CN105548722A - Measuring system of ferromagnetic material terahertz dielectric constant - Google Patents
Measuring system of ferromagnetic material terahertz dielectric constant Download PDFInfo
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- CN105548722A CN105548722A CN201510897649.2A CN201510897649A CN105548722A CN 105548722 A CN105548722 A CN 105548722A CN 201510897649 A CN201510897649 A CN 201510897649A CN 105548722 A CN105548722 A CN 105548722A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2682—Measuring dielectric properties, e.g. constants using optical methods or electron beams
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Abstract
The invention discloses a measuring system of a ferromagnetic material terahertz dielectric constant. The system comprises a femto second laser pulse generator, a light splitting device, a terahertz light generation device, two laser pulse time-delay devices, a polarizing device, a sample rack, a magnetic field generation device, a polarization detection device, a weak light photoelectric detector, a terahertz focusing device, a time sequence terahertz light intensity detection device and a testing control device. According to the invention, the reflective rate of a ferromagnetic sample in a terahertz wave band is measured, the magnetization strength of the sample in the terahertz wave band is also measured, and the accurate dielectric constant of the ferromagnetic material in the terahertz wave band is calculated.
Description
Technical field
The present invention relates to optical measuring technique, particularly a kind of measuring system of ferromagnetic material specific inductive capacity of terahertz wave band, for measuring the ferromagnetic specific inductive capacity at terahertz wave band.
Background technology
Current measurement material high-frequency dielectric constant method has Ellipsometric and spectroscopic methodology, the former carrys out the optical constant of working sample by the change of measuring polarization state before and after light wave and matter interaction, and the latter measures the specific inductive capacity of material by measurement reflection and transmissivity.Both is all carry out Measuring Dielectric Constant by measuring refractive index, make use of a basic assumption, namely the relative permeability of material equals 1, and ferromagnetic material is not 1 at the magnetic permeability of Terahertz frequency range, and the packet in the refractive index measured contains the impact of magnetic permeability.
The present invention designs a set of system simultaneously can measuring magnetic permeability in Terahertz frequency range and refractive index, thus can measure the specific inductive capacity of ferromagnetic material at terahertz wave band.
Summary of the invention
The object of the invention is the measuring system of a kind of ferromagnetic material Terahertz specific inductive capacity provided for deficiency of the prior art, to realize the measurement of the change in dielectric constant to material.The present invention adopts the mode that sequential Terahertz reflects and sequential Kerr magnetooptical effect is measured, measure the flash magnetization intensity in the relevant electric field intensity of terahertz light and sample simultaneously, utilize the magnetization of maxwell equation group and the standard model when low frequency to correct data, obtain ferromagnetic material at the specific inductive capacity of terahertz wave band and magnetic permeability.Object is the measuring system of a kind of ferromagnetic material Terahertz specific inductive capacity provided for deficiency of the prior art, to realize the measurement of the change in dielectric constant to material.
The concrete technical scheme realizing the object of the invention is:
A measuring system for ferromagnetic material Terahertz specific inductive capacity, this system comprises:
The femto-second laser pulse generating means of the femto-second laser pulse used for providing test;
For femtosecond pulse light beam being divided into the light-dividing device of the three beams of laser of different light intensity, be connected with femto-second laser pulse generating means light path;
For the terahertz light generating means that femtosecond pulse femto-second laser pulse being converted to terahertz pulse triggers, be connected with the wherein beam of laser light path of light-dividing device;
For the laser pulse time-delay mechanism regulating femto-second laser pulse to carry out delay process, be connected with the wherein beam of laser light path of light-dividing device;
For loading ferromagnetic sample and being placed in the specimen holder in the middle of magnetic field;
The field generator for magnetic of Keer rotation and magnetization relation is corrected during for testing; Be located at specimen holder periphery;
For carrying out the femtosecond pulse time-delay mechanism of delay process to femtosecond optics short pulse, be connected with the wherein beam of laser light path of light-dividing device;
Laser for generation of linearly polarized light plays deflection device, and be located between laser pulse time-delay mechanism and specimen holder, this device comprises polaroid and collective optics;
For the Calibrator that detection laser polarization state changes, be located between specimen holder and low light level photodetector, this device comprises collective optics and High Extinction Ratio polaroid; Light beam is dwindled into sizeable directional light by collective optics, by High Extinction Ratio polaroid.
For detecting the low light level photodetector of low light level light intensity, be connected with Calibrator light path;
For the Terahertz focalizer that terahertz light is carried out focusing on, be located between femtosecond pulse time-delay mechanism and specimen holder;
For detecting the sequential Terahertz light intensity test device of Terahertz light intensity, be connected with Terahertz focalizer light path;
For controlling the test control device of each variable change in test, connect femtosecond pulse time-delay mechanism, laser pulse time-delay mechanism, field generator for magnetic, low light level photodetector and sequential Terahertz light intensity test device by circuit.
Described terahertz light generating means is made up of terahertz pulse generation device, Excitation Filter with High, terahertz light collective optics, level crossing, terahertz pulse generation device, Excitation Filter with High, terahertz light collective optics and level crossing are arranged in order along direction of beam propagation, and its optical axis of former three is parallel to beam direction.Level crossing changes beam direction, and light beam incides sample surfaces with 10-45 degree.
Described terahertz pulse generation device is selected from photoconducting antenna, ZnSe crystal, LiNbO
3crystal, LiTaO
3any one in crystal, ZnTe crystal, InP crystal and GaAs crystal.
Described Excitation Filter with High is silicon chip or teflon plate, opaque and Terahertz is had to the material of high-transmission rate to visible ray; Described Terahertz collective optics is teflon lens or the single or multiple coupling of off-axis aspheric mirror.
Described sequential Terahertz light intensity test device is made up of photoconducting antenna or electro-optic crystal, polarization spectroscope and difference photodetector, electro-optic crystal is any one in ZnTe crystal, InP crystal and GaAs crystal, when detector is made up of electro-optic crystal, polarization spectroscope and difference photodetector, when detector is made up of electro-optic crystal, polarization spectroscope and difference photodetector, three is arranged in order along laser transfer direction, first two optical axis is parallel to laser transfer direction, and two photodetectors of the third party connect laser beam.
Described Terahertz focalizer is made up of the off-axis aspheric mirror of middle with hole or the level crossing of condenser lens and Intermediate Gray sky; The level crossing of condenser lens and Intermediate Gray sky is arranged in order, on photoconducting antenna in sequential Terahertz light intensity test device of the focus of condenser lens or photoelectric crystal.
In the present invention, femto-second laser pulse is produced by femto-second laser pulse generating means, enter light-dividing device and be divided into three beams of laser, wherein a branch ofly enter terahertz light generating means, trigger terahertz pulse light beam, the thz beam of focusing incides on the sample on the specimen holder being placed on magnetic field generation device centre.From light-dividing device the second bundle of pulsed laser out by laser pulse time-delay mechanism, deflection device and thz beam incide on the same position of sample.The laser pulse reflected from sample, by Calibrator, enters low light level photodetector.This beam of laser causes the change of the magnetization of sample for the magnetic effect detecting Terahertz light wave.The terahertz light of sample reflection, by Terahertz focalizer, focuses on sequential Terahertz light intensity test device; Simultaneously from light-dividing device, the 3rd bundle of pulsed laser is out by femtosecond pulse time-delay mechanism, and the terahertz pulse laser beam of sample reflection is with gathering in sequential Terahertz light intensity test device.Test control device connects femtosecond pulse time-delay mechanism, laser pulse time-delay mechanism, field generator for magnetic, low light level photodetector and sequential Terahertz light intensity test device by cable.
Beneficial effect of the present invention:
The present invention utilizes sequential Terahertz and sequential Ke Er magneto-optic to measure the way of coupling, 1., solves electromagnetic field fast-changing measurement problem in Terahertz frequency range; 2., under the electromagnetic field effect of alternation, Electric and magnetic fields has been distinguished respectively to the effect of material; 3. magnetic permeability and the specific inductive capacity of Terahertz frequency range, has been measured.
Accompanying drawing explanation
Fig. 1 is structural representation of the present invention.
Embodiment
Below in conjunction with drawings and Examples, technical scheme of the present invention is further described.
Consult Fig. 1, the present invention includes: femto-second laser pulse generating means 1, light-dividing device 2, terahertz light generating means 3, laser pulse time-delay mechanism 4a, deflection device 5, specimen holder 6, field generator for magnetic 7, Calibrator 8, low light level photodetector 9, Terahertz focalizer 10a, femtosecond pulse time-delay mechanism 4b, Terahertz focalizer 10b, sequential Terahertz light intensity test device 11 and test control device 12.Wherein, femto-second laser pulse generating means 1 produces femto-second laser pulse, enters light-dividing device 2 and is divided into three beams of laser, wherein the first bundle enters terahertz light generating means 3, trigger terahertz pulse light beam, filter, focus on the sample on the specimen holder 6 being placed on field generator for magnetic 7 centre.From light-dividing device 2 the second bundle of pulsed laser out by laser pulse time-delay mechanism 4a, deflection device 5 and thz beam incide on the same position of sample.The laser pulse reflected from sample enters low light level photodetector 9 by Calibrator 8.Second bundle laser causes the change of the magnetization of sample for the magnetic effect detecting Terahertz light wave.The terahertz light of sample reflection, by Terahertz focalizer 10a, focuses on sequential Terahertz light intensity test device 11; Simultaneously from light-dividing device 2 the 3rd bundle of pulsed laser out by femtosecond pulse time-delay mechanism 4b, and sample reflection terahertz pulse laser beam with gathering in sequential Terahertz light intensity test device 11; Test control device 12 controls to prolong femtosecond pulse time-delay mechanism 4b, laser pulse time-delay mechanism 4a, field generator for magnetic 7, low light level photodetector 9 and sequential Terahertz light intensity test device 11 by cable.
Terahertz light generating means 3 of the present invention produces the collective optics of device, Excitation Filter with High and terahertz light by terahertz pulse and level crossing forms, and its terahertz pulse is produced device and is selected from photoconducting antenna, ZnSe crystal, LiNbO
3crystal, LiTaO
3any one in crystal, ZnTe crystal, InP crystal and GaAs crystal, Excitation Filter with High can be that silicon chip, teflon etc. are opaque and terahertz electromagnetic wave is had to the material of high-transmission rate to visible ray; The collective optics of Terahertz is teflon lens, the single or multiple coupling of off-axis aspheric mirror.
The present invention plays deflection device 5 and comprises polaroid and collective optics;
The Calibrator that detection laser polarization state changes comprises collective optics and High Extinction Ratio polaroid.
Terahertz focalizer 10a, 10b can be off-axis aspheric mirrors, or the level crossing composition of condenser lens and Intermediate Gray sky.
Sequential Terahertz light intensity test device 11 is made up of photoconducting antenna or electro-optic crystal, polarization spectroscope and difference photodetector; Electro-optic crystal can be any one in ZnSe crystal, ZnTe crystal, InP crystal and GaAs crystal.When detector is made up of electro-optic crystal, polarization spectroscope and difference photodetector, laser and terahertz light are with gathering in photoelectric crystal, and laser, by after photoelectric crystal, enters polarization spectroscope and is divided into two bundles, enter in difference photodetector.
The present invention is work like this:
Beam of laser is produced by femto-second laser pulse generating means 1, three-beam is divided into after light-dividing device 2, light beam produces terahertz pulse after entering terahertz light generating means 3, and terahertz pulse and laser incide on the sample on specimen holder 6 simultaneously simultaneously, and sample is ferromagnetic material.When doing parameter and correcting, put into standard reflection mirror as reference signal in order to calculate at sample position.The terahertz pulse of 10a in Terahertz focalizer to sample reflection focuses on, and the 10b arrived in Terahertz focalizer changes direction to terahertz pulse, makes it focus on sequential Terahertz light intensity test device 11; Simultaneously from light-dividing device 2 the 3rd bundle of pulsed laser out by femtosecond pulse time-delay mechanism 4b and terahertz pulse laser beam with gathering in sequential Terahertz light intensity test device 11.Because electrooptical effect is to the modulation of exploring laser light, obtain the electric field intensity size of terahertz pulse, in order to calculate the change of specific inductive capacity, its Computational Methods:
Wherein R is terahertz light reflectivity, Φ
sampbe proportional to the Terahertz electric field signal recorded square, Φ
reffor the detection energy size of standard reflection part, for the polarized light of different directions, according to fresnel formula, R
swith R
prepresent s polarization and p polarization light reflectance respectively.
Wherein:
Z is Light negative, for the magnetic permeability of material is to the first order derivative of specific inductive capacity, can think that μ is magnetic permeability, and ε is specific inductive capacity except business in the quiescent state.
Due to the impact of terahertz electromagnetic wave, the magnetic permeability of material has contribution to reflectivity equally, second its magnetic permeability of road laser measurement change, second road laser is by after having entered after laser pulse time-delay mechanism 4a and being incident to the sample of specimen holder 6 with a smaller angle after deflection device 5, due to Kerr magnetooptical effect, polarized light generation small angle deflection, low light level photodetector 9 is entered after Calibrator 8, according to the light intensity change in low light level photodetector 9, calculate the magnetization in material, simultaneously according to the incident intensity of terahertz light, calculate the magnetic field intensity of terahertz light, thus calculate the magnetic permeability of material, specific inductive capacity is calculated again from Z.
Claims (6)
1. a measuring system for ferromagnetic material Terahertz specific inductive capacity, is characterized in that this system comprises:
The femto-second laser pulse generating means of the femto-second laser pulse used for providing test;
For the light-dividing device of three beams of laser that femtosecond pulse light beam is divided into, be connected with femto-second laser pulse generating means light path;
For the terahertz light generating means that femtosecond pulse femto-second laser pulse being converted to terahertz pulse triggers, be connected with the wherein beam of laser light path of light-dividing device;
For the laser pulse time-delay mechanism regulating femto-second laser pulse to carry out delay process, be connected with the wherein beam of laser light path of light-dividing device;
For loading ferromagnetic sample and being placed in the specimen holder in the middle of magnetic field;
The field generator for magnetic of Keer rotation and magnetization relation is corrected during for testing; Be located at specimen holder periphery;
For carrying out the femtosecond pulse time-delay mechanism of delay process to femtosecond optics short pulse, be connected with the wherein beam of laser light path of light-dividing device;
Laser for generation of linearly polarized light plays deflection device, and be located between laser pulse time-delay mechanism and specimen holder, this device comprises polaroid and collective optics;
For the Calibrator that detection laser polarization state changes, be located between specimen holder and low light level photodetector, this device comprises collective optics and High Extinction Ratio polaroid;
For detecting the low light level photodetector of low light level light intensity, be connected with Calibrator light path;
For the Terahertz focalizer that terahertz light is carried out focusing on, be located between femtosecond pulse time-delay mechanism and specimen holder;
For detecting the sequential Terahertz light intensity test device of Terahertz light intensity, be connected with Terahertz focalizer light path;
For controlling the test control device of each variable change in test, connect femtosecond pulse time-delay mechanism, laser pulse time-delay mechanism, field generator for magnetic, low light level photodetector and sequential Terahertz light intensity test device by circuit.
2. measuring system according to claim 1, it is characterized in that described terahertz light generating means is made up of terahertz pulse generation device, Excitation Filter with High, terahertz light collective optics and level crossing, terahertz pulse generation device, Excitation Filter with High, terahertz light collective optics and level crossing are arranged in order along direction of beam propagation, its optical axis of former three is parallel to beam direction, level crossing changes beam direction, and light beam incides sample surfaces with 10-45 degree.
3. measuring system according to claim 2, is characterized in that described terahertz pulse generation device is selected from photoconducting antenna, ZnSe crystal, LiNbO
3crystal, LiTaO
3any one in crystal, ZnTe crystal, InP crystal and GaAs crystal.
4. measuring system according to claim 2, is characterized in that described Excitation Filter with High is silicon chip or teflon plate, opaque and Terahertz is had to the material of high-transmission rate to visible ray; Described Terahertz collective optics is teflon lens or the single or multiple coupling of off-axis aspheric mirror.
5. measuring system according to claim 1, it is characterized in that described sequential Terahertz light intensity test device is made up of photoconducting antenna or electro-optic crystal, polarization spectroscope and difference photodetector, electro-optic crystal is any one in ZnTe crystal, InP crystal and GaAs crystal; When detector is made up of electro-optic crystal, polarization spectroscope and difference photodetector, three is arranged in order along laser transfer direction, and the above two optical axises are parallel to laser transfer direction, and two photodetectors of the third party connect laser beam.
6. measuring system according to claim 1, is characterized in that described Terahertz focalizer is made up of the off-axis aspheric mirror of middle with hole or the level crossing of condenser lens and Intermediate Gray sky; The level crossing of condenser lens and Intermediate Gray sky is arranged in order, on photoconducting antenna in sequential Terahertz light intensity test device of the focus of condenser lens or photoelectric crystal.
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| CN108023263A (en) * | 2017-11-20 | 2018-05-11 | 中国工程物理研究院电子工程研究所 | A kind of magnetic field and the terahertz pulse generator of regulating and controlling voltage |
| CN108535550A (en) * | 2018-03-12 | 2018-09-14 | 上海理工大学 | Terahertz substance dielectric constant measuring system based on Brewster angular measurement |
| CN109188105A (en) * | 2018-10-19 | 2019-01-11 | 北京环境特性研究所 | Suitable for Terahertz frequency range high reflection dielectric material parameter measuring apparatus and method |
| WO2020113671A1 (en) * | 2018-12-03 | 2020-06-11 | 昆山普尚电子科技有限公司 | System and method for detecting electromagnetic characteristic of object by using terahertz electromagnetic wave |
| CN112051454A (en) * | 2020-09-08 | 2020-12-08 | 中电科仪器仪表有限公司 | Terahertz wave-based method and system for detecting dielectric property of material in high-temperature environment |
| CN113777411A (en) * | 2021-09-18 | 2021-12-10 | 首都师范大学 | Method and device for measuring complex dielectric constant of terahertz waveband material |
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| CN107884625A (en) * | 2017-10-18 | 2018-04-06 | 江苏大学 | A kind of terahertz detection method based on cross-polarized antennas on piece |
| CN108023263A (en) * | 2017-11-20 | 2018-05-11 | 中国工程物理研究院电子工程研究所 | A kind of magnetic field and the terahertz pulse generator of regulating and controlling voltage |
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| CN109188105B (en) * | 2018-10-19 | 2020-10-13 | 北京环境特性研究所 | Dielectric parameter measuring device and method suitable for terahertz frequency band high-reflection material |
| WO2020113671A1 (en) * | 2018-12-03 | 2020-06-11 | 昆山普尚电子科技有限公司 | System and method for detecting electromagnetic characteristic of object by using terahertz electromagnetic wave |
| CN112051454A (en) * | 2020-09-08 | 2020-12-08 | 中电科仪器仪表有限公司 | Terahertz wave-based method and system for detecting dielectric property of material in high-temperature environment |
| CN112051454B (en) * | 2020-09-08 | 2023-11-07 | 中电科思仪科技股份有限公司 | Method and system for detecting dielectric characteristics of material under high-temperature environment based on terahertz waves |
| CN113777411A (en) * | 2021-09-18 | 2021-12-10 | 首都师范大学 | Method and device for measuring complex dielectric constant of terahertz waveband material |
| CN113777411B (en) * | 2021-09-18 | 2023-10-13 | 首都师范大学 | Terahertz wave band material complex dielectric constant measuring method and device |
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