CN105592309A - Depth of field testing device - Google Patents
Depth of field testing device Download PDFInfo
- Publication number
- CN105592309A CN105592309A CN201410573065.5A CN201410573065A CN105592309A CN 105592309 A CN105592309 A CN 105592309A CN 201410573065 A CN201410573065 A CN 201410573065A CN 105592309 A CN105592309 A CN 105592309A
- Authority
- CN
- China
- Prior art keywords
- depth
- field testing
- testing arrangement
- fixed
- gripper shoe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Abstract
The invention provides a depth of field testing device, which comprises a base, at least one driver, a supporting plate, a light source and an auxiliary device, wherein the base is provided with an accommodating groove; the at least one driver is accommodated in the accommodating groove, and each driver is used for driving a connection shaft to rotate; the supporting plate is in thread connection with at least one connection shaft, the supporting plate moves along the direction parallel to the axis of the connection shaft under effects of the at least one connection shaft, the supporting plate is provided with a first through hole, a transparent body is fixed on the supporting plate, a SFRChart (Spatial Frequency Response Chart) is arranged on the transparent body, and both the transparent body and the SFRChart cover the first through hole; the light source is arranged in the accommodating groove and is in the reverse direction of the supporting plate and the SFRChart; and the auxiliary device is arranged in the accommodating groove and the position of the auxiliary device is corresponding to that of the first through hole, and a to-be-tested camera module is arranged on the auxiliary device.
Description
Technical field
The present invention relates to a kind of testing arrangement, particularly a kind of depth of field testing arrangement.
Background technology
At present, the depth of field test of camera module is to the spatial frequency response figure (SpatialFrequencyResponseChart under different object distances by this camera module, SFRChart) take pictures, and then calculate SFR (SpatialFrequencyResponse) value by software, obtain the field depth of this camera module with SFR value, but, because the accuracy of distance between manual adjustment SFRChart and this camera module is poor, and SFRChart easily produces skew and rotation, causes testing accuracy rate lower.
Summary of the invention
In view of this, be necessary to provide a kind of depth of field testing arrangement that can improve test accuracy rate.
A kind of depth of field testing arrangement, it comprises a pedestal, this pedestal is offered a holding tank;
Be housed at least one driver in this holding tank, each driver is used for driving a connecting axle rotation;
A gripper shoe being threaded with this at least one connecting axle, this gripper shoe is moved along the direction that is parallel to connecting axle axis under the drive of this at least one connecting axle, this gripper shoe is offered first through hole, in this gripper shoe, fix a transparent body, a SFRChart(SpatialFrequencyResponseChart is set on this transparent body), this transparent body and this SFRChart all cover this first through hole;
A light source that is arranged in this holding tank and is positioned at this gripper shoe and the opposing side of this SFRChart;
And one be arranged in this holding tank and the position servicing unit corresponding with the position of this first through hole, camera module to be measured is arranged on this servicing unit.
Depth of field testing arrangement provided by the invention can automation the field depth of testing lens module, because the SFRChart that drives gripper shoe to move can fine guarantee to be fixed in gripper shoe by controller control driver keeps moving horizontally, and can be good at controlling displacement, improved test accuracy rate.
Brief description of the drawings
Fig. 1 is the assembling schematic diagram of the depth of field testing arrangement that provides of preferred embodiments of the present invention.
Fig. 2 is the decomposing schematic representation of the depth of field testing arrangement in Fig. 1.
Fig. 3 is another decomposing schematic representation of the depth of field testing arrangement in Fig. 1.
Fig. 4 is the decomposing schematic representation of the servicing unit of the depth of field testing arrangement in Fig. 1.
Fig. 5 is another decomposing schematic representation of the servicing unit of the depth of field testing arrangement in Fig. 1.
Fig. 6 is the assembling schematic diagram of camera module to be measured.
Fig. 7 is the use view of the depth of field testing arrangement in Fig. 1.
Main element symbol description
| Depth of field testing arrangement | 100 |
| Pedestal | 10 |
| Holding tank | 11 |
| The first bottom surface | 111 |
| The first side | 112 |
| The second side | 113 |
| The 3rd side | 114 |
| The 4th side | 115 |
| Dividing plate | 12 |
| The first via | 121 |
| The second via | 122 |
| Cover plate | 13 |
| Locating dowel | 14 |
| Back-up block | 15 |
| Support plate | 16 |
| Driver | 20 |
| Connecting axle | 21 |
| Gripper shoe | 30 |
| First surface | 31 |
| Second surface | 32 |
| The first through hole | 33 |
| The second through hole | 34 |
| Third through-hole | 35 |
| Ring bodies | 36 |
| The transparent body | 37 |
| SFR Chart | 38 |
| Light source | 40 |
| Guide post | 50 |
| The first fairlead | 51 |
| Servicing unit | 60 |
| The first loading plate | 61 |
| The 3rd surface | 611 |
| The 4th surface | 612 |
| The first side | 61a |
| The second side | 61b |
| The first in command | 613 |
| The first magnet | 614 |
| The first groove | 615 |
| The first carrier block | 616 |
| The second groove | 617 |
| The second carrier block | 618 |
| Rotating shaft | 62 |
| Torsion spring | 63 |
| Fixture cover plate | 64 |
| The 5th surface | 641 |
| The 6th surface | 642 |
| The 3rd side | 64a |
| The 4th side | 64b |
| The second in command | 643 |
| The 3rd groove | 644 |
| The second bottom surface | 6441 |
| The 4th groove | 645 |
| Probe bracket | 646 |
| The 5th groove | 647 |
| The first locating hole | 6471 |
| The second magnet | 648 |
| Test board | 65 |
| Controller | 70 |
| Camera module | 200 |
| Camera lens | 201 |
| Connector | 202 |
Following detailed description of the invention further illustrates the present invention in connection with above-mentioned accompanying drawing.
Detailed description of the invention
Refer to Fig. 1 to Fig. 3, the depth of field testing arrangement 100 of preferred embodiments provided by the invention, it comprises a pedestal 10, two drivers 20, gripper shoe 30, light source 40, multiple guide post 50, servicing unit 60 and a controller 70.
This pedestal 10 is offered a holding tank 11, and this holding tank 11 comprises first bottom surface 111, one and this first bottom surface 111 the first side 112 connected vertically, one second side 113 parallel with this first side 112, the 3rd side 114 intersecting vertically with this first bottom surface 111, this first side 112 and this second side 113 and the 4th side 115 paralleling with the 3rd side 114.
This pedestal 10 also comprises a dividing plate 12 and a cover plate 13. This dividing plate 12 is fixed on this first bottom surface 111 and contacts with the 3rd side 114 and the 4th side 115, this dividing plate 12 offers two the first via 121 and four the second vias 122 that axis is parallel with the axis of two these the first vias 121 that axis is parallel, two this first via 121 intervals arrange and are positioned at the middle part of this dividing plate 12, four this second via 122 intervals arrange, and each the first via 121 is between two these the second vias 122 of correspondence. This cover plate 13 is fixed on this dividing plate 12, and this dividing plate 13 and this first side 112, the 3rd side 114 and the 4th side 115 is vertical is connected.
On this second side 113, be vertically fixed with four locating dowels 14. The 3rd side 114 is respectively fixed with two along the spaced back-up block 15 of a first direction with the 4th side 115. These four locating dowels 14 are fixed a support plate 16. The quantity that is appreciated that locating dowel 14 is not limited to present embodiment, can adopt according to actual needs locating dowel 14 more or still less.
Each driver 20 connects a connecting axle 21 corresponding with this second via 122 and this first locating hole 142, and this connecting axle 21 is formed with external screw thread.
This gripper shoe 30 comprises a first surface 31 and a second surface 32, and this first surface 31 is parallel to this second surface 32. This first surface 31 offers first through hole 33, four the second through holes 34 and two third through-holes 35 towards these second surface 32 directions, and central shaft, the axis of these four the second through holes 34 and the axis of these two third through-holes 35 of this first through hole 33 are parallel to each other. In these two third through-holes 35, be respectively arranged with a ring bodies 36, these two ring bodies 36 are formed with respectively internal thread, and this internal thread matches with the external screw thread of corresponding connecting axle 21. On this first surface 31, be fixed with a transparent body 37, this transparent body 37 covers this first through hole 33. On this transparent body 37, be provided with a SFRChart38, this SFRChart38 covers this first through hole 33. In present embodiment, this transparent body 37 is a transparent glass.
This light source 40 is fixed on this second surface 32, and for light being provided to this SFRChart38, this light source 40 is positioned at the opposing side of this gripper shoe 30 and this SFRChart38. In present embodiment, the quantity of the plurality of guide post 50 is four, each guide post 50 is arranged in first fairlead 51, and four these guide posts 50 are for supporting this gripper shoe 30, and for this gripper shoe 30 is along providing guide effect perpendicular to moving of these the first side 112 directions.
Refer to Fig. 4 and Fig. 5, this servicing unit 60 comprises second support plate 61, rotating shaft 62, two torsion springs 63, fixture cover plate 64 and a test board 65. This second support plate 61 comprises the 3rd surface 611, four surface 612 parallel with the 3rd surface 611, a first side 61a who intersects vertically with the 3rd surface 611 and the 4th surface 612 and a four side 61b parallel with this first side 61a, the 4th side 61b is fixed with a first in command 613, and this second support plate 61 is fixed with two the first magnet 614 near the position of the 4th side 61b. The 3rd surface 611 offers first groove 615 towards the 4th surperficial 612 directions, is fixed with first carrier block 616 in this first groove 615. The 3rd surface 611 also offers second groove 617 towards the 4th surperficial 612 directions, is fixed with second carrier block 618 in this second groove 617.
This fixture cover plate 64 comprises that the 5th surface 641, one are parallel to the 4th side 64b that the 3rd side 64a that the 6th surface 642 on the 5th surface 641, one and the 5th surface 641 and the 6th surface 642 intersect vertically and are parallel to the 3rd side 64a. The 4th side 64b is fixed with a second in command 643. The 5th surface 641 offers the 3rd groove 644 towards the 6th surperficial 642 directions, the 3rd groove 644 comprises second bottom surface 6441 that is parallel to the 5th surface 641, this second bottom surface 6441 is offered one towards the 6th surperficial 642 directions, and to run through this second bottom surface 6441 corresponding with the position of this second groove 617 with the position of the 4th groove 645, the four grooves 645 on the 6th surface 642. The 4th groove 645 is interior arranges a probe bracket 646, and this probe bracket 646 is fixed with plurality of probes (not shown). The 6th surface 642 is offered the 5th groove 647, the five grooves 647 towards the 5th surperficial 641 directions and is offered first locating hole 6471 that runs through the 5th surface 641, and the position of this first locating hole 6471 is corresponding with the position of this first groove 615. This fixture cover plate 64 be fixed with two positions respectively with these two the second magnet 648 that the first magnet 614 positions are corresponding.
These two torsion springs 63 are set in this rotating shaft 62, reset for having tested rear auxiliary this fixture cover plate 64. This second support plate 61 is formed and is rotationally connected by this rotating shaft 62 with this fixture cover plate 64. This test board 65 is fixed on the second bottom surface 6441 of the 3rd groove 644, so that this test board 65 forms and is electrically connected with this plurality of probes. This controller 70 is for controlling the motion of these two drivers 20.
When assembling, these two drivers 20 are separately fixed on the 3rd side 114 and the 4th side 115, and these two drivers 20 are oppositely arranged. These two connecting axles 21 are separately positioned in two corresponding back-up blocks 15, and each connecting axle 21 is arranged in corresponding this first via 121 and corresponding this ring bodies 36, and each connecting axle 21 is threaded with corresponding this ring bodies 36 formation. These four guide posts 50 are fixed on this second side 113 through corresponding second via 122 respectively, and these four guide posts 50 are arranged in corresponding this second through hole 34 by this first fairlead 51 of correspondence respectively. The 4th surface 612 of this servicing unit 60 is fixed on this support plate 16, and the position of this first locating hole 6471 is corresponding with the position of this first through hole 33. This controller 70 is arranged in this holding tank 11.
Refer to Fig. 6 and Fig. 7, when test, this camera module 200 is arranged on this first carrier block 616 and this second carrier block 618, this camera module 200 comprises a camera lens 201 and a connector 202. This fixture cover plate 64 closes towards these the first loading plate 61 directions, these two the first magnet 614 and these two the second magnet 648 are connected with the stable of this first loading plate 61 for guaranteeing this fixture cover plate 64, now, this camera lens 201 is arranged in this first locating hole 6471, this connector 202 forms and is electrically connected with this plurality of probes, thereby described connector 202, this plurality of probes and this test board 65 are formed to electric connection, and this camera module 200 is realized communication with this test board 65. This controller 70 is controlled these two drivers 20 and is driven these two connecting axles 21 to rotate, these two connecting axles 21 drive this gripper shoe 30 to move along the axis direction that is parallel to this second through hole 34, this camera module 200 is taken pictures to the SFRChart38 of each distance, and then calculate SFR value by software, obtain the field depth of this camera module 200 with SFR value. After having tested, make this fixture cover plate 64 away from this second support plate 61 by this first in command 613 and this second in command 643 these fixture cover plates 64 of upset, the connector 202 of this plurality of probes and this camera module 200 disconnects and being electrically connected.
Depth of field testing arrangement provided by the invention can automation the field depth of testing lens module, because the SFRChart that drives gripper shoe to move can fine guarantee to be fixed in gripper shoe by controller control driver keeps moving horizontally, and can be good at controlling displacement, improved test accuracy rate.
Be appreciated that the above embodiment is used for illustrative purposes only, not limitation of the present invention. In addition, those of ordinary skill in the art conceives the variation of making in corresponding technical field and should belong to protection category of the present invention according to the present invention.
Claims (9)
1. a depth of field testing arrangement, for camera lens module to be measured is carried out to depth of field test, is characterized in that: this depth of field testing arrangement comprises a pedestal, this pedestal is offered a holding tank;
Be housed at least one driver in this holding tank, this at least one driver is used for driving at least one connecting axle rotation;
A gripper shoe being threaded with this at least one connecting axle, this gripper shoe is moved along the direction of the axis that is parallel to this at least one connecting axle under the drive of this at least one connecting axle, and this gripper shoe is offered first through hole;
One is arranged in this holding tank and is fixed on the light source in this gripper shoe;
And one be arranged in this holding tank and the position servicing unit corresponding with the position of this first through hole, camera module to be measured is arranged on this servicing unit.
2. depth of field testing arrangement as claimed in claim 1, is characterized in that: this holding tank comprises the second side of first side, and this first parallel sided, three side and four side that with three side parallels crossing with this first side and this second lateral vertical; The quantity of this at least one driver is two; Two these drivers are separately fixed on the 3rd side and the 4th side, and these two drivers are oppositely arranged.
3. depth of field testing arrangement as claimed in claim 2, it is characterized in that: the 3rd side and the 4th side are respectively fixed with two spaced back-up blocks, the quantity of this at least one connecting axle is two, and two these connecting axles are separately positioned in these two back-up blocks.
4. depth of field testing arrangement as claimed in claim 2, it is characterized in that: this depth of field testing arrangement also comprises four guide posts, these four guide posts are fixed on this second side, these four guide posts are used for supporting this gripper shoe, and for this gripper shoe is along providing guide effect perpendicular to moving of the first side surface direction.
5. depth of field testing arrangement as claimed in claim 1, it is characterized in that: in this gripper shoe, fix a transparent body, a SFRChart(SpatialFrequencyResponseChart is set on this transparent body), this transparent body and this SFRChart all cover this first through hole.
6. depth of field testing arrangement as claimed in claim 2, is characterized in that: on this second side, be vertically fixed with four locating dowels, these four locating dowels are fixed a support plate, are fixed with a servicing unit on this support plate.
7. depth of field testing arrangement as claimed in claim 6, it is characterized in that: this servicing unit comprises second support plate, a rotating shaft, two torsion springs, a fixture cover plate and a test board, these two torsion spring sets are located in this rotating shaft, reset for having tested rear auxiliary this fixture cover plate, this second support plate and this fixture cover plate are formed and are rotationally connected by this rotating shaft.
8. depth of field testing arrangement as claimed in claim 7, it is characterized in that: this fixture cover plate comprises that a first surface and one are parallel to the second surface of this first surface, this first surface is offered first groove towards this second surface direction, this first groove comprises a bottom surface, and second groove is offered towards this second surface direction in this bottom surface.
9. depth of field testing arrangement as claimed in claim 8, it is characterized in that: a probe bracket is set in this second groove, this probe bracket is fixed with plurality of probes, and this test board is fixed on the bottom surface of this first groove, is electrically connected so that this test board and this plurality of probes form.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410573065.5A CN105592309B (en) | 2014-10-23 | 2014-10-23 | Depth of field test device |
| TW104102565A TWI645175B (en) | 2014-10-23 | 2015-01-26 | Depth of field testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410573065.5A CN105592309B (en) | 2014-10-23 | 2014-10-23 | Depth of field test device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105592309A true CN105592309A (en) | 2016-05-18 |
| CN105592309B CN105592309B (en) | 2018-11-02 |
Family
ID=55931482
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410573065.5A Expired - Fee Related CN105592309B (en) | 2014-10-23 | 2014-10-23 | Depth of field test device |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN105592309B (en) |
| TW (1) | TWI645175B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107991841A (en) * | 2017-11-10 | 2018-05-04 | 苏州灵猴机器人有限公司 | Depth of field automatic testing equipment |
| CN113840132A (en) * | 2020-06-23 | 2021-12-24 | 深圳市万普拉斯科技有限公司 | Test device and image test method for photographing device |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06148571A (en) * | 1992-11-10 | 1994-05-27 | Akai Electric Co Ltd | Collimator device |
| JPH10260444A (en) * | 1997-03-19 | 1998-09-29 | Minolta Co Ltd | Optical device provided with function for correcting shake |
| CN101625519A (en) * | 2008-07-08 | 2010-01-13 | 比亚迪股份有限公司 | Camera detecting equipment and system |
| CN201436557U (en) * | 2008-11-20 | 2010-04-07 | 北京四维远见信息技术有限公司 | CCD line camera precise calibration device |
| CN202979081U (en) * | 2012-12-12 | 2013-06-05 | 科瑞自动化技术(深圳)有限公司 | Testing device for testing front and rear cameras of cellphone |
| CN103945215A (en) * | 2013-01-22 | 2014-07-23 | 布里门特克有限公司 | Test socket for camera module |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1628123A1 (en) * | 2004-08-17 | 2006-02-22 | Dialog Semiconductor GmbH | Testing of miniaturized cameras with electronic and/or optical zoom functions |
| CN200962616Y (en) * | 2006-10-24 | 2007-10-17 | 比亚迪精密制造有限公司 | Performance tester of multi-function flip mobile phone |
| CN200989846Y (en) * | 2006-11-27 | 2007-12-12 | 华晶科技股份有限公司 | Optical test clamp device |
-
2014
- 2014-10-23 CN CN201410573065.5A patent/CN105592309B/en not_active Expired - Fee Related
-
2015
- 2015-01-26 TW TW104102565A patent/TWI645175B/en not_active IP Right Cessation
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06148571A (en) * | 1992-11-10 | 1994-05-27 | Akai Electric Co Ltd | Collimator device |
| JPH10260444A (en) * | 1997-03-19 | 1998-09-29 | Minolta Co Ltd | Optical device provided with function for correcting shake |
| CN101625519A (en) * | 2008-07-08 | 2010-01-13 | 比亚迪股份有限公司 | Camera detecting equipment and system |
| CN201436557U (en) * | 2008-11-20 | 2010-04-07 | 北京四维远见信息技术有限公司 | CCD line camera precise calibration device |
| CN202979081U (en) * | 2012-12-12 | 2013-06-05 | 科瑞自动化技术(深圳)有限公司 | Testing device for testing front and rear cameras of cellphone |
| CN103945215A (en) * | 2013-01-22 | 2014-07-23 | 布里门特克有限公司 | Test socket for camera module |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107991841A (en) * | 2017-11-10 | 2018-05-04 | 苏州灵猴机器人有限公司 | Depth of field automatic testing equipment |
| CN113840132A (en) * | 2020-06-23 | 2021-12-24 | 深圳市万普拉斯科技有限公司 | Test device and image test method for photographing device |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI645175B (en) | 2018-12-21 |
| TW201616114A (en) | 2016-05-01 |
| CN105592309B (en) | 2018-11-02 |
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Effective date of registration: 20180305 Address after: 528437 Guangdong province Zhongshan Torch Development Zone, Cheung Hing Road 6 No. 222 north wing trade building room Applicant after: Zhongshan yunchuang Intellectual Property Service Co.,Ltd. Address before: 518109 Guangdong province Shenzhen city Longhua District Dragon Road No. 83 wing group building 11 floor Applicant before: SCIENBIZIP CONSULTING (SHEN ZHEN) Co.,Ltd. Effective date of registration: 20180305 Address after: 518109 Guangdong province Shenzhen city Longhua District Dragon Road No. 83 wing group building 11 floor Applicant after: SCIENBIZIP CONSULTING (SHEN ZHEN) Co.,Ltd. Address before: 518109 Guangdong city of Shenzhen province Baoan District Longhua Town Industrial Zone tabulaeformis tenth East Ring Road No. 2 two Applicant before: HONG FU JIN PRECISION INDUSTRY (SHENZHEN) Co.,Ltd. Applicant before: HON HAI PRECISION INDUSTRY Co.,Ltd. |
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Granted publication date: 20181102 Termination date: 20191023 |