CN105910717A - Amplifier gain uniformity testing device and method - Google Patents
Amplifier gain uniformity testing device and method Download PDFInfo
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- CN105910717A CN105910717A CN201610218369.9A CN201610218369A CN105910717A CN 105910717 A CN105910717 A CN 105910717A CN 201610218369 A CN201610218369 A CN 201610218369A CN 105910717 A CN105910717 A CN 105910717A
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- 238000009826 distribution Methods 0.000 claims abstract description 12
- 238000010998 test method Methods 0.000 claims description 10
- 238000005259 measurement Methods 0.000 claims description 7
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/02—Constructional details
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- Spectroscopy & Molecular Physics (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
Abstract
The invention discloses an amplifier gain uniformity testing device and method. The testing deice comprises a light source, a beam expanding lens, a lath amplification module, a detector and a processor, wherein the light source is used for providing seed light, the beam expanding lens is used for subjecting the seed light to beam expanding operation and therefore a large aperture light spot can be obtained, the lath amplification module is used for amplifying the large aperture light spot, the detector is used for measuring intensity distribution of the light spot, the processor is used for calculating a gain coefficient G(i, j)=P2(i, j)/P1(i, j) of each pixel point, P1(i, j) and P2(i, j) are respectively intensities of the large aperture light spot before amplification and after amplification, and gain uniformity of the lath amplification module is obtained according to the gain coefficient. Via the above mode, the amplifier gain uniformity testing device and method can be used for measuring the gain uniformity in a visual and high-precision manner.
Description
Technical field
The present invention relates to amplifier technique field, especially relate to a kind of amplifier gain uniformity
Test device and method.
Background technology
Amplifier is the key components of high power solid state laser, and the design optimizing amplifier is right
In improving the ratio of performance to price of laser instrument, laser beam quality, holding power-balance etc., there is important meaning
Justice.Gain and energy storage efficiency are two major parameters of amplifier performance, and gain characteristic includes little letter
Number gain coefficient and two aspects of flatness.Wherein flatness is to weigh amplifier performance
A key property, it is defined as the peak－to-average ratio of the unified upper gain coefficient of light beam.
The quality of overall output beam is had a great impact by the quality of flatness, amplifier gain
Uneven, operation material will be made to produce non-spherical lens effect and stress distribution, cause laser beam-wave
The Severe distortion in face and the notable destruction of polarization state.Particularly it makes spatial-intensity and the position phase of light beam
Producing perturbation, through the transmission of nonlinear dielectric, perturbation increases rapidly, causes light beam small size autohemagglutination
Jiao, causes destructive destruction to the optical element in light path.Therefore the uniformity pair of gain is detected
The impact reducing self-focusing effect has great importance.
In prior art, just with round-about ways such as fluorescence distribution, or width (one-dimensional)
The overall gain characteristic of gain characteristic reaction amplifier, do not have method of testing directly perceived, simple and
Device.
Summary of the invention
The technical problem that present invention mainly solves is to provide the test of a kind of amplifier gain uniformity
Device and method, it is possible to measure flatness intuitively, accurately.
For solving above-mentioned technical problem, the technical scheme that the present invention uses is: provide one to put
The test device of big device flatness, this test device includes:
Light source, it is provided that seed light；
Beam expanding lens, expands described seed light, obtains heavy caliber hot spot；
Lath amplification module, for being amplified described heavy caliber hot spot；
Detector, measures the intensity distributions of hot spot；
Processor, calculate each pixel gain coefficient G (i, j)=P2 (i, j)/P1 (i, j), wherein,
(i, j) (i, the intensity of the heavy caliber hot spot before j) being respectively amplification and after amplification, further according to gain with P2 for P1
Coefficient obtains the flatness of lath amplification module.
Wherein, according to the gain coefficient G of each pixel, (i j) obtains gain to described processor respectively
Maximum and meansigma methods, calculate flatness further
((i, j), wherein, G_uniformity represents that lath is put to G_uniformity=G_max for i, j)/G_average
The flatness of big module, (i j) represents the maximum of gain, G_average (i, j) table to G_max
Show the meansigma methods of gain.
Wherein, described beam expanding lens includes horizontal beam expanding lens and longitudinal beam expanding lens, wherein, described laterally
Beam expanding lens and described longitudinal beam expanding lens carry out horizontal and vertical expanding to described seed light respectively, with
To described heavy caliber hot spot.
Wherein, described device also includes reflecting mirror, for the described heavy caliber light after expanding
Speckle reflects, to incide in described lath amplification module.
Wherein, described device also includes beam-shrinked mirror, for the hot spot after amplifying being carried out contracting bundle,
To obtain the hot spot matched with detector size.
Wherein, described device also includes attenuator and filter plate, for respectively to after contracting bundle
Hot spot carries out decaying and filtering, to obtain the intensity distributions of hot spot on the detector.
Solving above-mentioned technical problem, another technical solution used in the present invention is: provide one to put
The method of testing of big device flatness, this states method of testing and includes following:
Seed light is provided；
Described seed light is expanded, obtains heavy caliber hot spot；
Spot intensity before detector measurement amplifies is distributed；
By lath amplification module, described heavy caliber hot spot is amplified；
Spot intensity after detector measurement amplifies is distributed；
Calculate each pixel gain coefficient G (i, j)=P2 (i, j)/P1 (i, j), wherein, P1 (i, j) and
(i, the intensity of the heavy caliber hot spot before j) being respectively amplification and after amplification obtain P2 further according to gain coefficient
Take the flatness of lath amplification module.
Wherein, the step bag of the described flatness obtaining lath amplification module according to gain coefficient
Include:
Gain coefficient G according to each pixel (i, j) obtains maximum and the meansigma methods of gain respectively,
Further calculating flatness G_uniformity=G_max (i, j)/G_average (i, j), wherein,
G_uniformity represents the flatness of lath amplification module, and (i j) represents gain to G_max
Maximum, (i j) represents the meansigma methods of gain to G_average.
Wherein, the described step expanding described seed light includes:
Described seed light is carried out respectively horizontal and vertical expanding, to obtain described heavy caliber hot spot.
Wherein, described method of testing also includes:
Described heavy caliber hot spot after expanding is reflected, to incide the amplification of described lath
In module；
Hot spot after amplifying is carried out contracting bundle, to obtain the hot spot matched with detector size；
Respectively the hot spot after contracting bundle is decayed and filtered, to obtain hot spot on the detector
Intensity distributions.
The invention has the beneficial effects as follows: be different from the situation of prior art, the present invention provides one to put
The test device of big device flatness, this test device includes that light source, beam expanding lens, lath amplify
Module and processor, wherein, light source provides seed light, and seed light is expanded by beam expanding lens,
Obtaining heavy caliber hot spot, lath amplification module is used for being amplified heavy caliber hot spot, processor meter
(((i, j), wherein, (i, j) (i j) divides P1 with P2 for i, j)/P1 for i, j)=P2 to calculate the gain coefficient G of each pixel
Not Wei amplify before and the intensity of heavy caliber hot spot after amplifying, obtain lath further according to gain coefficient and put
The flatness of big module.Therefore, the present invention can measure flatness intuitively, and
Test result is in units of pixel, and data volume is big, degree of accuracy is high, it is to avoid data matching brings
Error.
Accompanying drawing explanation
Fig. 1 is the knot of the test device of a kind of amplifier gain uniformity that the embodiment of the present invention provides
Structure schematic diagram；
Fig. 2 is the stream of the method for testing of a kind of amplifier gain uniformity that the embodiment of the present invention provides
Cheng Tu.
Detailed description of the invention
Referring to Fig. 1, Fig. 1 is a kind of amplifier gain uniformity that the embodiment of the present invention provides
The structural representation of test device.As it is shown in figure 1, the test device 10 of the present invention includes light source
11, beam expanding lens 12, lath amplification module 13, detector 14 and processor 15.
Wherein, light source 11 provides seed light.Seed light is undersized circular light spot, light beam matter
Amount is preferably.Preferably outgoing from seed laser.
Seed light is expanded by beam expanding lens 12, obtains heavy caliber hot spot.In the present embodiment, expand
Bundle mirror 12 includes horizontal beam expanding lens 121 and longitudinal beam expanding lens 122, wherein, described horizontal beam expanding lens
121 and described longitudinal beam expanding lens 122 respectively the hot spot of described seed light is carried out horizontal and vertical expansion
Bundle, to obtain heavy caliber hot spot.This heavy caliber hot spot is essentially identical with slab crystal face size,
And it is preferably oval hot spot.It should be noted that the test device of the present embodiment can also be used for rod
The test of the flatness of shape amplifier, when the test of the flatness for Rod Amplifier
Time test hot spot directly carry out expanding of circular light spot, both direction need not expand respectively
Bundle.
Lath amplification module 13 is for being amplified heavy caliber hot spot.Wherein, heavy caliber hot spot
Preferably in the crystals propagation of lath amplification module 13 in the way of zig-zag, with amplifier work
When making, the light path of seed light is identical.
Detector 14 measures the intensity distributions before hot spot amplifies and after amplification.
Processor 15 calculate each pixel gain coefficient G (i, j)=P2 (i, j)/P1 (i, j), wherein,
(i, j) (i, the intensity of the heavy caliber hot spot before j) being respectively amplification and after amplification, further according to gain with P2 for P1
Coefficient obtains the flatness of lath amplification module.Concrete, processor 15 is according to each picture
(i j) obtains maximum and the meansigma methods of gain, calculates gain further the gain coefficient G of vegetarian refreshments respectively
Uniformity G_uniformity=G_max (i, j)/G_average (i, j), wherein, G_uniformity table
Show the flatness of lath amplification module, G_max (i, j) represents the maximum of gain,
(i j) represents the meansigma methods of gain to G_average.Therefore, the intuitive measurement results of the present embodiment, survey
Amount process is simple.Further, in the range of the present embodiment can directly obtain amplifier module heavy caliber
Flatness, test result is in units of pixel, and data volume is big, and degree of accuracy is high, it is to avoid
The error that data matching brings.
Further, the test device 10 of the present embodiment also include reflecting mirror 16, beam-shrinked mirror 17,
Attenuator 18 and filter plate 19.Wherein, reflecting mirror 16 is for the heavy caliber light after expanding
Speckle reflects, to incide in lath amplification module 13.Beam-shrinked mirror 17 is for through amplifying
After hot spot carry out contracting bundle, to obtain the hot spot matched with detector size.Attenuator 18 He
Filter plate 19 is for decaying and filter the hot spot after contracting bundle, with at detector respectively
On obtain the intensity distributions of hot spot.
The present invention is additionally based upon previously described test device and provides a kind of amplifier gain uniformity
Method of testing.Specifically referring to Fig. 2, this method of testing includes following:
Step S1: seed light is provided.Wherein, seed light is undersized circular light spot, light beam matter
Amount is preferably.Preferably outgoing from seed laser.
Step S2: expand seed light, obtains heavy caliber hot spot.In this step, particularly as follows:
Seed light is carried out respectively horizontal and vertical expanding, to obtain heavy caliber hot spot.This heavy caliber
Hot spot is essentially identical with slab crystal face size, and is preferably oval hot spot.
It should be noted that the method for testing of the present embodiment can also be used for the gain of Rod Amplifier equal
The test of even property, when test for the flatness of Rod Amplifier, test hot spot directly enters
Expanding of row circular light spot, both direction need not expand respectively.
Step S3: the spot intensity before detector measurement amplifies is distributed；
Step S4: heavy caliber hot spot is amplified by lath amplification module.Wherein, heavy caliber
Hot spot preferably in the way of zig-zag lath amplification module crystals propagate, with amplifier work
When making, the light path of seed light is identical.
Also include reflecting, the heavy caliber hot spot after expanding to incide before this step
In lath amplification module.
Step S5: the spot intensity after detector measurement amplifies is distributed；
Step S6: calculate each pixel gain coefficient G (i, j)=P2 (i, j)/P1 (i, j), wherein,
(i, j) (i, the intensity of the heavy caliber hot spot before j) being respectively amplification and after amplification, further according to gain with P2 for P1
Coefficient obtains the flatness of lath amplification module.
This step is particularly as follows: (i j) obtains gain the most respectively according to the gain coefficient G of each pixel
Big value and meansigma methods, calculate flatness further
((i, j), wherein, G_uniformity represents that lath is put to G_uniformity=G_max for i, j)/G_average
The flatness of big module, (i j) represents the maximum of gain, G_average (i, j) table to G_max
Show the meansigma methods of gain.
Wherein, the method for testing of the present embodiment also includes carrying out the hot spot after amplifying contracting bundle,
To obtain the hot spot that matches with detector size and respectively the hot spot after contracting bundle to be carried out
Decay and filtration, to obtain the intensity distributions of hot spot on the detector.
Therefore, the present invention can measure flatness intuitively.Further, the present invention can be direct
Be amplified the flatness in the range of device module heavy caliber, test result in units of pixel,
Data volume is big, degree of accuracy is high, it is to avoid the error that data matching brings.
The foregoing is only embodiments of the invention, not thereby limit the scope of the claims of the present invention,
Every equivalent structure utilizing description of the invention and accompanying drawing content to be made or equivalence flow process conversion, or
Directly or indirectly being used in other relevant technical fields, the patent being the most in like manner included in the present invention is protected
In the range of protecting.
Claims (10)
1. the test device of an amplifier gain uniformity, it is characterised in that described test fills
Put and include:
Light source, it is provided that seed light；
Beam expanding lens, expands described seed light, obtains heavy caliber hot spot；
Lath amplification module, for being amplified described heavy caliber hot spot；
Detector, for measuring the intensity distributions of hot spot；
Processor, calculate each pixel gain coefficient G (i, j)=P2 (i, j)/P1 (i, j), wherein,
(i, j) (i, the intensity of the heavy caliber hot spot before j) being respectively amplification and after amplification, further according to gain with P2 for P1
Coefficient obtains the flatness of lath amplification module.
Test device the most according to claim 1, it is characterised in that described processor root
According to the gain coefficient G of each pixel, (i j) obtains maximum and the meansigma methods of gain, further respectively
Calculating flatness G_uniformity=G_max (i, j)/G_average (i, j), wherein,
G_uniformity represents the flatness of lath amplification module, and (i j) represents gain to G_max
Maximum, (i j) represents the meansigma methods of gain to G_average.
Test device the most according to claim 1, it is characterised in that described beam expanding lens bag
Include horizontal beam expanding lens and longitudinal beam expanding lens, wherein, described horizontal beam expanding lens and described longitudinal beam expanding lens
Respectively described seed light is carried out horizontal and vertical expanding, to obtain described heavy caliber hot spot.
Device the most according to claim 1, it is characterised in that described device also includes instead
Penetrate mirror, for the described heavy caliber hot spot after expanding being reflected, to incide described plate
In bar amplification module.
Test device the most according to claim 4, it is characterised in that described device also wraps
Include beam-shrinked mirror, for the hot spot after amplifying being carried out contracting bundle, to obtain and detector size phase
The hot spot of coupling.
Test device the most according to claim 5, it is characterised in that described device also wraps
Include attenuator and filter plate, for respectively the hot spot after contracting bundle being decayed and is filtered, with
Obtain the intensity distributions of hot spot on the detector.
7. the method for testing of an amplifier gain uniformity, it is characterised in that described test side
Method includes following:
Seed light is provided；
Described seed light is expanded, obtains heavy caliber hot spot；
Spot intensity before detector measurement amplifies is distributed；
By lath amplification module, described heavy caliber hot spot is amplified；
Spot intensity after detector measurement amplifies is distributed；
Calculate each pixel gain coefficient G (i, j)=P2 (i, j)/P1 (i, j), wherein, P1 (i, j) and
(i, the intensity of the heavy caliber hot spot before j) being respectively amplification and after amplification obtain P2 further according to gain coefficient
Take the flatness of lath amplification module.
Method of testing the most according to claim 7, it is characterised in that described according to gain
The step of the flatness that coefficient obtains lath amplification module includes:
Gain coefficient G according to each pixel (i, j) obtains maximum and the meansigma methods of gain respectively,
Further calculating flatness G_uniformity=G_max (i, j)/G_average (i, j), wherein,
G_uniformity represents the flatness of lath amplification module, and (i j) represents gain to G_max
Maximum, (i j) represents the meansigma methods of gain to G_average.
Method of testing the most according to claim 7, it is characterised in that to described seed light
The step carrying out expanding includes:
Described seed light is carried out respectively horizontal and vertical expanding, to obtain described heavy caliber hot spot.
Method of testing the most according to claim 7, it is characterised in that described method of testing
Also include:
Described heavy caliber hot spot after expanding is reflected, to incide the amplification of described lath
In module；
Hot spot after amplifying is carried out contracting bundle, to obtain the hot spot matched with detector size；
Respectively the hot spot after contracting bundle is decayed and filtered, to obtain hot spot on the detector
Intensity distributions.
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| CN201610218369.9A CN105910717B (en) | 2016-04-09 | 2016-04-09 | Device and method for testing gain uniformity of amplifier |
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| CN201610218369.9A CN105910717B (en) | 2016-04-09 | 2016-04-09 | Device and method for testing gain uniformity of amplifier |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1162856A (en) * | 1996-02-10 | 1997-10-22 | 三星电子株式会社 | Optical amplifiers |
| US20020196492A1 (en) * | 2001-06-25 | 2002-12-26 | Silicon Light Machines | Method and apparatus for dynamic equalization in wavelength division multiplexing |
| CN102239434A (en) * | 2008-12-04 | 2011-11-09 | Imra美国公司 | Highly rare-earth-doped optical fibers for fiber lasers and amplifiers |
| CN102645745A (en) * | 2012-04-18 | 2012-08-22 | 清华大学 | Control device and control method for laser light intensity distribution and wave front |
-
2016
- 2016-04-09 CN CN201610218369.9A patent/CN105910717B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1162856A (en) * | 1996-02-10 | 1997-10-22 | 三星电子株式会社 | Optical amplifiers |
| US20020196492A1 (en) * | 2001-06-25 | 2002-12-26 | Silicon Light Machines | Method and apparatus for dynamic equalization in wavelength division multiplexing |
| CN102239434A (en) * | 2008-12-04 | 2011-11-09 | Imra美国公司 | Highly rare-earth-doped optical fibers for fiber lasers and amplifiers |
| CN102645745A (en) * | 2012-04-18 | 2012-08-22 | 清华大学 | Control device and control method for laser light intensity distribution and wave front |
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