CN105203573A - 元素成分检测系统及方法 - Google Patents

元素成分检测系统及方法 Download PDF

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Publication number
CN105203573A
CN105203573A CN201510597883.3A CN201510597883A CN105203573A CN 105203573 A CN105203573 A CN 105203573A CN 201510597883 A CN201510597883 A CN 201510597883A CN 105203573 A CN105203573 A CN 105203573A
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CN
China
Prior art keywords
fuel
photon
crystals
sample
curvature
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
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CN201510597883.3A
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English (en)
Chinese (zh)
Inventor
V.K.R.科马雷迪
P.J.马丁
S.桑穆赫
P.B.格拉泽
S.M.李
R.劳
M.韦努戈帕尔
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General Electric Co
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General Electric Co
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Application filed by General Electric Co filed Critical General Electric Co
Publication of CN105203573A publication Critical patent/CN105203573A/zh
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/22—Fuels; Explosives
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/637—Specific applications or type of materials liquid
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/02—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance
    • G01N27/04—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance
    • G01N27/12—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon absorption of a fluid; of a solid body in dependence upon reaction with a fluid, for detecting components in the fluid
    • G01N27/125—Composition of the body, e.g. the composition of its sensitive layer
    • G01N27/127—Composition of the body, e.g. the composition of its sensitive layer comprising nanoparticles

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  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CN201510597883.3A 2009-10-26 2010-10-26 元素成分检测系统及方法 Pending CN105203573A (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US12/605391 2009-10-26
US12/605,391 US8058621B2 (en) 2009-10-26 2009-10-26 Elemental composition detection system and method
CN2010105364307A CN102053095A (zh) 2009-10-26 2010-10-26 元素成分检测系统及方法

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
CN2010105364307A Division CN102053095A (zh) 2009-10-26 2010-10-26 元素成分检测系统及方法

Publications (1)

Publication Number Publication Date
CN105203573A true CN105203573A (zh) 2015-12-30

Family

ID=43796945

Family Applications (2)

Application Number Title Priority Date Filing Date
CN201510597883.3A Pending CN105203573A (zh) 2009-10-26 2010-10-26 元素成分检测系统及方法
CN2010105364307A Pending CN102053095A (zh) 2009-10-26 2010-10-26 元素成分检测系统及方法

Family Applications After (1)

Application Number Title Priority Date Filing Date
CN2010105364307A Pending CN102053095A (zh) 2009-10-26 2010-10-26 元素成分检测系统及方法

Country Status (5)

Country Link
US (1) US8058621B2 (https=)
JP (1) JP2011089989A (https=)
CN (2) CN105203573A (https=)
CH (1) CH702055A2 (https=)
DE (1) DE102010038133A1 (https=)

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CN112639452A (zh) * 2018-09-07 2021-04-09 深圳帧观德芯科技有限公司 电镀控制系统和方法
WO2022117112A1 (zh) * 2020-12-04 2022-06-09 北京霍里思特科技有限公司 检测机构及带检测机构的矿产分选机
CN115825131A (zh) * 2022-10-11 2023-03-21 中国核电工程有限公司 一种用于微量放射性元素同时测量的x射线荧光分析系统
RU226928U1 (ru) * 2020-12-04 2024-06-28 Бэйджин Онест Текнолоджи Ко., Лтд. Механизм обнаружения и машина для сортировки минералов с механизмом обнаружения

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JP2019211252A (ja) * 2018-05-31 2019-12-12 キヤノン株式会社 識別装置
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WO2020051061A1 (en) 2018-09-04 2020-03-12 Sigray, Inc. System and method for x-ray fluorescence with filtering
WO2020051221A2 (en) 2018-09-07 2020-03-12 Sigray, Inc. System and method for depth-selectable x-ray analysis
DE112020004169T5 (de) 2019-09-03 2022-05-25 Sigray, Inc. System und verfahren zur computergestützten laminografieröntgenfluoreszenz-bildgebung
US11175243B1 (en) 2020-02-06 2021-11-16 Sigray, Inc. X-ray dark-field in-line inspection for semiconductor samples
JP7395775B2 (ja) 2020-05-18 2023-12-11 シグレイ、インコーポレイテッド 結晶解析装置及び複数の検出器素子を使用するｘ線吸収分光法のためのシステム及び方法
WO2022061347A1 (en) 2020-09-17 2022-03-24 Sigray, Inc. System and method using x-rays for depth-resolving metrology and analysis
US12480892B2 (en) 2020-12-07 2025-11-25 Sigray, Inc. High throughput 3D x-ray imaging system using a transmission x-ray source
KR20260030946A (ko) 2020-12-07 2026-03-06 시그레이, 아이엔씨. 투과 x-선 소스를 이용한 고처리량 3D x-선 이미징 시스템
WO2023168204A1 (en) 2022-03-02 2023-09-07 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
US11874239B2 (en) * 2022-03-11 2024-01-16 Uchicago Argonne, Llc Advanced X-ray emission spectrometers
WO2023177981A1 (en) 2022-03-15 2023-09-21 Sigray, Inc. System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
CN119173759A (zh) 2022-05-02 2024-12-20 斯格瑞公司 X射线顺序阵列波长色散光谱仪
CN115326854B (zh) * 2022-09-16 2024-12-17 中国科学院上海高等研究院 一种用于同步辐射光束线光子能量标定的系统及方法
CN116106339A (zh) * 2022-12-30 2023-05-12 安徽创谱仪器科技有限公司 一种x射线吸收谱仪
CN121013975A (zh) 2023-02-16 2025-11-25 斯格瑞公司 具有至少两个堆叠的平面布拉格衍射器的x射线探测器系统
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
US12429437B2 (en) 2023-11-07 2025-09-30 Sigray, Inc. System and method for x-ray absorption spectroscopy using spectral information from two orthogonal planes
US12429436B2 (en) 2024-01-08 2025-09-30 Sigray, Inc. X-ray analysis system with focused x-ray beam and non-x-ray microscope
WO2025155719A1 (en) 2024-01-18 2025-07-24 Sigray, Inc. Sequential array of x-ray imaging detectors
CN118169158B (zh) * 2024-02-07 2025-01-28 中国铁道科学研究院集团有限公司铁道建筑研究所 铁路路基填料含硫量检测装置及方法
WO2025174966A1 (en) 2024-02-15 2025-08-21 Sigray, Inc. System and method for generating a focused x‑ray beam

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CN112639452A (zh) * 2018-09-07 2021-04-09 深圳帧观德芯科技有限公司 电镀控制系统和方法
US11339493B2 (en) 2018-09-07 2022-05-24 Shenzhen Xpectvision Technology Co., Ltd. Systems and methods of controlling electroplating
TWI807092B (zh) * 2018-09-07 2023-07-01 大陸商深圳幀觀德芯科技有限公司 電鍍控制系統和方法
CN111678600A (zh) * 2020-08-10 2020-09-18 中国工程物理研究院激光聚变研究中心 一种平响应的霍尔晶体
WO2022117112A1 (zh) * 2020-12-04 2022-06-09 北京霍里思特科技有限公司 检测机构及带检测机构的矿产分选机
RU226928U1 (ru) * 2020-12-04 2024-06-28 Бэйджин Онест Текнолоджи Ко., Лтд. Механизм обнаружения и машина для сортировки минералов с механизмом обнаружения
CN115825131A (zh) * 2022-10-11 2023-03-21 中国核电工程有限公司 一种用于微量放射性元素同时测量的x射线荧光分析系统

Also Published As

Publication number Publication date
US20110095190A1 (en) 2011-04-28
DE102010038133A1 (de) 2011-04-28
JP2011089989A (ja) 2011-05-06
CN102053095A (zh) 2011-05-11
CH702055A2 (de) 2011-04-29
US8058621B2 (en) 2011-11-15

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