CN106198450A - A kind of device measuring material nonlinearity absorption curve - Google Patents
A kind of device measuring material nonlinearity absorption curve Download PDFInfo
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- CN106198450A CN106198450A CN201610581862.7A CN201610581862A CN106198450A CN 106198450 A CN106198450 A CN 106198450A CN 201610581862 A CN201610581862 A CN 201610581862A CN 106198450 A CN106198450 A CN 106198450A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
- G01N21/39—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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Abstract
The invention provides a kind of device measuring material nonlinearity absorption curve, described device uses the Single wavelength laser needed for crystal double frequency system and dispersing prism acquisition, then incident laser intensity is improved by long focus lens, use energy and the spot size of scientific grade CCD camera record incident laser, shoot laser energy is recorded, it is thus achieved that the non-linear absorption curve of testing sample by energy meter.The device of the measurement material nonlinearity absorption curve of the present invention improves the measurement scope of non-linear absorption curve, simplifies non-linear absorption curve measurement system, it is achieved that multi-wavelength, wide scope, high precision nonlinear absorption curve are measured.
Description
Technical field
The invention belongs to light laser and matter interaction field, be specifically related to a kind of measurement material nonlinearity absorption curve
Device.
Background technology
When light is by material, light interacts with the atom in material, electronics etc. and causes the absorption of light；At low light condition
The absorptance of lower material is constant, now be absorbed as linear absorption；During high light irradiation, the absorption of material becomes with laser intensity
Change, show non-linear absorption properties: the phenomenon that absorptance reduces with the increase of incident intensity is referred to as saturated absorption；Absorb
Coefficient increase with the increase of incident intensity for anti-saturated absorption.The non-linear absorption of material plays important in light laser
Role, utilizes the saturated absorption characteristic of material can realize Laser pulse compression, and the anti-saturated absorption characteristic utilizing material is permissible
Make the optics such as optical Limiting.But, in high power laser system, the non-linear absorption of material is the key causing damage
Link, becomes the Main Bottleneck of restriction high power laser system energy lift.Therefore, the non-linear absorption properties tool of research material
It is of great significance, and the non-linear absorption curve accurately measuring material is basis and the key of research.
The non-linear absorption of material is attributed to the multiphoton absorption of material more, and non-linear absorption and the incident wavelength of material have
Close, the non-linear absorption curve during different wave length incidence during non-linear absorption of research material, need to be measured.When laser is by material,
Material can cause the change of its transmitance to the absorption of light, and the transmitance of material can characterize material with the change of incident laser intensity
The non-linear absorption of material.The non-linear absorption curve measuring material generally uses Z-scanning technique, and Z-scanning technique uses lens
Focusing on and obtain the laser that intensity changes along Z-direction, obtain its non-linear absorption curve by changing sample in the position of Z-direction, Z-sweeps
The technology of retouching reduces requirement when measuring non-linear absorption curve to laser instrument output energy, but the method to be applicable to thickness less
Sample, and sample when Z-direction moves the position of laser light incident crystal also will change, inevitably introduce measurement error.With
The development of high power laser light technology, Transmissivity measurement method have also been obtained extensively application, and Transmissivity measurement method is by testing sample position
Put fixing, measure the transmittance curve of material by improving constantly incident laser intensity, utilize the change of material transmitance to reflect
Its non-linear absorption properties, thickness of sample is limited by the method without strict, and during measurement, sample position is fixed, and error is less.Measure
Beam-splitter is generally utilized to obtain the incident laser of small percentage and utilize energy meter to detect during the non-linear absorption curve of material, energy
Gauge has certain response lag, and during low-energy laser incidence, energy meter is difficult to respond, and which limits non-linear absorption curve
Measurement scope, and also need independent measurement incident laser spot size, add the complexity of measurement apparatus.
At present, need improvement nonlinear transmission measurement method badly, improve measurement scope, simplify measurement system.
Summary of the invention
The technical problem to be solved is to provide a kind of device measuring material nonlinearity absorption curve.
The device of the measurement material nonlinearity absorption curve of the present invention, is characterized in: described device includes pulse laser
Device, crystal double frequency system, dispersing prism, long focus lens, diaphragm, beam-splitter I, beam-splitter II, attenuator, scientific grade CCD camera,
Testing sample and energy meter, pulse laser emission pulse laser, inject dispersing prism by crystal double frequency system, it is thus achieved that unicast
Long laser, Single wavelength laser forms focusing laser after long focus lens and diaphragm, focuses on laser light incident to beam-splitter I, beam-splitter I
Reflection laser I through beam-splitter II be reflected into reflection laser II, reflection laser II to attenuator transmit reflection laser III, reflection
Laser III enters scientific grade CCD camera；The transmission laser I of beam-splitter I becomes transmission laser II through testing sample and enters energy meter；
Between the described focal distance f of long focus lens, the thickness h of testing sample and the spot diameter d of Single wavelength laser, ratio is f/h
>=100, f/d >=100；Described testing sample is L/h to the ratio of distance L and the thickness h of testing sample of focal length lens focus
≥30；The photosurface of described scientific grade CCD camera is s, s=f-L to the fold line distance of long focus lens.
Pulsewidth τ of the pulse laser that described pulse laser is launched is psec or nanosecond order, the wavelength of pulse laser
Scope is 1053 nm or 1064 nm.
Described crystal double frequency system includes the KDP crystalloid of a piece of or a piece of above arranged in series.
On the damping optical table that the device of described measurement material nonlinearity absorption curve is placed in darkroom, Scientific Grade
The surrounding of CCD camera is without interference of stray light.
Described beam-splitter I and the material of beam-splitter II are for melting quartz, and reflectance is 4%.
It is defeated that described crystal double frequency system is capable of two frequencys multiplication of fundamental frequency light, frequency tripling, quadruple and fifth harmonic laser
Go out, and chosen the Single wavelength laser of different wave length by dispersing prism.
Ratio f/d >=100 between focal distance f and the spot diameter d of described long focus lens, it is possible to reduce thickness of sample and cause
The absolute value of sample front and rear surfaces spot size difference.
After described diaphragm is positioned over long focus lens, controlled shape and the bore of Single wavelength laser facula by diaphragm, can
Laser is focused on the most uniformly with acquisition shape more rule, gray scale.
Described testing sample has certain transmitance to incident laser, and testing sample to focal length lens focus away from
Ratio from L with the thickness h of testing sample is L/h >=30, it is possible to reduce the sample front and rear surfaces spot size that thickness of sample causes
The relative value of difference.
Described scientific grade CCD camera has relatively low response lag and wider response wave band, utilizes scientific grade CCD phase
The energy of machine testing reflection laser III and hot spot, s=f-L makes to reflect on scientific grade CCD camera photosurface the hot spot chi of laser III
Very little equal with the spot size of transmission laser on testing sample I.
The beam-splitter I of device employing of the measurement material nonlinearity absorption curve of the present invention, the two-stage light splitting of beam-splitter II
Plate samples, and places the attenuator of appropriate attenuation multiplying power before scientific grade CCD camera simultaneously, it is ensured that incident pulsed laser energy is
Time big, the 65%-95% that maximum is the saturated gray scale of scientific grade CCD camera of the hot spot gray scale that scientific grade CCD camera obtains.
The device of the measurement material nonlinearity absorption curve of the present invention is positioned in darkroom on damping optical table, around nothing
Interference of stray light.
The device of the measurement material nonlinearity absorption curve of the present invention has the advantage that
1. utilize KDP crystalloid by fundamental frequency light frequency multiplication, and use dispersing prism to sort out required Single wavelength laser, can realize
Utilize the non-linear absorption curve of the Single wavelength laser measurement material of multi-wavelength；
2. scientific grade CCD camera has relatively low response lag and higher saturated gray scale, utilizes scientific grade CCD camera to detect
Single wavelength laser energy, can measure the non-linear absorption curve of material in the range of wider Single wavelength laser intensity；
3. utilize scientific grade CCD camera to detect the spot intensity distribution of incident laser simultaneously, can accurately obtain according to this distribution
The size of hot spot, simplifies measurement apparatus, improves certainty of measurement.
The device of the measurement material nonlinearity absorption curve of the present invention uses crystal double frequency system and dispersing prism to obtain institute
The Single wavelength laser needed, then improves incident laser intensity by long focus lens, uses scientific grade CCD camera record incident laser
Energy and spot size, record shoot laser energy by energy meter, it is thus achieved that the non-linear absorption curve of testing sample.This
The device of the measurement material nonlinearity absorption curve of invention improves the measurement scope of non-linear absorption curve, simplifies non-linear
Absorption curve measures system, it is achieved that multi-wavelength, wide scope, high precision nonlinear absorption curve are measured.
Accompanying drawing explanation
Fig. 1 is the device schematic diagram of the measurement material nonlinearity absorption curve of the present invention；
In figure, 1. pulse laser 2. crystal double frequency system 4. dispersing prism 5. long focus lens 6. diaphragm 7. light splitting
Plate I 8. beam-splitter II 9. attenuator 10. scientific grade CCD camera 11. testing sample 12. energy meter.
Detailed description of the invention
Below in conjunction with embodiment and accompanying drawing, the present invention will be further described.Following example are merely to illustrate the present invention,
And not limitation of the present invention.Relevant person skilled in the art without departing from the spirit and scope of the present invention, goes back
Can make a variety of changes, replace and modification, the most equal technical scheme falls within scope of the invention.
As it is shown in figure 1, the device of the measurement material nonlinearity absorption curve of the present invention, including pulse laser 1, crystal times
Frequently system 2, dispersing prism 3, long focus lens 4, diaphragm 5, beam-splitter I 6, beam-splitter II 7, attenuator 8, scientific grade CCD camera 9,
Testing sample 10 and energy meter 11, pulse laser 1 emission pulse laser, inject dispersing prism 3 by crystal double frequency system 2,
Obtaining Single wavelength laser, Single wavelength laser forms focusing laser after long focus lens 4 and diaphragm 5, focuses on laser light incident to light splitting
Plate I 6, the reflection laser I of beam-splitter I 6 is reflected into reflection laser II through beam-splitter II 7, and reflection laser II to attenuator 8 transmits
Reflection laser III, reflection laser III enters scientific grade CCD camera 9, and the transmission laser I of beam-splitter I 7 becomes through testing sample 10
Penetrate laser II and enter energy meter 11；
Between the described focal distance f of long focus lens 5, the thickness h of testing sample 11 and the spot diameter d of Single wavelength laser, ratio is
F/h >=100, f/d >=100；Described testing sample 11 to distance L and the testing sample 11 of long focus lens 5 focus thickness h it
Ratio is L/h >=30；The photosurface of described scientific grade CCD camera 10 is s, s=f-L to the fold line distance of long focus lens 5.
Pulsewidth τ of the pulse laser that described pulse laser 1 is launched is psec or nanosecond order, the wavelength of pulse laser
Scope is 1053 nm or 1064 nm.
Described crystal double frequency system 2 includes the KDP crystalloid of a piece of or a piece of above arranged in series.
On the damping optical table that the device of described measurement material nonlinearity absorption curve is placed in darkroom, Scientific Grade
The surrounding of CCD camera 10 is without interference of stray light.
Described beam-splitter I 7 and the material of beam-splitter II 8 are for melting quartz, and reflectance is 4%.
Embodiment 1
Pulse laser gain media is Nd:YLF, exports fundamental frequency lightω 1=1053 nm, pulsewidth τ=50 ps, fundamental frequency light spot diameter
0.7cm, shoot laser horizontal polarization；Crystal double frequency system is made up of KDP and DKDP crystal, obtains after being frequency convertedω 2=
The quadruple frequency light of 263 nm；Dispersing prism and long focus lens are the high element thoroughly of ultraviolet, and the focal distance f of long focus lens is about 130
cm；The material of beam-splitter is for melting quartz, and reflectance is 4%；Testing sample be deuterium content be the DKDP crystal of 66%, thickness of sample h
Being 0.8 cm, sample surfaces is through fine polishing；The resolution of scientific grade CCD camera is 1024 pixel × 1024 pixels, single
Pixel a size of 13 μ m 13 μm；Attenuator is laser of quadruple attenuator；The measurement scope of energy meter is 20 μ J-10
J；Scientific grade CCD camera and testing sample be placed in can along light path translation translation stage along, scientific grade CCD camera photosurface and
Testing sample to lens distance s is 103 cm；Whole measurement system is placed in darkroom on damping optical table, around without veiling glare
Interference.
The measuring process of the method for described measurement material nonlinearity absorption curve is as follows:
1. pulse laser emission pulse laser, adjusts the coupling angle of KDP and DKDP crystal in crystal double frequency system, until arteries and veins
The frequency-doubling conversion efficiency of impulse light reaches maximum；
2., when the pulsed laser energy of pulse laser transmitting is minimum, adds multi-disc attenuator before CCD camera, pass through Scientific Grade
CCD camera observes the gray scale of hot spot, and hot spot gray value is less than the saturated gray scale of scientific grade CCD camera；Gradually step up pulse laser
The pulsed laser energy that device is launched is until maximum, and the quantity of attenuator is constant, is observed the ash of hot spot by scientific grade CCD camera
Degree, hot spot gray value is less than the saturated gray scale of scientific grade CCD camera；Reduce the quantity of attenuator piecewise, by scientific grade CCD phase
The change of the gray scale of hot spot is observed, until the hot spot gray value in scientific grade CCD camera is the saturated of scientific grade CCD camera on machine
The 71% of gray scale.
3. removing testing sample, from low to high, progression is 12, adjusts the pulse laser that pulse laser (1) is launched step by step
Energy, the record reflection laser III hot spot P in scientific grade CCD camera10Hot spot P1nIntensity profile, record energy meter simultaneously
Reading Ein(P10)-Ein(P1n)；
4. placing testing sample, from low to high, progression is 12, adjusts the pulsed laser energy that pulse laser is launched, note step by step
The record reflection laser III hot spot P in scientific grade CCD camera20-hot spot P2nIntensity profile, record the reading of energy meter simultaneously
Eout(P20)-Eout(P2n)；
5. drawing gray scale and the relation curve G (X, Y) of position of each point on hot spot, G (X, Y) is Gauss distribution, hot spot halfwidth
Being about 20 pixels, the peak gray of hot spot is Gp, background signal is G0；The model of 100 pixel × 100 pixels is chosen around hot spot
Enclose, calculating hot spot gray scale QUOTE within the range ；Gauss
The facula area QUOTE of light beam equivalence ；Final acquisition hot spot P10Hot spot P1nRight
S (the P answered10)-S(P1n) and GA(P10)-GA(P1n), hot spot P20-hot spot P2nCorresponding S (P20)-S(P2n) and GA(P20)-GA
(P2n)；
6. by the E of step 3in(P10)-Ein(P1n) and the G of step 5A(P10)-GA(P1n) one_to_one corresponding, hot spot average gray scale and entering
Penetrate laser energy approximation linear, in order to obtain more accurate Ein(GA) relation, use second order polynomial fit data；
7. utilize Ein(GA) relation calculate testing sample GA(P20)-GA(P2n) corresponding Ein(P20)-Ein(P2n)；
8. pass through T=Ein/EoutCalculate the transmitance of testing sample, obtain T (P20)-T(P2n)；
9. pass through Iin= Ein/ (τ S) calculates laser intensity, obtains Iin(P20)- Iin(P2n)；
10. by the T (P of step 820)-T(P2n) and the I of step 9in(P20)- Iin(P2n) one_to_one corresponding, obtained by fitting of a polynomial
Obtain T (Iin)。
Result shows, along with the increase of laser intensity, the transmitance of DKDP crystal is non-linear decline, and fall off rate by
The least；Laser intensity is more than 10 GW/cm2Time, transmitance gradually tends to definite value.
Embodiment 2
The present embodiment is essentially identical with the embodiment of embodiment 1, differs primarily in that, crystal double frequency system is two pieces of KDP crystalline substances
Body, producesω 2The frequency tripling light of=351 nm；The focal length of long focus lens is about 140 cm, scientific grade CCD camera photosurface and treating
Test sample product are 104 cm to the distance of lens；Attenuator is frequency tripled laser attenuator, the hot spot gray scale in scientific grade CCD camera
Maximum is the 87% of its saturated gray scale.Result shows, along with the increase of laser intensity, the transmitance of DKDP crystal is non-linear
Declining, under 351 nm laser irradiation, the non-linear absorption of DKDP crystal significantly reduces compared with the result in embodiment 1.
Embodiment 3
The present embodiment is essentially identical with the embodiment of embodiment 1, differs primarily in that, pulse laser gain media is Nd:
YAG, exports fundamental frequency lightω 1=1064 nm；Crystal double frequency system is KDP and DKDP crystal, the cutting angle of KDP and DKDP crystal
Produce for 1064 nm laserω 2The quadruple frequency light of=266 nm.
Claims (5)
1. the device measuring material nonlinearity absorption curve, it is characterised in that: described device includes pulse laser
(1), crystal double frequency system (2), dispersing prism (3), long focus lens (4), diaphragm (5), beam-splitter I (6), beam-splitter II (7), decline
Subtract sheet (8), scientific grade CCD camera (9), testing sample (10) and energy meter (11), pulse laser (1) emission pulse laser,
Injecting dispersing prism (3) by crystal double frequency system (2), it is thus achieved that Single wavelength laser, Single wavelength laser is through long focus lens (4) and light
Door screen (5) forms focusing laser afterwards, and focusing laser light incident is to beam-splitter I (6), and the reflection laser I of beam-splitter I (6) is through beam-splitter II
(7) being reflected into reflection laser II, reflection laser II to attenuator (8) transmits reflection laser III, and reflection laser III enters science
Level CCD camera (9)；The transmission laser I of beam-splitter I (6) becomes transmission laser II through testing sample (10) and enters energy meter (11)；
The described focal distance f of long focus lens (5), compare between the thickness h of testing sample (11) and the spot diameter d of Single wavelength laser
Example is f/h >=100, f/d >=100；Described testing sample (11) arrives distance L and the testing sample of long focus lens (5) focus
(11) ratio of thickness h is L/h >=30；The photosurface of described scientific grade CCD camera (10) to long focus lens (5) broken line away from
From for s, s=f-L.
A kind of device measuring material nonlinearity absorption curve the most according to claim 1, it is characterised in that: described arteries and veins
Rush the pulsewidth of the pulse laser that laser instrument (1) is launchedτFor psec or nanosecond order, the wave-length coverage of pulse laser is 1053 nm
Or 1064 nm.
A kind of device measuring material nonlinearity absorption curve the most according to claim 1, it is characterised in that: described crystalline substance
Body frequency doubling system (2) includes the KDP crystalloid of a piece of or a piece of above arranged in series.
A kind of device measuring material nonlinearity absorption curve the most according to claim 1, it is characterised in that: described survey
On the damping optical table that the device of amount material nonlinearity absorption curve is placed in darkroom, the week of scientific grade CCD camera (10)
Enclose without interference of stray light.
A kind of device measuring material nonlinearity absorption curve the most according to claim 1, it is characterised in that: described divides
The material of tabula rasa I (7) and beam-splitter II (8) is for melting quartz, and reflectance is 4%.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109211846A (en) * | 2018-10-30 | 2019-01-15 | 广东工业大学 | A kind of non-linear transmissivity test device |
| CN116871680A (en) * | 2023-08-18 | 2023-10-13 | 广东海洋大学 | Laser light path system for welding dissimilar materials |
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| CN205317659U (en) * | 2016-01-15 | 2016-06-15 | 中国工程物理研究院激光聚变研究中心 | Non -linear spectral characteristic measuring device of nonlinearity photonics material |
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| EP0645616A1 (en) * | 1992-12-25 | 1995-03-29 | DRACHEV, Vladimir Prokopievich | Dispersion interferometer |
| WO2008127432A2 (en) * | 2006-11-21 | 2008-10-23 | California Institute Of Technology | Method of nonlinear harmonic holography |
| CN102621069A (en) * | 2012-03-30 | 2012-08-01 | 常熟微纳激光光子技术有限公司 | 4f phase imaging method for high sensitively measuring optical nonlinearity of material |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109211846A (en) * | 2018-10-30 | 2019-01-15 | 广东工业大学 | A kind of non-linear transmissivity test device |
| CN116871680A (en) * | 2023-08-18 | 2023-10-13 | 广东海洋大学 | Laser light path system for welding dissimilar materials |
| CN116871680B (en) * | 2023-08-18 | 2024-02-20 | 广东海洋大学 | Laser light path system for welding dissimilar materials |
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