CN111562002B - High-flux high-resolution high-contrast polarization interference spectrum imaging device and method - Google Patents
High-flux high-resolution high-contrast polarization interference spectrum imaging device and method Download PDFInfo
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- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
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- G01J3/45—Interferometric spectrometry
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- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J2003/1291—Generating the spectrum; Monochromators polarised, birefringent
Abstract
The invention relates to a high-throughput high-resolution high-contrast polarization interference spectrum imaging device and method. The problems that a traditional Michelson interference imaging spectrometer is low in detection precision and energy utilization rate and resolution of the traditional Sagnac interferometer-based imaging spectrometer are low are solved, and the Michelson interference imaging spectrometer comprises a collimating mirror, a polarizing film, an interferometer, a dispersion system, an imaging mirror and a detector which are sequentially arranged in a light path; the interferometer comprises a half-wave plate and an optical path difference etalon which are positioned in an emergent light path of the polarization beam splitter; the target light source is incident to the interferometer, and the vibration direction of the S light or the P light is adjusted by the aid of the half-wave plate, so that the S light and the P light have the same vibration direction; adjusting the optical path of the S light and/or the P light by using the optical path difference etalon to generate a fixed optical path difference between the S light and the P light; the non-polarization beam splitter reflects and transmits S light and P light with the same vibration direction and fixed optical path difference to form interference fringes; the interference fringe is dispersed by the dispersion system and then imaged on the detector.
Description
Technical Field
The invention belongs to the field of spectral imaging, and relates to a high-throughput high-resolution high-contrast polarization interference spectral imaging device and method.
Background
The interference imaging spectrum technology is a non-destructive, rapid and sensitive target identification and detection technology developed in recent years, and the technology has important application in various fields such as environmental monitoring, marine water quality monitoring, biomedicine, astronomical detection, optical fiber communication, military science, agriculture and the like at present.
Interference spectrometers can be generally classified into two types, a time modulation type and a spatial modulation type. An imaging spectrometer based on michelson interference and an imaging spectrometer based on Sagnac interferometer are typical representatives of a temporal modulation type and a spatial modulation type, respectively. The former can realize high-precision spectral measurement, but is sensitive to disturbance of external environment and mechanical scanning precision in the spectral measurement process. The latter can automatically compensate external disturbance and vibration due to the design of a common light path, and the system can be more stable without moving parts, but the spectrometer still has the problems of low energy utilization rate and low resolution. Energy utilization is very important for weak light detection especially in astronomy. With the development of interference imaging spectrum technology, the requirement for spectral resolution in the detection process is higher and higher.
Disclosure of Invention
In order to solve the problems that the detection precision of a traditional Michelson interference imaging spectrometer is low and the energy utilization rate and the resolution ratio of the traditional imaging spectrometer based on a Sagnac interferometer are low, the invention provides a polarization interference spectrum imaging device and method with high flux, high resolution ratio and high contrast ratio.
The technical scheme of the invention is to provide a high-flux high-resolution high-contrast polarization interference spectrum imaging device, which is characterized in that: the device comprises a collimating lens, a polaroid, an interferometer, a dispersion system, an imaging lens and a detector which are sequentially arranged in a light path;
the interferometer is a common-path Sagnac interferometer with an asymmetric structure, and comprises a polarization beam splitter, three plane reflectors and a non-polarization beam splitter which are sequentially arranged along a light path; the optical path difference etalon is arranged in a transmission light path from the polarization beam splitter to the non-polarization beam splitter; the half-wave plate is positioned in any emergent light path of the polarization beam splitter; the optical path difference etalon is positioned in any emergent light path or two emergent light paths of the polarization beam splitter;
the polarization beam splitter is used for dividing a target light source which passes through the collimating mirror and the polaroid into two paths of S light and P light with mutually vertical vibration directions; the half-wave plate is used for adjusting the vibration direction of the S light or the P light, so that the S light and the P light have the same vibration direction; the optical path difference etalon is used for adjusting the optical path of the S light and/or the P light, so that a fixed optical path difference is generated between the S light and the P light; the three plane reflectors are used for reflecting the S light and the P light and finally reflecting the S light and the P light with the same vibration direction and fixed optical path difference to the non-polarization beam splitter; the non-polarization beam splitter is used for reflecting and transmitting S light and P light with the same vibration direction and fixed optical path difference to form interference fringes;
and the interference fringes are dispersed by a dispersion system and then imaged on a detector through an imaging mirror.
Further, in order to ensure that the intensities of the two beams of light are basically consistent after the two beams of light are split by the polarization beam splitter, an included angle between the polarization direction of the polarizing plate and the vibration direction of the S light is 45 degrees, wherein the S light is reflected light of the polarization beam splitter; in order to make the vibration directions of the transmitted light and the reflected light consistent, the included angle between the fast axis direction of the half-wave plate and the vibration direction of the incident light is 45 degrees.
Further, the optical path difference etalon is made of a uniaxial crystal or an amorphous material; light is incident perpendicularly to the retardation etalon surface.
Further, if the optical path difference etalons made of uniaxial crystal materials are arranged in the two paths of emergent light paths passing through the polarization beam splitter, the surfaces of the two optical path difference etalons are perpendicular to the corresponding incident light, the crystal optical axis is parallel to the crystal plane, and the half-wave plate is located in the light path behind the optical path difference etalons.
Further, in order to adjust the period of the interference fringes, the inclination angle of at least one of the three plane mirrors is adjustable.
Further, when the two paths of emergent light paths of the polarization beam splitter are respectively provided with the optical path difference etalon made of the uniaxial crystal material, the optical path difference etalon is positioned in front of the plane reflector with the adjustable inclination angle.
Further, if the included angle between the plane mirror EF and the incident light is equal to 45 °, the dispersion system includes two sets of dispersion units;
each group of dispersion units comprises a first cylindrical mirror, a second cylindrical mirror, a slit, a collimation system and a grating which are sequentially arranged along a light path; the convergence directions of the first cylindrical mirror and the second cylindrical mirror are mutually vertical; the slit is positioned at the focus of the second cylindrical lens, and the length direction of the slit is consistent with the period direction of the interference fringes;
two groups of interference fringes are imaged at the slit after passing through a first cylindrical mirror and a second cylindrical mirror in each group of dispersion units respectively, then are collimated by a collimation system, and finally are subjected to grating dispersion.
Further, if the included angle between the plane reflector EF and the incident light is not equal to 45 °, the dispersion system is sequentially provided with a first cylindrical mirror, a second cylindrical mirror, a slit, a collimation system, and a grating along the light path; the converging directions of the first cylindrical mirror and the second cylindrical mirror are mutually vertical, the slit is positioned at the focus of the second cylindrical mirror, and the length direction of the slit is consistent with the period direction of the interference fringes;
two groups of interference fringes are imaged at different positions in the length direction of the slit after passing through the first cylindrical mirror and the second cylindrical mirror at the same time, collimated by the collimating system and finally dispersed by the grating.
The invention also provides an imaging method based on the high-flux high-resolution high-contrast polarization interference spectrum imaging device, which comprises the following steps of:
step 1, a target light source is incident to a polarization beam splitter after passing through a collimating mirror and a polarizing film;
step 2, the polarization beam splitter divides the target light source which passes through the collimating mirror and the polaroid into two paths of S light and P light which have mutually vertical vibration directions and consistent intensity;
3, sequentially reflecting the S light and the P light by the three plane reflectors, and adjusting the vibration direction of the S light or the P light by using a half-wave plate to enable the S light and the P light to have the same vibration direction; adjusting the optical path of the S light and/or the P light by using the optical path difference etalon to generate a fixed optical path difference between the S light and the P light; the three plane mirrors finally reflect the S light and the P light with the same vibration direction and fixed optical path difference to the non-polarization beam splitter;
and 5, imaging the interference fringes on a detector after the dispersion of the dispersion system.
Further, if an included angle between the plane mirror EF and the incident light is equal to 45 °, the step 5 specifically includes:
two groups of interference fringes are imaged at a slit after passing through a first cylindrical mirror and a second cylindrical mirror in each group of dispersion units respectively, then are collimated by a collimation system, and finally are imaged on two different detectors after being subjected to grating dispersion;
if the included angle between the plane mirror EF and the incident light is not equal to 45 °, the step 5 specifically includes:
firstly, adjusting the angle of a plane mirror EF to enable a reflected beam of the plane mirror EF and another beam entering a dispersion system not to be in the same plane; the reflected beam of the plane reflector EF and the other beam are imaged at different positions in the length direction of the slit after passing through the first cylindrical mirror and the second cylindrical mirror, collimated by the collimating system, and finally subjected to dispersion imaging by the grating (64) at different positions of the detector.
The invention has the beneficial effects that:
(1) the energy utilization efficiency of the imaging device of the invention is improved in terms of luminous flux.
Firstly, an asymmetrical structural design enables one path of light beam which returns to a light source originally to be reused; and secondly, because the polarization beam splitter and the half-wave plate are used in the interferometer, the vibration directions of two beams of light which are vertical to each other in the original vibration direction are consistent, and an analyzer is omitted. The energy efficiency of the light source is thus improved, and the sensitivity of the system is thus also improved.
(2) Has high stability.
Because the device adopts the design scheme of the common light path, the optical paths (except the added fixed optical path difference) passed by the two paths of light are basically consistent, so the influence of external vibration and thermodynamic change on interference can be basically ignored, and interference fringes are more stable than a non-common-path interferometer.
(3) With high spectral resolution.
Since the device uses a grating after the interferometer, the spectral resolution of the system is determined by the grating. And a proper grating can be selected according to detection requirements, and compared with a traditional interference imaging spectrometer with an incident slit or an interferometer with optical path difference, the energy utilization rate is improved, and the contrast of interference fringes is also improved.
(4) Has high contrast.
The invention adds the polaroid in front of the interferometer, the intensity of the two beams of light after being split by the polarization beam splitter is basically consistent by adjusting the angle of the polaroid, and the vibration directions of the two beams of light are consistent by using the half-wave plate in the interferometer, so that the contrast of interference fringes can be improved. The use of a polarization beam splitter in combination with a half-wave plate can reduce or eliminate interference caused by multiple reflections or scattering of the two rays in the interferometer, and can further improve the contrast.
(5) In the invention, the optical path difference etalon is added into the interferometer to generate a fixed optical path difference, and the optical path difference can amplify the phase change of the interference fringes according to the interference principle, so that the detection precision is favorably improved in the high-precision detection process.
(6) In the invention, the grating is used in the post-dispersion system, so that the interference fringes can be dispersed along the wavelength direction, and because the periods of the interference fringes obtained by different wavelengths are different, the superposition of the interference fringes among the light with different wavelengths can be reduced after dispersion, thereby improving the contrast of the system.
(7) In the invention, two cylindrical mirrors are used behind the interferometer, and the convergence directions of the two cylindrical mirrors are perpendicular to each other. The light beam after exiting from the interferometer is imaged at the slit after passing through the two cylindrical mirrors. The focal length of the two cylindrical lenses can be designed according to the size of the slit, so that the light beams can pass through the slit without loss or with minimum energy loss. Because the cylindrical mirrors only change the focal power in one direction, and the focal powers in two directions can be respectively controlled by using the two cylindrical mirrors, light spots with different length-width ratios can be obtained by changing the focal lengths of the two cylindrical mirrors.
Drawings
FIG. 1 is a schematic diagram of a polarized interference spectroscopy imaging apparatus according to a first embodiment of the present invention;
FIG. 2 is a diagram illustrating a set of dispersion units used in a polarized interference spectroscopy imaging apparatus according to a second embodiment of the present invention;
the reference numbers in the figures are: 1-light source, 2-collimating mirror, 3-polaroid, 4-interferometer, 41-polarization beam splitter, 42-plane reflector, 43-non-polarization beam splitter, 44-half wave plate, 45-optical path difference etalon, 5-plane reflector EF, 6-dispersion system, 60-first cylindrical mirror, 61-second cylindrical mirror, 62-slit, 63-collimation system, 64-grating, 7-imaging mirror and 8-detector;
Detailed Description
The invention relates to a high-flux high-resolution high-contrast polarization interference spectrum imaging device which mainly comprises three parts, namely a collimation system, an interferometer and a post-dispersion system. The collimation system is used for collimating the light path entering the system. The interferometer adopts a common-light-path Sagnac interferometer with an asymmetric structure, so that one path of light originally returning to a light source can be continuously utilized by a subsequent light path, the light paths of the two paths of light passing through the interferometer are basically consistent, and the luminous flux and the stability of the system are improved; two polarized lights with mutually vertical vibration directions can be obtained by adopting the polarization beam splitter for splitting, and a half-wave plate is added into one of the polarized lights, so that the vibration directions of the two polarized lights are consistent, the use of an analyzer is avoided, and the energy utilization rate is improved; the grating is added behind the interferometer to realize high spectral resolution, and the grating can disperse incident light along the wavelength direction, so that the contrast of interference fringes is improved; the addition of a fixed optical path difference in the interferometer amplifies the phase change of the interference fringes, and therefore, the detection accuracy can be improved in detecting the view-direction velocity according to the phase change of the interference fringes.
The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.
Example one
As shown in fig. 1, the coherent dispersive spectroscopic imaging device with high contrast, high flux and high resolution in this embodiment mainly includes a collimating mirror 2, a polarizing plate 3, a common-path Sagnac interferometer 4 with an asymmetric structure, a plane mirror EF5, a dispersive system 6, an imaging mirror 7 and a detector 8.
After passing through the collimator lens 2 and the polarizer 3, the target light source enters a common light path Sagnac interferometer 4 with an asymmetric structure, and the interferometer is composed of three plane mirrors 42, a polarization beam splitter 41, a non-polarization beam splitter 43, a half-wave plate 44 positioned in an emergent light path of the polarization beam splitter 41 and an optical path difference etalon 45. Firstly, a target light source is divided into two paths of polarized light with mutually vertical vibration directions by a polarization beam splitter, wherein the polarized light is S light and the P light respectively, reflected light is S light, and transmitted light is P light. It should be noted that an included angle between the polarization direction of the polarizer and the vibration direction of the S light is 45 °, so that the intensity of the S light and the intensity of the P light after passing are ensured to be consistent, and the contrast of the interference fringes is also ensured. By adopting the common-path Sagnac interferometer with an asymmetric structure, one path of light originally returning to the light source can be utilized, and the optical paths of the two paths of light are basically consistent, so that the luminous flux and the stability of the system are improved.
After passing through the polarization beam splitter 41, the S light passes through the mirrors AB, BC, CD in sequence. The transmitted light P passes through mirrors CD, BC and AB in sequence, similar to S light. In order to generate a fixed optical path difference between the S light path and the P light path, the fixed optical path difference can be added into any optical path, or the optical path difference can be added into the two paths simultaneously. The optical path difference in the interferometer can be generated by adding an optical path difference etalon in one path, but it should be noted that, if the optical path difference is added in any path, the optical path difference etalon 45 is arranged in an S light path or a P light path, and the optical path difference etalon 45 can be made of a uniaxial crystal or an amorphous crystal; when selecting amorphous material, light is required to be vertically incident on the surface of the optical path difference etalon 45, and the size of the optical path difference is related to the length and refractive index of the material; if the optical path difference etalon 45 made of the crystal material is inserted into any optical path to obtain the fixed optical path difference, when the light beam vertically enters, the optical axis of the crystal can be perpendicular to the crystal plane or parallel to the crystal plane. First, theIn one case, because no birefringence occurs, the propagation direction of light does not change, and when calculating the optical path difference, the selected refractive index is the refractive index (n) of the normal lighto) (ii) a In the second case, since the incident light is linearly polarized light having a vibration direction parallel to the incident surface or perpendicular to the incident surface, the propagation direction of the light does not change when the optical axis is parallel to the crystal plane, but the refractive index (n) is caused only by the fact that the vibration directions of the reflected light and the transmitted light are perpendicular to each otheroOr ne) There is a disparity in the optical path difference between the reflected and transmitted light resulting from insertion of the crystal. If the optical path difference is generated by adding the optical path difference etalon 45 of crystal material into the two paths of light, two beams of light are required to be vertically incident, the optical axis is parallel to the crystal plane, the propagation direction of the two beams of light after passing through the optical path difference etalon keeps unchanged, and S light (n light)o) And P (n)e) The refractive index of light in the optical path difference etalon is different, and fixed optical path difference (L (n) can be generatedo-ne))。
An example of inserting an amorphous material optical path difference etalon in reflected light is shown in fig. 1. The following description is based on this case, and other cases are similar to this case. After the reflected light passes through the plane mirror AB, the reflected light passes through the half-wave plate 44, and an included angle between a fast axis direction of the half-wave plate 44 and a vibration direction of the incident light is 45 °, so that vibration directions of the transmitted light and the reflected light are consistent. Of course, the half-wave plate 44 may be added to the transmitted light for the same purpose as the reflected light. The polarization beam splitter is adopted for splitting light to obtain two polarized lights with mutually vertical vibration directions, and the half-wave plate is added into one of the polarized lights, so that the vibration directions of the two polarized lights are consistent, the use of an analyzer is avoided, and the energy utilization rate is improved. However, it should be noted that if two paths of light are allowed to pass through the optical path difference etalon 45 made of a crystal material at the same time, the half-wave plate 44 is added after the two paths of light pass through the optical path difference etalon 45, so that the optical path difference can be generated.
After the two beams of light pass through the three plane mirrors 42 in sequence, the transmitted beam and the reflected beam pass through the non-polarizing beam splitter 43 again, so that the transmitted light and the reflected light are reflected and transmitted again, respectively, to form 4 paths of light, and because the interference condition is satisfied, the light transmitted through the polarizing beam splitter 41 and transmitted through the non-polarizing beam splitter 43 and the two paths of light reflected through the polarizing beam splitter 41 and reflected through the non-polarizing beam splitter 43 interfere, and the light transmitted through the polarizing beam splitter 41 and reflected through the non-polarizing beam splitter 43 and the two paths of light reflected through the polarizing beam splitter 41 and transmitted through the non-polarizing beam splitter 43 interfere.
Because the interferometer adopts an asymmetric design, the path of interference light returning to the light source and the emergent light of the light source generate certain displacement in space, and therefore, the interference light can be effectively utilized after being reflected by the plane reflector EF5, and the energy utilization rate of the whole light path is improved.
It should be noted here that the period of the interference fringes can be adjusted by adjusting the tilt angle of any one of the three plane mirrors 42. In fig. 1, the tilt angle of the plane mirror CD is adjusted. Although this tilt angle is small, the propagation direction of the light beam is changed and three reflections are performed, so that this small amount is also amplified by a factor of 4. To facilitate subsequent measurement and calculation of the optical path difference, it is necessary that the light beam passes perpendicularly through the surface of the optical path difference etalon 45, and therefore, we add the optical path difference etalon 45 to the reflected light. It should be noted that, if it is necessary to generate an optical path difference by adding the optical path difference etalon 45 made of a crystal material to the two paths of light, in order to accurately calculate the optical path difference, the optical path difference etalon 45 made of a crystal material needs to be added in front of the plane mirror for adjusting the tilt angle.
In this embodiment, the dispersion system 6 includes two groups of dispersion units, each group of dispersion units includes a first cylindrical mirror 60, a second cylindrical mirror 61, a slit 62, a collimation system 63, and a grating 64, which are sequentially arranged along the optical path; after the light beam passes through the interferometer to generate two paths of interference fringes, one path of interference fringes is reflected to the first group of dispersion units through the plane mirror EF5, the other path of interference fringes directly enters the second group of dispersion units, and the two paths of interference fringes are compressed through the first cylindrical mirror 60 and the second cylindrical mirror 61 in each dispersion unit and then are converged at the corresponding slits 62. The converging directions of the first cylindrical mirror 60 and the second cylindrical mirror 61 are perpendicular to each other, and the distance between the first cylindrical mirror 60 and the second cylindrical mirror 61 can be adjusted according to the required length-width ratio of the light spots, that is, the length-width ratios of the light spots obtained by combining the cylindrical mirrors with different focal lengths are different. The slit 62 is located at the focal point of the second cylindrical mirror 61, and the length direction of the slit coincides with the periodic direction of the interference fringes. After passing through the slit 62, the interference fringes are incident on the grating 64 through the collimating system 63, so that the interference fringes are dispersed along the wavelength direction, and the two dispersed light beams are finally imaged on the detector 8 through the imaging mirror 7, respectively.
Example two
In fig. 1, two paths of interference light emitted from the interferometer have opposite phases, and an included angle between the plane mirror EF5 and incident light is 45 °, if one set of dispersion unit is used, the intensities of the two paths of light may be cancelled out due to opposite phases, so that two sets of dispersion units are used in fig. 1 to disperse and image the two beams of light on the detector. However, if the angle between the plane mirror EF5 and the incident light is not 45 °, we can use a set of dispersion units to finally image the two beams at different positions on the CCD. As shown in fig. 2, the dispersion system 6 of the present embodiment includes a set of dispersion units, i.e. a first cylindrical mirror 60, a second cylindrical mirror 61, a slit 62, a collimation system 63 and a grating 64, which are sequentially arranged along the optical path; the specific imaging steps are as follows: firstly, adjusting the angle of a plane mirror EF to enable a reflected beam of the plane mirror EF and another beam entering a dispersion system not to be in the same plane; the reflected beam of the plane reflector EF and the other beam are imaged at different positions in the length direction of the slit after passing through the first cylindrical mirror and the second cylindrical mirror, collimated by the collimating system, and finally subjected to dispersion imaging by the grating 64 at different positions of the detector.
Claims (7)
1. A high-flux high-resolution high-contrast polarization interference spectrum imaging device is characterized in that: the device comprises a collimating mirror (2), a polaroid (3), an interferometer (4), a dispersion system (6), an imaging mirror (7) and a detector (8) which are arranged in a light path in sequence;
the interferometer (4) is a common-path Sagnac interferometer with an asymmetric structure, and comprises a polarization beam splitter (41), three plane reflectors (42) and a non-polarization beam splitter (43) which are sequentially arranged along a light path; the polarization beam splitter further comprises a half-wave plate (44) and an optical path difference etalon (45) which are arranged in the propagation light paths from the polarization beam splitter (41) to the non-polarization beam splitter (43); the half-wave plate (44) is positioned in any emergent light path of the polarization beam splitter (41); the optical path difference etalon (45) is positioned in any emergent light path or two emergent light paths of the polarization beam splitter (41);
the polarization beam splitter (41) is used for dividing a target light source passing through the collimating mirror (2) and the polaroid (3) into two paths of S light and P light with mutually vertical vibration directions; the half-wave plate (44) is used for adjusting the vibration direction of the S light or the P light, so that the S light and the P light have the same vibration direction; the optical path difference etalon (45) is used for adjusting the optical path difference of the S light and/or the P light, so that a fixed optical path difference is generated between the S light and the P light; the three plane mirrors (42) are used for reflecting the S light and the P light and finally reflecting the S light and the P light with the same vibration direction and fixed optical path difference to the non-polarizing beam splitter (43); the non-polarization beam splitter (43) is used for reflecting and transmitting S light and P light with the same vibration direction and fixed optical path difference to form interference fringes;
the interference fringes are dispersed by a dispersion system (6) and then imaged on a detector (8) through an imaging mirror (7);
if the included angle between the plane reflector EF (5) and the incident light is equal to 45 degrees, the dispersion system (6) comprises two groups of dispersion units;
each group of dispersion units comprises a first cylindrical lens (60), a second cylindrical lens (61), a slit (62), a collimation system (63) and a grating (64) which are sequentially arranged along a light path; the convergence directions of the first cylindrical mirror (60) and the second cylindrical mirror (61) are mutually vertical; the slit (62) is positioned at the focus of the second cylindrical lens (61), and the length direction of the slit (62) is consistent with the periodic direction of the interference fringes;
two groups of interference fringes are imaged at a slit (62) after passing through a first cylindrical lens (60) and a second cylindrical lens (61) in each group of dispersion units respectively, are collimated by a collimation system (63), and are dispersed by a grating (64);
if the included angle between the plane reflector EF (5) and the incident light is not equal to 45 degrees, the dispersion system (6) comprises a first cylindrical mirror (60), a second cylindrical mirror (61), a slit (62), a collimation system (63) and a grating (64) which are sequentially arranged along the light path; the converging directions of the first cylindrical mirror (60) and the second cylindrical mirror (61) are mutually perpendicular, the slit (62) is positioned at the focus of the second cylindrical mirror (61), and the length direction of the slit (62) is consistent with the periodic direction of the interference fringes;
two groups of interference fringes are imaged at different positions in the length direction of the slit (62) after passing through the first cylindrical mirror (60) and the second cylindrical mirror (61) at the same time, collimated by the collimating system (63), and dispersed by the grating (64).
2. A high throughput high resolution high contrast polarized interference spectroscopy imaging apparatus according to claim 1 wherein: an included angle between the transmission vibration direction of the polaroid (3) and the vibration direction of the S light is 45 degrees, wherein the S light is reflected light of the polarization beam splitter; the included angle between the fast axis direction of the half-wave plate (44) and the vibration direction of the incident light is 45 degrees.
3. The high throughput high resolution high contrast polarized interference spectroscopy imaging apparatus of claim 2, wherein: the optical path difference etalon (45) is made of a uniaxial crystal or an amorphous material; light is incident perpendicularly to the retardation etalon surface.
4. A high throughput high resolution high contrast polarized interference spectroscopy imaging apparatus according to claim 3 wherein: if the two paths of emergent light paths passing through the polarization beam splitter (41) are both provided with the optical path difference etalon (45) made of single-axis crystal materials, the surfaces of the two optical path difference etalons (45) are both vertical to corresponding incident light, the crystal optical axis is parallel to the crystal plane, and the half-wave plate (44) is positioned in the light path behind the optical path difference etalon (45).
5. The high throughput high resolution high contrast polarized interference spectroscopy imaging apparatus of claim 4, wherein: the inclination angle of at least one of the three plane reflectors (42) is adjustable.
6. The high throughput high resolution high contrast polarized interference spectroscopy imaging apparatus of claim 5, wherein: if the two paths of emergent light paths passing through the polarization beam splitter (41) are both provided with the optical path difference etalon (45) made of single-axis crystal materials, the optical path difference etalon (45) is positioned in front of the plane reflector with the adjustable inclination angle.
7. An imaging method based on the high-throughput high-resolution high-contrast polarization interference spectrum imaging device of any one of claims 1 to 6, characterized by comprising the following steps:
step 1, a target light source is incident to a polarization beam splitter after passing through a collimating mirror and a polarizing film;
step 2, the polarization beam splitter divides the target light source which passes through the collimating mirror and the polaroid into two paths of S light and P light which have mutually vertical vibration directions and consistent intensity;
3, sequentially reflecting the S light and the P light by the three plane reflectors, and adjusting the vibration direction of the S light or the P light by using a half-wave plate to enable the S light and the P light to have the same vibration direction; adjusting the optical paths of the S light and the P light by using the optical path difference etalon to generate a fixed optical path difference between the S light and the P light; the three plane mirrors finally reflect the S light and the P light with the same vibration direction and fixed optical path difference to the non-polarization beam splitter;
step 4, the non-polarization beam splitter reflects and transmits the S light and the P light with the same vibration direction and fixed optical path difference to form interference fringes;
step 5, the interference fringes are subjected to chromatic dispersion by a chromatic dispersion system and then imaged on a detector;
if the included angle between the plane mirror EF and the incident light is equal to 45 °, the step 5 specifically includes:
two groups of interference fringes are imaged at a slit after passing through a first cylindrical mirror and a second cylindrical mirror in each group of dispersion units respectively, then are collimated by a collimation system, and finally are imaged on two different detectors after being subjected to grating dispersion;
if the included angle between the plane mirror EF and the incident light is not equal to 45 °, the step 5 specifically includes:
firstly, adjusting the angle of a plane mirror EF to enable a reflected beam of the plane mirror EF and another beam entering a dispersion system not to be in the same plane; the reflected beam passing through the plane reflector EF and the other beam pass through the first cylindrical mirror and the second cylindrical mirror to be imaged at different positions in the length direction of the slit, are collimated by the collimating system, and are finally subjected to grating dispersion imaging at different positions of the detector.
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