CN105428294B - El测试装置中的归正机构 - Google Patents
El测试装置中的归正机构 Download PDFInfo
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- CN105428294B CN105428294B CN201510988491.XA CN201510988491A CN105428294B CN 105428294 B CN105428294 B CN 105428294B CN 201510988491 A CN201510988491 A CN 201510988491A CN 105428294 B CN105428294 B CN 105428294B
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- 238000002407 reforming Methods 0.000 claims abstract description 66
- 238000007664 blowing Methods 0.000 claims abstract description 16
- 238000007599 discharging Methods 0.000 claims abstract description 3
- 239000007787 solid Substances 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 abstract description 6
- 238000006073 displacement reaction Methods 0.000 abstract description 4
- 239000011521 glass Substances 0.000 description 8
- 238000012797 qualification Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 230000007547 defect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/68—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for positioning, orientation or alignment
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
- H01L22/10—Measuring as part of the manufacturing process
- H01L22/12—Measuring as part of the manufacturing process for structural parameters, e.g. thickness, line width, refractive index, temperature, warp, bond strength, defects, optical inspection, electrical measurement of structural dimensions, metallurgic measurement of diffusions
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Photovoltaic Devices (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Abstract
Description
Claims (5)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510988491.XA CN105428294B (zh) | 2015-12-25 | 2015-12-25 | El测试装置中的归正机构 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510988491.XA CN105428294B (zh) | 2015-12-25 | 2015-12-25 | El测试装置中的归正机构 |
Publications (2)
Publication Number | Publication Date |
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CN105428294A CN105428294A (zh) | 2016-03-23 |
CN105428294B true CN105428294B (zh) | 2018-05-08 |
Family
ID=55506400
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201510988491.XA Active CN105428294B (zh) | 2015-12-25 | 2015-12-25 | El测试装置中的归正机构 |
Country Status (1)
Country | Link |
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CN (1) | CN105428294B (zh) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN106335739A (zh) * | 2016-08-30 | 2017-01-18 | 嘉友联精密机械工程(无锡)有限公司 | 一种el检测让位式输送装置 |
CN108288659B (zh) * | 2018-04-02 | 2023-12-01 | 通威太阳能(安徽)有限公司 | 一种单片太阳能电池片边缘刻蚀用防挤压夹具 |
Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102237437A (zh) * | 2010-04-27 | 2011-11-09 | 英利能源(中国)有限公司 | 一种用于翻转光伏电池组件的翻转装置和层压后传输线 |
CN102779876A (zh) * | 2012-08-01 | 2012-11-14 | 保定嘉盛光电科技有限公司 | 一种全玻组件及其生产制造方法 |
CN205248247U (zh) * | 2015-12-25 | 2016-05-18 | 江苏创基新能源有限公司 | El测试装置中的归正机构 |
Family Cites Families (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP1900038A4 (en) * | 2005-06-17 | 2012-01-04 | Transform Solar Pty Ltd | PROCESS FOR INTERCONNECTING SOLAR CELLS |
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2015
- 2015-12-25 CN CN201510988491.XA patent/CN105428294B/zh active Active
Patent Citations (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102237437A (zh) * | 2010-04-27 | 2011-11-09 | 英利能源(中国)有限公司 | 一种用于翻转光伏电池组件的翻转装置和层压后传输线 |
CN102779876A (zh) * | 2012-08-01 | 2012-11-14 | 保定嘉盛光电科技有限公司 | 一种全玻组件及其生产制造方法 |
CN205248247U (zh) * | 2015-12-25 | 2016-05-18 | 江苏创基新能源有限公司 | El测试装置中的归正机构 |
Also Published As
Publication number | Publication date |
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CN105428294A (zh) | 2016-03-23 |
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Effective date of registration: 20240821 Address after: 215600 No.76 Minfeng South Road, Nanfeng Town, Zhangjiagang City, Suzhou City, Jiangsu Province Patentee after: ZHANGJIAGANG DONGDA INDUSTRIAL TECHNOLOGY Research Institute Country or region after: China Address before: 215628 Jiangsu Chuangji New Energy Co.,Ltd., No. 35 Jiangong Avenue, Nanfeng Town, Zhangjiagang City, Suzhou City, Jiangsu Province Patentee before: JIANGSU CHUANGQI RENEWABLE CO.,LTD. Country or region before: China |
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