CN105021284A - System and method for rapidly measuring space polarization information of random space vector polarized light - Google Patents
System and method for rapidly measuring space polarization information of random space vector polarized light Download PDFInfo
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Abstract
The invention relates to a system and method for rapidly measuring space polarization information of random space vector polarized light. The system is composed of non-polarized splitting prisms, reflectors, a lambda/4 wave plate, polaroids, area array CCDs and a computer, the measured space vector polarized light is divided equally into four light beams after passing the three non-polarized splitting prisms, two of the light beams are reflected by the two reflectors, and the four beams are respectively received by the four area array CCDs after passing a combination of the polaroids and the lambda/4 wave plate. The first light beam is directly input to the area array CCD 11 to measure the original light intensity distribution, the second light beam is input to the area array CCD 12 through one polaroid, the third light beam is input to the area array CCD 13 through the other polaroid, and the fourth light beam is input to the area array CCD 14 successively through the lambda/4 wave plate and one polaroid. Finally, the computer records the light intensity information of the four area array CCDs, and polarization information including the polarization state, direction and degree of each space point of the space vector polarization light is obtained via programming and computing.
Description
Technical field
The present invention relates to space vector light beam detection field, be specifically related to the polarization information measurement etc. to any post vector polarized light, as: the measurement of radial polarisation light, angle polarized light and high-order radial polarized light beam etc.
Background technology
Polarization is one of electromagnetic essential characteristic, and polarized light is the key property that light wave has.Polarized light is divided into even polarization light and non-uniform polarisation light, and usually said linearly polarized light, circularly polarized light and elliptically polarized light belong to even polarization light.
Space vector polarized light is a kind of special polarized light, its spatial polarization state and PHASE DISTRIBUTION are different and different with locus, having space distribution, namely can be even polarization light (spatial points polarization state is identical with initial phase), also can be non-uniform polarisation light.Post vector polarized light is exactly the one of spatial polarization light, its spatial polarization state skewness, but optical axis has certain symmetry or similarity relatively, is a kind of non-uniform polarisation light.Cylindrical polarized beam belongs to the one of post vector polarized light, comprises radial polarisation light, angle polarized light etc., has unique optical characteristics and application because its polarization and phase place distribute axisymmetricly on beam cross-section.In addition, have column symmetry or similar high-order radial polarisation light, the spatial polarization special because of it and PHASE DISTRIBUTION, also have many special optical characteristics and application.As radial polarisation light has the distribution of perfect rotational symmetry, comparing with circularly polarized light with linearly polarized light has significantly different characteristics.Radial polarisation light has the circular ring type beam arrangement along the axisymmetric Electric Field Distribution of light and hollow; Radial polarisation light and angle polarized light are all eigenstate of polarizations, when propagating in the tangential crystal of C, crosstalk can not occur; When high numerical aperture lens focuses on, radial polarisation light can produce the minimum focus surmounting diffraction limit, more much smaller than the focus point of linearly polarized light and circularly polarized light, and the longitudinal electric field of focus area becomes very strong.These characteristics make it in traction, catch and accelerate metallics, cutting metal, improve optical storage density and improve the aspects such as longitudinal frame to have significant advantage.
The polarization characteristic of polarized light describes with stokes parameter usually.1852 Stokes (G.G.Stokes) introduce four parameter S
0, S
1, S
2and S
3, not only can be used for describing polarized light, can also be used to describe natural light and partial poolarized light.These four parameters are light wave observable quantity functions, that is can be determined their size by optical measurement, and the dimension of these four amounts is all identical with light intensity.Degree of polarization represents with alphabetical P usually, for linearly polarized light, elliptically polarized light, and P=1, for linearly polarized light, S
3=0, circularly polarized light, S
1=S
2=0; For partial poolarized light, 0<P<1, natural light, P=0; For post vector polarized light, as radial polarisation light and angle polarized light, P=0.
Even polarization polarisation of light state, can be represented by stokes parameter completely, but for the non-uniform polarisation light that statuary column vector polarized light is such, overall degree of polarization P=0, it is different from natural light, and it is regular polarized light really, suitable method must be found its spatial polarization information is measured, and various post vector polarized light is distinguished.
Summary of the invention
The problem that the present invention solves: overcome the deficiency can only measured even polarization polarization state, provide a kind of method that any space vector polarized light polarization information is measured, the method utilizes area array CCD writing light beam each point intensity signal, can realize the measurement to any space vector polarized light spatial points polarization information.Measuring system has the features such as structure is simple, applied widely, space measurement precision high (can reach micron dimension), real-time online measuring.
Technical solution of the present invention: the method for any space vector polarized light of a kind of Quick Measurement spatial polarization information, comprises the following steps:
S1: set into irradiating light beam.Incident beam is space vector polarized light, and polarization state is any, and by the suitable attenuate light beam intensity of attenuator, spot size adjusts by beam-expanding collimation mirror, and the beam intensity incided on area array CCD is no more than the exposure value intensity of CCD;
S2: unpolarized Amici prism is set.Amici prism is insensitive to incident light polarization, does not change the polarization characteristic of incident beam, and spatial points light splitting ability is consistent, and the two-beam each point light intensity correspondent equal separated, incident beam vertical incidence, three Amici prisms are parallel up and down.
S3: accommodation reflex mirror M.For beam reflection, change light path, return to the space distribution of incident beam, mirror center overlaps with beam center, has high reflectivity to lambda1-wavelength;
S4: λ/4 wave plate is set.The optical axis of light beam crosses wave plate center, λ/4 and normal parallel, and the fast axle of λ/4 wave plate is parallel with X-axis, and λ/4 wave plate can be changed according to lambda1-wavelength, and consistent with the central wavelength lambda of light source, to improve the scope of application;
S5: polaroid P1 is set.Polaroid has high extinction ratio, beam optical axis cross polaroid center and and normal parallel, its transmission direction is parallel with horizontal direction (X-axis), i.e. horizontal direction;
S6: polaroid P2 is set.Polaroid has high extinction ratio, beam optical axis cross polaroid center and and normal parallel, its transmission direction and X-axis angle at 45 ° (counterclockwise 45 °);
S7: polaroid P3 is set.Polaroid has high extinction ratio, beam optical axis cross polaroid center and and normal parallel, its transmission direction becomes-45° angle (clockwise 45 °) with X-axis;
S8: area array CCD is set.Writing light beam intensity: area array CCD is black-white CCD, A/D digital-to-analog conversion is 12 or more, beam orthogonal incides CCD, CCD crosses optical axis in center, and light beam maximum intensity may not exceed CCD exposure value, and 4 CCD have identical signal to noise ratio (S/N ratio), performance is the same, 4 bundle light have identical position on 4 CCD, and be convenient to beam intensity ratio comparatively, light beam each point intensity information is converted into 0 ﹣ (2
12-1) or higher gray-scale value, numerical evaluation is convenient to.
In described step S1, space vector polarized light is produced by optical device, and incident light spectrum width is less than ± 3nm, and spot size is controlled, and wave band, from visible ray near infrared, is determined by the size of area array CCD and sensitive volume.
In described step S5, S6, S7, polaroid can be adjusted to Glan-Taylor prism according to measuring accuracy and incident intensity.
Area array CCD in described step S8 can be adjusted to face battle array light intensity meter or light power meter etc. according to measuring accuracy and incident intensity and development in science and technology situation.
In described step S8, the light intensity of area array CCD record, when concrete participation calculates, for improving measuring accuracy, should the reflectivity of catoptron, and the absorption loss rate of wave plate and polaroid is taken into account, amplifies the light intensity that CCD records according to loss ratio.
Principle of the present invention is the intensity signal utilizing 4 area array CCDs to obtain, and obtains the spatial points stokes parameter of light beam, and then obtains the polarization information of light beam spatial points, namely obtains the polarization information of whole light beam.
The Stokes parameter of light and total light intensity I of light, polarization azimuth ψ (direction, transverse place of elliptically polarized light), elliptic polarization angle χ (embodying major and minor axis length relation oval in elliptically polarized light), and degree of polarization P relation in Poincare sphere (as Fig. 2) is provided by following formula:
S
0＝I (1)
S
1＝IPcos2ψcos2χ (2)
S
2＝IPsin2ψcos2χ (3)
S
3＝IPsin2χ (4)
Wherein, 0≤ψ≤π ,-π/4≤χ≤π/4,0≤P≤1, ellipse degree of bias tan χ=± b/a (a, b are the ellipse long and short shaft length of elliptically polarized light, and tan χ=0 is linearly polarized light, and tan χ=± 1 is left/right circularly polarized light).
As shown in Figure 2, radius of a ball size is total light intensity I, and on ball, any point P coordinate is (S
1, S
2, S
3), show that the angular coordinate of the position latitude of P point on sphere and longitude is 2 χ and 2 ψ.Point on sphere represents pure polarized light, and the point in ball is partial poolarized light, and the centre of sphere is then natural light.
These parameters characterizing polarization also can use Stokes expressed as parameters, and meet following relationship:
I＝S
0(5)
2ψ＝arctan(S
2/S
1)(7)
Measuring principle with the coherence matrix derivation Stokes parameter of accurate single color plane ripple:
Assuming that being investigated light is successively the compensator of ε and the polarization direction polarizer into θ angle with positive X-direction through a phase delay angle, investigated light y component after compensator and will produce phase delay angle ε to x component, the component of electric vector on θ direction is
E(t,θ,ε)＝E
x(t)cosθ+E
y(t)e
iεsinθ (9)
Wherein,
a
1(t), a
2t () is light wave amplitude, ω is light vibration angular frequency, and δ is the initial phase difference investigating light.
For convenience of calculation adopts index to state here.I (θ, ε) represents and is investigated the transmitted intensity of light after the experimental provision that to be the compensator of ε and by a phase delay angle form with the polarizer tandem connection of X-direction degree into θ angle.
The coherence matrix J introducing light wave represents:
Coherence matrix unit is substituted into (10) formula, then has:
I(θ,ε)＝J
xxcos
2θ+J
yysin
2θ+J
xye
-iεcosθsinθ+J
yxe
iεsinθcosθ (12)
Definition from Stokes parameter:
Real part is got to the coherence matrix unit in (12) formula, Stokes parameter coherence matrix unit can be expressed as by (13) formula:
Light intensity I can be obtained respectively by area array CCD 1-CCD4
1, I
2, I
3, I
4, wherein, light intensity I is matrix distribution, is determined by the resolution of CCD, and namely each pixel of CCD all has light intensity value, can obtain according to formula (14),
Stokes parameter S
0, S
1, S
2, S
3also be matrix distribution, carry it into the degree of polarization P that formula (6), (7), (8) just can obtain incident beam spatial points, and the information such as the polarization azimuth ψ of polarized component and ellipse degree of bias tan χ.
The present invention's advantage is compared with prior art:
(1) the present invention not only can measure even polarization polarisation of light state, as linearly polarized light, elliptically polarized light etc., measurement space distribution can also have the non-uniform polarisation light of certain rule, as radial polarisation light, angle polarized light and high-order post vector polarized light etc.
(2) by four CCD receiving light power information simultaneously, directly can obtain the stokes parameter of light beam each point, even if incident beam power instability also can realize Measurement accuracy, and avoid the delay that traditional rotating wave plate or rotatory polarization sheet method bring, realize real-time online measuring.
(3) by changing λ/4 wave plate, can the laser beam in CCD sensitive volume be measured, applied widely.Its space measurement precision is relevant with the Pixel size of CCD, and pixel is less, and space measurement precision is also higher, and existing CCD Pixel size reaches micron dimension, can ensure measuring accuracy.
(4) realize Automated condtrol by computer programming, directly can obtain result.
Accompanying drawing explanation
Fig. 1 is measuring system schematic diagram of the present invention;
Fig. 2 is Poincare sphere figure.
Wherein: 1. space vector polarized light; 2,3,4 unpolarized Amici prisms (NPBS); 5,6 catoptrons (M); 7. λ/4 wave plate (QWP); 8,9,10 polaroids (P); 11,12,13,14 area array CCDs; 15. computing machines
Embodiment
Provide the specific embodiment of the present invention by reference to the accompanying drawings, describe technical scheme of the present invention in detail.
As shown in Figure 1, polarization measurement system of the present invention is made up of unpolarized Amici prism, catoptron, λ/4 wave plate, polaroid, area array CCD and computing machine.Detected space vector polarized light 1 is divided into four light beams after three pieces of unpolarized Amici prisms, and wherein two light beams return to the space distribution of incident beam again after two pieces of catoptron reflections; Four light beams, respectively by after the combination of polaroid and λ/4 wave plate, received by 4 area array CCDs.Wherein, light beam is directly incident on area array CCD 11, measure original light distribution, second bundle light reenters and is mapped on area array CCD 12 after the polaroid 8 that a polarization direction is horizontal direction, three-beam reenters through a polarization direction and is mapped on area array CCD 13 after the polaroid 9 of 45 °, 4th bundle light first through λ/4 wave plate 7 of a fast axle and horizontal direction parallel, then incides on area array CCD 14 after the polaroid 10 of-45 ° through a polarization direction.Finally, recorded the intensity signal of 4 area array CCDs by computing machine 15, and by program calculation, obtain the degree of polarization of space vector polarized light spatial points, and the polarization information such as the polarization direction of polarized component and the ellipse degree of bias.
As shown in Figure 1, for the inventive method is implemented as follows:
Step 101 arranges incident light 1.Incident beam is space vector polarized light, and polarization state is any, and by the suitable attenuate light beam intensity of attenuator, spot size adjusts by beam-expanding collimation mirror, and the beam intensity incided on area array CCD is no more than the exposure value intensity of CCD.Specifically can select He-Ne radial polarisation light, angle polarized light and second order radial polarisation light etc., it is measured and verifies;
Step 102 arranges unpolarized Amici prism 2,3,4.Amici prism is insensitive to incident light polarization, does not change the polarization characteristic of incident beam, and spatial points light splitting ability is consistent, and the two-beam each point light intensity correspondent equal separated, incident beam vertical incidence, three Amici prisms are parallel up and down.
Step 103 accommodation reflex mirror M5,6.For beam reflection, change light path, return to the space distribution of incident beam, mirror center overlaps with beam center, has high reflectivity to lambda1-wavelength;
Step 104 arranges λ/4 wave plate 7.The optical axis of light beam crosses wave plate center, λ/4 and normal parallel, and the fast axle of λ/4 wave plate is parallel with X-axis, and λ/4 wave plate can be changed according to lambda1-wavelength, and consistent with the central wavelength lambda of light source, to improve the scope of application.Specifically can choose the quarter wave plate of λ=633nm, when optical source wavelength changes, wave plate is changed thereupon;
Step 105 arranges the first polaroid 8.Polaroid has high extinction ratio, beam optical axis cross polaroid center and and normal parallel, its transmission direction is parallel with horizontal direction (X-axis), i.e. horizontal direction;
Step 106 arranges the second polaroid 9.Polaroid has high extinction ratio, beam optical axis cross polaroid center and and normal parallel, its transmission direction and X-axis angle at 45 ° (counterclockwise 45 °);
Step 107 arranges the 3rd polaroid 10.Polaroid has high extinction ratio, beam optical axis cross polaroid center and and normal parallel, its transmission direction becomes-45° angle (clockwise 45 °) with X-axis;
Step 108 arranges 4 area array CCDs 11,12,13,14.Writing light beam intensity: area array CCD is black-white CCD, A/D digital-to-analog conversion is 12 or more, and beam orthogonal incides CCD, and CCD crosses optical axis in center, and light beam maximum intensity may not exceed CCD exposure value, 4 CCD have identical signal to noise ratio (S/N ratio), and performance is the same, and 4 bundle light have identical position on 4 CCD, be convenient to beam intensity ratio comparatively, the A/D digital-to-analog conversion precision supposing CCD is 12, then light beam each point intensity information is converted into the gray-scale value of 0-4095, is convenient to numerical evaluation.Area array CCD record be a matrix information, for the CCD of 1024 × 1024 resolution, its record intensity signal be a matrix I
1024 × 1024, namely comprise the intensity signal of light beam every bit, when participating in Stokes Parameters Calculation, the Stokes parameter of light beam every bit can be obtained, and then obtain the polarization information of light beam spatial points.
Step 109 arranges the algorithm of computing machine 15.The intensity signal I of Computer Storage area array CCD, if the intensity signal of 4 area array CCDs is I
1-I
4, be stored in computing machine, utilize formula (15) to calculate, then can obtain the stokes parameter (S of spatial points
0, S
1, S
2, S
3), recycling formula (6), (7), (8) then can calculate the polarization state of light beam spatial points, the polarization direction of polarized component and ellipse degree of bias tan χ respectively, directly can characterize these polarization informations with the two-dimensional intensity figure calculated.
In a word, the present invention utilizes 4 measurements of area array CCDs realization to any space vector polarized light spatial points polarization information.This simple in measurement system structure, easy to operate; By changing λ/4 wave plate, can the laser beam in CCD sensitive volume be measured, applied widely; Its space measurement precision is relevant with A/D digital-to-analog conversion figure place with the Pixel size of CCD, pixel is less, A/D digital-to-analog conversion figure place is higher, space measurement precision is also higher, existing CCD Pixel size reaches micron dimension, A/D digital-to-analog conversion figure place reaches 16, and sampling precision is higher, can ensure measuring accuracy; Realize Automated condtrol by computer programming, directly can obtain result, and realize the Quick Measurement of real-time online.
Non-elaborated part of the present invention belongs to the known technology of those skilled in the art.
Although describe specific embodiment of the invention method above, but those skilled in the art is to be understood that, these only illustrate, under the prerequisite not deviating from the principle of the invention and realization, (such as, catoptron can be removed according to the difference of computing method can to make various changes or modifications to these embodiments; λ/4 wave plate can change to liquid crystal spatial light adjuster and realize multi-wavelength control, without the need to changing again; Polaroid is replaceable is other polarizers such as Glan-Taylor prism; Also by optimization system, 4 bundle light are all incided on same area array CCD, and optimized algorithm, cost-saving; CCD can by other face battle array light intensity detector replacements etc.), therefore, protection scope of the present invention is defined by the appended claims.
Claims (6)
1. a system for any space vector polarized light of Quick Measurement spatial polarization information, is characterized in that: be made up of unpolarized Amici prism, catoptron, λ/4 wave plate, polaroid, area array CCD and computing machine; Detected space vector polarized light is divided into four light beams after three pieces of unpolarized Amici prisms, and wherein two light beams return to the space distribution of incident beam again after two pieces of catoptron reflections; Four light beams, respectively by after the combination of polaroid and λ/4 wave plate, received by 4 area array CCDs; Wherein, light beam is directly incident on area array CCD 11, measure original light distribution, second bundle light reenters and is mapped on area array CCD 12 after the polaroid that a polarization direction is horizontal direction, three-beam reenters through a polarization direction and is mapped on area array CCD 13 after the polaroid of 45 °, 4th bundle light first through λ/4 wave plate of a fast axle and horizontal direction parallel, then incides on area array CCD 14 through a polarization direction after the polaroid of-45 °; Finally, by the intensity signal of computer recording 4 area array CCDs, and by program calculation, obtain the degree of polarization of space vector polarized light spatial points, and the polarization information such as the polarization direction of polarized component and the ellipse degree of bias.
2. a method for any space vector polarized light of Quick Measurement spatial polarization information, is characterized in that comprising following steps:
S1: set into irradiating light beam, requires that incident beam is space vector polarized light, and polarization state is any, and by the suitable attenuate light beam intensity of attenuator, the beam intensity incided on area array CCD is no more than the exposure value intensity of CCD;
S2: arrange unpolarized Amici prism, requires that Amici prism is insensitive to incident light polarization, does not change the polarization characteristic of incident beam, and spatial points light splitting ability is consistent, the two-beam each point light intensity correspondent equal separated, incident beam vertical incidence, three Amici prisms are parallel up and down;
S3: accommodation reflex mirror M, for beam reflection, change light path, return to the space distribution of incident beam, require that mirror center overlaps with beam center, to lambda1-wavelength, there is high reflectivity;
S4: λ/4 wave plate is set, require the optical axis of light beam to cross wave plate center, λ/4 and and normal parallel, and the fast axle of λ/4 wave plate is parallel with X-axis, and λ/4 wave plate can be changed according to lambda1-wavelength, and consistent with the central wavelength lambda of light source, to improve the scope of application;
S5: arrange polaroid P1, requires that polaroid has high extinction ratio, beam optical axis cross polaroid center and and normal parallel, its transmission direction is parallel with horizontal direction and X-axis, i.e. horizontal direction;
S6: arrange polaroid P2, requires that polaroid has high extinction ratio, beam optical axis cross polaroid center and and normal parallel, its transmission direction and X-axis angle at 45 ° and counterclockwise 45 °;
S7: arrange polaroid P3, requires that polaroid has high extinction ratio, beam optical axis cross polaroid center and and normal parallel, its transmission direction becomes with X-axis-45° angle and clockwise 45 °;
S8: area array CCD is set, writing light beam intensity, area array CCD is black-white CCD, and A/D digital-to-analog conversion is 12 or more, beam orthogonal incides CCD, CCD crosses optical axis in center, and light beam maximum intensity may not exceed CCD exposure value, and 4 CCD have identical signal to noise ratio (S/N ratio), performance is the same, 4 bundle light have identical position on 4 CCD, and be convenient to beam intensity ratio comparatively, light beam each point intensity information is converted into 0 ﹣ (2
12-1) or higher gray-scale value, numerical evaluation is convenient to.
3. the method for any space vector polarized light of a kind of Quick Measurement according to claim 2 spatial polarization information, it is characterized in that: the space vector polarized light in described step S1 is produced by optical device, incident light spectrum width is less than ± 3nm, spot size is controlled, wave band, from visible ray near infrared, is determined by the size of area array CCD and sensitive volume.
4. the method for any space vector polarized light of a kind of Quick Measurement according to claim 2 spatial polarization information, is characterized in that: the polaroid in described step S5, S6, S7 can be adjusted to Glan-Taylor prism according to measuring accuracy and incident intensity.
5. the method for any space vector polarized light of a kind of Quick Measurement according to claim 2 spatial polarization information, is characterized in that: the area array CCD in described step S8 can be adjusted to face battle array light intensity meter or light power meter according to measuring accuracy and incident intensity and development in science and technology situation.
6. the method for any space vector polarized light of a kind of Quick Measurement according to claim 2 spatial polarization information, it is characterized in that: the light intensity of the area array CCD record in described step S8, when concrete participation calculates, should the reflectivity of catoptron, and the absorption loss rate of wave plate and polaroid is taken into account, according to loss ratio, the light intensity that CCD records is amplified, to guarantee measuring accuracy.
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Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN106092905A (en) * | 2016-06-21 | 2016-11-09 | 北京化工大学 | A kind of Polarized infrared light spectrometer |
| CN106225928A (en) * | 2016-07-08 | 2016-12-14 | 南京航空航天大学 | A kind of vector beam polarisation distribution detection apparatus and method |
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Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070041014A1 (en) * | 2004-04-13 | 2007-02-22 | The United States Of America As Represented By The Secretary Of The Army | Simultaneous 4-stokes parameter determination using a single digital image |
| CN103017908A (en) * | 2012-11-30 | 2013-04-03 | 中国科学院上海技术物理研究所 | Polarized light characteristic real-time measuring device and method based on four-way light splitting module |
| CN103439001A (en) * | 2013-08-20 | 2013-12-11 | 浙江大学 | Method and device for measuring and evaluating inhomogeneous vector polarized light |
| CN103592808A (en) * | 2013-11-18 | 2014-02-19 | 苏州精创光学仪器有限公司 | Compact polarization imaging camera wide in field of view |
-
2015
- 2015-06-29 CN CN201510377522.8A patent/CN105021284B/en not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20070041014A1 (en) * | 2004-04-13 | 2007-02-22 | The United States Of America As Represented By The Secretary Of The Army | Simultaneous 4-stokes parameter determination using a single digital image |
| CN103017908A (en) * | 2012-11-30 | 2013-04-03 | 中国科学院上海技术物理研究所 | Polarized light characteristic real-time measuring device and method based on four-way light splitting module |
| CN103439001A (en) * | 2013-08-20 | 2013-12-11 | 浙江大学 | Method and device for measuring and evaluating inhomogeneous vector polarized light |
| CN103592808A (en) * | 2013-11-18 | 2014-02-19 | 苏州精创光学仪器有限公司 | Compact polarization imaging camera wide in field of view |
Cited By (13)
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| CN106092905A (en) * | 2016-06-21 | 2016-11-09 | 北京化工大学 | A kind of Polarized infrared light spectrometer |
| CN106225928A (en) * | 2016-07-08 | 2016-12-14 | 南京航空航天大学 | A kind of vector beam polarisation distribution detection apparatus and method |
| CN109253802B (en) * | 2017-07-13 | 2021-10-26 | 南京理工大学 | Bionic navigation multispectral polarization synchronous acquisition system and method |
| CN109253802A (en) * | 2017-07-13 | 2019-01-22 | 南京理工大学 | A kind of multispectral polarization synchronous of bionic navigation and method |
| CN108548603A (en) * | 2018-04-12 | 2018-09-18 | 中国科学院光电技术研究所 | A kind of non co axial four-way polarization imaging method and system |
| CN108801464A (en) * | 2018-04-13 | 2018-11-13 | 中国人民解放军国防科技大学 | Image processing method for calculating polarization direction and polarization degree of light wave |
| CN108801464B (en) * | 2018-04-13 | 2020-06-02 | 中国人民解放军国防科技大学 | Image processing method for calculating polarization direction and polarization degree of light wave |
| CN108801465A (en) * | 2018-06-29 | 2018-11-13 | 中国工程物理研究院应用电子学研究所 | A kind of laser polarization state measuring device and its measurement method |
| CN108801465B (en) * | 2018-06-29 | 2020-08-14 | 中国工程物理研究院应用电子学研究所 | Laser polarization state measuring device and measuring method thereof |
| CN110445550A (en) * | 2019-08-08 | 2019-11-12 | 深圳市深光谷科技有限公司 | A kind of coherent light direct detecting method, device and optical communication system |
| CN113324879A (en) * | 2021-05-21 | 2021-08-31 | 华中科技大学 | Method for measuring anisotropic rotational movement particles |
| CN115014533A (en) * | 2022-08-10 | 2022-09-06 | 歌尔光学科技有限公司 | Light polarization state testing device |
| CN115014533B (en) * | 2022-08-10 | 2022-12-09 | 歌尔光学科技有限公司 | Light polarization state testing device |
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