CN105067993A - 一种用于片上系统soc芯片的可拆分测试方法 - Google Patents
一种用于片上系统soc芯片的可拆分测试方法 Download PDFInfo
- Publication number
- CN105067993A CN105067993A CN201510383306.4A CN201510383306A CN105067993A CN 105067993 A CN105067993 A CN 105067993A CN 201510383306 A CN201510383306 A CN 201510383306A CN 105067993 A CN105067993 A CN 105067993A
- Authority
- CN
- China
- Prior art keywords
- test
- detecting
- soc
- whole
- testing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
Abstract
Description
Claims (10)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510383306.4A CN105067993B (zh) | 2015-07-02 | 2015-07-02 | 一种用于片上系统soc芯片的可拆分测试方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN201510383306.4A CN105067993B (zh) | 2015-07-02 | 2015-07-02 | 一种用于片上系统soc芯片的可拆分测试方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
CN105067993A true CN105067993A (zh) | 2015-11-18 |
CN105067993B CN105067993B (zh) | 2017-12-26 |
Family
ID=54497409
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN201510383306.4A Active CN105067993B (zh) | 2015-07-02 | 2015-07-02 | 一种用于片上系统soc芯片的可拆分测试方法 |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN105067993B (zh) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109164374A (zh) * | 2018-09-28 | 2019-01-08 | 长鑫存储技术有限公司 | 芯片与芯片测试系统 |
CN109270439A (zh) * | 2018-11-05 | 2019-01-25 | 郑州云海信息技术有限公司 | 一种芯片测试方法、装置、设备及介质 |
CN111736062A (zh) * | 2020-07-27 | 2020-10-02 | 上海兆芯集成电路有限公司 | 测试系统以及测试方法 |
CN114280449A (zh) * | 2021-11-22 | 2022-04-05 | 北京智芯微电子科技有限公司 | 数字芯片的测试访问架构与测试访问方法 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004054892A (ja) * | 2002-07-23 | 2004-02-19 | Samsung Electronics Co Ltd | 単一チップシステム及びこのシステムのテスト/デバッグ方法 |
US20050149797A1 (en) * | 2003-12-02 | 2005-07-07 | Korea Electronics Technology Institute | Soc-based core scan chain linkage switch |
CN1734278A (zh) * | 2005-05-27 | 2006-02-15 | 上海大学 | 集成电路片上系统中故障的测试系统和方法 |
CN103018657A (zh) * | 2012-12-05 | 2013-04-03 | 北京华大信安科技有限公司 | 一种电路测试控制方法及装置 |
CN103499787A (zh) * | 2013-09-24 | 2014-01-08 | 中国科学院自动化研究所 | 一种测试数据压缩方法、数据解压缩装置及解压缩方法 |
CN103576076A (zh) * | 2012-07-27 | 2014-02-12 | 飞思卡尔半导体公司 | 用于执行扫描测试的系统和方法 |
-
2015
- 2015-07-02 CN CN201510383306.4A patent/CN105067993B/zh active Active
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2004054892A (ja) * | 2002-07-23 | 2004-02-19 | Samsung Electronics Co Ltd | 単一チップシステム及びこのシステムのテスト/デバッグ方法 |
US20050149797A1 (en) * | 2003-12-02 | 2005-07-07 | Korea Electronics Technology Institute | Soc-based core scan chain linkage switch |
CN1734278A (zh) * | 2005-05-27 | 2006-02-15 | 上海大学 | 集成电路片上系统中故障的测试系统和方法 |
CN103576076A (zh) * | 2012-07-27 | 2014-02-12 | 飞思卡尔半导体公司 | 用于执行扫描测试的系统和方法 |
CN103018657A (zh) * | 2012-12-05 | 2013-04-03 | 北京华大信安科技有限公司 | 一种电路测试控制方法及装置 |
CN103499787A (zh) * | 2013-09-24 | 2014-01-08 | 中国科学院自动化研究所 | 一种测试数据压缩方法、数据解压缩装置及解压缩方法 |
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN109164374A (zh) * | 2018-09-28 | 2019-01-08 | 长鑫存储技术有限公司 | 芯片与芯片测试系统 |
CN109164374B (zh) * | 2018-09-28 | 2024-03-29 | 长鑫存储技术有限公司 | 芯片与芯片测试系统 |
CN109270439A (zh) * | 2018-11-05 | 2019-01-25 | 郑州云海信息技术有限公司 | 一种芯片测试方法、装置、设备及介质 |
CN111736062A (zh) * | 2020-07-27 | 2020-10-02 | 上海兆芯集成电路有限公司 | 测试系统以及测试方法 |
CN114280449A (zh) * | 2021-11-22 | 2022-04-05 | 北京智芯微电子科技有限公司 | 数字芯片的测试访问架构与测试访问方法 |
Also Published As
Publication number | Publication date |
---|---|
CN105067993B (zh) | 2017-12-26 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
CN105067993A (zh) | 一种用于片上系统soc芯片的可拆分测试方法 | |
US20200217890A1 (en) | Test compression in a jtag daisy-chain environment | |
US11199583B2 (en) | Programmable test compression architecture input/output shift register coupled to SCI/SCO/PCO | |
JP6544772B2 (ja) | スキャンテスト用のテストモード制御信号を生成可能な集積回路 | |
US11768726B2 (en) | Delay fault testing of pseudo static controls | |
KR100986416B1 (ko) | 지연 로크 루프 회로, 타이밍 발생기, 반도체 시험 장치,반도체 집적 회로 및 지연량 교정 방법 | |
CN104950251A (zh) | 一种片上系统soc芯片的时钟网络系统 | |
CN106526463B (zh) | 具扫描测试的集成电路及其测试方法 | |
CN102183721A (zh) | 多时钟域测试方法及测试电路 | |
CN101975922A (zh) | 低功耗扫描测试电路及运行方法 | |
US20080282122A1 (en) | Single scan clock in a multi-clock domain | |
JP5281656B2 (ja) | 複数テストサイトでテストリソースを共有する方法、自動試験装置、テスト対象デバイスを設置及び撤去するハンドラ、及びテストシステム | |
US20030226080A1 (en) | Method and apparatus for affecting a portion of an integrated circuit | |
US5467354A (en) | Test control circuit for controlling a setting and resetting of a flipflop | |
US20100095170A1 (en) | Semiconductor integrated circuit device and delay fault testing method thereof | |
CN104749515A (zh) | 一种基于顺序等分分段式的低功耗扫描测试方法和装置 | |
US5365527A (en) | Logical comparison circuit | |
CN114637182A (zh) | 基于fpga进位链的tdc细时间测量系统及方法 | |
CN107345997B (zh) | 一种基于测试壳的ip核测试方法 | |
US11519962B2 (en) | Test circuit | |
US8402329B2 (en) | Scan test circuit, and method and program for designing same | |
ITMI20110925A1 (it) | Apparato per conversioni analogico digitali. | |
Chen et al. | Design and implementation of an FPGA-based data/timing formatter | |
CN111030695A (zh) | 基于模数转换的延时时间配置方法及系统 | |
CN104639165A (zh) | 两步tdc的全时间域误差校正电路 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
C06 | Publication | ||
PB01 | Publication | ||
C10 | Entry into substantive examination | ||
SE01 | Entry into force of request for substantive examination | ||
GR01 | Patent grant | ||
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20200731 Address after: 2505 COFCO Plaza, No.2, nanmenwai street, Nankai District, Tianjin Patentee after: Xin Xin finance leasing (Tianjin) Co.,Ltd. Address before: 100094 No. 6 Yongjia North Road, Beijing, Haidian District Co-patentee before: DATANG SEMICONDUCTOR DESIGN Co.,Ltd. Patentee before: DATANG MICROELECTRONICS TECHNOLOGY Co.,Ltd. |
|
TR01 | Transfer of patent right | ||
TR01 | Transfer of patent right |
Effective date of registration: 20211026 Address after: 100094 No. 6 Yongjia North Road, Beijing, Haidian District Patentee after: DATANG MICROELECTRONICS TECHNOLOGY Co.,Ltd. Patentee after: DATANG SEMICONDUCTOR DESIGN Co.,Ltd. Address before: 300110 2505 COFCO Plaza, No. 2, nanmenwai street, Nankai District, Tianjin Patentee before: Xin Xin finance leasing (Tianjin) Co.,Ltd. |