CN105954547A - 卡槽下压型芯片测试夹具 - Google Patents
卡槽下压型芯片测试夹具 Download PDFInfo
- Publication number
- CN105954547A CN105954547A CN201610543102.7A CN201610543102A CN105954547A CN 105954547 A CN105954547 A CN 105954547A CN 201610543102 A CN201610543102 A CN 201610543102A CN 105954547 A CN105954547 A CN 105954547A
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- CN
- China
- Prior art keywords
- chip
- projecting member
- test
- fixed
- spring
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 40
- 238000003466 welding Methods 0.000 abstract 1
- 238000000034 method Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000007812 deficiency Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0425—Test clips, e.g. for IC's
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
Description
Claims (1)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610543102.7A CN105954547A (zh) | 2016-07-11 | 2016-07-11 | 卡槽下压型芯片测试夹具 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610543102.7A CN105954547A (zh) | 2016-07-11 | 2016-07-11 | 卡槽下压型芯片测试夹具 |
Publications (1)
Publication Number | Publication Date |
---|---|
CN105954547A true CN105954547A (zh) | 2016-09-21 |
Family
ID=56899725
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201610543102.7A Pending CN105954547A (zh) | 2016-07-11 | 2016-07-11 | 卡槽下压型芯片测试夹具 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN105954547A (zh) |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1130645A (ja) * | 1997-05-12 | 1999-02-02 | Advantest Corp | 半導体デバイス試験装置 |
JP2009250899A (ja) * | 2008-04-09 | 2009-10-29 | Toyota Motor Corp | プローブピン |
CN201532942U (zh) * | 2009-08-11 | 2010-07-21 | 中芯国际集成电路制造(上海)有限公司 | 手动测试基座 |
CN202562970U (zh) * | 2012-04-26 | 2012-11-28 | 中仪电子工业股份有限公司 | 可调整探针伸缩的探测棒 |
CN103487610A (zh) * | 2013-09-22 | 2014-01-01 | 中国科学院半导体研究所 | 用于测试器件光电性能的夹具及夹具组件 |
US20140015554A1 (en) * | 2012-07-10 | 2014-01-16 | Mitsubishi Electric Corporation | Inspection apparatus |
CN204719078U (zh) * | 2015-04-30 | 2015-10-21 | 赵立军 | 一种具有清洗功能的pcb板限位测试治具 |
CN205139182U (zh) * | 2015-11-11 | 2016-04-06 | 东莞新能德科技有限公司 | 测试夹具 |
-
2016
- 2016-07-11 CN CN201610543102.7A patent/CN105954547A/zh active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1130645A (ja) * | 1997-05-12 | 1999-02-02 | Advantest Corp | 半導体デバイス試験装置 |
JP2009250899A (ja) * | 2008-04-09 | 2009-10-29 | Toyota Motor Corp | プローブピン |
CN201532942U (zh) * | 2009-08-11 | 2010-07-21 | 中芯国际集成电路制造(上海)有限公司 | 手动测试基座 |
CN202562970U (zh) * | 2012-04-26 | 2012-11-28 | 中仪电子工业股份有限公司 | 可调整探针伸缩的探测棒 |
US20140015554A1 (en) * | 2012-07-10 | 2014-01-16 | Mitsubishi Electric Corporation | Inspection apparatus |
CN103487610A (zh) * | 2013-09-22 | 2014-01-01 | 中国科学院半导体研究所 | 用于测试器件光电性能的夹具及夹具组件 |
CN204719078U (zh) * | 2015-04-30 | 2015-10-21 | 赵立军 | 一种具有清洗功能的pcb板限位测试治具 |
CN205139182U (zh) * | 2015-11-11 | 2016-04-06 | 东莞新能德科技有限公司 | 测试夹具 |
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C06 | Publication | ||
PB01 | Publication | ||
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SE01 | Entry into force of request for substantive examination | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20180607 Address after: 102600 3 floor, 2 building, No. 4 Daxing District Garden Road, Beijing, 1 unit 317 Applicant after: Beijing informed investment home intellectual property rights Operation Co., Ltd. Address before: 214000 Jiangsu Wuxi New District, Qingyuan Road 20, Taihu international science and Technology Park, sensor network university science and Technology Park, D building, first floor Applicant before: Wuxi Hi-Nano Technology Co., Ltd. |
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TA01 | Transfer of patent application right | ||
TA01 | Transfer of patent application right |
Effective date of registration: 20190311 Address after: 102600 No. 11 Lian Lane, Liyuan Village, Huangcun Town, Daxing District, Beijing Applicant after: Du Hai Address before: 102600 3 floor, 2 building, No. 4 Daxing District Garden Road, Beijing, 1 unit 317 Applicant before: Beijing informed investment home intellectual property rights Operation Co., Ltd. |
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RJ01 | Rejection of invention patent application after publication |
Application publication date: 20160921 |
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RJ01 | Rejection of invention patent application after publication |