CN105548722B - A kind of measuring system of ferromagnetic material Terahertz dielectric constant - Google Patents
A kind of measuring system of ferromagnetic material Terahertz dielectric constant Download PDFInfo
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- CN105548722B CN105548722B CN201510897649.2A CN201510897649A CN105548722B CN 105548722 B CN105548722 B CN 105548722B CN 201510897649 A CN201510897649 A CN 201510897649A CN 105548722 B CN105548722 B CN 105548722B
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- terahertz
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2617—Measuring dielectric properties, e.g. constants
- G01R27/2682—Measuring dielectric properties, e.g. constants using optical methods or electron beams
Abstract
The invention discloses a kind of measuring system of ferromagnetic material Terahertz dielectric constant, which includes：Femto-second laser pulse generating means, terahertz light generating means, two laser pulse time-delay mechanisms, plays deflection device, specimen holder, field generator for magnetic, Calibrator, dim light photodetector at light-dividing device, Terahertz focusing device, sequential Terahertz light intensity test device and test control device, the present invention measures sample in the terahertz wave band intensity of magnetization while reflectivity of ferromagnetic sample in terahertz wave band is measured, and can calculate accurate dielectric constant of the ferromagnetic material in terahertz wave band.
Description
Technical field
The present invention relates to optical measuring technique, the measurement system of the ferromagnetic material dielectric constant of particularly a kind of terahertz wave band
System, for measuring the ferromagnetic dielectric constant in terahertz wave band.
Background technology
Measuring material high-frequency dielectric constant method at present has Ellipsometric and spectroscopic methodology, the former is by measuring light wave and object
The change of polarization state carrys out the optical constant of determination sample before and after matter interaction, and the latter is surveyed by measuring reflection and transmissivity
Measure the dielectric constant of material.Both of which is by measuring refractive index come Measuring Dielectric Constant, a basic assumption being utilized, i.e.,
The relative permeability of material is equal to 1, and ferromagnetic material is not 1 in the magnetic conductivity of Terahertz frequency range, in the refractive index measured
Data contain the influence of magnetic conductivity.
The system that the present invention designs a set of magnetic conductivity that can be measured simultaneously in Terahertz frequency range and refractive index, so as to
Measure dielectric constant of the ferromagnetic material in terahertz wave band.
Invention content
The purpose of the present invention is be directed to a kind of ferromagnetic material Terahertz dielectric constant that is of the prior art insufficient and providing
Measuring system, to realize the measurement to the change in dielectric constant of material.The present invention is using the reflection of sequential Terahertz and sequential magnetic
Optical kerr effect measure mode, while measure terahertz light relevant electric field strength and sample in flash magnetization intensity,
Data are corrected using the magnetization of maxwell equation group and the standard sample in low frequency, obtain ferromagnetic material in THz wave
The dielectric constant and magnetic conductivity of section.Purpose is for insufficient and offer a kind of ferromagnetic material Terahertz dielectric of the prior art
The measuring system of constant, to realize the measurement to the change in dielectric constant of material.
Realizing the specific technical solution of the object of the invention is：
A kind of measuring system of ferromagnetic material Terahertz dielectric constant, the system include：
For providing the femto-second laser pulse generating means of femto-second laser pulse that test uses；
For femtosecond pulse light beam to be divided into the light-dividing device of the three beams of laser of different light intensity, occur with femto-second laser pulse
Device light path connects；
Terahertz light for femto-second laser pulse to be converted to the triggering of the femtosecond pulse of terahertz pulse fills
It puts, is connect with the wherein beam of laser light path of light-dividing device；
For adjust femto-second laser pulse carry out delay process laser pulse time-delay mechanism, wherein one with light-dividing device
Beam laser optical path connects；
For loading ferromagnetic sample and being placed in the specimen holder among magnetic field；
Keer rotation and the field generator for magnetic of magnetization relationship are corrected during for testing；Set on specimen holder periphery；
For to femtosecond optics short pulse carry out delay process femtosecond pulse time-delay mechanism, wherein one with light-dividing device
Beam laser optical path connects；
Deflection device, between laser pulse time-delay mechanism and specimen holder, the dress are played for generating the laser of linearly polarized light
It puts including polarizer and collective optics；
For detecting the changed Calibrator of laser polarization state, set on specimen holder and dim light photodetector it
Between, which includes collective optics and High Extinction Ratio polarizer；Light beam is dwindled into sizeable directional light by collective optics,
Pass through High Extinction Ratio polarizer.
For detecting the dim light photodetector of dim light light intensity, it is connect with Calibrator light path；
For the Terahertz focusing device for being focused terahertz light, set on femtosecond pulse time-delay mechanism and specimen holder it
Between；
For detecting the sequential Terahertz light intensity test device of Terahertz light intensity, it is connect with Terahertz focusing device light path；
For controlling the test control device of each variable change in test, pass through circuit and connect femtosecond pulse delay dress
It puts, laser pulse time-delay mechanism, field generator for magnetic, dim light photodetector and sequential Terahertz light intensity test device.
The terahertz light generating means by terahertz pulse generate device, Excitation Filter with High, terahertz light collective optics,
Plane mirror forms, and terahertz pulse generates device, Excitation Filter with High, terahertz light collective optics and plane mirror along beam propagation side
To being arranged in order, its optical axis of former three is parallel to beam direction.Plane mirror changes beam direction, and light beam is incident on 10-45 degree
Sample surfaces.
The terahertz pulse generates device and is selected from photoconducting antenna, ZnSe crystal, LiNbO3Crystal, LiTaO3Crystal, ZnTe
Any one in crystal, InP crystal and GaAs crystal.
The Excitation Filter with High is silicon chip or teflon plate, opaque to visible ray and have high-transmission rate to Terahertz
Material；The Terahertz collective optics are polytetrafluoroethylene (PTFE) lens or the single or multiple combinations of off-axis aspheric mirror.
The sequential Terahertz light intensity test device is by photoconducting antenna or electro-optic crystal, polarization spectroscope and difference photoelectricity
Detector forms, and electro-optic crystal is any one in ZnTe crystal, InP crystal and GaAs crystal, when detector is by electric light crystalline substance
When body, polarization spectroscope and difference photodetector form, when detector is visited by electro-optic crystal, polarization spectroscope and difference photoelectricity
When surveying device composition, three is arranged in order along laser transfer direction, and first two optical axis is parallel to laser transfer direction, and the two of the third party
A photodetector connects laser beam.
The Terahertz focusing device by middle with hole off-axis aspheric mirror or condenser lens and Intermediate Gray sky plane
Microscope group into；The plane mirror of condenser lens and Intermediate Gray sky is arranged in order, and the focus of condenser lens is in sequential Terahertz light-intensity test
On photoconducting antenna or photoelectric crystal in device.
In the present invention, femto-second laser pulse is generated by femto-second laser pulse generating means, is divided into three beams into light-dividing device
Laser wherein a branch of enter terahertz light generating means, triggers terahertz pulse light beam, the thz beam of focusing, which is incident on, to be put
It puts on the sample on the specimen holder among magnetic field generation device.The second bundle of pulsed laser come out from light-dividing device passes through laser
Pulse delay apparatus, deflection device and thz beam are incident on the same position of sample.The laser reflected from sample
Pulse is by Calibrator, into dim light photodetector.The magnetic effect that this beam of laser is used to detect Terahertz light wave causes
The variation of the intensity of magnetization of sample.The terahertz light of sample reflection focuses on sequential terahertz light by Terahertz focusing device
In strong detection device；The third bundle of pulsed laser from light-dividing device out passes through femtosecond pulse time-delay mechanism and sample simultaneously
The terahertz pulse laser beam of reflection is same to be gathered in sequential Terahertz light intensity test device.Test control device is flown by cable connection
Pulse per second (PPS) time-delay mechanism, laser pulse time-delay mechanism, field generator for magnetic, dim light photodetector and sequential Terahertz light intensity
Detection device.
Beneficial effects of the present invention：
1. the present invention, solves electromagnetic field too using method associated with sequential Terahertz and the measurement of sequential Ke Er magneto-optics
Fast-changing measurement problem in hertz frequency range；2., under the electromagnetic field effect of alternation, distinguished electric field and magnetic field respectively to material
The effect of material；3., measured the magnetic conductivity and dielectric constant of Terahertz frequency range.
Description of the drawings
Fig. 1 is schematic structural view of the invention.
Specific embodiment
Technical scheme of the present invention is further described with reference to the accompanying drawings and embodiments.
Refering to Fig. 1, the present invention includes：Femto-second laser pulse generating means 1, light-dividing device 2, terahertz light generating means 3,
Laser pulse time-delay mechanism 4a, deflection device 5, specimen holder 6, field generator for magnetic 7, Calibrator 8, dim light photodetector 9 are played,
Terahertz focusing device 10a, femtosecond pulse time-delay mechanism 4b, Terahertz focusing device 10b, sequential Terahertz light intensity test device
11 and test control device 12.Wherein, femto-second laser pulse generating means 1 generates femto-second laser pulse, into light-dividing device 2
It is divided into three beams of laser, wherein the first beam enters terahertz light generating means 3, triggers terahertz pulse light beam, filter, focus on
On sample on to the specimen holder 6 being placed among field generator for magnetic 7.The second bundle of pulsed laser come out from light-dividing device 2
It is incident on the same position of sample by laser pulse time-delay mechanism 4a, deflection device 5 and thz beam.From sample
The laser pulse of reflection enters dim light photodetector 9 by Calibrator 8.Second beam laser is used to detect Terahertz light wave
Magnetic effect causes the variation of the intensity of magnetization of sample.The terahertz light of sample reflection is focused on by Terahertz focusing device 10a
On sequential Terahertz light intensity test device 11；The third bundle of pulsed laser from light-dividing device 2 out passes through femtosecond pulse simultaneously
Time-delay mechanism 4b and the terahertz pulse laser beam of sample reflection gather in sequential Terahertz light intensity test device 11 together；Test
Control device 12 by cable control prolong femtosecond pulse time-delay mechanism 4b, laser pulse time-delay mechanism 4a, field generator for magnetic 7,
Dim light photodetector 9 and sequential Terahertz light intensity test device 11.
Terahertz light generating means 3 of the present invention is by terahertz pulse production device, Excitation Filter with High and terahertz light
Collective optics and plane mirror composition, terahertz pulse production device are selected from photoconducting antenna, ZnSe crystal, LiNbO3Crystal,
LiTaO3Any one in crystal, ZnTe crystal, InP crystal and GaAs crystal, Excitation Filter with High can be silicon chip, polytetrafluoro
Ethylene etc. is opaque to visible ray and has the material of high-transmission rate to terahertz electromagnetic wave；The collective optics of Terahertz are polytetrafluoro
The single or multiple combinations of ethylene lens, off-axis aspheric mirror.
The present invention plays deflection device 5 and includes polarizer and collective optics；
It detects the changed Calibrator of laser polarization state and includes collective optics and High Extinction Ratio polarizer.
Terahertz focusing device 10a, 10b can be the plane mirrors of off-axis aspheric mirror or condenser lens and Intermediate Gray sky
Composition.
Sequential Terahertz light intensity test device 11 is visited by photoconducting antenna or electro-optic crystal, polarization spectroscope and difference photoelectricity
Survey device composition；Electro-optic crystal can be any one in ZnSe crystal, ZnTe crystal, InP crystal and GaAs crystal.Work as detection
When device is made of electro-optic crystal, polarization spectroscope and difference photodetector, laser and terahertz light swash with gathering in photoelectric crystal
After light is by photoelectric crystal, it is divided into two beams into polarization spectroscope, into difference photodetector.
The present invention works in this way：
Beam of laser is generated by femto-second laser pulse generating means 1, three-beam, light beam are divided into after light-dividing device 2
Terahertz pulse is generated after into terahertz light generating means 3, while terahertz pulse is incident on laser on specimen holder 6 simultaneously
Sample on, sample is ferromagnetic material.When doing parameter correction, it is put into standard reflection mirror in sample position and is used as with reference to signal use
To calculate.The terahertz pulse that 10a in Terahertz focusing device reflects sample is focused, and reaches Terahertz focusing device
In 10b to terahertz pulse change direction, it is made to focus on sequential Terahertz light intensity test device 11；It is filled simultaneously from light splitting
The third bundle of pulsed laser in 2 out is put by the way that femtosecond pulse time-delay mechanism 4b and terahertz pulse laser beam are same to gather in sequential too
Hertz light intensity test device 11.Due to modulation of the electrooptic effect to exploring laser light, the electric field strength size of terahertz pulse is obtained,
To calculate the variation of dielectric constant, Computational Methods：
Wherein R is terahertz light reflectivity, ΦsampIt is proportional to square of Terahertz electric field signal measured, ΦrefFor
The detection energy size of standard reflection part, for the polarised light of different directions, according to fresnel formula, RsWith RpIt is inclined that s is represented respectively
The reflectivity to shake with p-polarization light.
Wherein：
Z is Light negative, and the magnetic conductivity for material may be considered in the quiescent state except quotient, μ the first derivative of dielectric constant
For magnetic conductivity, ε is dielectric constant.
Due to the influence of terahertz electromagnetic wave, the magnetic conductivity of material equally contributes reflectivity, the second road laser measurement
Its magnetic conductivity changes, the second road laser by enter after laser pulse time-delay mechanism 4a be polarized after device 5 it is smaller with one
After angle is incident to the sample of specimen holder 6, due to Kerr magnetooptical effect, small angle deflection occurs for polarised light, by Calibrator 8
Enter dim light photodetector 9 afterwards, the light intensity variation in dim light photodetector 9 calculates the intensity of magnetization in material, together
When according to the incident intensity of terahertz light, the magnetic field intensity of terahertz light is calculated, so as to calculate the magnetic conductivity of material, then from Z
In calculate dielectric constant.
Claims (6)
1. a kind of measuring system of ferromagnetic material Terahertz dielectric constant, it is characterised in that the system includes：
For providing the femto-second laser pulse generating means of femto-second laser pulse that test uses；
For femtosecond pulse light beam to be divided into the light-dividing device of three beams of laser, it is connect with femto-second laser pulse generating means light path；
For femto-second laser pulse to be converted to the terahertz light generating means of the femtosecond pulse of terahertz pulse triggering,
It is connect with the wherein beam of laser light path of light-dividing device；
For adjusting the laser pulse time-delay mechanism that femto-second laser pulse carries out delay process, wherein a branch of with light-dividing device swashs
Light light path connects；
For loading ferromagnetic sample and being placed in the specimen holder among magnetic field；
Keer rotation and the field generator for magnetic of magnetization relationship are corrected during for testing；Set on specimen holder periphery；
For carrying out the femtosecond pulse time-delay mechanism of delay process, the wherein beam of laser with light-dividing device to femto-second laser pulse
Light path connects；
Deflection device, between laser pulse time-delay mechanism and specimen holder, the device packet are played for generating the laser of linearly polarized light
Include polarizer and collective optics；
It, should between specimen holder and dim light photodetector for detecting the changed Calibrator of laser polarization state
Device includes collective optics and High Extinction Ratio polarizer；
For detecting the dim light photodetector of dim light light intensity, it is connect with Calibrator light path；
For the Terahertz focusing device for being focused terahertz light, between femtosecond pulse time-delay mechanism and specimen holder；
For detecting the sequential Terahertz light intensity test device of Terahertz light intensity, it is connect with Terahertz focusing device light path；
For controlling the test control device of each variable change in test, femtosecond pulse time-delay mechanism is connected by circuit, is swashed
Light pulse time-delay device, field generator for magnetic, dim light photodetector and sequential Terahertz light intensity test device.
2. measuring system according to claim 1, it is characterised in that the terahertz light generating means is by terahertz pulse
Device, Excitation Filter with High, terahertz light collective optics and plane mirror composition are generated, terahertz pulse generates device, laser filters
Piece, terahertz light collective optics and plane mirror are arranged in order along direction of beam propagation, its optical axis of former three is parallel to beam direction,
Plane mirror changes beam direction, and light beam is incident on sample surfaces with 10-45 degree.
3. measuring system according to claim 2, it is characterised in that the terahertz pulse generates device and is selected from light guide day
Any one in line, ZnSe crystal, LiNbO3 crystal, LiTaO3 crystal, ZnTe crystal, InP crystal and GaAs crystal.
4. measuring system according to claim 2, it is characterised in that the Excitation Filter with High is silicon chip or polytetrafluoroethylene (PTFE)
Piece is opaque to visible ray and have the material of high-transmission rate to Terahertz；The Terahertz collective optics are saturating for polytetrafluoroethylene (PTFE)
Mirror or the single or multiple combinations of off-axis aspheric mirror.
5. measuring system according to claim 1, it is characterised in that the sequential Terahertz light intensity test device is by light guide
Antenna or electro-optic crystal, polarization spectroscope and difference photodetector composition, electro-optic crystal be ZnTe crystal, InP crystal and
Any one in GaAs crystal；When the detection device is made of electro-optic crystal, polarization spectroscope and difference photodetector
When, three is arranged in order along laser transfer direction, the above two optical axises are parallel to laser transfer direction, and two photoelectricity of the third party are visited
It surveys device and connects laser beam.
6. measuring system according to claim 1, it is characterised in that the Terahertz focusing device by middle with hole from
The plane mirror of axis aspherical mirror or condenser lens and middle with hole forms；The plane mirror of condenser lens and middle with hole is arranged successively
Row, the focus of condenser lens is on the photoconducting antenna or photoelectric crystal in sequential Terahertz light intensity test device.
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Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN107884625B (en) * | 2017-10-18 | 2020-06-09 | 江苏大学 | Terahertz detection method based on-chip orthogonal polarization antenna |
| CN108023263B (en) * | 2017-11-20 | 2020-03-10 | 中国工程物理研究院电子工程研究所 | Terahertz pulse generator for regulating and controlling magnetic field and voltage |
| CN108535550B (en) * | 2018-03-12 | 2020-03-20 | 上海理工大学 | Terahertz substance dielectric constant measuring system based on Brewster angle measurement |
| CN109188105B (en) * | 2018-10-19 | 2020-10-13 | 北京环境特性研究所 | Dielectric parameter measuring device and method suitable for terahertz frequency band high-reflection material |
| CN109557043B (en) * | 2018-12-03 | 2020-03-27 | 昆山普尚电子科技有限公司 | System and method for detecting electromagnetic characteristics of object by using terahertz electromagnetic wave |
| CN112051454B (en) * | 2020-09-08 | 2023-11-07 | 中电科思仪科技股份有限公司 | Method and system for detecting dielectric characteristics of material under high-temperature environment based on terahertz waves |
| CN113777411B (en) * | 2021-09-18 | 2023-10-13 | 首都师范大学 | Terahertz wave band material complex dielectric constant measuring method and device |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1945342A (en) * | 2006-09-15 | 2007-04-11 | 江苏大学 | Detecting method and its device for double light beam-two angle super short pulse laser pumping |
| CN101806623A (en) * | 2010-04-07 | 2010-08-18 | 中国科学院半导体研究所 | Multifunctional reflection-type magneto-optic spectrum measuring system |
| CN103278696A (en) * | 2013-04-22 | 2013-09-04 | 北京大华无线电仪器厂 | Measuring system for ferrite dielectric constant |
| CN103743681A (en) * | 2014-01-24 | 2014-04-23 | 中国工程物理研究院流体物理研究所 | Terahertz spectrograph and terahertz transceiver probe |
| CN104422702A (en) * | 2013-08-30 | 2015-03-18 | 深圳先进技术研究院 | Method for detecting cornea moisture based on terahertz |
| CN104634746A (en) * | 2015-02-04 | 2015-05-20 | 山东师范大学 | Time resolution Faraday rotation technology-improved experiment device and method |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7718969B2 (en) * | 2005-12-27 | 2010-05-18 | Rensselaer Polytechnic Institute | Methods and systems for generating amplified terahertz radiation for analyzing remotely-located objects |
| JP2013238438A (en) * | 2012-05-14 | 2013-11-28 | Fujitsu Ltd | Imaging apparatus and imaging method |
| JP2014190966A (en) * | 2013-03-28 | 2014-10-06 | Olympus Corp | Observation device |
-
2015
- 2015-12-08 CN CN201510897649.2A patent/CN105548722B/en not_active Expired - Fee Related
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1945342A (en) * | 2006-09-15 | 2007-04-11 | 江苏大学 | Detecting method and its device for double light beam-two angle super short pulse laser pumping |
| CN101806623A (en) * | 2010-04-07 | 2010-08-18 | 中国科学院半导体研究所 | Multifunctional reflection-type magneto-optic spectrum measuring system |
| CN103278696A (en) * | 2013-04-22 | 2013-09-04 | 北京大华无线电仪器厂 | Measuring system for ferrite dielectric constant |
| CN104422702A (en) * | 2013-08-30 | 2015-03-18 | 深圳先进技术研究院 | Method for detecting cornea moisture based on terahertz |
| CN103743681A (en) * | 2014-01-24 | 2014-04-23 | 中国工程物理研究院流体物理研究所 | Terahertz spectrograph and terahertz transceiver probe |
| CN104634746A (en) * | 2015-02-04 | 2015-05-20 | 山东师范大学 | Time resolution Faraday rotation technology-improved experiment device and method |
Non-Patent Citations (1)
| Title |
|---|
| 稀土铁氧化物的太赫兹时域光谱研究;周润泽;《中国优秀硕士学位论文全文数据库库 基础科学辑》;20140815(第8期);第A005-155页 * |
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