TWI645175B - Depth of field testing device - Google Patents

Abstract

The invention provides a depth of field testing device, comprising a base, the base opening a receiving slot; at least one driver received in the receiving slot, each driver for driving a connecting shaft to rotate; and one at least one connection a support plate coupled to the shaft, the support plate is moved in a direction parallel to the axis of the connecting shaft by the at least one connecting shaft, the support plate defines a first through hole, and the transparent plate is fixed on the support plate, the transparent plate is transparent An SFR chart is disposed on the body, the transparent body and the SFR chart both cover the first through hole; a light source disposed in the receiving groove and opposite to the support plate and the SFR Chart; and a receiving slot disposed in the receiving slot An auxiliary device having a position corresponding to the position of the first through hole.

Description

Depth of field test device

The invention relates to a testing device, in particular to a depth of field testing device.

At present, the depth of field test of the camera module is to take a picture of a spatial frequency response chart (SFR Chart) under different object distances, and then calculate a SFR (Spatial Frequency Response) value through the software. The depth of field range of the camera module is obtained by the SFR value. However, since the accuracy of manually adjusting the distance between the SFR Chart and the camera module is poor, and the SFR Chart is prone to offset and rotation, the test accuracy is low.

In view of this, it is necessary to provide a depth of field testing device capable of improving test accuracy.

A depth of field testing device comprising a base, the base opening a receiving slot; at least one driver received in the receiving slot, each driver for driving a connecting shaft to rotate; and one threading connection with the at least one connecting shaft a support plate that is moved in a direction parallel to the axis of the connecting shaft by the at least one connecting shaft, the support plate defines a first through hole, and the transparent plate is fixed on the supporting plate, and the transparent body is disposed on the transparent body One SFR Chart (Spatial Frequency Response Chart), the transparent body and the SFR Chart both cover the first through hole; a light source disposed in the receiving groove and located on a side of the support plate opposite to the SFR Chart; and a And an auxiliary device corresponding to the position of the first through hole, wherein the camera module to be tested is disposed on the auxiliary device, the auxiliary device includes a second carrier, a rotating shaft, and two torsion springs. a clamp cover and a test plate, the two torsion springs are sleeved on the rotating shaft, and are used to assist the resetting of the clamp cover after the test is completed, and the second carrier plate and the clamp cover plate form a rotational connection through the rotating shaft.

The depth of field testing device provided by the invention can automatically test the depth of field range of the lens module, and the movement of the support plate by the controller to control the driver can ensure that the SFR chart fixed on the support plate maintains horizontal movement and can be very good. Control the moving distance and improve the test accuracy.

100‧‧‧Depth of field test device

10‧‧‧ Pedestal

11‧‧‧ accommodating slot

111‧‧‧ first bottom surface

112‧‧‧ first side

113‧‧‧ second side

114‧‧‧ third side

115‧‧‧fourth side

12‧‧‧Baffle

121‧‧‧First via

122‧‧‧Second via

13‧‧‧ Cover

14‧‧‧Positioning column

15‧‧‧Support block

16‧‧‧ Carrier Board

20‧‧‧ drive

21‧‧‧Connected shaft

30‧‧‧Support board

31‧‧‧ first surface

32‧‧‧second surface

33‧‧‧First through hole

34‧‧‧Second through hole

35‧‧‧ third through hole

36‧‧‧8-ring

37‧‧‧Transparent

38‧‧‧SFR Chart

40‧‧‧Light source

50‧‧‧guide rod

51‧‧‧First guide sleeve

60‧‧‧Auxiliary devices

61‧‧‧First carrier board

611‧‧‧ third surface

612‧‧‧ fourth surface

61a‧‧‧ first side

61b‧‧‧ second side

613‧‧‧ first handle

614‧‧‧First magnet

615‧‧‧first groove

616‧‧‧First carrier block

617‧‧‧second groove

618‧‧‧Second carrier block

62‧‧‧ shaft

63‧‧‧torsion spring

64‧‧‧Clamp cover

641‧‧‧ fifth surface

642‧‧‧ sixth surface

64a‧‧‧ third side

64b‧‧‧ fourth side

643‧‧‧ second handle

644‧‧‧ third groove

6441‧‧‧second bottom surface

645‧‧‧fourth groove

646‧‧‧ probe holder

647‧‧‧ fifth groove

6471‧‧‧First positioning hole

648‧‧‧second magnet

65‧‧‧Test board

70‧‧‧ Controller

200‧‧‧ camera module

201‧‧‧ lens

202‧‧‧Connector

1 is a schematic view showing the assembly of a depth of field testing device according to a preferred embodiment of the present invention.

2 is an exploded perspective view of the depth of field testing device of FIG. 1.

3 is another exploded perspective view of the depth of field testing device of FIG. 1.

4 is an exploded perspective view of the auxiliary device of the depth of field testing device of FIG. 1.

FIG. 5 is another exploded perspective view of the auxiliary device of the depth of field testing device of FIG. 1. FIG.

FIG. 6 is an assembled view of the camera module to be tested.

Fig. 7 is a view showing the state of use of the depth of field testing device of Fig. 1.

1 to 3, a depth of field testing apparatus 100 according to a preferred embodiment of the present invention includes a base 10, two drivers 20, a support plate 30, a light source 40, a plurality of guide bars 50, and a The auxiliary device 60 and a controller 70.

The accommodating slot 11 defines a first bottom surface 111, a first side surface 112 perpendicularly connected to the first bottom surface 111, and a second side surface 113 parallel to the first side surface 112. a third side surface 114 perpendicularly intersecting the first bottom surface 111, the first side surface 112 and the second side surface 113, and a fourth side surface 115 parallel to the third side surface 114.

The base 10 further includes a partition 12 and a cover 13. The partition plate 12 is fixed to the first bottom surface 111 and is in contact with the third side surface 114 and the fourth side surface 115. The partition plate 12 is provided with two first conductive holes 121 and four axes and two axes parallel to the axis. a second via hole 122 of the first via hole 121 is parallel, and the two first via holes 121 are spaced apart from each other and located at a middle portion of the spacer 12, and the four second via holes 122 are spaced apart, and each of the first via holes A via hole 121 is located between the corresponding two of the second via holes 122. The cover plate 13 is fixed to the partition plate 12, and the partition plate 13 is perpendicularly connected to the first side surface 112, the third side surface 114 and the fourth side surface 115.

Four positioning posts 14 are vertically fixed to the second side surface 113. The third side surface 114 and the fourth side surface 115 are respectively fixed with two support blocks 15 spaced apart along a first direction. The four positioning posts 14 fix a carrier plate 16. It can be understood that the number of the positioning posts 14 is not limited to the embodiment, and more or fewer positioning posts 14 can be used according to actual needs.

Each of the drivers 20 is connected to a connecting shaft 21 corresponding to the second through hole 122 and the first positioning hole 142, and the connecting shaft 21 is formed with an external thread.

The support plate 30 includes a first surface 31 and a second surface 32 that is parallel to the second surface 32. The first surface 31 defines a first through hole 33, four second through holes 34 and two third through holes 35 in the direction of the second surface 32. The central axis of the first through hole 33 and the four The axis of the second through hole 34 and the axes of the two third through holes 35 are parallel to each other. The two An annular body 36 is formed in each of the three through holes 35, and the two annular bodies 36 are respectively formed with internal threads that cooperate with the external threads of the corresponding connecting shafts 21. A transparent body 37 is fixed on the first surface 31, and the transparent body 37 covers the first through hole 33. The transparent body 37 is provided with an SFR Chart 38, and the SFR Chart 38 covers the first through hole 33. In the present embodiment, the transparent body 37 is a transparent glass.

The light source 40 is fixed to the second surface 32 for providing light to the SFR Chart 38, the light source 40 being located on a side of the support plate 30 opposite the SFR Chart 38. In this embodiment, the number of the plurality of guiding rods 50 is four, and each of the guiding rods 50 is disposed in a first guiding sleeve 51, and the four guiding rods 50 are used for supporting the supporting plate 30 and supporting the supporting plate 30. The movement of the plate 30 in a direction perpendicular to the first side 112 provides a guiding effect.

Referring to FIGS. 4 and 5, the auxiliary device 60 includes a second carrier 61, a rotating shaft 62, two torsion springs 63, a clamp cover 64, and a test board 65. The second carrier 61 includes a third surface 611, a fourth surface 612 parallel to the third surface 611, and a first side 61a and a perpendicular intersection with the third surface 611 and the fourth surface 612. The first side 61a is parallel to the fourth side 61b. The fourth side 61b is fixed with a first handle 613. The second carrier 61 is fixed with two first magnets 614 near the fourth side 61b. The third surface 611 defines a first recess 615 in the direction of the fourth surface 612. A first bearing block 616 is fixed in the first recess 615. The second surface 611 further defines a second recess 617 in the direction of the fourth surface 612. A second carrier block 618 is fixed in the second recess 617.

The clamp cover 64 includes a fifth surface 641, a sixth surface 642 parallel to the fifth surface 641, a third side 64a perpendicular to the fifth surface 641 and the sixth surface 642, and a parallel to The fourth side 64b of the third side 64a. The fourth side 64b is fixed with a second handle 643. The fifth surface 641 defines a third recess 644 in the direction of the sixth surface 642. The third recess 644 includes a second bottom surface 6441 parallel to the fifth surface 641. The second bottom portion The surface 6441 defines a fourth groove 645 extending through the second bottom surface 6441 and the sixth surface 642 toward the sixth surface 642. The position of the fourth groove 645 corresponds to the position of the second groove 617. A probe holder 646 is disposed in the fourth recess 645. The probe holder 646 is fixed with a plurality of probes (not shown). The fifth surface 642 defines a fifth recess 647 in the direction of the fifth surface 641. The fifth recess 647 defines a first positioning hole 647,1 extending through the fifth surface 641. The position of the first positioning hole 6441 is The position of the first groove 615 corresponds. The clamp cover 64 is fixed with two magnets 648 at two positions corresponding to the positions of the two first magnets 614.

The two torsion springs 63 are sleeved on the rotating shaft 62 for assisting the resetting of the clamp cover 64 after the test is completed. The second carrier 61 and the clamp cover 64 are formed in a rotational connection by the rotating shaft 62. The test board 65 is fixed to the second bottom surface 6441 of the third recess 644 to electrically connect the test board 65 with the plurality of probes. The controller 70 is used to control the motion of the two drivers 20.

When assembled, the two drivers 20 are respectively fixed on the third side surface 114 and the fourth side surface 115, and the two drivers 20 are oppositely disposed. The two connecting shafts 21 are respectively disposed in the corresponding two supporting blocks 15, and each connecting shaft 21 is disposed in a corresponding one of the first through holes 121 and a corresponding one of the annular bodies 36, each connecting shaft 21 is threaded with a corresponding one of the annular bodies 36. The four guiding rods 50 are respectively fixed on the second side surface 113 through a corresponding one of the second guiding holes 122, and the four guiding rods 50 are respectively disposed on the corresponding one through the corresponding one of the first guiding sleeves 51. The second through hole 34 is inside. The fourth surface 612 of the auxiliary device 60 is fixed on the carrier 16 , and the position of the first positioning hole 6471 corresponds to the position of the first through hole 33 . The controller 70 is disposed in the accommodating groove 11.

Referring to FIG. 6 and FIG. 7 , the camera module 200 is disposed on the first carrier block 616 and the second carrier block 618 . The camera module 200 includes a lens 201 and a connector 202 . The clamp cover 64 is closed toward the first carrier 61, and the two first magnets 614 and the two second magnets 648 are used to ensure stable connection of the clamp cover 64 and the first carrier 61. In this case, the lens 201 is disposed in the first positioning hole 647,1, and the connector 202 is electrically connected to the plurality of probes, thereby connecting the connector 202, the plurality of probes, and the test board. 65 forms an electrical connection, and the camera module 200 communicates with the test board 65. The controller 70 controls the two drivers 20 to rotate the two connecting shafts 21, and the two connecting shafts 21 move the supporting plate 30 in the direction parallel to the axis of the second through hole 34. The camera module 200 is opposite. The SFR Chart 38 at each distance is photographed, and the SFR value is calculated by the software, and the depth of field range of the camera module 200 is obtained by the SFR value. After the test is completed, the clamp cover 64 is turned over by the first handle 613 and the second handle 643 to move the clamp cover 64 away from the second carrier 61. The plurality of probes and the connector 202 of the camera module 200 are connected. Disconnect the electrical connection.

The depth of field testing device provided by the invention can automatically test the depth of field range of the lens module, and the movement of the support plate by the controller to control the driver can ensure that the SFR chart fixed on the support plate maintains horizontal movement and can be very good. Control the moving distance and improve the test accuracy.

It is to be understood that the above-described embodiments are merely illustrative of the invention and are not intended to limit the invention. In addition, variations made in the corresponding technical field in accordance with the inventive concept by those skilled in the art should fall within the protection scope of the present invention.

Claims (8)

A depth of field testing device for performing a depth of field test on a lens module to be tested, wherein the depth of field testing device comprises a base, the base opening a receiving slot; and at least one driver received in the receiving slot, the at least a drive for driving at least one of the connecting shafts; a support plate threadedly coupled to the at least one connecting shaft, the support plate being moved in a direction parallel to an axis of the at least one connecting shaft by the at least one connecting shaft, The support plate defines a first through hole; a light source disposed in the receiving groove and fixed on the support plate; and an auxiliary device disposed in the receiving groove and corresponding to the position of the first through hole a camera module to be tested is disposed on the auxiliary device, the auxiliary device includes a second carrier, a rotating shaft, two torsion springs, a clamp cover and a test board, and the two torsion springs are sleeved on the auxiliary device On the rotating shaft, after the test is completed, the clamp plate is reset, and the second carrier plate and the clamp cover plate form a rotational connection through the rotating shaft. The depth of field testing device of claim 1, wherein the receiving groove comprises a first side, a second side parallel to the first side, and a third perpendicularly intersecting the first side and the second side a side surface and a fourth side parallel to the third side; the number of the at least one driver is two; two drivers are respectively fixed on the third side and the fourth side, and the two drivers are oppositely disposed . The depth of field testing device of claim 2, wherein the third side surface and the fourth side surface are respectively fixed with two spaced apart support blocks, the number of the at least one connecting shaft being two, and the two connecting shafts respectively Set in the two support blocks. The depth of field testing device of claim 2, wherein the depth of field testing device further comprises four guiding rods fixed on the second side, the four guiding rods are for supporting the supporting plate, and A guiding action is provided for the movement of the support plate in a direction perpendicular to the first side. The depth of field testing device of claim 1, wherein a transparent body is fixed on the support plate, and an SFR Chart (Spatial Frequency Response Chart) is disposed on the transparent body, and the transparent body and the SFR Chart both cover the first pass. hole. The depth of field testing device of claim 2, wherein the second side is vertically fixed with four positioning posts, the four positioning posts fixing a carrier plate, and an auxiliary device is fixed on the carrier plate. The depth of field testing device of claim 1, wherein the jig cover comprises a first surface and a second surface parallel to the first surface, the first surface opening a first recess toward the second surface The groove includes a bottom surface that opens a second groove toward the second surface. The depth of field testing device of claim 7, wherein a probe holder is disposed in the second recess, the probe holder is fixed with a plurality of probes, and the test board is fixed on the bottom surface of the first recess So that the test board is electrically connected to the plurality of probes.