CN105092975A - Pcb板内单端阻抗测试头 - Google Patents
Pcb板内单端阻抗测试头 Download PDFInfo
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- CN105092975A CN105092975A CN201510613109.7A CN201510613109A CN105092975A CN 105092975 A CN105092975 A CN 105092975A CN 201510613109 A CN201510613109 A CN 201510613109A CN 105092975 A CN105092975 A CN 105092975A
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- Prior art keywords
- transmission line
- support plate
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- slot
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- 238000012360 testing method Methods 0.000 title abstract description 28
- 230000005540 biological transmission Effects 0.000 claims abstract description 87
- 239000000523 sample Substances 0.000 claims abstract description 52
- 239000002184 metal Substances 0.000 claims description 8
- 229910052751 metal Inorganic materials 0.000 claims description 8
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 6
- 239000010931 gold Substances 0.000 claims description 6
- 229910052737 gold Inorganic materials 0.000 claims description 6
- 238000007747 plating Methods 0.000 claims description 6
- 230000000694 effects Effects 0.000 claims description 4
- 239000011810 insulating material Substances 0.000 claims description 3
- 150000003071 polychlorinated biphenyls Chemical class 0.000 abstract 2
- 238000003908 quality control method Methods 0.000 abstract 1
- 230000008054 signal transmission Effects 0.000 description 6
- 238000013461 design Methods 0.000 description 4
- 238000002847 impedance measurement Methods 0.000 description 4
- 238000009713 electroplating Methods 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 230000003647 oxidation Effects 0.000 description 2
- 238000007254 oxidation reaction Methods 0.000 description 2
- 239000011148 porous material Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 230000004308 accommodation Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 238000005728 strengthening Methods 0.000 description 1
Landscapes
- Measurement Of Resistance Or Impedance (AREA)
- Details Of Connecting Devices For Male And Female Coupling (AREA)
Abstract
Description
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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CN201510613109.7A CN105092975B (zh) | 2015-09-23 | 2015-09-23 | Pcb板内单端阻抗测试头 |
Applications Claiming Priority (1)
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CN201510613109.7A CN105092975B (zh) | 2015-09-23 | 2015-09-23 | Pcb板内单端阻抗测试头 |
Publications (2)
Publication Number | Publication Date |
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CN105092975A true CN105092975A (zh) | 2015-11-25 |
CN105092975B CN105092975B (zh) | 2017-11-03 |
Family
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Family Applications (1)
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CN201510613109.7A Active CN105092975B (zh) | 2015-09-23 | 2015-09-23 | Pcb板内单端阻抗测试头 |
Country Status (1)
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CN (1) | CN105092975B (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115455886A (zh) * | 2022-08-05 | 2022-12-09 | 上海移柯通信技术股份有限公司 | Pcb板设计方法、pcb板、电子设备、存储介质及终端 |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1095483A (zh) * | 1994-03-15 | 1994-11-23 | 吉林大学 | 共面集成电路芯片微波探针 |
JP2001194396A (ja) * | 2000-01-07 | 2001-07-19 | Onishi Denshi Kk | プリント基板のインピーダンス測定用プロービング装置 |
KR20040056103A (ko) * | 2002-12-23 | 2004-06-30 | 삼성전기주식회사 | 차동 임피던스 측정 프로브장치 |
CA2385337C (en) * | 1999-09-21 | 2010-01-12 | Rosenberger Hochfrequenztechnik Gmbh & Co. | Measuring probe for measuring high frequencies and method of producing said probe |
CN103870375A (zh) * | 2012-12-11 | 2014-06-18 | 鸿富锦精密工业(深圳)有限公司 | 端口测试装置 |
CN204086397U (zh) * | 2014-09-05 | 2015-01-07 | 东莞市五株电子科技有限公司 | 阻抗测试探头 |
CN205027819U (zh) * | 2015-09-23 | 2016-02-10 | 广州兴森快捷电路科技有限公司 | Pcb板内单端阻抗测试头 |
-
2015
- 2015-09-23 CN CN201510613109.7A patent/CN105092975B/zh active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN1095483A (zh) * | 1994-03-15 | 1994-11-23 | 吉林大学 | 共面集成电路芯片微波探针 |
CA2385337C (en) * | 1999-09-21 | 2010-01-12 | Rosenberger Hochfrequenztechnik Gmbh & Co. | Measuring probe for measuring high frequencies and method of producing said probe |
JP2001194396A (ja) * | 2000-01-07 | 2001-07-19 | Onishi Denshi Kk | プリント基板のインピーダンス測定用プロービング装置 |
KR20040056103A (ko) * | 2002-12-23 | 2004-06-30 | 삼성전기주식회사 | 차동 임피던스 측정 프로브장치 |
CN103870375A (zh) * | 2012-12-11 | 2014-06-18 | 鸿富锦精密工业(深圳)有限公司 | 端口测试装置 |
CN204086397U (zh) * | 2014-09-05 | 2015-01-07 | 东莞市五株电子科技有限公司 | 阻抗测试探头 |
CN205027819U (zh) * | 2015-09-23 | 2016-02-10 | 广州兴森快捷电路科技有限公司 | Pcb板内单端阻抗测试头 |
Non-Patent Citations (1)
Title |
---|
王红飞 等: "过孔阻抗控制及其对信号完整性的影响", 《印制电路信息》 * |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN115455886A (zh) * | 2022-08-05 | 2022-12-09 | 上海移柯通信技术股份有限公司 | Pcb板设计方法、pcb板、电子设备、存储介质及终端 |
CN115455886B (zh) * | 2022-08-05 | 2023-04-11 | 上海移柯通信技术股份有限公司 | Pcb板设计方法、pcb板、电子设备、存储介质及终端 |
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Publication number | Publication date |
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CN105092975B (zh) | 2017-11-03 |
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PB01 | Publication | ||
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EE01 | Entry into force of recordation of patent licensing contract |
Application publication date: 20151125 Assignee: Guangzhou Kaide Finance Leasing Co.,Ltd. Assignor: SHENZHEN FASTPRINT CIRCUIT TECH Co.,Ltd.|GUANGZHOU FASTPRINT CIRCUIT TECH Co.,Ltd.|YIXING SILICON VALLEY ELECTRONICS TECH Co.,Ltd.|GUANGZHOU XINGSEN ELECTRONIC Co.,Ltd. Contract record no.: 2019990000235 Denomination of invention: Single-end impedance test head in PCB Granted publication date: 20171103 License type: Exclusive License Record date: 20190716 |
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EE01 | Entry into force of recordation of patent licensing contract | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right | ||
PE01 | Entry into force of the registration of the contract for pledge of patent right |
Denomination of invention: Single-end impedance test head in PCB Effective date of registration: 20190807 Granted publication date: 20171103 Pledgee: Guangzhou Kaide Finance Leasing Co.,Ltd. Pledgor: GUANGZHOU FASTPRINT CIRCUIT TECH Co.,Ltd.|SHENZHEN FASTPRINT CIRCUIT TECH Co.,Ltd.|YIXING SILICON VALLEY ELECTRONICS TECH Co.,Ltd. Registration number: Y2019990000032 |
|
EC01 | Cancellation of recordation of patent licensing contract | ||
EC01 | Cancellation of recordation of patent licensing contract |
Assignee: Guangzhou Kaide Finance Leasing Co.,Ltd. Assignor: GUANGZHOU FASTPRINT CIRCUIT TECH Co.,Ltd.|SHENZHEN FASTPRINT CIRCUIT TECH Co.,Ltd.|YIXING SILICON VALLEY ELECTRONICS TECH Co.,Ltd.|GUANGZHOU XINGSEN ELECTRONIC Co.,Ltd. Contract record no.: 2019990000235 Date of cancellation: 20220922 |
|
PC01 | Cancellation of the registration of the contract for pledge of patent right | ||
PC01 | Cancellation of the registration of the contract for pledge of patent right |
Date of cancellation: 20220922 Granted publication date: 20171103 Pledgee: Guangzhou Kaide Finance Leasing Co.,Ltd. Pledgor: GUANGZHOU FASTPRINT CIRCUIT TECH Co.,Ltd.|SHENZHEN FASTPRINT CIRCUIT TECH Co.,Ltd.|YIXING SILICON VALLEY ELECTRONICS TECH Co.,Ltd. Registration number: Y2019990000032 |