CN105925951A - Crystal control device with six wafers - Google Patents
Crystal control device with six wafers Download PDFInfo
- Publication number
- CN105925951A CN105925951A CN201610531104.4A CN201610531104A CN105925951A CN 105925951 A CN105925951 A CN 105925951A CN 201610531104 A CN201610531104 A CN 201610531104A CN 105925951 A CN105925951 A CN 105925951A
- Authority
- CN
- China
- Prior art keywords
- wafer
- rotating shaft
- wafers
- shell
- cylinder
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/542—Controlling the film thickness or evaporation rate
- C23C14/545—Controlling the film thickness or evaporation rate using measurement on deposited material
- C23C14/546—Controlling the film thickness or evaporation rate using measurement on deposited material using crystal oscillators
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- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
Claims (6)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610531104.4A CN105925951B (en) | 2016-07-07 | 2016-07-07 | A kind of six chip crystalline substance control devices |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201610531104.4A CN105925951B (en) | 2016-07-07 | 2016-07-07 | A kind of six chip crystalline substance control devices |
Publications (2)
Publication Number | Publication Date |
---|---|
CN105925951A true CN105925951A (en) | 2016-09-07 |
CN105925951B CN105925951B (en) | 2018-08-24 |
Family
ID=56827015
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201610531104.4A Active CN105925951B (en) | 2016-07-07 | 2016-07-07 | A kind of six chip crystalline substance control devices |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN105925951B (en) |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002075017A1 (en) * | 2001-03-16 | 2002-09-26 | 4Wave, Inc. | System and method for controlling deposition thickness |
CN2911757Y (en) * | 2006-05-09 | 2007-06-13 | 北京奥博泰科技有限公司 | Intelligent optical membrane full automatic monitoring system |
CN101161856A (en) * | 2007-02-01 | 2008-04-16 | 河南中光学集团有限公司 | Optical coating film thickness monitoring automatic control system and monitoring method |
CN202913055U (en) * | 2012-10-31 | 2013-05-01 | 上海膜林科技有限公司 | Discrete type crystal-controlled film thickness control device |
CN203559116U (en) * | 2013-09-22 | 2014-04-23 | 无锡启晖光电科技有限公司 | Vacuum coating machine |
CN104992734A (en) * | 2015-05-22 | 2015-10-21 | 中广核检测技术有限公司 | Reactor pressure vessel bottom head penetration piece outer wall inspection apparatus |
CN105506560A (en) * | 2016-01-13 | 2016-04-20 | 中国科学院上海光学精密机械研究所 | Method for raising refractive index of hafnium oxide film |
-
2016
- 2016-07-07 CN CN201610531104.4A patent/CN105925951B/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2002075017A1 (en) * | 2001-03-16 | 2002-09-26 | 4Wave, Inc. | System and method for controlling deposition thickness |
CN2911757Y (en) * | 2006-05-09 | 2007-06-13 | 北京奥博泰科技有限公司 | Intelligent optical membrane full automatic monitoring system |
CN101161856A (en) * | 2007-02-01 | 2008-04-16 | 河南中光学集团有限公司 | Optical coating film thickness monitoring automatic control system and monitoring method |
CN202913055U (en) * | 2012-10-31 | 2013-05-01 | 上海膜林科技有限公司 | Discrete type crystal-controlled film thickness control device |
CN203559116U (en) * | 2013-09-22 | 2014-04-23 | 无锡启晖光电科技有限公司 | Vacuum coating machine |
CN104992734A (en) * | 2015-05-22 | 2015-10-21 | 中广核检测技术有限公司 | Reactor pressure vessel bottom head penetration piece outer wall inspection apparatus |
CN105506560A (en) * | 2016-01-13 | 2016-04-20 | 中国科学院上海光学精密机械研究所 | Method for raising refractive index of hafnium oxide film |
Also Published As
Publication number | Publication date |
---|---|
CN105925951B (en) | 2018-08-24 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20210224 Address after: 628017 no.059 Fushun street, Weizi Town, Zhaohua District, Guangyuan City, Sichuan Province Patentee after: Wang Wei Address before: 618 Kelin West Road, Chengdu cross strait science and Technology Industrial Development Park, Wenjiang District, Chengdu, Sichuan 610000 Patentee before: CHENGDU GUOTAI VACUUM EQUIPMENT Co.,Ltd. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20210820 Address after: 618 Kelin West Road, Chengdu cross strait science and Technology Industrial Development Park, Wenjiang District, Chengdu, Sichuan 610000 Patentee after: Sichuan Jincheng Guotai Vacuum Equipment Co.,Ltd. Address before: 628017 no.059 Fushun street, Weizi Town, Zhaohua District, Guangyuan City, Sichuan Province Patentee before: Wang Wei |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20220107 Address after: 618 Kelin West Road, Chengdu cross strait science and Technology Industrial Development Park, Wenjiang District, Chengdu, Sichuan 610000 Patentee after: CHENGDU GUOTAI VACUUM EQUIPMENT CO.,LTD. Address before: 618 Kelin West Road, Chengdu cross strait science and Technology Industrial Development Park, Wenjiang District, Chengdu, Sichuan 610000 Patentee before: Sichuan Jincheng Guotai Vacuum Equipment Co.,Ltd. |