Embodiment
In order to make purpose of the present invention, technical scheme and advantage clearer, below in conjunction with drawings and Examples, the present invention is further elaborated.Should be appreciated that specific embodiment described herein only in order to explain the present invention, is not intended to limit the present invention.
In the embodiment of the present invention, obtain online the characteristic parameter of circuit-under-test plate in nuclear power station according to the testing scheme that generates, with the characteristic parameter of the circuit-under-test plate that obtains and the qualified parameter obtained in advance relatively, and judge according to result relatively whether the performance of circuit-under-test plate is qualified.
It is a kind of that the embodiment of the present invention provides: nuclear power station circuit board piece detection method.
Described method comprises: obtain network connection layout and the point position of circuit-under-test plate in nuclear power station, according to network connection layout and the point position generation testing scheme of described circuit-under-test plate;
Obtain online the characteristic parameter of electronic devices and components in the working parameters of circuit-under-test plate and described circuit-under-test plate according to the testing scheme that generates;
With the characteristic parameter of electronic devices and components in the working parameters of the described circuit-under-test plate that obtains online and described circuit-under-test plate respectively with the acceptable performance parameter of the plate that obtains in advance and plate in electronic devices and components qualified parameter relatively, whether good to judge described circuit-under-test plate and components and parts performance.
In the embodiment of the present invention, circuit-under-test plate normal function is prerequisite in not affecting nuclear power station, utilize every test parameter of the commercial measurement circuit-under-test plates such as photoelectricity, electromagnetism, boundary scan, the every test parameter that obtains and the qualified parameter of obtaining are compared, and then judge according to result relatively whether the test parameter of this circuit-under-test plate is qualified.Further, the qualified tested plate of test parameter is carried out strike-machine detect again, judging the reliability of this circuit-under-test plate, thereby effectively improved the reliability that detects, reduce the risk that the nuclear power station chaser is jumped heap.
For technical solutions according to the invention are described, describe below by specific embodiment.
Embodiment one:
Fig. 1 shows the flow process of the nuclear power station circuit board piece detection method that first embodiment of the invention provides, the circuit board piece of the present embodiment diagnosis (Module In-circuit Diagnosis, MID) system is made of fixture, computer equipment and corresponding program software system.Fully understanding circuit diagram principle and the postpone of measuring point cloth of analysis circuit plate, need to select the components and parts of test and measuring point to arrange, draw the PCB file, for the plate exploitation Special-purpose testing jig adaptive with it, write supporting test procedure, standard etc., details are as follows.
Step S11 obtains network connection layout and the point position of circuit-under-test plate in nuclear power station, generates testing scheme according to network connection layout and the point position of this circuit-under-test plate.
In the present embodiment, the technical information that provides according to circuit-under-test plate sample, technical specification book, former factory etc. are determined the test position of network connection layout, Special-purpose testing jig and the test of this circuit-under-test plate needs of this circuit-under-test plate.Generally, in the circuit-under-test plate, each electronic devices and components position is all point position.
In the present embodiment, the network connection layout is imported circuit board piece diagnosis (Module In-circuit Diagnosis, MID) program, generate the testing scheme of test circuit-under-test plate, this testing scheme comprises the test parameter flow process of electronic devices and components in this circuit-under-test plate of test and the test parameter flow process of this monoblock circuit-under-test plate.
Step S12 obtains the characteristic parameter of electronic devices and components in the working parameters of circuit-under-test plate and this circuit-under-test plate online according to the testing scheme that generates.
The parameters testing process that the present embodiment comprises according to the testing scheme that generates, each components and parts and this circuit-under-test plate itself to the circuit-under-test plate carry out emulation testing, obtain the parameter that this circuit-under-test plate each electronic devices and components and this circuit-under-test plate under normal condition itself should have.
In the present embodiment, can test monoblock circuit-under-test plate, to obtain the working parameters of this circuit-under-test plate, to comprise the working parameters such as the electronic noise signal that obtains this circuit-under-test plate, circuit working point voltage.By regularly obtaining online the working parameters of circuit-under-test plate, can grasp the overall performance situation of this circuit-under-test plate.
In the present embodiment, except the working parameters that obtains monoblock circuit-under-test plate, also need to obtain the characteristic parameter of each electronic devices and components in the circuit-under-test plate, the reliability that detects to improve this circuit board piece.Adopt the MID system of nuclear power station, the electronic devices and components that do not need to pull down this circuit-under-test plate from the circuit-under-test plate also can obtain the characteristic parameter of respective electronic components and parts, as resistance value, capacitance etc.This MID system can test 5184 measuring points simultaneously, each measuring point and pin can carry out the programming and testing of logic level, editor's scope is between-3.5V and 5V, test frequency can be selected 6M, 12M and 20M etc., the individual features parameter such as the electronic devices and components resistance by on-line testing acquisition cuicuit plate, electric capacity.
Step S13, with the characteristic parameter of electronic devices and components in the working parameters of this circuit-under-test plate that obtains online and this circuit-under-test plate respectively with the acceptable performance parameter of the plate that obtains in advance and plate in electronic devices and components qualified parameter relatively, whether good to judge this circuit-under-test plate and components and parts performance.
Wherein, with the characteristic parameter of electronic devices and components in the working parameters of this circuit-under-test plate that obtains online and this circuit-under-test plate respectively with the acceptable performance parameter of the plate that obtains in advance and plate in electronic devices and components qualified parameter relatively, to judge whether good step is specially for this circuit-under-test plate and components and parts performance:
Bound according to the qualified parameter of electronic devices and components in the bound of the qualified parameter of electronic devices and components in the acceptable performance parameter of the parameter acquiring plate of electronic devices and components in the circuit theory diagrams of circuit-under-test plate and this circuit-under-test plate, plate and acceptable performance parameter, plate;
With the characteristic parameter of electronic devices and components in the working parameters of the circuit-under-test plate that obtains online and this circuit-under-test plate respectively with the acceptable performance parameter of plate and plate in electronic devices and components qualified parameter relatively, if the working parameters that obtains online is in acceptable performance parameter bound scope and in the bound scope of characteristic parameter in qualified parameter of obtaining online, judge that this circuit-under-test plate is good plate, otherwise, judge that this circuit-under-test plate is not good plate.
In the present embodiment, according to technical parameter table and the accuracy requirement that circuit board piece producer provides, determine the qualified parameter upper lower limit value of circuit board piece, if the measurement parameter that obtains surpasses qualified parameter limit value, judge that this circuit-under-test plate is defective.By a plurality of functional circuit board pieces are taken multiple measurements, determine the parameter acceptability limit of circuit board piece, by adding electrical testing, determine circuit board piece quiescent operation magnitude of voltage and scope simultaneously.
In first embodiment of the invention, obtain online the characteristic parameter of electronic devices and components in the working parameters of circuit-under-test plate in nuclear power station and this circuit-under-test plate, and with the characteristic parameter of electronic devices and components in the working parameters of this circuit-under-test plate that obtains online and this circuit-under-test plate respectively with the acceptable performance parameter of the plate that obtains in advance and plate in electronic devices and components qualified parameter relatively, whether good to judge this circuit-under-test plate and components and parts performance.It is the characteristic parameter of electronic devices and components in working parameters by obtaining online circuit-under-test plate in nuclear power station and this circuit-under-test plate due to the embodiment of the present invention, therefore need not pull down this can be known also that by the components and parts of current measuring instrument plate this is by the properties of current measuring instrument plate, thereby can judge that this is by the current overall operation state of current measuring instrument plate, find in advance the defective of electric instrument plate and components and parts according to this overall operation state by the current measuring instrument plate, reduce the chaser jumping heap risk that lost efficacy and bring due to electric instrument plate.
Embodiment two:
Fig. 2 shows the flow process of the nuclear power station circuit board piece detection method that second embodiment of the invention provides, and in embodiments of the present invention in detail, the step S12 of embodiment one is described in detail mainly, and is specific as follows:
Step S21 obtains network connection layout and the point position of circuit-under-test plate in nuclear power station, generates testing scheme according to network connection layout and the point position of this circuit-under-test plate.
The step S21 of the present embodiment is identical with the step S11 of embodiment one, repeats no more herein.
step S22, obtain the characteristic parameter of electronic devices and components in the circuit-under-test plate, in this circuit-under-test plate, the characteristic parameter of electronic devices and components comprises the resistance value of resistance, the resistance value of potentiometer, the capacitance of electric capacity, the voltage of general-purpose diode, the resistance of general-purpose diode, the junction capacity of general-purpose diode, the voltage stabilizing value of voltage stabilizing diode, the resistance of voltage stabilizing diode, the junction capacity of voltage stabilizing diode, the forward voltage of triode, the enlargement factor of triode, the resistance of triode, the junction capacity of triode, the cut-off current of triode, the switching time of triode, the noise signal of operational amplifier, the enlargement factor of amplifier, the resistance to earth of amplifier, the ground capacitance of amplifier, the critical distortion frequency of amplifier, the output voltage switching rate of amplifier, input offset voltage, the input end leakage current of amplifier.
In the present embodiment, adopt the test fixture that conforms to the circuit-under-test plate to detect the performance of each electronic devices and components in the circuit-under-test plate, with the performance characteristic of correspondence parameter of obtaining each electronic devices and components and judge each electronic devices and components and the connection of circuit-under-test plate, such as the situation that judges the whether free weldering of each electronic devices and components, rosin joint.Wherein, the test event of electronic devices and components and method see table 1 for details:
Table 1:
in table 1, (1) detects the resistance in the circuit-under-test plate, obtains the resistance value at this resistance two ends, (2) potentiometer in detection circuit-under-test plate obtains the resistance value between the different pins of this potentiometer, such as the resistance value of 1 to 3 end that obtains potentiometer and the resistance value of obtaining 2 to 3 ends of this potentiometer, (3) detect electric capacity in the circuit-under-test plate, obtain the capacitance at this electric capacity two ends, wherein, adopt the test frequency of 125Hz to measure for the capacitance of alminium electrolytic condenser, (4) general-purpose diode in detection circuit-under-test plate, obtain forward voltage values, forward resistance value, back resistance value, forward capacitance, the reciprocal capacitance value of this general-purpose diode, wherein, measure for the forward capacitance of general-purpose diode and the test frequency of reciprocal capacitance value employing 8192Hz, (5) voltage stabilizing diode (also referred to as Zener diode) in detection circuit-under-test plate, obtain voltage stabilizing value, forward resistance value, back resistance value, forward capacitance, reciprocal capacitance value, the dynamic electric resistance of this voltage stabilizing diode, wherein, forward capacitance and the reciprocal capacitance value for voltage stabilizing diode adopts the test frequency of 128Hz to obtain, (6) detect the triode of circuit-under-test plate, obtain turn-on voltage, enlargement factor, forward resistance value, back resistance value, forward capacitance, reciprocal capacitance value, cut-off current, the switching time between turn-on voltage, base stage and the collector (BC) between this transistor base and emitter (BE) and obtain saturation voltage curve between collector and emitter, wherein, measure for the forward capacitance of triode and the test frequency of reciprocal capacitance value employing 8192Hz, (7) detect the operational amplifier of circuit-under-test plate, at the forward input pin of operational amplifier with oppositely add a waveform to be sinusoidal wave input signal between input pin, then in the frequency of measurement of output end output signal, and waveform is carried out even interval sampling, to obtain the frequency response characteristic of this operational amplifier, closed-loop gain etc., while measuring operational amplifier resistance to earth value, the ground capacitance value, the critical distortion frequency, the output voltage switching rate, input offset voltage, the input end leakage current, wherein, measure for the resistance to earth value of operational amplifier and the test frequency of ground capacitance value employing 8192Hz, (8) detect the inductance of circuit-under-test plate, obtain the inductance value of this inductance.Certainly, if still had other electronic devices and components by the current measuring instrument plate, obtain the test parameter of these other electronic devices and components, be not construed as limiting herein.
Further, the inductance value of the capacitance of the resistance value of the frequency that detects the circuit-under-test plate, voltage, electric current, resistance, electric capacity, inductance, the time, can select according to frequency in-scope, voltage in-scope, electric current in-scope, resistance value in-scope, capacitance in-scope, inductance value in-scope the test mode of test frequency, voltage, electric current, resistance value, capacitance, inductance value.Certainly, test mode is different, and the precision of the test parameter that obtains is also different, and precision corresponding to concrete test mode and test mode is as shown in table 2.
Table 2:
In the present embodiment, when adopting two lines or four lines or six lines accurately to measure the resistance value of circuit-under-test plate, capacitance, inductance value, if during precise engineering surveying resistance, the resistance value that can adopt four lines or six line modes to obtain, its precision is higher than adopting the two-wire system metering system.
In the present embodiment, if electric capacity is relation in parallel, the capacitance of shunt capacitance can obtain by the maximal value capacity measurement.
Step S23, the circuit-under-test plate is powered on, to obtain the working parameters of monoblock circuit-under-test plate, the working parameters of this monoblock circuit-under-test plate comprises circuit working point voltage, pin ground capacitance, pin resistance to earth, the output noise signal of this monoblock circuit-under-test plate.
In the present embodiment, monoblock circuit-under-test plate is powered up, detect whether this monoblock circuit-under-test plate exists out, short-circuit conditions, detect again the quiescent potential of this monoblock circuit-under-test plate, the real work voltage of each electronic devices and components, detect pin ground capacitance, pin resistance to earth, the output noise signal of this monoblock circuit-under-test plate, and the function etc. that detects the voltage conversion devices such as voltage regulator of this monoblock circuit-under-test plate.
Wherein, the step that detects the output noise signal of monoblock circuit-under-test plate is specially: A1, before the circuit-under-test plate powers up, input signal pin ground connection with the circuit-under-test plate, and the output signal of continuous several times test output signal pin, such as continuously but be not limited to the output signal of 20 test output signal pins; A2, after the circuit-under-test plate powers up, make the input pin ground connection of this circuit-under-test plate, then measure the output voltage of the output pin of this circuit-under-test plate, such as every 1ms measures once, measure altogether 20 times; The measured value that A3, comparison step A1 and A2 obtain obtains the output noise of monoblock circuit-under-test plate.In the present embodiment, with the amplitude of amplitude, the frequency of the output voltage that obtains and the normal voltage obtained in advance, frequency ratio, obtain the output noise of this circuit-under-test plate, judge in amplifying circuit whether fault of triode exclusive disjunction amplifier according to output noise signal amplitude and frequency.Certainly, measure time, the number of times of the voltage of output pin and can change according to actual conditions, be not construed as limiting herein.
As one embodiment of the present invention, except the quiescent potential that obtains this monoblock circuit-under-test plate, pin ground capacitance, pin resistance to earth, output noise, also obtain the contact resistance of the connector of circuit-under-test plate, the resistance of insurance etc., whether exist aging or the loose contact phenomenon to determine connector or insurance.Concrete test event is as shown in table 3:
Table 3:
The step S24 of the present embodiment is identical with the step S13 of embodiment, repeats no more herein.
in second embodiment of the invention, set about from current blind controller system at the fortune nuclear power station, use open test, short-circuit test, resistance test, capacity measurement, Test Diode, the triode test, the field effect transistor test, IC pin tests etc. separate the electronic devices and components method of testing, and scalar test, digital test, boundary scan testing, simulation adds the detailed concrete test parameter that the methods such as electrical testing and digital-analog mixing test are obtained each electronic devices and components in this circuit-under-test plate, and the DCO parameter of monoblock circuit-under-test plate, can judge the current comprehensive performance condition of each electronic devices and components in this circuit-under-test plate and this circuit-under-test plate itself according to each the detailed concrete test parameter that obtains, find ahead of time the defective of circuit-under-test plate, whether break down such as judging certain electronic devices and components according to each test parameter that obtains, the electronic devices and components that break down are in which position of circuit-under-test plate etc., thereby the circuit-under-test plate that can fast processing breaks down.
Embodiment three:
Fig. 3 shows the flow process of the nuclear power station circuit board piece detection method that third embodiment of the invention provides, and the present embodiment has mainly increased step S32 on the basis of embodiment two, and details are as follows:
Step S31 obtains network connection layout and the point position of circuit-under-test plate in nuclear power station, generates testing scheme according to network connection layout and the point position of this circuit-under-test plate.
The step S31 of the present embodiment is identical with the step S21 of embodiment two, repeats no more herein.
Step S32 carries out electrical isolation to the electronic devices and components of circuit-under-test plate.
In the present embodiment, before the test parameter of each electronic devices and components that detect the circuit-under-test plate, according to primary electron circuit design characteristics, when the circuit around unit under test affects the test existence, need to different electromotive forces be transferred to other electronic devices and components in order to prevent, need to carry out electrical isolation to tested electronic devices and components, more accurate with the test parameter that ensures electronic devices and components, the reliability of raising testing result.
For example, in the present embodiment, adopt the Agilent 3070 In-Circuit Test Symstem of the MID system of nuclear power station to realize making through the test data of obtaining after electrical isolation electrical isolation to electronic devices and components on the circuit-under-test plate more accurate.
Wherein, the step S33 of the present embodiment~step S35 and embodiment two step S22~step S24 is identical, repeat no more herein.
Embodiment four:
In the performance process that detects circuit-under-test, the test of circuit-under-test plate voltage-contrast is a very important test link.After the circuit-under-test plate is powered on, measure each quiescent potential on the circuit-under-test plate, and the quiescent potential of the quiescent potential that measurement is obtained and the intact new plate of function compares, thereby identify in-problem circuit and trouble unit.
In order to be illustrated more clearly in the process that detects the circuit-under-test plate, the below is take the operational amplifier that detects the circuit-under-test plate as example, and concrete circuit connection diagram as shown in Figure 4.
Operational amplifier A 2 in Fig. 4 is input blocks of system, and its function is that the 1-5V signal that will input converts to-output of 4-0V signal, and the below only illustrates to measure R33 and R34 both end voltage, and all the other voltages calculating and control methods are similarly.
Wherein, can find out according to the content of following table 4 and table 5, the simulation parameter and the theoretical parameter that generate according to testing scheme differ very little, therefore can use this testing scheme to generate the qualified parameter of circuit-under-test plate.
Table 4:
Table 5:
Wherein the theoretical parameter of table 4 and table 5 is that hand computation draws according to circuit theory, and simulation parameter is that Simulation Engineering teacher calculates according to simulation software.
In the process that detects the circuit-under-test plate, at first make J3N=0.5V, do not regulate slide rheostat P21; Make again J2V get respectively 1V, 2V, 3V, then 4V and 5V compare the actual test parameter of circuit-under-test plate with simulation parameter, draw whether qualified conclusion of plate
The embodiment one of the embodiment of the present invention, embodiment two, embodiment three, embodiment four are unified integral body.
In the embodiment of the present invention, circuit-under-test plate normal function is prerequisite in not affecting nuclear power station, utilize every test parameter of the commercial measurement circuit-under-test plates such as photoelectricity, electromagnetism, boundary scan, the every test parameter that obtains and the qualified parameter of obtaining are compared, and then judge according to result relatively whether the test parameter of this circuit-under-test plate is qualified.Further, the qualified tested plate of test parameter is carried out strike-machine detect again, judging the reliability of this circuit-under-test plate, thereby effectively improved the reliability that detects, reduce the risk that the nuclear power station chaser is jumped heap.
The above is only preferred embodiment of the present invention, not in order to limiting the present invention, all any modifications of doing within the spirit and principles in the present invention, is equal to and replaces and improvement etc., within all should being included in protection scope of the present invention.