CN105928451B - A kind of multiple rows of combination probe moving displacement test macro - Google Patents
A kind of multiple rows of combination probe moving displacement test macro Download PDFInfo
- Publication number
- CN105928451B CN105928451B CN201610366287.9A CN201610366287A CN105928451B CN 105928451 B CN105928451 B CN 105928451B CN 201610366287 A CN201610366287 A CN 201610366287A CN 105928451 B CN105928451 B CN 105928451B
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- probe
- multiple rows
- test macro
- displacement test
- moving displacement
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
Abstract
The invention discloses a kind of multiple rows of combination probe moving displacement test macro, which includes:Non-metal base plate, the non-metal base plate are equipped with multiple rows of probe aperture;Multiple rows of probe, multiple rows of probe are fixedly plugged on the non-metal base plate by multiple rows of probe aperture;Pulse forming network equipment, the pulse forming network equipment are connected by coaxial cable with each probe;Recorder, the recorder are connected by signal output cable with the pulse forming network equipment.Multiple rows of combination probe moving displacement test macro of the invention has the characteristics that big range, high resolution, response are fast.
Description
Technical field
The invention belongs to dynamic motion displacement measurement technology fields, more particularly to a kind of multiple rows of combination probe movement
Displacement test system.
Background technique
Multiple rows of combination probe displacement measurement technology is mainly used for testing the displacement curve of moving object.The system is generally wrapped
Include displacement brush, displacement probe card, coaxial cable, pulse forming network, oscillograph etc..Being displaced probe card includes multiple probe groups,
Displacement brush is installed in moving object, and when moving object is by displacement probe card, displacement brush is with moving object campaign and successively
Each probe groups are connected in order, by oscillograph recording after pulse forming network is converted into voltage signal.According to known spy
Needle gage can obtain more accurate object of which movement by data process of fitting treatment from the respective pulses moment with oscillograph recording
Displacement versus time relation.
Since the emphasis of measurement concern is accelerator when moving object is hit, measures stroke and the time is shorter, it is existing
With the presence of multiple rows of combination probe moving displacement test macro probe because design it is unreasonable caused by probe collision, generate interference
Brought by signal the problem of test error.
Summary of the invention
The present invention discloses a kind of multiple rows of combination probe moving displacement test macro, for solving existing multiple rows of combination probe
Moving displacement test macro there are probe because design it is unreasonable caused by probe collision, generate interference signal brought by test
The problem of error.
To achieve the above object, the present invention provides a kind of multiple rows of combination probe moving displacement test macro, and using as follows
Technical solution:
Non-metal base plate, the non-metal base plate are equipped with multiple rows of probe aperture;Multiple rows of probe groups, multiple rows of probe groups are logical
Multiple rows of probe aperture is crossed to be fixedly plugged on the non-metal base plate;Pulse forming network equipment, the pulse forming network
Equipment is connected by coaxial cable with every group of probe;Recorder, the recorder pass through signal output cable and the pulse
The network equipment is formed to be connected.Further, multiple rows of probe is plugged on described multiple rows of by Instant cement or epoxide-resin glue
In probe aperture.
Further, multiple rows of probe aperture measurement direction is arranged in 20 degree of angle to 30 degree of overturning angles.
Further, the length of each probe is respectively less than the spacing between every two rows of probe groups.
Further, the coaxial cable passes through probe terminal with every group of probe and is connected, and sets on the probe terminal
There is knob, the knob is for the coaxial cable and each probe to be fixed.
Further, multiple rows of probe and the probe terminal are all made of phosphor bronze and are made.
The present invention passes through the probe groups of phosphor bronze material, and part probe lead is connected to phosphorus blueness by way of mechanical crimp
On copper probe binding post, multiple groups probe groups are formed.By the probe groups of nonmetallic multiple rows of combination probe substrate positioning, when measurement, is realized
The independent action of each probe is not interfere with each other;The probe groups space structure of multiple rows of dislocation, increases probe in the close of measurement direction
Degree, improves the spatial resolution of measuring system.Make multiple rows of combination probe moving displacement test macro of the invention that there is range
Greatly, the fast feature of high resolution, response.
Detailed description of the invention
Attached drawing is used to provide further understanding of the present invention, and is constituted part of this application, schematic reality of the invention
It applies example and its explanation is used to explain the present invention, do not constitute improper limitations of the present invention.In the accompanying drawings:
Fig. 1 shows a kind of structural representations of multiple rows of combination probe moving displacement test macro described in the embodiment of the present invention
Figure;
Fig. 2 indicates that schematic diagram is arranged in the probe aperture of non-metal base plate described in the embodiment of the present invention;
Fig. 3 indicates the connection floor map of multiple rows of probe groups described in the embodiment of the present invention;
Fig. 4 indicates the connection diagrammatic cross-section of multiple rows of probe groups described in the embodiment of the present invention.
Specific embodiment
The embodiment of the present invention is described in detail below in conjunction with attached drawing, but the present invention can be defined by the claims
Implement with the multitude of different ways of covering.
Fig. 1 shows a kind of structural representations of multiple rows of combination probe moving displacement test macro described in the embodiment of the present invention
Figure.
Shown in Figure 1, a kind of multiple rows of combination probe moving displacement test macro includes:Non-metal base plate 1, the non-gold
Belong to substrate 1 and is equipped with multiple rows of probe aperture (not showing in Fig. 1);Multiple rows of probe groups 2, multiple rows of probe groups 2 pass through multiple rows of spy
Pin hole is fixedly plugged on the non-metal base plate 1;Pulse forming network equipment 4, the pulse forming network equipment 4 pass through same
Shaft cable 3 is connected with each probe;Recorder 6, the recorder 6 pass through signal output cable 5 and the pulse form networking
Network equipment 4 is connected.
In the technical scheme of this embodiment, by multiple rows of combination probe settable on non-metal base plate 1, therefore non-metal base
The length of plate 1, width, thickness is determined all in accordance with the quantity of probe, such as non-metal base plate 1 can be length 200mm, width
Multiple rows of probe aperture is arranged on non-metal base plate 1, for installing probe groups in 100mm, thickness 8-15mm;Multiple rows of probe groups 2 pass through same
Shaft cable 3 connect pulse forming network equipment 4, then pass through 5 linkage record instrument 6 of signal output cable, wherein every group of probe by
Two probes in same lengthwise position form.
During installation, multiple rows of probe groups 2 need to be only sequentially loaded into multiple rows of probe aperture that non-metal base plate 1 is arranged, then
Multiple rows of probe groups are fixed on non-metal base plate 1 using 502 glue of quick-drying or epoxide-resin glue.It is same that every group of probe connects a part
Shaft cable 3, coaxial cable 3 are connected to the input terminal of pulse forming network equipment 4, and one end of signal output cable 5 connects pulse
The output end of the network equipment 4 is formed, the other end is connect with the signal input of recorder 6, just constitutes the multiple rows of combination of the present invention
Probe motion displacement test system.
Preferably, multiple rows of probe aperture measurement direction is arranged in 20 degree of angle to 30 degree of overturning angles.
For details, reference can be made to multiple rows of probe aperture 7 shown in Fig. 2, is arranged on non-metal base plate 1, multiple rows of probe aperture measurement direction is in 20
Degree angle to 30 degree of overturning angles are arranged.
Using shifting to install for the present embodiment, so that realizing the independent action of each probe in measurement, not interfereing with each other;It is multiple rows of
The probe groups space structure of dislocation increases probe in the density of measurement direction, improves the spatial resolution of measuring system.Make
Multiple rows of combination probe moving displacement test macro of the invention has the characteristics that big range, high resolution, response are fast.
Preferably, the length of each probe is respectively less than the spacing between every two rows of probe groups.
The probe length that control non-metal base plate 1 is is less than the spacing between two rows of probe groups, that is, can ensure that front-seat probe
Heel row probe will not be encountered, interference of the front-seat probe to heel row probe is excluded with this.
Fig. 3 indicates the connection schematic diagram of multiple rows of probe groups described in the embodiment of the present invention.
Fig. 4 indicates the connection diagrammatic cross-section of multiple rows of probe groups described in the embodiment of the present invention.
Referring to shown in Fig. 3 to Fig. 4, the coaxial cable 4 passes through probe terminal 8 with each probe groups and is connected, described
Probe terminal 8 is equipped with knob 9, and the knob 9 is for the coaxial cable 4 to be fixed with each probe groups.
Preferably, multiple rows of probe groups 2 and the probe terminal 8 are all made of phosphor bronze and are made.
The present invention passes through the probe groups of phosphor bronze material, and part probe lead is connected to phosphorus by way of mechanical crimp
On bronze probe binding post, multiple groups probe groups are formed.By the probe groups of nonmetallic multiple rows of combination probe substrate positioning, when measurement, is real
Now the independent action of each probe, do not interfere with each other;The probe groups space structure of multiple rows of dislocation, increases probe in the close of measurement direction
Degree, improves the spatial resolution of measuring system.Make multiple rows of combination probe moving displacement test macro of the invention that there is range
Greatly, the fast feature of high resolution, response.
The above is a preferred embodiment of the present invention, it is noted that for those skilled in the art
For, without departing from the principles of the present invention, it can also make several improvements and retouch, these improvements and modifications
It should be regarded as protection scope of the present invention.
Claims (5)
1. a kind of multiple rows of combination probe moving displacement test macro, which is characterized in that including:
Non-metal base plate, the non-metal base plate are equipped with multiple rows of probe aperture;
Multiple rows of probe groups, multiple rows of probe groups are fixedly plugged on the non-metal base plate by multiple rows of probe aperture, often
The length of a probe is respectively less than the spacing between every two rows of probe groups;
Pulse forming network equipment, the pulse forming network equipment are connected by coaxial cable with every group of probe;
Recorder, the recorder are connected by signal output cable with the pulse forming network equipment.
2. moving displacement test macro as described in claim 1, which is characterized in that multiple rows of probe passes through Instant cement or ring
Oxygen resin glue is plugged in multiple rows of probe aperture.
3. moving displacement test macro as described in claim 1, which is characterized in that multiple rows of probe aperture measurement direction is in 20
Degree angle to 30 degree of overturning angles are arranged.
4. moving displacement test macro as described in claim 1, which is characterized in that the coaxial cable and every group of probe are logical
It crosses probe terminal to be connected, the probe terminal is equipped with knob, and the knob is used for the coaxial cable and each probe
It is fixed.
5. moving displacement test macro as claimed in claim 4, which is characterized in that multiple rows of probe and the probe terminal
Phosphor bronze is all made of to be made.
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CN201610366287.9A CN105928451B (en) | 2016-05-30 | 2016-05-30 | A kind of multiple rows of combination probe moving displacement test macro |
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CN105928451B true CN105928451B (en) | 2018-11-20 |
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CN107192844B (en) * | 2017-04-20 | 2019-10-15 | 燕山大学 | A kind of Magnetic probe array device, electromagnetism propel velocity measuring device and method |
CN108120409B (en) * | 2017-12-25 | 2020-05-19 | 武汉华星光电技术有限公司 | Film thickness measuring apparatus and film thickness measuring method |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2786266B1 (en) * | 1998-11-20 | 2001-01-19 | Moving Magnet Tech | POSITION SENSOR WITH HALL PROBE |
CN101382558A (en) * | 2008-09-05 | 2009-03-11 | 中国工程物理研究院流体物理研究所 | Piezoelectric spring probe for impact wave measurement and its manufacturing method |
CN201463826U (en) * | 2009-03-26 | 2010-05-12 | 曹宜 | Magnetic array position sensing device |
CN102261932A (en) * | 2011-04-19 | 2011-11-30 | 何宗彦 | Device and method for measuring physical parameters of irregular heterogeneous object |
CN102519349A (en) * | 2011-12-23 | 2012-06-27 | 基康仪器(北京)有限公司 | Magnet displacement sensor |
CN202305571U (en) * | 2011-07-20 | 2012-07-04 | 浙江恒强科技股份有限公司 | Fixture for testing PCB (printed circuit board) board of flat knitting machine |
-
2016
- 2016-05-30 CN CN201610366287.9A patent/CN105928451B/en active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2786266B1 (en) * | 1998-11-20 | 2001-01-19 | Moving Magnet Tech | POSITION SENSOR WITH HALL PROBE |
CN101382558A (en) * | 2008-09-05 | 2009-03-11 | 中国工程物理研究院流体物理研究所 | Piezoelectric spring probe for impact wave measurement and its manufacturing method |
CN201463826U (en) * | 2009-03-26 | 2010-05-12 | 曹宜 | Magnetic array position sensing device |
CN102261932A (en) * | 2011-04-19 | 2011-11-30 | 何宗彦 | Device and method for measuring physical parameters of irregular heterogeneous object |
CN202305571U (en) * | 2011-07-20 | 2012-07-04 | 浙江恒强科技股份有限公司 | Fixture for testing PCB (printed circuit board) board of flat knitting machine |
CN102519349A (en) * | 2011-12-23 | 2012-06-27 | 基康仪器(北京)有限公司 | Magnet displacement sensor |
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