CN105469982B - Universal single-layer capacitor naked core grain fine setting test base device - Google Patents
Universal single-layer capacitor naked core grain fine setting test base device Download PDFInfo
- Publication number
- CN105469982B CN105469982B CN201610015866.9A CN201610015866A CN105469982B CN 105469982 B CN105469982 B CN 105469982B CN 201610015866 A CN201610015866 A CN 201610015866A CN 105469982 B CN105469982 B CN 105469982B
- Authority
- CN
- China
- Prior art keywords
- naked core
- core grain
- test
- layer capacitor
- fine setting
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 93
- 239000003990 capacitor Substances 0.000 title claims abstract description 20
- 239000002356 single layer Substances 0.000 title claims abstract description 19
- 230000003028 elevating effect Effects 0.000 claims abstract description 14
- 230000033001 locomotion Effects 0.000 claims description 5
- 239000007771 core particle Substances 0.000 claims 2
- 238000005259 measurement Methods 0.000 abstract description 2
- 230000000694 effects Effects 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Power Engineering (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a kind of universal single-layer capacitor naked core grain fine setting test base device, including a Z-direction elevating mechanism, and the rotary naked core grain mechanism for testing on Z-direction elevating mechanism, the rotary naked core grain mechanism for testing is connected with external vacuum equipment.Therefore, base device test position by rotation adjustment testing needle and naked core grain during high speed test is tested in the naked core grain fine setting of the present invention, test position fix precision is improved, the measurement error caused due to positioning precision, influence sorting test accuracy and efficiency is reduced.
Description
Technical field
The present invention is used for microwave ceramic capacitance and manufactures field.Specifically a kind of universal single-layer capacitor naked core grain fine setting
Base device is tested, the sorting test system in the universal single-layer capacitor naked core grain test machine people of small size is applied, and to logical
Tested with type single-layer capacitor naked core grain.Not only fit the sorting test of universal single-layer capacitor naked core grain test machine people
In system, the naked cores such as diode, triode, electric capacity grain chip pick-up is can be also used for, be particularly suitable for use in crisp fritter and easy damaged
The naked core grain chip testing of high position precision.
Background technology
Universal single-layer capacitor, is used widely in military field and end civil use field, and such as radar, guided missile are distant
The systems such as control, satellite communication, positioning, telstar receiver, wireless local, its naked core grain chip product size is from 0.254mm
× 0.254mm × 0.127mm to 2.29mm × 2.29mm × 0.254mm, capacitor naked core grain chip have small volume, it is thin,
The features such as crisp, gold coatings are easily scratched, and test the sorting that base device is universal single-layer capacitor naked core grain test machine people
Important component in test system, directly affects the test result of universal single-layer capacitor naked core grain chip, has an effect on chip
Product quality, cause scuffing, damage and collapse the quality problems such as angle.At present, producer passes through generally by the way of manually picking up
Tweezers are picked up, and are placed on test board, and handheld test pin is contacted with chip, ripe due to workman during engaged test
Practice degree and the test force that uses is different and influence of human factor, can be according into different degrees of damage or testing needle to chip
Contact position skew chip center, can all cause test error, have influence on the accuracy of test data, and then influence application effect
Really.
The content of the invention
In view of above-mentioned present situation, the invention provides a kind of universal single-layer capacitor naked core grain fine setting test base device.Make
It, by rotating the test position of adjustment testing needle and naked core grain, improves test position fix precision during high speed test, reduces
The measurement error caused due to positioning precision, influence sorting test accuracy and efficiency.
The present invention solve its technical problem technical scheme be：A kind of universal single-layer capacitor naked core grain fine setting test bench
Device, including a Z-direction elevating mechanism, and the rotary naked core grain mechanism for testing on Z-direction elevating mechanism, this is rotary
Naked core grain mechanism for testing is connected with external vacuum equipment.
In the present invention, involved Z-direction elevating mechanism, including screw mandrel, the square spiral shell of cooperation is installed on the screw mandrel
Frame support frame is fixedly connected with mother, the square nut, the screw mandrel lower end is provided with Z-direction motor big belt wheel, passes through Z thereon
It is connected to drive belt with the Z-direction motor small pulley on Z-direction motor.
Further, involved rotary naked core grain mechanism for testing, including naked core grain test bench, are tested by naked core grain
The bottom of seat is fixedly connected with rotation big belt wheel, and described rotation big belt wheel is arranged on the bearing at frame support frame center, should
Rotation big belt wheel is connected by rotating belt with the rotation small pulley on electric rotating machine.
Further, naked core grain test bench can realize 0-360 ° of rotation, with along Z-direction elevating movement.
Further, the naked core grain test bench is in the ducted body of " ∩ " type, and naked core grain test bench side is provided with vacuum
Carried in the middle part of joint, naked core grain test bench end face and vacuum sucking holes are distributed with square test trough, the square test trough, it is and true
Empty joint is communicated.
The beneficial effects of the invention are as follows：Naked core grain fine setting test base device of the present invention passes through rotation during high speed test
The test position of testing needle and naked core grain is adjusted, test position fix precision is improved, the test caused due to positioning precision is reduced inclined
Difference, influence sorting test accuracy and efficiency.In addition, apparatus of the present invention substitute existing handheld test mode, artificial behaviour is solved
Make a series of problems of brought influence product quality, greatly reduce hand labor intensity, add the quality of product
Uniformity and reliability.The problem of drawbacks described above is brought, reduction labor strength and manpower are solved using present apparatus side bottom.
In addition, the present invention is used for microwave ceramic capacitance manufacturing, apply in the universal single-layer capacitor naked core grain test machine of small size
In the sorting test system of device people.For testing universal single-layer capacitor naked core grain.The present invention not only fits universal
In the sorting test system of single-layer capacitor naked core grain test machine people.It can be also used for the naked cores such as diode, triode, electric capacity
Grain chip pick-up, the naked core grain chip testing of be particularly suitable for use in crisp fritter and the high position precision of easy damaged.
Brief description of the drawings
Fig. 1 is the topology view of the present invention；
Fig. 2 is Fig. 1 A-A sectional views.
Embodiment
The present invention is explained in further detail embodiment below in conjunction with the accompanying drawings.
See a kind of universal single-layer capacitor naked core grain fine setting test base device shown in Fig. 1, Fig. 2, including a Z-direction liter
Descending mechanism, and the rotary naked core grain mechanism for testing on Z-direction elevating mechanism, the rotary naked core grain mechanism for testing with it is outer
The vacuum equipment connection connect.Z-direction elevating mechanism in the present invention, including the Z-direction motor cabinet 2 installed in the side of bottom plate 1, described
Z-direction motor 4 is installed, the Z-direction motor 4 is provided with Z-direction motor small pulley 3, is driven by Z-direction on Z-direction motor cabinet 2
The Z-direction motor big belt wheel 6 that belt 5 is arranged on screw mandrel 17 with the opposite side of bottom plate 1 is connected, the Z-direction in the present embodiment transmission system
Drive belt 5, Z-direction motor small pulley 3 and Z-direction motor big belt wheel 6 are the cog belts and toothed wheel structure used.Described
The two ends of screw mandrel 17 are provided with upper and lower bearing 22,11, are arranged on upper support by the upper and lower bearing bracket stand 21,10 connected thereon respectively
Cover plate 23 and on the big support base 8 on bottom plate 1, is equipped with locking screw on the screw mandrel 17 of the both sides of Z-direction motor big belt wheel 6
Mother 7,9, upper and lower distance piece 19,12 is respectively provided with the screw mandrel 17 of the upper and lower inner side of bearing bracket stand 21,10.In the big support
Symmetrical riser 13 is installed between seat 8 and upper support cover plate 23 and constitutes stable framework.On screw mandrel 17 described in the present embodiment
The square nut 18 of cooperation is installed, the both sides of the square nut 18 are sequentially arranged with sliding block connector 16, guide runner 15, passed through
Guide runner 15 therein and the slide rail 14 being fixed on riser 13 are slidably installed cooperation.When the control forward and reverse rotation of screw mandrel 17
When, the square nut 18 that can control on screw mandrel 17 is lifted.Rotary naked core grain mechanism for testing of the present invention, including naked core grain
Test bench 32, is fixedly connected, described rotation big belt wheel 26 is pacified by the bottom of naked core grain test bench 32 with rotation big belt wheel 26
Mounted on the centre bearing 25 that collateral fagging 20 and mounting bracket 24 constitute frame support frame, the rotation big belt wheel 26 passes through rotation
Belt 27 is connected with the rotation small pulley 29 on electric rotating machine 30.Seal groove between naked core grain test bench 32 and mounting bracket 24
Sealing ring 31 is provided with 30.Collateral fagging 20 described in the present embodiment is fixedly connected with the square nut 18 on screw mandrel 17, can be with
Naked core grain test bench 32 is controlled along Z-direction elevating movement.Meanwhile, naked core grain test bench 32 is controlled further through electric rotating machine 30, is passed through
The control of electric rotating machine 30 can realize 0-360 ° of rotation.Naked core grain test bench 32 described in the present embodiment is in the ducted body of " ∩ " type,
Naked core grain test bench 32 side is provided with the middle part of vacuum adapter 33, the naked core grain end face of test bench 32 and carries square test trough,
Vacuum sucking holes are distributed with the square test trough, are communicated with vacuum adapter 33.
During detection, naked core grain is placed in the square test trough on naked core grain test bench 32, passes through vacuum sucking holes thereon
Naked core grain is tightly adsorbed.When the center of naked core grain produces deviation with respect to the position of testing needle, start electric rotating machine 30, control
Naked core grain test bench 32 rotates, until inhaling center and the center superposition of testing needle of naked core grain attached to it, anglec of rotation model
Enclose for 0 ° -360 °.
The effect of Z-direction elevating mechanism is：When Z-direction motor 4 is rotated forward, naked core grain is driven by naked core grain test bench 32
Motion upwards；When Z-direction motor 4 is inverted, naked core grain test bench 32 drives naked core grain to move downward, and passes through naked core grain test bench
32 drive naked core grain, and motion completes a test action up and down.
Claims (3)
1. a kind of universal single-layer capacitor naked core grain fine setting test base device, it is characterized in that, including a Z-direction elevating mechanism,
And the rotary naked core grain mechanism for testing on Z-direction elevating mechanism, described Z-direction elevating mechanism, including screw mandrel 17, in institute
The square nut 18 that cooperation is provided with screw mandrel 17 is stated, frame support frame 20, the screw mandrel are fixedly connected with the square nut 18
17 lower ends are provided with Z-direction motor big belt wheel 6, small by Z-direction drive belt 5 thereon and Z-direction motor on Z-direction motor 4
Belt wheel 3 is connected；Described rotary naked core grain mechanism for testing, including naked core grain test bench 32, pass through naked core grain test bench 32
Bottom is fixedly connected with rotation big belt wheel 26, and described rotation big belt wheel 26 is arranged on the bearing at frame support frame center, should
Rotation big belt wheel 26 is connected by rotating belt 27 with the rotation small pulley 29 on electric rotating machine 30, the rotary naked core grain test
Mechanism is connected with external vacuum equipment.
2. universal single-layer capacitor naked core grain fine setting test base device according to claim 1, it is characterized in that, it is described naked
Core particles test bench（32）0-360 ° of rotation can be realized, with along Z-direction elevating movement.
3. universal single-layer capacitor naked core grain fine setting test base device according to claim 1, it is characterized in that, it is described naked
Core particles test bench 32 is in the ducted body of " ∩ " type, and naked core grain test bench 32 side is provided with vacuum adapter 33, and the naked core grain is surveyed
Try to carry in the middle part of the end face of seat 32 and vacuum sucking holes are distributed with square test trough, the square test trough, communicated with vacuum adapter 33.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610015866.9A CN105469982B (en) | 2016-01-12 | 2016-01-12 | Universal single-layer capacitor naked core grain fine setting test base device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610015866.9A CN105469982B (en) | 2016-01-12 | 2016-01-12 | Universal single-layer capacitor naked core grain fine setting test base device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105469982A CN105469982A (en) | 2016-04-06 |
| CN105469982B true CN105469982B (en) | 2017-10-13 |
Family
ID=55607585
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610015866.9A Active CN105469982B (en) | 2016-01-12 | 2016-01-12 | Universal single-layer capacitor naked core grain fine setting test base device |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN105469982B (en) |
Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2871119B2 (en) * | 1991-01-30 | 1999-03-17 | 株式会社村田製作所 | Ceramic green sheet handling method and equipment |
| CN2430774Y (en) * | 2000-07-09 | 2001-05-16 | 初殿生 | Laminated equipment |
| CN2853200Y (en) * | 2005-12-08 | 2007-01-03 | 伯士恩有限公司 | High pressure sorting device for chip type capacitor |
| CN102175960A (en) * | 2011-01-14 | 2011-09-07 | 上海微曦自动控制技术有限公司 | Quad flat no-lead (QFN) chip gravity type testing device |
| CN202183410U (en) * | 2011-08-23 | 2012-04-04 | 广东志成华科光电设备有限公司 | Chip steering apparatus for SMD LED paster light-splitting machine |
| CN202275092U (en) * | 2011-09-21 | 2012-06-13 | 复旦大学 | Aligning device |
| CN204613356U (en) * | 2015-05-28 | 2015-09-02 | 广东合科泰实业有限公司 | A kind of transistor test device |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU1247957A1 (en) * | 1984-03-20 | 1986-07-30 | Специальное Конструкторское Бюро При Ордена Трудового Красного Знамени Псковском Заводе Радиодеталей | Apparatus for bringing parts like shaft and bushing into coincidence |
| JP2003151865A (en) * | 2001-11-15 | 2003-05-23 | Murata Mfg Co Ltd | Peeling device and peeling method |
| CN201514459U (en) * | 2009-03-23 | 2010-06-23 | 常州新区爱立德电子有限公司 | Chip test desk |
| CN101710565B (en) * | 2009-11-24 | 2012-02-22 | 中国科学院长春光学精密机械与物理研究所 | Device for realizing picking-up and turning-over of chip |
| CN103612083B (en) * | 2013-10-29 | 2016-03-02 | 杭州电子科技大学 | Piezoelectric transducer electrode is aimed at and contact device with detection chuck |
| CN104021950B (en) * | 2014-05-27 | 2016-08-31 | 秦皇岛视听机械研究所 | Single-layer capacitor naked core grain sorting test machine fine setting suction piece device |
| CN203909100U (en) * | 2014-06-19 | 2014-10-29 | 高新华 | Semiconductor chip test probe station |
| CN204220509U (en) * | 2014-10-31 | 2015-03-25 | 扬州泽旭电子科技有限责任公司 | SMD components Test handler |
| CN204916274U (en) * | 2015-08-25 | 2015-12-30 | 东莞中之光电股份有限公司 | Correcting unit of test braider |
| CN105182209B (en) * | 2015-09-23 | 2018-01-09 | 深圳市万中和科技有限公司 | The production detecting system and method for miniature display chip |
-
2016
- 2016-01-12 CN CN201610015866.9A patent/CN105469982B/en active Active
Patent Citations (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2871119B2 (en) * | 1991-01-30 | 1999-03-17 | 株式会社村田製作所 | Ceramic green sheet handling method and equipment |
| CN2430774Y (en) * | 2000-07-09 | 2001-05-16 | 初殿生 | Laminated equipment |
| CN2853200Y (en) * | 2005-12-08 | 2007-01-03 | 伯士恩有限公司 | High pressure sorting device for chip type capacitor |
| CN102175960A (en) * | 2011-01-14 | 2011-09-07 | 上海微曦自动控制技术有限公司 | Quad flat no-lead (QFN) chip gravity type testing device |
| CN202183410U (en) * | 2011-08-23 | 2012-04-04 | 广东志成华科光电设备有限公司 | Chip steering apparatus for SMD LED paster light-splitting machine |
| CN202275092U (en) * | 2011-09-21 | 2012-06-13 | 复旦大学 | Aligning device |
| CN204613356U (en) * | 2015-05-28 | 2015-09-02 | 广东合科泰实业有限公司 | A kind of transistor test device |
Also Published As
| Publication number | Publication date |
|---|---|
| CN105469982A (en) | 2016-04-06 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN110261398B (en) | Automatic capacitance detector | |
| CN109746195A (en) | automatic detection device | |
| CN105137131B (en) | A kind of FPC board checking devices of automatic fine tuning positioning | |
| CN104459439B (en) | The automatic checkout equipment of touch screen | |
| CN106060531B (en) | A kind of full-automatic four stations Camera Test machine | |
| CN104960919B (en) | Electric energy meter robot feeding and discharging system and working process thereof | |
| CN114019356A (en) | Bad recognition equipment of chip outward appearance and chip test system thereof | |
| CN108855962A (en) | It is a kind of for being pressed into the detection machine of the jig plate of electroceramics particle capacitor | |
| CN106771968A (en) | A kind of multistation automatic detection integration apparatus | |
| CN115436786A (en) | Safety protection type chip detection device and use method thereof | |
| CN112362676B (en) | Curved surface screen crack detection equipment | |
| CN110406116A (en) | A kind of filtering plastic pipe union assembly detection device | |
| CN107745964A (en) | Paster type resistor detecting system and the production equipment comprising the detecting system | |
| CN107777351A (en) | Paster type resistor loading and unloading system and the production equipment comprising the loading and unloading system | |
| CN109283454A (en) | Full-automatic pcb board electric logging device | |
| CN109827538A (en) | A kind of bar straightness detection device and its straightness detection method | |
| CN105469982B (en) | Universal single-layer capacitor naked core grain fine setting test base device | |
| CN207103037U (en) | Highly effective curved face point gum machine | |
| TWI405285B (en) | Rotating apparatus having single driving part with a function of rotational and translational motion | |
| CN115332120A (en) | Chip automatic detection packaging hardware | |
| CN206084352U (en) | Winged -type blood taking needle equipment | |
| CN106862015A (en) | Highly effective curved face point gum machine | |
| CN105171690A (en) | Automatic assembly tool | |
| CN114377995A (en) | Multi-station test equipment for manufacturing integrated circuit | |
| CN206362894U (en) | A kind of multistation automatic detection integration apparatus |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant | ||
| CP01 | Change in the name or title of a patent holder |
Address after: No. 165, middle section of Hebei Avenue, seaport area, Qinhuangdao, Hebei Province Patentee after: Qinhuangdao audio-visual Machinery Research Institute Co., Ltd. Address before: No. 165, middle section of Hebei Avenue, seaport area, Qinhuangdao, Hebei Province Patentee before: Qinhuangdao Video-Audio Machinery Inst. |
|
| CP01 | Change in the name or title of a patent holder |