the invention. Please refer to Figure 2A and Figure 2B, which are schematic diagrams 1 and 2 of the optical image automatic capturing system with compound detection conditions of the present invention. As shown in the figure, the optical image automatic capturing system 1 of the present invention with compound detection conditions includes: an image capturing device 10 and at least one light source 12. The image capturing device 10 is arranged on one side of a detection platform 9 and opposite to the detection platform 9 and lock an image area 100. The light source 12 and the imaging device 10 can be installed on the same side of the detection platform 9 (as shown in Figure 2A), or the light source 12 can be installed on one side of the detection platform 9 and the imaging device 10 can be installed on the other side of the detection platform 9 (As shown in the second figure B), it includes at least two wavelengths of light L1 and L2 illuminating at least one side of the image area 100. The image capturing device 10 captures images in the image area 100 to obtain image data 102.

上述之取像裝置10為一照相機構或攝影機構。The aforementioned image capturing device 10 is a photographing mechanism or a photographing mechanism.

上述之光源12如第二A圖所示,可為具有複數種光線波段之燈具所組成,而可依據檢測人員之照射需求,一次發出兩種波段(顏色)以上之光線L1、L2照射其進入影像區域100之一待測物8。亦可如第二B圖所示,設置多只光源12於檢測平台9之另一側,每一只光源12分別發出一波段之光線L1、L2、L3照射待測物8;其中,該些波段之光線可為人眼所能接收之可見光波段,或者為檢測軟體可讀取、分析、比對之不可見光波段。The above-mentioned light source 12, as shown in Figure 2A, can be composed of lamps with multiple light wavebands, and can emit light L1 and L2 of two wavebands (colors) or more at one time according to the illumination needs of the inspector. One of the test objects 8 in the image area 100. It is also possible to arrange multiple light sources 12 on the other side of the detection platform 9 as shown in the second figure B, and each light source 12 respectively emits a wavelength of light L1, L2, and L3 to illuminate the test object 8; The light of the wave band can be the visible light wave band that the human eye can receive, or the invisible light wave band that can be read, analyzed, and compared by the detection software.

上述之檢測軟體,不限制其係何軟體,只要能夠對影像資料102之各色圖層進行解析皆可為之,例如:Adobe Photoshop CC。The above-mentioned detection software is not limited to any software, as long as it can analyze the various color layers of the image data 102, such as: Adobe Photoshop CC.

上述之待測物8可為一印刷電路板、顯示面板或玻璃。The above-mentioned DUT 8 can be a printed circuit board, a display panel or glass.

復參閱第一圖以及第二A圖,以下說明本發明之複合檢測條件之光學影像自動擷取方法之流程,針對待測物8進行自動光學檢測作業時,將執行步驟S10至步驟S18。首先,檢測平台9、取像裝置10以及光源12,已經如上揭第二A圖、文所述之工作位置就定位。當待測物8經由輸送帶(未圖式)或者是機械手臂(未圖式)進入檢測平台9時,光源12發出之光線L1、L2照射位於影像區域100之待測物8,而取像裝置10則對影像區域100中經光線L1、L2照射產生影像變化之待測物8進行取像。之後取像裝置10取像獲取影像資料102,再將影像資料102與待測物8其無瑕疵部分之分色影像資訊,或相同於待測物8之無瑕疵待測物其分色影像資訊進行比對。爾後,得出檢測結果,知悉適才經檢測之待測物8為良品,抑或為具有瑕疵之劣品。Referring again to the first and second A, the following describes the flow of the optical image automatic capturing method of the present invention with multiple detection conditions. When the automatic optical detection operation is performed on the object 8 to be tested, step S10 to step S18 will be executed. First, the detection platform 9, the image capturing device 10, and the light source 12 have been positioned at the working positions described in the second figure A and the text above. When the test object 8 enters the detection platform 9 via a conveyor belt (not shown) or a robotic arm (not shown), the light L1, L2 emitted by the light source 12 illuminates the test object 8 in the image area 100, and the image is taken The device 10 captures an image of the object 8 in the image area 100 whose image changes caused by the light rays L1 and L2. Then the image capturing device 10 captures the image data 102, and then the image data 102 and the color separation image information of the flawless part of the test object 8 or the color separation image information of the flawless test object that is the same as the test object 8 Compare. Afterwards, the test result is obtained, and it is known whether the test object 8 tested by the appropriate talent is a good product or a defective product.

請一併參閱第三圖、第四A圖以及第四B圖,其為本發明之複合檢測條件之光學影像自動擷取方法之影像資料參考圖、分色影像資訊參考圖一以及分色影像資訊參考圖二。具體而言,光源12若發射一綠色波段之光線L1、一藍色波段之光線L2,以第三圖所示,即為待測物8藉由光源12照射產生之影像變化樣貌,亦為取像裝置10於影像區域100取像所得之影像資料102。接續如第四A圖以及第四B圖所示,影像資料102透過檢測軟體分色處理後,產生具有綠色圖層之影像資訊(第四A圖),以及具有藍色圖層之影像資訊(第四B圖)。由於以綠色波段之光線L1、藍色波段之光線L2照射待測物8時,取像裝置10之感光元件(未圖式)針對不同光線L1、L2具有感光差異。亦即,當綠色波段之光線L1照射待測物8時,影像資料102色彩之綠色部分具有較豐富之表現;同理,當藍色波段之光線L2照射待測物8時,影像資料102色彩之藍色部分具有較豐富之表現。因此,影像資料102經分色處理後,各顏色圖層之影像資訊即具有明顯差異,而可與待測物8其無瑕疵部分之分色影像資訊,或相同於待測物8之無瑕疵待測物其分色影像資訊進行辨識、比對作業。Please refer to the third, fourth A, and fourth B diagrams, which are the image data reference diagram, the color separation image information reference diagram 1 and the color separation image of the optical image automatic capture method of the composite detection condition of the present invention For information, refer to Figure 2. Specifically, if the light source 12 emits a light L1 in the green wavelength band and a light L2 in the blue wavelength band, as shown in the third figure, it is the image change appearance of the object 8 to be irradiated by the light source 12, which is also The image data 102 obtained by the image capturing device 10 captured in the image area 100. Continuing as shown in the fourth A and the fourth B, the image data 102 is processed by color separation by the detection software to generate image information with a green layer (fourth A), and image information with a blue layer (fourth Picture B). Since the light L1 in the green wavelength band and the light L2 in the blue wavelength band are used to illuminate the object 8, the photosensitive element (not shown) of the imaging device 10 has a sensitivity difference for different lights L1 and L2. That is, when the light L1 of the green wavelength band irradiates the test object 8, the green part of the color of the image data 102 has a richer performance; similarly, when the light L2 of the blue wavelength band irradiates the test object 8, the color of the image data 102 The blue part has a richer performance. Therefore, after the image data 102 is processed by color separation, the image information of each color layer has obvious differences, which can be the same as the color separation image information of the flawless part of the test object 8 or the same as the flawless image information of the test object 8. Identify and compare the color separation image information of the measured object.

承接前段,第四A圖所示,其影像資訊以低亮度灰階之光學條件來顯示影像資料102之綠色波段圖層,而得以清楚判別較為明亮之區塊是否存有缺陷。如該四A圖中粗線圓圈框選處之紅色箭頭所標示之缺陷,即係藉之而可明顯區分出該缺陷與待測物8之其他部分有所不同,但該四A圖中粗線圓圈框選處之藍色箭頭所標示之瑕疵,因係位於陰暗之區塊而不易加以辨識。同樣地,第四B圖所示,其影像資訊以高亮度灰階之光學條件來顯示影像資料102之藍色波段圖層,而得以清楚判別其在綠色波段圖層中原本較為陰暗之區塊是否存有缺陷。如該四B圖中粗線圓圈框選處之藍色箭頭所標示之瑕疵,即係藉此而可明顯區別出該瑕疵與待測物8之其他部分有所不同,然該四B圖中粗線圓圈框選處之紅色箭頭所標示之缺陷,因其本即位於明亮之區塊,在亮度提高之情形下,反而受光汙染致難以清楚予以辨別。故,本發明之光學影像自動擷取方法,可以將待測物之不同態樣之缺陷/瑕疵同時予以顯像,而便於檢測人員、檢測軟體辨識待測物之優劣。Continuing the previous paragraph, as shown in Figure 4A, the image information displays the green band layer of the image data 102 under low-brightness gray-scale optical conditions, so that it is possible to clearly determine whether there are defects in the brighter areas. For example, the defect marked by the red arrow in the bold circle in the figure 4A can be used to clearly distinguish the defect from the other parts of the DUT 8. However, the figure 4A is thick The flaws marked by the blue arrow in the circle frame are not easy to identify because they are located in the dark area. Similarly, as shown in Fig. 4B, the image information displays the blue band layer of the image data 102 with high-brightness gray-scale optical conditions, so that it can be clearly judged whether there is a darker area in the green band layer. defective. For example, the defect marked by the blue arrow in the bold circle in Figure 4B can clearly distinguish that the defect is different from the other parts of the test object 8. However, in Figure 4B The defect marked by the red arrow in the thick circle frame is because it is located in the bright area. When the brightness is increased, it is contaminated by light and it is difficult to distinguish clearly. Therefore, the optical image automatic capture method of the present invention can simultaneously visualize different types of defects/defects of the object to be tested, which facilitates the inspection personnel and the inspection software to identify the pros and cons of the object to be tested.

其中,為了因應待測物8本身之色彩呈現態樣,光源12之光線波段可對應變化。例如光源12可為發射綠色波段之光線L1與紅色波段之光線L2、紅色波段之光線L2與藍色波段之光線L3,或者是綠色波段之光線L1、紅色波段之光線L2以及藍色波段之光線L3。又,綠色波段光線L1、紅色波段光線L2,以及藍色波段光線L3三種光線之強度可以不同、部分相同或相同之方式排列組合運用。而根據光源12發射之光線為何種波段及強度之光線,即可分出相應之顏色圖層,以便於檢測人員、檢測軟體進行瑕疵之分析、比對。Among them, in order to respond to the color appearance of the object 8 itself, the light waveband of the light source 12 can be changed accordingly. For example, the light source 12 can emit light L1 in the green band and light L2 in the red band, L2 in the red band, and light L3 in the blue band, or light L1 in the green band, L2 in the red band, and light in the blue band. L3. In addition, the intensities of the three light rays of the green wave band L1, the red wave band light L2, and the blue wave band light L3 can be arranged and combined in different, partially identical or identical ways. According to the wavelength and intensity of the light emitted by the light source 12, the corresponding color layer can be separated, so that the inspection personnel and the inspection software can analyze and compare the defects.

綜上所述,本發明之複合檢測條件之光學影像自動擷取方法,經由取像裝置之感光元件與光源發射不同波段光線照射待測物之相互作用下,而同時取得各顏色圖層之影像資訊,可明顯且有效率地判斷待測物是否存有缺陷。於此,本發明之光學影像自動擷取方法,已有效改善傳統對待測物施行自動光學檢測時所產生之缺失問題。In summary, the optical image automatic capture method of the present invention under compound detection conditions obtains the image information of each color layer through the interaction of the photosensitive element of the image capturing device and the light source emitting light of different wavelengths to illuminate the object under test. , Can clearly and efficiently judge whether there are defects in the test object. Herein, the automatic optical image capturing method of the present invention has effectively improved the defect problem caused by the traditional automatic optical inspection of the object under test.

1:光學影像自動擷取系統8:待測物9:檢測平台10:取像裝置100:影像區域102:影像資料12:光源L1:光線L2:光線L3:光線S10:步驟S12:步驟S14:步驟S16:步驟S18:步驟1: Optical image automatic capture system 8: Object to be tested 9: Detection platform 10: Image capture device 100: Image area 102: Image data 12: Light source L1: Light L2: Light L3: Light S10: Step S12: Step S14: Step S16: Step S18: Step

第一圖:其為本發明之複合檢測條件之光學影像自動擷取方法之流程圖; 第二A圖:其為本發明之複合檢測條件之光學影像自動擷取系統之示意圖一; 第二B圖:其為本發明之複合檢測條件之光學影像自動擷取系統之示意圖二; 第三圖:其為本發明之複合檢測條件之光學影像自動擷取方法之影像資料參考圖; 第四A圖:其為本發明之複合檢測條件之光學影像自動擷取方法之分色影像資訊參考圖一;以及 第四B圖:其為本發明之複合檢測條件之光學影像自動擷取方法之分色影像資訊參考圖二。The first figure: it is the flow chart of the optical image automatic capturing method under the compound detection conditions of the present invention; the second figure A: it is the schematic diagram 1 of the optical image automatic capturing system under the compound detection conditions of the present invention; the second B Figure: It is the second schematic diagram of the optical image automatic capturing system of the compound detection condition of the present invention; Figure 3: It is the image data reference diagram of the optical image automatic capturing method of the compound detection condition of the present invention; Figure 4A : It is the color separation image information of the optical image automatic capture method of the compound detection condition of the present invention, refer to Figure 1; and Figure B: It is the color separation image of the optical image automatic capture method of the compound detection condition of the present invention For information, refer to Figure 2.

S10:步驟 S10: steps

S12:步驟 S12: steps

S14:步驟 S14: Step

S16:步驟 S16: steps

S18:步驟 S18: steps

Claims (12)

一種複合檢測條件之光學影像自動擷取方法,其包含:提供一檢測平台;提供一取像裝置,相對該檢測平台而鎖定一影像區域;提供至少一光源,包含其為同時進行照射之至少二波段之光線照射該影像區域之至少一側;一待測物進入該影像區域受該些光線所同時照射,由該取像裝置進行取像,同時取得包含該些波段之光線與該待測物之一影像資料;以及將該影像資料其中對應該些個波段之光線之不同色圖層與該待測物其無瑕疵部分之分色影像資訊,或與相同於該待測物之無瑕疵待測物的分色影像資訊進行比對,而取得一檢測結果。 A method for automatically capturing optical images with multiple detection conditions, comprising: providing a detection platform; providing an image capturing device for locking an image area relative to the detection platform; providing at least one light source, including at least two of which are simultaneously irradiated Wave bands of light irradiate at least one side of the image area; an object to be measured enters the image area and is illuminated by the light at the same time, and the image capturing device is used to capture the image, and at the same time, the light containing the bands and the object to be measured are obtained One of the image data; and the color separation image information of the different color layers corresponding to the light of some bands in the image data and the flawless part of the test object, or the same as the flawless part of the test object to be tested The color separation image information of the object is compared, and a detection result is obtained. 如申請專利範圍第1項所述之複合檢測條件之光學影像自動擷取方法,其中該光源與該取像裝置設置於該檢測平台之同一側。 As described in the first item of the scope of patent application, the optical image automatic capturing method with compound detection conditions, wherein the light source and the image capturing device are arranged on the same side of the detection platform. 如申請專利範圍第1項所述之複合檢測條件之光學影像自動擷取方法,其中於將對應該些個波段之光線之不同色圖層與該待測物其無瑕疵部分之分色影像資訊,或與相同於該待測物之無瑕疵待測物的分色影像資訊進行比對之步驟中,該影像資料經分色處理後即含有一紅色圖層與一綠色圖層之影像資訊,且個別將該紅色圖層與該綠色圖層之影像資訊與該待測物其無瑕疵部分之分色影像資訊,或與相同於該待測物之無瑕疵待測物其分色影像資訊進行比對,而取得該檢測結果。 For example, the optical image automatic capture method with compound detection conditions described in the first item of the scope of patent application, in which the different color layers corresponding to the light of some bands and the color separation image information of the flawless part of the object under test are combined, Or in the step of comparing with the color separation image information of the flawless test object that is the same as the test object, the image data contains the image information of a red layer and a green layer after the color separation process. The image information of the red layer and the green layer is compared with the color separation image information of the flawless part of the test object, or with the color separation image information of the flawless test object that is the same as the test object to obtain The test result. 如申請專利範圍第1或3項所述之複合檢測條件之光學影像自動擷取方法,其中該些波段之光線為一紅色波段以及一綠色波段。 The optical image automatic capturing method with compound detection conditions as described in item 1 or 3 of the scope of patent application, wherein the light of these wavelength bands is a red wavelength band and a green wavelength band. 如申請專利範圍第1項所述之複合檢測條件之光學影像自動擷取方法,其中於將對應該些個波段之光線之不同色圖層與該待測物其無瑕疵部分之分色影像資訊,或與相同於該待測物之無瑕疵待 測物的分色影像資訊進行比對之步驟中,該影像資料經分色處理後即含有一紅色圖層與一藍色圖層之影像資訊,且個別將該紅色圖層與該藍色圖層之影像資訊與該待測物其無瑕疵部分之分色影像資訊,或與相同於該待測物之無瑕疵待測物其分色影像資訊進行比對,而取得該檢測結果。 For example, the optical image automatic capture method with compound detection conditions described in the first item of the scope of patent application, in which the different color layers corresponding to the light of some bands and the color separation image information of the flawless part of the object under test are combined, Or with the same flawless treatment as the DUT In the step of comparing the color separation image information of the measured object, the image data contains the image information of a red layer and a blue layer after the color separation process, and the image information of the red layer and the blue layer are separately processed Compare with the color separation image information of the flawless part of the test object, or with the color separation image information of the flawless test object that is the same as the test object, to obtain the detection result. 如申請專利範圍第1或5項所述之複合檢測條件之光學影像自動擷取方法,其中該些波段之光線為一紅色波段以及一藍色波段。 In the optical image automatic capturing method with compound detection conditions as described in item 1 or 5 of the scope of patent application, the light in these bands is a red band and a blue band. 如申請專利範圍第1項所述之複合檢測條件之光學影像自動擷取方法,其中於將對應該些個波段之光線之不同色圖層與該待測物其無瑕疵部分之分色影像資訊,或與相同於該待測物之無瑕疵待測物的分色影像資訊進行比對之步驟中,該影像資料經分色處理後即含有一綠色圖層與一藍色圖層之影像資訊,且個別將該綠色圖層與該藍色圖層之影像資訊與該待測物其無瑕疵部分之分色影像資訊,或與相同於該待測物之無瑕疵待測物其分色影像資訊進行比對,而取得該檢測結果。 For example, the optical image automatic capture method with compound detection conditions described in the first item of the scope of patent application, in which the different color layers corresponding to the light of some bands and the color separation image information of the flawless part of the object under test are combined, Or in the step of comparing the color separation image information of the non-defective test object that is the same as the test object, the image data contains the image information of a green layer and a blue layer after the color separation process. Compare the image information of the green layer and the blue layer with the color separation image information of the flawless part of the test object, or with the color separation image information of the flawless test object that is the same as the test object, And get the test result. 如申請專利範圍第1或7項所述之複合檢測條件之光學影像自動擷取方法,其中該些波段之光線為一綠色波段以及一藍色波段。 The optical image automatic capturing method with compound detection conditions as described in item 1 or 7 of the scope of patent application, wherein the light of these wavelength bands is a green wavelength band and a blue wavelength band. 如申請專利範圍第1項所述之複合檢測條件之光學影像自動擷取方法,其中於將對應該些個波段之光線之不同色圖層與該待測物其無瑕疵部分之分色影像資訊,或與相同於該待測物之無瑕疵待測物的分色影像資訊進行比對之步驟中,該影像資料經分色處理後即含有一紅色圖層、一綠色圖層以及一藍色圖層之影像資訊,且個別將該紅色圖層、該綠色圖層以及該藍色圖層之影像資訊與該待測物其無瑕疵部分之分色影像資訊,或與相同於該待測物之無瑕疵待測物其分色影像資訊進行比對,而取得該檢測結果。 For example, the optical image automatic capture method with compound detection conditions described in the first item of the scope of patent application, in which the different color layers corresponding to the light of some bands and the color separation image information of the flawless part of the object under test are combined, Or in the step of comparing with the color separation image information of the non-defective test object that is the same as the test object, the image data after color separation processing contains images of a red layer, a green layer and a blue layer Information, and separately the image information of the red layer, the green layer, and the blue layer and the color separation image information of the flawless part of the test object, or the same as the flawless test object of the test object. The color separation image information is compared to obtain the detection result. 如申請專利範圍第1或9項所述之複合檢測條件之光學影像自動擷取方法,其中該些波段之光線為一紅色波段、一綠色波段以及一藍色波段。 In the optical image automatic capturing method with compound detection conditions as described in item 1 or 9 of the scope of patent application, the light of these bands is a red band, a green band, and a blue band. 如申請專利範圍第1項所述之複合檢測條件之光學影像自動擷取方法,其中該取像裝置為一照相機構或攝影機構。 As described in item 1 of the scope of patent application, the method for automatically capturing optical images with multiple detection conditions, wherein the image capturing device is a photographing mechanism or a photographing mechanism. 如申請專利範圍第1項所述之複合檢測條件之光學影像自動擷取方法,其中該光源設置於該檢測平台之一側,該取像裝置設置於該檢測平台之另一側。As described in the first item of the scope of patent application, the method for automatically capturing optical images with multiple detection conditions, wherein the light source is disposed on one side of the detection platform, and the image capturing device is disposed on the other side of the detection platform.
TW107139393A 2018-11-06 2018-11-06 Optical image automatic capture method for compound detection conditions TWI733062B (en)

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CN201508320U (en) * 2009-10-16 2010-06-16 苏州明富自动化设备有限公司 Automatic detecting device
TW201632874A (en) * 2015-03-03 2016-09-16 Machvision Inc Automatic lighting method for optical inspection and the optical inspection machine table thereof
CN107389701A (en) * 2017-08-22 2017-11-24 西北工业大学 A kind of PCB visual defects automatic checkout system and method based on image
CN108291970A (en) * 2015-12-03 2018-07-17 特里纳米克斯股份有限公司 Detector at least one object of optical detection

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201508320U (en) * 2009-10-16 2010-06-16 苏州明富自动化设备有限公司 Automatic detecting device
TW201632874A (en) * 2015-03-03 2016-09-16 Machvision Inc Automatic lighting method for optical inspection and the optical inspection machine table thereof
CN108291970A (en) * 2015-12-03 2018-07-17 特里纳米克斯股份有限公司 Detector at least one object of optical detection
CN107389701A (en) * 2017-08-22 2017-11-24 西北工业大学 A kind of PCB visual defects automatic checkout system and method based on image

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