CN106198450B - A kind of device measuring material nonlinearity absorption curve - Google Patents
A kind of device measuring material nonlinearity absorption curve Download PDFInfo
- Publication number
- CN106198450B CN106198450B CN201610581862.7A CN201610581862A CN106198450B CN 106198450 B CN106198450 B CN 106198450B CN 201610581862 A CN201610581862 A CN 201610581862A CN 106198450 B CN106198450 B CN 106198450B
- Authority
- CN
- China
- Prior art keywords
- laser
- absorption curve
- sample
- splitter
- tested
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
Abstract
The present invention provides a kind of devices for measuring material nonlinearity absorption curve, the device obtains required Single wavelength laser using crystal double frequency system and dispersing prism, then incident laser intensity is improved by long focus lens, using the energy and spot size of scientific grade CCD camera record incident laser, shoot laser energy is measured by energy meter, obtains the non-linear absorption curve of sample to be tested.The device of measurement material nonlinearity absorption curve of the invention improves the measurement range of non-linear absorption curve, simplifies non-linear absorption curve measurement system, realizes multi-wavelength, wide scope, the measurement of high precision nonlinear absorption curve.
Description
Technical field
The invention belongs to light lasers and matter interaction field, and in particular to a kind of measurement material nonlinearity absorption curve
Device.
Background technique
When light passes through material, the interactions such as atom, electronics in light and material cause the absorption of light；In low light condition
The absorption coefficient of lower material be constant, at this time be absorbed as linear absorption；The absorption of material becomes with laser intensity when strong light irradiation
Change, shows non-linear absorption properties: the phenomenon that absorption coefficient reduces with the increase of incident intensity referred to as saturated absorption；It absorbs
It is anti-saturated absorption that coefficient is increased with the increase of incident intensity.The non-linear absorption of material plays important in light laser
Laser pulse compression may be implemented using the saturated absorption characteristic of material in role, can be with using the anti-saturated absorption characteristic of material
Make the optical devices such as optical Limiting.However, the non-linear absorption of material is the key that cause damage in high power laser system
Link becomes the main bottleneck for restricting high power laser system energy lift.Therefore, the non-linear absorption properties tool of research material
The non-linear absorption curve for being of great significance, and accurately measuring material is basis and the key of research.
The non-linear absorption of material is attributed to the Multiphoton Absorbtion of material more, the non-linear absorption of material and incidence wave with
It closes, when non-linear absorption of research material need to measure non-linear absorption curve when different wave length incidence.When laser passes through material,
Material can cause the variation of its transmitance to the absorption of light, and the transmitance of material can characterize material with the variation of incident laser intensity
The non-linear absorption of material.The non-linear absorption curve of measurement material generallys use Z- scanning technique, and Z- scanning technique uses lens
It focuses and obtains the laser that intensity changes along Z-direction, obtain its non-linear absorption curve in the position of Z-direction by changing sample, Z- is swept
The requirement when technology of retouching reduces measurement non-linear absorption curve to laser output energy, but the method is smaller suitable for thickness
Sample, and the position of sample laser light incident crystal when Z-direction is mobile also will variation, inevitably introduce measurement error.With
The development of high power laser light technology, Transmissivity measurement method be also widely applied, Transmissivity measurement method is by sample to be tested position
Fixation is set, the transmittance curve of material is measured by the way that incident laser intensity is continuously improved, is reflected using the variation of material transmitance
Its non-linear absorption properties, this method is to thickness of sample without stringent limitation, and sample position is fixed when measurement, and error is smaller.Measurement
Beam-splitter is usually utilized to obtain the incident laser of small percentage and detect using energy meter, energy when the non-linear absorption curve of material
Meter has certain response lag, and energy meter is difficult to respond when low-energy laser incidence, and which limits non-linear absorption curves
Measurement range, and also need independent measurement incident laser spot size, increase the complexity of measuring device.
Currently, needing to improve nonlinear transmission mensuration, measurement range is improved, simplifies measuring system.
Summary of the invention
Technical problem to be solved by the invention is to provide a kind of devices for measuring material nonlinearity absorption curve.
The device of measurement material nonlinearity absorption curve of the invention, its main feature is that: the device includes pulse laser
Device, crystal double frequency system, dispersing prism, long focus lens, diaphragm, beam-splitter I, beam-splitter II, attenuator, scientific grade CCD camera,
Sample to be tested and energy meter, pulse laser emission pulse laser inject dispersing prism by crystal double frequency system, obtain unicast
Long laser, Single wavelength laser is formed after long focus lens and diaphragm focuses laser, focuses laser light incident to beam-splitter I, beam-splitter I
Reflection laser I be reflected into reflection laser II through beam-splitter II, reflection laser II to attenuator transmits reflection laser III, reflection
Laser III enters scientific grade CCD camera；The transmission laser I of beam-splitter I becomes transmission laser II through sample to be tested and enters energy meter；
Ratio between the focal length f of the long focus lens, the thickness h of sample to be tested and the spot diameter d of Single wavelength laser
For f/h >=100, f/d >=100；The sample to be tested is to the ratio between the distance L of focal length lens focus and the thickness h of sample to be tested
For L/h >=30；The fold line distance of the photosurface of the scientific grade CCD camera to long focus lens is s, s=f-L.
The pulsewidth τ of the pulse laser of the described pulse laser transmitting is picosecond or nanosecond order the wavelength of pulse laser
Range is 1053 nm or 1064 nm.
The crystal double frequency system includes the KDP crystalloid of a piece of or a piece of above arranged in series.
The device of the measurement material nonlinearity absorption curve is placed on the damping optical platform in darkroom, Scientific Grade
Without interference of stray light around CCD camera.
The material of the beam-splitter I and beam-splitter II is fused silica, reflectivity 4%.
Two frequencys multiplication, frequency tripling, quadruple and the fifth harmonic laser that the crystal double frequency system can be realized fundamental frequency light are defeated
Out, and by dispersing prism the Single wavelength laser of different wave length is chosen.
Ratio f/d >=100 between the focal length f and spot diameter d of the long focus lens, can reduce thickness of sample and cause
Sample front and rear surfaces spot size difference absolute value.
After the diaphragm is placed in long focus lens, the shape and bore of Single wavelength laser facula are controlled by diaphragm, it can
Laser is more uniformly focused to obtain shape more rule, gray scale.
The sample to be tested has certain transmitance to incident laser, and sample to be tested to focal length lens focus away from
The ratio between thickness h from L and sample to be tested is L/h >=30, can reduce sample front and rear surfaces spot size caused by thickness of sample
The relative value of difference.
The scientific grade CCD camera has lower response lag and wider response wave band, utilizes scientific grade CCD phase
The energy and hot spot of machine testing reflection laser III, s=f-L make the hot spot ruler of reflection laser III on scientific grade CCD camera photosurface
It is very little equal with the spot size of transmission laser I on sample to be tested.
The two-stage light splitting of beam-splitter I, beam-splitter II that the device of measurement material nonlinearity absorption curve of the invention uses
Plate samples, while the attenuator of appropriate attenuation multiplying power is placed before scientific grade CCD camera, guarantees incident pulsed laser energy most
When big, the maximum value for the hot spot gray scale that scientific grade CCD camera obtains is the 65%-95% that scientific grade CCD camera is saturated gray scale.
The device of measurement material nonlinearity absorption curve of the invention is placed in darkroom on damping optical platform, surrounding nothing
Interference of stray light.
The device of measurement material nonlinearity absorption curve of the invention has the advantages that
1. using KDP crystalloid by fundamental frequency optical sccond-harmonic generation, and required Single wavelength laser is sorted out using dispersing prism, it can
Realize the non-linear absorption curve of the Single wavelength laser measurement material using multi-wavelength；
2. scientific grade CCD camera has lower response lag and higher saturation gray scale, scientific grade CCD camera is utilized
Single wavelength laser energy is detected, the non-linear absorption curve of material can be measured within the scope of wider Single wavelength laser intensity；
It, can be accurate according to this distribution 3. the spot intensity for being detected incident laser simultaneously using scientific grade CCD camera is distributed
The size for obtaining hot spot, simplifies measuring device, improves measurement accuracy.
The device of measurement material nonlinearity absorption curve of the invention obtains institute using crystal double frequency system and dispersing prism
Then the Single wavelength laser needed improves incident laser intensity by long focus lens, record incident laser using scientific grade CCD camera
Energy and spot size, shoot laser energy is measured by energy meter, obtains the non-linear absorption curve of sample to be tested.This
The device of the measurement material nonlinearity absorption curve of invention improves the measurement range of non-linear absorption curve, simplifies non-linear
Absorption curve measuring system realizes multi-wavelength, wide scope, the measurement of high precision nonlinear absorption curve.
Detailed description of the invention
Fig. 1 is the schematic device of measurement material nonlinearity absorption curve of the invention；
In figure, long 5. diaphragm 6. of focus lens of 1. pulse laser, 2. crystal double frequency system, 3. dispersing prism 4.
10. sample to be tested of beam-splitter I 7. beam-splitter, II 8. attenuator, 9. scientific grade CCD camera, 11. energy meter.
Specific embodiment
Below with reference to embodiment and attached drawing, the present invention will be further described.Following embodiment is merely to illustrate the present invention,
And not limitation of the present invention.Related person skilled in the art without departing from the spirit and scope of the present invention, goes back
It can make a variety of changes, replacement and variant, therefore same technical solution also belongs to scope of the invention.
As shown in Figure 1, the device of measurement material nonlinearity absorption curve of the invention, including pulse laser 1, crystal times
Display system 2, dispersing prism 3, long focus lens 4, diaphragm 5, beam-splitter I 6, beam-splitter II 7, attenuator 8, scientific grade CCD camera 9,
Sample to be tested 10 and energy meter 11,1 emission pulse laser of pulse laser inject dispersing prism 3 by crystal double frequency system 2,
Single wavelength laser is obtained, Single wavelength laser is formed after long focus lens 4 and diaphragm 5 focuses laser, focuses laser light incident to light splitting
The reflection laser I of plate I 6, beam-splitter I 6 is reflected into reflection laser II through beam-splitter II 7, and reflection laser II to attenuator 8 transmits
Reflection laser III, reflection laser III enter scientific grade CCD camera 9, and the transmission laser I of beam-splitter I 7 becomes saturating through sample to be tested 10
It penetrates laser II and enters energy meter 11；
Compare between the focal length f of the long focus lens 4, the thickness h of sample to be tested 10 and the spot diameter d of Single wavelength laser
Example is f/h >=100, f/d >=100；The sample to be tested 10 arrives the distance L of long 4 focus of focus lens and the thickness of sample to be tested 10
Spending the ratio between h is L/h >=30；The fold line distance of the photosurface of the scientific grade CCD camera 9 to long focus lens 4 is s, s=f-L.
The pulsewidth τ for the pulse laser that the pulse laser 1 emits is picosecond or nanosecond order the wavelength of pulse laser
Range is 1053 nm or 1064 nm.
The crystal double frequency system 2 includes the KDP crystalloid of a piece of or a piece of above arranged in series.
The device of the measurement material nonlinearity absorption curve is placed on the damping optical platform in darkroom, Scientific Grade
Without interference of stray light around CCD camera 9.
The material of the beam-splitter I 6 and beam-splitter II 7 is fused silica, reflectivity 4%.
Embodiment 1
Pulse laser gain media is Nd:YLF, exports fundamental frequency lightω 1=1053 nm, pulsewidth τ=50 ps, fundamental frequency hot spot
Diameter 0.7cm, shoot laser horizontal polarization；Crystal double frequency system is made of KDP and DKDP crystal, is obtained after being frequency convertedω 2The quadruple frequency light of=263 nm；Dispersing prism and long focus lens are the ultraviolet saturating element of height, and the focal length f of long focus lens is about
130 cm；The material of beam-splitter is fused silica, reflectivity 4%；Sample to be tested is the DKDP crystal that deuterium content is 66%, and sample is thick
Degree h is 0.8 cm, and sample surfaces are finely polished；The resolution ratio of scientific grade CCD camera is 1024 pixels × 1024 pixels, single
A pixel is having a size of 13 μm of 13 μ m；Attenuator is laser of quadruple attenuator；The measurement range of energy meter is 20 μ J-
10 J；Scientific grade CCD camera and sample to be tested are placed in can be along the translation stage that optical path translates, and scientific grade CCD camera is photosensitive
Face and sample to be tested to lens distance s be 103 cm；Entire measuring system is placed in darkroom on damping optical platform, around without miscellaneous
Astigmatism interference.
The measuring process of the method for the measurement material nonlinearity absorption curve is as follows:
1. pulse laser emission pulse laser adjusts the matching angle of KDP and DKDP crystal in crystal double frequency system, directly
Frequency-doubling conversion efficiency to pulse laser reaches maximum value；
2. the pulsed laser energy of pulse laser transmitting is minimum, multi-disc attenuator is added before CCD camera, passes through science
The gray scale of grade CCD camera observation hot spot, hot spot gray value are lower than the saturation gray scale of scientific grade CCD camera；Pulse is gradually increased to swash
For the pulsed laser energy of light device transmitting until maximum, the quantity of attenuator is constant, and the ash of hot spot is observed by scientific grade CCD camera
Degree, hot spot gray value are lower than the saturation gray scale of scientific grade CCD camera；The quantity for reducing attenuator piecewise, passes through scientific grade CCD phase
The variation of the gray scale of hot spot is observed on machine, until the hot spot gray value in scientific grade CCD camera is the saturation of scientific grade CCD camera
The 71% of gray scale.
3. removing sample to be tested, from low to high, series 12 adjusts the pulse laser of pulse laser (1) transmitting step by step
Energy records hot spot P of the reflection laser III in scientific grade CCD camera10Hot spot P1nIntensity profile, while recording energy meter
Reading Ein(P10)-Ein(P1n)；
4. placing sample to be tested, from low to high, series 12 adjusts the pulse laser energy of pulse laser transmitting step by step
Amount records hot spot P of the reflection laser III in scientific grade CCD camera20Hot spot P2nIntensity profile, while recording energy meter
Read Eout(P20)-Eout(P2n)；
5. drawing the gray scale of each point and the relation curve G (X, Y) of position on hot spot, G (X, Y) is Gaussian Profile, hot spot half
High wide about 20 pixels, the peak gray of hot spot is Gp, background signal G0；100 pixels × 100 pixels are chosen around hot spot
Range, calculating hot spot gray scale QUOTE in the range ；
The equivalent facula area QUOTE of Gaussian beam ；It is final to obtain hot spot P10Hot spot
P1nCorresponding S (P10)-S(P1n) and GA(P10)-GA(P1n), hot spot P20Hot spot P2nCorresponding S (P20)-S(P2n) and GA(P20)-
GA(P2n)；
6. by the E of step 3in(P10)-Ein(P1n) and step 5 GA(P10)-GA(P1n) correspond, hot spot mean value gray scale
It is in a linear relationship with incident laser energy approximation, in order to obtain more accurate Ein(GA) relationship, using second order polynomial fit number
According to；
7. utilizing Ein(GA) relationship calculate sample to be tested GA(P20)-GA(P2n) corresponding Ein(P20)-Ein(P2n)；
8. passing through T=Ein/EoutThe transmitance for calculating sample to be tested, obtains T (P20)-T(P2n)；
9. passing through Iin= Ein/ (τ S) calculates laser intensity, obtains Iin(P20)- Iin(P2n)；
10. by the T (P of step 820)-T(P2n) and step 9 Iin(P20)- Iin(P2n) correspond, it is quasi- by multinomial
It closes and obtains T (Iin)。
The result shows that with the increase of laser intensity, the transmitance of DKDP crystal is in non-linear decline, and fall off rate by
It is decrescence small；Laser intensity is greater than 10 GW/cm2When, transmitance gradually tends to definite value.
Embodiment 2
The present embodiment and the embodiment of embodiment 1 are essentially identical, and the main distinction is, crystal double frequency system is two pieces
KDP crystal generatesω 2The frequency tripling light of=351 nm；The focal length of long focus lens is about 140 cm, scientific grade CCD camera photosurface
Distance with sample to be tested to lens is 104 cm；Attenuator is frequency tripled laser attenuator, the hot spot in scientific grade CCD camera
Gray scale maximum value is saturated the 87% of gray scale for it.The result shows that the transmitance of DKDP crystal is in non-with the increase of laser intensity
Linear decline, the non-linear absorption of DKDP crystal significantly reduces under 351 nm laser irradiations compared with the result in embodiment 1.
Embodiment 3
The present embodiment and the embodiment of embodiment 1 are essentially identical, and the main distinction is, pulse laser gain media is
Nd:YAG exports fundamental frequency lightω 1=1064 nm；Crystal double frequency system is KDP and DKDP crystal, the cutting of KDP and DKDP crystal
Angle pin generates 1064 nm laserω 2The quadruple frequency light of=266 nm.
Claims (5)
1. a kind of device for measuring material nonlinearity absorption curve, it is characterised in that: the device includes pulse laser
(1), crystal double frequency system (2), dispersing prism (3), long focus lens (4), diaphragm (5), beam-splitter I (6), beam-splitter II (7), decline
Subtract piece (8), scientific grade CCD camera (9), sample to be tested (10) and energy meter (11), pulse laser (1) emission pulse laser,
Dispersing prism (3) are injected by crystal double frequency system (2), obtain Single wavelength laser, Single wavelength laser is through long focus lens (4) and light
Late (5) form focus laser afterwards, focus laser light incident to beam-splitter I (6), the reflection laser I of beam-splitter I (6) is through beam-splitter II
(7) it is reflected into reflection laser II, reflection laser II to attenuator (8) transmits reflection laser III, and reflection laser III enters science
Grade CCD camera (9)；The transmission laser I of beam-splitter I (6) becomes transmission laser II through sample to be tested (10) and enters energy meter (11)；
Compare between the focal length f of the long focus lens (4), the thickness h of sample to be tested (10) and the spot diameter d of Single wavelength laser
Example is f/h >=100, f/d >=100；The sample to be tested (10) arrives the distance L and sample to be tested of long focus lens (4) focus
(11) the ratio between thickness h is L/h >=30；The photosurface of the scientific grade CCD camera (9) to long focus lens (4) broken line away from
From for s, s=f-L.
2. a kind of device for measuring material nonlinearity absorption curve according to claim 1, it is characterised in that: the arteries and veins
Rush the pulsewidth of the pulse laser of laser (1) transmittingτFor picosecond or nanosecond order, the wavelength of pulse laser be 1053 nm or
1064 nm。
3. a kind of device for measuring material nonlinearity absorption curve according to claim 1, it is characterised in that: the crystalline substance
Body frequency doubling system (2) includes the KDP crystalloid of a piece of above arranged in series.
4. a kind of device for measuring material nonlinearity absorption curve according to claim 1, it is characterised in that: the survey
The device of amount material nonlinearity absorption curve is placed on the damping optical platform in darkroom, around scientific grade CCD camera (9)
Without interference of stray light.
5. a kind of device for measuring material nonlinearity absorption curve according to claim 1, it is characterised in that: point
The material of tabula rasa I (6) and beam-splitter II (7) is fused silica, reflectivity 4%.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610581862.7A CN106198450B (en) | 2016-07-22 | 2016-07-22 | A kind of device measuring material nonlinearity absorption curve |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610581862.7A CN106198450B (en) | 2016-07-22 | 2016-07-22 | A kind of device measuring material nonlinearity absorption curve |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN106198450A CN106198450A (en) | 2016-12-07 |
| CN106198450B true CN106198450B (en) | 2019-02-22 |
Family
ID=57491333
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610581862.7A Active CN106198450B (en) | 2016-07-22 | 2016-07-22 | A kind of device measuring material nonlinearity absorption curve |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN106198450B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109211846A (en) * | 2018-10-30 | 2019-01-15 | 广东工业大学 | A kind of non-linear transmissivity test device |
| CN116871680B (en) * | 2023-08-18 | 2024-02-20 | 广东海洋大学 | Laser light path system for welding dissimilar materials |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0645616A1 (en) * | 1992-12-25 | 1995-03-29 | DRACHEV, Vladimir Prokopievich | Dispersion interferometer |
| CN102621069A (en) * | 2012-03-30 | 2012-08-01 | 常熟微纳激光光子技术有限公司 | 4f phase imaging method for high sensitively measuring optical nonlinearity of material |
| CN102692382A (en) * | 2012-03-30 | 2012-09-26 | 常熟微纳激光光子技术有限公司 | High-sensitivity frequency domain filtering baffle plate Z-scan method for measuring material nonlinearity |
| CN105403534A (en) * | 2015-06-18 | 2016-03-16 | 苏州微纳激光光子技术有限公司 | Method for measuring transient state optical nonlinearity of material |
| CN205317659U (en) * | 2016-01-15 | 2016-06-15 | 中国工程物理研究院激光聚变研究中心 | Non -linear spectral characteristic measuring device of nonlinearity photonics material |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7813016B2 (en) * | 2006-11-21 | 2010-10-12 | California Institute Of Technology | Method of nonlinear harmonic holography |
-
2016
- 2016-07-22 CN CN201610581862.7A patent/CN106198450B/en active Active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP0645616A1 (en) * | 1992-12-25 | 1995-03-29 | DRACHEV, Vladimir Prokopievich | Dispersion interferometer |
| CN102621069A (en) * | 2012-03-30 | 2012-08-01 | 常熟微纳激光光子技术有限公司 | 4f phase imaging method for high sensitively measuring optical nonlinearity of material |
| CN102692382A (en) * | 2012-03-30 | 2012-09-26 | 常熟微纳激光光子技术有限公司 | High-sensitivity frequency domain filtering baffle plate Z-scan method for measuring material nonlinearity |
| CN105403534A (en) * | 2015-06-18 | 2016-03-16 | 苏州微纳激光光子技术有限公司 | Method for measuring transient state optical nonlinearity of material |
| CN205317659U (en) * | 2016-01-15 | 2016-06-15 | 中国工程物理研究院激光聚变研究中心 | Non -linear spectral characteristic measuring device of nonlinearity photonics material |
Also Published As
| Publication number | Publication date |
|---|---|
| CN106198450A (en) | 2016-12-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| Mao et al. | Imaging femtosecond laser-induced electronic excitation in glass | |
| CN106248636B (en) | A method of measurement material nonlinearity absorption curve | |
| US11143558B2 (en) | Method and system for measuring transient time width of ultrashort pulse | |
| CN108680255A (en) | Window transient state absorption spectrometer when a kind of ultrahigh time resolution overlength | |
| JP5628256B2 (en) | Flash photolysis system | |
| CN104458216B (en) | Device and method for detecting weak absorption of optical element | |
| CN107121395A (en) | A kind of photo-thermal common path interference module and its method for measuring crystal defect | |
| CN111579221B (en) | Method and device for testing nonlinear effect I x L value of optical element | |
| CN106198450B (en) | A kind of device measuring material nonlinearity absorption curve | |
| CN204330141U (en) | A kind of apparatus for measuring high power ultra-short laser pulse contrast | |
| Veinhard et al. | Effect of non-linear amplification of phase and amplitude modulations on laser-induced damage of thick fused silica optics with large beams at 351 nm | |
| CN109211846A (en) | A kind of non-linear transmissivity test device | |
| CN102778301B (en) | Real-time measuring device of self-reference spectrum interference femtosecond laser pulse | |
| CN201293685Y (en) | Third-order relevant instrument with double delay light paths | |
| CN108414443A (en) | A kind of method and system realized ultrashort one pulse time and differentiate pump probe | |
| CN101226145A (en) | Method for measuring non-linear refraction nature eliminating nonlinear absorption influence | |
| CN104913853B (en) | Method and system for measuring ultra-short intense laser prepulsing | |
| CN104964929A (en) | Method for obtaining material thermo-optical coefficient through measuring light spot radius change | |
| CN103969033A (en) | Nonlinear coefficient measuring device and method based on noise small-scale self-focusing growth | |
| CN113984658B (en) | Component damage characteristic regulation and control method and damage test system based on pulse sequence | |
| Yudong et al. | Research on the Stokes linewidth characteristics of the pulse compression by stimulated Brillouin scattering in medium FC-770 | |
| US20230318244A1 (en) | Apparatus and method for measuring and controlling chirp of ultrafast laser pulse | |
| CN114361925B (en) | Laser pulse characteristic measuring device and method based on fluorescence modulation sampling | |
| Ye et al. | Direct observation of the reversible and irreversible processes in femtosecond laser-irradiated fused silica at the near-damage-threshold fluence | |
| CN116879242A (en) | Full-band polarization-adjustable nonlinear optical characteristic in-situ detection device |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |