CN105469982A - Slight adjustment test seat device for naked core of universal single-layer capacitor - Google Patents
Slight adjustment test seat device for naked core of universal single-layer capacitor Download PDFInfo
- Publication number
- CN105469982A CN105469982A CN201610015866.9A CN201610015866A CN105469982A CN 105469982 A CN105469982 A CN 105469982A CN 201610015866 A CN201610015866 A CN 201610015866A CN 105469982 A CN105469982 A CN 105469982A
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- China
- Prior art keywords
- naked core
- core grain
- test bench
- test
- layer capacitor
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- 238000012360 testing method Methods 0.000 title claims abstract description 99
- 239000003990 capacitor Substances 0.000 title claims abstract description 22
- 239000002356 single layer Substances 0.000 title claims abstract description 21
- 230000003028 elevating effect Effects 0.000 claims description 13
- 238000000034 method Methods 0.000 abstract description 4
- 238000001612 separation test Methods 0.000 abstract 1
- 239000000919 ceramic Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000012797 qualification Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/08—Inorganic dielectrics
- H01G4/12—Ceramic dielectrics
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Power Engineering (AREA)
- Ceramic Engineering (AREA)
- Inorganic Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
The invention discloses a slight adjustment test seat device for a naked core of a universal single-layer capacitor. The slight adjustment test seat device comprises a Z-directional lifting mechanism and a rotary naked core test mechanism, wherein the rotary naked core test mechanism is arranged on the Z-directional lifting mechanism and connected with an external vacuum device. Therefore, with the slight adjustment test seat device for the naked core during the high-speed test process, the test positioning accuracy is improved by rotatably adjusting a test needle and the test position of the naked core, the test deviation caused by the positioning accuracy is reduced, and the influence on the separation test accuracy and the efficiency is also reduced.
Description
Technical field
The present invention is used for microwave ceramic capacitance and manufactures field.Be a kind of universal single-layer capacitor naked core grain fine setting test bench device specifically, be applied in the sorting test macro of small size universal single-layer capacitor naked core grain test machine people, and universal single-layer capacitor naked core grain is tested.Not only fit on the sorting test macro of universal single-layer capacitor naked core grain test machine people, the naked core grain chip pick-ups such as diode, triode, electric capacity can also be used for, be particularly useful for the naked core grain chip testing of the high position precision of crisp fritter and easy damaged.
Background technology
Universal single-layer capacitor, all be used widely in military field and end civil use field, as radar, guided missile remote control, satellite communication, location, telstar receiver, the systems such as wireless local, its naked core grain chip product size is from 0.254mm × 0.254mm × 0.127mm to 2.29mm × 2.29mm × 0.254mm, it is little that this capacitor naked core grain chip has volume, thin, crisp, the features such as gold coatings easily scratches, and test bench device be universal single-layer capacitor naked core grain test machine people sorting test macro on vitals, the test result of direct impact universal single-layer capacitor naked core grain chip, also affect the product quality of chip, cause scuffing, damage and collapse the quality problems such as angle.At present, producer adopts the mode of artificial pickup usually, picked up by tweezers, and being positioned on test board, handheld test pin contacts with chip, the impact of and human factor different due to the test force of the qualification of workman and use in engaged test process, the contact position skew chip center of damage in various degree or testing needle can be shone into chip, test error is caused in capital, has influence on the accuracy of test data, and then affects effect.
Summary of the invention
In view of above-mentioned present situation, the invention provides a kind of universal single-layer capacitor naked core grain fine setting test bench device.Make it by rotating the test position of adjustment testing needle and naked core grain in high speed test process, raising test position fix precision, reduces the measurement error caused due to positioning precision, affects sorting test accuracy and efficiency.
The technical scheme that the present invention solves its technical problem is: a kind of universal single-layer capacitor naked core grain fine setting test bench device, comprise a Z-direction elevating mechanism, and the rotary naked core grain mechanism for testing be arranged on Z-direction elevating mechanism, this rotary naked core grain mechanism for testing is connected with external vacuum equipment.
In the present invention, involved Z-direction elevating mechanism, comprise screw mandrel, described screw mandrel is provided with the square nut of cooperation, this square nut is fixedly connected with frame bracing frame, described screw mandrel lower end is provided with the large belt wheel of Z-direction motor, drives belt to be connected with the Z-direction motor small pulley on Z-direction drive motors by the Z-direction on it.
Further, involved rotary naked core grain mechanism for testing, comprise naked core grain test bench, be fixedly connected with the large belt wheel of rotation by the bottom of naked core grain test bench, the large belt wheel of described rotation is arranged on the bearing at frame bracing frame center, and the large belt wheel of this rotation is connected with the rotation small pulley on electric rotating machine by rotating belt.
Further, described naked core grain test bench can realize 0-360 ° of rotation, with along Z-direction elevating movement.
Further, the ducted body of described naked core grain test bench in " ∩ " type, this naked core grain test bench side is provided with vacuum adapter, with square test trough in the middle part of described naked core grain test bench end face, this square test trough is distributed with vacuum sucking holes, communicates with vacuum adapter.
The invention has the beneficial effects as follows: naked core grain fine setting test bench device of the present invention adjusts the test position of testing needle and naked core grain in high speed test process by rotation, improve test position fix precision, reduce the measurement error caused due to positioning precision, affect sorting test accuracy and efficiency.In addition, apparatus of the present invention substitute existing handheld test mode, solve the series of problems affecting product quality that manual operation brings, greatly reduce hand labor intensity, add consistency and the reliability of the quality of product.Adopt the problem solving above-mentioned defect at the bottom of this device side and bring, reduce labor strength and manpower.In addition, the present invention is used for microwave ceramic capacitance manufacturing, is applied on the sorting test macro of small size universal single-layer capacitor naked core grain test machine people.For testing universal single-layer capacitor naked core grain.The present invention not only fits on the sorting test macro of universal single-layer capacitor naked core grain test machine people.The naked core grain chip pick-ups such as diode, triode, electric capacity can also be used for, be particularly useful for the naked core grain chip testing of the high position precision of crisp fritter and easy damaged.
Accompanying drawing explanation
Fig. 1 is topology view of the present invention;
Fig. 2 is the A-A cutaway view of Fig. 1.
Embodiment
Below in conjunction with accompanying drawing embodiment, the present invention is explained in further detail.
See the one universal single-layer capacitor naked core grain fine setting test bench device shown in Fig. 1, Fig. 2, comprise a Z-direction elevating mechanism, and the rotary naked core grain mechanism for testing be arranged on Z-direction elevating mechanism, this rotary naked core grain mechanism for testing is connected with external vacuum equipment.Z-direction elevating mechanism in the present invention, comprise the Z-direction motor cabinet 2 being arranged on base plate 1 side, described Z-direction motor cabinet 2 is provided with Z-direction drive motors 4, this Z-direction drive motors 4 is provided with Z-direction motor small pulley 3, drive belt 5 to be connected with the large belt wheel 6 of Z-direction motor that base plate 1 opposite side is arranged on screw mandrel 17 by Z-direction, the Z-direction in the present embodiment drive system drives belt 5, Z-direction motor small pulley 3 and the large belt wheel 6 of Z-direction motor to be the cog belt and toothed wheel structure that adopt.Described screw mandrel 17 two ends are provided with upper and lower bearing 22,11, be arranged on upper support cover plate 23 respectively by the upper and lower bearing bracket stand 21,10 that it connects and be positioned on the large supporting seat 8 on base plate 1, on the screw mandrel 17 of Z-direction motor large belt wheel 6 both sides, locking nut 7,9 is housed, is positioned on the screw mandrel 17 inside upper and lower bearing bracket stand 21,10 and upper and lower distance piece 19,12 is housed respectively.Described large supporting seat 8 and on support and symmetrical riser 13 is installed between cover plate 23 forms stable framework.Screw mandrel 17 described in the present embodiment is provided with the square nut 18 of cooperation, the both sides of this square nut 18 are equipped with slide block connector 16, guide runner 15 successively, and being slidably installed with the slide rail 14 be fixed on riser 13 by guide runner 15 is wherein coordinated.When the forward and reverse rotation of control screw mandrel 17, the square nut 18 on controlled throwing bar 17 is elevated.Rotary naked core grain mechanism for testing of the present invention, comprise naked core grain test bench 32, be fixedly connected with the large belt wheel 26 of rotation by the bottom of naked core grain test bench 32, the large belt wheel of described rotation 26 is arranged on and forms on the centre bearing 25 of frame bracing frame by collateral fagging 20 with installing rack 24, and the large belt wheel 26 of this rotation is connected with the rotation small pulley 29 on electric rotating machine 30 by rotating belt 27.Sealing ring 31 is provided with in seal groove 30 between naked core grain test bench 32 and installing rack 24.Collateral fagging 20 described in the present embodiment is fixedly connected with the square nut 18 on screw mandrel 17, can control naked core grain test bench 32 along Z-direction elevating movement.Meanwhile, control naked core grain test bench 32 by electric rotating machine 30 again, control to realize 0-360 ° of rotation by electric rotating machine 30.The ducted body of naked core grain test bench 32 in " ∩ " type described in the present embodiment, this naked core grain test bench 32 side is provided with vacuum adapter 33, with square test trough in the middle part of described naked core grain test bench 32 end face, this square test trough is distributed with vacuum sucking holes, communicates with vacuum adapter 33.
During detection, naked core grain is placed in the square test trough on naked core grain test bench 32, by the vacuum sucking holes on it, naked core grain is tightly adsorbed.When the position of the relative testing needle in center of naked core grain produces deviation, start electric rotating machine 30, control naked core grain test bench 32 and rotate, until the center of naked core grain of adsorbing thereon and the center superposition of testing needle, rotation angle range is 0 °-360 °.
The effect of Z-direction elevating mechanism is: when Z-direction drive motors 4 rotates forward, and drives naked core grain to move upward by naked core grain test bench 32; When Z-direction drive motors 4 reverses, naked core grain test bench 32 drives naked core grain to move downward, and drives naked core grain to have moved up and down a test action by naked core grain test bench 32.
Claims (5)
1. a universal single-layer capacitor naked core grain fine setting test bench device, it is characterized in that, comprise a Z-direction elevating mechanism, and be arranged on the rotary naked core grain mechanism for testing on Z-direction elevating mechanism, this rotary naked core grain mechanism for testing is connected with external vacuum equipment.
2. universal single-layer capacitor naked core grain fine setting test bench device according to claim 1, it is characterized in that, described Z-direction elevating mechanism, comprise screw mandrel (17), described screw mandrel (17) is provided with the square nut (18) of cooperation, this square nut (18) is fixedly connected with frame bracing frame (20), described screw mandrel (17) lower end is provided with the large belt wheel of Z-direction motor (6), drives belt (5) to be connected with the Z-direction motor small pulley (3) on Z-direction drive motors (4) by the Z-direction on it.
3. universal single-layer capacitor naked core grain fine setting test bench device according to claim 1, it is characterized in that, described rotary naked core grain mechanism for testing, comprise naked core grain test bench (32), be fixedly connected with the large belt wheel of rotation (26) by the bottom of naked core grain test bench (32), the large belt wheel of described rotation (26) is arranged on the bearing at frame bracing frame center, and the large belt wheel of this rotation (26) is connected with the rotation small pulley (29) on electric rotating machine (30) by rotating belt (27).
4. universal single-layer capacitor naked core grain fine setting test bench device according to claim 1, it is characterized in that, described naked core grain test bench (32) can realize 0-360 ° of rotation, with along Z-direction elevating movement.
5. universal single-layer capacitor naked core grain fine setting test bench device according to claim 1, it is characterized in that, the ducted body of described naked core grain test bench (32) in " ∩ " type, this naked core grain test bench (32) side is provided with vacuum adapter (33), with square test trough in the middle part of described naked core grain test bench (32) end face, this square test trough is distributed with vacuum sucking holes, communicates with vacuum adapter (33).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610015866.9A CN105469982B (en) | 2016-01-12 | 2016-01-12 | Universal single-layer capacitor naked core grain fine setting test base device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201610015866.9A CN105469982B (en) | 2016-01-12 | 2016-01-12 | Universal single-layer capacitor naked core grain fine setting test base device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN105469982A true CN105469982A (en) | 2016-04-06 |
| CN105469982B CN105469982B (en) | 2017-10-13 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201610015866.9A Active CN105469982B (en) | 2016-01-12 | 2016-01-12 | Universal single-layer capacitor naked core grain fine setting test base device |
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2016
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| JP2871119B2 (en) * | 1991-01-30 | 1999-03-17 | 株式会社村田製作所 | Ceramic green sheet handling method and equipment |
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| CN105469982B (en) | 2017-10-13 |
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Address after: No. 165, middle section of Hebei Avenue, seaport area, Qinhuangdao, Hebei Province Patentee after: Qinhuangdao audio-visual Machinery Research Institute Co., Ltd. Address before: No. 165, middle section of Hebei Avenue, seaport area, Qinhuangdao, Hebei Province Patentee before: Qinhuangdao Video-Audio Machinery Inst. |