CN105592309B - Depth of field test device - Google Patents
Depth of field test device Download PDFInfo
- Publication number
- CN105592309B CN105592309B CN201410573065.5A CN201410573065A CN105592309B CN 105592309 B CN105592309 B CN 105592309B CN 201410573065 A CN201410573065 A CN 201410573065A CN 105592309 B CN105592309 B CN 105592309B
- Authority
- CN
- China
- Prior art keywords
- support plate
- depth
- field test
- test device
- holding tank
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Abstract
The present invention provides a kind of depth of field test device comprising a pedestal, the pedestal open up a holding tank；At least one driver being housed in the holding tank, each driver is for driving a connecting shaft rotation；One support plate being threadedly coupled at least one connecting shaft, the direction that the support plate is parallel to the connecting shaft axis in the drive lower edge of at least one connecting shaft moves, the support plate opens up a first through hole, a transparent body is fixed in the support plate, one SFR Chart is set on the transparent body, and the transparent body and the SFR Chart cover the first through hole；One be arranged in the holding tank and with the support plate should, the opposite light sources of SFR Chart；And one be arranged in the holding tank and position auxiliary device corresponding with the position of the first through hole, camera module to be measured is arranged on the auxiliary device.
Description
Technical field
The present invention relates to a kind of test device, more particularly to a kind of depth of field test device.
Background technology
Currently, the depth of field test of camera module is rung to the spatial frequency under different object distances by the camera module
Ying Tu（Spatial Frequency Response Chart, SFR Chart）It takes pictures, and then is calculated by software
SFR (Spatial Frequency Response) value, the field depth of the camera module is obtained with SFR values, however, by
It is poor in the accuracy for manually adjusting distance between SFR Chart and the camera module, and SFR Chart be also easy to produce offset and
Rotation, causes test accuracy rate relatively low.
Invention content
In view of this, it is necessary to provide a kind of depth of field test devices that can improve test accuracy rate.
A kind of depth of field test device a comprising pedestal, the pedestal open up a holding tank；
At least one driver being housed in the holding tank, each driver is for driving a connecting shaft rotation；
One support plate being threadedly coupled at least one connecting shaft, band of the support plate at least one connecting shaft
Dynamic lower edge is parallel to the direction movement of connecting shaft axis, which opens up a first through hole, one is fixed in the support plate
A SFR Chart is arranged on the transparent body for the transparent body（Spatial Frequency Response Chart）, the transparent body
And the SFR Chart cover the first through hole；
One is arranged in the holding tank and positioned at the light source of support plate side opposite with the SFR Chart；
And one be arranged in the holding tank and position auxiliary device corresponding with the position of the first through hole, it is to be measured
Camera module is arranged on the auxiliary device.
The field depth for the testing lens module that depth of field test device provided by the invention can automate, due to passing through control
Device control driver processed moves come the SFR Chart holding levels for driving support plate movement that can ensure to fix very well on the supporting plate
It is dynamic, and can be good at controlling displacement distance, improve test accuracy rate.
Description of the drawings
Fig. 1 is the assembling schematic diagram for the depth of field test device that better embodiment of the present invention provides.
Fig. 2 is the decomposition diagram of the depth of field test device in Fig. 1.
Fig. 3 is another decomposition diagram of the depth of field test device in Fig. 1.
Fig. 4 is the decomposition diagram of the auxiliary device of the depth of field test device in Fig. 1.
Fig. 5 is another decomposition diagram of the auxiliary device of the depth of field test device in Fig. 1.
Fig. 6 is the assembling schematic diagram of camera module to be measured.
Fig. 7 is the use state diagram of the depth of field test device in Fig. 1.
Main element symbol description
| Depth of field test device | 100 |
| Pedestal | 10 |
| Holding tank | 11 |
| First bottom surface | 111 |
| First side | 112 |
| Second side | 113 |
| Third side | 114 |
| 4th side | 115 |
| Partition board | 12 |
| First via hole | 121 |
| Second via hole | 122 |
| Cover board | 13 |
| Positioning column | 14 |
| Supporting block | 15 |
| Support plate | 16 |
| Driver | 20 |
| Connecting shaft | 21 |
| Support plate | 30 |
| First surface | 31 |
| Second surface | 32 |
| First through hole | 33 |
| Second through-hole | 34 |
| Third through-hole | 35 |
| Ring bodies | 36 |
| The transparent body | 37 |
| SFR Chart | 38 |
| Light source | 40 |
| Guide rod | 50 |
| First guide sleeve | 51 |
| Auxiliary device | 60 |
| First loading plate | 61 |
| Third surface | 611 |
| 4th surface | 612 |
| First side | 61a |
| The second side | 61b |
| The first in command | 613 |
| First magnet | 614 |
| First groove | 615 |
| First carrier block | 616 |
| Second groove | 617 |
| Second carrier block | 618 |
| Shaft | 62 |
| Torsional spring | 63 |
| Fixture cover board | 64 |
| 5th surface | 641 |
| 6th surface | 642 |
| Third side | 64a |
| 4th side | 64b |
| Second handle | 643 |
| Third groove | 644 |
| Second bottom surface | 6441 |
| 4th groove | 645 |
| Probe bracket | 646 |
| 5th groove | 647 |
| First positioning hole | 6471 |
| Second magnet | 648 |
| Test board | 65 |
| Controller | 70 |
| Camera module | 200 |
| Camera lens | 201 |
| Connector | 202 |
Following specific implementation mode will be further illustrated the present invention in conjunction with above-mentioned attached drawing.
Specific implementation mode
It please refers to Fig.1 to Fig.3, the depth of field test device 100 of better embodiment provided by the invention comprising a base
10, two support plate 30, one of driver 20, one light sources 40 of seat, 50, auxiliary devices 60 of multiple guide rods and a control
Device 70 processed.
The pedestal 10 opens up a holding tank 11, which includes first bottom surface 111, one and first bottom
111 second side parallel with the first side 112 113, one of first side 112, one connected vertically of face with this first
The third side 114 and one and the third side that bottom surface 111, the first side 112 and the second side 113 intersect vertically
114 the 4th parallel sides 115.
The pedestal 10 further includes a partition board 12 and a cover board 13.The partition board 12 be fixed on first bottom surface 111 and with
The third side 114 and the 4th side 115 are in contact, which opens up that there are two parallel the first via holes 121 of axis
And the second via hole 122 that four axis are parallel with the axis of two first via holes 121, two first via holes 121
Interval setting and the middle part positioned at the partition board 12, four second via hole 122 interval settings, and each first via hole 121
Between corresponding two second via holes 122.The cover board 13 is fixed on the partition board 12, and the partition board 13 with this first
Side 112,115 vertical connection of third side 114 and the 4th side.
Four positioning columns 14 are vertically and fixedly provided in the second side 113.The third side 114 and the 4th side 115 are each
It is fixed that there are two along the spaced supporting block of a first direction 15.Four positioning columns 14 fix a support plate 16.It can manage
Solution, the quantity of positioning column 14 are not limited to present embodiment, can use more or less positioning column according to actual needs
14。
Each driver 20 connects a connecting shaft corresponding with second via hole 122 and the first positioning hole 142
21, which is formed with external screw thread.
The support plate 30 include a first surface 31 and a second surface 32, the first surface 31 be parallel to this second
Surface 32.The first surface 31 is opened up towards 32 direction of second surface there are one 33, four the second through-holes 34 and two of first through hole
A third through-hole 35, the central shaft of the first through hole 33, the axis of this four the second through-holes 34 and two third through-holes 35
Axis is mutually parallel.It is respectively set in two third through-holes 35 there are one ring bodies 36, which is respectively formed
There is internal thread, which matches with the external screw thread of corresponding connecting shaft 21.It is fixed on the first surface 31 that there are one transparent
Body 37, the transparent body 37 cover the first through hole 33.There are one SFR Chart 38, the SFR for setting on the transparent body 37
Chart 38 covers the first through hole 33.In present embodiment, which is a transparent glass.
The light source 40 is fixed on the second surface 32, for providing light, the light source 40 to the SFR Chart 38
In the side that the support plate 30 is opposite with the SFR Chart 38.In present embodiment, the quantity of multiple guide rod 50 is four
A, each guide rod 50 is arranged in first guide sleeve 51, and four guide rods 50 are used to support the support plate 30, and are
The support plate 30 provides guiding role along the movement perpendicular to 112 direction of first side.
Please refer to Fig. 4 and Fig. 5, the auxiliary device 60 include the shaft 62, two of the second support plate 61, one torsional spring 63,
One fixture cover board 64 and a test board 65.Second support plate 61 includes 611, one, third surface and the third surface
611 the 4th parallel surfaces 612, a first side 61a to intersect vertically with the third surface 611 and the 4th surface 612 and
There are one the first in command 613, second support plates for one the 4th side 61b parallel with the first side 61a, the 4th side 61b fixation
61 fix close to the position of the 4th side 61b there are two the first magnet 614.The third surface 611 is towards 612 direction of the 4th surface
It opens up there are one the first groove 615, fixed in first groove 615 there are one the first carrier blocks 616.611 court of third surface
4th surface, 612 direction is further opened with second groove 617, and fixed in second groove 617 there are one the second carrier blocks
618。
The fixture cover board 64 include 641, one, the 5th surface the 6th surface 642 for being parallel to the 5th surface 641,
One third side 64a to intersect vertically with the 5th surface 641 and the 6th surface 642 and one are parallel to third side 64a
The 4th side 64b.There are one second handles 643 for 4th side 64b fixations.5th surface 641 is towards 642 direction of the 6th surface
It opens up there are one third groove 644, which includes second bottom surface 6441 for being parallel to the 5th surface 641,
Second bottom surface 6441 opens up one through second bottom surface 6441 and the 6th surface 642 towards 642 direction of the 6th surface
The position of 4th groove 645, the 4th groove 645 is corresponding with the position of second groove 617.It is set in 4th groove 645
A probe bracket 646 is set, which is fixed with plurality of probes（It is not shown）.6th surface 642 towards the 5th
641 direction of surface opens up the 5th groove 647, and the 5th groove 647 opens up one to be determined through the first of the 5th surface 641
Position hole 6471, the position of the first positioning hole 6471 are corresponding with the position of first groove 615.The fixture cover board 64 is fixed with
Two positions the second magnet corresponding with two 614 positions of the first magnet 648 respectively.
Two torsional springs 63 are set in the shaft 62, for assisting the fixture cover board 64 to reset after the completion of testing.This
Two support plates 61, which are formed with the fixture cover board 64 by the shaft 62, to be rotatablely connected.The test board 65 is fixed on the third groove 644
The second bottom surface 6441 so that the test board 65 is electrically connected with the plurality of probes.The controller 70 is for controlling this
The movement of two drivers 20.
When assembling, which is separately fixed on the third side 114 and the 4th side 115, and this two
A driver 20 is oppositely arranged.Two connecting shafts 21 are separately positioned in corresponding two supporting blocks 15, and each connecting shaft
21 be arranged in corresponding one first via hole 121 and the corresponding ring bodies 36, each connecting shaft 21 with it is corresponding
The ring bodies 36 formed be threadedly coupled.It is solid that four guide rods 50 are each passed through corresponding one the second via hole 122
It is scheduled in the second side 113, and four guide rods 50 are arranged by corresponding one first guide sleeve 51 right respectively
In one answered, second through-hole 34.4th surface 612 of the auxiliary device 60 is fixed on the support plate 16, and first positioning
The position in hole 6471 is corresponding with the position of the first through hole 33.The controller 70 is arranged in the holding tank 11.
Please refer to Fig. 6 and Fig. 7, when test, by the camera module 200 setting first carrier block 616 and this second
On carrier block 618, which includes a camera lens 201 and a connector 202.The fixture cover board 64 towards this
One loading plate, 61 direction is closed, this two the first magnet 614 and this two the second magnet 648 for ensure the fixture cover board 64 with
First loading plate 61 is stably connected with, at this point, the camera lens 201 be arranged in the first positioning hole 6471, the connector 202 with
The plurality of probes is electrically connected, to form electrically the connector 202, the plurality of probes and the test board 65
Connection, the camera module 200 are realized with the test board 65 and are communicated.The controller 70 control two drivers 20 drive this two
Connecting shaft 21 rotates, which drives the support plate 30 to be moved along the axis direction for being parallel to second through-hole 34,
The camera module 200 takes pictures to the SFR Chart 38 at each distance, and then calculates SFR values by software, with SFR values
To obtain the field depth of the camera module 200.After the completion of test, turned over by the first in command 613 and the second handle 643
Turning the fixture cover board 64 makes the fixture cover board 64 far from second support plate 61, the plurality of probes and the camera module 200
Connector 202, which disconnects, to be electrically connected.
The field depth for the testing lens module that depth of field test device provided by the invention can automate, due to passing through control
Device control driver processed moves come the SFR Chart holding levels for driving support plate movement that can ensure to fix very well on the supporting plate
It is dynamic, and can be good at controlling displacement distance, improve test accuracy rate.
It is appreciated that embodiment described above is used for illustrative purposes only, not limitation of the present invention.In addition,
Those skilled in the art should belong to the guarantor of the present invention according to the variation that present inventive concept is made in corresponding technical field
Protect scope.
Claims (8)
1. a kind of depth of field test device, for carrying out depth of field test to camera lens module to be measured, it is characterised in that：Depth of field test dress
It sets including a pedestal, which opens up a holding tank；
At least one driver being housed in the holding tank, at least one driver is for driving at least one connecting shaft to revolve
Turn；
The controller being housed in the holding tank, the controller are used to control the movement of at least one driver；
One support plate being threadedly coupled at least one connecting shaft, the support plate is under the drive of at least one connecting shaft
It is moved along the direction for the axis for being parallel at least one connecting shaft, which opens up a first through hole；
One light source for being arranged in the holding tank and being fixed in the support plate；
And one be arranged in the holding tank and position auxiliary device corresponding with the position of the first through hole, camera shooting to be measured
Head mould group is arranged on the auxiliary device；The auxiliary device includes second support plate, a shaft, two torsional springs, a folder
Tool cover board and a test board, two torsional springs are set in the shaft, for assisting the clamp cover sheet reset after the completion of testing,
Second support plate is formed by the shaft with the fixture cover board and is rotatablely connected.
2. depth of field test device as described in claim 1, it is characterised in that：The holding tank include a first side, one
The second side parallel with the first side, a third side and one to intersect vertically with the first side and the second side
A fourth side parallel with the third side；The quantity of at least one driver is two；Two driver difference
It is fixed on the third side and the 4th side, and two drivers are oppositely arranged.
3. depth of field test device as claimed in claim 2, it is characterised in that：The third side is respectively fixed with the 4th side
Two spaced supporting blocks, the quantity of at least one connecting shaft are two, two connecting shafts be separately positioned on this two
In a supporting block.
4. depth of field test device as claimed in claim 2, it is characterised in that：The depth of field test device further includes four guiding
Bar, four guide rods are fixed on the second side, which is used to support the support plate, and are the support plate edge
Movement perpendicular to first side direction provides guiding role.
5. depth of field test device as described in claim 1, it is characterised in that：A transparent body is fixed in the support plate, this is thoroughly
One SFR Chart (Spatial Frequency Response Chart), the transparent body and the SFR are set on phaneroplasm
Chart covers the first through hole.
6. depth of field test device as claimed in claim 2, it is characterised in that：Four positioning are vertically and fixedly provided in the second side
Column, four positioning columns fix a support plate, and fixed on the support plate there are one auxiliary devices.
7. depth of field test device as described in claim 1, it is characterised in that：The fixture cover board includes a first surface and one
A second surface for being parallel to the first surface, the first surface open up first groove towards the second surface direction, this
One groove includes a bottom surface, which opens up second groove towards the second surface direction.
8. depth of field test device as claimed in claim 7, it is characterised in that：One probe bracket is set in second groove,
The probe bracket is fixed with plurality of probes, which is fixed on the bottom surface of first groove, so that the test board is multiple with this
Several probes are electrically connected.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410573065.5A CN105592309B (en) | 2014-10-23 | 2014-10-23 | Depth of field test device |
| TW104102565A TWI645175B (en) | 2014-10-23 | 2015-01-26 | Depth of field testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410573065.5A CN105592309B (en) | 2014-10-23 | 2014-10-23 | Depth of field test device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105592309A CN105592309A (en) | 2016-05-18 |
| CN105592309B true CN105592309B (en) | 2018-11-02 |
Family
ID=55931482
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410573065.5A Expired - Fee Related CN105592309B (en) | 2014-10-23 | 2014-10-23 | Depth of field test device |
Country Status (2)
| Country | Link |
|---|---|
| CN (1) | CN105592309B (en) |
| TW (1) | TWI645175B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107991841A (en) * | 2017-11-10 | 2018-05-04 | 苏州灵猴机器人有限公司 | Depth of field automatic testing equipment |
| CN113840132A (en) * | 2020-06-23 | 2021-12-24 | 深圳市万普拉斯科技有限公司 | Test device and image test method for photographing device |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06148571A (en) * | 1992-11-10 | 1994-05-27 | Akai Electric Co Ltd | Collimator device |
| JPH10260444A (en) * | 1997-03-19 | 1998-09-29 | Minolta Co Ltd | Optical device provided with function for correcting shake |
| CN101625519A (en) * | 2008-07-08 | 2010-01-13 | 比亚迪股份有限公司 | Camera detecting equipment and system |
| CN201436557U (en) * | 2008-11-20 | 2010-04-07 | 北京四维远见信息技术有限公司 | CCD line camera precise calibration device |
| CN103945215A (en) * | 2013-01-22 | 2014-07-23 | 布里门特克有限公司 | Test socket for camera module |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1628123A1 (en) * | 2004-08-17 | 2006-02-22 | Dialog Semiconductor GmbH | Testing of miniaturized cameras with electronic and/or optical zoom functions |
| CN200962616Y (en) * | 2006-10-24 | 2007-10-17 | 比亚迪精密制造有限公司 | Performance tester of multi-function flip mobile phone |
| CN200989846Y (en) * | 2006-11-27 | 2007-12-12 | 华晶科技股份有限公司 | Optical test clamp device |
| CN202979081U (en) * | 2012-12-12 | 2013-06-05 | 科瑞自动化技术(深圳)有限公司 | Testing device for testing front and rear cameras of cellphone |
-
2014
- 2014-10-23 CN CN201410573065.5A patent/CN105592309B/en not_active Expired - Fee Related
-
2015
- 2015-01-26 TW TW104102565A patent/TWI645175B/en not_active IP Right Cessation
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH06148571A (en) * | 1992-11-10 | 1994-05-27 | Akai Electric Co Ltd | Collimator device |
| JPH10260444A (en) * | 1997-03-19 | 1998-09-29 | Minolta Co Ltd | Optical device provided with function for correcting shake |
| CN101625519A (en) * | 2008-07-08 | 2010-01-13 | 比亚迪股份有限公司 | Camera detecting equipment and system |
| CN201436557U (en) * | 2008-11-20 | 2010-04-07 | 北京四维远见信息技术有限公司 | CCD line camera precise calibration device |
| CN103945215A (en) * | 2013-01-22 | 2014-07-23 | 布里门特克有限公司 | Test socket for camera module |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105592309A (en) | 2016-05-18 |
| TWI645175B (en) | 2018-12-21 |
| TW201616114A (en) | 2016-05-01 |
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Effective date of registration: 20180305 Address after: 528437 Guangdong province Zhongshan Torch Development Zone, Cheung Hing Road 6 No. 222 north wing trade building room Applicant after: Zhongshan yunchuang Intellectual Property Service Co.,Ltd. Address before: 518109 Guangdong province Shenzhen city Longhua District Dragon Road No. 83 wing group building 11 floor Applicant before: SCIENBIZIP CONSULTING (SHEN ZHEN) Co.,Ltd. Effective date of registration: 20180305 Address after: 518109 Guangdong province Shenzhen city Longhua District Dragon Road No. 83 wing group building 11 floor Applicant after: SCIENBIZIP CONSULTING (SHEN ZHEN) Co.,Ltd. Address before: 518109 Guangdong city of Shenzhen province Baoan District Longhua Town Industrial Zone tabulaeformis tenth East Ring Road No. 2 two Applicant before: HONG FU JIN PRECISION INDUSTRY (SHENZHEN) Co.,Ltd. Applicant before: HON HAI PRECISION INDUSTRY Co.,Ltd. |
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