CN105514228B - 一种基于纳米压印技术制备图形化蓝宝石衬底的方法 - Google Patents
一种基于纳米压印技术制备图形化蓝宝石衬底的方法 Download PDFInfo
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- CN105514228B CN105514228B CN201610051094.4A CN201610051094A CN105514228B CN 105514228 B CN105514228 B CN 105514228B CN 201610051094 A CN201610051094 A CN 201610051094A CN 105514228 B CN105514228 B CN 105514228B
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- aluminium oxide
- porous
- sapphire substrate
- silicon
- etching
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- 239000000758 substrate Substances 0.000 title claims abstract description 86
- 229910052594 sapphire Inorganic materials 0.000 title claims abstract description 45
- 239000010980 sapphire Substances 0.000 title claims abstract description 45
- 238000000034 method Methods 0.000 title claims abstract description 41
- 238000004049 embossing Methods 0.000 title claims abstract description 7
- PNEYBMLMFCGWSK-UHFFFAOYSA-N Alumina Chemical compound [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 claims abstract description 118
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims abstract description 34
- 229910052710 silicon Inorganic materials 0.000 claims abstract description 34
- 239000010703 silicon Substances 0.000 claims abstract description 34
- 239000004411 aluminium Substances 0.000 claims abstract description 32
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 32
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 32
- 238000005530 etching Methods 0.000 claims abstract description 27
- 238000007254 oxidation reaction Methods 0.000 claims abstract description 19
- 238000012546 transfer Methods 0.000 claims abstract description 8
- 238000001312 dry etching Methods 0.000 claims abstract description 7
- 238000004528 spin coating Methods 0.000 claims abstract description 7
- 238000002360 preparation method Methods 0.000 claims abstract description 6
- 238000005498 polishing Methods 0.000 claims abstract description 5
- -1 polydimethylsiloxane Polymers 0.000 claims abstract description 4
- 239000004205 dimethyl polysiloxane Substances 0.000 claims abstract 7
- 235000013870 dimethyl polysiloxane Nutrition 0.000 claims abstract 7
- 229920000435 poly(dimethylsiloxane) Polymers 0.000 claims abstract 7
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 claims description 24
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 claims description 24
- 125000000118 dimethyl group Chemical group [H]C([H])([H])* 0.000 claims description 18
- 229920005573 silicon-containing polymer Polymers 0.000 claims description 17
- 238000006243 chemical reaction Methods 0.000 claims description 13
- 229910000147 aluminium phosphate Inorganic materials 0.000 claims description 12
- 238000002048 anodisation reaction Methods 0.000 claims description 11
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 10
- 229910002804 graphite Inorganic materials 0.000 claims description 10
- 239000010439 graphite Substances 0.000 claims description 10
- 238000006056 electrooxidation reaction Methods 0.000 claims description 9
- 230000015572 biosynthetic process Effects 0.000 claims description 8
- 239000003792 electrolyte Substances 0.000 claims description 8
- 235000006408 oxalic acid Nutrition 0.000 claims description 8
- 239000002253 acid Substances 0.000 claims description 7
- KRVSOGSZCMJSLX-UHFFFAOYSA-L chromic acid Substances O[Cr](O)(=O)=O KRVSOGSZCMJSLX-UHFFFAOYSA-L 0.000 claims description 7
- AWJWCTOOIBYHON-UHFFFAOYSA-N furo[3,4-b]pyrazine-5,7-dione Chemical compound C1=CN=C2C(=O)OC(=O)C2=N1 AWJWCTOOIBYHON-UHFFFAOYSA-N 0.000 claims description 7
- 238000010438 heat treatment Methods 0.000 claims description 7
- 239000000463 material Substances 0.000 claims description 7
- 229910052751 metal Inorganic materials 0.000 claims description 7
- 239000002184 metal Substances 0.000 claims description 7
- 229920000642 polymer Polymers 0.000 claims description 7
- 238000003682 fluorination reaction Methods 0.000 claims description 6
- 238000001020 plasma etching Methods 0.000 claims description 6
- 230000008569 process Effects 0.000 claims description 6
- 230000008859 change Effects 0.000 claims description 5
- 230000008020 evaporation Effects 0.000 claims description 5
- 238000001704 evaporation Methods 0.000 claims description 5
- 229920002313 fluoropolymer Polymers 0.000 claims description 5
- 238000004544 sputter deposition Methods 0.000 claims description 5
- 230000003628 erosive effect Effects 0.000 claims description 4
- 229910052760 oxygen Inorganic materials 0.000 claims description 4
- 239000001301 oxygen Substances 0.000 claims description 4
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 3
- 238000005260 corrosion Methods 0.000 claims description 3
- 230000007797 corrosion Effects 0.000 claims description 3
- 238000005566 electron beam evaporation Methods 0.000 claims description 3
- 239000004811 fluoropolymer Substances 0.000 claims description 3
- 238000000465 moulding Methods 0.000 claims description 3
- 239000004094 surface-active agent Substances 0.000 claims description 3
- 238000013036 cure process Methods 0.000 claims description 2
- 238000011049 filling Methods 0.000 claims description 2
- 238000001755 magnetron sputter deposition Methods 0.000 claims description 2
- 239000002861 polymer material Substances 0.000 claims description 2
- 239000007921 spray Substances 0.000 claims description 2
- 238000001039 wet etching Methods 0.000 claims description 2
- 238000006392 deoxygenation reaction Methods 0.000 claims 2
- 230000005518 electrochemistry Effects 0.000 claims 2
- 239000011259 mixed solution Substances 0.000 claims 2
- PXGOKWXKJXAPGV-UHFFFAOYSA-N Fluorine Chemical compound FF PXGOKWXKJXAPGV-UHFFFAOYSA-N 0.000 claims 1
- 239000012670 alkaline solution Substances 0.000 claims 1
- 239000003795 chemical substances by application Substances 0.000 claims 1
- JZZIHCLFHIXETF-UHFFFAOYSA-N dimethylsilicon Chemical compound C[Si]C JZZIHCLFHIXETF-UHFFFAOYSA-N 0.000 claims 1
- 229910052731 fluorine Inorganic materials 0.000 claims 1
- 239000011737 fluorine Substances 0.000 claims 1
- 238000009616 inductively coupled plasma Methods 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 abstract description 9
- 238000005516 engineering process Methods 0.000 abstract description 6
- CXQXSVUQTKDNFP-UHFFFAOYSA-N octamethyltrisiloxane Chemical compound C[Si](C)(C)O[Si](C)(C)O[Si](C)(C)C CXQXSVUQTKDNFP-UHFFFAOYSA-N 0.000 abstract 3
- 238000004987 plasma desorption mass spectroscopy Methods 0.000 abstract 3
- 239000002585 base Substances 0.000 description 20
- 238000010586 diagram Methods 0.000 description 10
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 6
- 238000000605 extraction Methods 0.000 description 4
- 230000004044 response Effects 0.000 description 4
- 230000008901 benefit Effects 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 238000001259 photo etching Methods 0.000 description 2
- 229910021426 porous silicon Inorganic materials 0.000 description 2
- 230000035484 reaction time Effects 0.000 description 2
- ABTOQLMXBSRXSM-UHFFFAOYSA-N silicon tetrafluoride Chemical compound F[Si](F)(F)F ABTOQLMXBSRXSM-UHFFFAOYSA-N 0.000 description 2
- 229910015844 BCl3 Inorganic materials 0.000 description 1
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 description 1
- 239000003513 alkali Substances 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- AFYPFACVUDMOHA-UHFFFAOYSA-N chlorotrifluoromethane Chemical compound FC(F)(F)Cl AFYPFACVUDMOHA-UHFFFAOYSA-N 0.000 description 1
- 229910052681 coesite Inorganic materials 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 229910052906 cristobalite Inorganic materials 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
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- 238000011161 development Methods 0.000 description 1
- 238000004134 energy conservation Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000005429 filling process Methods 0.000 description 1
- 229920005570 flexible polymer Polymers 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000001459 lithography Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000002156 mixing Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 229910052698 phosphorus Inorganic materials 0.000 description 1
- 239000011574 phosphorus Substances 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 238000001338 self-assembly Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000000377 silicon dioxide Substances 0.000 description 1
- 238000000992 sputter etching Methods 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
- 229910052682 stishovite Inorganic materials 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- FAQYAMRNWDIXMY-UHFFFAOYSA-N trichloroborane Chemical compound ClB(Cl)Cl FAQYAMRNWDIXMY-UHFFFAOYSA-N 0.000 description 1
- 229910052905 tridymite Inorganic materials 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0066—Processes for devices with an active region comprising only III-V compounds with a substrate not being a III-V compound
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/005—Processes
- H01L33/0062—Processes for devices with an active region comprising only III-V compounds
- H01L33/0075—Processes for devices with an active region comprising only III-V compounds comprising nitride compounds
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/20—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies with a particular shape, e.g. curved or truncated substrate
Landscapes
- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
- Drying Of Semiconductors (AREA)
- Led Devices (AREA)
Abstract
Description
Claims (9)
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CN201610051094.4A CN105514228B (zh) | 2016-01-26 | 2016-01-26 | 一种基于纳米压印技术制备图形化蓝宝石衬底的方法 |
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CN201610051094.4A CN105514228B (zh) | 2016-01-26 | 2016-01-26 | 一种基于纳米压印技术制备图形化蓝宝石衬底的方法 |
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CN105514228A CN105514228A (zh) | 2016-04-20 |
CN105514228B true CN105514228B (zh) | 2018-11-09 |
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CN110491549A (zh) * | 2019-08-02 | 2019-11-22 | 中国航发北京航空材料研究院 | 一种可拉伸柔性减反导电膜及制备方法 |
CN112960641B (zh) * | 2020-10-12 | 2024-01-23 | 重庆康佳光电科技有限公司 | 转移构件、其制备方法及具有其的转移头 |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101806996A (zh) * | 2010-03-31 | 2010-08-18 | 华中科技大学 | 一种纳米压印硬模板的制备方法 |
CN102157642A (zh) * | 2011-03-23 | 2011-08-17 | 华中科技大学 | 一种基于纳米压印的高出光效率led的制备方法 |
CN102157643A (zh) * | 2011-04-08 | 2011-08-17 | 华中科技大学 | 一种基于纳米压印制备GaN基光子晶体LED的方法 |
CN102214742A (zh) * | 2011-06-02 | 2011-10-12 | 华中科技大学 | 一种二维光子晶体结构GaN基LED的制备方法 |
CN104651904A (zh) * | 2015-01-30 | 2015-05-27 | 北京大学 | 一种基于阳极氧化铝的纳米压印模板的制备方法 |
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2016
- 2016-01-26 CN CN201610051094.4A patent/CN105514228B/zh active Active
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101806996A (zh) * | 2010-03-31 | 2010-08-18 | 华中科技大学 | 一种纳米压印硬模板的制备方法 |
CN102157642A (zh) * | 2011-03-23 | 2011-08-17 | 华中科技大学 | 一种基于纳米压印的高出光效率led的制备方法 |
CN102157643A (zh) * | 2011-04-08 | 2011-08-17 | 华中科技大学 | 一种基于纳米压印制备GaN基光子晶体LED的方法 |
CN102214742A (zh) * | 2011-06-02 | 2011-10-12 | 华中科技大学 | 一种二维光子晶体结构GaN基LED的制备方法 |
CN104651904A (zh) * | 2015-01-30 | 2015-05-27 | 北京大学 | 一种基于阳极氧化铝的纳米压印模板的制备方法 |
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Inventor after: Chen Shaoqiang Inventor after: Weng Guoen Inventor after: Hu Xiaobo Inventor after: Tu Liangliang Inventor after: Wei Mingde Inventor before: Chen Shaoqiang Inventor before: Weng Guoen Inventor before: Hu Xiaobo |
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