CN102928634A - Probe rod - Google Patents

Abstract

A probe, including several probes, a row of needles and several terminal wires, each probe includes a body, two jacks opened at one end of the body and a data line arranged at the other end of the body, the data line is used to connect The signal received by the two jacks is transmitted to the oscilloscope. The pin header includes a fixed bracket and a number of pins pierced on the fixed bracket. The pins are not electrically connected, and the first end of the pin is used for Each terminal line includes a wire and a wire holder in a socket inserted into the probe, and an insertion hole electrically connected to one end of the wire is provided in the wire holder, and the insertion hole is used for inserting a plug The second end of the needle, the other end of the wire is used to connect to the test point. The probe stick of the present invention keeps a plurality of probe sticks in order and avoids the occurrence of a short circuit during testing due to exposed wires, thus bringing convenience to the test.

Description

probe

technical field

The invention relates to a probe.

Background technique

The existing probes all include two probes: a positive probe and a negative probe. During testing, one end of a first wire needs to be welded to the positive probe of the probe, and the other end is welded to a point to be tested, and one end of a second wire is welded to the negative probe, and the other end is welded to a point as far as possible. Close to the ground point around the point to be measured, that is, the signal of the point to be measured is input into the oscilloscope through the probe. However, when testing a plurality of different points to be tested at the same time, it is necessary to weld the positive and negative probes of multiple probes to the point to be tested and the grounding point around the point to be tested through wires, so It is possible that the wires cross each other due to the messy placement of the probes or the grounding point of one test point is close to another test point, which may cause the wires to short-circuit during the test, which affects the accuracy of the test and brings great harm to the test. the inconvenience.

Contents of the invention

In view of the above, it is necessary to provide a probe that can be easily measured.

A probe comprising:

A plurality of probes, each of which includes a body, two jacks at one end of the body and a data line at the other end of the body, the data line is used to transmit signals received by the two jacks to an oscilloscope;

A row of pins, including a fixed bracket and a number of pins passing through the fixed bracket, the pins are not electrically connected, and the first end of the pin is used to be inserted into a socket of the probe; as well as

A plurality of terminal wires, each terminal wire includes a wire and a wire holder, an insertion hole electrically connected to one end of the wire is provided in the wire holder, and the insertion hole is used to insert the second end of a pin, the The other end of the wire is used to connect to the test point.

The above-mentioned probe uses the pin header as the probe of the probe, and is plugged to the pin header through the terminal wire, so that multiple probes can be kept in order, avoiding the occurrence of short circuits during testing, and bringing convenience to the test .

Description of drawings

Fig. 1 is a structural diagram of a preferred embodiment of the probe of the present invention.

Fig. 2 is a test schematic diagram of the probe of the present invention.

Description of main component symbols

probe 10 Pin 20 terminal wire 30 ontology 100 jack 102 data line 104 fixed bracket 200 Pin 202 wire 300 Socket 302 insulator 304 Lead Holder 306

The following specific embodiments will further illustrate the present invention in conjunction with the above-mentioned drawings.

Detailed ways

Below in conjunction with accompanying drawing and preferred embodiment the present invention is described in further detail:

Please refer to FIG. 1 , a preferred embodiment of the probe of the present invention includes a plurality of probes 10 , a row of needles 20 and a plurality of terminal wires 30 .

Each probe 10 includes a body 100, two jacks 102 opened at one end of the body 100 and a data line 104 set at the other end of the body 100, the data line 104 is used to connect with an oscilloscope (not shown in the figure), The positive and negative signals received by the two sockets 102 are transmitted to the oscilloscope.

The pin header 20 includes a fixing bracket 200 and a plurality of pins 202 passing through the fixing bracket 200 , and the pins 202 are not electrically connected to each other. Each terminal wire 30 includes a wire 300, an insulator 304 and a wire holder 306, the wire holder 306 is provided with an insertion hole 302 electrically connected to one end of the wire 300, and the insulator 304 is used to cover the wire 300 Apart from the wire base 306 , the end of the wire 300 away from the insertion hole 302 is used for soldering to a point to be tested or a grounding point.

Please refer to FIG. 2. When in use, one end of each pin 202 of the pin header 20 is correspondingly inserted into the socket 102 of the probe 10, and the other end is correspondingly inserted into the insertion hole 302 of the terminal wire 30, and then , solder the other end of the wire 300 to a test point or a ground point. In this way, the signals of the test point and the ground point are transmitted to the data line 104 through the wire 300, the insertion hole 302, the contact pin 202 and the jack 102 in sequence, and the oscilloscope can obtain the test signal from the data line 104, thereby completing the waiting Test point.

The above-mentioned probes use the pin strip 20 as the probe of the probe, and are plugged into the pin strip 20 through the terminal wire 30 covered with the insulator 304, so that multiple probes can be kept in order and the wires 300 can be avoided. Exposure leads to the occurrence of short circuits during testing, which in turn brings convenience to testing.

Claims (2)

1. A probe comprising: A plurality of probes, each of which includes a body, two jacks at one end of the body and a data line at the other end of the body, the data line is used to transmit signals received by the two jacks to an oscilloscope; A row of pins, including a fixed bracket and a number of pins passing through the fixed bracket, the pins are not electrically connected, and the first end of the pin is used to be inserted into a socket of the probe; as well as A plurality of terminal wires, each terminal wire includes a wire and a wire holder, an insertion hole electrically connected to one end of the wire is provided in the wire holder, and the insertion hole is used to insert the second end of a pin, the The other end of the wire is used to connect to the test point. 2. The probe according to claim 1, wherein the terminal wire further comprises an insulator, and the insulator is used to cover the wire and the insertion hole.

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