CN105223495A - A kind of method of testing of the Analog-digital circuit fault diagnosis based on expert system - Google Patents
A kind of method of testing of the Analog-digital circuit fault diagnosis based on expert system Download PDFInfo
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- CN105223495A CN105223495A CN201510679007.5A CN201510679007A CN105223495A CN 105223495 A CN105223495 A CN 105223495A CN 201510679007 A CN201510679007 A CN 201510679007A CN 105223495 A CN105223495 A CN 105223495A
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Abstract
The present invention relates to electric device maintenance technical field, particularly relate to a kind of method of testing of the Analog-digital circuit fault diagnosis based on expert system.The present invention is by transient response Test Application in Analog-digital circuit fault diagnosis, the method for testing realized by traditional expert system; This system comprises knowledge base and inference machine two large divisions, and the establishment of knowledge base comprises knowledge acquisition, the true sign of measurand, rule base, database formation; Inference machine comprises explanation facility and man-machine interface part.The present invention has higher fault coverage, as long as monitoring input node and output node, avoids the problem that test point is selected, easy to operate.Transient response test another one advantage be exactly its speed usually than traditional small-signal test or static test speed fast.The present invention simplifies test process greatly, saves test duration and expense, working effect is significantly improved, is more suitable for practical engineering application.
Description
Technical field
The present invention relates to electric device maintenance technical field, particularly relate to a kind of method of testing of the Analog-digital circuit fault diagnosis based on expert system.
Background technology
Optimization linearity test signal method based on faultless circuit response be the present invention adopt the basis of method.This test signal comprises a string rect.p., and the amplitude of pulse is relevant with the transport function of circuit-under-test with the duration.But this method can not directly apply to analog-digital blended signal circuit test, because once test signal is by digital module, amplitude can be limited in the scope between logical zero and logical one.
Summary of the invention
For overcoming the defect existed in prior art, the invention provides a kind of method of testing of the Analog-digital circuit fault diagnosis based on expert system.Its objective is and provide one greatly can simplify test process, save test duration and expense, a kind of method of testing that working effect is significantly improved.
For achieving the above object, the technical solution adopted in the present invention is:
Based on a method of testing for the Analog-digital circuit fault diagnosis of expert system, be by transient response Test Application in Analog-digital circuit fault diagnosis, the method for testing realized by traditional expert system; This system comprises knowledge base and inference machine two large divisions, and the establishment of knowledge base comprises knowledge acquisition, the true sign of measurand, rule base, database formation; Inference machine comprises explanation facility and man-machine interface part; The construction method of this system knowledge base and inference machine is as follows:
Step 1, sets up knowledge base: the transient response curve under several state is distinguished obvious, effectively can distinguish state representative separately; But clearly non-linear due to curve, expert system None-identified, such curve can not directly be put in knowledge base, must carry out following pre-service:
(1) extract the feature of curve, comprising: the monotonicity of Curve Maximization, knee point, curve;
(2) extracting can for diagnosing the feature utilized;
(3) feature distinguishing curve is classified, and writes into knowledge base;
Being illustrated for normal condition transient response curve, by extracting curvilinear characteristic, obtaining: curve maximum value: 3.5; Curve minimal value: 0.1; Whether curve has local extremum: be, is 2.85; Monotonicity: non-monotonic, draws a rule according to this, and its natural language description is:
If obtain circuit transient response curve:
And: its maximal value is 3.5;
And: its minimum value is 0.1;
And: it has local extremum, is 2.85;
And: it is nonmonotonic;
Then: judged by this curve, this circuit non-fault;
Foundation like this is all regular, after completing, checks whole rule in accordance with following two cardinal rules:
define a production rule by minimum one group of adequate condition, avoid unnecessary redundancy;
any two production rules are avoided to clash; So construct the knowledge base of this Analog-digital circuit fault diagnosis expert system;
Step 2, inference machine: reasoning process is single fault diagnostic reasoning, adopts Accurate Reasoning method, forward reasoning direction; Inference step is: if there is sign A, so judges whether it meets rule 1, if meet, turns rule 2, otherwise turn rule 3, the like, until obtain conclusion.
The described methods combining instantaneous response analysis application that transient response is tested, be applied to and optimize linearity test signal method, therefore test signal can be applied directly to mixed signal circuit; Test vector comprises a series of amplitude pulse, and these pulses can obtain from standard digital testing apparatus; The response of any circuit all comprises the inside circuit information that a situation arises, therefore can carry out united analysis by transient response to circuit; Transient response curve under different circuit state can distinguish each different conditions of circuit, as long as the magnitude of voltage of sampling output point under different time can extract the temporal signatures of output point; This method is applied in independent mimic channel and digital circuit, all obtains good fault coverage; As long as the method monitoring input node and output node, avoid the problem that test point is selected, will facilitate a lot like this in test process.
Described Analog-digital circuit, carries out instantaneous response analysis to this circuit; Choosing is input as pulse signal, and the multiple fault of artificial setting, obtains the transient response curve of circuit under each single fault state.
Advantage of the present invention and effect are:
Transient response method of testing is applied in conjunction with instantaneous response analysis by the inventive method optimizes linearity test signal method, and therefore test signal can be applied directly to mixed signal circuit.Test vector comprises a series of amplitude pulse, and these pulses can obtain from standard digital testing apparatus.The inventive method is applied in independent mimic channel and digital circuit, all obtains good fault coverage.As long as the method monitoring input node and output node, avoid the problem that test point is selected, will facilitate a lot like this in test process.Transient response test another one advantage be exactly its speed usually than traditional small-signal test or static test speed fast.The present invention can also simplify test process greatly, saves test duration and expense, working effect is significantly improved, is more suitable for practical engineering application.
Below in conjunction with the drawings and specific embodiments, the present invention will be further described in detail.
Accompanying drawing explanation
Fig. 1 is that the present invention adopts Analog-digital circuit example;
Fig. 2 the present invention adopts transient response curve under circuit normal condition;
Fig. 3 is that the present invention adopts transient response curve under circuit AC short trouble state;
Fig. 4 is that the present invention adopts transient response curve under circuit R6 short trouble state;
Fig. 5 is transient response curve under circuit amplifier that the present invention adopts 2 both positive and negative polarity short trouble state;
Fig. 6 is diagnostic expert system block diagram of the present invention;
Fig. 7 is inference machine drawing in the present invention.
Embodiment
The present invention is a kind of method of testing of the Analog-digital circuit fault diagnosis based on expert system.That transient response method of testing is applied in conjunction with instantaneous response analysis, be applied to Analog-digital circuit fault diagnosis, by the method for testing that traditional expert system is realized, utilize a kind of by the new method of transient response Test Application in Analog-digital circuit fault diagnosis, realized by traditional expert system, be more suitable for practical engineering application.Be applied in conjunction with instantaneous response analysis by transient response method of testing and optimize linearity test signal method, therefore test signal can be applied directly to mixed signal circuit.Test vector comprises a series of amplitude pulse, and these pulses can obtain from standard digital testing apparatus.
The response of any circuit all comprises the inside circuit information that a situation arises, therefore can carry out united analysis by transient response to circuit.Transient response curve under different circuit state can distinguish each different conditions of circuit, as long as the magnitude of voltage of output point under different time of sampling like this can extract the temporal signatures of output point.This method is applied in independent mimic channel and digital circuit, all obtains good fault coverage.As long as the method monitoring input node and output node, avoid the problem that test point is selected, will facilitate a lot like this in test process.Transient response test another one advantage be exactly its speed usually than traditional small-signal test or static test speed fast.Therefore comprehensively see, transient response test is very suitable for practical engineering application, enormously simplify test process, saves test duration and expense.
Be Analog-digital circuit that the present invention adopts as shown in Figure 1, instantaneous response analysis is carried out to this circuit.Choosing is input as pulse signal, and the multiple fault of artificial setting, obtains the transient response curve of circuit under each single fault state, as Figure 2-Figure 5: Fig. 2 the present invention adopts transient response curve under circuit normal condition; Fig. 3 is that the present invention adopts transient response curve under circuit AC short trouble state; Fig. 4 is that the present invention adopts transient response curve under circuit R6 short trouble state; Fig. 5 is transient response curve under circuit amplifier that the present invention adopts 2 both positive and negative polarity short trouble state;
Based on a method of testing for the Analog-digital circuit fault diagnosis of expert system, as shown in Figure 6, concrete operation step is as follows: this expert system comprises knowledge base and inference machine two large divisions composition.The establishment of knowledge base comprises knowledge acquisition, the true sign of measurand, rule base, database formation, and inference machine comprises the part such as explanation facility and man-machine interface and forms.Introduce the construction method of this expert system knowledge base and inference machine below:
1, knowledge base is set up:
As can be seen from the figure the transient response curve under several state is distinguished obvious, effectively can distinguish state representative separately.But clearly non-linear due to curve, expert system None-identified, such curve can not directly be put in knowledge base, must carry out following pre-service:
(1) extract the feature of curve, comprising: the monotonicity of Curve Maximization, knee point, curve;
(2) extracting can for diagnosing the feature utilized;
(3) feature distinguishing curve is classified, and writes into knowledge base.
Be illustrated for normal condition transient response curve.By extracting the curvilinear characteristic shown in Fig. 2, obtain: curve maximum value: 3.5; Curve minimal value: 0.1; Whether curve has local extremum: be, is 2.85; Monotonicity: non-monotonic.We draw a rule according to this like this, and its natural language description is:
If obtain circuit transient response curve:
And: its maximal value is 3.5;
And: its minimum value is 0.1;
And: it has local extremum, is 2.85;
And: it is nonmonotonic;
Then: judged by this curve, this circuit non-fault.
Foundation like this is all regular, after completing, checks whole rule in accordance with following two cardinal rules:
define a production rule by minimum one group of adequate condition as far as possible, avoid unnecessary redundancy;
any two production rules are avoided to clash.
So construct the knowledge base of this Analog-digital circuit fault diagnosis expert system.
2, inference machine:
Reasoning process involved in the present invention is single fault diagnostic reasoning, adopts Accurate Reasoning method, forward reasoning direction.Inference mechanism as shown in Figure 7.If inference step is for there to be sign A, so judges whether it meets rule 1, if meet, turn rule 2, otherwise turn rule 3, the like, until obtain conclusion.
3, diagnosis example:
Be illustrated for certain diagnostic procedure.
Ask: curve minimum is 0.1? answer: be;
Ask: curve maximum is 3.5? answer: be;
Ask: on curve a little (2.85,1)? answer: no;
Ask: curve is the straight line of (3.5,1)? answer: no;
Ask: curve has local maximum 1.3? answer: no;
Ask: curve has local maximum 1.75? answer: no;
Ask: on curve a little (2.65,1)? answer: no;
Ask: on curve a little (1.45,1)? answer: be;
Ask: on curve a little (2.75,3.5)? answer: be;
Conclusion: this fault is R5 short circuit.
Explain: because this circuit exists fault, and transient response curve minimum value is 0.1, and maximal value is 3.5, and curve exists local minimum 1.45 and local maximum 2.75, therefore according to rule 6, obtain this conclusion.
Claims (3)
1. based on a method of testing for the Analog-digital circuit fault diagnosis of expert system, it is characterized in that: by transient response Test Application in Analog-digital circuit fault diagnosis, the method for testing realized by traditional expert system; This system comprises knowledge base and inference machine two large divisions, and the establishment of knowledge base comprises knowledge acquisition, the true sign of measurand, rule base, database formation; Inference machine comprises explanation facility and man-machine interface part; The construction method of this system knowledge base and inference machine is as follows:
Step 1, set up knowledge base:
Transient response curve under several state is distinguished obvious, effectively can distinguish state representative separately; But clearly non-linear due to curve, expert system None-identified, such curve can not directly be put in knowledge base, must carry out following pre-service:
(1) extract the feature of curve, comprising: the monotonicity of Curve Maximization, knee point, curve;
(2) extracting can for diagnosing the feature utilized;
(3) feature distinguishing curve is classified, and writes into knowledge base;
Being illustrated for normal condition transient response curve, by extracting curvilinear characteristic, obtaining: curve maximum value: 3.5; Curve minimal value: 0.1; Whether curve has local extremum: be, is 2.85; Monotonicity: non-monotonic, draws a rule according to this, and its natural language description is:
If obtain circuit transient response curve:
And: its maximal value is 3.5;
And: its minimum value is 0.1;
And: it has local extremum, is 2.85;
And: it is nonmonotonic;
Then: judged by this curve, this circuit non-fault;
Foundation like this is all regular, after completing, checks whole rule in accordance with following two cardinal rules:
define a production rule by minimum one group of adequate condition, avoid unnecessary redundancy;
any two production rules are avoided to clash;
So construct the knowledge base of this Analog-digital circuit fault diagnosis expert system;
Step 2, inference machine:
Reasoning process is single fault diagnostic reasoning, adopts Accurate Reasoning method, forward reasoning direction;
Inference step is: if there is sign A, so judges whether it meets rule 1, if meet, turns rule 2, otherwise turn rule 3, the like, until obtain conclusion.
2. the method for testing of a kind of Analog-digital circuit fault diagnosis based on expert system according to claim 1, it is characterized in that: the described methods combining instantaneous response analysis application that transient response is tested, be applied to and optimize linearity test signal method, therefore test signal can be applied directly to mixed signal circuit; Test vector comprises a series of amplitude pulse, and these pulses can obtain from standard digital testing apparatus;
The response of any circuit all comprises the inside circuit information that a situation arises, therefore can carry out united analysis by transient response to circuit; Transient response curve under different circuit state can distinguish each different conditions of circuit, as long as the magnitude of voltage of sampling output point under different time can extract the temporal signatures of output point; This method is applied in independent mimic channel and digital circuit, all obtains good fault coverage; As long as the method monitoring input node and output node, avoid the problem that test point is selected, will facilitate a lot like this in test process.
3. the method for testing of a kind of Analog-digital circuit fault diagnosis based on expert system according to claim 1, is characterized in that: described Analog-digital circuit, carries out instantaneous response analysis to this circuit; Choosing is input as pulse signal, and the multiple fault of artificial setting, obtains the transient response curve of circuit under each single fault state.
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| CN111158336A (en) * | 2019-11-22 | 2020-05-15 | 万洲电气股份有限公司 | Industrial intelligent optimization energy-saving system based on cement kiln fault diagnosis |
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